Abstract: A test bed for an electrical energy storage system for vehicles includes a test system for conducting electrical tests of the energy storage system, optionally at least one conditioning unit for the climate control of the energy storage system, at least one data collection and analysis system, and optionally at least one safety system. In order to be able to test energy storage systems in a manner approximating their use as closely as possible in that all real influences on the energy storage system, for example, a traction battery for electric or hybrid vehicles, can be simulated with the simultaneous interaction of thermal, electrical, and mechanical influencing factors without the need to conduct tests in a real-world environment, at least one actuator is additionally provided for the mechanical stimulation of the energy storage system.

Abstract: A method of preparing a test for an electronic system including a plurality of pieces of equipment interconnected by at least one communications link, in which method, in order to perform the test, use is made of a test bench appropriate for the electronic system under test, which test bench is connected to the system and controlled in application of a command sequence established from at least one informal functional specification; while preparing the test, the informal functional specification, the command sequence, and a link identifying the informal functional specification from which the command sequence was established are all recorded so that after execution of the command sequence and after the test results have been recorded, it is possible to read the link and identify unambiguously the informal functional specification that corresponds to the test results obtained.

Abstract: A cost-effective system architecture and apparatus for programmable automatic power supply testing. The system utilizes board level interface between various system testing modules and an Automatic Test Controller (ATC). The ATC receives coded test requests from the software on an industrial PC and control the various testing modules inside ATC to execute the tests. Test results were sent back to the PC and saved in a result file. A single industrial PC can control two or more ATC's and test two or more power supply units simultaneously. The ATC based test system is lower cost than the conventional Automatic Test Equipment which uses device level interface and standardized test devices.

Abstract: An improved method for calibration of dynamic motion sensors. In one aspect, the method comprises sending a low frequency driving signal to an exciter to generate a harmonic movement in a shaker table, using an optical position sensor to produce an output representative of position, computing the acceleration of the shaker table and a dynamic motion sensor under test (SUT), and comparing the output of the SUT with the instantaneous acceleration of the shaker table at different frequencies sufficient to define the performance characteristics of the SUT within a selected frequency range, among other things. In another aspect, the method comprises calibration of a dynamic motion SUT by simultaneous direct measurement of position and time. In another aspect, the optical position sensor has an electrical output representative of position for attaining a desired degree of positional accuracy.

Abstract: The information service providing device of the disclosure of the present application selects sensors which may be used for the implementation of an information service to be provided within a plurality of sensors which the device can make use of, and in addition, selects the most appropriate one within the sensors which may be used and selects an appropriate parameter for the sensors and processing programs in order for the information service to be provided appropriately, and set to these in response to the environment in which the information service is implemented. Furthermore, the information service providing device of the disclosure of the present application provides, with only the receipt of the designation of desired information service by a user, various information services are provided by appropriately combining various kinds of sensors and a plurality of processing programs.

Abstract: An automation system and a method for controlling a process and for monitoring the condition of process equipment. The method comprises the steps of measuring process signals indicating the condition of the process by means of a first sensor; measuring condition monitoring signals indicating the condition of process components by means of a second sensor; processing the process signals by means of a first I/O module; processing the condition monitoring signals by means of a second I/O module; transmitting the processed process signals obtained from the first I/O module to a process station. The method also comprises the steps of transferring the processed condition monitoring signals obtained from the second I/O module to the same process station; and processing both the said processed process signals and the said processed condition monitoring signals by process station software in the said process station.

Abstract: Systems, methods and apparatus are described for testing a data connection provided over a power supply line. A testing apparatus is coupled to a socket of the power supply line. The AC power supply line communicatively couples the testing apparatus to a communication device or another testing apparatus. The testing apparatus identifies the signal strengths of signals received by the testing apparatus and identifies the signal strengths of signals received by the communication device. The testing apparatus outputs an indicator of the first signal strength and the second signal strength to a user and this information may be utilized to detect noise or other problems in the data connection provided over the AC power supply line.

Abstract: An aircraft component assembly has an aircraft component for an aircraft. A sensor is configured to monitor the aircraft component. A local wireless transmitter is provided for communication with a remote receiver. In addition, a local wireless receiver is provided for communication with the remote transmitter. A processor is in communication with the sensor. The processor is configured to control the sensor, the local wireless transmitter and the local wireless receiver. A power source is configured to generate energy proximate the installed aircraft component.

Abstract: A method for calibrating a wheel speed detection system, comprising at least one wheel speed sensor and at least one electronic control unit. The at least one wheel speed sensor output signal is evaluated in the electronic control unit and the evaluation is adapted to a distance information item which is acquired from a traveled reference distance.

