Abstract: A double data rate pseudo SRAM (DDR PSRAM) is provided. The DDR PSRAM includes a data receiver, a memory and an address decoder. The data receiver receives a first single data rate data from a controller via a common bus according to a clock. The address decoder decodes the first single data rate data to obtain an address of the memory. The data receiver stores the double data rate data into the address of the memory. The DDR PSRAM also includes a data transmitter and a data strobe generating unit. The data transmitter obtains data stored in the address of the memory and provides a double data rate data to the controller according to the obtained data, and the data strobe generating unit a data strobe signal to the controller and toggling the data strobe signal in response to the double data rate data.

Abstract: An output driver comprises a pull-up circuit that pulls up an output node to a supply voltage in N successive intervals in response to N pull-up control signals having different phases and a pull-down circuit that pulls down the output node to a ground voltage in M successive intervals in response to M pull-down control signals having different phases.

Abstract: A system including a controller and a memory device interconnected to the controller; the controller includes a set of first terminals that is connected to the memory device through a set of first signal lines, and a control circuit configured to generate and output onto the set of first terminals edge specifying information that takes a selected one of first and second states, the edge specifying information being supplied to the memory device to cause the memory device to activate a data strobe signal at a first timing when the selected one of the edge specifying information is the first state and at a second timing, that is different from the first timing, when the edge specifying information is the second state. The control circuit is further configured to generate and output onto the set of first terminals a read command, the read command being supplied to the memory device.

Abstract: A memory device that accurately tracks memory operations includes a vertical loopback for tracking a sense clock signal to a row address decoder, and read and write reference bit lines in a reference column that include loopbacks for vertically tracking a selected bit line during read and write operations. Preferably the widths of word lines and a sense line are equal to enable the sense line to horizontally track any selected word line. The memory device also includes tri-state input/output (I/O) latches to latch sense amplifier outputs. A drive circuit of the tri-state I/O latch is disabled when the output is available at the corresponding sense amplifier and enabled when the output is latched by the latch circuit.

Abstract: Correction of duty cycle distortion of DQ and DQS signals between a memory controller and a memory is corrected by determining a duty cycle correction factor. The duty cycle distortion is corrected by applying the duty cycle correction factor to the plurality of differential DQS signals. The duty cycle distortion is corrected across a plurality of differential DQS signals between the memory controller and the bursting memory.

Abstract: An integrated circuit memory device is disclosed. The memory device includes a memory core having a timing input to receive a clock signal. An interface couples to the memory core. The interface includes a receiver to receive a serial stream of write data bits and a sampler clocked by a strobe signal to generate serialized write data. The interface also includes a deserializer and control logic. The deserializer includes an input to receive the serialized write data and an output to generate parallel data responsive to a control signal generated by the control logic. In a first mode of operation, the control logic generates the control signal with respect to the clock signal. In a second mode of operation, the control logic generates the control signal with respect to the strobe signal.

Abstract: A differential data strobe receiver is provided which is configured to receive a differential data strobe signal at a first strobe input and a second strobe input, wherein transitions of the differential data strobe signal indicate sample points for an associated data signal. The differential data receiver is configured to identify the transitions of the differential strobe signal by differentially comparing values of the differential strobe signal received at the first strobe input and the second strobe input. The differential data strobe receiver comprises strobe gating circuitry configured to generate a strobe gating signal, wherein the associated data signal can only be sampled in dependence on the differential data strobe signal when the strobe gating signal is asserted and strobe input termination circuitry configured selectively to provide a first termination connection for the first strobe input and a second termination connection for the second strobe input.

Abstract: A strobe signal from a memory is delayed through delay circuits of a strobe delay selection section, thus obtaining a plurality of delayed strobe signals. A strobe latch section produces check data in synchronism with each of the delayed strobe signals, and a system latch section latches, with a system clock, check data latched by the strobe latch section. Based on a comparison by an expected value comparison section and a determination by a delay determination section, the optimal strobe signal with the optimal delay is selected from among the delayed strobe signals produced in the strobe delay selection section. Then, data from the memory is delayed through delay circuits in a data delay selection section, thus obtaining a plurality of delayed data, and the optimal data with the optimal delay is selected from among the plurality of delayed data based on the comparison by the expected value comparison section and the determination by the delay determination section.

