Fluorescence Patents (Class 378/44)
  • Patent number: 10342633
    Abstract: A medical image data processing system comprising processing circuitry configured to receive three-dimensional medical imaging data; and process the three-dimensional medical imaging data to generate using a virtual light source an image for display, wherein the processing circuitry is configured to vary at least one parameter relevant to the virtual light source in dependence on at least one of a position of a medical device inserted into a human or animal body, a position of a viewing point for virtual endoscopic imaging, and the progress of a procedure.
    Type: Grant
    Filed: June 20, 2016
    Date of Patent: July 9, 2019
    Assignee: TOSHIBA MEDICAL SYSTEMS CORPORATION
    Inventors: Magnus Wahrenberg, Tristan Lawton, Timothy Day
  • Patent number: 10295485
    Abstract: An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: May 21, 2019
    Assignee: Sigray, Inc.
    Inventors: Wenbing Yun, Srivatsan Seshadri, Janos Kirz, Sylvia Jia Yun Lewis
  • Patent number: 10184905
    Abstract: Three or more tubular radiation detectors are arranged around an irradiation axis of radiation directed to a sample from an irradiation unit such that the end face thereof is opposed to the position irradiated with radiation. The radiation emitted from the sample enters the radiation detector through an end face and is detected. In the radiation detector, the length in the direction parallel to the straight line which is on the plane orthogonal to the irradiation axis and is perpendicular to the central axis continuously decreases from a position along the central axis to the end face. The size of each radiation detector around the irradiation axis is reduced as it approaches the end face, preventing the radiation detectors from interfering with one another and allowing the radiation detector to be closer to the sample compared to the conventional case. This makes it possible for the radiation detection apparatus to detect radiation from the sample with high efficiency.
    Type: Grant
    Filed: April 20, 2016
    Date of Patent: January 22, 2019
    Assignee: HORIBA, LTD.
    Inventors: Kengo Yasui, Daisuke Matsunaga
  • Patent number: 10175184
    Abstract: The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.
    Type: Grant
    Filed: June 2, 2016
    Date of Patent: January 8, 2019
    Assignee: Moxtek, Inc.
    Inventors: Richard Creighton, Steven Morris, Shawn Chin, Sanjay Kamtekar
  • Patent number: 10101469
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: October 16, 2018
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 10082390
    Abstract: Methods and systems for feed-forward of multi-layer and multi-process information using XPS and XRF technolgies are disclosed. In an example, a method of thin film characterization includes measuring first XPS and XRF intensity signals for a sample having a first layer above a substrate. A thickness of the first layer is determined based on the first XPS and XRF intensity signals. The information for the first layer and for the substrate is combined to estimate an effective substrate. Second XPS and XRF intensity signals are measured for a sample having a second layer above the first layer above the substrate. The method also involves determining a thickness of the second layer based on the second XPS and XRF intensity signals, the thickness accounting for the effective substrate.
    Type: Grant
    Filed: June 19, 2015
    Date of Patent: September 25, 2018
    Assignee: NOVA MEASURING INSTRUMENTS INC.
    Inventors: Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael C. Kwan, Mark Klare, Charles Thomas Larson
  • Patent number: 10022105
    Abstract: A radiographic imaging apparatus includes an electronic cassette and a console device for radio communication with the electronic cassette. The electronic cassette includes a transmitter for transmitting a beacon for the radio communication. A regulation unit regulates beaconing of the beacon in a predetermined specific state among plural operational states. The console device includes a receiver for receiving the beacon. A communication failure detector checks whether a communication failure has occurred in the radio communication according to a receiving state of the beacon in the receiver. A display panel or speaker generates alert notification to notify the communication failure assuming that the communication failure detector judges that the communication failure has occurred. An operational state detector checks whether the electronic cassette is in the specific state.
    Type: Grant
    Filed: May 25, 2016
    Date of Patent: July 17, 2018
    Assignee: FUJIFILM Corporation
    Inventor: Yoshimitsu Kudo
  • Patent number: 10012604
    Abstract: An apparatus includes at least one X-ray source that emits X-rays toward a sample, an X-ray fluorescence (XRF) detector that detects X-ray radiation scattered from the sample, an internal standard that emits scattered X-ray radiation in response to X-rays emitted from the at least one X-ray source, and a carriage assembly that translates the at least one X-ray source and XRF detector between a sample measurement position and an internal standard measurement position.
