Composition Analysis Patents (Class 378/88)
  • Publication number: 20120123697
    Abstract: A device for identifying a material of an object including: a source of X photons, and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming a scattering angle. Further, a mechanism adjusts position between the source, the detector, and the object for volume to be at different depths with a constant angle, and a mechanism processes the two magnitudes in two positions and the energy in one position to calculate an attenuation coefficient for estimating the density of the material.
    Type: Application
    Filed: July 19, 2010
    Publication date: May 17, 2012
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT
    Inventors: Elisa Fabiani, Jean Rinkel, Joachim Tabary, Jean-Marc Dinten
  • Publication number: 20120106707
    Abstract: The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.
    Type: Application
    Filed: December 2, 2011
    Publication date: May 3, 2012
    Inventors: Simon Billinge, Kenneth Shankland, Norman Shankland, Alastair Florence
  • Patent number: 8160201
    Abstract: The aim of the method is to characterize an element (21) comprising a plurality of superposed layers separated from one another by interfaces. It comprises at least the following steps: The element (21) is illuminated with radiation (15) emitted by a source (13); radiation (23) transmitted through the element (21) is collected on a detector (17), this transmitted radiation forming an experimental image of the element (21) on the detector (17), the detector (17) being placed at such a distance from the element (21) that interference fringes appear on the experimental image at the interfaces between the layers; and an approximate value of at least one physical characteristic of at least one given layer is determined by calculation from the experimental image, the determination step being implemented by minimizing the difference between the experimental image and a simulated image of at least part of the experimental image of the element (21).
    Type: Grant
    Filed: July 18, 2007
    Date of Patent: April 17, 2012
    Assignee: Areva NP
    Inventors: Julien Banchet, David Tisseur
  • Patent number: 8149988
    Abstract: Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.
    Type: Grant
    Filed: March 25, 2010
    Date of Patent: April 3, 2012
    Assignee: Passport Systems, Inc.
    Inventors: William Bertozzi, Robert J. Ledoux
  • Patent number: 8119991
    Abstract: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.
    Type: Grant
    Filed: August 12, 2010
    Date of Patent: February 21, 2012
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventor: Dale A Harrison
  • Patent number: 8094783
    Abstract: A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material.
    Type: Grant
    Filed: October 2, 2009
    Date of Patent: January 10, 2012
    Assignee: Morpho Detection, Inc.
    Inventor: Geoffrey Harding
  • Publication number: 20120002788
    Abstract: The present invention discloses an article inspection device, comprising: a x-ray machine, a collimation unit, a transmission detector array and at least one scattering detector array. Each of the at least one scattering detector array comprising a plurality of same scattering detector modules arranged in a matrix of i-rows and j-columns. A transmission cross section of the article transmitted by the x-rays is divided into a plurality of same sub-regions arranged in a matrix of i-rows and j-columns. The plurality of scattering detector modules arranged in i-rows and i-columns correspond to the plurality of sub-regions arranged in i-rows and j-columns one by one for detecting pair production effect annihilation photons and Compton-effect scattering photons from the respective sub-regions.
    Type: Application
    Filed: December 29, 2010
    Publication date: January 5, 2012
    Inventors: Yigang Yang, Tiezhu Li, Qinjian Zhang, Yi Zhang, Yingkang Jin, Qinghao Chen, Yuanjing Li, Yinong Liu
  • Publication number: 20110305318
    Abstract: An apparatus and method are described for obtaining radiation interaction data from an object to enable better determination of the composition of the object. A radiation source and a radiation detector system are used to collect both transmitted and scattered radiation, preferably including radiation from at least one forward scatter mode. The detector system is capable of detecting and collecting spectroscopically resolvable information about incident radiation. Each intensity dataset is resolved across at least three of energy bands within the spectrum of the source, and this data may then be processed numerically to enable better determination of the composition of the object.
    Type: Application
    Filed: December 14, 2009
    Publication date: December 15, 2011
    Inventor: Max Robinson
  • Patent number: 8071938
    Abstract: Systems, methods and computer program products for the multi-modal detection of particles are described herein. An embodiment of the present invention is a particle detector that includes a first chamber wherein analyte particles are subjected to a first particle detection mechanism, and a second chamber coupled to the first chamber, wherein the analyte particles are subjected to a second particle detection mechanism, and wherein the detection characteristics of second particle detection mechanism are orthogonal to detection characteristics of the first particle detection mechanism.