Abstract: An integrated circuit may include memory interface circuitry that is used to communicate with off-chip memory. The memory interface circuitry may include data strobe (DQS) enable circuitry that receives DQS signals from the off-chip memory and that outputs a gated version of the DQS signals. The DQS enable circuitry may include an input buffer, a comparator, a latch, a flip-flop, a counter, and a gating circuit. The input buffer may receive an incoming DQS signal. The comparator may be used to determine when the incoming DQS signal starts to toggle. The latch may be used to control when a gating signal is asserted. The flip-flop controls the counter, which limits the duration that the gating signal is asserted. The gating circuit receives the DQS signal from the buffer and the gating signal and passes the DQS signal through to its output only when the gating signal is asserted.

Abstract: A row decoder is disposed on a side of a memory cell array in a column direction and supplies one of word lines with a first drive signal for selecting one of memory cells. A dummy word line is formed extending in the column direction. A dummy bit line is formed extending in a row direction. At least one of the dummy word line and the dummy bit line is disposed outside of the memory cell array. The row decoder outputs a second drive signal toward a sense amplifier circuit via the dummy bit line and the dummy word line.

Abstract: A memory circuit includes a transistor having a channel in an oxide semiconductor layer, a capacitor, a first arithmetic circuit, a second arithmetic circuit, a third arithmetic circuit, and a switch. An output terminal of the first arithmetic circuit is electrically connected to an input terminal of the second arithmetic circuit. The input terminal of the second arithmetic circuit is electrically connected to an output terminal of the third arithmetic circuit via the switch. An output terminal of the second arithmetic circuit is electrically connected to an input terminal of the first arithmetic circuit. An input terminal of the first arithmetic circuit is electrically connected to one of a source and a drain of the transistor. The other of the source and the drain of the transistor is electrically connected to one of a pair of electrodes of the capacitor and to an input terminal of the third arithmetic circuit.

Abstract: Apparatuses and method for adjusting a path delay of a command path are disclosed. In an example apparatus, a command path configured to provide a command from an input to an output includes an adjustable delay. The adjustable delay is configured to add delay to the command path delay, wherein the delay of the adjustable delay is based at least in part on a phase relationship between a feedback signal responsive to the command propagating through the command path and a clock signal. An example method includes configuring a command path to add delay to a command path delay to provide an internal write command signal to perform a write operation on write data corresponding to the internal write command, and propagating the write data corresponding to the internal write command through a data path without further delaying the write data to match the command path delay.

Abstract: A memory component has a signaling interface, data input/output (I/O) circuitry, command/address (CA) circuitry and clock generation circuitry. The signaling interface includes an on-die terminated data I/O and an unterminated CA input. The data I/O circuitry is dedicated to sampling write data bits at the data I/O timed by a strobe signal and to transmitting read data bits timed by a first clock signal, each of the write and read data bits being valid for a bit time at the data I/O. The CA circuitry samples CA signals at the CA input timed by a second clock signal, the CA signals indicating read and write operations to be performed within the memory component. The clock generation circuitry generates the first clock signal with a phase that establishes alignment between a leading edge of the bit time for each read data bit and a respective transition of the second clock signal.

Abstract: According to example embodiments, a semiconductor memory device includes a memory cell array, a multi-purpose register, a data output circuit, and a mode register. The memory cell array is configured to store data. The multi-purpose register is configured to store a data pattern. The data output circuit is configured to output the stored data during a first output mode and output the stored data pattern during a second output mode. The mode register is configured to set the first or second output mode according to a logic level of a portion of a content of the mode register.

