Quality Inspection Patents (Class 348/92)
  • Patent number: 7570801
    Abstract: A device comprises an imaging device, a placement element connected to the imaging device for placing a component on a substrate, as well as an optical system having an optical axis. The placement element and the imaging device can be jointly moved relative to the optical system to at least a position in which the optical axis is located between the imaging device and the placement element, wherein the position of a component supported by the placement element can be detected by means of the imaging device. The optical system is telecentric at least in an image space located near the imaging device as well as in an object space located near the placement element.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: August 4, 2009
    Assignee: Assembleon N.V.
    Inventor: Joseph L. Horijon
  • Patent number: 7570795
    Abstract: A system and method are provided for a “multi-region” autofocus video tool-type or mode within a machine vision inspection system. The user may efficiently define multiple regions of interest that are grouped as a “multi-region” set. The autofocus operations for the multi-region set are defined with a shared set of autofocus parameters. The same set of autofocus images may be used for the autofocus operations of the multi-region set. The user may conveniently also define individual autofocus regions of interest, defined with individual autofocus parameters, within the same field of view. Various user interface features allow a user to conveniently change between the individual autofocus tool-type or mode and the multi-region autofocus tool-type or mode.
    Type: Grant
    Filed: July 18, 2006
    Date of Patent: August 4, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Dahai Yu, Barry Eugene Saylor, Ana M. Tessadro
  • Patent number: 7567273
    Abstract: A system is presented that applies M×N×K computational units to calculating image parameters on N picture images captured simultaneously by N digital camera devices, where there are N groups of frame grabber units, each containing M frame grabbers in which there are K computational units. The data operated on by a computational unit is separate and independent from the image data operated on by the other computational units. This results in a performance speedup of M×N×K compared to one computational unit making the same computations. A master frame grabber unit controls the illumination of the N digital camera devices, and synchronizes the illumination with the clocks of the N digital camera devices.
    Type: Grant
    Filed: November 3, 2004
    Date of Patent: July 28, 2009
    Assignee: Digital Imaging Systems GmbH
    Inventors: Horst Knoedgen, Dirk Huettmann
  • Publication number: 20090174767
    Abstract: A digital camera 28 that is capable of color photography and that has an automatic exposure-adjustment function and an automatic focusing function is mounted in such a way that it can be swiveled by means of a tilt device 29 to a prescribed position in relation to a photographed object 30. The digital camera is swiveled by the tilt device such that the center of the screen moves along a predetermined prescribed route 31 a on subject surface 31. Every time the digital camera's field of view reaches a prescribed location on the route, a portion of the subject surface and a portion of a member 35 that is set on the subject surface are photographed by the digital camera as a photographed range. It is desirable to adjust the focal distance of the digital camera such that the image resolution of each photographed range is nearly constant. The photographed member is a liquid gasket that is applied in bead form along the route and that is detected as defective if its width exceeds a prescribed range.
    Type: Application
    Filed: March 7, 2005
    Publication date: July 9, 2009
    Inventors: Toru Kishimoto, Eiji Amaki, Yukiyoshi Umeda, Naoyuki Sugiura
  • Publication number: 20090175530
    Abstract: Methods and apparatuses for quality control and detecting errors related to the manufacturing and production of more accurate patterns and resultant devices are provided. The patterns or devices may include patterns used in display applications such as TFT-LCD, OLED, SED, PDP, FED, LTPS-LCD and similar display technologies using at least partially cyclical patterns.
    Type: Application
    Filed: November 12, 2008
    Publication date: July 9, 2009
    Inventors: Fredrik Sjostrom, Peter Ekberg
  • Publication number: 20090147082
    Abstract: A method for quality control of a stretch-blow-molded plastic container by inspecting its base, which method is easy to execute and is not highly susceptible to faults. Such inspection of the container bases includes determining quality features such as the surface area of an unstretched and/or only slightly stretched region of the base of the plastic container.