    Type: Grant
    Filed: March 20, 2008
    Date of Patent: December 6, 2011
    Assignee: The Mitre Corporation
    Inventor: Samar K. Guharay
  • Patent number: 8068583
    Abstract: Provided is an X-ray analysis apparatus including: an X-ray tubular bulb for irradiating a sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray and outputting a signal containing energy information on the characteristic X-ray and the scattered X-ray; an analyzer for analyzing the signal; a sample stage capable of moving an irradiation point relatively with respect to the sample within a mapping area set in advance; and an X-ray mapping processing section for discriminating an X-ray intensity corresponding to a specific element, determining an intensity contrast in which a color or lightness is changed in accordance with the X-ray intensity, and for performing image display at a position corresponding to the irradiation point, in which the X-ray mapping processing section determines the intensity contrast of the X-ray intensity at the irradiation point by setting in advance the X-ray intensity discriminated as to a reference material in which a component el
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: November 29, 2011
    Assignee: SII Nanotechnology Inc.
    Inventors: Yoshiki Matoba, Kanji Nagasawa
  • Patent number: 8041007
    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
    Type: Grant
    Filed: October 14, 2009
    Date of Patent: October 18, 2011
    Assignee: Passport Systems, Inc.
    Inventors: Robert J. Ledoux, William Bertozzi
  • Publication number: 20110243306
    Abstract: A method for detecting the presence of a chemical element in an object by emission of neutrons onto the object, characterized in that the emission of neutrons onto the object is constituted, firstly, by a continuous emission of neutrons originating from an associated particle neutron generator (G1) and, secondly, by an emission of neutron pulses which are superimposed on the continuous emission of neutrons, where the neutron pulses originate from a pulsed neutron generator (G2) which generates neutron pulses of pulse duration T2, where two successive neutron pulses are separated by a duration T4, and where the continuous and pulsed emissions of neutrons on to the object produce a gamma capture radiation and an inelastic gamma radiation.
    Type: Application
    Filed: December 14, 2009
    Publication date: October 6, 2011
    Inventors: Cedric Carasco, Bertrand Perot
  • Patent number: 8023618
    Abstract: The broadening of the lines in NRF from an isotope that is part of a material may be due to several causes: the temperature of the material, the molecular structure of the material and the crystalline structure of the material. By measuring the broadening caused by the molecular structure and the crystalline structure the material itself can be identified. The exact energy of the lines in NRF may also depend on the nature of the crystalline and molecular structure of the material. By measuring the changes in the energy of the NRF lines caused by the structure of the material the material itself may be identified. These techniques provide a “fingerprint” of the molecule or crystal that is involved. The fingerprint information may be used to determine a potential threat.
    Type: Grant
    Filed: December 12, 2008
    Date of Patent: September 20, 2011
    Assignee: Passport Systems, Inc.
    Inventors: William Bertozzi, Robert J. Ledoux
  • Patent number: 8019048
    Abstract: A window arrangement on a pressure pipe, with a casing in the train or at the end of the pressure pipe, said casing featuring flanges on diametrically opposing sides having radially directed passages, whose axes are standing perpendicular to the longitudinal axis of the pressure pipe and are located in a measurement plane for an x-ray measurement device, an x-ray source being associated to the one passage on the outer side and a receiver sensitive to X-rays to the other passage, and with window plates that are transmissive for X-rays which are sealingly arranged in the associated passage and are fixed in the passage with the aid of a fastening member and which consist of a material which is resistant against high temperatures and process-due etchings by chemically aggressive substances.
    Type: Grant
    Filed: August 14, 2009
    Date of Patent: September 13, 2011
    Assignee: Sikora AG
    Inventors: Harald Sikora, Ralf Seidel
  • Patent number: 8010365
    Abstract: The present invention relates particularly to a method and system for integrating an interactive voice response (IVR) environment into an existing host processing system to provide automated telephone responses to callers to the host system. The integrated IVR environment is highly scaleable with hardware and software open to the host system for in-house modification and/or addition of components and applications to accommodate additional and/or modified host business logic, host applications, and other host requirements. The integrated IVR environment also alleviates the high cost often associated with the purchase, installation, and maintenance of the IVR functionality for a host processing system.
