Composition Analysis Patents (Class 378/88)
  • Patent number: 7592591
    Abstract: An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for analysis points having different compositions in a case where the numerous analysis points having the plural compositions are analyzed by WDS (wavelength-dispersive X-ray spectrometer). At each analysis point, the analyzer performs quantitative analysis using EDS (energy-dispersive X-ray spectrometer) permitting easy and quick analysis. Based on the results, chemical compounds are identified. If the results indicate that there is any new compound, analytical conditions adapted for the new compound are selected. If the new compound is already registered in a database, the analytical conditions are read from the database. Then, quantitative analysis is performed using WDS.
    Type: Grant
    Filed: April 9, 2007
    Date of Patent: September 22, 2009
    Assignee: Jeol Ltd.
    Inventor: Satoshi Notoya
  • Patent number: 7593506
    Abstract: A system and method for inspecting an object with multiple sources of substantially coplanar penetrating radiation. Irradiation of the inspected object by the sources is temporally sequenced such that the source of detected scattered radiation is unambiguous. Thus, multiple views of the inspected object may be obtained and image quality may be enhanced.
    Type: Grant
    Filed: July 10, 2008
    Date of Patent: September 22, 2009
    Assignee: American Science and Engineering, Inc.
    Inventor: W. Randall Cason
  • Patent number: 7587026
    Abstract: A method for determining a type of a substance is described. The method includes determining a packing fraction of the substance from a molecular interference function.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: September 8, 2009
    Assignee: General Electric Company
    Inventor: Geoffrey Harding
  • Publication number: 20090175412
    Abstract: Systems and methods for detecting clandestine fissile or radioactive material on the basis of emitted radiation and particles (such as neutrons and alpha particles) arising from within the material. Emission by the fissile or radioactive material is detected in conjunction with a conventional x-ray imaging system that includes an external source of illuminating penetrating radiation, at least one detector configured to detect at least the penetrating radiation and to generate a detector signal, and a processor configured as a detector signal discriminator to generate an output indicating whether the detector signal is triggered by an origin other than illuminating penetrating radiation. Active and passive modes of detection are described by some embodiments. Other embodiments are directed toward neutron detection, gamma ray detection with energy resolution, and designs of detectors to enhance the detection of clandestine nuclear material.
    Type: Application
    Filed: September 26, 2008
    Publication date: July 9, 2009
    Applicant: AMERICAN SCIENCE AND ENGINEERING, INC.
    Inventors: Lee Grodzins, Peter Rothschild, William L. Adams
  • Publication number: 20090175415
    Abstract: An apparatus for recording and displaying images of and identifying material types in a target object in a fluid carrying conduit includes a downhole unit. The downhole unit includes a controllable light source, the controllable light source structured to emit high energy photons. The downhole unit further includes a sensor unit structured to detect the high energy photons that are backscattered from the target object and to generate signals in response to the detected high energy photons. The apparatus also includes a control and display unit that includes a signal transmitter and a viewing screen structured to display at least one two-dimensional image that is generated using the signals from the sensor unit.
    Type: Application
    Filed: March 17, 2009
    Publication date: July 9, 2009
    Applicant: VisuRay AS
    Inventors: Einar Ramstad, Phil Teague
  • Publication number: 20090168958
    Abstract: A scanner includes a transmission detector, an x-ray source positioned to emit a beam of x-rays toward the transmission detector, and a scatter detector positioned to receive x-rays scattered from the beam of x-rays by an object. The scanner includes a computer programmed to receive data from the transmission detector and from the scatter detector, and determine a material composition of the object based on the data received from the transmission and scatter detectors.