    Type: Application
    Filed: August 29, 2006
    Publication date: June 11, 2009
    Applicant: Krones AG
    Inventors: Christian Detrois, Peter Lindner, Rainer Kwirandt, Anton Niedermeier, Stefan Piana
  • Publication number: 20090141965
    Abstract: The invention relates to a method of displaying and monitoring the profile of a weld bead (4), in which, placed inside the groove, there is an assembly (10) comprising, facing one another, an image acquisition means (11), a light source (12), the beam of which is directed towards said image acquisition means, and, between the image acquisition means and the light source, a mask (13); the optical axis of the image acquisition means (11) is oriented so as to be approximately parallel to the sidewalls (5, 6) of the groove (3); a light beam produced by the light source (12) is directed towards the mask (13) and the image acquisition means (11); a central shadow zone and a peripheral halo are formed by means of the light beam and the mask (13), said halo illuminating, approximately perpendicularly, the weld bead (4) and the sidewalls (5, 6); the profile of the weld bead (4) and the sidewalls (5, 6) are displayed on a display/monitoring means; and said assembly (10) is moved inside the groove (3) longitudinally and
    Type: Application
    Filed: November 4, 2008
    Publication date: June 4, 2009
    Applicant: AREVA NP
    Inventors: Jean-Claude Ferlay, Jean-Mathieu Mestre-Bresson
  • Patent number: 7538862
    Abstract: A testing system (200) for digital camera modules (100) includes a first testing module (50), an assembling mechanism (60), a focusing module (62), a second testing module (70), a carrying mechanism (80), and a main processor (90). The carrying mechanism supports and transports subassemblies of the digital camera modules and the digital camera modules between the first testing module, the assembling mechanism, the focusing module and the second testing module. The first testing module, the assembling mechanism, the focusing module, the carrying mechanism, and the second testing module are all electronically connected with the main processor.
    Type: Grant
    Filed: November 3, 2006
    Date of Patent: May 26, 2009
    Assignee: Altus Technology Inc.
    Inventors: Steven Webster, Ying-Cheng Wu, Yuan-Po Wang
  • Publication number: 20090109287
    Abstract: An inspecting system of an assembly, for inspecting the assembly, by obtaining three-dimensional position relationship, in short time, for each of parts building up the assembly, comprises: a data editor/processor portion 2 for storing design data therein, and for producing/editing a calculated projection view; a brightness calculating portion 3 for calculating brightness in vicinity of boundaries, which are obtained when photographing the part to be extracted in plural numbers of directions, from the design data, for each direction; a sensitivity determining portion 4 for determining sensitivity of the photographing apparatus upon basis of the brightness, so that the projection image becomes clear in the vicinity of said boundaries; a photographing apparatus 5 for obtaining the projection images in the plural number of directions for the assembly conveyed; a video processor portion 6 for conducting video processing with converting the projection image into an electric signal, as an actual projection view; an
    Type: Application
    Filed: October 29, 2008
    Publication date: April 30, 2009
    Inventors: Ichiro SASAKI, Noriyuki Sadaoka, Masatoshi Watanabe
  • Patent number: 7486309
    Abstract: A test system for digital camera modules used in consumer electronics, e.g. cellular phones and PDA's is shown. The test system comprises of a tester and a module handler that is aimed at reducing test time by an order of magnitude. The Test system has an image-processing unit that uses N-parallel processor to reduce the computation time on a test image by approximately the number of parallel processors. The handler is controlled by the tester to select, focus and test small digital camera modules. There are two test stations in the handler, where a first test station performs tests on a first camera module while a second test station is loaded with a second camera module, thus burying the loading time within the test time.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: February 3, 2009
    Assignee: Digital Imaging Systems GmbH
    Inventors: Horst Knoedgen, Dirk Huettmann
  • Publication number: 20090015668
    Abstract: The present invention relates to an apparatus for confirming three-dimensional model data or the like, capable of confirming easily, efficiently, and precisely whether three-dimensional model data including an attached object attached to a machine tool and at least a part of the machine tool good are accurate.
    Type: Application
    Filed: August 31, 2007
    Publication date: January 15, 2009
    Applicants: MORI SEIKI CO., LTD., INTELLIGENT MANUFACTURING SYSTEMS INTERNATIONAL
    Inventors: Xiaodong Tian, Makoto Fujishima
  • Patent number: 7474329
    Abstract: An apparatus to evaluate an illuminated panel comprises a camera to acquire a real-time digital color image of the illuminated panel and a stored digital color image of a standard illuminated panel. A monitor is provided to alternately display the real-time image and the stored image to detect any differences in the illuminated panel.
    Type: Grant
    Filed: December 13, 2006
    Date of Patent: January 6, 2009
    Assignee: BAE Systems Controls, Inc.
    Inventors: Richard Duane Hill, Stephen P. Cook, Thomas J. Lipko, Robert Burns
  • Patent number: 7406189
    Abstract: A device for inspecting microscopic objects. A plurality of LEDS is arranged in an array underneath a lens. Some of the LEDS are lighted and some of the LEDS are unlighted. A computer is in control of the LED array. The computer turns on selected LEDS from the array to form the lighted LEDS. Also, the computer turns off selected LEDS from the array to form the unlighted LEDS. The lighted LEDS form a pattern of lighted LEDS underneath the lens. In a preferred embodiment, the lens is connected to a computer controlled camera and the microscopic objects are microscopic crystals.
