Excimer Or Exciplex Patents (Class 372/57)
  • Patent number: 7141806
    Abstract: An EUV light source collector erosion mitigation method and apparatus for a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma, is disclosed which may comprise including within an EUV plasma source material a replacement material. The replacement material may comprise the same material as the capping material of the multilayered mirror. The replacement material may comprise a material that is essentially transparent to light in a selected band of EUV light, e.g., a spectrum of EUV light generated in a plasma of a plasma source material. The replacement material may comprise a material not susceptible to being etched by an etching material used to remove deposited plasma source material from the collector, e.g., a halogen etchant.
    Type: Grant
    Filed: September 27, 2005
    Date of Patent: November 28, 2006
    Assignee: Cymer, Inc.
    Inventors: William N. Partlo, Alexander I. Ershov, Igor V. Fomenkov, David W. Myers, William Oldham
  • Patent number: 7142573
    Abstract: A temperature-stable and temperature-tunable composite etalon with an increased field of view is constructed by partially filling the cavity with a transmissive parallel-plate filler. The coefficient of thermal expansion and the index of refraction of the filler material are selected so as to produce the desired rate of change of the optical length of the cavity as a function of temperature. The filler plate is preferably chosen to be significantly thicker than the remaining air gap in the etalon cavity. As a result, the fact that the filler plate occupies a large part of the cavity space increases the acceptance angle of the etalon of the invention in comparison with corresponding conventional air-spaced etalons.
    Type: Grant
    Filed: May 7, 2004
    Date of Patent: November 28, 2006
    Assignee: Coronado Technology Group, LLC
    Inventors: David Lunt, Yakov Sidorin
  • Patent number: 7139301
    Abstract: An integrated circuit lithography technique called spectral engineering by Applicants, for bandwidth control of an electric discharge laser. In a preferred process, a computer model is used to model lithographic parameters to determine a desired laser spectrum needed to produce a desired lithographic result. A fast responding tuning mechanism is then used to adjust center wavelength of laser pulses in a burst of pulses to achieve an integrated spectrum for the burst of pulses approximating the desired laser spectrum. The laser beam bandwidth is controlled to produce an effective beam spectrum having at least two spectral peaks in order to produce improved pattern resolution in photo resist film. Line narrowing equipment is provided having at least one piezoelectric drive and a fast bandwidth detection control system having a time response of less than about 2.0 millisecond.
    Type: Grant
    Filed: November 3, 2003
    Date of Patent: November 21, 2006
    Assignee: CYMER, Inc.
    Inventors: Armen Kroyan, Ivan Lalovic, Igor V. Fomenkov, Palash P. Das, Richard L. Sandstrom, John M. Algots, Khurshid Ahmed
  • Patent number: 7122814
    Abstract: A short-wavelength radiation is generated which is stable over time from a plasma generated by energy input into a target jet, in which intensity variations due to altered coupling of excitation radiation into the target jet are minimized. Measuring devices are provided for successive detection over time of deviations of at least one of the directions of the target jet or the energy beam from an intersection point of the two directions that is provided as an interaction point. The measuring devices have output signals which are suitable as regulating variables for the orientation of the directions on the interaction point, and actuating elements are provided for adjusting and tracking at least one of the directions of either the target jet or the energy beam depending on the output signal of the measuring devices in the manner of a control loop.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: October 17, 2006
    Assignee: XTREME technologies GmbH
    Inventors: Guido Hergenhan, Christian Ziener, Kai Gaebel
  • Patent number: 7095762
    Abstract: An object of the present invention is obtaining a semiconductor film with uniform characteristics by improving irradiation variations of the semiconductor film. The irradiation variations are generated due to scanning while irradiating with a linear laser beam of the pulse emission. At a laser crystallization step of irradiating a semiconductor film with a laser light, a continuous light emission excimer laser emission device is used as a laser light source. For example, in a method of fabricating an active matrix type liquid crystal display device, a continuous light emission excimer laser beam is irradiated to a semiconductor film, which is processed to be a linear shape, while scanning in a vertical direction to the linear direction. Therefore, more uniform crystallization can be performed because irradiation marks can be avoided by a conventional pulse laser.
    Type: Grant
    Filed: July 26, 2005
    Date of Patent: August 22, 2006
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Koichiro Tanaka
  • Patent number: 7088758
    Abstract: An apparatus and method are disclosed for operating a narrow band short pulse duration gas discharge laser output light pulse beam producing system, producing a beam comprising laser output light pulses at a selected pulse repetition rate, which may comprise: a dispersive center wavelength selection optic selecting at least one center wavelength for each pulse determined at least in part by the angle of incidence of the laser light pulse beam containing the respective pulse on the dispersive wavelength selection optic; a tuning mechanism operative to select at least one angle of incidence of a first spatially defined portion of the laser light pulse beam containing the respective pulse upon the dispersive center wavelength selection optic; and, the tuning mechanism comprising a variably refractive optical element defining a plurality of refractive angular displacements of the first spatially defined portion of the laser light pulse beam passing through the variably refractive optical element at one of a plura
    Type: Grant
    Filed: October 1, 2004
    Date of Patent: August 8, 2006
    Assignee: Cymer, Inc.
    Inventors: Richard L. Sandstrom, William N. Partlo, Daniel J. W. Brown, Thomas A. Yager, Alexander I. Ershov, Robert J. Rafac, German E. Rylov
  • Patent number: 7085302
    Abstract: There is to provide a laser apparatus that emits a laser beam by exciting gas enclosed in a chamber, including a gas characteristic detecting mechanism for detecting a characteristic of the gas in the chamber, and a calculation mechanism for calculating an oscillation wavelength and/or a wavelength spectral bandwidth of the laser beam based on a detected result by the gas characteristic detecting mechanism.
