Contouring Patents (Class 702/167)
  • Publication number: 20110106492
    Abstract: Provided is a waist belt for automatically measuring a waist circumference. The waist belt includes a belt part (10) and a buckle part (20). The belt part has a plurality of magnets (11) attached thereto at a predetermined interval. The buckle part includes two or more magnetic field sensors sensing the plurality of magnets attached to the belt part, an operation processor processing and analyzing signals obtained by the magnetic field sensors, and a display displaying a measurement result of a waist circumference obtained by the operation processor.
    Type: Application
    Filed: February 11, 2009
    Publication date: May 5, 2011
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Yong-Won Jang, In-Bum Lee, Seung-Chul Shin, Seung-Hwan Kim, Seon-Hee Park
  • Publication number: 20110098992
    Abstract: A projection operator framework is described to analyze the concept of localized normal-vector fields within field-material interactions in a spectral basis, in isotropic and anisotropic media. Generate a localized normal-vector field n in a region of the structure defined by the material boundary, decomposed into sub-regions with a predefined normal-vector field and possibly corresponding closed-form integrals. Construct a continuous vector field F using the normal-vector field to select continuous components ET and Dn. Localized integration of normal-vector field n over the sub-regions to determine coefficients of, C. Determine components Ex, Ey, Ez of the electromagnetic field by using field-material interaction operator C to operate on vector field F. Calculate electromagnetic scattering properties of the structure using the determined components of the electromagnetic field.
    Type: Application
    Filed: October 15, 2010
    Publication date: April 28, 2011
    Applicant: ASML Netherlands B.V.
    Inventors: Martijn Constant VAN BEURDEN, Irwan Dani Setija, Remco Dirks
  • Publication number: 20110098971
    Abstract: A form measuring device includes: a measuring unit configured to detect a height at each position in a reference axis direction of a measured object and measure a cross-sectional form of the measured object; and an arithmetic unit configured to synthesize a plurality of form measurement data, obtained by repeated measurements of the form of the same measured object by the measuring unit, and calculate synthesized form measurement data. In the synthesis of the form measurement data, the arithmetic unit is configured to calculate shift amounts in the reference axis direction and a height direction of the form measurement data with respect to the synthesized form measurement data and align the form measurement data in the reference axis direction and the height direction based on the calculated shift amount.
    Type: Application
    Filed: October 21, 2010
    Publication date: April 28, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Tomonori Goto, Jyota Miyakura
  • Patent number: 7933740
    Abstract: Arrangements and methods for performing structural clustering between different time series. Time series data relating to a plurality of time series is accepted, structural features relating to the time series data are ascertained, and at least one distance between different time series via employing the structural features is determined. The different time series may be partitioned into clusters based on the at least one distance, and/or the k closest matches to a given time series query based on the at least one distance may be returned.
    Type: Grant
    Filed: August 31, 2009
    Date of Patent: April 26, 2011
    Assignee: International Business Machines Corporation
    Inventors: Vittorio Castelli, Michail Vlachos, Philip S. Yu
  • Patent number: 7927225
    Abstract: A device for tracking a golfer's shot during a round of golf wherein the device comprises a housing, a battery having no more than 225 milliamp hours of power, a microprocessor and an accelerometer. The accelerometer is preferably a multiple axis accelerometer. The circuit is preferably utilized with a device for shot tracking.
    Type: Grant
    Filed: May 14, 2010
    Date of Patent: April 19, 2011
    Assignee: Callaway Golf Company
    Inventors: Joseph Balardeta, Scott Denton
  • Publication number: 20110087457
    Abstract: Systems, processes, articles of manufacture, and techniques may be used to determine a machining shape for a surface to be machined. In particular implementations, determining a machining shape may include retrieving stored surface measurements for a surface to be machined, the measurements representing the surface at a plurality of points for each of a number of measurement locations on the surface, and analyzing the measurements to determine a shape to which the surface should be machined. Determining a machining shape may also include determining the surface that may be achieved by machining to the determined shape, analyzing the determined surface to determine whether it is acceptable, and storing the determined shape based on whether the determined surface is acceptable.
    Type: Application
    Filed: October 9, 2009
    Publication date: April 14, 2011
    Applicant: Furmanite Worldwide, Inc.