    Type: Grant
    Filed: March 22, 2010
    Date of Patent: August 30, 2011
    Assignee: The Travelers Indemnity Company
    Inventors: Dean Collins, Kathleen D'Auria, Raul Matamoros
  • Patent number: 8000439
    Abstract: An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information of the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a first observation system which optically observes a surface of the sample in order to determine the irradiation point, and a second observation system which has a smaller depth of field than the first observation system, optically observes a narrow region, and measures the distance from the determined irradiation point by focus adjustment are included.
    Type: Grant
    Filed: August 20, 2009
    Date of Patent: August 16, 2011
    Assignee: SII NanoTechnology Inc.
    Inventor: Yoshiki Matoba
  • Patent number: 8000444
    Abstract: A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle scattered X-ray diffraction, and in-plane X-ray diffraction, etc.
    Type: Grant
    Filed: July 4, 2006
    Date of Patent: August 16, 2011
    Assignee: Rigaku Corporation
    Inventor: Yoshio Iwasaki
  • Patent number: 7970101
    Abstract: An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included.
    Type: Grant
    Filed: August 20, 2009
    Date of Patent: June 28, 2011
    Assignee: SII Nanotechnology Inc.
    Inventors: Noriaki Sakai, Toshiyuki Takahara, Yoshiki Matoba
  • Publication number: 20110135990
    Abstract: Disclosed is a sodium secondary battery. The sodium secondary battery comprises a first electrode and a second electrode comprising a carbonaceous material. The carbonaceous material satisfies one or more requirements selected from the group consisting of requirements 1, 2, 3 and 4. Requirement 1: R value (=ID/IG) obtained by Raman spectroscopic measurement is 1.07 to 3. Requirement 2: A value and ?A value obtained by small angle X-ray scattering measurement are ?0.5 to 0 and 0 to 0.010, respectively. Requirement 3: for an electrode comprising an electrode mixture obtained by mixing 85 parts by weight of the carbonaceous material with 15 parts by weight of poly(vinylidene fluoride), the carbonaceous material in the electrode after being doped and dedoped with sodium ions is substantially free from pores having a size of not less than 10 nm. Requirement 4: Q1 value obtained by a calorimetric differential thermal analysis is not more than 800 joules/g.
    Type: Application
    Filed: July 29, 2009
    Publication date: June 9, 2011
    Applicant: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Taketsugu Yamamoto, Hideaki Nakajima, Hiroshi Inukai, Shigekazu Ohmori, Chikara Murakami, Daisuke Nakaji, Hidekazu Yoshida, Maiko Saka
  • Publication number: 20110135061
    Abstract: The invention relates to a method and to an apparatus for analyzing nanoparticles, wherein the nanoparticles are first fractionated as a function of their particle size and subsequently analyzed, wherein small angle X-ray scattering is used for the analysis of the nanoparticles, and to a corresponding apparatus for carrying out the method according to the invention. The analysis by means of small angle X-ray scattering comprises the focussing of X-radiation onto the nanoparticles to be analyzed by means of a slit collimator and the analysis of the nanoparticles using a detector-to-sample distance of less than 50 cm.
    Type: Application
    Filed: May 20, 2009
    Publication date: June 9, 2011
    Inventor: Andreas Thünemann
  • Publication number: 20110129066
    Abstract: A method and apparatus for quantitative analysis of a material in which an electron beam is caused to impinge upon the material are described. The method comprises detecting low loss electrons (LLEs) received from a first region of the material due to interaction with the electron beam and generating corresponding LLE data. The method further comprises detecting x-rays received from a second region of the material due to interaction with the electron beam and generating corresponding x-ray data, wherein the first and second regions overlap, and analysing the LLE data together with the x-ray data so as to generate compositional data representative of the composition of the first region.
    Type: Application
    Filed: June 20, 2008
    Publication date: June 2, 2011
    Inventors: Peter John Statham, Ian Richard Barkshire
  • Patent number: 7949097
    Abstract: The scattered intensity of photons from the nuclear Pygmy Resonance taken in conjunction with the scattered intensity at lower energies provides a signal that is sensitive to the nature of the nuclear species doing the scattering. Highly enriched uranium and depleted uranium can be distinguished by this signal from other materials. Other nuclei can also be distinguished and identified. Methods and apparatus for employing the phenomenon to identify or assist in the identification of materials are disclosed.