    Type: Grant
    Filed: January 30, 2003
    Date of Patent: August 1, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yoshiyuki Nagai
  • Patent number: 7075963
    Abstract: A line-narrowing module for a laser includes a prism beam expander and a grating preferably attached to a heat sink. A pressure-controlled enclosure filled with an inert gas seals the grating and/or other elements of the line-narrowing module. The pressure in the enclosure is adjusted for tuning the wavelength. Preferably, the pressure is controlled by controlling the flow of an inert gas through the enclosure. A pump may be used, or an overpressure flow may be used. Alternatively, a prism of the beam expander or an etalon may be rotatable for tuning the wavelength.
    Type: Grant
    Filed: January 25, 2001
    Date of Patent: July 11, 2006
    Assignee: Lambda Physik AG
    Inventors: Dirk Basting, Wolfgang Zschocke, Thomas Schröeder, Juergen Kleinschmidt, Matthias Kramer, Uwe Stamm
  • Patent number: 7072375
    Abstract: In a line-narrowed gas laser system such as a line-narrowed molecular fluorine laser system, ASE is cut off to obtain a spectral linewidth of 0.2 pm or lower and a spectral purity of 0.5 pm or lower. The laser system comprises a laser chamber filled with an F2-containing laser gas, discharge electrodes located in the laser chamber, a laser resonator and a line-narrowing module located in the laser resonator with a wavelength selection element, so that a line-narrowed laser beam emerges from the laser resonator. To cut off ASE from the laser beam emerging from the laser resonator, the duration from laser emission by discharge to generation of a laser beam is preset. Rise of the sidelight is made so gentle that the starting point of a laser pulse can exist after the time of the first sidelight peak.
    Type: Grant
    Filed: February 20, 2003
    Date of Patent: July 4, 2006
    Assignees: Gigaphoton Inc., Ushio Denki Kabushiki Kaisya
    Inventors: Tatsuya Ariga, Kyohei Seki, Osamu Wakabayashi
  • Patent number: 7061959
    Abstract: A gas discharge laser crystallization apparatus and method for performing a transformation of a crystal makeup or orientation in a film on a workpiece is disclosed, which may comprise a master oscillator power amplifier MOPA or power oscillator power amplifier configured XeF laser system producing a laser output light pulse beam at a high repetition rate and high power with a pulse to pulse dose control; an optical system producing an elongated thin pulsed working beam from the laser output light pulse beam. The apparatus may further comprise the laser system is configured as a POPA laser system and further comprising: relay optics operative to direct a first output laser light pulse beam from a first laser PO unit into a second laser PA unit; and, a timing and control module timing the creation of a gas discharge in the first and second laser units within plus or minus 3 ns, to produce the a second laser output light pulse beam as an amplification of the first laser output light pulse beam.
    Type: Grant
    Filed: July 1, 2004
    Date of Patent: June 13, 2006
    Assignee: TCZ GmbH
    Inventors: William N. Partlo, Palash P. Das, Russell Hudyma, Michael Thomas
  • Patent number: 7061961
    Abstract: An oscillator-amplifier gas discharge laser system and method is disclosed which may comprise a first laser unit which may comprise a first discharge region which may contain an excimer or molecular fluorine lasing gas medium; a first pair of electrodes defining the first discharge region containing the lasing gas medium, a line narrowing unit for narrowing a spectral bandwidth of output laser light pulse beam pulses produced in said first discharge region; a second laser unit which may comprise a second discharge chamber which may contain an excimer or molecular fluorine lasing gas medium; a second pair of electrodes defining the second discharge region containing the lasing gas medium; a pulse power system providing electrical pulses to the first pair of electrodes and to the second pair of electrodes producing gas discharges in the lasing gas medium between the respective first and second pair of electrodes, and laser parameter control mechanism modifying a selected parameter of a selected laser output lig
    Type: Grant
    Filed: August 9, 2005
    Date of Patent: June 13, 2006
    Assignee: Cymer, Inc.
    Inventors: David S. Knowles, Daniel J. W. Brown, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo, Richard L. Sandstrom, Palash P. Das, Stuart L. Anderson, Igor V. Fomenkov, Richard C. Ujazdowski, Eckehard D. Onkels, Richard M. Ness, Scot T. Smith, William G. Hulburd, Jeffrey Oicles
  • Patent number: 7039086
    Abstract: The present invention provides a control system for a modular high repetition rate two discharge chamber ultraviolet gas discharge laser. In preferred embodiments, the laser is a production line machine with a master oscillator producing a very narrow band seed beam which is amplified in the second discharge chamber. Novel control features specially adapted for a two-chamber gas discharge laser system include: (1) pulse energy controls, with nanosecond timing precision (2) precision pulse to pulse wavelength controls with high speed and extreme speed wavelength tuning (3) fast response gas temperature control and (4) F2 injection controls with novel learning algorithm.
    Type: Grant
    Filed: July 30, 2003
    Date of Patent: May 2, 2006
    Assignee: Cymer, Inc.
    Inventors: John P. Fallon, John A. Rule, Robert N. Jacques, Jacob Lipcon, Richard L. Sandstrom, William N. Partlo, Alexander I. Ershov, Toshihiko Ishihara, John Meisner, Richard M. Ness, Paul C. Melcher
  • Patent number: 7035012
    Abstract: An optical pulse extender includes a delay loop formed by a plurality of mirrors and a graded reflectivity beamsplitter. The mirrors and the beamsplitter are configured and aligned such that a pulse to be broadened makes a predetermined number of round trips in the delay loop and is incident on a different zone of the beamsplitter after each round trip. The different zones of the beamsplitter have different reflection values and different transmission values. These values are selected such that the pulse extender delivers a plurality of temporally and spatially separated replica pulses each thereof having about the same energy. The delivered replica pulses together provide an extended pulse having a longer duration than the input pulse. The replica pulses may be passed through a beam homogenizer to spatially homogenize the temporal characteristics of the extended pulse.
