Abstract: Various embodiments of the present invention are directed to crossbar-memory systems to methods for writing information to and reading information stored in such systems. In one embodiment of the present invention, a crossbar-memory system comprises a first layer of microscale signal lines, a second layer of microscale signal lines, a first layer of nanowires configured so that each first layer nanowire overlaps each first layer microscale signal line, and a second layer of nanowires configured so that each second layer nanowire overlaps each second layer microscale signal line and overlaps each first layer nanowire. The crossbar-memory system includes nonlinear-tunneling resistors configured to selectively connect first layer nanowires to first layer microscale signal lines and to selectively connect second layer nanowires to second layer microscale signal lines.

Abstract: A circuit for transforming memory address is disclosed. A first memory address is transformed into a second memory address with more bits than the first memory address for providing a memory. The memory space is an even multiple of the maximum of the first memory address. Therefore a large memory can be used as a small memory.

Abstract: A computer-implemented method for creating an integrated circuit, IC, test engine for testing a proposed IC memory array using new memory structural model. An IC designer inputs the number of words that can be stored and a column multiplexer ratio in a proposed IC memory array. A selection of one or more procedures is made from a library of computer-readable procedures. Each of the procedures is to produce one or more structural primitives that describe certain physical layout features of the proposed IC memory array, without analyzing a CAD layout file of the proposed IC memory array. The library of procedures as a whole translates between a physical model of a family of IC memory arrays and a user interface model of the family. A data background, DB, pattern is produced to be used by the test engine in testing the proposed IC memory array. This is done by executing the selected one or more procedures, wherein these procedures take as input the received number of words and column multiplexer size.

Abstract: A circuit, method, and computer readable medium for on-chip measuring of noise margins in a memory device memory device are disclosed. The on-chip method includes electrically coupling at least a first circuit to a memory cell. A voltage divider is electrically coupled to at least a first voltage and a second voltage. A multiplexer circuit is electrically coupled to the voltage divider. The multiplexer selects one of the first voltage and second voltage for producing a test voltage. A selecting line is electrically coupled to a force\measure network. A comparator is coupled to the force\measure network. The force-measure network supplies the test voltage to the comparator and a measured voltage to the comparator for determining when the measured voltage exceeds the test voltage.

Abstract: A pseudo-dual port memory address multiplexing system includes a control circuit operative to identify a read request and a write request to be accomplished during a single clock cycle. A self time tracking circuit monitors a read operation and generates a switching signal when the read operation is determined to be complete. A multiplexer is responsive to the switching signal for selectively providing a read address and a write address to a memory address unit at the proper time.

Abstract: In a semiconductor device including a plurality of memory units and a method of testing the same, the semiconductor device includes a plurality of memory units each comprising a plurality of input lines; and an input unit configured to provide a plurality of test signals to the input lines, respectively, included in each of the memory units in response to a test enable signal. A data input/output unit can be configured to receive Z-bit data from test equipment and to distribute the Z-bit data to the plurality of memory units in response to the test enable signal, where Z is a natural number. The data input/output unit outputs K-bit data, which are output from each of the plurality of memory units, through data input/output lines included in the plurality of memory units in response to the test enable signal, where K?Z and K is a natural number.

Abstract: This disclosure relates to misalignment-tolerant processes for fabricating multiplexing/demultiplexing architectures. One process enables fabricating a multiplexing/demultiplexing architecture at a tolerance greater than a pitch of conductive structures with which the architecture is capable of communicating. Another process can enable creation of address elements and conductive structures having substantially identical widths.

Abstract: Some embodiments include a delay line configured to apply a delay to an input signal to provide an output signal; an input circuit configured to provide the input signal based on a first signal, such that the cycle time of the input signal is different from a cycle time of the first signal; an output circuit configured to provide a second signal based on the output signal, the second signal having a cycle time different from a cycle time of the output signal; and a controller configured to adjust the delay to control a timing relationship between the first signal and the second signal. Other embodiments are described and claimed.