    Type: Grant
    Filed: December 30, 2008
    Date of Patent: May 24, 2011
    Assignee: Passport Systems, Inc.
    Inventors: William Bertozzi, Robert J. Ledoux
  • Publication number: 20110106455
    Abstract: The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.
    Type: Application
    Filed: May 28, 2010
    Publication date: May 5, 2011
    Inventors: Simon Billinge, Kenneth Shankland, Norman Shankland, Alastair Florence
  • Patent number: 7924979
    Abstract: A system and methods for characterizing an inspected object on the basis of attenuation determined from pair-wise illuminated voxels. A beam of penetrating radiation characterized by a propagation direction and an energy distribution is scanned relative to an object, while scatter detectors with collimated fields-of-view detect radiation scattered by each voxel of the inspected object that is intercepted by the incident beam of penetrating radiation. By calculating the attenuation of penetrating radiation between pairs of voxels illuminated sequentially by the incident beam, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of various material characteristics.
    Type: Grant
    Filed: September 1, 2009
    Date of Patent: April 12, 2011
    Assignee: American Science and Engineering, Inc.
    Inventor: Peter J. Rothschild
  • Publication number: 20110081003
    Abstract: A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material.
    Type: Application
    Filed: October 2, 2009
    Publication date: April 7, 2011
    Inventor: Geoffrey Harding
  • Publication number: 20110075808
    Abstract: Systems and methods for inspecting an object with a scanned beam of penetrating radiation. Scattered radiation from the beam is detected, in either a backward or forward direction. Characteristic values of the scattered radiation are compared to expected reference values to characterize the object. Additionally, penetrating radiation transmitted through the inspected object may be combined with scatter information. In certain embodiments, the inspected field of view is less than 0.1 steradians, and the detector is separate from the source of penetrating radiation and is disposed, with respect to the object, such as to subtend greater than 0.5 steradians in the field of view of the object.
    Type: Application
    Filed: September 28, 2010
    Publication date: March 31, 2011
    Applicant: AMERICAN SCIENCE AND ENGINEERING, INC.
    Inventors: Peter J. Rothschild, Jeffrey R. Schubert, Richard L. Schueller
  • Publication number: 20110064200
    Abstract: Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.
    Type: Application
    Filed: March 25, 2010
    Publication date: March 17, 2011
    Applicant: Passport Systems, Inc.
    Inventors: William Bertozzi, Robert J. Ledoux
  • Publication number: 20110017917
    Abstract: An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a given subject. A positioner provides for relative motion of each beam vis-à-vis the subject in a motion, the vertical component of which is one-way. A detector receives radiation produced by at least one of the sources after the radiation interacts with the subject.
    Type: Application
    Filed: October 4, 2010
    Publication date: January 27, 2011
    Applicant: AMERICAN SCIENCE AND ENGINEERING, INC.
    Inventors: Richard Mastronardi, Dean Fleury, Jeffrey R. Schubert, Joseph DiMare, Richard Schueller, Alexander Chalmers
  • Publication number: 20100329424
    Abstract: A method for operating an X-ray diffraction imaging (XDI) system to scan an object includes generating an X-ray beam from at least one source focus at a first focus location, and receiving first scatter radiation at a first scatter angle at a scatter detector. The first scatter radiation is produced when the X-ray beam interacts with the object. The method further includes displacing the at least one source focus from the first focus location to a second focus location, generating a displaced X-ray beam from the at least one source focus at the second focus location, and receiving second scatter radiation at a second scatter angle at the scatter detector. The second scatter radiation is produced when the displaced X-ray beam interacts with the object. An identification of the object based on one of the first scatter radiation and the second scatter radiation is output.