    Type: Grant
    Filed: December 15, 2015
    Date of Patent: July 3, 2018
    Assignee: THERMO GAMMA-METRICS PTY LTD
    Inventors: Bryan John Crosby, Simon Liemar, Peter William Hayles, Charlie Minghua Mao, Tejas Indravadanbhai Shah, Hao Zeng
  • Patent number: 10012605
    Abstract: A measurement line evaluation unit (23): calculates, for all of specified measurement lines, estimated measured intensities by theoretical calculation on the basis of a composition and/or a thickness specified for a thin film; changes, by a predetermined amount, only an estimated measured intensity of one measurement line, and obtains quantitative values of the composition and/or the thickness of the thin film after change of the estimated measured intensity, for each changed measurement line, by a fundamental parameter method; and estimates a quantitative error and/or determines possibility of analysis, on the basis of the obtained quantitative values and the specified composition and/or the specified thickness.
    Type: Grant
    Filed: July 1, 2016
    Date of Patent: July 3, 2018
    Assignee: Rigaku Corporation
    Inventors: Yasujiro Yamada, Shinya Hara, Makoto Doi
  • Patent number: 9961753
    Abstract: A portable XRF analyzer includes a hand shield and a handle. In one embodiment, the XRF analyzer further comprises a power component spaced-apart from an engine component. The handle and the hand shield extend in parallel between the engine component and the power component, attaching the engine component to the power component. In another embodiment, the XRF analyzer further comprises two housing portions, each integrally formed in a single, monolithic body formed together at the same time. The two housing portions are joined together to form an XRF analyzer housing. In another embodiment, the hand shield is shorter than the handle.
    Type: Grant
    Filed: June 26, 2017
    Date of Patent: May 1, 2018
    Assignee: Moxtek, Inc.
    Inventors: Vincent Floyd Jones, Daniel N. Paas
  • Patent number: 9874531
    Abstract: Periodic spatial patterns of x-ray illumination are used to gather information about periodic objects. The structured illumination may be created using the interaction of a coherent or partially coherent x-ray source with a beam splitting grating to create a Talbot interference pattern with periodic structure. The object having periodic structures to be measured is then placed into the structured illumination, and the ensemble of signals from the multiple illumination spots is analyzed to determine various properties of the object and its structures. Applications to x-ray absorption/transmission, small angle x-ray scattering, x-ray fluorescence, x-ray reflectance, and x-ray diffraction are all possible using the method of the invention.
    Type: Grant
    Filed: May 15, 2015
    Date of Patent: January 23, 2018
    Assignee: Sigray, Inc.
    Inventors: Wenbing Yun, Sylvia Jia Yun Lewis, Janos Kirz
  • Patent number: 9767559
    Abstract: A system and method for reconstructing locations of sensors in radiopaque images may estimate sensor locations in two groups of good radiographic images and use them to estimate candidate sensor locations in a group of bad radiographic images B1, . . . , Bn in which many sensors are indiscernible. A first iterative process pervading from the first image B1 to the last image Bn may determine a first set of candidate sensor locations, and a second iterative process pervading from the last image Bn to the first image B1 may determine a second set of candidate sensor location for each image. Location of a sensor in each image Bi may be estimated based on the pertinent first and second candidate sensor locations related, or determined for, the particular sensor in the particular image. Sensor locations still missing in the series of images are, then, estimated using the already estimated sensor locations.
    Type: Grant
    Filed: March 27, 2015
    Date of Patent: September 19, 2017
    Assignee: GIVEN IMAGING LTD.
    Inventor: Stas Rozenfeld
  • Patent number: 9719949
    Abstract: A sample plate is for X-ray analysis to which a sample is fixed in performing an analysis using an X-ray fluorescent analyzer, and includes: a plate-like body that supports the sample; and a code-indicated portion provided on the plate-like body in which information on the sample is encoded and indicated.
