Abstract: A fully automated inspection system provides for inspection, measurement and characterization of a wire mesh tube, particularly a stent. The system uses an optical imaging subsystem to capture high resolution color images of both exterior and interior surfaces of a stent. Defects are defected by processing the captured images using proprietary algorithms. Geometric dimensional features of a stent are measured by processing the stitched 2-D map of the stent. In addition, a surface-scanning profiling subsystem is used to measure the surface roughness of drug films or metallic surfaces. It also measures the 3-D profile of a stent strut.

Abstract: A device for detecting elevations and/or depressions on bottles, in particular in a labeling machine, the device comprising a lighting unit with a light screen for generating a light reflection on a bottle to be examined and at least one camera for detecting the light reflection. By areas of varying luminance being formed on the light screen, molding seams can be reliably detected over a large area of the bottle wall and embossings can be located in various rotational positions of the bottle. The invention also relates to a method for applying the device.

Abstract: A foil lid inspection system for detecting and separating defective foil lids on a container in a production line includes one or more light sources, an inspection camera, and inspection software. The light sources are positioned to direct light in an upward direction to illuminate the container. The inspection camera is positioned above the foil lid, and the camera includes one or more outputs. The inspection software is in communication with the inspection camera. The inspection software is constructed and arranged to determine if the foil lid on the container is defective. A reject signal is applied to an output if the software determines that the foil lid is defective.

Abstract: The present invention generally provides an apparatus and a method for automatically calibrating the placement of fragile substrates into a substrate carrier. Embodiments of the present invention also provide an apparatus and a method for inspecting the fragile substrates prior to processing to prevent damaged substrates from being further processed or broken in subsequent transferring steps. Embodiments of the invention also generally provide an apparatus and a method for determining the alignment and orientation substrates that are to be delivered into or removed from a substrate carrier. Embodiments of the invention further provide an apparatus and method for accurately positioning the substrate carrier for substrate loading. The substrate carriers are generally used to support a batch of substrates that are to be processed in a batch processing chamber.

Abstract: A defect inspection system can suppress an effect of light from a sample rough surface or a regular circuit pattern and increasing a gain of light from a defect such as a foreign material to detect the defect on the sample surface with high sensitivity. When a lens with a large NA value is used, the outer diameter of the lens is 10a, and an angle between the sample surface and a traveling direction of the light from a defect is ?1. An oblique detection optics system receives the light from the defect at a reduced elevation angle ?2 with respect to the sample surface to reduce light from the sample rough surface, an oxide film rough bottom surface, and a circuit pattern, and to increase the amount of the light from the defect and detected. The diameter 10a of a lens is smaller than the diameter 10b, resulting in a reduction in the ability to focus the scattered light. When a lens with an outer diameter 10c is used to improve the focus ability, the lens interferes with the sample.

Abstract: An optical fibre joint enclosure includes a plurality of carriers for supporting a plurality of optical fibre connectors. At least one carrier is rotatable or pivotable between a first position and a second position, independent of an adjacent carrier. The first position is an in-use orientation of an optical fibre connector and the second position provides improved access to an end face of the optical fibre connector. The carrier itself includes a hub portion, engaging an adjacent hub portion of an adjacent carrier, an arm portion attached to the hub portion, the arm portion supporting the optical fibre connector, and a release member preventing the hub portion from rotating unless the release member is activated. A method includes inspecting, testing or cleaning an end face of the optical fibre connector in situ.

Abstract: An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system.

Abstract: Myocardial tissue tracking techniques are used to project or guide a single manually-defined set of myocardial contours through time. Displacement encoding with stimulated echoes (DENSE), harmonic phase (HARP) and speckle tracking is used to encode tissue displacement into the phase of complex MRI images, providing a time series of these images, and facilitating the non-invasive study of myocardial kinematics. Epicardial and endocardial contours need to be defined at each frame on cine DENSE images for the quantification of regional displacement and strain as a function of time. The disclosed method presents a novel and effective two dimensional semi-automated segmentation technique that uses the encoded motion to project a manually defined region of interest through time. Contours can then easily be extracted for each cardiac phase.

