Quality Inspection Patents (Class 348/92)
  • Patent number: 8154593
    Abstract: An appearance inspection device, which inspects an appearance of test objects, includes a first and second conveying means 21 and 22a conveying the test objects, a back/front reversal means 23 turning over the front and back surfaces of the test objects being conveyed by the first conveying means 21 and supplying the test objects to the second conveying means 22a, and a plurality of image-pickup means 30b and 30c capturing images of each test object from upper oblique directions while the test objects are conveyed by the first and second conveying means 21 and 22a. The appearance inspection device also includes a defect detection means detecting the presence of defects in the test objects based on image data captured by the image-pickup means 30b and 30c. This appearance inspection device makes it possible to reliably and readily inspect an entire appearance of the test objects.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: April 10, 2012
    Assignee: Qualicaps Co., Ltd.
    Inventors: Motohiro Yagyu, Kenichi Kasai, Ken Sato, Junsuke Yasui, Akira Nagao, Tetsuhisa Ishida
  • Patent number: 8154592
    Abstract: The invention relates to a device for inspecting fast repetitive events of defined duration, comprising image recording means for recording successive images of the repetitive event, and image reproduction means for providing a synchronized slow motion representation of said successive images of the repetitive event during the total duration of the repetitive event or a multiple thereof, whereas said image recording means comprise high frame rate image recording means for digitally recording a limited burst of successive images of a fraction of one event, and the device comprises software means to provide synchronized image recording of said fraction of one event and slow motion representation of said limited burst of successive images during the total duration of said one event or multiple thereof, and to an inspection method for such repetitive events involving high frame rate image recording of a limited burst of successive images of a fraction of one event, and synchronized slow motion representation of s
    Type: Grant
    Filed: August 30, 2006
    Date of Patent: April 10, 2012
    Assignee: Tesin NV
    Inventor: Luc van Quickelberge
  • Patent number: 8144193
    Abstract: A system and method of visual monitoring of a work implement (e.g., a welding torch) while a task is being performed (e.g., forming a welding joint) to train workers (e.g., apprentices, inexperienced workers) in proper welding technique, for example) and/or to evaluate the worker's use of a particular work implement (e.g., to determine if the welding torch was held in a desired relationship to the items being welded together, determine if the welding torch formed the joint at the current speed, etc.). In general, one or more cameras may acquire images of a target secured to and/or formed on the work implement. The images may be analyzed to provide feedback to the user, to be evaluated for weld integrity purposes; and/or may be used to compare the performance of a task (e.g., forming a welding joint) with a database of one or more profiles made by experienced and/or expert craftsmen.
    Type: Grant
    Filed: February 9, 2009
    Date of Patent: March 27, 2012
    Assignee: Recognition Robotics, Inc.
    Inventor: Simon Melikian
  • Publication number: 20120069173
    Abstract: A workpiece inspecting apparatus for rotating a workpiece having a shape portion containing a convex portion and a concave portion which are periodically and repetitively formed on the workpiece and picking up images of the shape portion of the workpiece to inspect the workpiece, including a workpiece rotating mechanism that outputs reference pulses at a fixed interval while rotating the workpiece at a fixed rotational speed, an image pickup mechanism that picks up images of the shape portions of the workpiece every image pickup timing based on the reference pulses, an image pickup controller that synchronizes each of the shape portions of the workpiece with the image pickup timing, and an inspection controller that executes image processing of taking a difference between a pickup k-th (k represents an integer) image and a pickup (k+1)-th image and detects a defect on the basis of differential data representing the difference.
    Type: Application
    Filed: September 2, 2011
    Publication date: March 22, 2012
    Applicant: HONDA MOTOR CO., LTD.
    Inventors: Hisashi TAKAHASHI, Ryo OBARA, Koichi IMAZU
  • Publication number: 20120069174
    Abstract: Embodiments of the present invention provide methods and apparatus for analyzing thermal properties of bonding materials within a composite structure. One embodiment of the present invention provides an apparatus for analyzing thermal property of a bonding material within a structure. The apparatus comprises a structure support having a supporting surface configured to support the structure, a heat source configured to direct a heat flux to the structure supported by the supporting surface of the structure support, and a camera facing the structure supported on the structure support and configured to capture thermal images of the structure supported on the structure support.
    Type: Application
    Filed: September 19, 2011
    Publication date: March 22, 2012
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Zheng John Ye, Kartik Ramaswamy, Troy S. Detrick, Kenneth S. Collins
  • Patent number: 8139107
    Abstract: In the present invention, an image of a substrate is picked up by an image pickup unit with the substrate being held by a transfer member. A drive unit for the transfer member is controlled by a driving signal from a first controller. A driving signal outputted to the first controller is outputted also to a second controller so that the second controller controls the image pickup unit based on the driving signal, thereby synchronizing drive of the transfer member with the image pickup by the image pickup unit. According to the present invention, the throughput in performing a defect inspection for the substrate is improved and a precise image is captured and subjected to accurate inspection.