Abstract: A driving circuit includes a first switch, a first driver and a second driver. The first switch has a first terminal coupled to a first voltage. The first driver includes a second switch and a third switch. The second switch has a first terminal coupled to a second terminal of the first switch, and a second terminal coupled to a first capacitor. The third switch has a first terminal coupled to the second terminal of the second switch, and a second terminal coupled to a second voltage. The second driver includes a fourth switch and a fifth switch. The fourth switch has a first terminal coupled to the second terminal of the first switch, and a second terminal coupled to a second capacitor. The fifth switch has a first terminal coupled to the second terminal of the fourth switch, and a second terminal coupled to the second voltage.

Abstract: A semiconductor memory device includes a plurality of input/output (I/O) ports, a plurality of memory cell arrays and a region configurator. The region configurator is adapted to hold share region information about at least one share region. In the memory cell arrays, at least one share region accessible through the I/O ports is configured on the basis of the share region information.

Abstract: A memory unit includes width decoding logic enabling data to be accessed in a memory array at different data widths. To improve memory access speed, the memory unit also includes dedicated read output paths for accessing data at the full data width of the memory array. The dedicated read output paths bypass the width decoding logic and provide data from the memory array directly to a data bus, thereby providing improved memory performance when width decoding is not needed. The memory unit can be incorporated in programmable devices and a programmable device configuration can select either the read bypass paths or the width decoding logic. Hardware applications that require width decoding and improved memory access speed can utilize additional programmable device resources outside the memory unit to register the full width data from the memory unit and convert it to a different data width.

Abstract: Memories, precharge control circuits, methods of controlling, and methods of utilizing are disclosed, including precharge control circuits for a memory having at least one bank of memory. One such control circuit includes at least one precharge preprocessor circuit. The precharge preprocessor circuit is coupled to a respective bank of memory and is configured to prevent precharge of the respective bank of memory until after execution of buffered write commands issued to the respective bank of memory is completed.

Abstract: Apparatus and methods are disclosed, such as those involving a memory device. One such memory device includes a memory array including a sub-array that includes a first number of columns of memory cells, and one or more global input/output (I/O) lines shared by the first number of columns for data transmission. The memory device also includes one or more multiplexers/demultiplexers, wherein each of the multiplexers/demultiplexers is electrically coupled to one or more, but not all, of the global I/O lines. The memory device further includes a plurality of local I/O lines, each configured to provide a data path between one of the multiplexers/demultiplexers and one or more, but less than the first number, of the columns in the sub-array. This configuration allows local I/O line repairability with fewer redundant elements, and shorter physical local I/O lines, which translate to improved speed and die size reduction.

Abstract: A semiconductor device may include a decoder for decoding a plurality of internal command signals and outputting a first Y-address enabling signal; a Y-address enabling signal generator for receiving the first Y-address enabling signal and outputting a second Y-address enabling signal having a predetermined enabled period; a multiplexer (MUX) for receiving the first Y-address enabling signal and the second Y-address enabling signal and selectively outputting any one thereof as a Y-address enabling signal; and a MUX controller for controlling the MUX such that the MUX selects any one of the first Y-address enabling signal or second Y-address enabling signal according to an operation mode of the semiconductor device.

Abstract: A semiconductor memory apparatus includes a first data selection section inputted with the first data and second data and output one of the first data and the second data as first selection data in response to an address signal, a second data selection section inputted with the second data and the first selection data and output one of the second data and the first selection data as second selection data depending upon an input and output mode, and a data output section configured to be inputted with the first and second selection data and output first and second output data.

Abstract: A memory device, and method of operation of such a device, are provided. The memory device comprises an array of memory cells arranged in a plurality of rows and a plurality of columns, at least one bit line being associated with each column. Column multiplexer circuitry is coupled to the plurality of columns, for inputting write data into a selected column during a write operation and for outputting an indication of read data sensed from a selected column during a read operation. The column multiplexer circuitry comprises a single pass gate transistor per bit line, and latch circuitry is then used to detect the read data from the indication of read data output by the column multiplexer circuitry during the read operation, and to store that detected read data. Such an approach provides a particularly area efficient construction for the column multiplexer circuitry whilst enabling correct evaluation of the read data held in the addressed memory cell.