    Type: Grant
    Filed: July 25, 2003
    Date of Patent: July 29, 2008
    Inventors: Brian L. Ganz, John A. Adams, James Hutchings, Andrew Provost, Joseph Gottlieb, David W. Jewell, Mandel W. Mickley, John Andrew Moulds, Christopher T. Brovold
  • Patent number: 7394926
    Abstract: Improved user interface methods facilitate navigation and programming operations for a magnified machine vision inspection system. Large composite images are determined and stored. The composite images include workpiece features that are distributed beyond the limits of a single magnified field of view of the machine vision system. Despite their size, the composite images may be recalled and displayed in a user-friendly manner that approximates a smooth, real-time, zoom effect. The user interface may include controls that allow a user to easily define a set of workpiece features to be inspected using a composite image, and to easily position the machine vision system to view those workpiece features for the purpose of programming inspection operations for them.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: July 1, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Robert Kamil Bryll, Vidya Venkatachalam
  • Patent number: 7388979
    Abstract: The present invention relates to a pattern defect inspection method and apparatus that reveal ultramicroscopic defects on an inspection target in which ultramicroscopic circuit patterns are formed, and inspect the defects with high sensitivity and at a high speed. The present invention provides a pattern inspection apparatus for comparing the images of corresponding areas of two formed patterns that should be identical with each other, and judging any mismatched image area as a defect. The pattern inspection apparatus includes means for performing an image comparison process on a plurality of areas in a parallel manner. Further, the pattern inspection apparatus also includes means for converting the gradation of the image signals of compared images in each of a plurality of different processes. Therefore, the present invention can properly detect defects even if the same patterns of compared images differ in brightness.
    Type: Grant
    Filed: November 22, 2004
    Date of Patent: June 17, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kaoru Sakai, Shunji Maeda, Takafumi Okabe
  • Patent number: 7388600
    Abstract: The read head (1) for a postal sorting installation serves to pick up a digital image of each postal object using a high-resolution camera (3) providing a multiple level gray scale. The read head also has a low-resolution color camera (4), the two cameras (3, 4) being placed in such a manner as to acquire simultaneously two superposable digital images of each postal object. The superposable high-resolution gray scale image and low-resolution color image are intended to be combined in order to provide a high-resolution color image.
    Type: Grant
    Filed: July 10, 2003
    Date of Patent: June 17, 2008
    Assignee: Solystic
    Inventors: Cyrille Prudhomme, Claude Mitte, Agnés Gamez Cuatzin
  • Patent number: 7350379
    Abstract: The present invention provides a quality control method and a quality control apparatus for use in the formation of a glass product. A feeder mechanism cuts a column-like molten glass pushed out through an orifice thereof into a glass gob and allows each glass gob to fall with gravity from the orifice. A predetermined glass product is formed from the glass gob after delivering the fallen glass gob to a predetermined position. According to the present invention, the glass gob produced by the feeder mechanism is observed by a plurality of optical observing means spaced apart from each other during a falling process of the glass gob, and three-dimensional coordinates data of the entire surface of the glass gob is generated. Measurement data relating to at least one of a volume, a weight, a surface shape, a length, a thickness, an angle in a falling direction, and a cut surface shape of the glass gob is produced based on the three-dimensional coordinates data.
    Type: Grant
    Filed: July 19, 2002
    Date of Patent: April 1, 2008
    Assignee: Nihon Yamamura Glass Co., Ltd.
    Inventors: Mitsuo Ueda, Melvin Lim Si, Kenichi Gomyo, Satoshi Sugimoto
  • Publication number: 20080069428
    Abstract: A method for digital video gauging parts comprising obtaining image data of a part to be gauged, identifying at least one of a plurality of features of the image data for inspection, calculating at least one of a plurality of metrics of said at least one of a plurality of features, creating at least one of a plurality of dimension lines and at least one of a plurality of extension lines corresponding to said at least one of a plurality of features, and displaying on a viewing device in mechanical drawing format said at least one of a plurality of dimension lines, said at least one of a plurality of extension lines, and text of said at least one of a plurality of metrics corresponding to said at least one of a plurality of features in combination with said image data.
    Type: Application
    Filed: August 23, 2006
    Publication date: March 20, 2008
    Inventors: Robert Schulkin, Eduardo D. Schulkin
  • Patent number: 7346411
    Abstract: The present system enables the monitoring and automatic control of the tolerance in splice overlap of textile play , though the identification of the overlap area, identification and counting of textile cords in the overlap area, and the generation of a control signal for the manufacturing equipment based on parameters and criteria defined by a user. The system includes an image acquisition sub-assembly that contains a lighting module, artificial vision module, and respective elements of support, fixation, conditioning and adjustment. The system also includes a quality control computer program that has a module of morphologic image analysis for detection and recognition of the overlap of the ply, detecting and counting of cords in the overlap area, a module of support to the decision of acceptance/rejection of the ply based on parameters defined by the user and a module of an interface with production equipment.