    Inventors: George Petrescu, James Edd Wheeler
  • Publication number: 20110085175
    Abstract: Systems, processes, articles of manufacture, and techniques may be used to measure a surface to be machined. In particular implementations, a representation of a surface to be machined may be determined. Measuring the surface may include measuring a plurality of surface points at each of a plurality of surface measurement locations with a measurement system moving over a surface and measuring the position of the measurement system. Determining a representation of the surface to be machined may include determining an estimated shape for the surface based on the surface measurements at the surface measurement locations. The surface measurements, the surface measurement locations, and the estimated shape may be stored in computer memory for future retrieval and use.
    Type: Application
    Filed: October 9, 2009
    Publication date: April 14, 2011
    Applicant: Furmanite Worldwide, Inc.
    Inventors: George PETRESCU, James Edd WHEELER
  • Patent number: 7921575
    Abstract: A method is provided for assembling a measurement device for use in measuring a machine component. The method includes providing a coordinate measuring machine (CMM). The method also includes combining ultrasonic inspection (UT) capabilities and CMM capabilities to form an inspection probe. The inspection probe is installed on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures internal boundaries of the machine component with the UT capabilities.
    Type: Grant
    Filed: December 27, 2007
    Date of Patent: April 12, 2011
    Assignee: General Electric Company
    Inventors: Francis Howard Little, Yanyan Wu, Jian Li, Nicholas J. Kray
  • Publication number: 20110071790
    Abstract: An unmoldability determination apparatus includes: a normal line calculation unit that calculates a normal line extending from a point on each of surfaces constituting a three-dimensional shape of a molded product; an opposite direction component determination unit that determines whether or not the normal line calculated on each surface has an opposite direction component which is a directional component opposite to a mold release direction of a mold of the molded product prescribed for the each surface; a reach determination unit that, when a surface having a point at which the normal line having the opposite direction component is calculated is a projection surface, determines whether or not there is another surface on the molded product which one of a line extending from the projection surface in the mold release direction and a line extending in a direction opposite to the mold release direction reaches; and an unmoldability determination unit that, when there is another surface which both of the line ex
    Type: Application
    Filed: April 21, 2010
    Publication date: March 24, 2011
    Applicant: FUJI XEROX CO., LTD.
    Inventors: Toshihiro NUMAUCHI, Masaaki Hagiwara, Hiroaki Nakazato, Katsumi Takezaki
  • Publication number: 20110063627
    Abstract: Plasmon energy is produced by exciting a plasmon resonance at least one excitation position on a first surface of a first material, and the plasmon energy is detected at at least one measurement position on the first surface after the plasmon energy has propagated from the at least one excitation position to the at least one measurement position. An attenuation of plasmon energy is determined along a plurality of paths between the at least one excitation position and the at least one measurement position, and relative distances between the first surface and a second surface of a second material are determined at a plurality of points on at least one of the surfaces based on the determined attenuation of plasmon energy along the plurality of paths.
    Type: Application
    Filed: November 10, 2010
    Publication date: March 17, 2011
    Inventor: Roderick A. Hyde
  • Publication number: 20110060552
    Abstract: With little cost and time, this invention makes high-precision measurements over an entire surface of a substrate to check how well devices are fabricated. The devices include integrated circuits, magnetic heads, magnetic discs, solar cells, optical modules, light emitting diodes and liquid crystal display panels—the ones that are fabricated on a substrate by repetitively performing deposition, resist application, exposure, development and etching. The method of this invention involves inputting multipoint measured data and a number of points used for measurement and calculating measuring coordinates by the measuring coordinate calculation program 1161. Next, based on the calculated measuring coordinates, the measuring program 1162 measures device characteristics, such as dimensions of the devices.
    Type: Application
    Filed: July 19, 2010
    Publication date: March 10, 2011
    Applicant: Hitachi, Ltd.
    Inventor: Makoto ONO
  • Patent number: 7895009
    Abstract: This disclosure provides for an impression scanner system having improved calibration having a housing and a calibration plate of known geometry. The calibration plate has a plurality of different shapes thereon. The system also has a radiation source for emitting radiation towards the shapes on the plate and a surface for reflecting images created by the radiation on the shapes. A sensor for receiving the images of the shapes as the plate moves relative to the housing is also provided. A processor compares known geometry of the plate to the images received by the sensor and calibrates the sensor based upon the known geometry and images to reduce system aberration and distortion.
    Type: Grant
    Filed: November 7, 2008
    Date of Patent: February 22, 2011
    Assignee: Amfit, Inc.
