Abstract: In order to realize accurate measurement with an X-ray fluorescence thickness tester characterized by being non-destructive and non-contacting, a system comprises an X-ray generating source, a collimator for focusing primary X-rays, and a sample observation optical system for positioning and observation of microscopic sections. As thickness testing means, as detectors for detecting X-ray fluorescence generated from the sample there is one sensor having low counting efficiency but excellent energy resolution used for low energy counting, and another sensor having poor energy resolution but excellent counting efficiency used for counting high energy, these two sensors being arranged next to each other, and in stages subsequent to the detector preamps there are separate linear amps and frequency analyzers with respective signals being subjected to processing as spectrums for qualitative and quantitative analysis in a common control and computing section.

Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.

Abstract: The invention relates to a method for classifying and identifying by means of energy dispersion X-ray fluorescence analysis chemical substances whose X-ray fluorescence lines cannot be detected and which therefore cannot be classified by energy dispersion X-ray fluorescence analysis alone. Said method is characterized in that the sample to be analyzed is analyzed in its original packaging or natural state without prior processing in a sample vessel. According to the method the sample is: a) positioned in front of the measuring aperture in a sample chamber of an X-ray fluorescence apparatus; b) measured; and c) classified and identified by application of multivariate, statistical techniques to the measurement signals obtained, i.e., to the Compton and Rayleigh scattering.

Abstract: An x-ray fluorescence analyzer and method. The analyzer and method use a single radio-active source, such as, 241Am to determine the composition of a metal alloy or precious metal. The method compensates for Rayleigh scattering by first determining a scaling factor using a particular energy line in the spectrum of the test material and comparing that line to the same energy line for a pure metal. Based on the scaling factor the energy spectrum for the pure is compensated and then subtracted from the energy spectrum of the test material at discrete points.

Abstract: To achieve elemental analysis and structural analysis with an X-ray apparatus employing X-rays characterized by being non-destructive and non-contacting.

Abstract: The present invention is a method and apparatus for calculating the amount and composition of inorganic material in a sheet material. The apparatus of the present invention is capable of calculating the composition of all the additives at once without requiring multiple cycles. The apparatus uses a combination of two techniques, namely an X-ray fluorescence analysis and a preferential X-ray absorption analysis. X-ray fluorescence is measured by a thermoelectrically cooled solid state detector. The apparatus can measure more than three additives. Measurement of argon in the air is used for compensation of electronic drift. An empirical correction is used to compensate for mutual interaction between X-ray fluorescence radiation and clay or talc. The measurement is compensated for dust accumulation by fluorescing the dust.

Abstract: Apparatus for X-ray microanalysis of a sample includes an X-ray source, which irradiates a spot having a dimension less than 500 &mgr;m on a surface of the sample. A first X-ray detector captures fluorescent X-rays emitted from the sample, responsive to the irradiation, at a high angle relative to the surface of the sample. A second X-ray detector captures X-rays from the spot at a grazing angle relative to the surface of the sample. Processing circuitry receives respective signals from the first and second X-ray detectors responsive to the X-rays captured thereby, and analyzes the signals in combination to determine a property of a surface layer of the sample within the area of the spot.

Abstract: In order to realize accurate measurement with an X-ray fluorescence thickness tester characterized by being non-destructive and non-contacting, a system comprises an X-ray generating source, a collimator for focusing primary X-rays, and a sample observation optical system for positioning and observation of microscopic sections. As thickness testing means, as detectors for detecting X-ray fluorescence generated from the sample there is one sensor having low counting efficiency but excellent energy resolution used for low energy counting, and another sensor having poor energy resolution but excellent counting efficiency used for counting high energy, these two sensors being arranged next to each other, and in stages subsequent to the detector preamps there are separate linear amps and frequency analyzers with respective signals being subjected to processing as spectrums for qualitative and quantitative analysis in a common control and computing section.

Abstract: A fluorescent X-ray analyzing apparatus capable of being used as either a wavelength dispersive type or an energy dispersive type is provided, with which the analysis can be performed quickly and accurately. The fluorescent X-ray analyzing apparatus includes a detecting unit for detecting and analyzing fluorescent X-ray (5) emitted from at least one target area (1a) of a sample (1) to be analyzed as a result of excitation of such target area (1a) with a primary X-ray (3). The detecting unit includes a wavelength dispersive type detecting unit (6) including a spectroscope (8) and a first detector (9), and an energy dispersive type detecting unit (11) including a second detector (12) of an energy dispersive type.