    Type: Application
    Filed: June 30, 2009
    Publication date: December 30, 2010
    Inventors: Geoffrey Harding, Stephan Olesinski, Dirk Kosciesza, Helmut Rudolf Otto Strecker
  • Publication number: 20100305873
    Abstract: Embodiments of the invention pertain to a method and apparatus for spectral deconvolution of detector spectra. In a specific embodiment, the method can be applied to sodium iodide scintillation detector spectra. An adaptive chi-processed (ACHIP) denoising technique can be used to remove the results of stochastic noise from low-count detector spectra. Embodiments of the ACHIP denoising algorithm can be used as a stand alone tool for rapid processing of one dimensional data with a Poisson noise component. In a specific embodiment, the denoising technique can be combined with the spectral deconvolution method. Embodiments of the denoising technique and embodiments of the deconvolution method can be applied to any detector material that provides a radiation spectrum. Specific embodiments can incorporate one or more of the following for spectral deconvolution: denoising, background subtraction, detector response function generation, and subtraction of detector response functions.
    Type: Application
    Filed: September 12, 2008
    Publication date: December 2, 2010
    Inventors: Glenn Sjoden, Eric LaVigne, James Baciak, Rebecca Detwiler
  • Patent number: 7831019
    Abstract: A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line.
    Type: Grant
    Filed: December 28, 2007
    Date of Patent: November 9, 2010
    Assignee: Morpho Detection, Inc.
    Inventor: Geoffrey Harding
  • Patent number: 7809104
    Abstract: An imaging system that can form an image of an item under inspection using scattered radiation. A pencil beam of radiation is steered over the item under inspection and scattered radiation is detected. Regions of the item under inspection from which radiation is scattered are resolved in three dimensions using two-dimensional coordinates to which the pencil beam is steered. The third dimension is resolved using time of flight from the source. Because the inspection system can be located on one side of an item under inspection, an item may be imaged from a long distance and the imaging system may be mounted on a moving vehicle, making the imaging system well suited for use in many security inspection systems to detect explosives and other contraband items.
    Type: Grant
    Filed: November 13, 2006
    Date of Patent: October 5, 2010
    Assignee: L-3 Communications Security and Detection Systems Inc.
    Inventor: Andrew D. Foland
  • Patent number: 7809109
    Abstract: An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a subject. A positioner provides for synchronized relative motion of each carriage vis-à-vis the subject in a direction having a vertical component. A detector receives radiation produced by at least one of the sources after the radiation interacts with the subject.
    Type: Grant
    Filed: November 17, 2008
    Date of Patent: October 5, 2010
    Assignee: American Science and Engineering, Inc.
    Inventors: Richard Mastronardi, Dean Fleury, Jeffrey R. Schubert, Joseph DiMare, Richard Schueller, Alexander Chalmers
  • Publication number: 20100236776
    Abstract: A method and system for determining a property of a sample of fluid in a borehole. A fluid sample is collected in a downhole tool. While collecting, X-rays are transmitted proximate the fluid from an X-ray source in the tool and an X-ray flux that is a function of a property of the fluid is detected. The detected X-ray flux data is processed to determine the property of the fluid.
    Type: Application
    Filed: November 13, 2008
    Publication date: September 23, 2010
    Applicant: HALLIBURTON ENERGY SERVICES, INC.
    Inventors: Ronald L. Spross, Jerome Allen Truax, Paul F. Rodney, Daniel David Gleitman
  • Patent number: 7796734
    Abstract: An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a subject. A positioner provides for synchronized relative motion of each carriage vis-á-vis the subject in a direction having a vertical component. A detector receives radiation produced by at least one of the sources after the radiation interacts with the subject.
    Type: Grant
    Filed: January 14, 2010
    Date of Patent: September 14, 2010
    Assignee: American Science and Engineering, Inc.
    Inventors: Richard Mastronardi, Dean Fleury, Jeffrey R. Schubert, Joseph DiMare, Richard Schueller, Alexander Chalmers
  • Patent number: 7787589
    Abstract: Methods for in vivo measurement of lead or other trace elements in bone by x-ray fluorescence (XRF) without independent measurement of underlying tissue thickness are disclosed. In one method, the lead concentration is calculated based on the intensity of a first characteristic fluoresced peak and a function having as an argument the intensity ratio of first and second characteristic fluoresced peaks, with at least one parameter of the function being empirically determined by measurements of calibration phantoms having differing thicknesses of tissue surrogate material. In another method, the lead concentration is measured by estimating tissue thickness based on the intensity of the Compton scattering peak, or ratio of Compton/Rayleigh intensities, and the intensity of a characteristic fluoresced x-ray peak corrected for attenuation by tissue of the estimated thickness. Also disclosed is a method for determining the calcium concentration and density of bone based on XRF spectrum data.