    Inventors: Arjen Sundman, Jeffery L. Davis
  • Patent number: 7890294
    Abstract: Arrangements are provided for performing structural clustering between different time series. Time series data relating to a plurality of time series is accepted, structural features relating to the time series data are ascertained, and at least one distance between different time series via employing the structural features is determined. The different time series may be partitioned into clusters based on the at least one distance, and/or the k closest matches to a given time series query based on the at least one distance may be returned.
    Type: Grant
    Filed: May 5, 2008
    Date of Patent: February 15, 2011
    Assignee: International Business Machines Corporation
    Inventors: Vittorio Castelli, Michail Vlachos, Philip S. Yu
  • Patent number: 7877227
    Abstract: A surface measurement instrument (1) for obtaining surface characteristic data of a sample surface (13) is described. Relative movement between a reference surface (11) and a sample support (15) is caused to occur while a sensor (16) senses light intensity at intervals along a scan path (SP) to provide a series of intensity values representing interference fringes produced by a region of a sample surface (13) during said relative movement and from which series of intensity values surface characteristic data can be derived. The sample support (15) is both translatable and tiltable in at least one direction perpendicular to a scan direction so that the sample support (15) can be both tilted to cause the scan path (SP) to be normal to the sample surface region and translated to compensate for translation movement due to the tilting.
    Type: Grant
    Filed: February 9, 2007
    Date of Patent: January 25, 2011
    Assignee: Taylor Hobson Limited
    Inventors: Ivor McDonnell, Andrew Douglas Bankhead, Daniel Ian Mansfield
  • Publication number: 20110015885
    Abstract: A reference mirror 21 is disposed on a table 2, a first laser displacement sensor L1 for measuring a machined surface of a workpiece W and a second laser displacement sensor L2 for measuring a reference surface of the reference mirror 21 are disposed to a tool holder 3. A measurement motion applying section 24 causes the table 2 and the tool holder 3 to relatively move in a sinusoidal trajectory, and a sensitivity calculating section 28 calculates sensitivity of the first laser displacement sensor L1 based on machined-surface displacement data and reference-surface displacement data which are measured during the relative movement. Subsequently, an actual shape data calculating section 29 corrects the machined-surface displacement data based on the calculated sensitivity, and calculates actual shape data of the machined surface by taking the difference between the corrected machined-surface displacement data and the reference-surface displacement data.
    Type: Application
    Filed: May 12, 2010
    Publication date: January 20, 2011
    Applicant: MORI SEIKI CO., LTD.
    Inventors: Atsushi MATSUBARA, Iwao YAMAJI, Daisuke KONO, Yusuke KOIKE
  • Patent number: 7865330
    Abstract: A system and method for measuring a curve of an object includes aligning the ideal curve and the real point-cloud of the object, and defining a plurality of tolerance ranges for an area of a real curve of the object having a tolerance in a predetermined range. The method further includes determining a closest ideal point on the ideal curve corresponding to each real point in the real point-cloud, and assigning a serial number to each real point in the real point-cloud according to a sequence of the closest ideal points on the ideal curve. Furthermore, the method includes generating the real curve by connecting every two real points in the real point-cloud according to the serial number, and assigning a color to each line-segment according to the tolerance range in which two closest distances corresponding to two end-points of each line-segment fall.
    Type: Grant
    Filed: April 26, 2009
    Date of Patent: January 4, 2011
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Xin-Yuan Wu
  • Publication number: 20100332438
    Abstract: The present disclosure relates to methods for predicting warp of a wood product produced from a log. Some embodiments include performing a three dimensional scan of the log to obtain geometric data, using the geometric data to construct a log profile, partitioning the geometric data into geometric components, removing one or more selected geometric components to create one or more residual grid profiles, deriving geometric statistics from the one or more residual grid profiles or from the log profile, and entering the geometric statistics into a model for predicting warp of the wood product. The geometric statistics may include orientation dependent and orientation independent statistics.
    Type: Application
    Filed: June 29, 2009
    Publication date: December 30, 2010
    Applicant: Weyerhaeuser NR Company
    Inventors: Mitchell R. Toland, Chih-Lin Huang, Mark A. Stanish, Stanely L. Floyd
  • Patent number: 7853429
    Abstract: Evaluating irregularities in surfaces of objects such as semiconductor wafers using a thickness profile of a surface section and analyzing the profile to obtain information of an irregularity start position, magnitude, and span along with surface slope and height information.