    Type: Application
    Filed: October 27, 2008
    Publication date: July 2, 2009
    Inventors: Cristina Francesca Cozzini, Marko Klaus Baller, Geoffrey Harding
  • Patent number: 7551718
    Abstract: Methods for characterizing an inspected object on the basis of attenuation determined from pair-wise illuminated voxels. A beam of penetrating radiation characterized by a propagation direction and an energy distribution is scanned across an object, while scatter detectors with collimated fields-of-view detect radiation scattered by each voxel of the inspected object that is intercepted by the incident beam of penetrating radiation. By calculating the attenuation of penetrating radiation between pairs of voxels of incidence of the incident beam, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of various material characteristics.
    Type: Grant
    Filed: August 22, 2007
    Date of Patent: June 23, 2009
    Assignee: American Science and Engineering, Inc.
    Inventor: Peter J. Rothschild
  • Publication number: 20090147920
    Abstract: The present invention utilizes novel laser-based, high-brightness, high-spatial-resolution, pencil-beam sources of spectrally pure hard x-ray and gamma-ray radiation to induce resonant scattering in specific nuclei, i.e., nuclear resonance fluorescence. By monitoring such fluorescence as a function of beam position, it is possible to image in either two dimensions or three dimensions, the position and concentration of individual isotopes in a specific material configuration. Such methods of the present invention material identification, spatial resolution of material location and ability to locate and identify materials shielded by other materials, such as, for example, behind a lead wall. The foundation of the present invention is the generation of quasimonochromatic high-energy x-ray (100's of keV) and gamma-ray (greater than about 1 MeV) radiation via the collision of intense laser pulses from relativistic electrons. Such a process as utilized herein, i.e.
    Type: Application
    Filed: September 26, 2006
    Publication date: June 11, 2009
    Inventors: Christopher P.J. Barty, Frederic V. Hartemann, Dennis P. McNabb, Jason A. Pruet
  • Publication number: 20090116617
    Abstract: An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a subject. A positioner provides for synchronized relative motion of each carriage vis-à-vis the subject in a direction having a vertical component. A detector receives radiation produced by at least one of the sources after the radiation interacts with the subject.
    Type: Application
    Filed: November 17, 2008
    Publication date: May 7, 2009
    Applicant: AMERICAN SCIENCE AND ENGINEERING, INC.
    Inventors: Richard Mastronardi, Dean Fleury, Jeffrey R. Schubert, Joseph DiMare, Richard Schueller, Alexander Chalmers
  • Patent number: 7529341
    Abstract: Method and apparatus are provided for combining information obtained from CT and Coherent Scatter Computed Tomography to better determine whether there are dangerous materials in the baggage or not. Hence, the attenuation coefficient and the diffraction pattern of the item of baggage are used to determine whether the baggage should be cleared.
    Type: Grant
    Filed: February 10, 2004
    Date of Patent: May 5, 2009
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Jens-Peter Schlomka, Geoffrey Harding, Bernd Schreiber
  • Publication number: 20090091740
    Abstract: Methods and systems for the analysis of solid materials are disclosed. The present invention comprises x-ray and Raman analytical techniques and systems which facilitate the rapid characterization of a plurality of solid samples.
    Type: Application
    Filed: April 14, 2005
    Publication date: April 9, 2009
    Applicant: TransForm Pharmaceuticals, Inc.
    Inventors: Nathan Kane, Michael MacPhee, Mark Oliveira
  • Publication number: 20090074142
    Abstract: Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.
    Type: Application
    Filed: August 1, 2008
    Publication date: March 19, 2009
    Inventors: William Bertozzi, Robert J. Ledoux
  • Patent number: 7486760
    Abstract: An imaging system for generating a diffraction profile is described. The imaging system includes a gantry including an x-ray imaging system configured to generate an x-ray image of a substance and a scatter system configured to generate a diffraction profile of the substance.
    Type: Grant
    Filed: August 15, 2006
    Date of Patent: February 3, 2009
    Assignee: GE Security, Inc.