Abstract: A process is provided for inspecting an absorbent article constructed from multiple components. A filtered image is produced from the absorbent article. In the image of the absorbent article, a nonlinear first edge and a second edge are identified at a location where there is a course change in contrast. A center point and centerline of the absorbent article is calculated using the position of the first edge and the second edge. A skew of the absorbent article is calculated. These known locations are utilized to define at least one additional region of the image for further analysis. A third edge and fourth edge are identified at a location where there is a fine change in contrast. The skew of the third edge and the fourth edge within the defined region is calculated and compared to known parameters for the absorbent article.

Abstract: A method of imaging a fragmentation pattern formed in a single ply of toughened glass having first and second opposing surfaces is disclosed. Initially, a region of the fragmentation pattern is aligned with an image capture device, where the image capture device is arranged in a spaced relationship with the first surface of the ply of glass to capture images of the region when being illuminated in transmission. The region is then illuminated from a first illumination direction and capturing a first image of the region, and subsequently illuminated from at least a second illumination direction and capturing at least a second image of the region. The images are then superimposed to produce a composite image of the region. Preferably four images are obtained. A vehicle glazing optical inspection apparatus for carrying out such a method is also disclosed.

Abstract: There is disclosed an inspection device of a plugged honeycomb structure in which a plugged honeycomb structure is an inspection target, and the inspection device comprises a light source which illuminates one end face of the plugged honeycomb structure as the inspection target; a camera-side lens which condenses light emitted from the light source to the one end face, transmitted through plugged portions of the plugged honeycomb structure and radiated from the other end face; a camera which receives the light condensed by the camera-side lens; and an image processor which processes an image of the light received by the camera to display the contrast of the light transmitted through the plugged portions of the plugged honeycomb structure.

Abstract: The invention relates to a picking line for inserting products into a packaging container, having a conveyor belt for the delivery and the transport of products in a transport direction, and at least one picker equipped with a position image processing system for determining the position of the products on the conveyor belt. A quality image processing system is disposed in the transport direction upstream of the at least one picker for checking the products passing the quality image processing system on the conveyor belt in the transport direction for predetermined quality features, and for associating quality information to be transmitted to a picker adjacent downstream of the quality image processing system in the transport direction, serving as a control command for grasping or not grasping the products.

Abstract: An apparatus for inspecting pattern defects, the apparatus including: a defect candidate extraction unit configured to perform a defect candidate extraction process by comparing a detected image signal with a reference image signal; and a defect detection unit configured to perform a defect detection process and a defect classification process based on a partial image containing a defect candidate that is extracted by the defect candidate extraction unit, wherein the processes performed by the defect candidate extraction unit and/or the defect detection unit are performed asynchronously with an image acquisition process.

Abstract: Early techniques for object inspection relied on human inspectors to visually examine objects for defects. However, automated object inspection techniques were subsequently developed due to the labour intensive and subjective nature of human operated inspections. Additionally, object characteristics such as object power and object thickness need to be determined after the objects have been examined for defects. Conventionally, corresponding inspection stations are along the manufacturing lines for determining each of the object characteristics. However, the need for human intervention and time spent to move the objects from one inspection station to another adversely affect the efficiency of the object manufacturing process. An embodiment of the invention disclosed describes a high-resolution object inspection system for performing object inspection.

Abstract: An on-board object detector and on-board object detection method for detecting an object present in a pickup image at a high level of precision. A controller controls a projector to irradiate a line of light while shifting the irradiation angle, and images in the coverage area of the line of light are captured for multiple frames using a camera. Then, shifts in the moving speed of the line of light in the images across the frames are computed based on the images captured, and shifting points in the moving speed of the line of light are detected based on the computed shifts in the moving speed of the line of light in the images across the frames. The position and size of an object that is present in the images are specified based on said detected shifting points in the moving speed of the line of light.

Abstract: A method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts are provided. The system includes a support for supporting a part to be inspected and/or a calibration device along a measurement axis. The system further includes a head apparatus including a plurality of radiation plane generators for directing an array of planes of radiation at the part and/or device so that the part and/or device occludes each of the planes of radiation to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part and/or device. The head apparatus further includes a plurality of radiation plane receivers or cameras such as line scan cameras.