Abstract: The invention relates to a method for defining element contents contained by solid, liquid or slurry-like materials by means of an X-ray fluorescence method in an online analysis. According to the invention a combination of both the energy dispersive (3) and wave dispersive (2) X-ray fluorescence methods are applied in the method, so that by means of the energy dispersive method (3), there are measured such diffraction lines that are located essentially far from each other, whereas by means of the wave dispersive method (2), there are measured such diffraction lines that are located essentially near to each other as well as such diffraction lines where a high resolution and resulting accuracy and sensitivity are required.

Abstract: A fluorescent X-ray analyzer has at least three optical detection paths along which the secondary fluorescent X-ray to be analyzed travels selectively and includes a monochromator (6) carried by a first spindle (14) having a longitudinal axis (O) passing in touch with a light receiving surface of the monochromator (6). A first detector (8A) for measuring the intensity of at least a portion of the secondary X-ray (7) monochromatized by the monochromator (6) while allowing the remaining portion of the secondary X-ray (7) to pass therethrough, and a light receiving slit member (11) for passing the secondary X-ray (7) monochromatized by the monochromator (6) therethrough are carried by a second spindle (17) in side-by-side relation in a circumferential direction. A third spindle (20) is utilized separate from the second spindle (17) for carrying a second detector (8B) for measuring the intensity of the secondary X-ray (7) having passed through the first detector (8A) or the light receiving slit member (11).

Abstract: Display is made of the spectrums of the fluorescent X-rays by using the ordinate axis as representing the square root of a fluorescent X-ray intensity and using the abscissa axis as representing the energy of the fluorescent X-rays.

Abstract: A method and apparatus determine a concentration of dopant in soot that constitutes at least a portion of a soot preform used to form an optical waveguide. The soot is irradiated with photons, X-ray fluorescent emissions from the irradiated soot are detected, and the concentration of dopant is determined based on the detected X-ray fluorescent emissions. Additionally, the concentration of dopant in layers of soot on the soot preform can be individually determined. Furthermore, the manufacture of the soot preform can be controlled by utilizing the detected X-ray fluorescent emissions to determine a deviation between a concentration of dopant in the soot and a predetermined concentration, and adjusting deposition conditions based on the deviation.

Abstract: A fluorescent x-ray spectrometer, which can be used selectably both as a wavelength-dispersion type and an energy-dispersion type, includes an irradiation chamber and a detection chamber provided with both a first detector and a second detector respectively for detecting wavelength-type and energy-type dispersion. A sample disposed in the irradiation chamber is exposed to excitation x-ray and generates fluorescent x-ray which is introduced into the detection chamber along an incident optical path defined by a Soller slit and is made incident on a dispersing element. For detecting wavelength-type dispersion, dispersed x-ray is received by the first detector. For detecting energy-type dispersion, the dispersing element is retracted from the incident optical path such that the incident x-ray from the irradiation chamber is directly received by the second detector, disposed on an extension of the incident optical path, without being dispersed by the dispersing element.

Abstract: In a method for image reconstruction in imaging technology for the implementation of a fast convolution with the transformation length M while allowing slight over-convolution errors, each of p or 2p out of n measured projections of the length N are convolved with a modified filter kernel h (k) using Fast Fourier Transform (FFT) and Inverse Fast Fourier Transform (IFFT) simultaneously in one step.

Abstract: In a goniometer having several axes around which a crystal specimen to be examined can be rotated, a radiation source, a detector for Bragg reflections and a detector for fluorescence radiation, with the detector making it possible to measure lattice geometry and chemical composition at the same time. The detector for the fluorescence radiation is secured in a holder, and is oriented with its surface parallel to the specimen and is pivotably secured together with the specimen to the specimen table. As such, reflexes can be simultaneously observed using the Bragg detector which is secured in a pivotable arm, and the fluorescence radiation using the fluorescence detector.