    Type: Grant
    Filed: August 29, 2003
    Date of Patent: March 18, 2008
    Assignee: Continental Mabor-Industria de Pneus, S.A.
    Inventors: Nuno Filipe Martins Silva, Andre Teixeira Puga, Antonio Alberto da Silva Maia, Ireneu Manuel Silva Dias, Agostinho Jose Barbosa Ferreira, Filipe de Sousa Pinto
  • Publication number: 20080030575
    Abstract: A system to provide remote support may include a video camera to acquire a video image of a chosen scene and a field augmenting device to present the video image. The system may also include a module associated with the field augmenting device to permit augmentation of the video image by field personnel, wherein augmentation comprises at least one of selection of a feature in the video image and association of any attributes to the selected feature. A support site augmenting device may be provided to receive a video transmission including the video image and any augmentation by the field personnel over a network from the field augmenting device and to present the video image including any augmentation to support personnel.
    Type: Application
    Filed: August 3, 2006
    Publication date: February 7, 2008
    Inventors: Paul R. Davies, Anthony E. Majoros
  • Patent number: 7298870
    Abstract: A color sorting apparatus capable of displaying images of granules picked up by a CCD sensor on a panel and performing sensibility control of defective granules while observing the displayed images is provided. The color sorting apparatus comprises a contour processor for outputting contour binary data from the picked-up images and a contour threshold, a first defective determination circuit for outputting the defective part of the granule having a predetermined area or more of part exceeding a first threshold in the form of first defective pixel binary data, and a second defective determination circuit for outputting the defective part of the granule having a part exceeding a second threshold being greater than the first threshold in the form of second defective pixel binary data. The first defective pixel binary data are displayed on a monitor for thin coloration. The second defective pixel binary data are displayed on a monitor for partial coloration.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: November 20, 2007
    Assignee: Satake Corporation
    Inventors: Norimasa Ikeda, Nobuyoshi Ikeda
  • Patent number: 7289655
    Abstract: The invention provides a device to inspect an illumination optical device and a method to inspect an illumination optical device that make it possible to efficiently inspect illumination optical devices and to control manufacturing cost. A lens array inspecting device is provided with a light source device to emit a parallel luminous flux, lens array holders to retain lens arrays, which are test objects that split the parallel luminous flux into a plurality of partial luminous fluxes, and a ground glass on which the optical images of the luminous fluxes emitted through the lens arrays are projected. On the ground glass, a parting frame appropriate to a design illumination region is formed. Therefore, whether the lens arrays are defective or non-defective can be determined by checking whether the optical images projected onto the ground glass include the area of the parting frame.
    Type: Grant
    Filed: July 8, 2002
    Date of Patent: October 30, 2007
    Assignee: Seiko Epson Corporation
    Inventor: Masashi Kitabayashi
  • Publication number: 20070182814
    Abstract: In the present invention, an image of a substrate is picked up by an image pickup unit with the substrate being held by a transfer member. A drive unit for the transfer member is controlled by a driving signal from a first controller. A driving signal outputted to the first controller is outputted also to a second controller so that the second controller controls the image pickup unit based on the driving signal, thereby synchronizing drive of the transfer member with the image pickup by the image pickup unit. According to the present invention, the throughput in performing a defect inspection for the substrate is improved and a precise image is captured and subjected to accurate inspection.
    Type: Application
    Filed: January 24, 2007
    Publication date: August 9, 2007
    Inventors: Makoto Hayakawa, Hiroshi Tomita
  • Publication number: 20070157274
    Abstract: A system for testing a plurality of multimedia devices is provided, the system comprising a first multi-input device, a second multi-input device, a video-capturing device, and a console. The first multi-input device is connected to one end of each of the plurality of multimedia devices, for transmitting original video data to the plurality of multimedia devices. The second multi-input device is connected to the other end of each of the plurality of multimedia devices. The video capturing device is connected to the second multi-input device. The second multi-input device is used for switching connections between the plurality of multimedia devices and the video capturing device.
    Type: Application
    Filed: September 22, 2006
    Publication date: July 5, 2007
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventor: WEN-TING CHIU
  • Patent number: 7162073
    Abstract: A method is provided for detecting spot defects on an object when an allowable variation (called the “background”) in the appearance of the object can be modeled. Methods are also provided for measuring and classifying detected spot defects. An alignment model is used to align the image of the object, a background model is then used to estimate the (possibly different) background in each region, and each background is substantially removed from the image so as to form a foreground image on which blob analysis can be applied to detect spot defects, the blob analysis using a threshold image that accommodates different noise statistics for each region. The method facilitates robust spot defect inspection of fiber optic end faces, or of any object with different object regions. The method also allows use of blob analysis over a larger range of conditions, including conditions that make simple blob analysis infeasible.