Abstract: A system for measuring residual phase noise of a device under test (DUT) includes first and second signal sources, first and second receivers, and a processor. The first signal source generates a first signal to be input to the DUT as a stimulus signal and provides a second signal that is phase coherent with the first signal. The second signal source receives the second signal and generates a reference signal based on the second signal, which is phase coherent with the stimulus signal. The first receiver measures an output signal from the DUT responsive to the stimulus signal, and the second receiver measures the reference signal from the second signal source. The processor mathematically suppresses a carrier of the output signal by determining a difference between the measured output signal and the measured reference signal, and determines the residual phase noise of the DUT based on the difference.

Abstract: Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.

Abstract: A program can be instrumented to test the program. The test instruments are classified, and concurrency constraints applied based on the classifications. A testing tool determines classifications of a plurality of test instruments in the instrumented program. The testing tool prevents concurrent instantiation of multiple of the plurality of test instruments in a first classification of the classifications. Multiple of the plurality of test instruments in a second classification of the classifications are concurrently instantiated.

Abstract: A method of manufacture for a portable computing device is described. In particular, methods and apparatus for assessing a quality of weld joints used to connect one or more components of the portable computing device are described. The weld joints can include one or more weld points. At a weld check station, using a vector network analyzer, a test signal generated can be passed through the weld joint and a response signal can be measured. The measured characteristics can be used to assess a quality of the weld joint. In one embodiment, the vector network analyzer can be used to generate a number of high frequency test signals that are passed through the weld to perform a time domain reflectometry measurement where the weld joint can be accepted or rejected based upon the measurement.

Abstract: An integrated circuit (IC) including a warranty and enforcement system, and a related design structure and HDL design structure are disclosed. In one embodiment, an IC includes a parameter obtainer for obtaining a value of a parameter of the IC; a warranty data storage system for storing warranty limit data regarding the IC; a comparator for determining whether a warranty limit has been exceeded by comparing the value of the parameter to a corresponding warranty limit; and an action taker for taking a prescribed action in response to the warranty limit being exceeded.

Abstract: In a computing device, computerized method, and a non-transitory storage medium, correction data of a probe holder is read. The probe holder comprises one or more slots that houses all available probes and is placed on the coordinate measuring machine. The correction data comprises coordinates of the slots. A coordinate of one of the slots is obtained from the correction data. A Z-axis of the coordinate measuring machine moves to a position that corresponds to the extracted coordinates, to detach a probe which is currently installed on the Z-axis and to place the detached probe into the slot, and/or to pick up and install another probe which is currently housed in the slot onto the Z-axis.

Abstract: Test systems and methodologies are provided and may include platforms for developing test programs for automated testing. In one example, tester and instruments are isolated from the tester OS, permitting any OS to be used. In another, a user layer is isolated from the physical layer, permitting hardware-independent development and usability among different tester platforms. In another, test program execution is isolated from a tester platform OS, permitting test program function independent from tester platform. In another embodiment, functions are only added, existing links to functions are not broken, ensuring continued operation with new software, hardware and/or features. Systems may be non-deterministic. In one example, the non-deterministic computer is required to execute computer instructions within a constant execution time. A deterministic engine, may be used to wait a variable amount of time to ensure constant execution time.

Abstract: In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.

Abstract: A system for measuring normal load and deflection of a material that includes a portable load deflection device and a method of using the same is disclosed. The system includes a support arm having a first end and a second end opposite said first end. The first end can be attached to a base surface. The support arm can provides at least three degrees of freedom of movement and includes at least one sensor for determining a position of the second end. A uniaxial load cell can be operably attached to the second end. The system can also include a processing system operable to receive position data and corresponding force data when the support arm is used to apply a non-normal compression force to the test surface. The data can be used to calculate normal force versus deflection data for the test surface.

Abstract: A measured device coupled to test equipment providing at least two test factors and receiving a test result is disclosed. The measured device includes a combinatorial logic circuit and a main circuit. The combinatorial logic circuit includes a first storage module and a second storage module. The first storage module stores the test factors according to a first operation clock. The second storage module stores and outputs at least two output factors according to a second operation clock. The frequency of the second operation clock is higher than the frequency of the first operation clock. When the test factors are stored in the first storage module, the test factors stored in the first storage module are served as the output factors and the output factors are output and stored in the second storage module. The main circuit generates the test result according to the output factors output by the second storage module.