    Type: Grant
    Filed: January 24, 2007
    Date of Patent: March 20, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Makoto Hayakawa, Hiroshi Tomita
  • Patent number: 8131017
    Abstract: Automatic illuminating and image recording system for an automobile service device, combined illuminating and image recording unit and method for automatic measured value-dependent setting of the image recording and exposure for an automobile service device having contactless measuring capability. Comprises at least one camera (32, 34) having an interface to a control unit, at least one illuminating unit (62, 64) having a control input, and a control unit. This control unit is equipped with an interface to the camera(s) (32, 34), with an interface to the illuminating unit(s) (62, 64), with an image processing-and, respectively, image pre-processing-unit and with an evaluating unit that generates control parameters for the illuminating unit(s) (62, 64) and/or the camera(s) (32, 34).
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: March 6, 2012
    Assignee: Beissbarth GmbH
    Inventors: Hermann Bux, Ulrich Bichlmeier, Stefan Schommer
  • Publication number: 20120050523
    Abstract: A system and method of inspecting an optical fiber junction is provided. The method includes moving an optical fiber having a junction, a recoat portion overlaying the junction and non-recoat portions on opposite sides of the recoat portion through an imaging region imaged by a pair of cameras. The optical fiber is imaged to acquire a plurality of images with the cameras as the optical fiber continuously moves through a distance to capture images of the recoat portion and the non-recoat portions adjacent to the recoat portion. The plurality of acquired images are evaluated for potential imperfections, and an output is provided indicative of detected images having potential imperfections.
    Type: Application
    Filed: August 22, 2011
    Publication date: March 1, 2012
    Inventors: Ian D. Cook, Igor Rafaelyevich Mejouev, Michael Seifert, Larry B. Stansell
  • Publication number: 20120050522
    Abstract: A method and apparatus for verifying the assembly components of a mobile device includes a camera module communicatively coupled to processing module. The processing module is programmed to receive a first image of at least a partially-assembled device having at least two components. The processing module is also programmed to compare the first image with a first validation image of at least a partially-assembled device. Based on the comparison of the first image and the first validation image, the processing module can approve the partially-assembled device for further assembly. In one implementation, the processing module can be programmed to generate a certification code in the event the comparison of the components in the first image and the components of the first validation image are substantially equivalent. If the partially-assembled device is approved, assembly is continued. If the partially-assembled device is not approved, assembly is discontinued.
    Type: Application
    Filed: August 24, 2010
    Publication date: March 1, 2012
    Applicant: RESEARCH IN MOTION LIMITED
    Inventors: Tyler Jaffery Van Slyck, Ranjeet Jheeta, David John Wegscheider
  • Publication number: 20120044344
    Abstract: A method and a system for detecting defects of a transparent substrate are provided.
    Type: Application
    Filed: May 14, 2010
    Publication date: February 23, 2012
    Inventors: Yuan Zheng, Jean-Philippe Schweitzer, Xiaofeng Lin, Dazhi Chen
  • Patent number: 8120654
    Abstract: A device for detecting a defect on the end face of a glass sheet is provided with: an image pick-up device having at least two CCD cameras for image-picking up the end face of the glass sheet from outside the glass sheet and in two directions diagonal to both front and back surfaces thereof; an illuminating device having a nearly C-shaped ring illumination capable of applying illuminating light in its center axis direction and having an opening slit; and an image processing device for processing the image signals acquired from the CCD cameras to determine the quality of the end face. The glass sheet is loosely inserted in the opening slit so that the end face agrees with the center axis of the ring illumination; the illuminating light is applied to the end face; and the end face is image-picked up by the image pick-up device. The image signals thus acquired are processed by the image processing device, thereby detecting the presence/absence of the defect on the end face.
    Type: Grant
    Filed: February 10, 2006
    Date of Patent: February 21, 2012
    Assignee: Central Glass Co., Ltd.
    Inventor: Shinichi Okamura
  • Patent number: 8115813
    Abstract: An optical system includes a first set of cameras and a second set of cameras, and an optical assembly. The first set of cameras receive first light originating from each of a set of first portions of a printed circuit board. The first light transmits along a first optical path defined between each of the set of first portions and each of the first set of cameras. The second set of cameras receive second light originating from each of a set of second portions of the printed circuit board. The second light travels along a second optical path defined between each of the set of second portions and each of the second set of cameras. The optical assembly is capable of directing the first light and the second light toward the first set of cameras and the second between the printed circuit board respectively.