    Type: Grant
    Filed: March 1, 2004
    Date of Patent: April 25, 2006
    Assignee: Coherent, Inc.
    Inventors: Sergei V. Govorkov, Luis A. Spinelli, William Eugene White, Murray Keith Reed
  • Patent number: 7031364
    Abstract: In a gas laser device, a laser gas sealingly stored in a chamber is excited using a discharging electrode that is electrically discharged. Laser light produced by the electrical discharging is totally reflected by a total reflection mirror. An output window partially reflects the laser light and outputs a portion of the laser light reflected between the total reflection mirror and the output window. A blower circulates the laser gas within the chamber so that the laser gas passing an electrical discharging region of the discharging electrode is circulated in the chamber and is returned to the electrical discharging region of the discharging electrode. The blower is operated according to the state of electrical discharging from the discharging electrode.
    Type: Grant
    Filed: September 30, 1998
    Date of Patent: April 18, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Naoto Sano, Yoshiyuki Nagai
  • Patent number: 7023893
    Abstract: An axial direction excitation type F2 laser apparatus comprises a discharge tube consisting of an insulating cylinder and metal electrodes at both ends of thereof, and a reflecting mirror or a transmitting mirror, constituting a resonator, outside the electrodes. A high voltage for pulse discharge is applied to the electrodes from a drive circuit. Total gas pressure in the discharge tube is set in a range between 10 Torr. and 100 Torr., and concentration of F2 gas to total gas in the discharge tube is set to be in a range between 0.2% and 2.0%. This low-pressure axial direction excitation type F2 laser apparatus having small size and high efficiency can be provided at a low cost.
    Type: Grant
    Filed: July 8, 2002
    Date of Patent: April 4, 2006
    Assignee: Japan Science and Technology Agency
    Inventor: Takahisa Jitsuno
  • Patent number: 7006546
    Abstract: Provided is a gas laser electrode in which a stable laser output can be obtained by inhibiting the deterioration of the electrode (discharge characteristics). In an anode 3, a dielectric material 4 is applied on the surface of a discharging portion 3a in order to inhibit the deterioration of the electrode. Used as a dielectric material 4 may be, for example, fluorides such as calcium fluoride and strontium fluoride. Further, the dielectric material 4 is of a thickness (in a range of 0.005 mm˜1.5 mm, preferably 0.1 mm˜1 mm, for example) sufficient to prevent the erosion of halogen gas in the discharging portion 3a of the anode 3 and to secure a conductivity thereof, whereby it is enabled to form mono-fluoride evenly in extreme precision.
    Type: Grant
    Filed: March 1, 2001
    Date of Patent: February 28, 2006
    Assignee: Komatsu Ltd.
    Inventors: Tsukasa Hori, Junichi Fujimoto, Takayuki Yabu
  • Patent number: 7006548
    Abstract: Burst and spike characteristics in an excimer laser output in a burst operation are efficiently improved. Xenon gas is added from a compact Xe gas cylinder to gases for excimer laser in a chamber supplied from an Ar/Ne gas cylinder and an Ar/F2/Ne gas cylinder, a ratio of the xenon gas is detected by an Xe gas sensor, and the supply of the xenon gas from the Xe gas cylinder to the chamber is controlled by a gas controller.
    Type: Grant
    Filed: November 4, 1999
    Date of Patent: February 28, 2006
    Assignee: Komatsu Ltd.
    Inventors: Katsutomo Terashima, Akira Sumitani, Eiji Sunaka
  • Patent number: 7006547
    Abstract: A method and apparatus for producing a very high repetition rate gas discharge laser system in a MOPA configuration is disclosed which may comprise a master oscillator gas discharge layer system producing a beam of oscillator laser output light pulses at a very high pulse repetition rate; at least two power amplification gas discharge laser systems receiving laser output light pulses from the master oscillator gas discharge laser system and each of the at least two power amplification gas discharge laser systems amplifying some of the received laser output light pulses at a pulse repetition that is a fraction of the very high pulse repetition rate equal to one over the number of the at least two power amplification gas discharge laser systems to form an amplified output laser light pulse beam at the very high pulse repetition rate, which may be positioned in series with respect to the oscillator laser output light pulse beam.
    Type: Grant
    Filed: March 31, 2004
    Date of Patent: February 28, 2006
    Assignee: Cymer, Inc.
    Inventors: Thomas D. Steiger, Edward P. Holtaway, Bryan Moosman, Rajasekhar M. Rao
  • Patent number: 6993052
    Abstract: Method and system provide a variable delay between the external trigger pulse for a laser system and the light pulse such that the total delay is controlled. The method and system utilize a digital time measuring circuit which measure a time interval which corresponds to a time between the generation of the trigger pulse and generation or a laser light pulse. Based on the measurement by the digital time measuring circuit a processor controls a delay circuit which thereby controls the time between the trigger pulse and the generation of the laser light pulse.