    Type: Grant
    Filed: April 23, 2007
    Date of Patent: December 14, 2010
    Assignee: KLA-Tencor Corporation
    Inventors: Rabi Fettig, Jaydeep Kumar Sinha
  • Publication number: 20100299103
    Abstract: A 3D shape measurement apparatus for measuring a 3D shape of an object existing on a measurement area, comprising, a pattern projection unit for projecting a pattern having a periodicity onto the measurement area, and a capturing unit for capturing an image of the area where the pattern is projected, wherein the measurement area is specified by a reference plane, a projection area of the pattern projection unit, and a capturing area of the capturing unit, and the pattern projection unit projects the pattern to be focused on the reference plane. The apparatus further comprises a first calculation unit for calculating phase information of a pattern of the captured image, a second calculation unit for calculating defocus amounts of the pattern in the captured image, and a third calculation unit for calculating a 3D shape of the object based on the phase information and the defocus amounts.
    Type: Application
    Filed: May 14, 2010
    Publication date: November 25, 2010
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Hiroshi Yoshikawa
  • Patent number: 7840374
    Abstract: The invention relates to a method and device for measuring an object for measurement, comprising at least one reference structure for the definition of an object coordinate system, fixed with relation to the object, by means of a measuring system, which comprises at least one sensor system for recording a contour of the object for measuring in a measurement coordinate system. According to the invention, the object for measurement is placed in a measuring position in the recording region of the sensor system, the position of the object coordinate system is fixed by means of the reference structure, the object coordinate system is linked to the measurement coordinate system, the sensor system is turned about a rotation axis relative to the object for measurement, in order to determine contour data and a processing of the contour data carried out in an analytical unit, taking into account the position of the object coordinate system. The invention further relates to an application for contour determination.
    Type: Grant
    Filed: March 19, 2005
    Date of Patent: November 23, 2010
    Inventor: Jan Bernd Lugtenburg
  • Publication number: 20100290002
    Abstract: A method for determining a contour data set of a spectacle frame rim comprising the steps of: a) providing a plurality (N) of three dimensional measured points along a contour of a spectacle frame rim; b) calculating a plurality of best torus that fits P points chosen among the N measured points and where P is equal or more than 4; c) selecting the (T) points among the N measured points that deviate from one of the best torus more than a threshold value; and d) forming the contour data set with (N-T) three dimensional measured points where the T selected points of step c) are excluded from the list of three dimensional measured points of step a).
    Type: Application
    Filed: December 23, 2008
    Publication date: November 18, 2010
    Applicant: Essilor International (Compagnie Generale D"Optique)
    Inventors: Frédéric Dubois, David Freson
  • Patent number: 7830374
    Abstract: A system for integrating dispersed point-clouds of an object is provided. The system includes a fixture for fixing an object, a measurement machine to scan all surfaces of the object and a computer. The fixture, which has three reference balls, is 360-degree rotatable. The computer includes a point-cloud reading module, a sphere fitting module, a computing module, a matching module and an aligning module. The system utilizes three reference objects to integrate dispersed point-clouds of multiple scans of the object, restore original space location relations of the point-clouds, so as to obtain a complete space point-cloud of the object with simple operation and higher precision. A related method is also provided.
    Type: Grant
    Filed: June 28, 2007
    Date of Patent: November 9, 2010
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Xin-Yuan Wu
  • Patent number: 7827003
    Abstract: Distances from three displacement meters arranged in a first direction to three measuring points arranged along a measurement line that extends in the first direction on a surface of an object to be measured are measured while a movable body, which is either the three displacement meter or an object to be measured, is moved in the first direction relative to a stationary body, which is the other one. Solution candidates are determined which are defined by two profiles among a surface profile along the measurement line, a profile of locus curve which is the locus a reference point fixed to the movable body, and a profile of a pitching component accompanied with the movement of the movable body. One candidate solution with the highest fitness is extracted by applying a genetic algorithm using a fitness function defined on the basis of the other profile.
    Type: Grant
    Filed: October 28, 2009
    Date of Patent: November 2, 2010
    Assignee: Sumitomo Heavy Industries, Ltd.
    Inventors: Yoshihisa Kiyota, Kouichi Ichihara
  • Publication number: 20100274525
    Abstract: Laser scanning measurement systems and methods are disclosed that allow for surface shape measurements of otherwise hidden portions of an object's surface. The system includes a laser system that scans a laser beam over a scan path, a photodetector that detects light reflected from the object's surface, and a processor adapted to process detector signals from the photodetector to determine a two-dimensional (2D) surface shape representation and a three-dimensional (3D) surface shape profile representation. The system includes a mirror(s) configured to direct the scanned laser beam to one or more portions of the object surface that cannot be directly irradiated by the laser, and that allows the photodetector to detect light reflected from the one or more hidden portions via the mirror(s).