    Type: Grant
    Filed: April 24, 2009
    Date of Patent: February 14, 2012
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Pei-Chong Tang
  • Patent number: 8116533
    Abstract: Methods and systems for operator intervention in a document processing system are disclosed. One possible method includes capturing images of documents within a document processing system. The method further includes executing computerized analysis of the images to establish an acceptability determination regarding the images. The method further includes manually reviewing the computer analysis of the images to confirm or override the acceptability determination.
    Type: Grant
    Filed: December 5, 2007
    Date of Patent: February 14, 2012
    Assignee: Burroughs Payment Systems, Inc.
    Inventors: Michael John Kiplinger, George T. Spray, Michael James Spall, Johan P. Bakker, David Brian Tratar, Sammy C. Hutson
  • Publication number: 20120033068
    Abstract: Image pickup is executed at an image pickup timing based on reference pulses by using, as a trigger, workpiece pulses which are output at an interval synchronized with a shape portion (projecting or recess portion) which is periodically and repetitively formed on a workpiece being rotated, and the image pickup is executed at the image pickup timing based on the reference pulses PA every time only reference pulses PA whose number corresponds to a pulse number between workpiece pulses are output from the image pickup timing concerned.
    Type: Application
    Filed: July 15, 2011
    Publication date: February 9, 2012
    Applicant: HONDA MOTOR, CO., LTD.
    Inventor: Hisashi TAKAHASHI
  • Patent number: 8111904
    Abstract: The invention provides inter alia methods and apparatus for determining the pose, e.g., position along x-, y- and z-axes, pitch, roll and yaw (or one or more characteristics of that pose) of an object in three dimensions by triangulation of data gleaned from multiple images of the object. Thus, for example, in one aspect, the invention provides a method for 3D machine vision in which, during a calibration step, multiple cameras disposed to acquire images of the object from different respective viewpoints are calibrated to discern a mapping function that identifies rays in 3D space emanating from each respective camera's lens that correspond to pixel locations in that camera's field of view. In a training step, functionality associated with the cameras is trained to recognize expected patterns in images to be acquired of the object.
    Type: Grant
    Filed: October 7, 2005
    Date of Patent: February 7, 2012
    Assignee: Cognex Technology and Investment Corp.
    Inventors: Aaron S Wallack, David Michael
  • Patent number: 8111288
    Abstract: There is provided an image processing controller capable of faithfully recreating a process of a series of image processing based upon a control program, which includes: a history buffer for extracting a result of the measurement in each processing unit, executed by the program executing section, as history information in each measurement cycle and holding the extracted result in association with the processing unit and the measurement cycle; a history buffer for extracting a camera image acquired from a camera by the program executing section during execution of a control program, as history information in each the measurement cycle and holding the extracted image in association with the measurement cycle; and a history information transferring section for transferring history information, held in the history buffers, to the PC.
    Type: Grant
    Filed: November 12, 2008
    Date of Patent: February 7, 2012
    Assignee: Keyence Corporation
    Inventors: Kazuya Fujimori, Toshihiro Konaka, Teruhiko Maeda
  • Publication number: 20120026316
    Abstract: According to an embodiment, a pattern inspection apparatus includes an imaging unit, a defect detection unit, and an inspection control unit. The imaging unit is configured to image a pattern on a substrate to acquire a pattern image. The defect detection unit is configured to detect a defect of the pattern by a first outer shape comparison in associate with the pattern image and design information for the pattern or by a comparison in pixel values between images of patterns designed to be formed into the same shape in the substrate. The inspection control unit is configured to select an inspection based on the amount of the defect detected by the first outer shape comparison or based on a value of a gradient of an edge profile of the pattern image and to control the imaging unit and the defect detection unit in accordance with the selected inspection.
    Type: Application
    Filed: January 26, 2011
    Publication date: February 2, 2012
    Inventor: Ichirota NAGAHAMA
  • Publication number: 20120026315
    Abstract: A display panel test apparatus includes: an image pickup part which picks up an image from a target display panel; a jig including a receiving part which receives the target display panel, a fixing part which fixes the image pickup part, and an adjusting part which adjusts an image pickup angle of the image pickup part; a pattern generating part which provides the target display panel with a test pattern; a defect extracting part which analyzes test image data provided from the image pickup part using a defect extracting algorithm and extracts display defect information, where the defect extracting algorithm includes different settings corresponding to different types of display defects; and a control part which generates evaluated data corresponding to a viewing angle of the target display panel using the image pickup angle of the image pickup part and the display defect information.
    Type: Application
    Filed: December 22, 2010
    Publication date: February 2, 2012
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Bum-Suk LEE, Eung-Sang LEE, Gi-Chang PARK, Jong-Jin KIM, Chan-Youn PARK
  • Publication number: 20120026317
    Abstract: In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.
    Type: Application
    Filed: June 14, 2011
    Publication date: February 2, 2012
    Applicant: Hitachi-GE Nuclear Energy, Ltd.