    Type: Grant
    Filed: May 20, 2003
    Date of Patent: January 31, 2006
    Assignee: Lambda Physik AG
    Inventors: Rainer Desor, Thomas Wenzel
  • Patent number: 6987790
    Abstract: Precise timing control can be obtained for a gas discharge laser, such as an excimer or molecular fluorine laser, using a timed trigger ionization. Instead of using a standard approach to control the timing of the emission or amplification of an optical pulse using the discharge of the main electrodes, the timing of which can only be controlled to within about 10 ns, a trigger ionization pulse applied subsequent to the charging of the main electrodes can be used to control the timing of the discharge, thereby decreasing the timing variations to about 1 ns. Since ionization of the laser gas can consume relatively small amounts of energy, such a circuit can be based on a fast, high-voltage, solid state switch that is virtually free of jitter. Trigger ionization also can be used to synchronize the timing of dual chambers in a MOPA configuration. In one such approach, ionization trigger can include at least a portion of the optical pulse from the oscillator in a MOPA configuration.
    Type: Grant
    Filed: February 11, 2004
    Date of Patent: January 17, 2006
    Assignee: Lambda Physik AG
    Inventors: Sergei V. Govorkov, Rainer Paetzel, Igor Bragin, Rainer Desor, Andreas Targsdorf, Andriy Knysh
  • Patent number: 6985508
    Abstract: An injection seeded modular gas discharge laser system capable of producing high quality pulsed laser beams at pulse rates of about 4,000 Hz or greater and at pulse energies of about 5 mJ or greater. Two separate discharge chambers are provided, one of which is a part of a master oscillator producing a very narrow band seed beam which is amplified in the second discharge chamber. The chambers can be controlled separately permitting separate optimization of wavelength parameters in the master oscillator and optimization of pulse energy parameters in the amplifying chamber. A preferred embodiment in an ArF excimer laser system configured as a MOPA and specifically designed for use as a light source for integrated circuit lithography. In the preferred MOPA embodiment, each chamber comprises a single tangential fan providing sufficient gas flow to permit operation at pulse rates of 4000 Hz or greater by clearing debris from the discharge region in less time than the approximately 0.25 milliseconds between pulses.
    Type: Grant
    Filed: July 24, 2003
    Date of Patent: January 10, 2006
    Assignee: Cymer, Inc.
    Inventors: David S. Knowles, Daniel J. W. Brown, Herve A. Besaucele, David W. Meyers, Alexander I. Ershov, William N. Partlo, Richard L. Sandstrom, Palash P. Das, Stuart L. Anderson, Igor V. Fomenkov, Richard C. Ujazdowski, Eckehard D. Onkels, Richard M. Ness, Scott T. Smith, William G. Hulburd, Jeffrey Oicles
  • Patent number: 6970492
    Abstract: A beam parameter monitoring unit for coupling with an excimer or molecular fluorine (F2) laser resonator that produces an output beam having a wavelength below 200 nm includes an on-line laser pulse energy detector. This, in turn, allows output pulse energy stabilization to the same degree of accuracy, which is crucial for stability of exposure dose and other process parameters in microlithography and industrial applications.
    Type: Grant
    Filed: May 14, 2003
    Date of Patent: November 29, 2005
    Assignee: Lambda Physik AG
    Inventors: Sergei V. Govorkov, Gongxue Hua
  • Patent number: 6965624
    Abstract: A method and apparatus is provided for stabilizing output beam parameters of a gas discharge laser by maintaining a molecular fluorine component of the laser gas mixture at a predetermined partial pressure using a gas supply unit and a processor. The molecular fluorine is provided at an initial partial pressure and is subject to depletion within the laser discharge chamber. Injections of gas including molecular fluorine are performed each to increase the partial pressure of molecular fluorine by a selected amount in the laser chamber preferably less than 0.2 mbar per injection, or 7% of an amount of F2 already within the laser chamber. A number of successive injections may be performed at selected intervals to maintain the constituent gas substantially at the initial partial pressure for maintaining stable output beam parameters.
    Type: Grant
    Filed: January 6, 2003
    Date of Patent: November 15, 2005
    Assignee: Lambda Physik AG
    Inventors: Hans-Stephan Albrecht, Klaus Wolfgang Vogler, Juergen Kleinschmidt, Thomas Schroeder, Igor Bragin, Vadim Berger, Uwe Stamm, Wolfgang Zschocke, Sergei Govorkov
  • Patent number: 6963596
    Abstract: A pre-ionizing arrangement for a gas laser includes two ceramic-jacketed ionizer electrodes extending into an enclosure including spaced-apart slab electrodes of the laser and a lasing gas at reduced pressure. RF power is applied to the dielectric-jacketed ionizer electrodes creating a gas discharge between the dielectric-jacketed ionizer electrodes. This discharge provides ions in the laser gas. The presence of these ions in the lasing gas facilitates ignition of a gas discharge between the slab electrodes for energizing the laser.
    Type: Grant
    Filed: January 28, 2004
    Date of Patent: November 8, 2005
    Assignee: Coherent, Inc.
    Inventors: Christian J. Shackleton, Phillip Gardner, William Clayton Brand, Raul Wong Gutierrez
  • Patent number: 6963595
    Abstract: An automatic F2 laser gas control, for a modular high repetition rate ultraviolet gas discharge laser. The laser gas control includes techniques, monitors, and processor for monitoring the F2 consumption rates through the operating life of the laser system. These consumption rates are used by a processor programmed with an algorithm to determine F2 injections needed to maintain laser beam quality within a delivery range. Preferred embodiments include F2 controls for a two-chamber MOPA laser system.
    Type: Grant
    Filed: January 31, 2003
    Date of Patent: November 8, 2005
    Assignee: Cymer, Inc.
