Abstract: Proposed is a light sensor (1), comprising at least one wavelength selective photo-detector (10), a lens (20) and an aperture (30).The wavelength selective photo-detector allows detecting light within a predefined wavelength range falling on the sensor. The lens project light on the photo-detector and the aperture defines a field of view of the light sensor. The photo-detector (10), the lens (20), and the aperture (30) are arranged in a telecentric configuration. Advantageously, this allows light to impinge on the wavelength selective photo-detector within a predefined range of angles irrespective of the direction of the light incident on the aperture, thus removing the angle dependent response of the wavelength selective photo-detector.

Abstract: Embodiments described herein relate to a light sensing system. In one embodiment, the light sensing system may include a microprocessor including an input pin configured to receive a first voltage from a light sensor. The light sensing system may also include a pull-up resistor coupled to the input pin. The pull-up resistor may include a first gate. The light sensing system may further include a pull-down resistor coupled to the input pin. The pull-down resistor may include a second gate. The first and second gates may allow for connecting or disconnecting the pull-up and pull-down resistors based on the amount or intensity of light detected by the light sensor.

Abstract: In a wavelength monitor that monitors a wavelength of laser light emitted from at least two semiconductor lasers formed in parallel on a semiconductor substrate, the wavelength monitor includes a collimating lens that collimates laser light from each of the semiconductor lasers, an etalon that is arranged so that laser light collimated by the collimating lens is capable of entering and has a periodicity, and a photodetector that receives laser light transmitted through the etalon and detects a light intensity, wherein a beam propagation angle in the etalon of laser light emitted from each of the semiconductor lasers becomes a predetermined angle obtained by formula 1.

Abstract: Photoelectric Meter for Stamps Perforations made up of two rows of photoreceptor cells conveniently connected to printed circuits endowed with a CICounter, a CIConverter and a Display, integrated within a single unit. This device allows measuring the horizontal as well as the vertical perforation of any stamp as well as the number of perforations and/or their variation in the superficial element to be measured, discriminating the type of perforation, of foot, of line, etc.

Abstract: According to one embodiment, a method is disclosed for evaluating discomfort glare. The method can include obtaining average luminance information relating to an average luminance La of a luminous surface of a luminaire, luminance uniformity ratio information relating to a luminance uniformity ratio U of the luminous surface, luminous surface size information relating to a size ? of the luminous surface, and background luminance information relating to a background luminance Lb of the luminaire. The method can include calculating an evaluation parameter value based on the La, the U, the ?, and the Lb obtained in the obtaining. The evaluation parameter value is a value of a product of a value based on the La, a value based on the U, and a value based on the ? divided by a value based on the Lb.

Abstract: A Solar Access Measurement Device (“SAMD”) located at a predetermined position is disclosed. The SAMD may include a skyline detector enabled to detect a skyline of a horizon relative to the SAMD, an orientation determination unit enabled to determine the orientation of the skyline detector, and a processor in signal communication with the skyline detector and orientation determination unit.

Abstract: A tunable light source for interrogating at least one resonant waveguide grating (RWG) biosensor having a resonance linewidth. The tunable light source includes a broadband light source that emits a light beam having a first spectral bandwidth greater than the RWG biosensor resonance linewidth. The broadband light source may be substantially spatially incoherent. A tunable optical filter having a tunable spectral linewidth is arranged to receive and filter the light beam to cause the light beam to have a second spectral bandwidth substantially the same as the RWG biosensor resonance linewidth. Label-independent optical readers that employ the tunable light source are also disclosed.

Abstract: Manufacturing opto-electronic modules (1) includes providing a substrate wafer (PW) on which detecting members (D) are arranged; providing a spacer wafer (SW); providing an optics wafer (OW), the optics wafer comprising transparent portions (t) transparent for light generally detectable by the detecting members and at least one blocking portion (b) for substantially attenuating or blocking incident light generally detectable by the detecting members; and preparing a wafer stack (2) in which the spacer wafer (SW) is arranged between the substrate wafer (PW) and the optics wafer (OW) such that the detecting members (D) are arranged between the substrate wafer and the optics wafer. Emission members (E) for emitting light generally detectable by the detecting members (D) can be arranged on the substrate wafer (PW). Single modules (1) can be obtained by separating the wafer stack (2) into separate modules.