Abstract: Various embodiments are disclosed relating to a memory circuit architecture. In an example embodiment, which may accommodate a change to a new memory size or cell aspect ratio, while migrating between different process nodes or the same process generation, while retaining at least a portion of the periphery circuitry, a memory circuit architecture may be employed in which the memory array is divided into an upper half and a lower half, thereby splitting the cache Ways among the two halves. The wordline may be split among the two array halves, with each half driven by a half wordline driver. Also, in another embodiment, two sets of bitlines may be provided for each column, including a contacted set of bitlines and a feed-through set of bitlines.

Abstract: Method and apparatus for implementing first-in-first-out (FIFO) memories using time-multiplexed memory in an integrated circuit are described. A block random access memory (BRAM) circuit embedded in the integrated circuit is provided. The BRAM includes at least one port responsive to a respective at least one BRAM clock signal. FIFO logic is configured to implement a plurality of FIFOs in the BRAM having a plurality of interfaces. Multiplexer logic is configured to selectively couple the plurality of output interfaces of the FIFO logic to the at least one port of the BRAM circuit responsive to at least one FIFO clock signal. Each of the at least one BRAM clock signal has at least twice the frequency of a respective one of the at least one FIFO clock signal.

Abstract: AY-decoder includes a selection unit and a Y-MUX. The selection unit is coupled to the memory array for selecting the column lines. The Y-MUX is coupled to the selection unit for supplying a voltage to the selected column line. The Y-MUX includes a first switch, a second switch, a third switch and a fourth switch coupled in parallel. The first switch and the second switch are respectively for receiving a first shielding voltage and a second shielding voltage. The third switch and the fourth switch are respectively for receiving a first sensing voltage and a second sensing voltage.

Abstract: A circuit and method are provided that eliminate race conditions in data storage devices. Generally, the circuit includes: (i) an input latch to which an address signal (ADD) is applied; (ii) a multiplexer (MUX) to which the ADD is coupled from the input latch and through which an output is supplied to an output latch; (iii) an address valid signal (ADV) input coupled to the output latch and to which an ADV is applied to close the output latch supplying the output to a circuit output; and (iv) a middle latch coupled between the input latch and the MUX to hold the ADD applied to the MUX until the output latch closes, independent of a change in the ADD applied to the input latch. Preferably, the circuit includes control logic configured to close the middle latch on a rising edge of ADV and reopen it when the output latch closes.

Abstract: For each memory block, a predecoder for predecoding an applied address signal, an address latch circuit for latching the output signal of the predecoder, and a decode circuit for decoding an output signal of the address latch circuit and performing a memory cell selecting operation in a corresponding memory block are provided. Propagation delay of latch predecode signals can be made smaller and the margin for the internal read timing can be enlarged. In addition, the internal state of the decoder and memory cell selection circuitry are reset to an initial state when a memory cell is selected and the internal data output circuitry is reset to an initial state in accordance with a state of internal data reading. Thus, a non-volatile semiconductor memory device that can decrease address skew and realize an operation with sufficient margin is provided.

Abstract: A sense margin is improved for a read path in a memory array. Embodiments improve the sense margin by using gates with a lower threshold voltage in a read column multiplexer. A cross coupled keeper can further improve the sense margin by increasing a voltage level on a bit line storing a high value, thereby counteracting leakage on the “high” bit line.

Abstract: An object of the present invention is to provide a memory system that offers enhanced security of ROM code that is data whose contents can be utilized for a given purpose in its intact form. In a memory system, data is read from a memory according to at least two or more addresses outputted from an address generator, from individual pages uniquely specified respectively by the addresses. A data generator generates one piece of data on the basis of the at least two or more pieces of data read from the individual pages.

Abstract: A semiconductor memory device with adjustable I/O bandwidth includes a plurality of data I/O buffers connected one by one to a plurality of I/O ports, a switch array including a plurality of switches for connecting the plurality of data I/O buffers to a plurality of sense amplifier arrays, and a switch control unit for receiving external control signals to control the data I/O buffer and the plurality of switches.