    Inventor: Geoffrey Harding
  • Patent number: 7456399
    Abstract: A method comprising obtaining a first set of spectral data for a first sample film measured by a first system, extracting intensities for one or more elemental species associated with the first sample film to provide a first set of extracted intensities using a function, and determining a first quantitative characteristic associated with the first sample film using the first set of extracted intensities. Next, obtain a second set of spectral data measured for a comparable sample film measured by a second photoelectron spectroscopy system. Next, apply the same function and continually adjust the function to extract intensities for the respective elemental species associated with the comparable sample film to provide a second set of corrected-extracted intensities. A second quantitative characteristic for the comparable sample is determined. The function is continually adjusted until the determined second quantitative characteristic closely or substantially matches the first quantitative characteristic.
    Type: Grant
    Filed: March 30, 2006
    Date of Patent: November 25, 2008
    Assignee: ReVera Incorporated
    Inventor: Eric J. Soderstrom
  • Patent number: 7456393
    Abstract: A device is provided for testing surfaces of a card for the presence of explosives, drugs or other substances of interest. The device includes a slot for receiving the card. Thin metallic wiper blades are dispose in alignment with the slot and wipe over surfaces of the card as the card is passed through the slot. Thus, substances on the surface of the card are transferred to the wiper blade. The wiper blade then is enclosed and rapidly heated to desorb the material retrieved from the card. The enclosure then is placed in communication with a detector to test for the presence of substances of interest.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: November 25, 2008
    Assignee: GE Homeland Protection, Inc.
    Inventor: Joseph D. Napoli
  • Publication number: 20080205598
    Abstract: In a CSCT material identification apparatus CT-information and differential scatter cross-sections are used for material identification. According to an aspect of the present invention, a material identification is provided which uses both the differential and the total scatter cross-sections. This may yield an improved material discrimination, i.e. a better detection rate and a lower false alarm rate.
    Type: Application
    Filed: January 10, 2006
    Publication date: August 28, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Udo Van Stevendaal, Jens-Peter Schlomka
  • Patent number: 7418073
    Abstract: The invention relates to a computed tomography method in which an examination zone is irradiated along a circular trajectory by a fan-shaped radiation beam. Radiation coherently scattered in the examination zone is measured by a detector unit, the variation in space of the scatter intensity in the examination zone being reconstructed from said measuring values. Reconstruction is performed by back projection in a volume which is defined by two linearly independent vectors of the rotational plane and a wave vector transfer.
    Type: Grant
    Filed: October 24, 2003
    Date of Patent: August 26, 2008
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Jens-Peter Schlomka, Michael Graβ
  • Publication number: 20080191133
    Abstract: A portal monitoring system has a cosmic ray charged particle tracker with a plurality of drift cells. The drift cells, which can be for example aluminum drift tubes, can be arranged at least above and below a volume to be scanned to thereby track incoming and outgoing charged particles, such as cosmic ray muons, whilst also detecting gamma rays. The system can selectively detect devices or materials, such as iron, lead, gold and/or tungsten, occupying the volume from multiple scattering of the charged particles passing through the volume and can also detect any radioactive sources occupying the volume from gamma rays emitted therefrom. If necessary, the drift tubes can be sealed to eliminate the need for a gas handling system. The system can be employed to inspect occupied vehicles at border crossings for nuclear threat objects.
    Type: Application
    Filed: June 29, 2007
    Publication date: August 14, 2008
    Inventors: Christopher Morris, Konstantin N. Borozdin, J. Andrew Green, Gary E. Hogan, Mark F. Makela, William C. Priedhorsky, Alexander Saunders, Larry J. Schultz, Michael J. Sossong
  • Patent number: 7409042
    Abstract: Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.
    Type: Grant
    Filed: February 22, 2006
    Date of Patent: August 5, 2008
    Assignee: Passport Systems, Inc.
