Abstract: A method, apparatus, and a computer program is provided. The method comprises: determining an ambient light value from ambient light data provided by at least one ambient light sensor, in dependence upon the spectral distribution of the ambient light data provided by the at least one ambient light sensor and a manufacturer of the at least one ambient light sensor.

Abstract: A light distribution characteristic measurement apparatus includes: a detecting unit for detecting light from a light source; a mirror for reflecting the light from the light source to direct the light to the detecting unit; a movement mechanism for moving the detecting unit and the mirror relatively to the light source; a rotation mechanism for rotating the mirror while maintaining an optical path length from the light source to the detecting unit; and a processor adapted to calculate the light distribution characteristic of the light source, based on a plurality of measurement results that are detected by the detecting unit under a condition that the detecting unit and the mirror are arranged at a plurality of measurement positions relative to the light source and the mirror is oriented at different rotational angles for each measurement position.

Abstract: The present invention relates to a method of detecting a failed luminaire and/or light sensor in a lighting system comprising M luminaires and N light sensors. The elements Dsl of an N×M transfer matrix D expresses how each luminaire l affect a light sensor s with respect to sensed light intensity, wherein s=1, 2, . . . N, and l=1, 2, . . . , M.

Abstract: An optical coupling lens includes a refraction surface, a first total reflection surface, a second total reflection surface, a first aligning member and a second aligning member. The refraction surface, the first total reflection surface and the second total reflection surface are orderly connected end to end. The first aligning member and the second aligning member are formed on the refraction surface.

Abstract: A method and device for detecting a precision of a dish parabolic reflecting mirror are provided. Accurate coordinate values of positions on an X-axis and a Y-axis may be obtained by adjusting and controlling a double helix lifting mechanism, a 360-degree plane rotary mechanism, a telescoping mechanism, and an extension rod, and using a photoelectric position sensor with a high precision and the extension rod being measured. Then, the curved surface of the dish paraboloid reflecting mirror being detected is obtained by fitting sampling values of the coordinate values of spatial positions of the detecting points at various, and the precision error value by comparing the curved surface of the dish paraboloid reflecting mirror being detected to the theoretical curved surface, thereby realizing detection of the precision of the curved surface of the dish paraboloid reflecting mirror.

Abstract: The disclosure provides a photoelectric sensor that provides useful information to set measurement conditions. The photoelectric sensor includes a light emitting unit having a light emitting element configured to emit detection light toward a detection area, a light receiving unit having a light receiving element configured to receive the detection light from the detection area and to obtain a detection value corresponding to the amount of light received, and a display unit configured to display information about the detection value in the light receiving unit. When the detection value varies across a predetermined threshold, the display unit displays a transit time that is the time from when the detection value crosses the predetermined threshold until when it crosses the predetermined threshold again, and a variation amount of the detection value in the variation.

Abstract: An optical measuring apparatus for measuring optical characteristics of a stereoscopic display device includes a test image supplier for generating a 3D test signal, a 3D display for displaying left-eye image and/or right-eye image based on the 3D test signal supplied from the test image supplier, a image selection member for selectively transmitting the left-eye image and right-eye image to be displayed on the 3D display, and a light measuring device for measuring intensity or color information of the image transmitted via the image selection member.

Abstract: An optical touch device with a detecting area includes light guide components, a light source module, a light detecting component and an auxiliary light guide component. Each light guide component includes a first light emitting surface. The light guide components includes a first light guide component and a second light guide component. The auxiliary light guide component and the light detecting component are disposed between two neighboring ends of the first light guide component and the second light guide component, and the light detecting component includes a light detecting end. The auxiliary light guide component is positioned between the light detecting component and the detecting area and includes a first light incidence surface, a second light incidence surface and a second light emitting surface connected between the first light incidence surface and the second light incidence surface. The optical touch device can effectively avoid the blind zone problem.

