Abstract: An X-ray fluorescence analyzer is provided inside an analysis chamber covered with a housing with: an X-ray tube; an analyzing crystal for spectrally dispersing X-ray fluorescence emitted from a sample; an X-ray detector for detecting the X-ray fluorescence spectrally dispersed by the analyzing crystal; a warm air generator for generating warm air to maintain a temperature of the analyzing crystal at a target temperature; and a Peltier element for cooling the X-ray detector.

Abstract: An X-ray imaging apparatus includes an X-ray generation apparatus including an X-ray generation tube having an electron gun and a target configured to receive an electron beam from the electron gun to generate X-rays, a support structure supporting the tube, and a deflector configured to deflect the electron beam, an X-ray detector configured to detect the X-rays from the X-ray generation apparatus, and a control apparatus configured to control the X-ray generation apparatus. The support structure supports the tube to permit at least the target to be pivoted in a state in which the deflector is fixed, and the control apparatus determines, based on use amount of the X-ray generation apparatus and/or change of the X-rays generated by the X-ray generation apparatus, whether it is necessary to pivot the target.

Abstract: An X-ray inspection system and method are presented. The system comprising: at least two X-ray sources positioned and oriented at selected angles with respect to an inspection plane, to provide a common illumination spot on said inspection plane, thereby enabling inspection of common regions of a sample with at least one of increased irradiation intensity or two or more different irradiation characteristics while reducing navigation and registration processing.

Abstract: The present invention relates to a sample holder on which a crystal sample for serial crystallography is mounted, or the like. Compared to an existing sample holder, the sample holder according to the present invention can be manufactured by a very simple manufacturing process and at low costs, and does not physically and chemically affect other equipment therearound while collecting X-ray diffraction data. Therefore, it is possible to stably operate a beam line, to increase beam time efficiency, and further to perform raster scanning so that many diffraction images can be obtained even in a small-sized chip. In addition, since the problem of evaporation of a crystallized solution does not occur even when the crystallized solution is stored in the air for a long time, the sample holder is generally easy to use compared to a previously reported sample holder.

Abstract: This application relates to apparatus and method for x-ray fluorescence analysis. There is provided an X-ray fluorescence analysis apparatus for analysing a sample, The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity.

Abstract: Systems and techniques that facilitate detecting fuel in oil, lube degradation, and foreign object contamination through optical and/or color characterization are provided. A signature component can generate a digital signature corresponding to a lubricant in a lubrication circuit of an engine. The digital signature can be based on optical or visual properties of a sensor array coupled to the lubrication circuit and exposed to the lubricant, wherein the optical or visual properties of the sensor array can depend on a health of the lubricant. An analysis component can characterize the health of the lubricant by comparing, via a machine learning algorithm, the digital signature with a baseline digital signature corresponding to a desired health-level of the lubricant. In some embodiments, a light emitter component can emit a first light onto the sensor array, and a light receiver component can receive a second light emitted by the sensor array in response to the first light.

Abstract: A method, and corresponding system, provides enhanced security threat detection. The method includes: irradiating a target from a stationary x-ray source having end-point energy of at least 88 keV; enabling target motion with respect to the stationary x-ray source; detecting resulting x-rays received from the target; generating an image of an interior of the target based on the resulting x-rays; performing analysis of the image for an indication of a weapon; producing signals representing an energy spectrum of the resulting x-rays; analyzing the signals for characteristic x-ray fluorescence that can be emitted from lead potentially present in the target; providing an indication, based on the signals, of a probability of lead ammunition being present; and outputting an indication of likelihood of a security threat based on the analysis of the image for the weapon indication and the probability of lead ammunition.

Abstract: An ore component analysis device and method are provided, the analysis device comprises: a sample containing device configured to place an ore sample to be detected; an excitation unit configured to output X-rays with continuously adjustable energy; a detector configured to detect the secondary X-rays; a signal processing unit configured to amplify, shape and classify the secondary X-rays to obtain counts and energy of the secondary X-rays; a data processing device comprising a processor configured to execute a storage module, a matching module, a count correction module, a peak seeking module, a calculation module and a content correction module stored in a memory, so as to obtain elements and contents thereof in the ore sample. The present application can be directly applied to production line for qualitative and quantitative analysis of ore components.