    Type: Application
    Filed: October 28, 2008
    Publication date: October 28, 2010
    Applicant: Corning Incorporated
    Inventor: Leon Robert Zoeller, III
  • Publication number: 20100248091
    Abstract: A photomask blank which is manufactured by depositing a phase shift film on a substrate and irradiating the phase shift film with high-energy radiation to effect substrate shape adjusting treatment is inspected by measuring a surface topography of the photomask blank after the substrate shape adjusting treatment, removing the phase shift film from the photomask blank, measuring a surface topography of the treated substrate after removal of the phase shift film, and comparing the surface topographies, thereby evaluating a warpage change before and after removal of the phase shift film, due to a stress of the phase shift film having undergone substrate shape adjusting treatment.
    Type: Application
    Filed: March 30, 2010
    Publication date: September 30, 2010
    Inventors: Yukio INAZUKI, Hideo Kaneko, Hiroki Yoshikawa
  • Patent number: 7805258
    Abstract: A method of testing a wafer after a current top layer is formed over the wafer. Stress data is collected for the wafer after forming the current top layer. The stress data is derived from changes in wafer curvature. The stress data includes: stress-xx in an x direction and stress-yy in a y direction for each area of a set of finite areas on the wafer, the stress-xx and stress-yy both being derived from wafer-curvature-change-xx in the x direction for each area of the set of finite areas and from wafer-curvature-change-yy in the y direction for each area of the set of finite areas; and the stress-xy being derived from wafer-curvature-change-xy, wherein wafer-curvature-change-xy is a change in wafer twist in the x-y plane for each area of the set of finite areas. A stress gradient vector (and/or its norm) is calculated and used to evaluate the investigating single or multiple accumulated layer.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: September 28, 2010
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Hsueh-Hung Fu, Chih-Wei Chang, Shih-Chang Chen, Chin-Piao Chang, Shing-Chyang Pan, Wei-Jung Lin, Tsung-Hsun Huang
  • Publication number: 20100241396
    Abstract: A method and apparatus are disclosed for providing image data for constructing an image of a region of a three dimensional target object. The method includes the steps of providing incident radiation, via at least one detector detecting an intensity of radiation scattered by the target object, repositioning incident radiation relative to the target object, subsequently detecting the intensity of radiation scattered by the target object, determining a probe function indicating an estimate of at least one characteristic of the incident radiation at one or more depths of the object and providing image data from which an image of one or more regions of the object may be constructed via an iterative process using the probe function.
    Type: Application
    Filed: February 25, 2008
    Publication date: September 23, 2010
    Inventor: John Marius Rodenburg
  • Patent number: 7774157
    Abstract: A method of checking turbomachine blades is presented that may be implemented using a computer and a measuring device. Turbomachine blades compatible with embodiments of the method have a profile including a centerline, suction face, pressure face, leading edge and trailing edge. The method measures geometrical coordinates of many points on a blade section profile, calculates an aerodynamic parameter of the blade section as a function of the measured coordinates, verifies whether the calculated aerodynamic parameter value departs from a valid range of parameters from a reference blade, and validates or rejects the blade depending upon whether the value of the aerodynamic parameter falls within the valid range.
    Type: Grant
    Filed: July 26, 2006
    Date of Patent: August 10, 2010
    Assignee: Snecma
    Inventors: Alain Henri Daniel Bouron, Jean-Francois Escuret, Didier Merville, Laurent Villaines
  • Patent number: 7774160
    Abstract: Conventional cryptographic methods that are based on elliptic curves are prone to side-channel attacks. Previously known methods for preventing side-channel attacks have the disadvantage of requiring high arithmetic capacity and a large amount of available memory space. The proposed method overcomes said disadvantage by using a process for verifying points on elliptic curves which saves arithmetic capacity and memory space.