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: January 9, 2007
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Yusuf Akgul, Ivan Bachelder, Adam Wagman, Jason Davis, Juha Koljonen, Prabhav Morje
  • Patent number: 7145595
    Abstract: An image processing and inspection system includes a master device (10) having a video camera (40) and a first controller (20) responsible for processing and inspecting the image of an object (1) in accordance with inspection criteria. Intercommunicated (12) with the master device (10) is a personal computer (100) equipped with a second monitor (120), and a second input member (102,104). The motion-picture taken by the camera (40) for inspection on the side of the master device (10) is transmitted to the computer (100) so as to be displayed on the second monitor (120) as a real-time image of the object (1) for easy confirmation of the object on the side of the computer (100), thereby enabling to determine the inspection criteria on the side of the computer (100) while monitoring the real-time image of the object (1).
    Type: Grant
    Filed: August 28, 2002
    Date of Patent: December 5, 2006
    Assignee: Matsushita Electric Works, Ltd.
    Inventors: Toshiki Yamane, Masayuki Hattori, Jun Nishijima, Osamu Iijima, Yoshinori Koizumi
  • Patent number: 7127993
    Abstract: The invention relates to a positioning apparatus for positioning flexible printing plates on printing cylinders, wherein the printing plates are provided with at least one mark functioning as reference, wherein the apparatus comprises: a support device for a printing cylinder; at least one camera which is adapted to record the image of the at least one mark of the printing plate positioned on the printing cylinder; and a monitor for enlarged display of the image recorded by the at least one camera, wherein the positioning apparatus is provided with a registering device for registering the image recorded by the camera. Using such a registering device it is possible to establish that the marks are located at the correct position. By making a copy of the data thus inputted into the register, evidence can be provided that the flexible printing plate is placed in the correct manner.
    Type: Grant
    Filed: May 14, 2004
    Date of Patent: October 31, 2006
    Assignee: AV Flexologic B.V.
    Inventor: Petrus Johannes Marie Otten
  • Patent number: 7126628
    Abstract: A screw auto-detection and selection device comprises a rotary machine table; a light source generating unit; a recording control unit; a camera detecting unit; and a time scale cam unit. The feature of device is that the camera detecting unit includes a press, an ejecting and a second camera detector. The press has a press arm extending above the notch of the dispatching disk and an elastic press installed at a predetermined position of the press arm. An ejecting has an ejecting pin and a movement limiting unit for ejecting a screw pressed by the press arm so that the screw is aligned to a radiating hole of the light source generating unit.
    Type: Grant
    Filed: May 27, 2003
    Date of Patent: October 24, 2006
    Inventor: Ying-Chung Liu
  • Patent number: 7061522
    Abstract: In an optical fiber observing image processing apparatus, at least two different capturing modes is provided in an image capturing means for capturing image data from two or more television cameras, so that, by automatically switching capturing modes in synchronous with or independently from progress of the image processing, high speed processing can be achieved regardless of limitation of a data capturing speed. A scanning converting means is provided in a rear stage of the image capturing means, and a plurality of different transfer modes for transferring data between the scanning converting means and the image capturing means are prepared. Further, a delay means may be provided in a front stage of the scanning converting means.
    Type: Grant
    Filed: February 3, 1999
    Date of Patent: June 13, 2006
    Assignee: The Furukawa Electric Co., Ltd.
    Inventors: Hidekazu Kojima, Seiryo Mishima
  • Patent number: 7027082
    Abstract: An image recording system includes first imaging means for imaging operations of manufacturing equipment in a production line, second imaging means arranged downstream from the manufacturing equipment for imaging articles processed by the manufacturing equipment, inspection means for inspecting the processed articles based on image data outputted from the second imaging means, and an image recording apparatus for acquiring data outputted from the first imaging means and the inspection means, wherein the image recording apparatus is equipped with a temporary storage portion for temporarily storing image data from the imaging means, storage means, and control means for reading out any desired interval from the image data stored a prescribed time interval portion in the past in the temporary storage portion and storing such read out interval when a signal based on inspection results outputted from the inspection means is received.
    Type: Grant
    Filed: March 16, 2001
    Date of Patent: April 11, 2006
    Assignee: Omron Corporation
    Inventors: Toyoo Iida, Masanori Sato, Tomoki Ishizawa, Hitoshi Oba
  • Patent number: 6961081
    Abstract: A system for inspecting signals of the circuits on a panel includes a moveable stage with a transparent work area for holding the panel to be tested; a probe for contacting the panel; a tester for receiving a signal via the probe; an image sensing device disposed in an opposite side to the probe with respect to the stage; and image display device coupled to the image sensing device. The image display device includes a screen having a cross mark. When the system is operating, the probe is aligned with the image sensing device such that the captured image of the probe is displayed on the center of the cross.