    Inventors: Kenji NAKAHIRA, Atsushi Miyamoto, Naoki Hosoya, Minoru Yoshida
  • Publication number: 20120013732
    Abstract: A system and method for inspecting stents can involve an inspection camera to take an image of the stent and a computer system for analyzing the image to determine the presence of any coating defects. The determination can be made by masking out a portion of the stent, identifying deviations from a strut edge, and/or highlighting features protruding from a stent external boundary defining an outer diameter. The image can be taken after a focus feedback camera determines the position of the stent.
    Type: Application
    Filed: September 24, 2011
    Publication date: January 19, 2012
    Inventors: Ian Cameron, Andrew David Coppin Maw, Hong Zhang, Calden Wloka, Sidney Watterodt, Sang Joon Park, Anthony S. Andreacchi, Yung-Ming Chen, Arnoldo M. Currlin, Antonio Garcia, Jason Van Sciver, Bryan D. Glenn
  • Publication number: 20120002036
    Abstract: A method and a device for induction thermography for non-destructive material examination are provided. A movement of a test object relative to an infrared camera with an inductor is carried out along any desired single or multi-dimensional path such that the relative movement for recording an image by the infrared camera is independent.
    Type: Application
    Filed: May 22, 2009
    Publication date: January 5, 2012
    Applicant: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Matthias Goldammer, Max Rothenfusser, Johannes L. Vrana
  • Publication number: 20110310244
    Abstract: A system and a method for detecting defects of a substrate are provided. The system includes: a first illuminating component, disposed at one side of the substrate and adapted to emit diffused light to the substrate; a first imaging component, disposed at the other side of the substrate and adapted to scan the substrate by sensing light emitted by the first illuminating component and transmitted through the substrate, the first illuminating component and the first imaging component constructing a first detection channel; and a transport module, adapted to produce relative motion between the substrate, and the first illuminating component and the first imaging component.
    Type: Application
    Filed: February 26, 2010
    Publication date: December 22, 2011
    Applicant: SAINT-GOBAIN GLASS FRANCE
    Inventors: Jean-Philippe Schweitzer, Huifen Li, Xiaofeng Lin, Feng Guo, Xiaofeng Guo
  • Publication number: 20110310242
    Abstract: An apparatus for optically inspecting an at least partially reflecting surface of an object includes first and second transverse carriers (12, 14) defining respective substantially circular segment-shaped cutouts (32). The transverse carriers (12, 14) are disposed at a longitudinal distance (D) from one another and the longitudinal distance (D) defines a longitudinal direction (17). A plurality of longitudinal members are configured to hold the first and second transverse carriers at the longitudinal distance (D). The longitudinal members are arranged at a defined radial distance to the circular segment-shaped cutouts. A translucent diffusing screen is held in the circular segment-shaped cutouts by the transverse carriers to form a tunnel-shaped inspection space. A multiplicity of light sources are arranged outside of the tunnel-shaped inspection space behind the diffusing screen.
    Type: Application
    Filed: June 28, 2011
    Publication date: December 22, 2011
    Inventors: Klaus-Georg Knupfer, Joachim Reimann, Volker Huss, Volker Schöllkopf
  • Publication number: 20110310243
    Abstract: The invention pertains to a method and to a device for the quality assurance of an at least partially light-transmitting hollow body, the walls of which are illuminated by a light source, wherein a digital still camera is used to record images of various imaging areas of the walls containing useful data. So that the images of the imaging areas containing the useful data can be recorded with as little interference as possible by means of a digital still camera and thus so that the discriminating power of the quality assurance process can be improved, the unwanted data located a certain distance away from the imaging area on the walls of the hollow body are suppressed by carefully achieved superimposition of partial images.
    Type: Application
    Filed: February 16, 2010
    Publication date: December 22, 2011
    Applicant: Intravis Gmbh
    Inventors: Gerd Fuhrmann, Klaus Schönhoff
  • Publication number: 20110304725
    Abstract: An apparatus for inspecting pattern defects, the apparatus including: an image acquisition unit which acquires an image of a specimen and stores the acquired image in an image memory; a defect candidate extraction unit which performs a defect candidate extraction process by using the acquired image, which is read from the image memory; and a defect detection unit which performs a defect detection process based on a partial image containing a defect candidate that is extracted by the defect candidate extraction unit, wherein the defect detection process performed by the defect detection unit is performed asynchronously with an image acquisition process that is performed by the image acquisition unit.
    Type: Application
    Filed: August 22, 2011
    Publication date: December 15, 2011
    Inventors: Kaoru SAKAI, Shunji Maeda, Takafumi Okabe
  • Publication number: 20110285841
    Abstract: An appearance inspection apparatus has conveying means for conveying an inspection object and surface shape inspecting means for inspecting the surface shape of the inspection object. The surface shape inspection means has a slit beam irradiating section for irradiating a band-shaped slit beam on the surface of the inspection object, an area sensor camera for capturing images of the slit beam, first and second optical mechanisms for receiving reflected lights of the slit beam on the downstream and upstream sides in a conveyance direction, respectively, and guiding them to the area sensor camera, and a shape judging section for judging appropriateness of the surface of the inspection object based on images captured by the area sensor camera. Optical paths of the first and second optical mechanisms allow images of the reflected lights to be formed on the area sensor camera in a state of being aligned laterally.