Abstract: The invention relates to a detection device (2) intended to be positioned in a conveyor (1) which comprises conveying rollers (100) arranged between two lateral uprights (10, 11) to convey goods in a conveying direction (D), the device comprising: an elongate support extending over its length along a longitudinal axis (X), said support supporting a number of detectors (40) distributed along its longitudinal axis (X) to detect the goods borne by the conveyor (1), said support being intended to be positioned between two conveying rollers (100), fixed between the two lateral uprights (10, 11) of the conveyor (1), transversally relative to the conveying direction (D).

Abstract: A luminous intensity test device includes an optical frequency converter, a display, and a processor. The optical frequency converter selectively converts at least a portion of light emitted by a light source into a digital signal. The display displays a color selection interface. The processor processes the digital signal and obtains the luminous intensity. When a tester inputs a color parameter into the color selection interface via an input device, the optical frequency converter converts a kind of light to the digital signal and then the processor processes the digital signal to obtain a luminous intensity and display the luminous intensity on the display.

Abstract: A light distribution characteristic measurement apparatus for measuring the light distribution characteristic of a light source is provided. The apparatus includes a plurality of detectors arranged so that they have a predetermined relative relationship with each other. One detector has a detection range at least partially overlapping a detection range of another detector adjacent to the former detector. The apparatus further includes a drive unit that drives a plurality of detectors as one unit to update a positional relationship of the plurality of detectors relative to the light source, and a calculation unit that calculates the light distribution characteristic of the light source by performing a process depending on at least one of a relative relationship between a plurality of detectors and overlapping of respective detection ranges thereof, based on respective results of detection that have been acquired by the plurality of detectors at the same timing.

Abstract: The invention provides a lighting unit (100) comprising (1) a vacuum ultraviolet (VUV) radiation based source of radiation (10) configured to generate VUV radiation (11), and (2) a luminescent material (20) configured to convert at least part of the VUV radiation into visible luminescent material light (21), wherein the luminescent material comprises a trivalent praseodymium containing material selected from the group consisting of (Zr1-x-yHfxPry)(Si1-yPy)04, (Zr1-x-yHfxPry)3((P1-3/4yS3/4y)04)4, and (Zr1-x-yHxPry)3((B1-3/4yX3/4y))O3)4, with x in the range of 0.0-1.0 and y being larger than 0 and being equal to or smaller than 0.15.

Abstract: Disclosed is an inspecting equipment for inspecting a light emission characteristic of a display screen includes: a carrying device provided for carrying the display screen, a cover device and a data analyzing device. The cover device has a detecting surface provided with a plurality of luminance detectors, and covers an emitting surface of the display screen to form a darkroom between the cover device and the detecting surface. A plurality of corresponding luminance information is generated by the luminance detectors provided for detecting a plurality of measuring zones of the emitting surface. The data analyzing device receives the luminance information and analyzes the light emission characteristic of the display screen according to the luminance information. And, it is thus able to rapidly inspect the light emission characteristic of the display screen during manufacture process, and is easy to be applied to a present producing line.

Abstract: A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array located on a surface of a substrate. The carbon nanotube array has a top surface away from the substrate. The carbon nanotube array with the substrate is located in an inertia environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a visible light. A reflector is provided, and the visible light is reflected by the reflector. An imaging element images the visible light reflected by the reflector, to obtain an intensity distribution of the light source.

Abstract: An optoacoustic system includes first and second light sources capable of generating pulse of light at first and second wavelengths, first and second electrically controlled optical attenuators, first and second light sync detectors, and a combiner. A power meter that is calibrated to determine power at the first and second predominant wavelength measures power at the first wavelength after the first light sync is detected and measures power at the second wavelength after the second light sync is detected. The system includes a calibration mode wherein it electrically attenuates the first optical attenuator when the power measured by the power meter at the first wavelength after the first light sync is detected is above a first level, and electrically attenuated the second optical attenuator when the power measured by the power meter at the second wavelength after the second light sync is detected is above a second level.

Abstract: An optical power meter including a photodiode having a surface for receiving a beam of light, a thermo-electric cooler for maintaining the photodiode at a predetermined temperature, and a current monitor for measuring a drive current passing through the thermo-electric cooler allows dark current drift arising from a varying thermal gradient across the active region of the photodiode to be corrected, thus improving stability of the optical power meter. More specifically, by monitoring the TEC drive current, and applying a correction factor to the optical power readings, the stability of optical power readings is improved by an order of magnitude.