    Inventors: John A. Rule, Richard C. Morton, Vladimir V. Fleurov, Fedor Trintchouk, Toshihiko Ishihara, Alexander I. Ershov, James A. Carmichael
  • Patent number: 6956885
    Abstract: An extreme ultraviolet radiation generator is disclosed in which Xenon gas is continuously ejected from a high pressure nozzle into a low pressure chamber to generate Xenon atom clusters which are irradiated with a high repetition rate pulsed laser to form a plasma and yield quasi-continuous EUV generation. The nozzle has a beveled outer rim to enable the focus point of the laser light to be brought close to the nozzle. The nozzle is cooled to a temperature at which background Xenon gas condenses onto the nozzle forming a protective layer. A gas compressor serves to recirculate the Xenon gas and batch purification triggered by a mass spectrometer monitoring gas purity may be periodically applied.
    Type: Grant
    Filed: August 30, 2001
    Date of Patent: October 18, 2005
    Assignee: Powerlase Limited
    Inventors: Alan G. Taylor, David R. Klug, Ian P. Mercer, Daniel A. Allwood
  • Patent number: 6944195
    Abstract: An object of the present invention is obtaining a semiconductor film with uniform characteristics by improving irradiation variations of the semiconductor film. The irradiation variations are generated due to scanning while irradiating with a linear laser beam of the pulse emission. At a laser crystallization step of irradiating a semiconductor film with a laser light, a continuous light emission excimer laser emission device is used as a laser light source. For example, in a method of fabricating an active matrix type liquid crystal display device, a continuous light emission excimer laser beam is irradiated to a semiconductor film, which is processed to be a linear shape, while scanning in a vertical direction to the linear direction. Therefore, more uniform crystallization can be performed because irradiation marks can be avoided by a conventional pulse laser.
    Type: Grant
    Filed: December 10, 2002
    Date of Patent: September 13, 2005
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Koichiro Tanaka
  • Patent number: 6941259
    Abstract: A first software program for simulating an operating laser system controls a processor that generates one or more dummy parameters each corresponding to a parameter of an operating laser system. The dummy parameter is read over a same or similar signal interface as the operating laser system by a processor running a test software subroutine having the laser system parameter as an input. An algorithm including the test software subroutine then generates an output command based on the value of the dummy parameter. A second software program for efficiently scheduling laser service routines based on a predetermined lithography system schedule controls a processor that reads the lithography system schedule including scheduled system downtimes, wherein the scheduled downtimes include start times and durations. The processor then reads a time window and duration for each of one or more scheduled laser service routines.
    Type: Grant
    Filed: February 22, 2001
    Date of Patent: September 6, 2005
    Assignee: Lamda Physik AG
    Inventor: Gunter Nowinski
  • Patent number: 6937635
    Abstract: The present invention provides a gas discharge laser having at least one long-life elongated electrode for producing at least 12 billion high voltage electric discharges in a fluorine containing laser gas. In a preferred embodiment at least one of the electrodes is comprised of a first material having a relatively low anode erosion rate and a second anode material having a relatively higher anode erosion rate. The first anode material is positioned at a desired anode discharge region of the electrode. The second anode material is located adjacent to the first anode material along at least two long sides of the first material. During operation of the laser erosion occurs on both materials but the higher erosion rate of the second material assures that any tendency of the discharge to spread onto the second material will quickly erode away the second material enough to stop the spread of the discharge.
    Type: Grant
    Filed: August 7, 2003
    Date of Patent: August 30, 2005
    Assignee: Cymer, Inc.
    Inventors: Richard G. Morton, Timothy S. Dyer, Thomas D. Steiger, Richard C. Ujazdowski, Tom A. Watson, Bryan Moosman, Alex P. Ivaschenko, Walter Gillespie, Curtis Rettig
  • Patent number: 6922428
    Abstract: The present invention relates to a long pulse gas laser apparatus for lithography further improved in the laser oscillation efficiency and stability increased by addition of xenon gas. A gas laser apparatus for lithography has a pair of discharge electrodes 2 provided in a laser chamber 1 and emits laser beam having a laser pulse width (Tis) of not less than 40 ns by exciting a laser gas sealed in the laser chamber 1 by electric discharge between the pair of discharge electrodes 2, the laser gas containing xenon in an amount not less than 2 ppm and not more than 100 ppm in partial pressure ratio. The laser gas has been heated at least when the laser beam is emitted.
    Type: Grant
    Filed: March 20, 2003
    Date of Patent: July 26, 2005
    Assignee: Gigaphoton Inc.
    Inventors: Satoshi Tanaka, Kouji Kakizaki, Youichi Sasaki
  • Patent number: 6914919
    Abstract: The present invention provides gas discharge laser systems capable of reliable long-term operation in a production line capacity at repetition rates in the range of 6,000 to 10,0000 pulses power second. Preferred embodiments are configured as KrF, ArF and F2 lasers used for light sources for integrated circuit lithography. Improvements include a modified high voltage power supply capable for charging an initial capacitor of a magnetic compression pulse power system to precise target voltages 6,000 to 10,0000 times per second and a feedback control for monitoring pulse energy and determining the target voltages on a pulse-by-pulse basis. Several techniques are disclosed for removing discharge created debris from the discharge region between the laser electrodes during the intervals between discharges. In one embodiment the width of the discharge region is reduced from about 3 mm to about 1 mm so that a gas circulation system designed for 4,000 Hz operation could be utilized for 10,000 Hz operation.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: July 5, 2005
    Assignee: Cymer, Inc.