Abstract: A tester for testing a device under test has a first channel unit and a second channel unit. The first channel unit has a corresponding first pin connection for a signal from a device under test, a corresponding first test processor adapted to process, at least partially, data obtained from the first pin connection, and a corresponding first memory coupled with the first test processor and adapted to store data provided by the first test processor. The first channel unit is adapted to transfer at least a part of the data obtained from the first pin connection to the second channel unit as transfer data. The second channel unit has a corresponding second test processor adapted to process, at least partly, the transfer data from the first channel unit.

Abstract: An ultrasonic multiphase flowmeter, a flow rate measurement program and a multiphase flow rate measurement method using an ultrasonic wave that can measure the flow rate of a multiphase flow by detecting the position of an interface between phases by an operation processing of at least one of data on reflected ultrasonic wave and data on a flow velocity distribution are provided. The ultrasonic multiphase flowmeter functions to transmit/receive ultrasonic waves, calculate flow velocity distributions, determine interface positions, and calculate flow rates.

Abstract: A semiconductor device is provided. The semiconductor device applies data applied through a bump pad on which a bump is mounted through a test pad to a test apparatus such that the reliability of the test can be improved. The amount of test pads is significantly reduced by allowing data output through bump pads to be selectively applied to a test pad. Data and signals applied from test pads are synchronized with each other and applied to bump pads during a test operation such that the reliability of the test can be improved without the need of an additional test chip.

Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a sampling section that samples the signal under measurement with a plurality of sampling phases at non-uniform intervals for each sampling repetition cycle; and an inverting section that cancels out a replica that is not an observation target, from among the replicas in a sampling band of the signal under measurement and the replicas in the sampling band of a frequency component of the signal under measurement, by inverting signs of values of the signal under measurement sampled with at least one sampling phase from among the plurality of sampling phases.

Abstract: The invention generally relates to a circuit card assembly testing system for testing and troubleshooting new and failed circuit card assemblies. Specifically, circuit card assemblies that are part of a guided missile and launcher test set are tested using a board testing system (BTS), the preferred embodiment, to isolate faults or to verify final assembly. The BTS is used for testing and troubleshooting a wide variety of circuit card assemblies at the end of final assembly and upon their return as a failed item from the field. The BTS is designed to rapidly isolate faults in failed circuit card assemblies that have been returned to a maintenance facility by providing an improved means of fault isolation. The BTS is designed to aid in the production of circuit card assemblies by providing an improved means of rapidly verifying the proper operation of circuit boards after final assembly.

Abstract: A method of generating and storing three-dimensional digital data indicative of a sporting trophy is provided. The method may be implemented in relation to a wide variety of sporting trophy applications. A sportsman can provide a sporting trophy to a scanning system to obtain three-dimensional image data relative to the sporting trophy. Sporting-relevant measurements can be computed based on the stored three-dimensional image data.

Abstract: According to some embodiments, characterization data can be loaded onto a programmable device. The characterization data can be configured to cause the programmable device to perform one or more functions if executed on the programmable device. It can then be determined whether or not loading the characterization data onto the programmable device caused the programmable device to be successfully programmed. An indication can be transmitted for receipt by an external device, the indication indicating whether or not the programmable device was successfully programmed.

Abstract: In a system in which a plurality of modules have different operational rates and a common clock controlling data delivery to the modules, the rate at which data is delivered to the system can be maximized using a return clock signal to prevent the loss of synchronization of the modules. A clocking error signal may be produced when the clock signal makes a transition to a logic state that may cause loss of synchronization between the modules.

Abstract: Disclosed is a system with which fuel cell stacks can be tested automatically or manually so that production of pollutants and consumption of electricity are little. The system runs various analyses and tests on the fuel cell stacks and provides operative conditions such as temperatures and fluid flows needed in the tests.

Abstract: An information service providing device selects a combination, all sensors contained in which are available and which has the highest priority, from within the combinations of sensors, which are for implementing an information service. In addition, the information service providing device selects an appropriate parameter for the sensors and processing program selected so as to be provided appropriately in response to the environment in which an information service has been implemented, and sets the parameter to these. By selecting sensors and processing program, and setting parameters, the information service providing device with only the receipt of the designation of desired information service by a user, various information services by appropriately combining various kinds of sensors and a plurality of processing programs.

Abstract: A communications system and method for testing components of an aircraft via Ethernet. The communications system may comprise one or more Ethernet links having software and hardware controls for timing, buffering, and messaging, and a dedicated Ethernet line. The Ethernet links may be configured to communicably link sections of a central communication system of the aircraft, each section being part of a separate aircraft component. The Ethernet links may also communicably link the sections with various databases over the Ethernet line. The databases may comprise loadable software, archived testing data, configuration data, and/or diagnostic data. Any of the central communication system sections and the databases may be located at geographically distant locations from each other, such as at separate production sites. The communications system may allow the aircraft components to test each other, or essentially for the aircraft to test itself prior to its components being physically joined together.

