Abstract: Detecting an anomaly is disclosed. An indication that a computer system monitoring instrument is desired to provide as output a subset of the output data that it would produce if it were to remain on throughout a relevant period with no limit being placed on its output at any point during the relevant period is received. The instrument is configured to provide as output only the desired subset.

Abstract: Provided is a test apparatus 10, which includes: a plurality of test modules 150, each of which is connected to any of the plurality of devices under test 100 to supply a test signal to the connected device under test 100; a plurality of site controllers 130 that control the plurality of test modules 150 to test the respective plurality of devices under test 100 simultaneously; a connection setting device 140 that sets a connection mode between the plurality of site controllers 130 and the plurality of test modules 150 so that each of the test modules 150 is connected to any of the plurality of site controllers 130; and a plurality of system controllers 110, each of which controls any of the plurality of site controllers 130, in which a predetermined system controller of the plurality of system controllers 110 assigns, in response to a request from another system controller of the system controllers, a site controller of the site controllers, which is to be controlled by the another system controller.

Abstract: A method for automatically creating a probability of detection (POD) curve of an entire network of transducers monitoring and detecting damage in a structure is based on the POD of each of the individual actuator-sensor paths. These individual path PODs may be generated in different ways, such as by experimentation or simulation. This technique makes it possible to create the POD curve of a structural health monitoring (SHM) system for the detection of damages in structures.

Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.

Abstract: A semiconductor apparatus includes a functional block to observe a state of a signal line in the apparatus. The functional block includes a signal transfer section to receive, transmit and output the state of the signal line, and an observation flip-flop to store a state of an input terminal or an output terminal of the signal transfer section.

Abstract: Embodiments of the invention provide a data storage device test method and data storage device manufacture method which allow a tester to perform an operation test of plural data storage devices connected thereto in a shorter period of time. In one embodiment, an operation test of each of plural HDDs 81-84 connected to a tester is performed by making plural HDDs 81-84 execute commands received from the tester, wherein, during a waiting period when exchange stops between the tester and, for example, HDD 81 of which operation test is being executed, the tester executes the operation test of another HDD. Such a waiting period occurs, for example, before HDD 81 becomes ready to receive a command, before a data transfer is completed and before HDD 81 becomes ready to receive the subsequent command. By using this waiting period, the tester issues a command to, for example, HDD 82 if the HDD is ready to receive a command or transfers data to the HDD if data transfer is possible.

Abstract: Provided is a distributed test system and method for electrical devices that features bifurcated testing and analysis of test results for electrical devices by aggregating test results from multiple testing systems to a centralized server where analysis of test data is undertaken. The system includes a plurality of testing systems, each of which is configured to operate test software to provide electrical stimuli to devices under test (DUTs) and obtain measured metrics indicative of actual operational characteristics (AOCs) of the DUTs. A decision support system (DSS) is selectively placed in data communication with the plurality of testing systems to receive the measured metrics from each of the plurality of testing systems. The DSS is configured to operate on software and compare desired metrics, indicative of desired operational characteristics (DOCs) of each of the DUTs, with the measured metrics and provide a plurality of operational characteristic determinations (OCDs).

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.

Abstract: The information service providing device of the disclosure of the present application selects sensors which may be used for the implementation of an information service to be provided within a plurality of sensors which the device can make use of, and in addition, selects the most appropriate one within the sensors which may be used and selects an appropriate parameter for the sensors and processing programs in order for the information service to be provided appropriately, and set to these in response to the environment in which the information service is implemented. Furthermore, the information service providing device of the disclosure of the present application provides, with only the receipt of the designation of desired information service by a user, various information services are provided by appropriately combining various kinds of sensors and a plurality of processing programs.

Abstract: A monitoring system includes a controller, a number of input devices, a number of digital sensors, a number of analog sensors, and a number of alarms. Each input device comprises a switching circuit, an input circuit, and a connector. The connector is connected to a digital sensor or connected to an analog sensor and a first power source in series. The controller controls the switching circuit of the input device to receive a digital signal of the digital sensor or an analog signal of the analog sensor and output a corresponding detection signal. The input circuit transmits the detection signal to the controller. The controller controls the corresponding alarm to work according to the detection signal.

Abstract: A processor having one or more processor cores includes execution logic that may execute instructions including one or more processes. Each process may include one or more execution threads. The processor also includes a profiling mechanism that includes monitor logic and a monitor process. The monitor logic may monitor the one or more processes and provide access to performance data associated with the one or more processes without interrupting a flow of control of the one or more processes being monitored. The monitor process may gather the performance data. In addition, the monitor process may include program instructions executable by the one more processor cores while operating in user mode.