Abstract: A sample is mounted on a sample base. A detector is provided on the sample base, and detects a fluorescent X-ray generated from the sample, and a scattered X-ray of an incident X-ray when the sample is irradiated with the incident X-ray. A controller controls the sample base and an operation of the detector. The controller sequentially changes an incident angle of the incident X-ray to the sample so as to detect the fluorescent X-ray generated from the sample at each incident angle, and the scattered X-ray of the incident X-ray. Next, the controller obtains the relationship between the incident angle of the incident X-ray to the sample and a standard value obtained by standardizing intensity of the fluorescent X-ray by intensity of the scattered X-ray. Then, the controller corrects the incident angle of the incident X-ray to the sample based on the obtained relationship.

Abstract: A method for identifying foreign matter in or on a sample, using apparatus composed of an X-ray generator, an X-ray detector, and a sample stage having a tilting mechanism capable of fixing a sample and changing both its irradiation and detection angles at the same time, an inclination fixing jig, and a calculation processing unit for executing bulk composition calculation at each angle according to the obtained X-ray intensity which is detected at the each angle. A judgment is made such that there is foreign matter mixed in the sample material when the bulk composition indications are coincident even when the angle is changed, while there is foreign matter at the surface of the sample when the bulk composition indications are not coincident.

Abstract: A device for performing both elemental and structural analysis of a crystalline sample, comprising a polychromatic x-ray source (11); a mounting means (15) for mounting the sample so that it is illuminated with x-rays; one or more fluorescence channels (17), able to select x-rays of a particular wavelength and energy and having means (20) for detecting said selected x-ray; a diffraction channel (28) able to select a characteristic x-ray wavelength at said source (11) following diffraction of the x-rays by said sample (14) and having means (33) for detecting a selected characteristic x-ray; and an actuating means (32) for controlling arcuate movement of said diffraction channel (28) relative to said sample (14) so as to detect x-rays leaving the sample at different diffraction angles.

Abstract: An inspection system using penetrating radiation wherein pixels corresponding to transmitted radiation which has been attenuated to at least a predetermined level are displayed in a first color. Pixels which correspond to radiation which has been backscattered to a least predetermined level are displayed in a second color, and pixels which correspond to the remainder of the transmitted radiation are displayed in a third color. Additionally, the brightness of the color of each pixel is controlled in dependence on how far above or below the predetermined level the detected transmitted or scattered signal is.

Abstract: A total reflection X-ray fluorescence apparatus comprises a base material having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector such as an SSD for detecting fluorescent X-rays emerging from a specimen located near the optically flat surface of the base material and a second detector such as a scintillation counter for detecting an intensity of an X-rays coming from the base material.

Abstract: A method and apparatus for measuring, for example, the iron content in zinc layers and/or the thickness of a layer of zinc in galvanized steel. In order to measure the percentage of iron content in a zinc layer, the apparatus has a source of X-radiation which is arranged at a specified angle to the plane of the material to be measured and at least two detectors equipped with selective sensitivity, one of which is arranged at a second angle and the other at a third angle. One detector measures the iron content and the other detector measures essentially the amount of zinc per unit surface of the coating. From these two measurements, the amount of iron as a percentage of the zinc layer can be calculated.

Abstract: A method and apparatus for background correction of the measured data in analysis of a specimen surface by scanning the surface with an electron beam, wherein a signal occurring from an element to be analyzed contained in the specimen is detected to obtain a two-dimensional distribution data of the level of the signal in a predetermined area of the specimen surface; a specimen current induced in the specimen by the scanning is detected to obtain a two-dimensional distribution data of the specimen current in the predetermined specimen surface area; a relation between the background intensity and specimen current of the specimen is calculated from the background intensity and specimen current measured on at least two points in the specimen surface area; a two-dimensional distribution data of the background intensity is calculated from the two-dimensional distribution data of the specimen current by using the calculated relation; and the calculated two-dimensional distribution data of the background intensity is

Abstract: A total reflection X-ray fluorescence apparatus comprises a base material having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector such as an SSD for detecting fluorescent X-rays emerging from a specimen located near the optically flat surface of the base material and a second detector such as a scintillation counter for detecting an intensity of an X-rays coming from the base material.

Abstract: Analyzing sludgy materials by exposing the flowing material in continuous action to x-ray radiation and by measuring the radiation thus created in the said material, according to the invention, the radiation emitted from the material is measured with respect to the intensities of both x-ray fluorescence radiation and x-ray diffraction radiation, and these intensities are combined in order to form a parameter which describes the proportions of the partial components in a given compound combination. Moreover, the detectors employed in the measurement of the radiation intensities are placed at the same cross-sectional plane of the analyzer.