    Type: Grant
    Filed: April 30, 2009
    Date of Patent: August 31, 2010
    Assignee: Thermo Niton Analyzers LLC
    Inventor: Lee Grodzins
  • Patent number: 7778783
    Abstract: A substance analyzer utilizing Prompt Gamma Neutron Activation Analysis for identifying characteristics of a substance and method of manufacturing the same are disclosed. The analyzer is small enough to be portable and to allow its use in many applications where current analyzers cannot be utilized. The analyzer uses a neutron radiation source and a gamma-ray detector to activate the sample material and detect the prompt gamma rays emitted by the sample material. A novel housing for such an analyzer and method for making the housing are also described. Novel methods of operating such an analyzer including via a communications network are also disclosed. Also disclosed are data analysis methods that improve the accuracy and sensitivity of the results of such material analysis.
    Type: Grant
    Filed: December 18, 2006
    Date of Patent: August 17, 2010
    Assignee: Sabia, Inc.
    Inventors: Clinton L. Lingren, David B. Cook, James F. Miller, Stephen J. Foster
  • Patent number: 7764764
    Abstract: A method, a processor, and a system for identifying a substance are described. The method includes identifying a substance based on a plurality of integrated intensities of a plurality of X-ray diffraction profiles.
    Type: Grant
    Filed: December 28, 2007
    Date of Patent: July 27, 2010
    Assignee: Morpho Detection, Inc.
    Inventor: Geoffrey Harding
  • Patent number: 7742564
    Abstract: Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a single monochromator crystal in a predetermined position to directly intercept the first X-ray beam such that a second X-ray beam having a predetermined energy level is produced. Further, an object can be positioned in the path of the second X-ray beam for transmission of the second X-ray beam through the object and emission from the object as a transmitted X-ray beam. The transmitted X-ray beam can be directed at an angle of incidence upon a crystal analyzer. Further, an image of the object can be detected from a beam diffracted from the analyzer crystal.
    Type: Grant
    Filed: January 24, 2007
    Date of Patent: June 22, 2010
    Assignees: The University of North Carolina at Chapel Hill, Brookhaven Science Associates, The University of Saskatchewan
    Inventors: Christopher Parham, Zhong Zhong, Etta Pisano, Dean Connor, Leroy D. Chapman
  • Patent number: 7738631
    Abstract: A specimen inspection system includes a photon source for outputting photons along a transmission path and a conveyor for translating a specimen completely through the transmission path. A radiation detector is positioned offset with respect to the transmission path for detecting photons that are scattered from the transmission path in response to interaction with the specimen passing therethrough. A controller determines from the detected scattered photons that a first material is present in the specimen.
    Type: Grant
    Filed: June 15, 2006
    Date of Patent: June 15, 2010
    Assignee: Endicott Interconnect Technologies, Inc.
    Inventor: David S. Rundle
  • Patent number: 7705294
    Abstract: An apparatus for recording and displaying images of and identifying material types in a target object in a fluid carrying conduit includes a downhole unit. The downhole unit includes a controllable light source, the controllable light source structured to emit high energy photons. The downhole unit further includes a sensor unit structured to detect the high energy photons that are backscattered from the target object and to generate signals in response to the detected high energy photons. The apparatus also includes a control and display unit that includes a signal transmitter and a viewing screen structured to display at least one two-dimensional image that is generated using the signals from the sensor unit.
    Type: Grant
    Filed: March 17, 2009
    Date of Patent: April 27, 2010
    Assignee: VisuRay AS
    Inventors: Einar Ramstad, Phil Teague
  • Patent number: 7693261
    Abstract: A method and apparatus for obtaining radiation transmission data including providing a radiation source, e.g., x-ray or gamma-ray source, and a radiation detector system, e.g., x-ray or gamma-ray detection system, spaced therefrom to define a scanning zone therebetween, the detector system capable of detecting and collecting spectroscopically resolvable information about incident radiation. Collecting a dataset of information about radiation incident including transmissivity of an object in the scanning zone at at least one scanning position from radiation transmitted through the object and received at the detector system. Resolving each dataset spectroscopically across a plurality of frequency bands within the spectrum of the source; at least one of the frequency bands corresponding to a characteristically scattered wavelength of a target species to be identified.