Abstract: Embodiments of a data capture system and method may be used in a variety of devices, such as in memory controllers and memory devices. The data capture system and method may generate a first set of periodic signals and a second set of periodic signals that differs from the first set. Either the first set of periodic signals or the second set of periodic signals may be selected and used to generate a set of data capture signals. The selection of either the first set or the second set may be made on the basis of the number of serial data digits in a previously captured burst of data. The data capture signals may then be used to capture a burst of serial data digits.

Abstract: The present invention provides a DQS bus for implementing high speed multiple-data-rate interface architectures in programmable logic devices. The DQS bus has a balanced tree structure between at least one data strobe circuit and a plurality of I/O register blocks.

Abstract: An integrated circuit chip includes a test enable pad configured to receive a test enable signal, a plurality of test input pads including a reset pad, a signal combination unit configured to combine signals input to the plurality of test input pads when the test enable signal is activated, and to generate a plurality of test output signals, a plurality of test output pads configured to output the plurality of test output signals, and a reset control unit configured to generate a system reset signal using a signal input to the reset pad when the test enable signal is deactivated, and to generate the system reset signal using the test enable signal when the test enable signal is activated.

Abstract: A semiconductor integrated circuit including first semiconductor chip and second semiconductor chip that are vertically stacked, wherein the first semiconductor chip includes a first column data driving circuit configured to transmit internal data to the second semiconductor chip in a DDR (double data rate) scheme based on an internal strobe signal, and a first column strobe signal driving circuit configured to generate first column strobe signals that are source-synchronized with first column data transmitted to the second semiconductor chip by the first column data driving circuit, based on the internal strobe signal, and transmit the first column strobe signals to the second semiconductor chip.

Abstract: Disclosed embodiments may include a circuit having a plurality of data terminals, no more than two pairs of differential data strobe terminals associated with the plurality of data terminals, and digital logic circuitry. The digital logic circuitry may be coupled to the data terminals and configured to use the no more than two pairs of differential data strobe terminals concurrently with the plurality of data terminals to transfer data. Other embodiments may be disclosed.

Abstract: A method for synchronizing signals includes the steps of receiving a preamble of a data strobe signal in response to a write preamble command, and synchronizing the data strobe signal with a clock signal through the preamble of the data strobe signal.

Abstract: A controller, includes a plurality of external terminals configured to supply a command and an address to a semiconductor memory device, communicate a data with the semiconductor memory device, and communicate a strobe signal related to the data, at least one external terminal among the plurality of external terminals being configured to be capable of supplying an information specifying a length of a preamble of the strobe signal before the semiconductor memory device communicates the data.

Abstract: A memory device includes a decoder circuit configured to activate a setting signal and a write signal if a setting command is applied when a reference mode is set; a delay circuit configured to delay and to generate a delayed write signal; and a setting circuit configured to perform a setting operation in response to the delayed write signal and an input signal of a predetermined pad at the time of setting of the reference mode and to perform the setting operation in response to the setting signal when the reference mode is not set.

Abstract: A memory device includes a command decoder and control interface logic. One or more external inputs, such as row and column address strobes, communicate with the command decoder through the control interface logic. A control signal is also in communication with the control interface logic. During operation of a drowsy mode in the memory device, a self-refresh signal causes the control signal to disable the external inputs. With the external inputs disabled, command hazards are reduced when exiting drowsy mode.

Abstract: A semiconductor memory device, includes a clock terminal provided to receive a clock signal, a data terminal provided to transfer a data therethrough in synchronization with the clock signal, a strobe terminal provided to be related in the data terminal and to transfer a strobe signal therethrough, a command terminal provided to receive a command that communicates the data with an outside thereof, and an address terminal provided to be supplied an information specifying a length of a preamble of the strobe signal from an outside of the semiconductor memory device, prior to communicating the data.