Abstract: Method and apparatus for parallel testing of multiple regions on a substrate used in high performance combinatorial development of new materials and processes are described. The apparatus comprises dedicated hardware for each probe assembly with multiple PC controllers networked using a master/slave configuration.

Abstract: System and method for configuring a client system, e.g., a measurement system. First input is received from a client system over a network requesting access to a plurality of configuration diagrams comprising respective solutions to respective tasks. At least a subset of the plurality of configuration diagrams is displayed on a display device of the client system for viewing by a user. Second input is received from the client system selecting one of the displayed configuration diagrams indicating a solution for a task to be performed by the client system. The solution is provided to the client system over the network, and may include the selected configuration diagram and/or pricing information for proposed products. The configuration diagrams are stored in a configuration diagram database. The stored configuration diagrams may be pre-defined solutions for pre-defined tasks, generated in response to received user requirements, and/or received from client systems and/or vendors.

Abstract: An Analog/mixed signal automatic test system includes a software architecture that creates a virtual composite instruments through novel software dynamic allocation of low level resources. These virtual composite instruments provide backwards and forwards compatibility to a variety of automatic test equipment, known or available on the market. The virtual composite instruments are free from the normal constraints imposed by hardware implementations. Creation of the virtual composite instruments allows a single piece of automatic test equipment system to emulate many implementations of automatic test equipment, providing higher utilization, and therefore a lower cost test solution for device manufacturers. The test instruments are preferably object controls and are preferably instantiated and controlled by the test system server. This allows multiple users to control the tester simultaneously across, for example, the Internet.

Abstract: A gas analyzer using a quadrupole mass spectrometric method etc. is provided with an ionizer to ionize a sample gas, a first ion detector and a second ion detector each configured to detect a respective ion from ionizer, and each being disposed a respective distance from the ionizer on an opposite side of the ionizer, the respective distances being different from each other, a filter interposed between the ionizer and the first ion detector to selectively allow ions from the ionizer to pass therethrough, and an arithmetic device to correct a partial pressure of a specific component obtained from the first ion detector and selected by the filter by using a first total pressure of the sample gas obtained from the first ion detector and a second total pressure of the sample gas obtained from the second ion detector.

Abstract: A signal integrity test system and method uses an oscilloscope to test a signal on each test point of a transmission line, obtains test parameter values of the signal on each test point, and compares the test parameter values with preset standard values. If any test parameter value does not match a corresponding preset standard value, a time-domain reflectometer is used to test an impedance value of the test point. If the impedance value matches a standard impedance value of the transmission line, the system and method determines the signal on the test point satisfies integrity requirements.

Abstract: A method for determining a distance between a first piece and a second piece includes measuring, at the first or second piece, a first signal at a first frequency, and measuring, at the first or second piece, a second signal at a second frequency. The second frequency is different from the first frequency. The distance is determined based on the measured first and second signals.

Abstract: A method and apparatus is disclosed that guides a user through a sequence of steps that will allow the user to complete a predefined task using the flow meter. The steps include: selecting a predefined task, displaying a sequence of steps that directs the user through a process for using the Coriolis flow meter to complete the predefined task, and operating the Coriolis flow meter in response to the sequence of steps to complete the predefined task.

Abstract: Problem diagnostics may be obtained from components that log messages using a unique component identifier which is provided within each message so as to enable routing of callbacks to the component that originated the message. Similarly, problem diagnostics may be obtained from components that generate alerts, where the alerts contain the unique identifier of the component that generated the alert. Each component supports a diagnostic provider interface comprising operations which may be dynamically invoked, for example to solicit information from the component such as its configuration data, its state information, to execute self-diagnostic tests, and so forth. In addition or instead, operations may be provided that can be invoked to cause the component to alter its configuration data (such as notifying the component to change its level of message logging) or its behavior.

Abstract: In a sensor network system comprising a sensor terminal and a management server, the sensor terminal transmits observation data acquired using the sensor, the management server has a latest data storage manager which manages the latest observation data among observation data received from the sensor terminal, a history data storage manager which manages the history of the observation data from any time when data was received from the sensor terminal to the latest observation data, and a missing data manager which manages missing history data, and compensates the missing history data based on a predetermined rule, and when a request for such observation data is received, at least one of the latest observation data managed by the latest data storage manager, and history data wherein the missing data has been compensated and managed by the history data storage manager, is output according to the type of request.