    Type: Grant
    Filed: July 7, 2015
    Date of Patent: August 1, 2017
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Masahiro Sakuta
  • Patent number: 9689815
    Abstract: An XRF analyzer can include a rotatable filter structure to separately position at least two different x-ray source modification regions between an x-ray source and a focal point and at least two different x-ray detector modification regions between an x-ray detector and the focal point. An XRF analyzer can include a rotatable source filter wheel between an x-ray source and a focal point and a rotatable detector filter wheel between an x-ray detector and the focal point. The source filter wheel can include multiple x-ray source modification regions. The detector filter wheel can include multiple x-ray detector modification regions. A gear wheel can mesh with a gear on the source filter wheel and with a gear on the detector filter wheel and can cause the source filter wheel and the detector filter wheel to rotate together.
    Type: Grant
    Filed: July 23, 2015
    Date of Patent: June 27, 2017
    Assignee: Moxtek, Inc.
    Inventor: Vincent Floyd Jones
  • Patent number: 9667190
    Abstract: Disclosed herein is a device for controlling a sample temperature during photoelectric measurement of the sample. The device for controlling a sample temperature during photoelectric measurement of the sample includes: a sample stage to which a measurement target sample is fixed; a cooling unit for cooling the sample by injecting air; and a temperature measuring unit having a thermometer that measures a temperature of the sample. The device has an effect of easily controlling the temperature of a measurement target sample by employing a direct control method for a sample temperature, in which air or cooled air is injected to the sample.
    Type: Grant
    Filed: August 8, 2014
    Date of Patent: May 30, 2017
    Assignee: KOREA INSTITUTE OF ENERGY RESEARCH
    Inventors: SeoungKyu Ahn, Kyung Hoon Yoon, Jae Ho Yun, Jun Sik Cho, SeJin Ahn, Jihye Gwak, Kee Shik Shin, Kihwan Kim, Joo Hyung Park, Young Joo Eo, Jin Su Yoo, Ara Cho
  • Patent number: 9649078
    Abstract: A hybrid x-ray device for mounted and portable use. The hybrid x-ray device can include a housing, an x-ray source, a support connector, a shield connector, and an interlock. The x-ray source is coupled to the housing and configured to generate x-ray radiation. The support connector is coupled to the housing and configured to mechanically couple to a support arm. The shield connector is coupled to the housing and configured to mechanically couple to a removable radiation shield. The interlock is coupled to the x-ray source and configured to disable activation of the x-ray source when both: (a) the support connector is mechanically uncoupled from the support arm, and (b) the shield connector is mechanically uncoupled from the removable radiation shield.
    Type: Grant
    Filed: July 28, 2015
    Date of Patent: May 16, 2017
    Assignee: DENTAL IMAGING TECHNOLOGIES CORPORATION
    Inventors: Sameer Anand Joshi, Bradley S. Carlson
  • Patent number: 9594037
    Abstract: In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray.
    Type: Grant
    Filed: May 19, 2015
    Date of Patent: March 14, 2017
    Assignee: Horiba, Ltd.
    Inventors: Yusuke Mizuno, Tomoki Aoyama
  • Patent number: 9551677
    Abstract: A method includes directing an X-ray beam to be incident at a grazing angle on a location on a surface of the sample. An X-ray fluorescence excited at the location is measured. A reflection angle of the X-ray beam from the surface and a transmission angle of the X-ray beam are measured. An angle of incidence of the X-ray beam on the surface is evaluated using the measured reflection and transmission angles, and the measured X-ray fluorescence is analyzed using the evaluated angle of incidence.
    Type: Grant
    Filed: November 27, 2014
    Date of Patent: January 24, 2017
    Assignee: BRUKER JV ISRAEL LTD.
    Inventors: Isaac Mazor, Asher Peled
  • Patent number: 9513233
    Abstract: Systems and methods are provided for staining tissue with multiple biologically specific heavy metal stains and then performing X-ray imaging, either in projection or tomography modes, using either a plurality of illumination energies or an energy sensitive detection scheme. The resulting energy-weighted measurements can then be used to decompose the resulting images into quantitative images of the distribution of stains. The decomposed images may be false-colored and recombined to make virtual X-ray histology images. The techniques thereby allow for effective differentiation between two or more X-ray dyes, which had previously been unattainable in 3D imaging, particularly 3D imaging of features at the micron resolution scale. While techniques are described in certain example implementations, such as with microtomography, the techniques are scalable to larger fields of view, allowing for use in 3D color, X-ray virtual histology of pathology specimens.