Abstract: A system, includes a controller including a plurality of first external terminals configured to supply a command, a clock signal and an address, and communicate a data, and communicate a strobe signal related to the data, and a semiconductor memory device including a plurality of second external terminals corresponding to the plurality of first external terminals, one of the plurality of first external terminals and one of the plurality of second external terminals transferring an information specifying a length of a preamble of the strobe signal before the semiconductor memory device communicates the data.

Abstract: A system, includes a controller comprising a plurality of first external terminals configured to supply a command and an address, and communicate a data, and communicate a strobe signal related to the data; and a semiconductor memory device including a plurality of second external terminals corresponding to the plurality of first external terminals, at least one of the plurality of first external terminals and at least one of the plurality of second external terminals each being capable of supplying an information specifying a length of a preamble of the strobe signal before the semiconductor memory device communicates the data between the controller and the semiconductor memory device, the semiconductor memory device further including a preamble register configured to be capable of storing the information.

Abstract: Hardware-based methods and apparatus are provided for training high speed data links used in data transfer applications. A data valid window is calibrated on one or more high speed links by determining an offset delay value for at least one datapath using a finite state machine, wherein the offset delay value is based on a maximum offset delay value and a minimum offset delay value for the at least one datapath; and delaying a read data strobe signal based upon a base delay and the offset delay value for the at least one datapath. The offset delay value can be, for example, an average of the maximum offset delay and the minimum offset delay. The received pattern can be a predefined pattern or a programmable pattern. In addition, the received pattern can cover single-bit transitions and/or multi-bit transitions.

Abstract: A semiconductor memory device includes an input/output circuit configured to receive an address and data from an exterior, and a peripheral circuit configured to receive the address through the input/output circuit and generate a chip selection signal based on the address. The input/output circuit may include a control pad circuit configured to apply or block at least one data strobe signal in response to the chip selection signal, and one or more input/output pad circuits configured to transfer the data to the peripheral circuits in response to the at least one data strobe signal.

Abstract: According to one embodiment, a device for synchronizing data output from two or more memory arrays that includes a plurality of sense circuits configured to be responsive to a clock signal. The device further includes a plurality of latches and a tracking circuit. The tracking circuit may be configured to produce a control signal responsive to the clock signal. The control signal may be operable to enable the plurality of latches. The tracking has an associated delay that is substantially the same as a delay associated with at least one of the plurality of sense circuits.

Abstract: Various method and apparatus embodiments for training a delay for enabling a data strobe signal in a memory subsystem are disclosed. In one embodiment, a system includes a memory controller configured to receive a data strobe signal. The memory controller includes a training circuit. The training circuit includes a first storage circuit coupled to receive the data strobe signal on a data input and an enable signal on a clock input, and a training unit configured to, based on an output signal received from the first flip-flop, adjust a phase of the enable signal until an assertion of the enable signal coincides with a preamble indication in the data strobe signal.

Abstract: A controller includes a set of first terminals to be coupled to a device that is under control of the controller, and a control circuit configured to generate and output onto the set of first terminals edge specifying information that takes a selected one of first and second states, the edge specifying information being supplied to the device to cause the device to activate a data strobe signal at a first timing when the selected one of the edge specifying information is the first state and at a second timing, that is different from the first timing, when the edge specifying information is the second state, the control circuit being further configured to generate and output onto the set of first terminals a read command, the read command being supplied to the device to cause the device to return to the controller a data signal.

Abstract: A controller for a DDR PSRAM is provided. The controller includes a single rate processing unit, a double rate processing unit and a selector. The signal rate processing unit obtains a single data rate data according to a first data and a first clock. The double rate processing unit obtains a double data rate data according to a second data and a second clock that is two times the frequency of the first clock. The selector selectively provides any of the single data rate data and the double data rate data to the DDR PSRAM via a common bus according to a control signal.

Abstract: A system includes a data transmitting device and a data receiving device. The data transmitting device includes a data strobe signal generation unit configured to generate first and second data strobe signals in response to an output enable signal, and a data output unit configured to transmit data in synchronization with the first data strobe signal. The data receiving device is configured to receive the data in synchronization with the second data strobe signal.