    Inventors: William Bertozzi, Robert J. Ledoux
  • Patent number: 7400705
    Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to the ion-exchange film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the change in the characteristic of the film, which accompanies change in the molecular structure (hence, ion-exchanging ability) of the ion-exchange film due to the change in humidity, is evaluated. The humidity ambient to the ion-exchange film can be adjusted by a humidity-adjusting device that comprises a vapor source, gas source, gas mixer and gas-introducing pipe.
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: July 15, 2008
    Assignee: Rigaku Corporation
    Inventors: Kazuhito Hoshino, Yoshio Iwasaki
  • Patent number: 7400701
    Abstract: A system and method for inspecting an object with multiple sources of penetrating radiation. Irradiation of the inspected object by the sources is temporally sequenced such that the source of detected scattered radiation is unambiguous. Thus, multiple views of the inspected object may be obtained and image quality may be enhanced, even in a compact geometry in which the beams are substantially coplanar.
    Type: Grant
    Filed: April 1, 2005
    Date of Patent: July 15, 2008
    Assignee: American Science and Engineering, Inc.
    Inventor: W. Randall Cason
  • Patent number: 7359042
    Abstract: A limited access space inspection system comprising: an imaging device for imaging a region in the limited access space, a mounting for mounting the imaging device to scan about the limited access space and a scanning control unit, associated with the imaging device, for controlling the imaging device to scan about the limited access space. The device is particularly useful for improving by automation, security checks customs checks and safety checks involving such awkward to access spaces.
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: April 15, 2008
    Assignee: S.T.I. Security Technology Integration Ltd
    Inventor: Yuval Ovadia
  • Patent number: 7327447
    Abstract: A limited access space inspection system comprising: a sensing device for carrying out sensing over a region in the limited access space, a mounting for mounting the sensing device to scan about the limited access space and a scanning control unit, associated with the sensing device, for controlling the sensing device to scan about the limited access space. The device is particularly useful for improving by automation, security checks, customs checks and safety checks involving such awkward to access spaces. The sensing device may be an imaging device, or a sensor for detecting traces of chemical substances.
    Type: Grant
    Filed: September 18, 2003
    Date of Patent: February 5, 2008
    Assignee: S.T.I. Security Technology Integration Ltd.
    Inventor: Yuval Ovadia
  • Patent number: 7286638
    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
    Type: Grant
    Filed: July 8, 2005
    Date of Patent: October 23, 2007
    Assignee: Passport Systems, Inc.
    Inventors: Robert J. Ledoux, William Bertozzi
  • Patent number: 7242747
    Abstract: A method for determining a weight per unit area and/or a chemical composition of a conveyed material sample. From the analysis of a portion of an incident ionizing radiation, in particular an X-radiation, scattered from a material sample, a detector signal corresponding to the gsm substance and/or the chemical composition of the material sample is generated and used for determining the weight per unit area and/or the chemical composition of the material sample. A device for determining a weight per unit area and/or a chemical composition of a material sample has a compact measurement head arranged unilaterally with respect to the material sample. This measurement head includes an X-radiation source and a detector arrangement integrated into the measurement head of at least one X-ray detector connected to a voltage supply and an evaluation unit.
    Type: Grant
    Filed: October 20, 2004
    Date of Patent: July 10, 2007
    Assignee: Mahlo GmbH & Co. KG
    Inventor: Ludwig Zerle
  • Patent number: 7239245
    Abstract: A method and device for monitoring the position of radioactive materials in vehicles relates to a technical field of monitoring of radioactive materials.
    Type: Grant
    Filed: September 17, 2004
    Date of Patent: July 3, 2007
    Assignees: Tsinghua University, Nuctech Company Limited
    Inventors: Kejun Kang, Wenhuan Gao, Xiaobing Wang, Jianmin Li, Yu He, Yinong Liu, Yuanjing Li
  • Patent number: 7139366
    Abstract: A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.
    Type: Grant
    Filed: May 31, 2005
    Date of Patent: November 21, 2006
    Assignee: Osmic, Inc.