    Type: Grant
    Filed: October 29, 2012
    Date of Patent: December 6, 2016
    Assignees: THE UNIVERSITY OF CHICAGO, THE PENN STATE RESEARCH FOUNDATION, UCHICAGO ARGONNE, LLC
    Inventors: Patrick La Riviere, Yuxin Steve Wang, Darin Clark, Keith Cheng
  • Patent number: 9450536
    Abstract: An inspection apparatus includes an irradiation part that emits plural pieces of pulse light having different wavelengths to irradiate a multi-junction type solar cell; a wavelength setting part that sets the wavelengths of the plural pieces of pulse light with which the multi-junction type solar cell is irradiated by the irradiation part; and a detection part that detects an electric field intensity of an electromagnetic wave emitted from the multi-junction type solar cell in response to the plural pieces of pulse light with which the multi-junction type solar cell is irradiated by the irradiation part. The irradiation part includes a delay element that delays a time the multi-junction type solar cell is irradiated with the pulse light by a time ?t11 relative to the pulse light.
    Type: Grant
    Filed: February 11, 2015
    Date of Patent: September 20, 2016
    Assignees: SCREEN HOLDINGS CO., LTD., OSAKA UNIVERSITY
    Inventors: Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama, Masayoshi Tonouchi
  • Patent number: 9430925
    Abstract: Embodiments disclosed herein provide a detector unit and sensor chamber with matter retention member and method for making the same. In one embodiment, a smoke chamber can include a detection circuitry member having a surface, a particle trapping member mounted to the surface, and a chamber coupled to the detection circuitry member. The chamber can include a planar member, and several baffles extending away from the planar member in the direction towards the detection circuitry member and disposed around a periphery of the planar member, wherein a distal end of each baffle interfaces with the particle trapping member.
    Type: Grant
    Filed: September 5, 2014
    Date of Patent: August 30, 2016
    Assignee: GOOGLE INC.
    Inventor: Adam Mittleman
  • Patent number: 9398888
    Abstract: In a radiation imaging system performing a difference process using a stored mask image based on a radiation image obtained before a contrast agent is injected and a radiation image obtained after the contrast agent is injected, a controller displays a first graphic representing a first timing when irradiation of a radial ray is started, a second graphic representing a second timing when the mask image is stored, and a third graphic representing a third timing when the contrast agent is injected in this order along a time axis and controls the second and third timings by the second and third graphics. The controller moves, when one of the second and third graphics is moved along the time axis, the other of the second and third graphics such that an interval between the first and third graphics becomes larger than an interval between the first and second graphics.
    Type: Grant
    Filed: June 16, 2014
    Date of Patent: July 26, 2016
    Assignee: Canon Kabushiki Kaisha
    Inventor: Hironori Yamashita
  • Patent number: 9297773
    Abstract: X-ray fluorescence (XRF) monitoring of characteristic peaks while etching thin-film layers can reveal coverage defects and thickness nonuniformity in the top film. To measure coverage and uniformity while screening candidate layer materials and processes, the candidate layers may be formed above an underlayer of a different composition. A wet etchant that selectively etches the underlayer faster than the candidate layer is applied to the candidate layer, and the XRF spectrum is monitored. Pinholes, cracks, islands, and nonuniform thickness in the candidate layer produce characteristic features in the time-dependent behavior of XRF peaks from the underlayer and/or the candidate layer. “Etch/XRF” tests can be used to rapidly and objectively identify the most uniform contiguous candidate layers to advance to further screening or production. XRF may also be calibrated against a known thickness indicator to detect the approach of a desired endpoint in an etch process.
    Type: Grant
    Filed: December 26, 2013
    Date of Patent: March 29, 2016
    Assignee: Intermolecular, Inc.