Abstract: An apparatus and method are provided for reading a plurality of consecutive entries and writing a plurality of consecutive entries with only one read address and one write address using a 2Read/2Write register file. In one exemplary embodiment, a 64 entry register file array is partitioned into four sub-arrays. Each sub-array contains sixteen entries having one or more 2Read/2Write SRAM cells. The apparatus and method provide a mechanism to write the consecutive entries by only having a 4 to 16 decode of one address. In addition, the apparatus and method provide a mechanism for reading data from the register file array using a starting read word address and two read word lines generated based on the starting read word address. The two read word lines are used to access the two read ports of the entries in the sub-arrays.

Abstract: A programmable logic device, in accordance with an embodiment of the present invention, includes a plurality of multiplexers, having fuse input terminals and input signal terminals, and a plurality of associated fuses providing fuse signals to the fuse input terminals to control selection of the input signal terminals. The fuses in a first state select a first input signal terminal of the input signal terminals, with a first multiplexer from the plurality of multiplexers receiving a first logic level signal at the first input signal terminal and providing the first logic level signal to the first input signal terminal of a first set of the plurality of multiplexers. The fuses associated with the first set are adapted to be programmed before the fuses associated with the first multiplexer.

Abstract: A semiconductor memory device includes a plurality of memory cell columns each having a plurality of memory cells, each memory cell including being a static type, a plurality of local bit lines connected to the memory cell columns, a global bit line connected to the local bit lines via a plurality of sense amplifiers, a measurement terminal to which a measurement voltage is applied in a cell current measurement mode, and a plurality of switching circuits provided to correspond to the local bit lines, and configured to electrically connect the measurement terminal and one of the local bit lines in the cell current measurement mode.

Abstract: An integrated circuit includes a memory array, first pads, and second pads. The integrated circuit is configured to operate in a first mode and in a second mode. The first mode includes receiving data signals on the first pads and address signals on the second pads to access the memory array. The second mode includes receiving multiplexed data signals and address signals on the first pads to access the memory array.

Abstract: The present invention relates to a memory repair circuit and a repairable pseudo-dual port static random access memory (pseudo-dual port SRAM). The memory repair circuit uses fewer redundant column blocks and stores a few failed block addresses to reduce the required complexity of decoding the redundant column blocks. Thus, the present invention can reduce a layout area required by redundant memory cells.

Abstract: Disclosed herein are a semiconductor memory device and word line addressing method. The semiconductor memory device comprises a memory array comprising a plurality of word lines arranged in a predetermined sequence, and a word line driver adapted to sequentially address the plurality of word lines in a discontinuous manner relative to neighboring word lines. The method comprises addressing a plurality of word lines in a discontinuous manner relative to the predetermined sequence, such that neighboring word lines in the plurality of word lines are not coincidently addressed.

Abstract: A semiconductor device and a method of controlling the semiconductor device, the semiconductor device including: a memory cell array; a terminal that inputs or outputs storage data stored in the memory cell array, and inputs address data indicating an address in the memory cell array at which the storage data is input or output, the terminal including: a first terminal that inputs a first part of the address data; and a second terminal that inputs a second part of the address data, wherein the second part of the address data is included of the entire remaining portion of the address data not including the first part of the address data; a first internal address line and a second internal address line to which the address data is supplied; and a switch that couples the first part of the address data to one of the first internal address line or the second internal address line in accordance with predetermined switch information, while coupling the second part of the address data to the other one of the first in

Abstract: Some embodiments of the invention include a memory device having a memory array for storing memory data, a conditioning data storage unit for storing conditioning data, and data lines for transferring data. During a memory operation, the memory device transfers both the condition data and the memory data to the data lines at different time intervals. The condition data is transferred at one time interval. The memory data is transferred at another time interval. Other embodiments are described and claimed.

Abstract: A memory includes multiple interface ports. The memory also includes at least two sub-arrays each having an instance of all of the bit lines of the memory and a portion of the word lines of the memory. The memory has a common decoder coupled to the sub-arrays and configured to control each of the word lines. The memory also includes multiplexers coupled to each of the interface ports. The multiplexers are configured to cause the selection of one of the sub-arrays based upon an address of a memory cell received at one or more of the interface ports.