Abstract: A fluorescent X-ray film thickness gauge having an X-ray source for generating incident X-rays, a shutter device for shuttering the incident X-rays, a collimator for collimating the incident X-rays, a sample stage for mounting a sample onto which the collimated X-ray is irradiated, and a detector for detecting fluorescent X-rays generated from the sample upon irradiation of the collimated X-rays. The shutter device includes a switching mechanism operable to switch the shutter device between a measurement state and a calibration state, a shutter frame, and a shutter member disposed in the shutter frame and having a measurement passage, a calibration passage and a calibration plate in the calibration passage.

Abstract: A method for determining the element concentration in electron beam melting is used for the continous measurement during the melting process especially for melting alloys. According to the invention, the X-radiation generated during melting is utilized by concurrently measuring the intensity of the characteristic radiation of the element to be determined and the intensity of another portion of the X-ray spectrum from the same location of the melt. The quotient of both measurands then is a function of the concentration of the element to be determined.

Abstract: A method for the rapid and sensitive analysis of heavy metal ores, especially those of gold and uranium, uses high-engery X-ray fluorescence spectroscopy. The invention is of particular interest for the measurement of samples from gold or bodies which typically have concentrations up to 10 ppm by mass. Preferred features include the use of an X-ray tube as a source, the counting of emitted fluorescence photons in energy bands selected to correlate with the characteristic x-ray fluorescence emissions of elements of interest, the excitement of the ore sample by irradiation with high energy bremsstrahlung radiation filtered through tin, the exploitation of polarization in analysis for uranium, the interposition of a platinum-group metal filter between the sample and the detector, and the use of high-purity germanium detectors. Techniques are described for the detection and elimination of inaccuracies due to the presence of certain interfering metals and correction for variations in sample density.

Abstract: An electron probe microanalyzer equipped with a wavelength-dispersive x-ray spectrometer and also with an energy-dispersive x-ray spectrometer. X-rays emanating from the same sample region are detected by these two spectrometers, and spectra are created from the detected x-rays. Cursors which can be moved at will are superimposed on the spectra. One of the cursors is moved in relation to the other. That is, when one cursor is moved into the position of a desired wavelength or energy, the other is moved into the position of the corresponding energy or wavelength. The use of the cursors enables one to precisely and easily find the existence of a certain element in the sample region from the spectra obtained by the two x-ray spectrometers.

Abstract: A system and related method are provided for radiographically inspecting an object, located in a radiation path at an inspecting location, using backscattered radiation to obtain a radiographic representation of the object. Radiation, from a source, is transmitted to the selected location. A portion of the transmitted radiation passes through the object and is backscattered by an illuminator to a radiation detecting device. Another portion of the transmitted radiation interacts with and is backscattered by the object to the detecting device. The detecting device generates response signals in response to both portions of the backscattered radiation. The response signals are used to obtain the radiographic representation of the object.

Abstract: A device which measures both the thickness of a thin film and the concentration of selected elements within the thin film. An X-ray source is utilized to irradiate the thin film sample and two detectors, an energy dispersive detector and a wavelength dispersive detector, provide the film thickness and element concentration measurements respectively.

Abstract: An X-ray analyzer for performing both X-ray fluorescence and X-ray diffraction analysis is provided with an X-ray source, an X-ray guide tube for collimating X-rays from the source, a vacuum tank in which the guide tube is partially disposed, a rotatable sample table for holding a sample adjacent the guide tube, and an X-ray detector movable away from and towards the sample table, and also rotatable independently of the sample table.

Abstract: The ash content of coal suspended in a slurry is determined by bombarding a sample of the slurry flowing past a window of a measuring chamber with radiation from an annular nucleonic source, such as Cm-244, for emitting radiation within the range of about 7 to about 30 KeV and causing the sample to emit both backscattered and iron fluorescent x-rays. These x-rays are detected by a radiation detector which produces first and second electrical signals representative of the intensity of each. The density of the sample flowing from the measuring chamber is measured, such as by a nucelonic density gauge, to produce an electrical signal representative of the density and the ash content is determined from the detected intensities of the backscattered and iron fluorescent x-rays and the sample density.