Abstract: A test management system is provided that performs tests on integrated circuit test structures. A server may be used to distribute a test recipe to multiple test cells. Each test cell may have multiple test instruments and associated instrument drivers. When performing a test, a test type module may run on a given test cell. The test type module may perform tests by using the instrument drivers to control the test instruments available in the test cell. Users may make test option selections using graphical interface screens such as a test recipe setup screen and a platform engine control screen. A user can select test sites for testing based on which process parameters where used to fabricate the test structures associated with the test sites or other criteria.

Abstract: A semiconductor memory device having a test mode circuit is presented which includes: a mode setting unit, in response to an external command and a first address signal for a mode set, providing a mode register set signal corresponding to predetermined mode setting; and a test mode circuit, in response to the mode register set signal and a second address signal for test enable control in an initial operation, performing test mode enable; the test mode circuit, in response to the mode register set signal and a third address signal for test item selection in the test mode enable state, outputting a test mode item signal; and the test mode circuit, in a subsequent operation, receiving the fed-back test mode item signal to maintain the test mode enable state.

Abstract: A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.

Abstract: In an embodiment, a test method is implemented to test an integrated circuit that includes at least one processor. The method may include programming a memory to which the integrated circuit is coupled during testing with one or more test programs. The integrated circuit may be booted, and the processor may execute the test programs from the memory. In one embodiment, the memory may also store a control program that may manage the execution of the tests. In an embodiment, the control program may also implement a protocol to communicate with the ATE to perform the testing. The protocol may be implemented over a set of general purpose input/output (I/O) pins, for example. Using the protocol and test vectors on the ATE, the tests may be selected and executed, and test results may be reported.

Abstract: An apparatus for testing multiple Small Form-Factor Pluggable Plus (SFP+) ports comprising: a first testing module; a second testing module; and a communications link coupled with the first and the second testing modules; wherein each of the testing modules includes: a SFP+ interface connectable to a port under test (PUT), a signal processing circuit including: a signal compensator configured to perform signal compensation on a signal received from the other testing module, and a signal modifier configured to: modify the compensated signal according to a set of predetermined modification parameters, and transmit the modified signal to the PUT.

Abstract: A system for measuring signals received by an apparatus. An antenna system in the apparatus may include two or more antennas. A receiver in the apparatus may be configured to measure signal response induced in the antenna system in accordance with a pattern. After the signal response for the antenna system is measured at least once, the pattern may be altered and the signal response for the antenna system may be measured again in accordance with the altered pattern. The signal response in the antenna system measured for the pattern may then be averaged with the signal response in the antenna system measured for the altered pattern, and the average may be utilized as input to, for example, a directional determination process.

Abstract: Relating with board numbers of the boards mounted with the logic circuits and mounted places on the boards and in relation to log information to be collected from the logic circuits, analysis information describing information to be processed when the log information is generated, information of a condition for which the log information is to be valid, and information of a condition for which the log information is to be invalid are defined for analyzing failures using the analysis information based on the logic circuits. Upon the realization of the failure analysis based on the logic circuits, the analysis information further describes information of the priority of the log information to realize a thorough analysis of critical failures.

Abstract: A system and method for determining a received signal frequency by sampling the received signal at a rate less than twice a predefined nyquist rate. The system includes a distorting component configured to distort the received signal in a frequency dependent manner, at least one analog to digital converter configured to sample the received signal and the distorted signal at a rate less than twice a predefined nyquist rate, and a processing component configured to determine a frequency of the received signal based on the sampled received signal and the sampled distorted signal. The method includes distorting the received signal, sampling the received signal and the distorted signal at a rate less than twice a predefined nyquist rate, and determining a frequency of the received signal. In an embodiment, distorting includes at least one of distorting an amplitude or a group delay of the received signal.

Abstract: Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.

Abstract: A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be programmed and controlled by a test controller on a test fixture that allows simultaneous testing of a single MDC or one or more pairs of MDCs, one MDC in a pair (e.g., the “golden” MDC) testing the other MDC of that pair. Other methods are also described, wherein one MDC executes a series of reads and writes and other commands to another MDC to test at least some of the other card's functions, or wherein one port executes a series of test commands to another port on the same MDC to test at least some of the card's functions.

Abstract: A system and method for testing objects using a mechanical arm includes establishing coordinate system based on a work area of the mechanical arm, and obtaining test parameters from a storage system. The method further includes controlling the mechanical arm to get an object and position the object to the position of a test platform according to the test parameters, controlling the mechanical arm to get test tool from a tool shelf and position the test tool to a position of test point on the object to test the object according to the test parameters. The method also includes controlling the mechanical arm to get the object from the test platform and position the object to the location reserved for the object according to the test parameters.