Abstract: Disclosed herein is a method comprising: causing emission of characteristic X-rays of a first element attached to a first biological analyte; causing emission of characteristic X-rays of a second element attached to a second biological analyte; detecting a characteristic of the first biological analyte based on the characteristic X-rays of the first element and a characteristic of the second biological analyte based on the characteristic X-rays of the second element; wherein the first element and the second element are different; wherein the first biological analyte and the second biological analyte are in the same solution.

Abstract: An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

Abstract: In one embodiment, a system and a method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a movement path, as the substance moves along the movement path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of the overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.

Abstract: Provided are a quantitative analysis method, a quantitative analysis program, and an X-ray fluorescence. The quantitative analysis method includes: a step of acquiring a representative composition set to represent contents of analysis components; a step of acquiring a plurality of comparative compositions, in each of which the content of one of the analysis components of the representative composition is changed by a predetermined content; a detection intensity calculation step of calculating a detection intensity indicating an intensity of fluorescent X-rays detected under the influence of the geometry effect through use of an FP method with respect to a virtual sample having a thickness set in advance and being indicated by each of the representative composition and the comparative compositions; and a step of calculating a matrix correction coefficient for each of the analysis components based on the detection intensity.

Abstract: Provided is an X-ray analysis device and an X-ray analysis method capable of easily analyzing a valence of a target element in a sample. A controller 22 of a signal processing device of the X-ray analysis device is provided with: a storage unit 360 for storing a calibration curve generated based on a peak energy of K?1 X-ray and a peak energy of K?2 X-ray emitted from a metal simple substance, a peak energy of K?1 X-ray and a peak energy of K?2 X-ray emitted from each of two or more types of compounds each containing the metal simple substance, and a valence of the metal in each of the two or more types of compounds; a processing unit 302 configured to acquire a peak energy of K?1 X-ray and a peak energy of K?2 X-ray of the metal emitted from the metal contained in an unknown sample; and a calculation unit 308 configured to calculate a mean valence of the metal contained in the unknown sample by applying the obtained peak energy of K?1 X-ray and peak energy of K?2 X-ray to the calibration curve.

Abstract: This fluorescent X-ray analysis apparatus is provided with an X-ray irradiation unit 20 for irradiating a sample S with: X-rays, having an energy that exceeds the energy absorption edge value of Ag which is selected as a measurement target element, and that is no greater than the energy absorption edge value of Sn which is an adjacent element having a higher energy absorption edge value than Ag; and X-rays having an energy exceeding the energy absorption edge value of Sn which is selected as a measurement target element.

Abstract: Provided are a quantitative analysis method, a quantitative analysis program, and an X-ray fluorescence. The quantitative analysis method includes: a step of acquiring a representative composition set to represent contents of analysis components; a step of acquiring a plurality of comparative compositions, in each of which the content of one of the analysis components of the representative composition is changed by a predetermined content; a detection intensity calculation step of calculating a detection intensity indicating an intensity of fluorescent X-rays detected under the influence of the geometry effect through use of an FP method with respect to a virtual sample having a thickness set in advance and being indicated by each of the representative composition and the comparative compositions; and a step of calculating a matrix correction coefficient for each of the analysis components based on the detection intensity.

Abstract: Disclosed is a measurement probe for a measurement of elements in a mineral slurry. The measurement probe includes a housing having an X-ray window. The housing encloses: an X ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control an operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine a quantity of one or more elements of interest in the mineral slurry. The measurement probe further includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.

Abstract: The present invention includes a method and apparatus for measuring the transport of analytes from living, biological cells through a cell barrier, which includes, but is not limited to, steps of providing the living, biological cells loaded with analytes, unloading at least a portion of said analytes from the cells through ion channels, removing unloaded analyte remaining in the cells, and measuring the analytes using x-ray fluorescence, specifically wherein the measurement uses an energy dispersive x-ray fluorescence spectrometer equipped with a microfocus x-ray tube. These steps may be repeated so that multiple measurements can be obtained over a period of time.

Abstract: A geological analysis system, device, and method are provided. The geological analysis system includes sensors, including an X-ray fluorescence (XRF) unit, which detect properties of geological sample materials, a sample tray which holds the geological sample materials therein, and a processor. The XRF unit includes a body and a separable head unit and an output port configured to emit helium onto the geological sample materials within the sample tray. The sample tray includes chambers formed in an upper surface, ports, and passages, each providing communication between an interior of a chamber and an interior of a port. The ports are configured to be attachable to vials. The processor is configured to automatically position at least one of the sensors and the sample tray with respect to the other of the at least one of the sensors and the sample tray and to control the sensors.