Abstract: A procedure and means for non-destructively measuring the distribution of the filler and/or coating materials in the thickness direction of paper or cardboard. Radiation from a radio-isotope source is used to excite in the material component its characteristic X-ray radiation, the intensity of this radiation being observed. Measurements are made on both sides of the paper and the contents of other filler components are also determined by X-ray absorption in order to eliminate the effects of these components disturbing the distribution measurement. The base weight of the paper is measured e.g. by beta radiation absorption. Measurements are made both by measuring the characteristic radiation of the material components excited in the paper with different radiator sources and with the aid of absorption measurements of radiation directly from the source or produced with its aid in transformation targets, thus eliminating the effects of these components.

Abstract: A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.

Abstract: A procedure and means for non-destructive measuring of the distribution in the thickness direction of the filler and/or coating materials in paper or cardboard. Radiation emitted by an x-ray tube is used to excite in the material component to be examined, its characteristic x-ray radiation, the intensity of this radiation being observed. Measurements are made on both sides of the specimen. The contents of other filler components are also determined by x-ray absorption measurements, and the base weight of the paper, e.g. by beta radiation absorption. Measurements of the characteristic radiation, elicited with constant energy x-ray radiation as well as absorption measurements of radiation obtained directly from the x-ray tube and of radiation produced in transformation targets are made in order to eliminate by calculation the disturbing interaction of the filler components.

Abstract: The device operates by means of the X-ray fluorescence principle wherein a beam of primary X-rays is directed on to a coated test specimen and X-rays emitted back by the test specimen are counted to determine the thickness of the coating. The device has a stage for supporting test specimens, an X-ray generator, a collimator device for the primary X-rays, a counter for X-rays emitted back by the test specimens, and a displacement device for moving the stage in at least one direction at right angles to the collimator device, and in the direction of the X-ray beam. A rod composed principally of aluminum of a material of low atomic number is positioned at a safe distance beneath the collimator device, and approximately at right angles to the X-ray beam. The shaft of an electric motor imparts periodic motion to the rod. An evaluating device monitors the motion of the rod and outputs a signal when the rod is momentarily stopped.

Abstract: The ash content of a granular coal sample having a moisture content greater than 10% by weight is sensed by bombarding it with primary radiation comprising at least two spectrums of energies (46 KeV and 9-17 KeV) to cause radiative reactions in the coal, sensing the secondary radiation generated by the radiative reactions caused by one of the two spectrums of energies (46 KeV), sensing the secondary radiations at a characteristic fluorescent energy of at least one element (e.g. iron) in the coal sample, the characteristic fluorescent energy being excited by the other of the two spectrums of energies (9-17 KeV), and using the sensed secondary radiations to determine the ash content of the coal.

Abstract: A system and method of rapidly obtaining quantitative information as to the elemental constituents of coal, particularly the oxygen and sulfer content thereof. The system makes use of the photonuclear interaction to produce the desired radioactivity in the coal constituents. The above mentioned interaction is induced by high energy x-rays from a suitable electron accelerator. The induced radioactivity manifests itself by the emission of characteristic gamma rays among other things. These gamma rays are detected by conventional energy sensitive gamma-ray detectors such as germanium or sodium iodide crystals. The resultant signals are sorted and analyzed to provide the desired information.

Abstract: A method for determining the solids weight fraction of a slurry especially a coal slurry is described based on a measure of the concentration (wt/wt) of hydrogen in the slurry by neutron transmission or scatter. Accuracy of the method can be improved by combining the neutron measurement with a .gamma.-ray transmission or scatter measurement, and further improved by including a measurement of X-ray scatter or transmission. In the last mentioned case the mineral matter content of the coal in the slurry can also be determined.

Abstract: A new X-ray fluorescence method for testing a sample having two essentially parallel planar faces that provides full matrix effect compensation is disclosed. The intensities of the transmitted and fluorescent beams of photons are measured by X-ray detectors, and the X-ray source and the two detectors are operated so that ##EQU1## where .PHI. is the angle of the primary beam to one face of the sample, .PSI. is the angle of the fluorescent beam to either face of the sample, E.sub.1 is the energy of the photons of the primary beam, and E.sub.2 is the characteristic electron orbital transition energy for the element of interest. From the ratio of the two intensities the mean average concentration of the element is calculated directly without iterative or other complex procedures.