    Inventors: Tom A. Watson, Richard C. Ujazdowski, Alex P. Ivaschenko, Richard L. Sandstrom, Robert A. Shannon, R. Kyle Webb, Frederick A. Palenschat, Thomas Hofmann, Curtis L. Rettig, Richard M. Ness, Paul C. Melcher, Alexander I. Ershov
  • Patent number: 6914927
    Abstract: Methods and apparatus are provided for cleaning and passivating laser discharge chambers with plasmas. In one embodiment, an oxygen based plasma is formed in a plasma source external to the laser discharge chamber by applying a radiofrequency signal to oxygen containing gases. The oxygen based plasma is drawn into the laser discharge chamber, where it reacts with contaminants and cleans internal surfaces. After cleaning, a fluorine based plasma is formed in the plasma source and drawn into the laser discharge chamber to passivate internal surfaces. In another embodiment, cleaning with the oxygen based plasma is not used since some level of cleaning is accomplished with the fluorine based plasma. In another embodiment, oxygen based plasmas and fluorine based plasmas are formed in the laser discharge chamber by applying a radiofrequency signal to a laser discharge chamber electrode.
    Type: Grant
    Filed: August 26, 2003
    Date of Patent: July 5, 2005
    Assignee: Cymer, Inc.
    Inventors: Tom A. Watson, Richard L. Sandstrom, Richard G. Morton, Robert E. Weeks, John P. Quitter, Mark R. Lewis
  • Patent number: 6914920
    Abstract: The invention is directed to a method for the energy stabilization of a gas discharge-pumped radiation source that is operated in defined pulse sequences, particularly for suppression of overshooting and undershooting of excimer lasers and EUV radiation sources in burst operation. It is the object of the invention to find a novel possibility for the stabilization of the energy emission of a gas discharge-pumped radiation source that is operated in defined pulse sequences (bursts) which makes it possible to take into account a temporary behavior of the radiation source at the beginning of every burst without repeated recalibration of the energy-voltage curve.
    Type: Grant
    Filed: February 7, 2003
    Date of Patent: July 5, 2005
    Assignee: Xtreme technologies GmbH
    Inventor: Juergen Kleinschmidt
  • Patent number: 6907058
    Abstract: A beam parameter monitoring unit for coupling with a molecular fluorine (F2) or ArF laser resonator that produces an output beam having a wavelength below 200 nm includes a detector and a beam path enclosure. The unit may also include a beam splitter within the enclosure for separating the output beam into first and second components, or first and second beam are attained by other means. The detector measures at least one optical parameter of the second component of the output beam. The beam path enclosure includes one or more ports for purging the beam path enclosure with an inert gas to maintain the enclosure substantially free of sub-200 nm photoabsorbing species.
    Type: Grant
    Filed: January 25, 2001
    Date of Patent: June 14, 2005
    Assignee: Lambda Physik AG
    Inventors: Klaus Vogler, Frank Voss, Elko Bergmann
  • Patent number: 6904073
    Abstract: The present invention provides long life optics for a modular, high repetition rate, ultraviolet gas discharge laser systems producing a high repetition rate high power output beam. The invention includes solutions to a surface damage problem discovered by Applicants on CaF2 optics located in high pulse intensity sections of the output beam of prototype laser systems. Embodiments include an enclosed and purged beam path with beam pointing control for beam delivery of billions of output laser pulses. Optical components and modules described herein are capable of controlling ultraviolet laser output pulses with wavelength less than 200 nm with average output pulse intensities greater than 1.75×106 Watts/cm2 and with peak intensity or greater 3.5×106 Watts/cm2 for many billions of pulses as compared to prior art components and modules which failed after only a few minutes in these pulse intensities.
    Type: Grant
    Filed: March 8, 2003
    Date of Patent: June 7, 2005
    Assignee: Cymer, Inc.
    Inventors: Thomas A. Yager, William N. Partio, Richard L. Sandstrom, Xiaojiang Pan, John T. Melchior, John Martin Algots, Matthew Ball, Alexander I. Ershov, Vladimir Fleurov, Walter D. Gillespie, Holger K. Glatzel, Leonard Lublin, Elizabeth Marsh, Richard G. Morton, Richard C. Ujazdowski, David J. Warkentin, R. Kyle Webb
  • Patent number: 6898220
    Abstract: In a gas laser machining apparatus based on a pulse laser oscillation, a mis-pulse-preventing pulse, viz., a preparatory pulse component whose energy is below the threshold value of a laser oscillation, is located prior to a first pulse of discharging power pulses.
    Type: Grant
    Filed: June 25, 2004
    Date of Patent: May 24, 2005
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Hitoshi Kidokoro, Masato Matsubara
  • Patent number: 6882704
    Abstract: The invention is directed to a radiation source for generating extreme ultraviolet (EUV) radiation, particularly for photolithography exposure processes. The object of the invention is to find a novel possibility for realizing radiation sources for generating extreme ultraviolet (EUV) radiation which permits a uniform basic construction for ensuring beam characteristics that are reproducible over the long term and in which the source is conceived so as to be flexible with respect to specific applications.
    Type: Grant
    Filed: October 30, 2003
    Date of Patent: April 19, 2005
    Assignee: Xtreme technologies GmbH
    Inventors: Guido Schriever, Kai Gaebel, Uwe Stamm
  • Patent number: 6882674
    Abstract: The present invention provides an excimer laser capable of producing a high quality pulsed laser beam at pulse rates of about 4,000 Hz at pulse energies of about 5 mJ or greater. A preferred embodiment is an ArF excimer laser specifically designed as a light source for integrated circuit lithography. An improved wavemeter with special software monitors output beam parameters and controls a very fast PZT driven tuning mirror and the pulse power charging voltage to maintain wavelength and pulse energy within desired limits. In a preferred embodiment two fan motors drive a single tangential fan which provides sufficient gas flow to clear discharge debris from the discharge region during the approximately 0.25 milliseconds between pulses.
    Type: Grant
    Filed: December 21, 2001
    Date of Patent: April 19, 2005
    Assignee: Cymer, Inc.