Abstract: A method and apparatus for x-ray fluorescence measurement in object (1) are disclosed. The method includes (a) producing x-ray beam (2) using source device (10), wherein beam extends through object parallel to a first projection direction, (b) irradiating object with beam at scan positions in first projection plane, which are set by scanning device (20) such that source device and object are moved relative to one another, (c) detecting x-ray radiation emitted from object using detector array device (30) securely connected to source device and including spectrally selective detector elements (31) arranged to detect radiation, and stop lamellas (32) extending in radial directions relative to beam direction shielding detector elements from radiation scattered in object and arranged such that detector elements are able to detect radiation from all locations, and (d) processing detector signals to capture x-ray fluorescence of target particles in radiation and to localize target particles in object.

Abstract: An in vitro method for detecting presence of cancer includes obtaining a single hair sample. An x-ray beam is emitted from a source towards the hair sample. A small angle X-ray scattering (SAXS) intensity profile is generated after the x-ray beam hits the hair sample. The SAXS profile is received on a detector to obtain SAXS data, which is desmeared and Kratky Analysis is performed. A relative estimation of peak area under 1.38 nm?1 to 0.89 nm?1 from keratin and lipid content in the hair sample is performed to obtain R and is corrected by dividing by D, thickness of the hair. R? is computed using formula: 10×R2/(D?R). The value of R? is compared with clinically validated samples. If R? value is below 0.7, it indicates the presence of cancer and if it is above 0.8, it indicates absence of cancer.

Abstract: An X-ray fluorescence measurement apparatus has a sample tank, and a measurement unit that has an X-ray generator and an X-ray fluorescence detector. A film mechanism takes out a used film from a partitioning position between the sample tank and the measurement unit in a slide direction which intersects a direction of arrangement of the sample tank and the measurement unit, and feeds an unused film portion to the partitioning position in the slide direction. The film portions may alternatively be exchanged using cassettes.

Abstract: A system and method for analyzing a three-dimensional structure of a sample includes generating a first x-ray beam having a first energy bandwidth less than 20 eV at full-width-at-half maximum and a first mean x-ray energy that is in a range of 1 eV to 1 keV higher than an absorption edge energy of a first atomic element of interest, and that is collimated to have a collimation angular range less than 7 mrad in at least one direction perpendicular to a propagation direction of the first x-ray beam; irradiating the sample with the first x-ray beam at a plurality of incidence angles relative to a substantially flat surface of the sample, the incidence angles of the plurality of incidence angles in a range of 3 mrad to 400 mrad; and simultaneously detecting a reflected portion of the first x-ray beam from the sample and detecting x-ray fluorescence x-rays and/or photoelectrons from the sample.

Abstract: The X-ray analysis apparatus contains an X-ray generation unit. The X-ray generation unit includes a target plate having a target that is irradiated with an electron beam from an electron beam source and generates X-rays, X-ray convergence optics that converges X-rays generated from the target in conjunction with a movement of the target plate, and a driving unit that changes a position of the target plate or the X-ray convergence optics relative to the electron beam source.

Abstract: The present invention relates to an apparatus and a method for inspecting battery cells for automation of total inspection. To this end, the present invention is configured such that test objects are sequentially stacked on a test object casing provided on an upper portion of a mounting stage of a main stage, images of the test objects are obtained by radiography after the test object casing is moved to a test object inspection unit, and the test objects stacked on the test object casing are unloaded to the outside after the images are obtained. Accordingly, the present invention enables total inspection to be performed on battery cells, which are the test objects, in order to quickly divide good and defective products, and solves a delay of a flow rate caused by X-ray inspection of the test object inspection unit in order to improve productivity and efficiency.

Abstract: A chemical state analysis apparatus 10 includes: an excitation source 11 configured to irradiate an irradiation region A of a predetermined surface in a sample S containing a battery material with an excitation rays for generating characteristic X-rays of the battery material; an analyzing crystal 13 of a flat plate arranged so as to face the irradiation region A; a slit 12 arranged between the irradiation region A and the analyzing crystal 13, the slit being arranged in parallel to the irradiation region A and a predetermined crystal plane of the analyzing crystal 13; an X-ray linear sensor 15 in which linear detecting elements 151 each having a length in a direction parallel to the slit 12 are arranged in a direction perpendicular to the slit; a wavelength spectrum generation unit 161 configured to generate a wavelength spectrum based on intensity of the characteristic X-rays detected by the X-ray linear sensor 15; a peak wavelength determination unit 162 configured to determine a peak wavelength which is a

Abstract: An X-ray fluorescence analyzer includes an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. The first crystal diffractor is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The first crystal diffractor includes a pyrolytic graphite crystal that has a diffractive surface, which is a simply connected surface. The first radiation detector is a solid-state semiconductor detector.