    Inventor: Licai Jiang
  • Patent number: 7130376
    Abstract: A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the surface so as to generate a reflectance signal as a function of elevation angle relative to the surface. A feature due to reflection of the radiation from the first layer is identified in the reflectance signal. The reflectance signal is calibrated responsively to the identified feature and to the known reflectance property of the first layer. The calibrated reflectance signal is analyzed to determine a characteristic of the second layer. Other enhanced inspection methods are disclosed, as well.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: October 31, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: David Berman, Alex Dikopoltsev, Dileep Agnihotri
  • Patent number: 7130370
    Abstract: Inventions related to the intra-vision means, designed for production of visually sensed images of the internal structure of an object, in particular, of a biological object, are aimed at higher accuracy of determining the relative density indices of the object's substance in the obtained image together with avoiding complex and expensive engineering; when used for diagnostic purposes in medicine, the dosage of tissues surrounding those that are examined is decreased. X-rays from source 1 is concentrated (for example, using X-ray lens 2) in the zone that includes the current point 4, to which the measurement results are attributed and which is located within the target area 7 of the object 5. Excited in this zone secondary scattered radiation (Compton, fluorescent) is transported (for example, using X-ray lens 3) to one or more detectors 6.
    Type: Grant
    Filed: June 22, 2004
    Date of Patent: October 31, 2006
    Inventor: Muradin Abubekirovich Kumakhov
  • Patent number: 7120226
    Abstract: A method for detecting nuclear species in a sample by adaptive scanning using nuclear resonance fluorescence may comprise illuminating the target sample with photons from a source; detecting a signal in an energy channel; determining a scan evaluation parameter using the signal detected; determining whether the scan evaluation parameter meets a detection efficiency criterion; adjusting one or more system parameters such that the scan evaluation parameter meets the detection efficiency criterion; and comparing the signal in an energy channel to a predetermined species detection criterion to identify a species detection event. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons scattered from the target sample. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons transmitted through the target sample and scattered from at least one reference scatterer.
    Type: Grant
    Filed: November 19, 2004
    Date of Patent: October 10, 2006
    Assignee: Passport Systems, Inc.
    Inventors: Robert J. Ledoux, William Bertozzi
  • Patent number: 7092485
    Abstract: A baggage scanning system and method employ combined angular and energy dispersive x-ray scanning to detect the presence of a contraband substance within an interrogation volume of a baggage item. The interrogation volume is illuminated with penetrating, polychromatic x-rays in a primary fan beam from a source such as a tungsten-anode x-ray tube. An energy-dependent absorption correction is determined from measurement of the attenuation of the fan beam at a plurality of different energies. Radiation coherently scattered by substances in the interrogation volume is detected by an energy-resolved x-ray detector operated at a plurality of scattering angles to form a plurality of scattering spectra. Each scattering spectrum is corrected for energy-dependent absorption and the corrected spectra are combined to produce a scattering pattern. The experimental scattering pattern is compared with reference patterns that uniquely characterize known contraband substances.
    Type: Grant
    Filed: May 27, 2003
    Date of Patent: August 15, 2006
    Assignee: Control Screening, LLC
    Inventor: Scott D. Kravis
  • Patent number: 7072440
    Abstract: X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Detector design is improved by the use of optically adiabatic scintillators. Switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: July 4, 2006
    Assignee: Control Screening, LLC
    Inventors: Arthur W. Mario, Scott D. Kravis
  • Patent number: 7062014
    Abstract: An object is to reduce the influence of chlorine in plastics when the metal concentrations in the plastics are analyzed. In an X-ray analyzer including an X-ray generating part for irradiating primary X-rays onto a sample and an X-ray detector for detecting an X-ray from the sample, primary X-rays is irradiated onto a plastic sample from the X-ray generating part, the X-ray intensity of chlorine is obtained from the plastic sample by the X-ray detector, and the scattered X-ray intensity where the primary X-ray has been scattered by the plastic sample is obtained by the X-ray detector. A chlorine X-ray intensity ratio calculating means for dividing the X-ray intensity of chlorine by the scattered X-ray intensity to calculate a chlorine X-ray intensity ratio is provided. The calculated chlorine X-ray intensity ratio and the chlorine concentration in the plastic sample have positive correlation each other.