Abstract: Methods for simultaneously making quantum efficiency measurements at multiple points in a photovoltaic cell are provided. A light beam (e.g., monochromatic light) can be directed to a first beam splitter, where it is split into a first reflected portion and a first passthrough portion such that the first reflected portion is directed to a first point on the photovoltaic cell. The first reflected portion can then be chopped at a first frequency between the first beam splitter and the first point. The first passthrough portion of the light beam can be reflected at a second beam splitter to a second point on the photovoltaic cell. The second reflected portion can then be chopped at a second frequency between the second beam splitter and the second point. Finally, the quantum efficiency can be calculated at both the first point and the second point. Systems are also generally provided for simultaneously making quantum efficiency measurements at multiple points in a photovoltaic cell.

Abstract: A light emitting diode (LED) verification system is provided having a mounting module for securing an LED board for testing. The mounting module includes a thermal management system for controlling the temperature of the LED board. A mounting plate is provided for centering the LED board. A clamp is provided for securing the LED board. A hood is positioned over the mounting module. The hood has a top and a base. The mounting module is positioned at the base of the hood. The mounting plate centers the LED board with respect to a centerline of the hood. A light meter is positioned at the top of the hood and centered with respect to the centerline of the hood. The light meter measures light emitted from the LED board.

Abstract: The invention discloses an optical measurement system for measuring the optical properties of a device under test (DUT). The optical measurement system includes a DUT, a light measuring module, a light guiding module and an analyzing module. The present invention utilizes the light guiding module to receive an axial ray of the rays emitted by the DUT so as to analyze the optical properties thereof. Thus, the present invention is not only capable of measuring the light intensity of the rays emitted by the DUT, but also capable of obtaining the properties of the axial ray emitted by the DUT.

Abstract: A visible wavelength range proximity sensor includes a visible light emitter with a peak wavelength in a visible wavelength range, and a plasmonic ambient light sensor, where a proximity sensing mode and an ambient light sensing mode are time multiplexed.

Abstract: A solid-state image sensor comprising a pixel array having a plurality of pixels, and a plurality of signal processing circuits each of which amplifies a signal of the pixel array, wherein each of the plurality of signal processing circuits comprises an operation amplifier having an input terminal and an output terminal, an input capacitance arranged between the input terminal and the column signal line, and a feedback circuit which connects the input terminal with the output terminal, wherein the feedback circuit is configured to form a feedback path in which a first and a second capacitance elements are arranged in series in a path connecting the input terminal to the output terminal, and a third capacitance element is arranged between a reference potential and a path connecting the first capacitance element to the second capacitance element.

Abstract: A unit pixel of a depth sensor includes a light-receiver configured to perform photoelectric conversion of an incident light to output an electrical signal and at least two sensors adjacent to the light-receiver to receive the electrical signal from the light-receiver such that a line connecting the sensors forms an angle greater than zero degrees with respect to a first line, the first line passing through a center of the light-receiver in a horizontal direction.

Abstract: An apparatus for detecting electromagnetic waves includes a first electromagnetic wave sensor, two first electrodes, a second electromagnetic wave sensor, and two second electrodes. The two first electrodes are electrically connected to different portions of the first electromagnetic wave sensor. The second electromagnetic wave sensor crosses with and is spaced from the first electromagnetic wave sensor. The two second electrodes are electrically connected to different portions of the second electromagnetic wave sensor.

Abstract: A processing circuit coupled to a controlling circuit and including a first capacitor module, a second capacitor, a detection module, a first processing module, and a second processing module is disclosed. The first and the second capacitor modules are charged. The detection module generates a detection signal according to intensity of a light to charge the first and the second capacitor modules. The first processing module asserts a first output signal according to the time of charging the first capacitor module. The second processing module asserts a second output signal according to the time of charging the second capacitor module. The controlling circuit controls a backlight according to the asserted output signal.