Abstract: Disclosed is an inspecting equipment for inspecting a light emission characteristic of a display screen includes: a carrying device provided for carrying the display screen, a cover device and a data analyzing device. The cover device has a detecting surface provided with a plurality of luminance detectors, and covers an emitting surface of the display screen to form a darkroom between the cover device and the detecting surface. A plurality of corresponding luminance information is generated by the luminance detectors provided for detecting a plurality of measuring zones of the emitting surface. The data analyzing device receives the luminance information and analyzes the light emission characteristic of the display screen according to the luminance information. And, it is thus able to rapidly inspect the light emission characteristic of the display screen during manufacture process, and is easy to be applied to a present producing line.

Abstract: A detection apparatus comprising a chuck, a probe device, a light-sensing device and a light-concentrating unit is disclosed. The chuck bears light-emitting diode chips. The probe device includes two probes and a power supply. The end point of the probes respectively electrically connects with one of the light-emitting diode chips and the power supply to make the light-emitting diode chip emits a plurality of light beams. The light-sensing device is disposed on one side of a light-emitting surface of the light-emitting diode chip so as to receive the light beams emitted by the light-emitting diode chip. The light-concentrating unit is disposed between the light-emitting diode chip and the light-sensing device to concentrate the light beams emitted by the light-emitting diode chip.

Abstract: The illumination power density of a multi-spot inspection system is adjusted in response to detecting a large particle in the inspection path of an array of primary illumination spots. At least one low power, secondary illumination spot is located in the inspection path of an array of relatively high power primary illumination spots. Light scattered from the secondary illumination spot is collected and imaged onto one or more detectors without overheating the particle and damaging the wafer. Various embodiments and methods are presented to distinguish light scattered from secondary illumination spots. In response to determining the presence of a large particle in the inspection path of a primary illumination spot, a command is transmitted to an illumination power density attenuator to reduce the illumination power density of the primary illumination spot to a safe level before the primary illumination spot reaches the large particle.

Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing an integrating sphere comprising an inlet port and a first exit port; disposing the light-emitting device close to the inlet port of the integrating sphere; providing a current source to drive the light-emitting device to form an image of the light-emitting device in driven state; providing an image receiving device and to receive the image of the light-emitting device, wherein the image receiving device is connected to the first exit port of the integrating sphere; and determining a luminous intensity of the light-emitting device according to the image. An apparatus for testing a light-emitting device is also disclosed.

Abstract: An optical wavelength monitor photodiode integrated on a wafer and/or an optical device and coupled to optical components thereof provides wavelength measurement. The optical wavelength monitor includes a photodiode configured to output a signal that is representative of a wavelength of the light. An additional photodiode may be included in the optical wavelength monitor, each photodiode differing from the other in operating characteristics. The monitor may be used in testing the optical device while in wafer form and when the optical device has been cleaved from the wafer at the bar level. Testing/monitoring of the optical device may also be performed during use, for example, to control the wavelength of a laser such as a tunable laser.

Abstract: The invention relates to an actuation and evaluation circuit for a laser diode (1) and a photodiode (3) for determining the concentration of a gas. The laser diode can generate light in the range of an absorption line of the gas. The circuit comprises a driver (10, 11, 12, 13) for generating a driving signal (17) for the laser diode (1), an assembly (8, 9) for generating a reference signal (20), and a subtractor (5) for subtracting the reference signal (20) from the signal (21) supplied by the photodiode. The invention further relates to a measuring device for determining the concentration of a gas by means of such an actuation and evaluation circuit. Finally, the invention relates to a corresponding method.

Abstract: A system for obtaining a propagation factor for determining the performance of a light beam (32) includes a light sensor (10), a lens element (30) operable to focus a beam from a light source to be tested towards the sensor element (10); wherein the lens element is a variable focus lens (30).