Abstract: A multi-function, intelligent, distributed analysis test tool (MFDAT) suitable for performing maintenance on complex, sophisticated electronic systems. MFDAT replaces ordinary test instruments such as spectrum analyzers, oscilloscopes, power meters, frequency counters and digital multimeters with modular virtual test instruments that perform the identical functions but use a single display and human interface. Setup information stored internally allows automatic selection and set up the instruments for a particular test. MFDAT provides a “virtual” system to the technician whereby when a second system under test is unavailable, a previous good reading stored by MFDAT is available for comparison. MFDAT provides three operating modes that allow the operator to develop, modify, or refine test procedures, use the embedded test instruments as they would use standard instruments, or to step through predefined test procedures.

Abstract: A method and apparatus is disclosed that guides a user through a sequence of steps that will allow the user to complete a predefined task using the flow meter. The steps include: selecting a predefined task, displaying a sequence of steps that directs the user through a process for using the Coriolis flow meter to complete the predefined task, and operating the Coriolis flow meter in response to the sequence of steps to complete the predefined task.

Abstract: Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.

Abstract: A system and method for determining the true electrical characteristics of a device. A codec is configured to measure at least one electrical characteristic of a device connected to a jack and to identify the device based on the measured electrical characteristics. An updateable database is populated with application circuit information and a software routine is responsive to the measured electrical characteristic and configured to adjust the electrical characteristics measured by the codec based on the application circuit information in the database.

Abstract: A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines a test result for the device under test according to the first output signal and the second output signal.

Abstract: Disclosed herein is an apparatus and apparatus for simultaneously testing a plurality of wireless communication terminals. The apparatus for simultaneously testing a plurality of wireless communication terminals includes one or more virtual Operating Systems (OSs) each configured to be run under an actual Operating System (OS) and to connect a wireless communication terminal with a test module independently of the actual OS, a plurality of test modules each configured to test a wireless communication terminal under the actual OS or one of the virtual OSs, and a control module configured to assign a plurality of wireless communication terminals recognized by the actual OS to the actual OS and the virtual OSs in a one-to-one correspondence and to assign the plurality of test modules to the actual OS and the virtual OSs in a one-to-one correspondence so that the test modules can be run simultaneously.

Abstract: A solution is proposed for testing a software application. The test includes the execution of a series of test cases, each one involving the application of a predefined test input to the software application. The software application generates a corresponding output in response to this test input. A result of the test case is determined by comparing the actual output provided by the software application with an expected output thereof. The expected output of the test case is determined automatically. For this purpose, multiple auxiliary sources are exploited, such as other software applications different from the one under test. Each auxiliary source receives a corresponding input, derived from the test input, which is intended to cause the auxiliary source to provide the same expected output as the software application. The expected output is then estimated according to the actual outputs provided by the different auxiliary sources.

Abstract: An Analog/mixed signal automatic test system includes a software architecture that creates a virtual composite instruments through novel software dynamic allocation of low level resources. These virtual composite instruments provide backwards and forwards compatibility to a variety of automatic test equipment, known or available on the market. The virtual composite instruments are free from the normal constraints imposed by hardware implementations. Creation of the virtual composite instruments allows a single piece of automatic test equipment system to emulate many implementations of automatic test equipment, providing higher utilization, and therefore a lower cost test solution for device manufacturers. The test instruments are preferably object controls and are preferably instantiated and controlled by the test system server. This allows multiple users to control the tester simultaneously across, for example, the Internet.

Abstract: Test systems and methodologies are provided and may include platforms for developing test programs for automated testing. In one example, tester and instruments are isolated from the tester OS, permitting any OS to be used. In another, a user layer is isolated from the physical layer, permitting hardware-independent development and usability among different tester platforms. In another, test program execution is isolated from tester platform OS, permitting test program function independent from tester platform. In another embodiment, functions are only added, existing links to functions are not broken, ensuring continued operation with new software, hardware and/or features. Systems may be non-deterministic. In one example, the non-deterministic computer is required to execute computer instructions within a constant execution time. A deterministic engine may be used to wait a variable amount of time to ensure constant execution time.