    Type: Grant
    Filed: November 27, 2006
    Date of Patent: August 10, 2010
    Assignee: Siemens Aktiengesellschaft
    Inventors: Michael Braun, Anton Kargl, Bernd Meyer
  • Patent number: 7764386
    Abstract: A method and system are provided which can easily determine relative positions and postures of a three-dimensional measurement device and an object when the measurement device is used to measure the object using a manipulator. The method includes fixing one of the measurement device and the object, supporting the other at a support point with the manipulator so that a position and support posture of the other can be changed, conducting first measurement with the support point being set to first position and posture, changing the support point to second position and posture so that the second position is a position where the posture is changed, about a reference position within a measurable area of the measurement device in the first measurement, to an opposite side by a degree equal to a portion corresponding to a change from the first posture to the second posture, and conducting second measurement.
    Type: Grant
    Filed: September 26, 2006
    Date of Patent: July 27, 2010
    Assignee: Konica Minolta Sensing, Inc.
    Inventors: Shinichi Horita, Yoshihisa Abe
  • Patent number: 7756673
    Abstract: An exemplary measuring device (100) for measuring aspects of objects includes a first contour measuring probe (10), a second contour measuring probe (20) and a processor (30). The first contour measuring probe (10) has a first tip extension (16) and a first displacement sensor (19). The first tip extension (16) is slidable in a first direction. The first displacement sensor (19) is used to sense a displacement of the first tip extension (16). The second contour measuring probe (20) has a second tip extension (26) and a second displacement sensor. The second tip extension (26) is slidable in the first direction. The second displacement sensor is used to sense a displacement of the second tip extension (26). The processor (30) is electrically connected to the first displacement sensor (19) and the second displacement sensor respectively.
    Type: Grant
    Filed: December 28, 2007
    Date of Patent: July 13, 2010
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Qing Liu, Jun-Qi Li
  • Patent number: 7756321
    Abstract: Shims used to join part assemblies are automatically designed and fabricated without the need for fitting part assemblies together in order to determine the exact dimensions of voids filled by the shims. The locations of key features on part assemblies are surveyed using a merged photogrammetry and laser tracking technique that generate the dimensions of a virtual shim. The dimensions of the virtual shim are contained in a digital file that can be used to automatically fabricate the shim using automated fabrication equipment such as a CNC machining center. The automated virtual shim design may be modified to reflect the effect of part assembly fit on performance characteristics of the aircraft.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: July 13, 2010
    Assignee: The Boeing Company
    Inventors: Bobby J. Marsh, Thomas Vanderwiel, Kinson VanScotter, Michael Thompson
  • Publication number: 20100169042
    Abstract: A system for measuring a shape, includes an external storage unit storing tolerances of first and second shape factors defining a design shape of a measuring object; a first measuring tool measuring the first shape factor of the measuring object to obtain measurement data; and a measurement processing unit determining a shape of the measuring object. The measurement processing unit includes; a comparison module comparing the measurement data of the first shape factor with the tolerance of the first shape factor; a verification module composing a predicted shape using the measurement data and verifying whether the predicted shape is formed as a figure; a calculation module calculating predicted data of the second shape factor from the predicted shape; and a determination module determining a measurement shape by comparing the predicted data with the tolerance of the second shape factor.
    Type: Application
    Filed: April 2, 2008
    Publication date: July 1, 2010
    Applicant: Dai Nippon Printing Co., Ltd.
    Inventors: Yuki Aritsuka, Morihisa Hoga
  • Publication number: 20100161273
    Abstract: A coherence scanning interferometer (2) carries out: a coherence scanning measurement operation on a surface area (81) carrying a structure using a low numeric aperture objective so that the pitch of the surface structure elements (82) is much less that the spread of the point spread function at the surface (7) to obtain structure surface intensity data; and a coherence scanning measurement operation on a non-structure surface area (83), which may be part of the same sample or a different sample, to obtain non-structure surface intensity data. A frequency transform ratio determiner (105) determines a frequency transform ratio (the HCF function) related to the ratio between the structure surface intensity data and the non-structure surface intensity data.
    Type: Application
    Filed: November 22, 2006
    Publication date: June 24, 2010
    Applicant: TAYLOR HOBSON LIMITED
    Inventor: Daniel Ian Mansfield
  • Publication number: 20100149546
    Abstract: An optical object measurement apparatus includes a light source for generating a low-coherent light beam, which is swept via an array of pinholes on a Nipkow disk that rotates about an axis. A beam splitter splits the swept light beam into a probe light beam toward an object to be measured and a reference light beam toward a reference optical path. The probe light beam from the object and the reference light that has traveled along the reference optical path are combined in the beam splitter to produce interference light. A two-dimensional image-capturing device detects the interference light and produces a video signal to provide reflection intensity information of the interior of the object. This allows an interference optical system to be readily realized and tomographic images of an object to be observed at high levels of resolution and contrast.