Abstract: An analyzing apparatus includes an X-ray measurement device, an optical characteristic measurement device, and a calculation unit. The X-ray measurement device may be configured to measure fluorescent X-rays generated from the measurement object. The optical characteristic measurement device may be configured to obtain optical characteristics other than the fluorescent X-rays of one or more carbon compounds contained in the measurement object. The calculation unit may be configured to calculate information about a quantity of the one or more carbon compounds contained in the measurement object on the basis of the optical characteristics of the carbon compound(s), and correct the information about fluorescent X-rays measured by the X-ray measurement device on the basis of the information about the quantity of the carbon compound(s).

Abstract: A method of analysis of X-ray spectra in an instrument fits a measured sample spectrum using a combination of at least one measured reference spectrum with at least one calculated function. The method includes measuring a reference spectrum as a plurality of measured values for a plurality of energy bins from at least one reference sample; selecting a region or multiple regions of interest corresponding to a plurality of the energy bins and, for each region of interest, recording the profile for the respective plurality of energy bins from the measured reference spectrum. The method further comprises measuring a sample spectrum as a plurality of intensity values for a plurality of energy bins; and fitting the measured sample spectrum to a fit function, the fit funtion including the at least one profile in at least one respective region of interest of the measured spectrum as well as the at least one calculated function.

Abstract: To more accurately output a signal related to a source of particulate matter floating in the atmosphere, an analyzer is equipped with a mass concentration measuring unit, an element analysis unit, and a source-related signal output unit. The mass concentration measuring unit measures the mass concentration of fine particulate matter (FP) in the atmosphere. The element analysis unit analyzes an element contained in the FP. The source-related signal output unit outputs a signal related to the source of the FP on the basis of the mass concentration measurement result from the mass concentration measuring unit, and the analysis result for the element contained in the FP from the element analysis unit.

Abstract: A method for assaying a wall of a pressure tube for a nuclear reactor is disclosed. The wall has a matrix material and deuterium nuclei in the matrix material. The method includes: (a) transmitting gamma rays into the matrix material to induce photodisintegration of at least some of the deuterium nuclei, whereby reaction particles of the nuclei are emitted from the wall; (b) detecting at least some of the reaction particles emitted in step (a) using a particle detector; and (c) generating particle signals in response to detecting the particles in step (b).

Abstract: A system for x-ray analysis includes at least one x-ray source configured to emit x-rays. The at least one x-ray source includes at least one silicon carbide sub-source on or embedded in at least one thermally conductive substrate and configured to generate the x-rays in response to electron bombardment of the at least one silicon carbide sub-source. At least some of the x-rays emitted from the at least one x-ray source includes Si x-ray emission line x-rays. The system further includes at least one x-ray optical train configured to receive the Si x-ray emission line x-rays and to irradiate a sample with at least some of the Si x-ray emission line x-rays.

Abstract: There are disclosed a method of producing an XRF readable mark, the XRF readable mark and a component comprising thereof. The method comprises providing an XRF marking composition with specific relative concentrations of one or more chemical elements and fabricating a multilayer structure of the XRF readable mark. The relative concentrations are selected such that in response to irradiation of the XRF marking composition by XRF exciting radiation, the XRF marking composition emits an XRF signal indicative of a predetermined XRF signature. Fabricating the multilayer structure comprises implementing an attenuation layer with at least one element exhibiting high absorbance for an XRF exciting radiation and/or an XRF background; and implementing a marking layer comprising said XRF marking composition.

Abstract: Methods and systems for feed-forward of multi-layer and multi-process information using XPS and XRF technologies are disclosed. In an example, a method of thin film characterization includes measuring first XPS and XRF intensity signals for a sample having a first layer above a substrate. The first XPS and XRF intensity signals include information for the first layer and for the substrate. The method also involves determining a thickness of the first layer based on the first XPS and XRF intensity signals. The method also involves combining the information for the first layer and for the substrate to estimate an effective substrate. The method also involves measuring second XPS and XRF intensity signals for a sample having a second layer above the first layer above the substrate. The second XPS and XRF intensity signals include information for the second layer, for the first layer and for the substrate.