Abstract: Self-generated automated tests can use a pseudo-random number generator to select one or more arguments that are passed to programs and scripts. The random arguments are driven by a configuration file where the limits for the parameters are defined. Multidimensional functions with multidimensional parameters can be tested. Test duration can be limited by time, number of iterations, or by any of the multidimensional functions or parameters. A pseudo-random seed for each test is recorded so that a test case can be reproduced if a failure is detected or otherwise.

Abstract: Controlling a multiplexer for switching between probes of a microwave sensor. The multiplexer is used to select one of the probes at any one time of operation of the sensor. Signal processing constants are updated for the selected probe. One or more signal conditioning devices are adjusted to optimize signal noise levels and dynamic range for the probe. The transmit frequency is set for the probe. Upon expiration of a transition period, a data acquisition operation or measurement operation is conducted with the probe. In turn, a time for switching to the next probe is calculated and applied prior to enabling the multiplexer to switch to another probe. These tasks are completed steps for each of the remaining probes of the microwave sensor and then repeated again for continuing operation of the sensor.

Abstract: A method of selecting a sensor in a semiconductor manufacturing process is provided. The method includes measuring responses of a plurality of sensors when a first of a plurality of process conditions is varied, identifying one or more of the sensors having a steady state response after the first of the process conditions is varied, and selecting a sensor having a highest value within a response range from among the sensors having the steady state response for the first process condition that is varied. This methodology may be performed for multiple different process conditions. Thus, when process conditions in multiple processes of manufacturing a semiconductor device are varied, sensors having a steady state response can be selected from among multiple sensors for detecting abnormalities in the processes.

Abstract: The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CCM.

Abstract: A test apparatus that tests a device under test is provided, including a plurality of testing units that are mapped to a control bus address space and that test the device under test; a control processor that executes a plurality of test control programs to control each testing unit corresponding to each test control program; a plurality of address registers that are mapped to a control processor address space and store an address in the control bus address space of one of the testing units when written thereon by the control processor; and a plurality of data registers that are mapped to the control processor address space, that are disposed to correspond one-to-one with the plurality of address registers, and that store data that is written thereto and read therefrom by the testing unit designated by the address stored in the corresponding address register.

Abstract: Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.

Abstract: An arc monitor system locates an arc based on optimal frames from a frame obtained before an arc discharge to a frame obtained immediately after the arc discharge. The arc monitor system, used to locate an occurred place of an arc discharge that occurred in an electric facility, includes multiple monitor cameras arranged at multiple places in the electric facility, an image processing device that processes images received from the respective monitor cameras, a control logic section that controls the image processing device, and an operation device that includes a display section and an operation section and is connected to the control logic section. The image processing device and the control logic section extract a change in the images received from the monitor cameras in response to a control signal generated from the electric facility on an occurrence of the arc discharge, and then locate an occurred place of the arc discharge.

Abstract: There is implemented an instrument check system for storing check data of an instrument for a long period of time in an instrument body in a stylized format. The instrument check system comprises an instrument provided with an AD converter for converting a voltage value applied to an input terminal into a digital value, a checking PC connected to the instrument so as to communicate with the instrument, a voltage generation unit for applying a checking voltage value to the input terminal, a check data storage unit formed in the instrument, wherein the checking PC comprises an input check means for acquiring data that is converted from the voltage value into the digital value by the AD converter upon giving an instruction to the voltage generation unit, and storing the data in the check data storage unit.

Abstract: Methods to detect rogue access points (APs) and prevent unauthorized wireless access to services provided by a communication network are provided. A mobile station (MS) reports to a serving AP the received signal strength (RSS) for all APs in the area it travels. The serving AP detect a rogue AP based on inconsistencies perceived in the RSS reports, assessed during the handover phase or whilst the communication is active.

Abstract: A manufacturing test and programming system (100) is presented including providing a PCB tester (108), providing an in-system programmer (102) electrically attached to the PCB tester (108), mounting a device under test (114) having a programmable device (116) attached thereon and programming the programmable device (116) with the in-system programmer (102).

Abstract: A system and method for binding a GUI element to a data source of live measurement data are described. A data source component may be included in a program and may be configured with a binding to a data source of live measurement data in response to user input. A GUI element may also be included in the program, and the binding configured for the data source component may be associated with the GUI element in response to user input. Associating the binding with the GUI element may effectively bind the GUI element to the data source of live measurement data and may enable the GUI element to automatically display the live measurement data from the data source during execution of the program. A system and method for binding a GUI element in a program to a data target for live measurement data are also described. A GUI element may be included in a program, and the GUI element may be configured to display live measurement data during execution of the program.