Abstract: A fixed vision system comprises a sensor (2) for acquiring an image of an object on a detecting plane (38), said sensor comprising a sensitive surface (10), a light-emitting device (3) for generating a luminous reference figure (39) on said detecting plane (38), said light-emitting device (3) comprising an emission surface (61a, 61b; 61c; 51; 89; 61d; 61e; 61f), at least an objective (36) through which a luminous radiation and a further luminous radiation pass, said luminous radiation coming from said object and being directed to said sensor (2) and said further luminous radiation coming from said light-emitting device (3) and being directed to said object, characterised in that said sensor (2) and said light-emitting device (3) are positioned in such a way that, when said detecting plane (38) is focussed by said objective (36) on said sensor (2), said sensitive surface (10) of said sensor (2) is on the image plane (60; 66; 67; 69; 73; 92) generated by said objective (36) or on a respective mirror plane (63,

Abstract: Aims to provide an inspection apparatus and an inspection method for detecting an amount of misalignment of a component mounted on a panel through an ACF.

Abstract: An apparatus and method for scanning a surface of an article moving along a travel path axis provide a compact sensor configuration. A first sensor unit has a first sensing field transversely directed toward the travel path axis and defining a first scanning zone. A second sensor unit has a second sensing field transversely directed toward the travel path axis and defining a second scanning zone. The first and second sensing fields are crossing one with another at a location sufficiently remote from the first and second scanning zones so as to not adversely affect the generation of sensor output data, while providing a compact arrangement of sensor units.

Abstract: A morphological operation is applied to an SEM image to obtain a idealized image, and the idealized image is used to detect a defect in a subject of the SEM image. The defect is detected by subtraction of the idealized image from the original image. Morphological operations are used also to entrance the visibility of defects or to check for irregularities in patterns. Other described methods comprise: growing a flow from seed points in the image, in order to define maps in which particles can be identified; checking for separation of objects in the image by growing flows from seed points located on the objects; segmenting the image into supposed identical objects and applying statistical methods to identify the defective ones.

Abstract: The present disclosure provides a system and method for recognizing a defect image associated with a semiconductor substrate. In one example, the method includes collecting defect data of the defect image by testing and measuring the semiconductor substrate, extracting a pattern from the defect data, normalizing a location, orientation, and size of the pattern, and identifying the pattern after the pattern is normalized.

Abstract: In a method and apparatus for the optical inspection of a matt surface of an object, the surface having a random texture, for example a tile (11) to find cracks (12), in a first step digital images of the surface are created by an image sensor (K) whereby the surface is illuminated from different directions by light sources (B). In a second step sub-images of the regions of interest are created from the images. In a third step the cracks are detected in the sub-images by digital image processing, generating abnormality sub-charts showing the putative cracks. In a fourth step for each region of interest a joint abnormality chart is generated by fusion of the sub-charts and in a fifth step the cracks are detected in each of the joint abnormality charts of each region of interest.

Abstract: A defect inspection device for a silicon wafer comprises: an infrared light illumination which illuminates the silicon wafer with a light power that has been adjusted in accordance with a specific resistance value of the silicon wafer; and an imaging unit constituted by a line sensor array that is sensitive to infrared light, which captures the silicon wafer.

Abstract: An inspecting apparatus and an inspecting method capable of detecting a state inside the cream solder are provided. An illumination device (5) irradiates infrared light at predetermined intensity to a board on which cream solder is applied. An image taking device (6) takes an image of the board to which the infrared light is irradiated. A main control portion (95) in a control device (9) is capable of detecting a sectional shape of the cream solder according to an intensity distribution of infrared light reflected on the board from image data of the image captured by the image taking device (6). Also, because reflected light from the cream solder surface can be eliminated by an elimination portion (95c), the sectional shape of the solder can be detected more exactly.

Abstract: A process for using a hand-held infrared inspection system incorporating on-board training, on-board validation, on-board operator certification, on-board reporting information, or on-board survey instructions. Improved methods for automating area surveys are provided through exception-driven surveillance practices. Imbedded information enables less experienced operators to use more sophisticated devices more effectively. Validation or certification assures operator knowledge or ability. Multilevel classification of anomalies aids in automated analysis and report generation.