Abstract: Described herein is a projective optical metrology system including: a light target equipped with a plurality of light sources having a pre-set spatial arrangement; an optoelectronic image sensor; an optical unit receiving a light signal coming from the light target and defining two different optical paths for the light signal towards the optoelectronic image sensor, the two optical paths being such as to cause simultaneous formation on the optoelectronic image sensor of at least two images of the light target; and an electronic processing unit coupled to the optoelectronic image sensor and determining a plurality of different quantities indicating the position and attitude of the light target with respect to the optical unit, on the basis of the two images.

Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.

Abstract: A method and apparatus for continuous monitoring of a light bulb or group of light bulbs. The light emission of a light bulb is compared with known emission failure values for similar types of light bulbs, and a determination of a near failure status for the bulb is made.

Abstract: A light sensor and light sensing system to detect an intensity of incident light and an angle of incidence of the incident light. The light sensor includes a dielectric layer, a plurality of photo detectors coupled relative to the dielectric layer, and a plurality of stacks of opaque slats embedded within the dielectric layer. The dielectric layer is substantially transparent to the incident light. The photo detectors detect the incident light through the dielectric layer. The stacks of opaque slats are approximately parallel to an interface between the dielectric layer and the photo detectors. The stacks of opaque slats define light apertures between adjacent stacks of opaque slats. At least some of the stacks of opaque slats are arranged at a non-zero angle relative to other stacks of the opaque slats.

Abstract: The present invention relates to a sensor for thiol analytes, to a sensor array and to a method of detecting thiol analytes using said sensor.

Abstract: Apparatus and methods can include an optical waveguide coupled to a photonic crystal comprising a dielectric material, the photonic crystal located on an exterior surface of the optical waveguide and comprising a first surface including a first array of periodic features on or within the dielectric material, the array extending in at least two dimensions and including an effective dielectric permittivity different from the surrounding dielectric material. In an example, the periodic features include a specified lattice constant, the periodic features configured to extract a portion of propagating optical energy from the waveguide through the photonic crystal, the portion determined at least in part by the specified lattice constant.

Abstract: There is provided a solar powered light intensity measurement device which includes one or more photovoltaic cells, one or more resistors and one or more light emitting diodes. The one or more photovoltaic cells convert light to electricity, the output corresponding to the intensity of incident light. Electrically activated from the photovoltaic cells, through the one or more resistors, the light emitting diodes emit a signal color, further corresponding to their electrical activation and hence to the intensity of light incident upon the one or more photovoltaic cells. The signal color is compared to reference color or chart for use in determining the relevant light intensity. In one embodiment, the device further includes an analog switch.

Abstract: The present invention provides systems and methods for measuring an analyte in a medium without exposing the medium to contamination. The systems and methods employ a novel combination of a small sensor device embedded in a Luer cap and capable of wirelessly transmitting data to a reading device.

Abstract: The present embodiments are directed towards the optical control of switching an electrical assembly. For example, in an embodiment, an electrical package is provided. The electrical package generally includes a micro electromechanical systems (MEMS) device configured to interface with an electrical assembly, the MEMS device being operable to vary the electrical assembly between a first electrical state and a second electrical state, a MEMS device driver in communication with the MEMS device and being operable to produce high voltage switching logic from an electrical signal, and an optical detector in communication with the MEMS device driver and configured to produce the electrical signal from an optical signal produced by a light source in response to an applied current-based electrical control signal.

Abstract: A photodiode (PD) array accurately measures incident optical power on each of the PDs in the array by eliminating the effect of crosstalk between the individual PDs. Crosstalk within the PD array is removed by measuring the current generated by each PD in the array and generating a corrected optical power value for each PD that is based on the measured current for each PD and on coupling coefficients associated with other PDs in the array. The coupling coefficients are determined during a previous calibration procedure.