Abstract: The present invention is directed to an electronic target for use with a pulsed beam of laser light. The electronic target may include a housing, which includes a window and a solar cell. The solar cell may be disposed in the window for receiving a pulsed beam of light that may be emitted from a gun barrel or simulated weapon. The beam of light may have a predominant wavelength of between approximately 635 nm and 650 nm, as well as a pulse duration of between 1 ms and 50 ms, and a pulse modulation frequency of approximately 2 KHz. The electronic target may be tuned to the emission characteristics of the beam of light. The electronic target may be used to count a user's consecutive hits, drill how quickly a user can place a shot of laser light on the electronic target, and simulate a magazine change or burst shooting.

Abstract: Photoelectric Meter for Stamps Perforations made up of two rows of photoreceptor cells conveniently connected to printed circuits endowed with a CICounter, a CIConverter and a Display, integrated within a single unit. This device allows measuring the horizontal as well as the vertical perforation of any stamp as well as the number of perforations and/or their variation in the superficial element to be measured, discriminating the type of perforation, of foot, of line, etc.

Abstract: Disclosed is an apparatus for testing an LED lamp which includes: a secured seat on which the LED lamp is seated; an up and down shifter which, when the LED lamp is seated on the secured seat, shifts from an initial position spaced upward from the LED lamp to a measurement position in which the up and down shifter contacts with a socket of the LED lamp, and which supplies electric power to the LED lamp when the up and down shifter is placed in the measurement position, and a sensor sensing that the up and down shifter is placed in the measurement position; and a quality determining means determining a quality of the LED lamp based on light emitted from the LED lamp, and comprising an illuminometer or a luminance meter.

Abstract: An embodiment of present invention discloses an optoelectronic device package including a first auxiliary energy receiver having a first energy inlet and a side wall for substantially directing energy far away from the first energy inlet; an optical element optically coupled to the first auxiliary energy receiver and having a recess facing the first energy inlet; and an optoelectronic device optically coupled to the optical element and receiving the energy from the first energy inlet.

Abstract: The disclosure is directed to a system and method for determining at least one characteristic of an illumination beam emanating from an illumination source. A substrate having a plurality of apertures may be actuated through an illumination beam so that apertures at different spatial offsets are scanned through the illumination beam at one or more levels of focus. Portions of illumination directed through scanned apertures may be received by at least one detector. At least one characteristic of the illumination beam may be extracted from data points associated with intensity levels associated with detected portions of illumination. Furthermore, multiple determinations of a beam characteristic made over a period of time may be utilized to calibrate the illumination source.

Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing a light-emitting device comprising a plurality of light-emitting diodes; driving the plurality of the light-emitting diodes with current; generating an image of the light-emitting device; and determining a luminous intensity of each of the light-emitting diodes with the image. An apparatus for testing a light-emitting device comprising a plurality of light-emitting diodes is also disclosed. The apparatus comprises: a current source to provide a current to drive the plurality of the light-emitting diodes; an image receiving device for receiving an image of the light-emitting device in the driven state; and a processing unit for determining a luminous intensity of each of the light-emitting diodes with the image.

Abstract: Proposed is a technique for detecting a damaged VCSEL in a short time and at low cost. It shows the light emission spectrum of a multi-mode VCSEL before an ESD damage, and the light emission spectrum which shows several peaks corresponding to the structure of the active layer (MQW) and the upper and lower reflectors (DBR) is obtained. On the other hand, when the VCSEL which has an ESD damage has a damage in the active layer, the light emission spectrum which shows fewer peaks than the original number of peaks is obtained. Accordingly, the light spectrum analyzer analyzes the light emission spectrum, and it is determined that ESD damage has occurred when the number of peaks is equal to or smaller than a predetermined number, e.g., two peaks.

Abstract: A method for analyzing a laser system, which has a focused laser beam and a controllable deflection assembly for controlling the transverse and/or longitudinal position of the beam focus, said method comprising the steps of directing the laser beam or a partial beam branched therefrom downstream of the deflection assembly toward an optically nonlinear medium for the purpose of generating frequency multiplied radiation, the wavelength of which corresponds to an uneven higher harmonic of the wavelength of the laser beam, activating the deflection assembly, and measuring a power of the frequency multiplied radiation while the deflection assembly is activated. The conversion efficiency of the nonlinear process by which the frequency multiplied radiation is produced is dependent upon the focusability of the laser beam.