    Type: Application
    Filed: May 16, 2011
    Publication date: November 24, 2011
    Applicant: DAIICHI JITSUGYO VISWILL CO., LTD.
    Inventors: Shinya Matsuda, Hiroshi Aoki, Toshiaki Onoe
  • Publication number: 20110279668
    Abstract: An image inspection device includes a first illuminating unit illuminating an object from an oblique direction with a first illuminating light; an imaging unit receiving specular reflection light of the first illuminating light from the object; and a focusing unit focusing the specular reflection light on the imaging unit. The image inspection device is configured to inspect the image based on the intensity of the specular reflection light received by the imaging unit. The first illuminating unit includes light-emitting elements and an illumination light producing unit that is configured to deflect light emitted from the light-emitting elements and thereby to produce the first illuminating light such that the specular reflection light from the object enters a pupil of the focusing unit.
    Type: Application
    Filed: April 4, 2011
    Publication date: November 17, 2011
    Applicant: RICOH COMPANY, LTD.
    Inventors: Fumihiro Nakashige, Keiji Kojima, Hitoshi Itoh
  • Publication number: 20110267451
    Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.
    Type: Application
    Filed: May 3, 2010
    Publication date: November 3, 2011
    Applicant: United Technologies Corporation
    Inventors: Joseph D. Drescher, Jesse R. Boyer, Robert E. Erickson, Erik M. Pedersen
  • Publication number: 20110261186
    Abstract: A system, method and program adapted for collecting images of job-site conditions, plans and specifications. Images are annotated with attributes that relate to the location, time and trades involved and other aspects of the images. Job site images are collected with a camera connected to a portable data collection device. The portable data collection device is programmed with image attributes for a particular project. Images are also annotated with attributes gathered by sensors, such as GPS position data and direction information. Images with attached attributes are uploaded to a database server and indexed into a relational database. Images can be flagged and determined to be images for review which triggers automatic notification to the involved parties and follow up to confirm resolution. Authorized participants can access images in near real time, to make funding, insurance and other judgments about the project. Images are archived for safekeeping and long-term storage.
    Type: Application
    Filed: July 6, 2011
    Publication date: October 27, 2011
    Inventors: David A. Blackburn, Paul J. Kitchen, William R. Bradley, Bryan Madison, Christopher Robert Hetherly, Aaron Freeman, William Clark Dale, Marlon B. Akins
  • Patent number: 8040375
    Abstract: A method for inspecting a slider having a substantially rectangular parallelepiped shape is provided. The method has: a lifting step of lifting said slider upward and stopping said slider at an inspecting position while supporting said slider at an undersurface of said slider, wherein said undersurface is a surface that is other than a first surface, said first surface being an air bearing surface or a surface that is to be formed in said air bearing surface; and an inspection step of simultaneously inspecting said first surface and a second surface of said slider, said second surface being a surface that is other than said first surface and said undersurface, wherein said first surface is inspected by a first camera and said second surface is inspected by a second camera, said first and second cameras being arranged in advance such that an optical axis thereof passes through said inspecting position.
    Type: Grant
    Filed: June 25, 2007
    Date of Patent: October 18, 2011
    Assignee: SAE Magnetics (H.K.) Ltd.
    Inventor: Ryuji Fujii
  • Publication number: 20110249112
    Abstract: A defect inspection device and an inspection method which can decide the quality of a pattern shape of a sample surface in a short time are provided. A defect inspection device 20 that inspects a defect of a substrate (wafer 10) on which a repeated pattern is formed includes an illumination optical system 21 that has an objective lens 9 and radiates light from a light source 1 onto the repeated pattern formed on the wafer 10 via the objective lens 9, a detection optical system 22 that detects an image of a pupil plane of the objective lens 9 produced by diffracted light of a plurality of orders caused by the repeated pattern and a detection section 23 that detects a defect of the repeated pattern of the wafer 10 from the pupil image obtained.
    Type: Application
    Filed: April 28, 2011
    Publication date: October 13, 2011
    Applicant: Nikon Corporation
    Inventor: Kazumasa ENDO
  • Patent number: 8018487
    Abstract: The present invention relates to a computer-implemented quality assurance system, which includes the steps of retrieving quality assurance and supporting information from a database; receiving information on technical variables from monitoring of the patient, and on radiographic equipment in the performance of an imaging study; generating a quality assurance score after said imaging study based on said technical variables and said quality assurance and supporting information; and performing a quality assurance analysis of the imaging study based on the quality assurance score. The score can be used to perform trending analysis, and provide recommendations for education, and feedback, to clinicians, radiologists, and departments.
