Germanium (ge), Tin (sn), Or Lead (pb) Containing Patents (Class 427/255.35)
  • Patent number: 6689203
    Abstract: Composition containing a chlorinated organotin derivative and a polyfluoroalkenyl compound and/or a halo polyfluoroalkenyl compound useful for CVD formation of fluorine doped tin oxide coatings.
    Type: Grant
    Filed: May 15, 2002
    Date of Patent: February 10, 2004
    Inventor: Gilles Merienne
  • Patent number: 6669990
    Abstract: An atomic layer deposition method which comprises forming a metal oxide thin film by using, as a group IV metal precursor, a complex of a formula M(L)2 in which M is a group IV metal ion having a charge of +4 and L is a tridentate ligand having a charge of −2, the ligand being represented by the following formula (I): wherein each of R1 and R2, independently, is a linear or branched C1-4 alkyl group; and R3 is a linear or branched C1-5 alkylene group. The group IV metal precursor exhibits excellent thermal and chemical stabilities under a carrier gas atmosphere, whereas it has high reactivity with a reaction gas.
    Type: Grant
    Filed: November 5, 2001
    Date of Patent: December 30, 2003
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Yo Sep Min, Dae Sig Kim, Young Jin Cho, Jung Hyun Lee
  • Patent number: 6605319
    Abstract: The method of the invention involves depositing a plurality of thin layers of film, each layer having a thickness ranging from about 500Å to about 2000Å. Low Pressure Chemical Vapor Deposition or other techniques known in the art maybe used to deposit each thin layer of film. The film is polysilicon or silicon-germanium, where the germanium content ranges from about 4% by weight to about 20% by weight germanium. A Rapid Thermal Anneal (“RTA”) is performed on a deposited thin film layer to relieve residual film stress in at least that film layer. The use of RTA rather than furnace annealing permits much shorter annealing times. Optionally, but advantageously, hydrogen may be present during RTA to permit the use of lower processing temperatures, typically about 20% lower relative to a customary anneal. A series of film deposition/rapid thermal anneal cycles is used to produce the desired, nominal total thickness polysilicon film.
    Type: Grant
    Filed: February 11, 2002
    Date of Patent: August 12, 2003
    Assignee: Applied Materials, Inc.
    Inventors: Jeffrey D. Chinn, Yi-Hsing Chen, Robert Z. Bachrach, John Christopher Moran
  • Patent number: 6602541
    Abstract: A process for depositing an antimony-containing coating upon a surface of a heated glass substrate includes dissolving an antimony halide in an organic solvent to form an antimony halide containing solution. This solution is then vaporized to form a gaseous antimony precursor. The gaseous antimony precursor is then directed toward and along the surface of the heated glass substrate. The antimony precursor is reacted at or near the surface to form an antimony containing coating.
    Type: Grant
    Filed: March 3, 2000
    Date of Patent: August 5, 2003
    Assignee: Libbey-Owens-Ford Co.
    Inventors: Richard J. McCurdy, Michel J. Soubeyrand, David A. Strickler
  • Patent number: 6585821
    Abstract: A method of monitoring the synthesis of a PGO spin-coating precursor solution includes monitoring heating of the solution with a UV spectrometer and terminating the heating step when a solution property reaches a predetermined value. The method utilizes the starting materials of lead acetate trihydrate (Pb(OAc)2.3H2O) and germanium alkoxide (Ge(OR)4 (R=C2H5 and CH(CH3)2)). The organic solvent is di(ethylene glycol)ethyl ether. The mixed solution of lead and di(ethylene glycol)ethyl ether is heated in an atmosphere of air at a temperature no greater than 190° C., and preferably no greater than 185° C. for a time period in a range of approximately eighty-five minutes. During the heating step the solution properties are monitored to determine when the reaction is complete and when decomposition of the desired product begins to take place. The solution is then added to germanium di(ethylene glycol)ethyl ether to make the PGO spin-coating solution.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: July 1, 2003
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Wei-Wei Zhuang, Fengyan Zhang, Jer-shen Maa, Sheng Teng Hsu
  • Patent number: 6551718
    Abstract: Disclosed is a metal sulphide coating composition of the formula MXSiVRYSZFW where M is one or more metals selected from: Mo, Ti, W, Nb, Ta, Zr, and Hf; Si is silicon; R is one or more elements selected from: C, B, Al, V, Cr, Fe, Co, Ni, Sm, Au, Cu, Zn, Sn, Pb, N, H, and O; S is sulphur; F is fluorine; X is 0.2 to 1.5; V is 0.02 to 3; Y is 0 to 4; Z is 0.2 to 6; and W is 0.01 to 6, and in which X, Y, Z, V, and W are given in amounts by atomic ratio. The compositions show good non-stick properties, low hydrophilia, and high stability.
    Type: Grant
    Filed: June 11, 1999
    Date of Patent: April 22, 2003
    Assignee: Gencoa Ltd.
    Inventor: Victor Bellido-Gonzalez
  • Patent number: 6509066
    Abstract: A series of processes have been discovered whereby uniform oxygen doping of lead chalcogenides have been achieved by using vapor deposition combined with in situ or ex situ ion implantation allowing the high yield manufacture of high S/N infrared detectors.