    Type: Grant
    Filed: May 16, 2008
    Date of Patent: April 6, 2010
    Assignee: Durham Scientific Crystals Limited
    Inventors: Max Robinson, Arnab Basu
  • Patent number: 7693262
    Abstract: Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.
    Type: Grant
    Filed: August 1, 2008
    Date of Patent: April 6, 2010
    Assignee: Passport Systems, Inc.
    Inventors: William Bertozzi, Robert J. Ledoux
  • Patent number: 7680243
    Abstract: A method for analyzing a sample includes directing one or more beams of X-rays to impinge on an area of a surface of the sample on which a layer of nano-particles of a selected element has been formed. Secondary X-ray radiation from the area is detected responsively to the one or more beams. A distribution of the nano-particles on the surface is characterized based on the detected radiation.
    Type: Grant
    Filed: September 6, 2007
    Date of Patent: March 16, 2010
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventors: Boris Yokhin, Alexander Tokar, Alexander Krokhmal, Asher Peled, Dileep Agnihotri
  • Publication number: 20100061514
    Abstract: A method for developing a secondary collimator is described. The method includes orienting a plurality of collimator elements in a plane such that a gap is defined between a first collimator element and a second collimator element. The first collimator element has a first curved end, and the first curved end faces the second collimator element across the gap.
    Type: Application
    Filed: September 12, 2006
    Publication date: March 11, 2010
    Inventor: Geoffrey Harding
  • Publication number: 20100027749
    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
    Type: Application
    Filed: October 14, 2009
    Publication date: February 4, 2010
    Applicant: Passport Systems, Inc.
    Inventors: Robert J. Ledoux, William Bertozzi
  • Patent number: 7647189
    Abstract: A method and a device are provided for inspection of liquid articles to determine the presence of drugs concealed in the liquid articles without opening the outer packages. The method includes emitting radiation beams having a single energy to transmit through the liquid article; receiving the radiation beams transmitted through the liquid article to get multi-angle projection data; inversely operating the multi-angle projection data based on the uniformity of the liquid article to obtain an attribute value of the inspected liquid article; retrieving a reference attribute value in a pre-created database by using the identification information of the liquid article as an index, and calculating a difference between the calculated attribute value and the reference attribute value; and determining whether the difference is larger than a predefined threshold value.
    Type: Grant
    Filed: April 9, 2008
    Date of Patent: January 12, 2010
    Assignees: Tsinghua University, Nuctech Company Limited
    Inventors: Kejun Kang, Zhiqiang Chen, Haifeng Hu, Yuanjing Li, Li Zhang, Yinong Liu, Xuewu Wang, Lijun Qiu, Hong Zhang
  • Patent number: 7634058
    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
    Type: Grant
    Filed: September 12, 2007
    Date of Patent: December 15, 2009
    Assignee: Passport Systems, Inc.
    Inventors: Robert J. Ledoux, William Bertozzi
  • Publication number: 20090279666
    Abstract: The scattered intensity of photons from the nuclear Pygmy Resonance taken in conjunction with the scattered intensity at lower energies provides a signal that is sensitive to the nature of the nuclear species doing the scattering. Highly enriched uranium and depleted uranium can be distinguished by this signal from other materials. Other nuclei can also be distinguished and identified. Methods and apparatus for employing the phenomenon to identify or assist in the identification of materials are disclosed.
    Type: Application
    Filed: December 30, 2008
    Publication date: November 12, 2009
    Applicant: Passport Systems, Inc.
    Inventors: William Bertozzi, Robert J. Ledoux
  • Publication number: 20090238333
    Abstract: Non invasive in-vivo measurement of composition of a tissue within a part of a human or animal subject is carried out by detecting a Raman spectral characteristic in light scattered through the part using a transmission, rather than a backscattering geometry. The technique is applied to the detection of calcifications in human breast tissues.
    Type: Application
    Filed: April 5, 2007
    Publication date: September 24, 2009
    Applicant: THE SCIENCE AND TECHNOLOGY FACILITIES COUNCIL
    Inventors: Pavel Matousek, Anthony William Parker, Nicholas Stone