Abstract: An aircraft, system, and method for sensing and/or releasing chemical agents by an aircraft is disclosed. The aircraft, system, and method may employ a chemical sensor, a wind sensor, an imaging device for capturing environmental features, and/or a processor operably coupled therewith. The processor may be used for collecting data from the chemical sensor, the wind sensor, and the imaging device to identify a navigational waypoint and to provide commands to the chemical sensor or to the aircraft based at least in part on collected data.

Abstract: The X-ray analysis apparatus of the present invention comprises a sample stage for supporting a sample, a goniometer having an axis of rotation, and an X-ray detector arranged to be rotatable about the axis of rotation of the goniometer, wherein the X-ray detector is arranged to receive X-rays from the sample directed along an X-ray beam path. The X-ray analysis apparatus further comprises a first collimator, a second collimator and a third collimator each having a first configuration and a second configuration. In its first configuration, the collimator is arranged in the X-ray beam path. In its second configuration the collimator is arranged outside of the X-ray beam path. A first actuator arrangement is configured to move the first collimator and the second collimator between the first configuration and the second configuration by moving the first collimator and the second collimator in a lateral direction that intersects the X-ray beam path.

Abstract: An analyzing apparatus includes a collection filter, a two-dimensional sensor, and a calculation unit. The collection filter collects fine particulate matter included in the air. The two-dimensional sensor obtains collection image data including a collection area of the collection filter in which the fine particulate matter is collected. The calculation unit calculates data relating to content of the colored particulate matter included in the collection area based on the collection image data.

Abstract: A sensor for determining the overall content of a pre-determined chemical element in a liquid body uses X-ray fluorescence technology and includes an X-ray source, an X-ray detector, and a cell intended to contain a sample of lubricant to be analyzed, and is provided with a wall forming a window for passage of X-rays, the wall of the sensor cell being produced from polyethylene terephthalate, the cell also including a casing defining an internal volume for receiving the sample. A procedure for calibrating the sensor, and an automated method for online monitoring are also described and claimed.

Abstract: A system and method for generating X-ray radiation. The system includes an electron source operable to generate an electron beam and an X-ray target for generating X-ray radiation upon interaction with the electron beam. The method includes moving the electron beam over an edge separating a first region and a second region of the X-ray target, wherein the first region and the second region have different capability to generate X-ray radiation upon interaction with the electron beam. The system allows for a lateral extension of the electron beam to be determined based on a change in a quantity indicative of the interaction between the electron beam and the first region and between the electron beam and the second region, and the movement of the electron beam.

Abstract: A system for analyzing a fluid includes an integrated fluid-electric cabinet having a fluid compartment and an electronic compartment. The fluid compartment and an electronic compartment are separated from one another by a partition wall. The partition wall includes opposed first and second surfaces. A flow cell assembly is disposed in the fluid compartment and is configured to be mounted on the first surface side of the partition wall. A probe head assembly is disposed in the electronic compartment and is mounted on the opposed second surface side of the partitioned wall. Both of the flow cell assembly and the probe head assembly are configured to be in electro-magnetic communication with one another for elemental analysis of the fluid such that the probe head assembly utilizes an X-ray source to analyze the fluid in a static mode or in flow mode through the flow cell assembly.

Abstract: An x-ray inspection device includes an x-ray irradiation unit that irradiates an object for inspection with an x-ray; a sensor that detects an electric signal corresponding to a back-scattered x-ray reflected off the object for inspection; a measurement unit that measures the object for inspection with reference to the electric signal output by the sensor; and a heavy metal plate having a pinhole that allows the back-scattered x-ray to pass therethrough, the pinhole forming an image of the back-scattered x-ray on the sensor.

Abstract: A system and method for identifying an object is provided. The system includes an enhanced chemical compound coupled to an object, an X-Ray Fluorescence (XRF) device for scanning the enhanced chemical compound coupled to the object, and a display coupled to the XRF device for displaying the results of the scan of the enhanced chemical compound coupled to the object, the results of the scan including at least one of what kind of object was scanned, the owner of the object, and the manufacturer of the object.