    Type: Grant
    Filed: April 28, 2006
    Date of Patent: September 13, 2011
    Assignee: QAMI
    Inventor: Bruce Reiner
  • Patent number: 8014586
    Abstract: Apparatus, systems, and methods to recognize features on bottom surfaces of containers on a container production line, detect defects in the containers, and correlate the defects to specific production equipment of the container production line, based in part on the recognized features. The system includes imaging apparatus, programmable processing devices, and encoders. The methods include synchronization techniques and correlation techniques.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: September 6, 2011
    Assignee: Applied Vision Corporation
    Inventors: Richard A. Sones, Carl E. Sebeny, Brian M. Baird, Michael A. Kress, Michael L. Kress
  • Patent number: 8008641
    Abstract: An automated object inspection system is presented. The inspection system includes an imaging system to produce at least two images of said object having different optical properties and an analyzer coupled to the imaging system to receive the images and to perform a variety of inspection operations on said images. The imaging system may produce images of the object under inspection in the visible range having varying exposure values. A vision engine included in the analyzer may combine said images through an algorithmic process into one image having high light dynamic range. Alternatively, the imaging system may produce images of the object in the visible or non-visible electromagnetic range. The analyzer may perform inspection routines on said images. An imaging system capable of producing digital video is presented, wherein each frame of video produced by said camera is composed of multiple images having different optical properties.
    Type: Grant
    Filed: August 27, 2007
    Date of Patent: August 30, 2011
    Assignee: Acushnet Company
    Inventors: Kevin M. Harris, Paul A. Furze
  • Patent number: 8005292
    Abstract: An apparatus for inspecting pattern defects, the apparatus including: an image acquisition unit which acquires an image of a specimen and stores the acquired image in an image memory; a defect candidate extraction unit which performs a defect candidate extraction process by using the acquired image, which is read from the image memory; and a defect detection unit which performs a defect detection process and a defect classification process based on a partial image containing a defect candidate that is extracted by the defect candidate extraction unit, wherein the processes performed by the defect detection unit is performed off-line asynchronously with an image acquisition process that is performed by the image acquisition unit.
    Type: Grant
    Filed: September 7, 2010
    Date of Patent: August 23, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kaoru Sakai, Shunji Maeda, Takafumi Okabe
  • Publication number: 20110199478
    Abstract: An inspection program which is installed on a mobile terminal connects to a management server via a communication network and acquires inspection identifying information. The mobile terminal captures inspection subject picture of an inspection site corresponding to the inspection identifying information and inspection backup picture for backing up the inspection subject picture. The inspection program creates inspection information to associate image data of inspection subject picture and image data of inspection backup picture with the inspection identifying information. The inspection information, the image data of inspection subject picture and the image data of inspection backup picture are merged, and a hash value is calculated by a hash function based on the merged result. The hash value, the inspection information, the image data of inspection subject picture and the image data of inspection backup picture are sent to the management sever all together.
    Type: Application
    Filed: December 23, 2010
    Publication date: August 18, 2011
    Applicant: FUJIFILM Corporation
    Inventor: Atsushi ITO
  • Publication number: 20110187848
    Abstract: Computer-implemented methods, computer-readable media, and systems for classifying defects detected in a memory device area on a wafer are provided.
    Type: Application
    Filed: July 28, 2009
    Publication date: August 4, 2011
    Applicant: KLA-TENCOR CORPORATION
    Inventors: SunYong Choi, YeonHo Pae, Ellis Chang
  • Publication number: 20110175997
    Abstract: An optical inspection system (92) for inspecting a workpiece (10) including a feature (60) to be inspected is provided. The system (92) includes a workpiece transport conveyor (26) configured to transport the workpiece (10) in a nonstop manner. The system (92) also includes an illuminator (9) configured to provide a first strobed illumination field type and a second strobed illumination field type. An array of cameras (4) is configured to digitally image the feature, wherein the array of cameras (4) is configured to generate a first image of the feature with the first illumination field and a second image of the feature with the second illumination field. A processing device (90) is operably coupled to the illuminator (9) and the array of cameras (4), the processing device (90) provides an inspection result relative to the feature (60) on the workpiece (10) based, at least in part, upon the first and second images.
    Type: Application
    Filed: January 23, 2009
    Publication date: July 21, 2011
    Applicant: Cyberoptics Corporation
    Inventors: Steven K. Case, Caruso Beverly, Chuanqi Chen, Carl Haugan
  • Patent number: 7982779
    Abstract: In an inspection of a substance in which a first region is made of black resin and a second region is made of a metal, a portion surrounding the first region is registered as a first imaging range, and a portion surrounding the second region is registered as a second imaging range. As an imaging condition for the first region, a relatively slow shutter speed is registered such that an image does not become dark. Further, as an imaging condition for the second region, a relatively fast shutter speed is registered such that an image does not have unduly high white levels. As such, the imaging range and condition set by a user are supplied to a CCD camera, and then image processing is performed on a captured image from the CCD camera by an image processing device main body.