    Inventor: Edwin Adhiprakasha
  • Patent number: 9279890
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: March 8, 2016
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 9268039
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the opposite surface.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: February 23, 2016
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 9255996
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: February 9, 2016
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 9213007
    Abstract: A foreign matter detector includes an X-ray source which irradiates a sample moving in a constant direction with primary X-rays, a parallel two-dimensional slit which includes a plurality of slits arranged in at least a moving direction of the sample and emits parallel secondary X-rays by extracting a parallel component of secondary X-rays generated from the sample, a dispersing element which disperses the parallel secondary X-rays to obtain a specific X-ray fluorescence, a TDI sensor which receives the X-ray fluorescence, and a control unit which controls the TDI sensor to detect a foreign matter corresponding to the X-ray fluorescence. The control unit integrates a luminance value of the X-ray fluorescence received by the TDI sensor while matching a direction and a speed of charge transfer of the TDI sensor to a direction and a speed of movement of the sample.
    Type: Grant
    Filed: March 25, 2014
    Date of Patent: December 15, 2015
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Yoshiki Matoba
  • Patent number: 9042516
    Abstract: A system comprises a structure having particles embedded at a level within the structure, and X-ray imaging apparatus for capturing images of the particles at the level.
    Type: Grant
    Filed: October 9, 2012
    Date of Patent: May 26, 2015
    Assignee: The Boeing Company
    Inventors: James A. Grossnickle, Robert B. Greegor
  • Patent number: 9031187
    Abstract: The invention provides an apparatus and a method of performing X-ray diffraction (XRD) and/or X-ray fluorescence (XRF) analysis of a sample, comprising: irradiating a sample with X-rays from an X-ray source; providing a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector; and performing XRD analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample using the scanning wavelength selector and detecting X-rays of the selected fixed wavelength(s) at one or more values of the diffraction angle ? at the sample using the X-ray detector(s); and/or performing XRF analysis of the sample by scanning wavelengths of X-rays emitted by the sample using the scanning wavelength selector and detecting X-rays of the scanned wavelengths using the X-ray detector(s).
    Type: Grant
    Filed: December 13, 2010
    Date of Patent: May 12, 2015
    Assignee: Thermo Fisher Scientific (Ecublens) SARL
    Inventors: Ravisekhar Yellepeddi, Pierre-Yves Negro
  • Publication number: 20150103973
    Abstract: An x-ray system with multiple dynamic range selections. The system including an x-ray source and a detector, wherein the detector includes a scintillator and a pixel. The pixel includes a photodiode and first and second capacitors connectable to the photodiode. The pixel is configured to be switched between a first state where only the first capacitor is connected to the photodiode and a second state where both capacitors are connected to the photodiode. The x-ray source directs x-rays to the detector and a region of interest positioned between the source and detector, the scintillator converts the x-rays to light, and the pixel photodiode converts the light to an electrical charge. The charge is stored in the first capacitor when the pixel is in the first state and in the first and second capacitors when the pixel is in the second state.
    Type: Application
    Filed: October 11, 2013
    Publication date: April 16, 2015
    Applicant: General Electric Company
    Inventors: James Zhengshe Liu, Jonathan Edvard Snyder, Richard Larry Anderton, David Ellis Barker, Brian James Grekowicz
  • Publication number: 20150085976
    Abstract: A portable X-ray fluorescence analyzer comprises a detector of ionizing radiation that is configured to detect radiation from spontaneous radioactive decay within an environment of the portable X-ray fluorescence analyzer and or ionizing radiation that propagates past a front end of the portable X-ray fluorescence analyzer towards its user.
    Type: Application
    Filed: September 24, 2013
    Publication date: March 26, 2015
    Applicant: Oxford Instruments Analytical Oy
    Inventors: Mikko JÄRVIKIVI, Jarmo LEINO
  • Publication number: 20150085977
    Abstract: A portable analyzer comprises a detector of ionizing radiation that is configured to detect radiation from spontaneous radioactive decay within an environment of the portable analyzer and or ionizing radiation that propagates past a front end of the portable analyzer towards its user.