Abstract: A method for parameterization of data distributions for efficient information sharing in distributed sensor networks including a plurality of sensors, comprising the steps of performing Bayesian multi-source data fusion and sharing probalistic data information.

Abstract: A portable electromechanical actuator test system includes a command generator, a rechargeable battery system, an electronic power supply, and a power controller, all disposed within a portable housing. The command generator at least selectively supplies test actuator commands to, and receives operational feedback signals from, an electromechanical actuator (EMA) controller. The rechargeable battery system and electronic power supply each supply electric power. The power controller is coupled to receive the electric power supplied from both the rechargeable battery system and the electronic power supply, and is operable to at least selectively supply electric power to the EMA controller and to an EMA that is controlled by the EMA controller.

Abstract: A method, apparatus, and computer-readable media for routing a message service message in a wireless device is disclosed. According to a method, routing messages in a wireless device includes receiving routing preferences from one or more applications operating with a wireless device. The method further includes receiving a message, and routing the message to designated locations for the one or more applications. The locations may include an application or set of applications, or a memory unit associated with one or more applications. Another method includes determining a routing parameter from the message by parsing at least one routing parameter from message content. Routing the message further includes comparing the at least one routing parameter with the routing preferences.

Abstract: A test instrument network for testing a plurality of DUTs includes a plurality of communicating script processors, the script processors being adapted to execute computer code; and a plurality of measurement resources controllable by the script processors in response to executed computer code, the measurement resources being adapted to test the DUTs. Each script processor and measurement resource may be arbitrarily assigned by the controller to one of at least two groups, only one script processor being assigned to be a master script processor, any other script processor being a slave script processor and any group not including the master script processor being a remote group. The master script processor is exclusively authorized to initiate code execution on any script processor in a remote group. Any slave script processor is only able to initiate operation of measurement resources in it own group.

Abstract: An Analog/mixed signal automatic test system includes a software architecture that creates a virtual composite instruments through novel software dynamic allocation of low level resources. These virtual composite instruments provide backwards and forwards compatibility to a variety of automatic test equipment, known or available on the market. The virtual composite instruments are free from the normal constraints imposed by hardware implementations. Creation of the virtual composite instruments allows a single piece of automatic test equipment system to emulate many implementations of automatic test equipment, providing higher utilization, and therefore a lower cost test solution for device manufacturers. The test instruments are preferably object controls and are preferably instantiated and controlled by the test system server. This allows multiple users to control the tester simultaneously across, for example, the Internet.

Abstract: A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.

Abstract: A method and apparatus is provided to utilize the configurability of a programmable logic device (PLD), so as to reduce the complexity of special test equipment (STE) fixtures that are required to test the PLD. The output drivers of certain I/O buffers of the PLD that are not under test may be configured to exhibit a particular impedance magnitude. The impedance magnitude of the output drivers that are not under test may then be used to supply the reference impedance that is required by the digitally controlled impedance (DCI) controllers of the I/O buffers that are under test. The DCI controllers may then correctly configure the impedance magnitude of the respective I/O buffers under test, so as to test the functionality of the controlled impedance buffers for I/O standards that require controlled impedance.

Abstract: A test carrier 10 for storage devices 38 comprising a carrier base 12; a slider tray 16 slidably mounted to the carrier base 12, the slider tray 16 having at least one aperture for receiving a storage device 38 therein; at least one storage device connector 20 connected to the carrier base 12; and a tester interface 22, where, when the slider tray 16 is in a first position, the storage device 38 can be received within the at least one aperture of the slider tray 16 and, when the slider tray 16 is in a second position, an interface of the storage device 38 mates with the storage device connector 20; appropriate circuitry contained in the carrier base 12 connecting the tester interface 22 and the storage device connector 20 thereafter allowing the storage device 38 to be tested via the tester interface 22.

Abstract: A method of analysing tachometer and vibration response data from an apparatus having one or more rotary components is provided. The method comprises the steps of: providing vibration response data and corresponding tachometer data from the apparatus for a period over which a rotary component of the apparatus varies in rotational speed, the tachometer data being for that component; repeatedly performing at intervals throughout the period the sub-steps of: determining a forcing frequency of the component from the tachometer data and a corresponding vibration response frequency of the apparatus from the vibration response data, comparing the forcing and vibration response frequencies to determine the relative phase difference between the frequencies, and determining the corresponding amplitude of the vibration response from the vibration response data; and plotting the relative phase differences and vibration amplitudes on a polar diagram.