    Type: Grant
    Filed: February 10, 2005
    Date of Patent: July 19, 2011
    Assignee: Keyence Corporation
    Inventor: Yasushi Saeki
  • Publication number: 20110169942
    Abstract: An inspection system and associated method are provided for inspecting a smoking article having a smokable rod and a filter element serially secured together by a tipping material circumscribing a longitudinal periphery of the filter element and a portion of a longitudinal periphery of the smokable rod adjacent to the filter element. A transport device is configured to transport individual as-formed smoking articles from a first to a second position such that the tipping material associated with each smoking article is accessible at least about the portion of the longitudinal periphery of the smoking article. An inspection device is configured to optically inspect each smoking article, at least about the portion of the longitudinal periphery of the smoking article having the tipping material, as the smoking article is transported between the first and second positions, and to automatically determine from the optical inspection whether the inspected smoking article is defective.
    Type: Application
    Filed: January 13, 2010
    Publication date: July 14, 2011
    Inventors: Franklin Forrest Brantley, Eddie Lee Nuckols, Darrell Thomas Dixon, Timothy Frederick Thomas, Calvin Wayne Henderson, Balager Ademe
  • Patent number: 7973826
    Abstract: There is provided a program creation apparatus with improved operability in checking an operation of a created control program, including: a program generating section for acquiring a camera image from a camera based upon an image pick-up trigger signal, to extract a measurement result from the acquired camera image as a control program for the image processing controller; a simulation part for executing the control program; and a communication section for transferring the control program to the image processing controller, wherein the simulation part includes an offline simulation section for extracting a measurement result from a camera image previously held as a registration image, and an online simulation section for acquiring a camera image from the camera through the image processing controller when executing the control program, to extract the measurement result from the acquired camera image.
    Type: Grant
    Filed: October 23, 2008
    Date of Patent: July 5, 2011
    Assignee: Keyence Corporation
    Inventors: Teruhiko Maeda, Toshihiro Konaka
  • Publication number: 20110141269
    Abstract: Various embodiments are directed to apparatuses for inspecting an on-line product web moving relative to the apparatus in a machine direction. The apparatuses may comprise a line-scan camera defining a field of view and positioned such that the field of view includes a portion of the product web. A camera control system may be in electronic communication with the camera and may be configured to receive from the web velocity sensor web velocity data indicating a velocity of the product web and convert the web velocity data to a line trigger signal. The line trigger signal may indicate a temporal frequency of camera image captures necessary to achieve a constant machine direction pixel resolution. Additionally, the camera control system may be configured to receive product position data and generate a frame trigger signal considering the product position data. The frame trigger signal may indicate a break between image frames.
    Type: Application
    Filed: December 16, 2009
    Publication date: June 16, 2011
    Inventors: Stephen Michael Varga, Charles Jeffrey Spaulding
  • Patent number: 7932922
    Abstract: In a web-forming machine, a threading tail is formed from the web. The threading tail is transferred to the production section (10, 12-14) of the web-forming machine including a draw section (21). Monitoring takes place of both the formation of the threading tail and its transfer to the draw point (21). The holding point (24) and its environment that terminates the tail threading of the production section (10, 12-14) in question are additionally monitored, in order to detect the threading tail at the holding point (24) and thus to determine the success of the tail threading.
    Type: Grant
    Filed: November 19, 2004
    Date of Patent: April 26, 2011
    Assignee: Metso Paper, Inc.
    Inventors: Vesa Ahvenniemi, Juha Laitio
  • Patent number: 7916170
    Abstract: The Invention provides specific and proprietary means to digitally record CCTV inspection Header Information, Defect Observation Data, GPS information, and Distance Information; combine this data into a single digital file; and store it within single video files preferable over digital video format like MPEG, DiviX, Microsoft Windows Media, DVD, or related formats—from which it may be retrieved by compatible application software and serve as a basis for inspection viewing, reviewing, evaluation, mapping, report generation, and other uses provided or supported by compatible application software features. Formatted media can be played with media player like Microsoft media player, real player, Dix Player, Quick time player like computer based player and/or with any external media player like DVD player which can be connected to system like television for viewing.