    Type: Application
    Filed: June 19, 2014
    Publication date: March 26, 2015
    Inventors: Mikko JARVIKIVI, Jarmo LEINO
  • Patent number: 8990024
    Abstract: A fluorescence intensity compensation method, includes: receiving, with photodetectors having different input wavelength bands, fluorescence emitted from fluorochromes excited by irradiating light on microparticles multiply-labeled by a plurality of fluorochromes with overlapping fluorescence wavelengths; collecting detected values for the photodetectors; and obtaining a measurement spectrum, by approximating, from the linear sum of single-stain spectrums obtained from microparticles individually labeled with the fluorochromes; wherein approximation of the measurement spectrum by the linear sum of the single-stain spectrums is performed using the restricted least-square method.
    Type: Grant
    Filed: July 7, 2011
    Date of Patent: March 24, 2015
    Assignee: Sony Corporation
    Inventors: Yasunobu Kato, Yoshitsugu Sakai
  • Patent number: 8989344
    Abstract: A system and a method for measuring an ash content and a calorific value of a coal are provided. The system comprises: an X ray device, disposed over the coal and configured to emit an X ray to the coal; at least one X ray measuring device, disposed over the coal and configured to measure an energy spectrum of an X ray reflected by the coal; a distance sensor, disposed over the coal and configured to measure a distance between the coal and the at least one X ray measuring device; and a computing device, configured to receive the energy spectrum and the distance from the at least one X ray measuring device and the distance sensor and to compute the ash content and the calorific value of the coal according to the energy spectrum and the distance.
    Type: Grant
    Filed: December 20, 2012
    Date of Patent: March 24, 2015
    Assignee: Tsinghua University
    Inventors: Hongchang Yi, Qian Lin, Jianping Cheng
  • Publication number: 20150078517
    Abstract: A method of testing for impurities includes directing an x-ray source toward a surface at an angle ? relative to the plane of the surface, the surface defined by a ceramic coating over a crystalline substrate; detecting electromagnetic radiation emitted from the ceramic coating at an angle ? different from the angle ? and its supplementary angle; and comparing characteristics of the detected electromagnetic radiation to characteristics associated with impurities.
    Type: Application
    Filed: September 15, 2014
    Publication date: March 19, 2015
    Inventor: Timothy Hossain
  • Publication number: 20150051877
    Abstract: Methods and systems for performing simultaneous X-ray Fluorescence (XRF) and small angle x-ray scattering (SAXS) measurements over a desired inspection area of a specimen are presented. SAXS measurements combined with XRF measurements enables a high throughput metrology tool with increased measurement capabilities. The high energy nature of x-ray radiation penetrates optically opaque thin films, buried structures, high aspect ratio structures, and devices including many thin film layers. SAXS measurements of a particular location of a planar specimen are performed at a number of different out of plane orientations. This increases measurement sensitivity, reduces correlations among parameters, and improves measurement accuracy. In addition, specimen parameter values are resolved with greater accuracy by fitting data sets derived from both SAXS and XRF measurements based on models that share at least one material parameter. The fitting can be performed sequentially or in parallel.
    Type: Application
    Filed: August 17, 2014
    Publication date: February 19, 2015
    Inventors: Michael S. Bakeman, Andrei V. Shchegrov, Kevin Peterlinz, Thaddeus Gerard Dziura
  • Publication number: 20150021487
    Abstract: When a conventional idea of determining a setting condition from a parameter of resolution (image resolution) is changed to use an X-ray tube with a stable focus size, setting conditions are determined from a focus size ? [?m] of the X-ray tube. The minimum radiography size b [?m] is settable from the focus size ? [?m] and ??b/2. A magnification rate ? is settable from the set minimum radiography size b [?m], a pixel pitch d [?m] of an X-ray detector, and b?/d?5. Consequently, the minimum radiography size b [?m] and the magnification rate ? are each settable with use of the X-ray tube having the stable focus size ? [?m]. This results in stable radiography or fluoroscopy through magnifying an object in minute size.
    Type: Application
    Filed: July 2, 2014
    Publication date: January 22, 2015
    Inventors: Satoshi SANO, Toshiyuki SATO, Koichi TANABE, Toshinori YOSHIMUTA
  • Publication number: 20150003580
    Abstract: Sample cell assemblies containing and holding powdered, granular, paste, or liquid samples are assembled and manufactured in a way that allows them to be inexpensive enough to be disposable and configured to be attached to a fork member for providing shaking or vibrating movement to the samples for X-ray Diffraction and X-ray Fluorescence testing. The sample cell assemblies include the usage of double-sided adhesive films and spacer for sealing the component of the sample cell assemblies, and latches as locking means for locking and unlocking the cell assemblies.