    Type: Grant
    Filed: September 7, 2004
    Date of Patent: June 13, 2006
    Assignee: SII NanoTechnology Inc.
    Inventor: Kiyoshi Hasegawa
  • Patent number: 7062012
    Abstract: A method of detecting a leak in a sealed object includes placing the sealed object into a chamber and introducing an x-ray attenuating gas into the chamber. The method also includes observing, by way of x-ray imaging, the transfer of the x-ray attenuating gas between the sealed object and the chamber.
    Type: Grant
    Filed: December 9, 2004
    Date of Patent: June 13, 2006
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Kiong Chin Chng, Cheng Yun Audrey Wong
  • Patent number: 6993113
    Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the molecular structure of the ion-exchange film is determined, thereby to evaluate the performance of the ion-exchange film.
    Type: Grant
    Filed: June 10, 2003
    Date of Patent: January 31, 2006
    Assignee: Rigaku Corporation
    Inventors: Kazuhito Hoshino, Yoshio Iwasaki
  • Patent number: 6937695
    Abstract: Provided are an analyzing apparatus and an analyzing method for analyzing a sample by performing measurements using X-rays and measuring a gas generated from the sample.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: August 30, 2005
    Assignee: Rigaku Corporation
    Inventor: Kazuhito Hoshino
  • Patent number: 6895075
    Abstract: Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the radiation source. The array has a first operative configuration for resolving the received radiation along a first axis perpendicular to the surface, and a second operative configuration for resolving the received radiation along a second axis parallel to the surface. A signal processor processes the signal from the detector array in the two configurations so as to determine a reflectance of the surface as a function of elevation angle relative to the surface and a scattering profile of the surface as a function of azimuthal angle in a plane of the surface.
    Type: Grant
    Filed: February 12, 2003
    Date of Patent: May 17, 2005
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: Boris Yokhin, Alexander Dikopoltsev, Tzachi Rafaeli, Amos Gvirtzman
  • Patent number: 6879657
    Abstract: An imaging system includes an x-ray source coupled to a gantry. The x-ray source generates an x-ray flux, wherein a portion of the x-ray flux becomes scatter radiation. A scatter detector is also coupled to the gantry to receive the scatter radiation. The scatter detector generates a scatter signal in response to the scatter radiation, and a host computer receives the scatter signal.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: April 12, 2005
    Assignee: GE Medical Systems Global Technology, LLC
    Inventor: David Michael Hoffman
  • Patent number: 6839406
    Abstract: A method and an apparatus for detecting items in objects, such as in luggage, wherein a detector apparatus, functioning as a second detector is divided into a lower testing stage and a higher testing stage. In the lower testing stage, the coordinates of the object location are determined, and subsequently, a diffraction apparatus is moved to this location in the higher testing stage. In particular, X-ray diffraction can be employed to determine the explosive material of the item in the object. The diffraction apparatus comprises a collimator/detector arrangement, which is disposed to be adjusted height-wise and laterally in the higher testing stage, with a laterally-adjustable X-ray source, which is synchronized with the collimator/detector arrangement. The collimator/detector arrangement preferably has only one collimator and one detector. The collimator preferably has a conically-expanding ring slot, which a predetermined angle ?M of a scatter radiation.
    Type: Grant
    Filed: May 21, 2001
    Date of Patent: January 4, 2005
    Assignee: Smiths Heimann GmbH
    Inventors: Hermann Ries, Patricia Schall, Frank Cordes, Martin Hartick
  • Patent number: 6823043
    Abstract: A method for determining parameters of a material includes comparing a range of an actual x-ray scattering profile with a range of an expected x-ray scattering profile for a material sample. The expected profile is modified to match the actual profile and this is then repeated with an ever-larger range of the profiles until two profiles match across the whole of their profile. From the last modified expected profile the parameters of the material are determined.