Abstract: A method and apparatus of the present invention determines whether zero, one, or a plurality of microscope slide coverslips are about to be applied to a microscope slide. Light, such as ultraviolet light, may be directed toward a coverslip testing region, in which a number of coverslips reside. The amount of light passing through the coverslip testing region is collected and measured. Based on the measured amount, the method and apparatus determine the number of coverslips present in the coverslip testing region.

Abstract: A luminance sensing system and method and a computer program product thereof are provided. The system includes: a first luminance sensing unit, arranged at a first position, and used for sensing a light ray luminance at the first position to generate a first illumination value; a second luminance sensing unit, arranged at a second position, having a displacement unit, and used for sensing a light ray luminance at the second position to generate a second illumination value; and a computing unit, electrically connected to the first luminance sensing unit, the displacement unit, and the second luminance sensing unit, and used for acquiring the first illumination value and the second illumination value, acquiring luminance range information by using the first illumination value, and determining whether the second illumination value conforms to the luminance range information, so as to decide whether to control the displacement unit to move.

Abstract: In a wavelength monitor that monitors a wavelength of laser light emitted from at least two semiconductor lasers formed in parallel on a semiconductor substrate, the wavelength monitor includes a collimating lens that collimates laser light from each of the semiconductor lasers, an etalon that is arranged so that laser light collimated by the collimating lens is capable of entering and has a periodicity, and a photodetector that receives laser light transmitted through the etalon and detects a light intensity, wherein a beam propagation angle in the etalon of laser light emitted from each of the semiconductor lasers becomes a predetermined angle obtained by formula 1.

Abstract: A light intensity measuring unit for measuring an intensity of light emitted from a microscope includes an aperture stop, a field stop, at least one measurement lens arranged between the aperture stop and the field stop, and an interface for attachment to a microscope. The aperture stop is positioned on or close to a back focal plane of the at least one measurement lens. The field stop is positioned on or close to a front focal plane of the at least one measurement lens.

Abstract: A method and a system of evaluating a stereo image displaying panel are provided. The evaluation method includes the following steps. An inspection frame is displayed on the stereo image displaying panel, wherein the displaying surface of the stereo image displaying panel has a first normal vector. A luminance of the inspection frame is sensed by an image sensing apparatus, wherein the sensing surface of the image sensing apparatus has a second normal vector. An angle is formed between the first normal vector and the second normal vector. The luminance of the inspection frame is sensed in different angles. A maximum luminance of the inspection frame is sensed by the image sensing apparatus when the angle is equal to a first angle. A luminance uniformity of the inspection frame is analyzed at the first angle. An optimized viewable distance is measured, and the degree of cross-talk is calculated.

Abstract: A photodetecting device 1 includes a photodiode PD and an integrating circuit 10. The integrating circuit 10 includes an amplifier circuit 20, a capacitive element C, a first switch SW1, and a second switch SW2. The second switch SW2 is provided between a reference potential input terminal to which a reference potential Vref is input and a terminal of the capacitive element C on the inverting input terminal side of the amplifier circuit 20, and the second switch is opened or closed according to the level of a second reset signal Reset2, and is capable of applying the reference potential Vref to the terminal of the capacitive element. Thus, an integrating circuit and a photodetecting device capable of achieving both low power consumption and high speed can be realized.

Abstract: An image capturing apparatus comprises: a photometry unit configured to perform photometry on a subject and output a photometric value; an obtaining unit configured to obtain a plurality of photometric values from the photometry unit during a predetermined period of time; and a calculation unit configured to perform a prediction calculation to predict a luminance of the subject based on the plurality of photometric values obtained by the obtaining unit.

Abstract: A method and apparatus are set forth for monitoring lamp condition, comprising directing a beam of light at the lamp, detecting percent transmission of the beam through the lamp, wherein the percent transmission is indicative of lamp blackening, and repeating the directing and detecting of the beam of light periodically to provide an indication of lamp blackening over time, wherein the lamp blackening thereby provides an indication of lamp condition over time.