Abstract: Integrated circuits such as programmable logic device integrated circuits are provided that have memory arrays that may be configured for true dual port operation or simple dual port operation. The memory arrays include memory cells arranged in rows and columns and associated row address lines and data lines. Sense amplifiers and write drivers are used for reading and writing data. Precharge drivers are used to precharge the data lines prior to read operations. Configurable multiplexer circuitry in the array has read paths through which data is provided to the sense amplifiers from the memory cells. The multiplexer circuitry has write paths through which data from the write drivers is written into the memory cells. The read paths and the write paths contain no more than a single pass gate each. Each precharge driver may be connected to a respective one of the data lines with no intervening pass gates.

Abstract: In a non-volatile memory storage system such as a flash EEPROM system, a controller switches the manner in which data sectors are mapped into blocks and metablocks of the memory in response to host programming and controller data consolidation patterns, in order to improve performance and reduce wear. Data are programmed into the memory with different degrees of parallelism.

Abstract: When recording uncompressed video and/or audio data using a digital video recorder, there is the need for a robust memory arrangement based on non-volatile, integrated circuits which is able to be fitted directly on the video camera without a long external cable connection and which is also able to be used for shots under difficult conditions, particularly action shots. The inventive memory arrangement involves the use of a number of non-volatile memory chips which are connected together with a favorable level of circuit complexity. To be able to cope with the high data rate for the incoming video and/or audio data, a plurality of parallel supply buses are provided. Each supply bus has an associated number of memory chips. In this case, the memory word length of the memory chips is greater than the bus width of a data/address bus.

Abstract: A control circuit applied in a memory that comprises a first memory block and a second memory block, and each of the first and the second memory blocks includes a boundary cell. The control circuit comprises an address decoder, a first Y-multiplexer, and a second Y-multiplexer. The address decoder provides a plurality of column selection signals capable of being a boundary value. The first Y-multiplexer corresponds to the first memory block and provides a first boundary data channel for a boundary cell of the first memory block. The second Y-multiplexer corresponds to the second memory block and provides a second boundary data channel for a boundary cell of the second memory block. The first and the second boundary data channels are enabled simultaneously in response to the boundary value for outputting boundary data stored in the boundary cell of the first memory block and that of the second memory block.

Abstract: A semiconductor integrated circuit device includes a dynamic random access memory (DRAM) unit. The DRAM unit comprises a plurality of bit line pairs. Each bit line pair includes a first bit line and a second bit line. The first bit line and the second bit line within each bit line pair are aligned adjacent to each other. Each of a plurality of word lines is associated with the bit lines such that an array is formed by the bit lines and the associated word lines. Each bit line is associated with both first and second interconnect layers. Each of a plurality of memory cells is associated with every other bit line along each word line. Each of a plurality of amplifiers is in communication with a first bit line and a second bit line within a bit line pair.

Abstract: A redundancy program circuit and methods thereof. The redundancy program circuit may include a master fuse circuit with a master fuse outputting an operation enable signal to indicate a master fuse operating status, at least one control fuse circuit including at least one control fuse, the at least one control fuse circuit outputting an operating status signal for the at least one control fuse and a multiplexing unit configured to multiplex decoding address signal bits based on at least one of the operating status signal and the operation enable signal.

Abstract: A redundancy program circuit and methods thereof. The redundancy program circuit may include a master fuse circuit with a master fuse outputting an operation enable signal to indicate a master fuse operating status, at least one control fuse circuit including at least one control fuse, the at least one control fuse circuit outputting an operating status signal for the at least one control fuse and a multiplexing unit configured to multiplex decoding address signal bits based on at least one of the operating status signal and the operation enable signal.

Abstract: A device that is programmable to operate as a memory device, a multiplexer, or a demultiplexer includes: a first column decoder; a memory array coupled to the first column decoder; a plurality of selectors coupled to the memory array; and a second column decoder coupled to the plurality of selectors.

Abstract: An embedded system for programming a programmable device including a micro controller and an I/O interface. The programmable device includes a pin set for signal delivery. The micro controller device controls the programmable device via the pin set. The I/O interface receives a program code provided externally. The micro controller executes a command sequence to program the program code into the programmable device via the pin set, and the programmable device uses the program code to provide the specific function. The command sequence may also be provided externally and sent to the micro controller via the well-known general I/O interface.