    Inventors: Christian J. Wittak, William N. Partlo, Richard L. Sandstrom, Paul C. Melcher, David M. Johns, Robert B. Saethre, Richard M. Ness, Curtis L. Rettig, Robert A. Shannon, Richard C. Ujazdowski, Shahryar Rokni, Scott T. Smith, Stuart L. Anderson, John M. Algots, Ronald L. Spangler, Igor V. Fomenkov, Thomas D. Steiger, Jerome A. Emilo, Clay C. Titus, Alex P. Ivaschenko, Paolo Zambon, Gamaralalage G. Padmabandu, Mark S. Branham, Sunjay Phatak, Raymond F. Cybulski
  • Patent number: 6879617
    Abstract: The present invention relates to a two stage laser system in which a desired spectral line width can be obtained at high output even when the integrated spectral characteristic of oscillator laser does not have the desired spectral line width, comprising an oscillator laser device 10 which has discharge electrodes 2 within a laser chamber 1 filled with laser gas containing F2 and emits laser beam which is band-narrowed by means of a band narrowing module 3 arranged in a laser resonator, and an amplifier laser device 20 which has discharge electrodes 2 within a laser chamber 1 filled with laser gas containing F2 and amplifies laser pulse injected from said oscillator laser device 10. In the system, a synchronous time interval having a predetermined spectral line width exists in laser pulse from the oscillator laser 10, and the system is set such that a discharge occurs in the amplifier laser 20 within the synchronous time interval.
    Type: Grant
    Filed: May 14, 2003
    Date of Patent: April 12, 2005
    Assignees: Komatsu Ltd., Ushio Denki Kabushiki Kaisya, Gigaphoton Inc.
    Inventors: Tatsuya Ariga, Kyohei Seki, Osamu Wakabayashi
  • Patent number: 6868106
    Abstract: An excimer or molecular fluorine laser system includes a discharge chamber filled with a laser gas mixture at least including a halogen-containing molecular species and a buffer gas, multiple electrodes within the discharge chamber connected to a discharge circuit for energizing the gas mixture, and a resonator for generating a laser beam including an optical component made of MgF2. The optical component made of MgF2 has been previously cleaved along a predetermined plane, such that the refractive indices of the birefringent MgF2 material for orthogonal polarization components of the beam are either at least approximately equal so that the polarization of the beam due to the influence of the birefringent nature of the MgF2 material is not substantially reduced, or are approximately maximum so that at least a portion of one of the components is rejected by the resonator so that the polarization of the beam is increased due to the birefringent nature of the MgF2.
    Type: Grant
    Filed: October 31, 2001
    Date of Patent: March 15, 2005
    Assignee: Lambda Physik AG
    Inventor: Klaus Vogler
  • Patent number: 6865212
    Abstract: The invention is directed to a method for energy regulation of pulsed-operation gas discharge-coupled radiation sources, particularly of excimer lasers, F2 lasers and EUV radiation sources. The object of the invention is to find a novel possibility for energy regulation of pulsed-operation gas discharge-coupled radiation sources which permits a control of the charging voltage while taking into account the aging of gas discharge components (particularly of the work gas) without recalibration of the system.
    Type: Grant
    Filed: February 7, 2003
    Date of Patent: March 8, 2005
    Assignee: Xtreme technologies GmbH
    Inventor: Juergen Kleinschmidt
  • Patent number: 6865210
    Abstract: Feedback timing control equipment and process for an injection seeded modular gas discharge laser. A preferred embodiment is a system capable of producing high quality pulsed laser beams at pulse rates of about 4,000 Hz or greater and at pulse energies of about 5 to 10 mJ or greater for integrated outputs of about 20 to 40 Watts or greater. The feedback timing control is programmed to permit in some circumstances discharges timed so that no significant laser energy is output from the system. Use of this technique permits burst mode operation in which the first discharge of a burst is a no-output discharge so that timing parameters for each of the two chambers can be monitored before the first laser output pulse of the burst. Two separate discharge chambers are provided, one of which is a part of a master oscillator producing a very narrow band seed beam which is amplified in the second discharge chamber.
    Type: Grant
    Filed: December 21, 2001
    Date of Patent: March 8, 2005
    Assignee: Cymer, Inc.
    Inventors: Alexander I. Ershov, Richard M. Ness
  • Patent number: 6862307
    Abstract: Method and system for providing an excimer or molecular fluorine laser including a laser tube filled with a laser gas surrounded by an optical resonator, where the laser tube has multiple electrodes including a pair of main discharge electrodes connected to a discharge circuit for exciting the laser gas to produce a laser output beam. The discharge circuit has an all solid state switch and preferably does not include a transformer. The solid state switch includes multiple solid state devices that may be capable of switching voltages in excess of 12 kV, such as 14-32 kV or more, or the voltage needed to switch the laser. The series of switches has a rise time of approximately less than 300 ns, and preferably around 100 ns or less. The switch may be capable of switching voltages of slightly more than half, but less than the entire voltage needed to produce laser pulses of desired energies, and a voltage doubling circuit may be used to produce the voltage required to produce the desired output pulse energies.
    Type: Grant
    Filed: May 14, 2001
    Date of Patent: March 1, 2005
    Assignee: Lambda Physik AG
    Inventors: Rustem Osmanow, Uwe Stamm, Andreas Targsdorg
  • Patent number: 6856639
    Abstract: A gas laser comprises a pair of elongated electrodes arranged to define a discharge region between two opposing surfaces of said elongated electrodes, wherein the discharge region defines a longitudinal axis, a wide axis and a narrow axis. The gas laser further includes a lasing gas disposed in said discharge region and an excitation means for energizing the electrodes to excite the lasing gas. A first mirror is arranged in front of a first end of the pair of elongated electrodes, wherein the first mirror is spaced apart from the first end along the longitudinal axis by a first distance, and a second mirror is arranged in front of a second end of the pair of elongated electrodes. Moreover, the two opposing electrode surfaces define an electrode curvature, respectively, that is adapted such that a wave front of the a fundamental transverse radiation mode with respect to the narrow axis substantially coincides with a mirror curvature of the first mirror at the first distance.