Abstract: A method of operating a charged particle microscope comprising: Providing a specimen on a specimen holder; Using a source to produce a beam of charged particles, and irradiating the specimen with said beam; Using a detector to detect X-ray radiation emanating from the specimen in response to said irradiation, and to produce a spectrum comprising X-ray characteristic peaks on a Bremsstrahlung background, comprising the following additional steps: Using an elemental decomposition algorithm to analyze the characteristic peaks in said spectrum, thereby determining a reference group of major chemical elements contributing to the spectrum; Calculating an average atomic number for said reference group, and using this in a predictive model to generate a calculated Bremsstrahlung profile for the reference group; Fitting said calculated Bremsstrahlung profile to the Bremsstrahlung background in said spectrum, and attributing a discrepancy between the latter and the former to a residual element absent from, or inc

Abstract: An X-ray backscatter indication and detection system, including an object disposed with respect to a target area targeted by X-rays, such that X-rays that backscatter from the target area strike the surface of the object. The surface of the object includes an X-ray sensitive indicator substance that fluoresces with a visible light when contacted by backscattered X-rays.

Abstract: Concepts presented herein relate to approaches for performing substrate inspection. In one aspect, the concepts relate to detecting anomalies or candidate defects on the substrate based on contrast in images obtained of the substrate.

Abstract: Determining a property of a layer of an integrated circuit (IC), the layer being formed over an underlayer, is implemented by performing the steps of: irradiating the IC to thereby eject electrons from the IC; collecting electrons emitted from the IC and determining the kinetic energy of the emitted electrons to thereby calculate emission intensity of electrons emitted from the layer and electrons emitted from the underlayer calculating a ratio of the emission intensity of electrons emitted from the layer and electrons emitted from the underlayer; and using the ratio to determine material composition or thickness of the layer. The steps of irradiating IC and collecting electrons may be performed using x-ray photoelectron spectroscopy (XPS) or x-ray fluorescence spectroscopy (XRF).

Abstract: An apparatus (1) for detecting a substance in a rod shaped article of the tobacco industry (2), the apparatus (1) including one or more sources (10,11) of electromagnetic radiation, one or more detectors (26, 27) and a processor (32). The one or more sources (10, 11) are configured to generate electromagnetic radiation at first and second wavelengths (?1, ?2). The one or more detectors (26, 27) are configured to detect the first and second wavelengths (?1, ?2) after propagation in the rod shaped article (2), lo and to generate signals (A, B) based on the amount of radiation received at each wavelength (?1, ?2). The processor (32) is configured to process the signals (A, B) to determine information relating to the presence of the substance, based on the relative amount of radiation received at the first and second wavelengths.

Abstract: A method and system for sorting workpieces, such as chicken nuggets. The sorting system includes a conveyor system that advances in a forward direction and one or more blow off bars positioned over the conveyor system. The blow off bars extend along the forward advancing direction. The blow off bars include one or more valved nozzles connected to a pressurized source of a fluid, and the nozzles are positioned to discharge the fluid across the conveyor system.

Abstract: One embodiment of the resent invention is a method for a user equipment transmitting/receiving information related to a barometer in a wireless communication system, the method for transmitting/receiving information related to a barometer comprising the steps of: transmitting positioning information to an evolved NodeB; receiving temperature/humidity information based on the positioning information; and transmitting, to the evolved NodeB, barometer information based on the temperature/humidity information, wherein the barometer information is corrected using the temperature/humidity information.

Abstract: A system and method for imaging a sample having a complex structure (such as an integrated circuit) implements two modes of operation utilizing a common electron beam generator that produces an electron beam within a chamber. In the first mode, the electron beam interacts directly with the sample, and backscattered electrons, secondary electrons, and backward propagating fluorescent X-rays are measured. In the second mode, the electron beam interrogates the sample via X-rays generated by the electron beam within a target that is positioned between the electron beam generator and the sample. Transmitted X-rays are measured by a detector within the vacuum chamber. The sample is placed on a movable platform to precisely position the sample with respect to the electron beam. Interferometric and/or capacitive sensors are used to measure the position of the sample and movable platform to provide high accuracy metadata for performing high resolution three-dimensional sample reconstruction.

Abstract: A system for monitoring and controlling electrical devices has a local central processor with memory for storing an operating and control systems for controlling analog or digital sensors, instruments, and devices. A web browser interfaces with a communications system to exchange data with the local central processor. External hardware couples to the local central processor via an inter integrated circuit interconnection system. Plural sensors and instruments couple to the local central processor, and are controlled over the internet. Electrical devices include any combination of temperature sensors, potentiometric sensors, oceanographic sensors and instruments, industrial sensors and instruments, voltammetric sensors, light sensors, atmospheric sensors and instruments, water sensors, pH sensors, and amperometric sensors and instruments. Sensor data is stored in a removable data storage arrangement.