Abstract: The invention relates to a detection device (2) intended to be positioned in a conveyor (1) which comprises conveying rollers (100) arranged between two lateral uprights (10, 11) to convey goods in a conveying direction (D), the device comprising: an elongate support extending over its length along a longitudinal axis (X), said support supporting a number of detectors (40) distributed along its longitudinal axis (X) to detect the goods borne by the conveyor (1), said support being intended to be positioned between two conveying rollers (100), fixed between the two lateral uprights (10, 11) of the conveyor (1), transversally relative to the conveying direction (D).

Abstract: A spectrum information measurement method may include steps of; controlling a reference pixel accumulating charges based on an amount of light irradiated from a test specimen; controlling a plurality of measurement pixels accumulating the charge based on an amount of light that is irradiated from the test specimen and has a prescribed wavelength; generating and outputting a reference signal based on an amount of change in the charge that is accumulated in the reference pixel over the prescribed measurement time; generating and outputting a plurality of measurement signals based on an amount of change in the charge that is accumulated in each of the plurality of measurement pixels over the prescribed measurement time; determining whether or not any one or more of the plurality of measurement signals is greater than the reference signal, and determining that the measurement signal that is greater than the reference signal includes saturated output.

Abstract: Machines and methods measure an unknown characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the unknown characteristic based on the comparison of the output signal and the computationally determined response of the detector. Another method receives an output signal from an optical detector detecting one or more optical signals, accesses a predetermined characteristic curve of detector response, compares the output signal from the detector to the predetermined characteristic curve of detector response, and calculates at least one unknown characteristic of one or more optical signals based on results of the comparing step.

Abstract: An imaging system may include an optical system that forms an image of light irradiated onto a sample in a predetermined focal plane, an imaging element that includes a pixel array in which a plurality of pixels are arranged in a two-dimensional matrix, each of the pixels detecting at least a part of the light of the image of the sample formed in the focal plane, the imaging element obtaining the image of the sample corresponding to the light detected by the pixel array, a spectrum detecting unit arranged to be adjacent to the pixel array, the spectrum detecting unit detecting a spectrum of the light in the focal plane to output spectrum information, and a correcting unit that corrects the image of the sample obtained by the imaging element based on the spectrum information output from the spectrum detecting unit.

Abstract: Embodiments of the present disclosure provide systems, devices, and methods for photodetection. For example, briefly described, in one embodiment among others, a sensor comprises an array of photodetectors, wherein the reflectance of each of the photodectors is a function of the number of photons incident on the respective photodetector; and an electrical insulator positioned between one of the photodetectors and another one of the photodetectors to reduce diffusion of electrons therebetween.

Abstract: Provided is a tester for testing an optical detector. The tester includes a plurality of light emitting units which emit light beams to the optical detector, wherein the light beams have light intensities different from each other, and a power supply unit which supplies electric power to the plurality of light emitting units.

Abstract: The present disclosure relates to a system for optical detection of particles arranged in a viewing area suitable for being illuminated by radiation with a predetermined wavelength. The system includes an optical detector, as well as an assembly of metal plasmonic channels arranged in a single plane and in which one end is close enough to the viewing area to allow optical information to be transferred from one end to the other of the channels. In the system, the channels are arranged such that the assembly forms an array for transferring optical information around the viewing area. The value of at least one spatial characteristic of the array is respectively lower and higher than the wavelength near the ends of the channels that are respectively close to and far away from the viewing area. The system includes an optical decoupler between the ends that are far away from the viewing area and the optical detecter.

Abstract: An optical signal quality monitor includes a splitter splitting an input optical signal into two signals; a low-frequency converter converting one split optical signal to a low frequency signal by modulating the optical signal with a frequency offset signal; and an intensity ratio calculator calculating an intensity ratio between the low frequency signal and the other split optical signal, thereby appropriately confirming the quality of a high-bit rate optical signal. The monitor includes plural processing lines, each line including the splitter, the low-frequency converter, and the intensity ratio calculator. At least one line includes an optical noise superimposer superimposing optical noise on the one split signal before inputted to the converter or an optical band-pass filter transmitting the one split signal before inputted to the converter. The monitor includes a polarization state changer changing the polarization state of the input signal before inputted to the splitter.