Abstract: The invention relates to a method and a device for the quality control of a rotationally symmetrical body (2, 2, 2?) and a grip (4) of a handling system (5) for gripping a rotationally symmetrical body (2, 2, 2?). The aim of the invention is to improve the quality control of rotationally symmetrical bodies (2, 2, 2?) in such a way that it is faster, reliable and more economical. To this end, the grip (4) comprises grip fingers (26) having rotationally symmetrically holding elements (29, 31) for holding the body (2, 2, 2?), the holding elements (31) being mounted in the grip fingers (26) in such a way that they can be rotated about the rotational axes (29) thereof. In order to grip the body (2, 2, 2?), the grip fingers (26) are displaced on a circular path. A central drive mechanism (22; 35) is respectively provided for the rotational movement of the holding elements (29, 31) of all of the grip fingers and for the rotational movement of all of the grip fingers (26).

Abstract: A system and method are provided for automatically defining acceptable shape requirements for an object. A reference shape is a shape that the object should be in, and the acceptable shape requirements define an acceptable shape of the object that may deviate from the reference shape and yet is acceptable to a user. The system includes two elements: a processor, and a scanner coupled to the processor for scanning objects and sending scanned information of the objects to the processor. The processor is configured to perform three steps: (i) receiving scanned information of two or more acceptable shapes from the scanner; (ii) combining the scanned information of the two or more acceptable shapes to define acceptable shape requirements; and (iii) storing the acceptable shape requirements.

Abstract: A mura evaluation apparatus 100 includes: a mura detection unit 110 that acquires multiple images of a display mura present in a display area of a display device by scanning the display area while moving along a spherical surface with a preset radius; and an information processing apparatus 150 that generates a three-dimensional mura figure from the multiple images acquired by the mura detection unit, by associating a feature value of the display mura in each of the images with a position where the image is acquired, and generates a mura superimposed image in which the three-dimensional mura figure viewed from a designated observation angle is superimposed.

Abstract: A method for processing poultry suspended by the feet from a conveyor hook is provided. The method and apparatus allow the quality of the poultry to be classified and graded in a simpler and more effective manner to realize higher yields or an extra added value. In one exemplary embodiment a processing apparatus for a foot of the poultry is provided that includes a foot pad inspection apparatus.

Abstract: Visibility of defects is improved for inspection of structures and the like, by generating an image having higher resolution than pixel resolution of a TV camera itself. An appearance inspection apparatus is provided with a TV camera; a camera driving device for making the TV camera scan an inspection object; an image capture device for capturing the image in the TV camera as a digital image; a camera motion measuring device for measuring scanning motion of the TV camera; a high definition image generating device, which generates a high definition image having a higher pixel resolution than that of the TV camera, based on the digital images captured by the image capture device and the TV camera scanning motion data measured by the camera motion measuring device; and a recording device which records and stores positional information of the inspection object.

Abstract: The invention concerns a device for inspecting a surface of a workpiece (1) comprising a processor for reading image data of the surface, wherein the image data comprises at least a bright field (B) and at least a dark field (D1). A portion (A) of the surface is in the image data in at least one position in the bright field. (B) and in at least a second position in the dark field (D1). The processor generates a result by comparing the portion (A) in the bright field (B) to the portion (A) in the dark field (D1) in order to find surface anomalies, and outputs the result using an outputting means. Furthermore, the invention concerns a surface inspection arrangement for inspecting a workpiece (1) comprising the device, and further comprising a light source (2), at least one image pick-up device (3) and means for transferring the image data from the image pick-up device (3) to the processor that reads image data.

Abstract: The invention concerns an optical inspection method for the line inspection of transparent or translucent objects (2) travelling at fast rate between a light source (3) and means (4) to take images of the objects and to analyze the images taken, so as to detect defects in the objects.

Abstract: The invention relates to a method for recognizing surface characteristics of metallurgical products, especially continuously cast products and rolled products. According to said method, a defined section of the product surface (12, 12?) is irradiated by at least two radiation sources of different wavelengths, from different directions, and the irradiated surface section is optoelectronically detected. Three light sources (21, 22, 23) are oriented towards the product surface (12, 12?), as radiation sources, under the same angle (a), the positions thereof being in three planes (E1, E2, E3) forming a 120 DEG angle and being perpendicular to the product surface (12, 12?). In this way, instructive information about metallurgical products can be determined and stored in a very short space of time such that the products can be determined in a perfectly identified manner for the reprocessing, in terms of the surface quality or surface structure thereof.