    Type: Application
    Filed: December 11, 2008
    Publication date: June 17, 2010
    Inventors: Koji Kobayashi, Naoki Kobayashi
  • Publication number: 20100153024
    Abstract: The invention refers to an apparatus for mapping a surface profile of a surface of an object, by which the apparatus yields slope data. The slope data of the apparatus may comprise measurement errors, which according to the invention shall be detected and corrected for. It is suggested that a computational entity calculates for all measurement values the curl of the slope data for determining surface locations at which the measurement values exhibit measurement errors. In a second step the proposal is given with which the measurement values can be corrected.
    Type: Application
    Filed: June 27, 2006
    Publication date: June 17, 2010
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Willem Potze, Willem Dirk Van Amstel
  • Publication number: 20100149547
    Abstract: The present invention provides a measurement apparatus that illuminates a surface to be tested having an aspheric surface using light beams that form spherical waves to measure a figure of the surface to be tested, including a detection unit configured to detect interference patterns between light beams from the surface to be tested and light beams from a reference surface, and a controller configured to control processing for obtaining a figure of the surface to be tested based on the interference patterns detected by the detection unit.
    Type: Application
    Filed: December 8, 2009
    Publication date: June 17, 2010
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Akihiro Nakauchi
  • Patent number: 7725299
    Abstract: Techniques are presented for a multi-tier distributed frame work for mass configuration of products by design and synthesis. Products are represented as components having hierarchical relationships with one another. The components include form information, function information, behavioral information, and constraint information. Components may be created from scratch or retrieved from a plurality of sources over a network. In some embodiments, the components may include optimization constraints and derived from other components to meet the optimization constraints.
    Type: Grant
    Filed: February 28, 2005
    Date of Patent: May 25, 2010
    Assignee: Purdue Research Foundation
    Inventors: Karthnik Ramani, Srikanth Devanathan, Jayanti Subramaniam, Robert Thomas Brent Cunningham, Christopher Peters
  • Publication number: 20100121606
    Abstract: This invention relates to methods for measuring geometrical parameters of a wind turbine blade, the method comprising placing a surveying instrument with a view to the root of the blade and measuring the blade. Methods are described for measuring parameters such as the blade length, the blade bending, the twist and the alpha-angle of the blade. This is accomplished by the use of a surveying instrument by which is measured a number of points or markings on the root of the blade, the blade tip and/or some reference markings on the blade. The invention further relates to the use of a surveying instrument for measuring and/or marking geometrical parameters on a wind turbine blade and for measuring deformations of a wind turbine blade.
    Type: Application
    Filed: April 21, 2008
    Publication date: May 13, 2010
    Applicant: LM GLASFIBER A/S
    Inventor: Jorgen Dahl Vestergaard
  • Publication number: 20100110448
    Abstract: A system and method for measuring the threaded surface of an internally threaded component is provided, where the inspection system includes at least one measuring probe, wherein the at least one measuring probe includes an emitter and a receiver and is sized and shaped to be positionable adjacent at least a portion of the threaded surface at an offset distance, wherein the emitter is configured to emit electromagnetic energy that is incident upon the threaded surface to generate reflected electromagnetic energy responsive to the threaded surface and wherein the receiver is configured to receive at least a portion of the reflected electromagnetic energy and generate threaded surface data. A processing device is also provided, wherein the processing device is in signal communication with the measuring probe to receive the threaded surface data and process the threaded surface data to determine physical characteristics of the threaded surface.
    Type: Application
    Filed: July 10, 2009
    Publication date: May 6, 2010
    Inventor: Stanley P. Johnson
  • Patent number: 7711495
    Abstract: For automatic identification of microorganisms collected on a carrier, a color image of the carrier surface with collected microorganisms is recorded and digitalized. The digitalized image is converted into a grayscale image and optionally converted subsequently into a silhouette image. When microorganisms are present, an image is produced with full-surface labeled objects of a first grayscale and a background of a second grayscale. Objects are identified in the grayscale and/or silhouette image by a model-based comparative method. Contours of the objects are marked in the color or grayscale image. Features of the objects in the color image and/or grayscale image are determined. The objects are classified based on the features. The classified objects are indicated and/or saved as species, name and/or code. Non-classified objects are indicated and/or saved as color, grayscale and/or silhouette image. Non-classified objects are subsequently discarded or added as a new case to the classification system.