Abstract: Integrated circuits with memory interface circuitry may be provided. Prior to calibration, a number of samples may be determined by computing probability density function curves as a function of timing window edge asymmetry for different degrees of oversampling. During calibration, duty cycle distortion in data strobe signals may be corrected by selectively delaying the data strobe rising or falling edges. A data clock signal that is used for generating data signals may also suffer from duty cycle distortion. The rising and falling edges of the data clock signal may be selectively delayed to correct for duty cycle distortion. The data path through which the data signals are routed may be adjusted to equalize rising and falling transitions to minimize data path duty cycle distortion. Multi-rank calibration may be performed by calibrating to an intersection of successful settings that allow each memory rank to pass memory operation tests.

Abstract: A semiconductor memory device includes: a strobe clock generator configured to generate a strobe clock signal having a delay time controlled according to a plurality of test mode signals which are selectively enabled in response to a read signal or write signal; an internal address generator configured to latch an address in response to a first level of the strobe clock signal, and generate an internal address by decoding the address in response to a second level of the strobe clock signal; and an output enable signal generator configured to decode the internal address and generate output enable signals which are selectively enabled.

Abstract: A non-volatile memory device is operated by outputting data in response to an alternating sequence of first and second edges of a read control signal, respectively. A determination is made whether the read control signal and a write control signal are in synchronization at one of the first edges. Output of the data is stopped at the second edge that follows the one of the first edges of the read control signal if the read control signal and the write control signal are in synchronization at the one of the first edges.

Abstract: According to one embodiment, a timing adjustment circuit for a memory interface is presented. The circuit is provided with a gate circuit, an original gate signal generation circuit, a high impedance prevention unit, an impedance control unit and a gate leveling circuit. The gate circuit performs gating of a data strobe signal outputted from a memory. The original gate signal generation circuit generates an original gate signal based on information of a read latency and a burst length. The high impedance prevention unit to prevent the data strobe signal from being in a high impedance state. The impedance control unit controls execution and release of operation of the high impedance prevention unit. The gate leveling circuit outputs a timing adjusted gate signal to the gate circuit based on the original gate signal and the data strobe signal.

Abstract: A system, includes a controller including a plurality of first external terminals configured to supply a command, a clock signal and an address, and communicate a data, and communicate a strobe signal related to the data, and a semiconductor memory device including a plurality of second external terminals corresponding to the plurality of first external terminals, one of the plurality of first external terminals and one of the plurality of second external terminals transferring an information specifying a length of a preamble of the strobe signal before the semiconductor memory device communicates the data.

Abstract: A control device that comprises a first data strobe input terminal to be connected in common to data strobe terminals that are included respectively in first memory devices, and a plurality of first sub-units each coupled to the first data strobe input terminal and each holding a data strobe delay value corresponding to an associated one of the first memory devices, and the data strobe delay values of the sub-units being independent from each other.

Abstract: A semiconductor memory device includes a signal processing unit configured to generate a control signal corresponding to burst length information and an output controlling unit configured to control an output of a data strobe signal in response to the control signal.

Abstract: A memory device using error correcting code and a system including the same are provided. The memory device includes a memory cell array including a plurality of bit lines and a plurality of memory cells; an access block for accessing the memory cell array; and a controller block for receiving a first operation command signal, dividing the first operation command signal into at least two paths pulse signals corresponding to at least two paths, based on a pre-determined criterion, and then supplying the at least two path pulse signals to the access block. The access block operates based on an output signal of the controller block.

Abstract: A data input device for use in a memory device to avoid false data being written due to a postamble ringing phenomenon in a write operation is provided. The data input device comprises a buffer, a combinational logic circuit and a flip-flop unit. The buffer receives the data and outputs internal data to the flip-flop unit. The combinational logic circuit receives an external data strobe signal to generate a first data strobe signal and a second data strobe signal. The flip-flop unit stores the data in synchronization with the first data strobe signal and outputs the stored data in synchronization with the second data strobe signal. A last rising edge of the second data strobe signal is generated prior to onset of the postamble ringing on the external data strobe signal, so that a data transferred path in the flip-flop unit is closed prior to onset of the postamble ringing.