    Type: Application
    Filed: June 24, 2014
    Publication date: January 1, 2015
    Applicant: Olympus Scientific Solutions of America, Inc.
    Inventors: Philippe Christian Sarrazin, Will M. Brunner, Sunil Ranganath Belligundu
  • Publication number: 20150003581
    Abstract: According to some aspects, an x-ray apparatus for imaging and/or radiation therapy is provided, the x-ray apparatus comprises an electron source capable of generating electrons, at least one first target arranged to receive electrons from the electron source, the at least one first target comprising material that, in response to being irradiated by the electrons, emits broad spectrum x-ray radiation, at least one second target arranged to receive at least some of the broad spectrum x-ray radiation, the at least one second target comprising material that, in response to irradiation by broad spectrum x-ray radiation from the first target, emits monochromatic x-ray radiation, and at least one detector positioned to detect at least some of the monochromatic x-ray radiation emitted from the at least one second target.
    Type: Application
    Filed: September 2, 2014
    Publication date: January 1, 2015
    Inventor: Eric H. Silver
  • Publication number: 20140307849
    Abstract: Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and at least one window protecting film allowing X-rays to pass through and providing protections to the window, the film being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film presently in use.
    Type: Application
    Filed: April 10, 2014
    Publication date: October 16, 2014
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INC
    Inventors: Fabrice Cancre, Ted Michael Shields, Jiawei Tan
  • Publication number: 20140294144
    Abstract: A foreign matter detector includes an X-ray source which irradiates a sample moving in a constant direction with primary X-rays, a parallel two-dimensional slit which includes a plurality of slits arranged in at least a moving direction of the sample and emits parallel secondary X-rays by extracting a parallel component of secondary X-rays generated from the sample, a dispersing element which disperses the parallel secondary X-rays to obtain a specific X-ray fluorescence, a TDI sensor which receives the X-ray fluorescence, and a control unit which controls the TDI sensor to detect a foreign matter corresponding to the X-ray fluorescence. The control unit integrates a luminance value of the X-ray fluorescence received by the TDI sensor while matching a direction and a speed of charge transfer of the TDI sensor to a direction and a speed of movement of the sample.
    Type: Application
    Filed: March 25, 2014
    Publication date: October 2, 2014
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventor: Yoshiki Matoba
  • Publication number: 20140294143
    Abstract: An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage.
    Type: Application
    Filed: March 19, 2014
    Publication date: October 2, 2014
    Applicant: Hitachi High-Tech Science Corporation
    Inventors: Hiroaki Nohara, Yoshiki Matoba, Noriaki Sakai, Toshitada Takeuchi
  • Publication number: 20140286474
    Abstract: An X-ray fluorescence analyzer includes a sample stage having an opening at an X-ray irradiation position, an X-ray source which irradiates a sample placed on the opening with a primary X-ray from below, a detector which detects an X-ray fluorescence generated from the sample, a transparent drop prevention plate supported to be advanced and retracted immediately below the opening, a drive mechanism which advances and retracts the drop prevention plate, an observation camera which observes the drop prevention plate positioned immediately below the opening, and an operation unit which processes an image of the drop prevention plate which is captured by the observation camera. The operation unit detects a foreign matter on the drop prevention plate based on an image difference between images before and after the drive mechanism moves or vibrates the drop prevention plate within an observation range of the observation camera.
    Type: Application
    Filed: March 24, 2014
    Publication date: September 25, 2014
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Masahiro Sakuta, Kiyoshi Hasegawa, Yoshiki Matoba
  • Publication number: 20140286473
    Abstract: A method for inspection includes capturing an optical image of one or more features on a surface of a sample and irradiating an area of the sample containing at least one of the features with an X-ray beam. An intensity of X-ray fluorescence emitted from the sample in response to the irradiating X-ray beam is measured. The optical image is processed so as to extract geometrical parameters of the at least one of the features and to compute a correction factor responsively to the geometrical parameters. The correction factor is applied to the measured intensity in order to derive a property of the at least one of the features.