    Type: Grant
    Filed: June 14, 2002
    Date of Patent: November 1, 2005
    Assignee: Hannstar Display Corp.
    Inventor: Cheng Ming Chen
  • Patent number: 6959108
    Abstract: In an inspection system, workpieces to be inspected are consecutively and automatically launched to pass unsupported through the field of view of a plurality of cameras. As a workpiece passes through the field of view of the cameras, a sensor is activated which communicates with a computer system to activate the cameras to capture an unobstructed image, or image data, of the workpiece. The image data is then analyzed by a computer program to verify whether the image data indicates that the workpiece does not meet established criteria and therefore is considered defective. If the image does not meet the established criteria, the workpiece is rejected and segregated from workpieces which have not been identified as defective.
    Type: Grant
    Filed: December 6, 2001
    Date of Patent: October 25, 2005
    Assignee: Interactive Design, Inc.
    Inventors: Todd F. Bartelt, Richard A. Sizemore, Robert E. Larson
  • Patent number: 6958768
    Abstract: A system for inspecting components is provided. The system includes a CMOS imaging system generating image data, such as pixel data from a pixel array. An image analysis system is connected to the CMOS imaging system, the image analysis system receiving the image data and generating image analysis data. The CMOS imaging system generates the image data at a rate that allows the CMOS imaging device to be used for inspecting components.
    Type: Grant
    Filed: October 20, 2000
    Date of Patent: October 25, 2005
    Assignee: ASTI Holdings Limited
    Inventors: Sreenivas Rao, Noor Ashedah Binti Jusoh
  • Patent number: 6952231
    Abstract: The invention relates to an apparatus based on the telecentric imaging system for forming an image of a linear zone (17) of an object (1). The apparatus comprises a non-telecentric camera (9) consisting of an objective (8) and an image plane (19) formed by a row of photosensitive cells (15) as well as telecentric imaging means (18) between the objective and the object. The telecentric means comprise a concave strip mirror (6), which is aligned with said row of cells and with the aperture of said objective located in its focal plane, as well as a strip-like plane mirror (5) between the parabolic mirror and the objective, whereby the radiation being reflected from the objective continues via the parabolic mirror and the planar mirror further to the objective and from there to the image plane. In the apparatus there is further a scattered light source (7) which lightens the object. The apparatus is adapted for measuring the dimensions of the width parts of the object.
    Type: Grant
    Filed: September 28, 2000
    Date of Patent: October 4, 2005
    Assignee: Oy Ekspansio Engineering Limited
    Inventors: Jyri Paavola, Lasse Lindström
  • Patent number: 6940537
    Abstract: To provide an inspecting apparatus of a printed state or the like in a flexible printed circuit board which requires no skill, generates no error by oversight and further improves an operation efficiency, a substrate feeding out unit (2), a substrate inverting unit (4), a camera inspecting unit (5), a substrate inverting unit (9) and a defect point marking unit (10) for a printed state or the like are sequentially placed on working tables (1, 1) along a moving direction of a flexible printed circuit board, in this order, the substrate inverting units (4, 9) respectively invert the flexible printed circuit board, the camera inspecting unit (5) detects a print defect point by means of a camera (8), and the defect point marking unit (10) applies a marking to the print defect point by a laser marker (13) on the basis of a signal output from the camera inspecting unit (5).
    Type: Grant
    Filed: August 28, 2002
    Date of Patent: September 6, 2005
    Assignee: Minami Co., Ltd.
    Inventor: Takehiko Murakami
  • Patent number: 6937754
    Abstract: To inspect a finer device pattern formed in a semiconductor wafer, there is provided an inspection equipment including means for supporting a semiconductor wafer as a specimen and moving it to a predetermined position of inspection, means for projecting an ultraviolet light onto the specimen supported on the specimen supporting means, an ultraviolet imaging means for detecting a reflected light or transmitted light from the specimen illuminated by the ultraviolet light projecting means and picking up an image of the specimen, means for processing the image picked up by the ultraviolet imaging means. The image picked up by the imaging means is processed and analyzed by the image processing means to inspect the specimen.
    Type: Grant
    Filed: June 7, 2000
    Date of Patent: August 30, 2005
    Assignee: Sony Corporation
    Inventor: Naoya Eguchi
  • Publication number: 20040252190
    Abstract: A system for inspecting an object, the system comprising a camera; a work surface for receiving the object; and an apparatus for processing an image of the object taken by the camera wherein, during the capture of an image by the camera, the camera and the object are fixed with respect to one another. The processing apparatus identifies those image data components that represent the an edge of the object in an image plane, and projects each image edge data component onto the object plane.