    Type: Grant
    Filed: June 25, 2002
    Date of Patent: November 23, 2004
    Assignee: Panalytical B.V.
    Inventors: Paul F. Fewster, Gareth A. Tye
  • Publication number: 20040141585
    Abstract: A material analyzer for identifying quantities of one or more elements in a material has a container for holding a material to be analyzed, a resonant gamma ray source unit for directing resonant gamma rays into the material in the container, and at least one detector for detecting gamma rays resonantly scattered by at least one predetermined element in the material. The resonant gamma ray source unit has an outer housing of gamma ray shield and neutron shield material, with an inner chamber and an aperture directed towards the container, a moving gamma ray generator source of a predetermined material mounted in the chamber, the material being selected from a predetermined group of materials which emit resonant gamma rays when exposed to neutrons, the source being directed towards said aperture, and a neutron source positioned in the chamber adjacent the gamma ray generator source.
    Type: Application
    Filed: January 10, 2004
    Publication date: July 22, 2004
    Inventor: Raymond J. Proctor
  • Patent number: 6754304
    Abstract: A method and device for producing visually sensed images of the internal structure of, particularly, a biological object. When used for diagnostic purposes in medicine the x-ray dosage of tissues surrounding the spot that is being examined is decreased.
    Type: Grant
    Filed: September 25, 2001
    Date of Patent: June 22, 2004
    Inventor: Muradin Abubekirovich Kumakhov
  • Patent number: 6718007
    Abstract: A method for detecting the presence of a gene responsible for a pathological state; or the pathological state itself in a patient comprising exposing at least one hair from the patient to fibre X-ray diffraction and detecting changes in the ultrastructure of the hair. An instrument (1) for detecting the presence of a gene responsible for a pathological state; or de pathological state itself, using a hair sample, comprising: an X-ray source (2) producing a beam of X-ray radiation; a sample stage for positioning said hair (3) sample within said beam; a detector to detect the scanering of said X-ray beam caused by said hair sample; and a display means (9) associated with said detector for displaying the output thereof (9a, 9b, 9c and 9d); whereby patterns of output related to the presence of said gene or said pathological state are displayed for interpretation.
    Type: Grant
    Filed: September 6, 2001
    Date of Patent: April 6, 2004
    Assignee: Fiberscan PTY Ltd.
    Inventor: Veronica Jean James
  • Patent number: 6621888
    Abstract: A system and method for inspecting an enclosure with penetrating radiation. Radiation side-scattered from an object within the enclosure is detected, allowing the object to be located. If the object is deemed suspect, a volume element of the suspect object is further irradiated with penetrating radiation, and radiation coherently-scattered by the volume element is detected. The energy spectrum and angular distribution of the coherently-scattered radiation are used to characterize the volume element of the suspect object.
    Type: Grant
    Filed: July 8, 2002
    Date of Patent: September 16, 2003
    Assignee: American Science and Engineering, Inc.
    Inventors: Lee Grodzins, William Adams, Peter Rothschild
  • Patent number: 6610977
    Abstract: A method and apparatus for screening an object for the presence of an explosive, chemical warfare agent, biological warfare agent, drug, metal, weapon, and/or radioactive material. The apparatus includes a portal through which the object is arranged to pass, the portal including a housing equipped with an ion mobility spectrometer and a surface acoustic wave device for detecting explosives, drugs and chemical warfare agents. In another embodiment the housing is equipped with a biological warfare agent detector, chemical warfare agent detector, metal detector, x-ray system, and/or radiation detector.