Abstract: A machine for inspecting a rotating glass container for defects wherein the image evaluated for defects is a critical addition of a plurality of additions each defined by a plurality of time spaced images.

Abstract: A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.

Abstract: An apparatus to conduct an inspection of printed impressions placed on a conveyor transport system which is synchronized with an optical collection device that captures and digitizes the image of the impressions. The images are then reformatted and analyzed for defects using a reference image. The images are also filtered and converted to an LCH representation which further inspected using the CIE methodology. The final results of the inspection are presented to the operator in real time on a display monitor.

Abstract: A separation filter selection device provided with an image input unit, a memory unit, a setting unit, an evaluation unit and a separation filter selection unit is disclosed. The image input unit inputs a captured image capturing a tire surface including a characteristic portion thereof. The memory unit stores plural filters for performing image processing of the captured image, stores a training image in which the characteristic portion is separated from the captured image, and a weighted image in which a weighting is set to a predetermined region of the captured image. The setting unit combines two or more filters out of the plural filters and sets a separation filter. The evaluation unit derives an evaluation value of the separation filter on the basis of an image in which a differential between the processed image that has been processed by each of the filters of the separation filter, and the training image, and to which a weighting based on the weighted image is applied.

Abstract: A non-destructive method capable of real-time or on-line measurement of a wood or pulp fiber without sample pretreatment for the microfibril angle and the path difference. A circular polariscope in combination with a line spectral camera generating a micrograph insensitive to the orientation of a fiber and determined only by the fiber's properties related to polarized light. A line image across the fiber is captured and dispersed it into a spectral image to perform a real-time spectral analysis of the fiber's image.

Abstract: A system for inspecting an object, the system comprising a camera; a work surface for receiving the object; and an apparatus for processing an image of the object taken by the camera wherein, during the capture of an image by the camera, the camera and the object are fixed with respect to one another. The processing apparatus identifies those image data components that represent the an edge of the object in an image plane, and projects each image edge data component onto the object plane.

Abstract: A pattern inspection device according to the embodiment, includes: an image picking-up portion for picking-up an image of a pattern formation member in which a plurality of opening patterns are formed so as to obtain a picked-up image of the pattern formation member; a reference image obtaining portion for obtaining a reference image used for comparing with the picked-up image; and a pattern defect detecting portion for matching the center locations of the opening pattern images respectively between the picked-up image and the reference image, forming difference images of the opening pattern images between the picked-up image and the reference image per the opening pattern and detecting the defect of the opening pattern base on the difference images.

Abstract: The present invention provides a reticle defect inspection method and a reticle defect inspection apparatus capable of calibrating the offset and gain of a sensor amplifier using a product reticle even though black and white regions each sufficiently wider than a TDI sensor imaging area do not exist in the product reticle. An output of each pixel of the TDI sensor is amplified by the sensor amplifier. A bottom value of the amplified amount-of-light signal of each pixel is stored by bottom value storing means of offset/gain calibrating means, and a peak value thereof is stored by peak value storing means. The offset of each pixel is calculated by offset calculating means based on the bottom value of each pixel. The gain of each pixel is calculated by gain calculating means based on the offset of each pixel and the peak value of each pixel. The calculated offset and gain of each pixel are stored in a register and thereby the offset and gain of the sensor amplifier are calibrated.

Abstract: A system for capturing a composite image of an object with a curved surface includes a conveyor configured to transport the object to be imaged to a predetermined imaging position. A sensor is configured to produce a signal when the object to be imaged is at the predetermined position, and several cameras are arranged to photograph the object at the predetermined position from a plurality of different angles. A tracking module is used to receive the signal from the sensor, and output an actuating signal to the several cameras, such that each camera captures an image when the actuating signal is received. A processing device receives a captured image from each of the several cameras, manipulates the received images, and generates a composite image based on the manipulated images.