Abstract: A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array having a top surface. The carbon nanotube array is located in an inert gas environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a radiation light. An imaging element images the radiation light, to obtain an intensity distribution of the light source.

Abstract: A turbidity sensor for sensing the turbidity of a fluid in a working chamber in a household appliance is disclosed to include a light-transmissive body shell defining therein an accommodation chamber and covered with a cover member, and a sensor module, which includes a circuit board mounted in the accommodation chamber inside the body shell, a holder block a set of light-transmitting devices and a set of light-receiving devices on the circuit board in a right angle relationship for emitting light onto the fluid and picking up reflected light from suspended particles/impurities in the fluid for determination of the turbidity of the fluid.

Abstract: A distance detection induction device 100 comprises a housing 1, a condensing lens 2, a circuit board 3 having multiple electronic components, an infrared light emitting means 4, a light receiving means 5 for receiving and sensing the reflected infrared light. The housing 1 comprises a main body 10 and two round openings 11 and 12 on the top of the main body 10. The condensing lens 2 has an emitting lens 21 and a receiving lens 22 respectively located at the two round openings 11 and 12. The circuit board 3 bearing multiple electronic components for processing signal is mounted inside the main body 10. The infrared light emitting means 4 is to be infrared light-emitting diodes, emitting the infrared light to the emitting lens 21. The infrared light receiving means 5 is to be distance detecting sensing module, sensing the reflected light focused by the receiving lens 22. A connection part 23 having at least a bending part is set between the emitting lens 21 and the receiving lens 22.

Abstract: A light intensity measuring unit for measuring an intensity of light emitted from a microscope includes an aperture stop, a field stop, at least one measurement lens arranged between the aperture stop and the field stop, and an interface for attachment to a microscope. The aperture stop is positioned on or close to a back focal plane of the at least one measurement lens. The field stop is positioned on or close to a front focal plane of the at least one measurement lens.

Abstract: A light-monitoring apparatus includes a power source, a light detector, a computer processor coupled with the power source and in communication with the light detector and configured to receive and record light exposure detected by the light detector, an output device coupled with the computer processor, and a computer-readable medium coupled with the computer processor and storing instruction code for summing the recorded light exposure from the computer processor over time and communicating a signal to the output device to generate and communicate a signal indicating that a cumulative threshold light exposure for achieving a health benefit has been reached. The apparatus can accordingly be used by an individual to monitor cumulative light exposure from both natural and artificial sources, e.g., in the treatment of seasonal or non-seasonal depression.

Abstract: A luminous intensity test device includes an optical frequency converter, a display, and a processor. The optical frequency converter selectively converts at least a portion of light emitted by a light source into a digital signal. The display displays a color selection interface. The processor processes the digital signal and obtains the luminous intensity. When a tester inputs a color parameter into the color selection interface via an input device, the optical frequency converter converts a kind of light to the digital signal and then the processor processes the digital signal to obtain a luminous intensity and display the luminous intensity on the display.

Abstract: A testing device for testing one more characteristics of an electronic display. The testing device includes a main body and a receiving cavity defined within the main body configured to receive at least a portion of the electronic display. The testing device also includes a plurality of sensors positioned on a first surface of the testing device and configured to be in optical communication with at least a portion of the electronic display received within the cavity. The plurality of sensors is configured to detect at least one type of non-uniformity of the electronic display by detecting light emitted from the electronic display.

Abstract: A light emitting diode (LED) verification system is provided having a mounting module for securing an LED board for testing. The mounting module includes a thermal management system for controlling the temperature of the LED board. A mounting plate is provided for centering the LED board. A clamp is provided for securing the LED board. A hood is positioned over the mounting module. The hood has a top and a base. The mounting module is positioned at the base of the hood. The mounting plate centers the LED board with respect to a centerline of the hood. A light meter is positioned at the top of the hood and centered with respect to the centerline of the hood. The light meter measures light emitted from the LED board.