    Type: Grant
    Filed: October 1, 2001
    Date of Patent: August 26, 2003
    Assignee: Lockheed Martin Corporation
    Inventor: Clifford Megerle
  • Patent number: 6567496
    Abstract: A cargo inspection apparatus and process includes scanning containers with x-rays along two different planes. Outputs from x-ray sensors along the two different planes are collected for use in establishing the presence of contraband within the container. Using the sensor output data, images of the container are provided and suspicious areas and background areas are identified on the images. By using representative suspicious area and background area geometry and compensating in the suspicious area for the effective estimated background thereat, the average atomic number and density of the suspicious contraband is established. The average atomic number and density is then compared with known atomic numbers and densities of contraband materials and an output indicative of whether the suspicious area falls within the parameters of actual contraband material is provided.
    Type: Grant
    Filed: October 11, 2000
    Date of Patent: May 20, 2003
    Inventor: Boris S. Sychev
  • Publication number: 20030091144
    Abstract: The properties of meat are assessed using a non-invasive dual-energy X-ray absorption scanner. Two images or arrays of the values representative of the intensities of the X-rays at two energy levels are produced (1). These are then processed to determine properties such as the chemical lean, fat percentage, weight, presence of contaminants and the tenderness of the scanned meat (2-5). The meat assessment includes a correction step to overcome unwanted instrumental effects.
    Type: Application
    Filed: December 11, 2002
    Publication date: May 15, 2003
    Inventor: Colin Murray Bartle
  • Patent number: 6563898
    Abstract: The present invention relates to a method and portable apparatus which is used to detect substances, such as explosives and drugs, by neutron irradiation. The apparatus has a portable neutron generating probe and corresponding controllers and data collection computers. The probe emits neutrons in order to interrogate an object. The probe also contains gamma ray detectors for the collection of gamma rays from fast neutron, thermal neutron and neutron activation reactions. Data collected from these detectors is sent to the computer for data de-convolution then object identification in order to determine whether the object being interrogated contains explosives or illicit contraband.
    Type: Grant
    Filed: September 30, 1999
    Date of Patent: May 13, 2003
    Assignee: Western Kentucky University
    Inventors: George Vourvopoulos, Sandor Sudar
  • Patent number: 6556653
    Abstract: The system for inspecting an object comprises a structure having a first, second and third orthogonal axes, and a source of x-ray pencil beam mounted thereto along the first axis. An incident radiation detector is mounted to the structure perpendicularly to the first axis. A first and second linear arrays of scattered radiation detectors are mounted to the structure perpendicularly to the second and third axes respectively. The source of x-ray pencil beam, the incident radiation detector and the first and second linear arrays of scattered radiation detectors are spaced apart and define therebetween an inspection zone. In use, an object to be inspected is moved inside the inspection zone relative to the x-ray pencil beam. The object is inspected voxel by voxel and the radiation measurements taken at each voxel are indicative of incident radiation attenuation, scattered radiation attenuation and electron density of that voxel.
    Type: Grant
    Filed: May 21, 2001
    Date of Patent: April 29, 2003
    Assignee: University of New Brunswick
    Inventor: Esam Hussein
  • Patent number: 6532276
    Abstract: A method for determining the material of a detected item in objects, especially explosives in luggage, using X-ray diffraction. In this method, wherein scatter radiation deflected at the crystal-lattice structure of the material is measured and compared to characteristic energy spectra or diffraction spectra of various explosives, the absorption by the material influences the X-ray diffraction spectrum, so that information is missing, and inaccurate conclusions may be drawn regarding the material. To improve this method, the primary beam of an X-ray source is used for measuring the absorption. The beam passes through the material, and, from the absorption, an average atomic number of the material is determined, and this additional information is used for the identification of material known by comparing the recorded spectra with diffraction spectra.
    Type: Grant
    Filed: January 17, 2002
    Date of Patent: March 11, 2003
    Assignee: Heimann Systems GmbH
    Inventors: Martin Hartick, Frank Cordes