Abstract: System and method for configuring a client system, e.g., a measurement system. First input is received from a client system over a network requesting access to a plurality of configuration diagrams comprising respective solutions to respective tasks. At least a subset of the plurality of configuration diagrams is displayed on a display device of the client system for viewing by a user. Second input is received from the client system selecting one of the displayed configuration diagrams indicating a solution for a task to be performed by the client system. The solution is provided to the client system over the network, and may include the selected configuration diagram and/or pricing information for proposed products. The configuration diagrams are stored in a configuration diagram database. The stored configuration diagrams may be pre-defined solutions for pre-defined tasks, generated in response to received user requirements, and/or received from client systems and/or vendors.

Abstract: An automated switching system that enables a tester to establish different connections between multiple electronic devices is provided. The system includes a switching module that connects to the electronic devices. The switching module may be controlled to automatically couple the electronic devices to the testing device in different configurations. The switching module may include radio ports for selectively coupling devices one at a time and check ports for concurrently coupling one or more of the devices. The system may also be configured to provide a time-varying coupling between the tester and the electronic devices.

Abstract: A metrology recipe includes dynamic instructions that allow a metrology tool to perform a secondary metrology operation on a test wafer when previous measurement data indicates a process issue with that test wafer. The metrology recipe can instruct the metrology tool to perform an efficient default metrology operation on all test wafers, and perform a more in-depth secondary metrology operation on only those wafers that warrant additional scrutiny. In this manner, critical metrology data can be captured with a minimum of effect on metrology throughput. The metrology data used to determine whether or not the secondary metrology operation is to be performed can be generated from default metrology operations within the same tool, or can be generated by measurements taken by a completely different tool. Such “external” metrology data can be received via a communications network, either directly or from a server on the network for processing the metrology data.

Abstract: Disclosed herein is a semiconductor test apparatus for simultaneously testing a plurality of semiconductor devices. The semiconductor test apparatus includes a plurality of pattern generation boards, a DUT board, a backplane board, and a power supply unit.

Abstract: A system for evaluating a simulation includes a reference simulator configured to execute a simulation image to obtain golden data, a test simulator configured to execute the simulation image to obtain test data, and a comparator configured to generate a comparison result by comparing a portion of the golden data to a portion of the test data before the execution of the simulation image on the test simulator has completed.

Abstract: A method, system and program product are disclosed for optimizing a fleet of measurement systems. One embodiment determines a tool matching precision (TMP) and a fleet measurement precision (FMP) and normalizes these metrics across applications. An optimization is carried out in which usage weighting factors are assigned to each measurement system while enforcing usage enforcement rule(s) to ensure that each measurement system is optimally used and each application is adequately covered. The optimization re-assigns usage weighting factors to minimize a normalized FMP metric and enforce the usage enforcement rule(s).

Abstract: The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.

Abstract: A test apparatus that tests a device under test is provided, including a plurality of testing units that are mapped to a control bus address space and that test the device under test; a control processor that executes a plurality of test control programs to control each testing unit corresponding to each test control program; a plurality of address registers that are mapped to a control processor address space and store an address in the control bus address space of one of the testing units when written thereon by the control processor; and a plurality of data registers that are mapped to the control processor address space, that are disposed to correspond one-to-one with the plurality of address registers, and that store data that is written thereto and read therefrom by the testing unit designated by the address stored in the corresponding address register.

Abstract: A circuit board diagnostic operating center (10) including a large flat panel display (18) used for displaying the test system assets (instruments 12) and the circuit card assembly (CCA) schematic diagram, a small flat panel display (20) to display ancillary information, a computer (24) that executes the system application program and provides the means to communicate with automated test equipment. The diagnostic operating center may contain industry standard programmable equipment and instrumentation, or may contain independent instrumentation, or a combination. Physical CCA signal to operating center instrumentation interconnections are accomplished via a cross-point matrix (16). A graphical user interface (GUI) in combination with diagnostic operating center software and hardware provides an interactive means to visually create and store test sequences by capturing the technician's diagnostic methodology.

Abstract: The present invention provides a system of testing semiconductor devices. The system comprises a central host computer, an array of user computers (the array), and a HU (Host-User) network as the mean of communication between them. Two user computers are dedicated to one test instrument via UI connections in the instrument test head, a first user computer can be assigned to perform the tasks of generating and delivering data to the test instrument, while a second user computer can be assigned to perform the tasks of receiving and processing information from the same test instrument.