Abstract: A goniophotometer includes an arc reflector; a holder for positioning a light source at the center of the arc reflector; a stationary detector substantially disposed at the center of the arc reflector and aimed at an arc reflective surface of the reflector; a driving device for rotating the holder with respect to the reflector and the detector about an axis of the light source; and a computing unit configured to convert a detection result of the detector into a measurement value.

Abstract: A method to monitor an output of an APD is disclosed. The method includes steps of, (a) measuring dark currents of the APD at several temperatures in advance to a practical operation of the APD, (b) measuring an output current of the APD by illuminating the APD practically at a measured temperature, (c) estimating a dark current at the measured temperature from measured dark currents, and (d) subtracting the estimated dark current from the output current.

Abstract: An optical signal inspection device includes a housing, a diagnostic unit, an optical specimen holder, a light-shielding module, and a guiding unit. A receiving space is defined internally of the housing. The housing has an optical fiber holding area formed thereon. The optical specimen holder has an upper jaw member and a lower jaw member. The light shielding module has a main body and two lateral shielding members disposed thereon. Two side portions of the lower jaw member are formed matchingly to the lateral shielding members. The guiding unit is secured to the upper or lower jaw member. When the upper and lower jaw members are used to clamp the optical fiber for inspection, interference due to ambient lighting can be prevented by the light shielding module. Thus, quick and accurate inspection results can be obtained by the user.

Abstract: A system to test operation of an optical sensor is disclosed. The optical sensor includes one or more photosensitive devices configured to convert light to electrical signals. A test light source is included within the housing of the optical sensor. The test light source is periodically pulsed on to emit radiation at a sufficient intensity to saturate each of the photosensitive devices. Each of the photosensitive devices generates a signal corresponding to the intensity of light detected at that device. A logic circuit uses the signals corresponding to the intensity of light to identify whether each of the photosensitive devices is performing at an acceptable level.

Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing a light-emitting device comprising a plurality of light-emitting diodes; driving the plurality of the light-emitting diodes with current; generating an image of the light-emitting device; and determining a luminous intensity of each of the light-emitting diodes with the image. An apparatus for testing a light-emitting device comprising a plurality of light-emitting diodes is also disclosed. The apparatus comprises: a current source to provide a current to drive the plurality of the light-emitting diodes; an image receiving device for receiving an image of the light-emitting device in the driven state; and a processing unit for determining a luminous intensity of each of the light-emitting diodes with the image.

Abstract: A gesture sensing device includes one or more sensors and a processor for processing sensed voltages output from the sensors based on ambient light and/or reflected light received by the sensors. The processor determines an ambient light level and/or a distance between the target and the sensors such that, if the ambient light level exceeds an ambient light threshold and/or the distance is less than a distance threshold, the processor determines the motion of a target relative to the sensors based on the ambient light instead of the reflected light.

Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.

Abstract: A solar cell inspection method and apparatus are disclosed. An embodiment of the solar cell inspection method includes the steps of: charging a diffusion capacitance of a solar cell; after charging the diffusion capacitance, discharging the diffusion capacitance; and detecting light emitted by the solar cell during the discharging step.

Abstract: A low pressure heater control system. In some embodiments a control is in electrical communication with a sensor having a view of a combustion chamber. The control calculates an average sensor value over each of a plurality of brief sampling periods based on a plurality of readings from the sensor. In some embodiments a reference point that may be at least based in part on an average of a plurality of average optical sensor values from earlier brief sampling periods is calculated and compared against the average optical sensor value from a recent brief sampling period to monitor for an abrupt combustion change. In some embodiments a peak-to-peak optical sensor value is also calculated over each of a plurality of brief sampling periods. In some embodiments the type of fuel being combusted is recognized and/or the fuel level approximated based on measured average and/or peak-to-peak optical sensor values.

Abstract: A solid-state imaging device includes a light sensing unit generating a signal charge by performing a photoelectric conversion of an incident light; a conductive material in the vicinity of the light sensing unit; a first light-shielding film formed to cover at least a portion of the conductive material; and a second light-shielding film formed on a part of or all of a surface of the first light-shielding film.

Abstract: An apparatus in one example configured to receive and demodulate a homodyne carrier signal, where the homodyne carrier signal comprises sensor data for at least two sensors.