    Type: Grant
    Filed: November 29, 2002
    Date of Patent: February 15, 2005
    Assignees: Gosudarstvennoye Predpriyatie Nauchnoissledovatelsky Institut Lazernoy Fiziki, Amada Company, Limited
    Inventors: Alexander Ivanovich Dutov, Victor Semenov, Alexey A. Kuleshov, Nikolay A. Novoselov, Alexander A. Sokolov
  • Patent number: 6856638
    Abstract: A line-narrowed excimer or molecular fluorine laser system includes a discharge chamber filled with a gas mixture at least including molecular fluorine and a buffer gas, multiple electrodes within the discharge chamber connected to a discharge circuit for energizing the gas mixture, a resonator including a pair of resonator reflecting surfaces disposed on either side of the discharge chamber for generating a laser beam, and a line-narrowing/selection unit within the resonator for narrowing the bandwidth of the laser beam. The resonator further includes a third reflecting surface which is deformable and disposed between the pair of resonator reflecting surfaces. The line-narrowing/selection unit preferably includes a beam expander and a dispersive element, wherein the deformable third reflecting surface is disposed between the beam expander and the dispersive element.
    Type: Grant
    Filed: October 19, 2001
    Date of Patent: February 15, 2005
    Assignee: Lambda Physik AG
    Inventors: Konstantin Aab, Juergen Kleinschmidt, Peter Lokai, Matthias Ulrich
  • Patent number: 6847671
    Abstract: A tangential blower for use in a gas discharge laser is provided provides improved homogeneity of laser gas flow through the discharge region of the laser. A flange which supports adjacent blower sections has an aerodynamic shape and occupies a minimal portion of the space in the inlet region of the blowers. The ends of the blower's shafts may be formed as a twice-profiled polygon which is has a non-uniform and preferably rounded geometry along its longitudinal axis where it fits into end flanges. The blades of the blower may be formed with varying thickness and radii of curvature. The blower's blades and hubs may be cast as a single piece of steel, titanium alloy, or other suitable material.
    Type: Grant
    Filed: March 29, 2001
    Date of Patent: January 25, 2005
    Assignee: Lambda Physik AG
    Inventor: Juergen Baumler
  • Patent number: 6847672
    Abstract: A gas supply path structure forms a fluid path for allowing a laser gas to flow into or out of a pair of fluid inlet and outlet 11a and a laser gas is controlled to a predetermined subsonic speed at a throat portion. Gas supplies for controlling the speed of the gas are connected each to the fluid inlet and to the fluid outlet of the gas supply path structure and, together with a cooling device, compose a circulation system for controlling the speed and pressure of the laser gas at the fluid inlet and/or at the fluid outlet.
    Type: Grant
    Filed: November 6, 2001
    Date of Patent: January 25, 2005
    Assignees: Canon Kabushiki Kaisha
    Inventors: Tadahiro Ohmi, Hiroshi Osawa, Nobuyoshi Tanaka, Kazuhide Ino, Toshikuni Shinohara, Yasuyuki Shirai, Masaki Hirayama
  • Patent number: 6847670
    Abstract: The oscillation pulse width is extended in a gas laser apparatus emitting ultraviolet radiation by a high-repetition rate oscillating operation. The gas laser apparatus has a pair of laser discharge electrodes connected to the output terminals of a magnetic pulse compression circuit and disposed in a laser chamber. The pulse width is extended by determining circuit constants so that the period of the oscillating current flowing between the discharge electrodes is shortened and, at the same time, the peak value of the current is increased, whereby the laser gas is continuously excited even during at least one half-cycle subsequent to the first half-cycle of the oscillating current to sustain the laser oscillating operation.
    Type: Grant
    Filed: September 14, 2000
    Date of Patent: January 25, 2005
    Assignee: Ushio Denki Kabushiki Kaisya
    Inventors: Koji Kakizaki, Takashi Saito, Hidenori Watanabe
  • Patent number: 6839372
    Abstract: The present invention provides a gas discharge ultraviolet laser capable of producing a high quality pulsed ultraviolet laser beam at pulse rates greater than 2000 Hz at pulse energies at 5 mJ or greater and having an enclosed beam path at least a portion of which comprises an oxidation agent. In a preferred embodiment a portion of the beam path comprises a sealed chamber containing a gas comprising a small concentration of oxygen. In one preferred embodiment the sealed chamber is an etalon chamber and the contained gas is nitrogen with an oxygen concentration of between 1.6 and 2.4 percent. In another preferred embodiments a small concentration of oxygen is added to the purge gas of a special purge compartment containing optical components exposed to high intensity output laser beam.
    Type: Grant
    Filed: May 7, 2002
    Date of Patent: January 4, 2005
    Assignee: Cymer, Inc.
    Inventors: Xiaojiang Pan, Holger K. Glatzel, John T. Melchior, Raymond Cybulski
  • Patent number: 6839374
    Abstract: The invention relates to an excimer laser which includes a source of a laser beam and one or more windows which include barium fluoride. Another aspect of the invention relates to an excimer laser which includes a source of a laser beam, one or more windows which include barium fluoride and a source for annealing the one or more windows. Another aspect of the invention relates to a method of producing a predetermined narrow width laser beam.
    Type: Grant
    Filed: March 1, 2002
    Date of Patent: January 4, 2005
    Assignee: Corning Incorporated
    Inventor: Robert W. Sparrow