    Type: Application
    Filed: April 12, 2004
    Publication date: December 16, 2004
    Inventor: Jan Antonis
  • Patent number: 6831995
    Abstract: In image-capture inspection of electronic displays, the object of the present invention is to reduce moire generation, improve inspection precision by making pixel defects easier to discover, and allowing quantitative evaluation of these pixel defects. The relative positioning of the electronic display and an imaging element is changed by very small amounts of 1/n of the pixel pitch. The n images are arranged by pixel and the images are combined by taking the moving average of the image data values to reduce the image-capture moires generated during the image capture operations. The composite image is used to inspect pixel defects in the electronic display.
    Type: Grant
    Filed: March 8, 2000
    Date of Patent: December 14, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Toshio Asano, Kaoru Sakai, Jun Mochizuki, Tatsuo Horiuchi, Hirofumi Nakatoyodome, Tadashi Furukawa, Atsuo Ohsawa
  • Publication number: 20040218040
    Abstract: The present invention is an appearance inspection apparatus and method utilizing multiple light sources in a lighting unit 30 to alternately irradiate, line by line, side light from a side light source and slit light from a slit light source onto board 1 to be inspected. A correction value memory unit stores digital correction values required for correcting shadings for the side light source and the slit light source and an analysis unit utilizes these digital correction values to correct shadings on the image data. A highly accurate image is thus obtained.
    Type: Application
    Filed: January 23, 2004
    Publication date: November 4, 2004
    Inventor: Yoshihiro Akiyama
  • Patent number: 6809756
    Abstract: The invention relates to a method for monitoring a process. The image information received from cameras monitoring various positions of the process is stored in digital form and various cameras positions are alternately selected for a display and analysis on the screen of a computer. The screen is also used for displaying an image variation graph representing the image variation data of images preceding and following the image to be analyzed. The system includes selector elements (5) for selecting a camera position representing the highest-level image variation for an automated display.
    Type: Grant
    Filed: January 21, 2000
    Date of Patent: October 26, 2004
    Assignee: Honeywell Oy
    Inventors: Mika Valkonen, Jorma Snellman, Juha Toivonen
  • Patent number: 6804629
    Abstract: A production management system 1 includes a production line 2, a plurality of image-taking components 22 and a communications line 5. The production line 2 includes a combination weigher 2a and a bagger 2b. The communications line 5 is capable of distributing operating conditions from the combination weigher 2a and the bagger 2b. The plurality of image-taking components 22 are provided at the combination weigher 2a and the bagger 2b respectively, and are used for checking operating conditions. The communications line 5 is capable of distributing image information from the plurality of image-taking components 22. The present invention provides at low cost a production management system having a production line that includes a combination weigher and a bagger and is capable of using image information for monitoring.
    Type: Grant
    Filed: December 19, 2001
    Date of Patent: October 12, 2004
    Assignee: Ishida Co., Ltd.
    Inventors: Nobuki Hashiguchi, Katsuaki Kono
  • Publication number: 20040183900
    Abstract: The system automatically performs analysis on images from a remote video inspection apparatus to provide an operator with an indication of areas that are potentially out of specification, or which require more detailed analysis by the operator. Pattern recognition algorithms are applied to sequential images to search for anomalies or defects in the images. The search area is initially limited to edges of the item being inspected where the probability of defects is much higher. To reduce the processing requirements and probability of false detection, the search area is narrowed to a limited field of view and depth. Defects such as dents and small cracks are detected using stereo measurement techniques or by projecting a known supplementary image into the defect. These techniques are used to provide an image disparity map. Using known triangulation algorithms, this map provides depth and distance information to the processing system.
    Type: Application
    Filed: March 20, 2003
    Publication date: September 23, 2004
    Applicant: Everest VIT
    Inventors: Thomas Karpen, Clark Bendall, Jon R. Salvati
  • Patent number: 6795580
    Abstract: A picture quality measurement technique using blockiness provides realtime analysis without the use of a reference signal. A field/frame of an image represented by a processed video signal is captured in a bit-map for analysis. The image is filtered to enhance edges and then correlated with a kernel having a size corresponding to the block size of the compression algorithm used in compressing and decompressing the video signal to produce the processed video signal. The correlation results are processed by comparing an average value with the maximum value to produce a picture quality rating for the processed video signal.
    Type: Grant
    Filed: September 10, 1998
    Date of Patent: September 21, 2004
    Assignee: Tektronix, Inc.
    Inventors: Bozidar Janko, Steven D. Maurer
  • Publication number: 20040135884
    Abstract: An image processing apparatus has a trigger receiving section for receiving an external trigger and a trigger generation section including a timer. When a trigger from the outside is inputted, in synchronization with this trigger, the timer of the trigger generation section operates and a predetermined number of internal triggers are generated at predetermined intervals. After each image pickup data picked up by the external trigger and the internal triggers is processed by an image processing section statistical processing is internally performed by a statistical processing section and the maximum value, the minimum value, the average value, etc. of variations in the workpiece are calculated and the results are outputted.