Abstract: A defect review apparatus comprises a storage for receiving and storing defect information concerning an inspection objective captured by a wafer inspection system, an image acquisition unit for capturing images concerning the inspection objective and a process unit for acquiring data for defect review based on the defect information by using the image acquisition unit. The process unit makes a decision as to whether a cluster representative of a set or gang of defects exists in the defect information read out of the storage unit and when the presence of the cluster is determined, acquires an image of a defective portion forming part of the cluster and additional data in respect of the inspection objective by using the image acquisition unit on the basis of a distributive feature of the cluster.

Abstract: The present invention relates to a high-sensitivity inspection method and apparatus adapted for the fine-structuring of patterns, wherein defect inspection sensitivity is improved using the following technologies: detection optical system is improved in resolution by filling the clearance between an objective lens 30 and a sample 1, with a liquid, and increasing effective NA (Numerical Aperture); and when a transparent interlayer-insulating film is formed on the surface of the sample, amplitude splitting at the interface between the liquid and the insulating film is suppressed for reduction in the unevenness of optical images in brightness due to interference of thin-film, by immersing the clearance between the objective lens and the sample, with a liquid of a refractive index close to that of the transparent film.

Abstract: Methods and systems of part programming for machine vision inspection systems are provided, which permit a user to readily define multiple image acquisition operations interspersed with associated image analysis and/or inspection operations during learn mode operations and in the resulting part program image acquisition operations for at least some of the images are arranged into a continuous motion image acquisition sequence that acquires images and stores images in a “non-interspersed” manner in order to increase the throughput of the machine vision inspection system. Image analysis/inspection operations associated with the stored images are performed subsequently by recalling the store images. The programming systems and methods disclosed herein may operate automatically to facilitate rapid programming for a variety of workpieces by relatively unskilled users, wherein the resulting programs include continuous motion image acquisition sequences.

Abstract: In a defect inspection apparatus for inspecting a wafer provided with a circuit pattern for defects, the illuminating direction of illuminating light rays is selectively determined such that an area containing a defect that scatters light of high intensity coincides with the aperture of a dark-field detecting system, and such that regularly reflected light regularly reflected by a pattern, which is noise to defect detection, does not coincide with the aperture of the dark field detecting system.

Abstract: A disk inspection apparatus according to the present invention comprises: a disk holding device which holds a disk; an illumination device which radiates an inspection area portion having a predetermined shape on a disk surface including an edge of the disk held by the disk holding device, with illumination light having an illumination light pattern which forms a range of delivery of illumination light having approximately the same shape as that of the inspection area; and an imaging device which includes, in the field of view, the inspection area portion on the disk surface including the edge illuminated by the illumination device, and takes an image of light reflected from the inspection area portion.

Abstract: Subjects are repeatedly photographed efficiently and automatically. An input receiving means, for receiving input of photography intervals between completion of a previous photography operation and initiation of a next photography operation; and a photography control means for controlling the photography unit to perform a plurality of photography operations, based on the photography intervals received by the input receiving means; are provided.

Abstract: An inspection system for locating multiple features on an exterior of an object includes a fixture, a camera, a computer and software. The fixture secures the object and includes a plurality of nest points for mating with specific positions on the exterior of the object, and a reference point located at a specific position relative to the nest points and within a best-plane of the object. The camera is positioned normal to the best-plane of the object and obtains video imaging of a plurality of the features and the reference point. The computer communicates with the camera and collects the video imaging. The software determines the actual parameters of the features relative to the reference point based on the video imaging.

Abstract: A method and system are provided for non-contact evaluation of a machined surface of a cast-metal part, including a vision-based porosity inspection station. A digital image of the machined surface is acquired, oriented and scaled to an XY coordinate system, filtered, and inverted. A second image is generated with known design surface features eliminated. Each pixel of the inverted digital image is XOR-compared with a corresponding pixel of the second image. Identified common surface features common to both images is analyzed statistically for conformance to a threshold. A defect is identified as any identified surface feature common to both images which exceeds the threshold. The system moves the part for further processing if a statistical analysis of defects indicates an acceptable component, and alternatively, removes the part from further processing if the analysis indicates a flawed component.