    Type: Grant
    Filed: June 7, 2006
    Date of Patent: March 29, 2011
    Inventor: Robert Charles Soltysik
  • Publication number: 20110050881
    Abstract: There is provided an accurate association between an inspection result inputted from a mobile terminal and the accurate position and direction on the drawing of a shooting point of an inspection photo shot by a digital camera. In step S21, the PC 3 receives inspection result information sent from the mobile terminal 1 through the communication device 35 and stores the received inspection result information in the storage device 33. In step S22, the PC 3 inputs a set of the inspection photo and the shooting point ID to the storage device 33. In step S23, the processing device 31 of the PC 3 associates the inspection result information and the inspection photo, using the shooting point ID which is contained in the inspection result information stored in the storage device 33 and the shooting point ID which is associated with the inspection photo as keys.
    Type: Application
    Filed: August 20, 2010
    Publication date: March 3, 2011
    Applicant: FUJIFILM CORPORATION
    Inventor: Hajime TERAYOKO
  • Publication number: 20110013013
    Abstract: A wafer inspection apparatus that performs surface inspection and internal inspection of solar cells using a single apparatus. The wafer inspection apparatus includes a loading unit configured to allow a cassette to be lifted up or lowered by an elevator. A surface inspection unit includes a plurality of stages, thus performing surface inspection of each wafer using a first vision module. A wafer transfer unit has a rotatably installed center portion and has both ends provided with adsorption parts. An internal inspection unit is configured such that a conveyor is installed to allow the wafer to be transferred, thus performing internal inspection of the transferred wafer through a second vision module. An unloading unit enables wafers having completed the internal inspection to be sequentially loaded onto the unloading unit. A control unit controls a series of wafer inspection procedures.
    Type: Application
    Filed: July 15, 2010
    Publication date: January 20, 2011
    Inventors: Yeu Yong LEE, Jung-Jae IM
  • Publication number: 20110007147
    Abstract: A system and method for inspecting stents can involve an inspection camera to take an image of the stent and a computer system for analyzing the image to determine the presence of any coating defects. The determination can be made by masking out a portion of the stent, identifying deviations from a strut edge, and/or highlighting features protruding from a stent external boundary defining an outer diameter. The image can be taken after a focus feedback camera determines the position of the stent.
    Type: Application
    Filed: September 22, 2010
    Publication date: January 13, 2011
    Inventors: Ian Cameron, Andrew David Coppln Maw, Hong Zhang, Calden Wloka, Sidney Watterodt, Sang joon Park, Anthony S. Andreacchi, Yung-Ming Chen, Arnoldo M. Currlin, Antonio Garcia, Jason Van Sciver, Bryan D. Glenn
  • Publication number: 20100329539
    Abstract: The present disclosure includes a system for inspecting a manufactured composite component. In some embodiments, the system includes an inspection assembly having master camera assembly and a slave camera assembly. The master camera assembly and the slave camera assembly each include a machine vision camera and a lighting system. The lighting assembly may include back lights and spot lights. In some embodiments, the master camera and the slave camera are each connected to a telecentric lens. The composite component is inspected by moving it through the inspection assembly, taking images, and processing the images to measure features on the component.
    Type: Application
    Filed: June 30, 2009
    Publication date: December 30, 2010
    Applicant: Weyerhaeuser NR Company
    Inventors: Benjamin T. Blaine, Kristopher Ryan Okelberry, Joanna Davis, Tasche L. Streib
  • Patent number: 7860295
    Abstract: A method and a unit for determining the spatial position of a wheel rim with respect to a measuring unit having at least one camera, wherein the wheel rim lies in the viewing field of the camera, including making available of a model, that describes a model body of a localizable wheel rim geometry detail as well as the spatial position of the model body with respect to the measuring unit, through model parameters, capturing of a picture of the wheel rim geometry detail of the wheel rim with the camera, fitting the image of the model body resulting from the model parameters to the picture of the wheel rim geometry detail through changing the model parameters of the model, and tracking the changes of the model parameters upon the fitting, whereby the data related to the position of the model body of the wheel rim geometry detail reflect the spatial position of the wheel rim-geometry detail and, thereby, the wheel rim itself, when the image resulting from the model parameters, of the wheel rim-geometry detail fi
    Type: Grant
    Filed: March 18, 2005
    Date of Patent: December 28, 2010
    Assignee: Beissbarth GmbH
    Inventors: Karin Donner, Hermann Bux, Stefan Schommer, Rudolf Engl
  • Publication number: 20100309308
    Abstract: Apparatus for inspection includes an imaging assembly, including a plurality of cameras, which are mounted in different, respective locations in the imaging assembly and are configured to capture respective images of a sample. A motion assembly is configured to move at least one of the imaging assembly and the sample so as to cause the imaging assembly to scan the sample with a scan accuracy that is limited by a predetermined position tolerance. An image processor is coupled to receive and process the images captured by the cameras so as to locate a defect in the sample with a position accuracy that is finer than the position tolerance.
    Type: Application
    Filed: January 11, 2009
    Publication date: December 9, 2010
    Applicant: Orbotech Ltd.
    Inventors: Ofer Saphier, Israel Shappira, Yaakov Davidi