Abstract: A memory device having a short precharge time is included. The memory device selects at least two pairs of bit lines and connects the selected two pairs of bit lines to the sense amplifier within a preparatory period during which the two pairs of bit lines and an input to the sense amplifier are precharged. In the preparatory period an input unit of the sense amplifier is precharged through by a plurality of precharge units through more than two bit lines, and thus the precharge time may be decreased. The memory device selects one pair of bit lines and connects the selected pair of bit lines to a sense amplifier within a read/write (data transmission) period.

Abstract: A semiconductor memory cell device includes a first multiplexer selecting a sub-block including a memory cell storing data to be read out in a row, a drain selector selecting a first column line connected to one terminal of the memory cell to be read, a precharge selector selecting a second column line connected to the other terminal of the memory cells adjacent to the one terminal of the memory cell storing the data to be readout, a second multiplexer selecting the sub-block including the second column line, a source selector selecting a third column line connected to the other terminal of the memory cell storing the data to be read out. The second multiplexer and precharge selector, when selecting, apply a first voltage to the second column line, and the source selector, when selecting, applies a second voltage to the third column line.

Abstract: The semiconductor memory device includes a plurality of bank groups each including a plurality of banks sharing one of a plurality of global input/output line groups, a data input unit configured to transfer external data to data input global lines in response to write commands corresponding to the respective bank groups, a data output unit configured to output data applied on data output global lines to an external circuit in response to read commands corresponding to the respective bank groups, and a data transfer unit configured to transfer data applied on the data input global lines to one of the plurality of global input/output line groups in response to the write commands, and to transfer data applied on one of the plurality of global input/output line groups to the data output global lines in response to the read commands.

Abstract: An integrated circuit device comprises a plurality of bit line pairs. First and second bit lines are aligned with each other in an end-to-end arrangement. The first and second bit lines are arranged consecutively adjacent to one another, respectively. A plurality of word lines is associated with the first bit lines and the second bit lines. A first array includes the first bit lines and first associated ones of the plurality of word lines, and wherein a second array includes the second bit lines and second ones of the plurality of associated word lines. A first plurality of multiplexers communicates with two adjacent bits lines within one of the first and second arrays. The first array operates as a sense array and the second array operates as a reference array when at least one of the plurality of word lines is active in the first array.

Abstract: Systems and methods are described for reducing the number of exterior contacts on a semiconductor package without reducing the number of address, data and control signals used by an integrated circuit interior to the semiconductor package. In some embodiments, two signals may be received at a shared conductor accessible by devices exterior to the semiconductor package and communicated to two contacts on the integrated circuit that are inaccessible to the exterior of the semiconductor package. In various embodiments, signals required to support a full set of features of the JEDEC JESD79E standard or the JEDEC JESD79-2C standard are communicated using a reduced number of exterior contacts.

Abstract: A high performance, set associative, cache memory tag multiplexer provides wide output pulse width without impacting hold time by separating the evaluation and restore paths and using a wider clock in the restore path than in the evaluation path. A clock controls the evaluation of the input signals. Its leading edge (i.e., rising edge) turns on NR to allow evaluation, its trailing edge (falling edge) turns off NR to stop evaluation. At this point, when NR is shut off, the inputs can start changing to set up for the next cycle. Hence the hold time of the input is determined by the clock trailing edge.

Abstract: A pseudo-dual port memory address multiplexing system includes a control circuit operative to identify a read request and a write request to be accomplished during a single clock cycle. A self time tracking circuit monitors a read operation and generates a switching signal when the read operation is determined to be complete. A multiplexer is responsive to the switching signal for selectively providing a read address and a write address to a memory address unit at the proper time.

Abstract: A memory apparatus includes: a memory cell block; a data input part that performs signal processing to transmit general data and mask information input to the semiconductor memory apparatus to the memory cell block, and outputs the processed data and information; a broadband data line connected between the data input part and the memory cell block; a plurality of registers connected to the broadband data line that writes mask information transmitted through the broadband data line; and a multiplexer that selects mask information from one of the plurality of registers in response to a mask information selection signal, and outputs the selected mask information to the memory cell block.