    Type: Application
    Filed: March 23, 2014
    Publication date: September 25, 2014
    Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.
    Inventors: Alex Tokar, Alex Dikopoltsev, Isaac Mazor, Matthew Wormington
  • Patent number: 8835857
    Abstract: A device for a radiation detector includes a main body, which includes a material G and is at least partially provided with a coating. The coating has at least a first layer with a material A1. The material G of the main body can be excited by a primary radiation impinging on the coating, so that an x-ray fluorescence radiation is produced with an x-ray fluorescence spectrum, which has a maximum MG at an energy EG. Furthermore, at an energy E1, the material A1 has an absorption edge. In this case, the material A1 is chosen such that the relationships E1<EG and EG?E1?4 keV apply. Also specified is a radiation detector, which has the device and a detector element, which is suitable for the detection of the primary radiation.
    Type: Grant
    Filed: August 9, 2012
    Date of Patent: September 16, 2014
    Assignee: Ketek GmbH
    Inventor: Tobias Eggert
  • Publication number: 20140254752
    Abstract: Various embodiments of systems, components, modules, routines, and processes for luminescence based spectral measurement are described herein. In one embodiment, a method for measuring a scintillation property of a sample includes directing an ionizing radiation toward the sample, thereby inducing the sample to produce an emission. The method also includes acquiring a spectral luminescence of the produced emission by the sample, the spectral luminescence including a plurality of luminescence intensities at corresponding emission wavelengths or frequencies. The scintillation property of the sample may then be determined based on the acquired spectral luminescence.
    Type: Application
    Filed: March 6, 2014
    Publication date: September 11, 2014
    Inventor: Farida A. Selim
  • Publication number: 20140254751
    Abstract: A radiographic examination apparatus improves response to fluoroscopy or continuous shooting by changing promptly the power-output of an X-ray tube. The apparatus and method, when an absolute value of variation C per fixed time interval between the filament electric current of current pulse-output calculated by the filament electric current variation calculation element is more than a setup value, a flash control between pulse conducts increases or decreases temporarily the filament electric current between pulses to become the filament electric current on flash control between pulses calculated by a filament electric current calculation element based on a radiation condition of a current pulse-output and the radiation condition of following pulse-output.
    Type: Application
    Filed: March 7, 2013
    Publication date: September 11, 2014
    Inventor: KATSUHIRO YABUGAMI
  • Publication number: 20140205062
    Abstract: The invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.
    Type: Application
    Filed: January 18, 2013
    Publication date: July 24, 2014
    Inventors: Alan W. Hunt, J. Frank Hermon, Douglas P. Wells
  • Patent number: 8787523
    Abstract: An XRF analysis apparatus includes a housing with a source of penetrating radiation to be directed at a sample and a detector for detecting fluoresced radiation from the sample. A shield is attachable to the housing to protect the user from radiation and a safety interlock is configured to detect whether or not the shield is attached to the housing. A controller is responsive to the safety interlock, and configured to monitor usage of the source of radiation at or above a predetermined power level when the shield is not attached to the housing and provide an output signal when the monitored usage of the source of penetrating radiation at or above the predetermined power level without the shield attached to the housing exceeds one or more predetermined thresholds.
    Type: Grant
    Filed: July 1, 2011
    Date of Patent: July 22, 2014
    Assignee: Olympus NDT, Inc.
    Inventor: Don Sackett
  • Patent number: 8774356
    Abstract: In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit (11), when correcting a counting rate of pulses determined by a counting unit (10) on the basis of a dead time of a detector (7), stores beforehand a correlation between a predetermined pulse height range, within which pulses are selected by a pulse height analyzer (9), and the dead time and determines the dead time so as to correspond to the predetermined pulse height range during a measurement on the basis of the stored correlation.
    Type: Grant
    Filed: April 3, 2012
    Date of Patent: July 8, 2014
    Assignee: Rigaku Corporation
    Inventors: Yoshiyuki Kataoka, Hisashi Inoue, Kosuke Kawakyu