Abstract: A memory component has a signaling interface, data input/output (I/O) circuitry, command/address (CA) circuitry and clock generation circuitry. The signaling interface includes an on-die terminated data I/O and an unterminated CA input. The data I/O circuitry is dedicated to sampling write data bits at the data I/O timed by a strobe signal and to transmitting read data bits timed by a first clock signal, each of the write and read data bits being valid for a bit time at the data I/O. The CA circuitry samples CA signals at the CA input timed by a second clock signal, the CA signals indicating read and write operations to be performed within the memory component. The clock generation circuitry generates the first clock signal with a phase that establishes alignment between a leading edge of the bit time for each read data bit and a respective transition of the second clock signal.

Abstract: Integrated circuits may communicate with off-chip memory. Such types of integrated circuits may include memory interface circuitry that is used to interface with the off-chip memory. The memory interface circuitry may be calibrated using a procedure that includes read calibration, write leveling, read latency tuning, and write calibration. Read calibration may serve to ensure proper gating of data strobe signals and to center the data strobe signals with respect to read data signals. Write leveling ensures that the data strobe signals are aligned to system clock signals. Read latency tuning serves to adjust read latency to ensure optimum read performance. Write calibration may serve to center the data strobe signals with respect to write data signals. These calibration operations may be used to calibrate memory systems supporting a variety of memory communications protocols.

Abstract: A semiconductor device includes: a clock generator generating a first internal clock signal based on an external clock signal; a clock divider generating second and third internal clock signals based on the first internal clock signal and including an edge adjustor adjusting a timing of one of rising and falling edges of the third internal clock signal, an adjustment information holder supplying an edge adjustment signal to the edge adjustor, and a data strobe generator receiving the second and third internal clock signals to generate a first data strobe signal based on the second internal clock signal, and a second data strobe signal with a phase different from that of the first data strobe signal, based on the third internal clock signal. The edge adjustor adjusts the timing of at least one of the rising and falling edges of the third internal clock signal based on the edge adjustment signal.

Abstract: Integrated circuits may include memory interface circuitry operable to communicate with system memory. The memory interface circuitry may receive data and data strobe signals from system memory during read operations. The memory interface circuitry may include de-skew circuitry and dynamic variation compensation circuitry. The de-skew circuitry may be configured during calibration procedures to reduce skew between the data and data strobe signals. The dynamic variation compensation circuitry may be used in real time to compensate for variations in operating conditions.

Abstract: A nonvolatile memory device and system having a nonvolatile memory device accessible with a DRAM protocol.

Abstract: The present invention relates to a semiconductor memory circuit enabling stable data transmission in a high frequency operation and a data processing system using the same. The data processing system includes a semiconductor memory circuit configured to output data, corresponding to a read command, in response to an external strobe signal, and a controller configured to provide the semiconductor memory circuit with the read command and the strobe signal related to the read command.

Abstract: A memory system includes a memory controller that writes data to and reads data from a memory device. A write data strobe accompanying the write data indicates to the memory device when the write data is valid, whereas a read strobe accompanying data from the memory device indicates to the memory controller when the read data is valid. The memory controller adaptively controls the phase of the write data strobe to compensate for timing drift at the memory device. The memory controller uses read signals as a measure of the drift.

Abstract: Memory access alignment in a double data rate (‘DDR’) system, including: executing, by a memory controller, one or more write operations to a predetermined address of a DDR memory module, including sending to the DDR memory module a predetermined amount of data of a predetermined pattern along with a data strobe signal; executing, by the memory controller, a plurality of read operations from the predetermined address of the DDR memory module, including capturing data transmitted from the DDR memory module; and determining, by the memory controller, a read adjust value and a write adjust value in dependence upon the data captured in response to the read operations.