    Type: Application
    Filed: October 21, 2003
    Publication date: July 15, 2004
    Inventor: Kazuhito Saeki
  • Patent number: 6748112
    Abstract: The present invention is directed to an imaging apparatus for examining an object having smooth surfaces to determine shape deformations in the surface of object. The imaging apparatus includes an imaging device for obtaining a scanned image of the object to be examined. A reference image of the object is stored in a memory. An image register is coupled to the imaging device and to the memory containing the reference image of the object. The image register stores patch information corresponding to both the reference image and the scanned image. A transformation estimator is coupled to the image register, and provides a transform for registering the scanned image to the reference image. A deformation estimator is coupled to the transformation estimator and to the image register. The deformation estimator is configured to utilize the transform and the patch information to determine shape deformations of the object.
    Type: Grant
    Filed: July 15, 1999
    Date of Patent: June 8, 2004
    Assignee: General Electric Company
    Inventors: Van-Duc Nguyen, Roderic Greene Collins, Victor Nzomigni, Donald Wagner Hamilton, Jr., Charles Vernon Stewart, Joseph Legrand Mundy
  • Publication number: 20040105001
    Abstract: The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured.
    Type: Application
    Filed: December 27, 2002
    Publication date: June 3, 2004
    Applicant: OG TECHNOLOGIES, INC., a MICHIGAN CORPORATION,
    Inventors: Tzyy-Shuh Chang, Daniel Gutchess, Hsun-Hau Huang
  • Patent number: 6720989
    Abstract: The present invention relates to a system and method for scanning electronically acquired periodic images from an object and thereafter, inspecting the periodic images by using predetermined rules. The method to inspect the image includes an algorithm for analyzing the periodic patterns of the image and detecting deviations from numerical acceptance norms. In the system, the field of view of a camera, such as a video camera, viewing the object includes a two-dimensional image of the object. The camera captures the two-dimensional image of the object and converts the image into an array of scan lines, whereby each scan line represents a one-dimensional “slice” of target shape of the object. Hence, while all two dimensional images do not have periodic pattern, the array of scan lines represents a periodic pattern that is used by the algorithm in the inventive system.
    Type: Grant
    Filed: December 5, 2000
    Date of Patent: April 13, 2004
    Assignee: K-G Devices Corp.
    Inventor: Thomas Joseph Martel
  • Publication number: 20040056950
    Abstract: A stereo camera inputs a first image and a second image each including a predetermined plane. An image conversion unit projects each pixel of the predetermined plane from the first image onto a corresponding pixel of the second image as a third image. A feature conversion unit respectively emphasizes edges included in the first image, the second image and third image. A similarity calculation unit sets a plurality of areas on the predetermined plane from the second feature conversion image, calculates a first similarity between each area of the second feature conversion image and a corresponding area of the first feature conversion image, and calculates a second similarity between each area of the second feature conversion image and a corresponding area of the third feature conversion image. An obstacle decision unit detects an obstacle based on the first similarity and the second similarity.
    Type: Application
    Filed: September 3, 2003
    Publication date: March 25, 2004
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventor: Nobuyuki Takeda
  • Patent number: 6683687
    Abstract: The assessment of the effects of yarn faults is carried out by simulating the fabric image. In a first step, the yarn is examined by a measuring member for parameters associated with the volume and/or the surface. In a second step, these parameters are converted into grey values or color values, and these values are assigned to image spots. Finally, the image spots are reproduced on a video display unit and/or a printer. An image is generated thereby, representing a simulation of a woven or knitted fabric produced from the examined yarn.
    Type: Grant
    Filed: September 30, 1996
    Date of Patent: January 27, 2004
    Assignee: Zellweger Luwa AG
    Inventor: Robert Hoeller
  • Patent number: RE39750
    Abstract: An automated apparatus for producing and testing a bus-controlled television includes a camera, a bus control facility, an automatic connector, and a remote controller. The camera photographs a predetermined area near the automated apparatus and outputs an approach detection signal indicating if the television is located in such area. Also, the camera photographs the screen of the television when it is in the predetermined area and outputs a screen state signal which represents the information displayed on the screen. The bus control facility generates a television test signal based on the approach detection signal and transmits remote control signals to the television to select control items for testing various functions of the television. The automatic connector connects the television and the bus control facility when the television is located in the predetermined area to enable the bus control facility to transmit the television test signal to the television.
    Type: Grant
    Filed: October 13, 1999
    Date of Patent: July 31, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Kyung-Ho Moon