Abstract: It relates to a method for measuring at least one of light intensity and colour in at least one modulated image, the method comprising the steps of: a) detecting a modulation pattern of the modulated image(s); and b) synchronizing a measurement of the intensity and/or colour with the detected modulation pattern. It also relates to a corresponding device.

Abstract: This invention enables a worker, who performs a work for optical axis adjustment, to easily grasp whether adjustment for further increasing the light receiving quantity is possible. In a multi-optical axis photoelectronic sensor, a minimum value of the light receiving quantities obtained for every optical axis is detected every time a process of measuring, while lighting each light emitting element 10 by turns, the light receiving quantity of a light receiving element corresponding to a lighted light emitting element 10 is repeated for one cycle, and a peak value of the minimum light receiving quantities detected in the past is detected. A bar graph based on specific values of the most recent minimum light receiving quantity and the peak value, or a bar graph showing a proportion of the most recent minimum light receiving quantity with respect to the peak value is displayed using a plurality of indication lights 100, each arranged on the front surfaces of a light projector 1 and a light receiver 2.

Abstract: A LED light fixture and a luminous flux monitoring system for a light fixture. The light fixture includes a housing defining an interior space including an interior surface and a transmissive panel. A light source is coupled to the interior surface. The system includes a light sensor coupled to the interior surface and aligned to receive light from the transmissive panel, light source, and/or interior surface. The light sensor is configured to measure luminous flux in the interior space. A controller is coupled to the light source and the light sensor. The controller is configured to determine if a light sensor measurement of luminous flux in the interior space is more or less than a reference value of the luminous flux. If the measurement of luminous flux is less than the reference value, the controller is configured to activate an end-of-life indicator. The reference value equals (total flux?internal ambient flux)×depreciation factor.

Abstract: A method for determining optical density is disclosed. A first measurement is taken on a white area of a substrate (402). A second measurement is taken on an area of the substrate printed with ink (404). A relative optical density of the ink is determined using the first and second measurements (406).

Abstract: A mobile device including a solar battery having a light-receiving surface provided on a casing of the mobile device, an illuminance detector that detects an illuminance of light incident on the casing, an output section that outputs a state of light incident on the light-receiving surface of the solar battery, and a controller that controls the output section based on the illuminance detected by the illuminance detector.

Abstract: An apparatus for detecting electromagnetic waves includes a first electromagnetic wave sensor, two first electrodes, a second electromagnetic wave sensor, and two second electrodes. The two first electrodes are electrically connected to different portions of the first electromagnetic wave sensor. The second electromagnetic wave sensor crosses with and is spaced from the first electromagnetic wave sensor. The two second electrodes are electrically connected to different portions of the second electromagnetic wave sensor.

Abstract: An object is to provide a photosensor utilizing an oxide semiconductor in which a refreshing operation is unnecessary, a semiconductor device provided with the photosensor, and a light measurement method utilizing the photosensor. It is found that a constant gate current can be obtained by applying a gate voltage in a pulsed manner to a transistor including a channel formed using an oxide semiconductor, and this is applied to a photosensor. Since a refreshing operation of the photosensor is unnecessary, it is possible to measure the illuminance of light with small power consumption through a high-speed and easy measurement procedure. A transistor utilizing an oxide semiconductor having a relatively high mobility, a small S value, and a small off-state current can form a photosensor; therefore, a multifunction semiconductor device can be obtained through a small number of steps.

Abstract: Embodiments described herein relate to a light sensing system. In one embodiment, the light sensing system may include a microprocessor including an input pin configured to receive a first voltage from a light sensor. The light sensing system may also include a pull-up resistor coupled to the input pin. The pull-up resistor may include a first gate. The light sensing system may further include a pull-down resistor coupled to the input pin. The pull-down resistor may include a second gate. The first and second gates may allow for connecting or disconnecting the pull-up and pull-down resistors based on the amount or intensity of light detected by the light sensor.