    Type: Grant
    Filed: March 29, 2001
    Date of Patent: January 21, 2003
    Assignee: BAE Systems Information and Electronic Systems Integration Inc.
    Inventor: Steven Jost
  • Patent number: 6428850
    Abstract: A single-substrate-processing CVD apparatus is used for forming a BST thin film on a semiconductor wafer while supplying a first process gas containing a mixture of Ba(thd)2 and Sr(thd)2, and a second process gas containing Ti(O-iPr)(thd)2 or Ti(thd)2. Precursors of Ba and Sr have lower activation energies and higher resistivities than precursors of Ti. The first and second process gases are supplied from a shower head which has a group of first spouting holes for spouting the first process gas and a group of second spouting holes for spouting the second process gas. The group of the second spouting holes are designed to have diameters gradually decreasing in radial directions outward from the center of a shower region, such that the second process gas is supplied at a spouting rate gradually decreasing in radial directions outward from the center.
    Type: Grant
    Filed: July 10, 2000
    Date of Patent: August 6, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Hiroshi Shinriki, Yijun Liu, Masahito Sugiura
  • Patent number: 6416814
    Abstract: Novel ligated compounds of tin, titanium, and zinc are useful as metal oxide CVD precursor compounds without the detriments of extreme reactivity yet maintaining the ability to produce high quality metal oxide coating by contact with heated substrates.
    Type: Grant
    Filed: December 7, 2000
    Date of Patent: July 9, 2002
    Assignee: First Solar, LLC
    Inventor: Dean M. Giolando
  • Publication number: 20020087018
    Abstract: A liquid precursor for forming a transparent metal oxide thin film comprises a first organic precursor compound. In one embodiment, the liquid precursor is for making a conductive thin film. In this embodiment, the liquid precursor contains a first metal from the group including tin, antimony, and indium dissolved in an organic solvent. The liquid precursor preferably comprises a second organic precursor compound containing a second metal from the same group. Also, the liquid precursor preferably comprises an organic dopant precursor compound containing a metal selected from the group including niobium, tantalum, bismuth, cerium, yttrium, titanium, zirconium, hafnium, silicon, aluminum, zinc and magnesium. Liquid precursors containing a plurality of metals have a longer shelf life. The addition of an organic dopant precursor compound containing a metal, such as niobium, tantalum or bismuth, to the liquid precursor enhances control of the conductivity of the resulting transparent conductor.
    Type: Application
    Filed: November 9, 2001
    Publication date: July 4, 2002
    Applicant: Symetrix Corporation
    Inventors: Jolanta Celinska, Carlos A. Paz de Araujo, Joseph D. Cuchiaro, Jeffrey W. Bacon, Larry D. McMillan
  • Publication number: 20020071912
    Abstract: Novel ligated compounds of tin, titanium, and zinc are useful as metal oxide CVD precursor compounds without the detriments of extreme reactivity yet maintaining the ability to produce high quality metal oxide coating by contact with heated substrates.
    Type: Application
    Filed: December 7, 2000
    Publication date: June 13, 2002
    Applicant: First Solar, LLC
    Inventor: Dean M. Giolando
  • Patent number: 6379873
    Abstract: There is disclosed a method of constructing photosensitive waveguides on silicon wafers through the utilization of a Plasma Enhanced Vapor Deposition (PECVD) system. The deposition is utilized to vary the refractive index of resulting structures when they have been subject to Ultra Violet (UV) post processing.
    Type: Grant
    Filed: December 22, 1998
    Date of Patent: April 30, 2002
    Assignee: Unisearch Limited
    Inventors: Michael V. Bazylenko, David Moss, Mark Gross, Pak Lim Chu
  • Patent number: 6361825
    Abstract: A pyroelectric detector system, the pyroelectric detector element therefor and the method of making the detector element which comprises an integrated circuit (1) and a pyroelectric detector element (7) coupled to the integrated circuit and thermally isolated from the integrated circuit. The element includes a lead-containing pyroelectric layer having a pair of opposing surfaces and having a thickness to provide a resonant cavity for radiations in a predetermined frequency range. A bottom electrode (5) opaque to radiations in the predetermined frequency range is secured to one of the pair of opposing surfaces and a top electrode (9, 11) is secured to the other of the pair of opposing surfaces which is semi-transparent to radiations in the predetermined frequency range. The top electrode is taken from the group consisting of platinum and nichrome. The lead-containing pyroelectric layer is preferably lead titanate.
    Type: Grant
    Filed: August 20, 1996
    Date of Patent: March 26, 2002
    Assignee: Texas Instruments Incorporated
    Inventors: Howard R. Beratan, Charles M. Hanson
  • Patent number: 6333066
    Abstract: A method for forming a PZT (lead zirconate titanate: Pb(ZrxTi1−x)O3) thin film using a seed layer is provided. In the method for forming a PZT thin film, PZT is grown on a PbO seed layer or a PZT seed layer of a perovskite phase formed by injecting excess Pb. The PbO seed layer or the PZT seed layer of a perovskite phase facilitates creation of perovskite PZT nuclei, thereby growing small and uniform PZT grains consisting of a perovskite phase.
    Type: Grant
    Filed: November 20, 1998
    Date of Patent: December 25, 2001
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Dae-sig Kim