    Type: Grant
    Filed: October 1, 2004
    Date of Patent: May 4, 2010
    Inventor: Petra Perner
  • Publication number: 20100106455
    Abstract: Distances from three displacement meters arranged in a first direction to three measuring points arranged along a measurement line that extends in the first direction on a surface of an object to be measured are measured while a movable body, which is either the three displacement meter or an objet to be measured, is moved in the first direction relative to a stationary body, which is the other one. Solution candidates are determined which are defined by two profiles among a surface profile along the measurement line, a profile of locus curve which is the locus a reference point fixed to the movable body, and a profile of a pitching component accompanied with the movement of the movable body. One candidate solution with the highest fitness is extracted by applying a genetic algorithm using a fitness function defined on the basis of the other profile.
    Type: Application
    Filed: October 28, 2009
    Publication date: April 29, 2010
    Applicant: SUMITOMO HEAVY INDUSTRIES, LTD.
    Inventors: Yoshihisa KIYOTA, Kouichi ICHIHARA
  • Publication number: 20100094589
    Abstract: The correction method includes searching for one or more anomalous zones (S1, S2), if any, of the sensed curve (19), and if one or more anomalous zones are found, correcting the shape of each anomalous zone of the sensed curve.
    Type: Application
    Filed: December 14, 2007
    Publication date: April 15, 2010
    Applicant: Essilor International (Compagnie Generale d'Optique)
    Inventor: Romain Tesseraud
  • Publication number: 20100070236
    Abstract: A bolus that is intended to be irradiated during radiotherapy. Advantageously, the bolus is made from a polyurethane gel.
    Type: Application
    Filed: February 27, 2008
    Publication date: March 18, 2010
    Inventors: François Campana, Jean-Yves Kristner, Jérémy Lachet, Nathalie Fournier-Bidoz
  • Publication number: 20100037695
    Abstract: A photoacoustic imaging apparatus is equipped with: light generating means, for emitting measuring light; light irradiating means, for irradiating the measuring light onto a target; ultrasound detecting means, for detecting ultrasonic waves which are generated in the target portion by the irradiation of the measuring light; and tomographic image obtaining means, for obtaining a tomographic image of the target based on signals of the detected ultrasonic waves. The light generating means includes a pulse laser and light modulating means, which are employed to emit a pulse train having a plurality of pulse beams having pulse widths within a range from 1 nsec to 100 nsec as the measuring light. The tomographic image obtaining means generates processed signals by performing a correlating process between transmission signals of the pulse train and the signals of the ultrasonic waves, and obtains the tomographic image of the target based on the processed signals.
    Type: Application
    Filed: August 13, 2009
    Publication date: February 18, 2010
    Inventors: Kazuhiro TSUJITA, Tadashi Kasamatsu
  • Publication number: 20100042363
    Abstract: One embodiment of a method of calculating an optical surface comprises calculating a meridional optical line of the surface. A ray is selected that passes a known point defining an end of a part of the optical line already calculated. The optical line is extrapolated from the known point to meet the ray using a polynomial with at least one degree of freedom. The polynomial is adjusted as necessary so that the selected ray is deflected at the extrapolated optical line to a desired target point. The polynomial is added to the optical line up to the point where the selected ray is deflected. The point where the selected ray is deflected is used as the known point in a repetition of those steps.
    Type: Application
    Filed: August 7, 2009
    Publication date: February 18, 2010
    Applicant: LPI-Europe, S.L.
    Inventors: Juan Carlos Miñano, Pablo Benítez, Fernando Muñoz
  • Publication number: 20100023299
    Abstract: An analysis apparatus includes an assignor assigning a physical property value corresponding to the kind of a material to each of regions formed by dividing a structural data representing a structure of a multilayer substrate, a determiner determining whether or not the each of the region belongs to a predetermined region in a layer of a predetermined kind, and a physical property value changer changing the physical property value of the region belonging to a predetermined region in a layer of a predetermined kind.
    Type: Application
    Filed: July 20, 2009
    Publication date: January 28, 2010
    Applicant: Fujitsu Limited
    Inventors: Tetsuyuki KUBOTA, Nobutaka ITOH
  • Publication number: 20100002950
    Abstract: Methods and apparatus to perform wavefront analysis, including phase and amplitude information, and 3D measurements in optical systems, and in particular those based on analyzing the output of an intermediate plane, such as an image plane, of an optical system. Measurement of surface topography in the presence of thin film coatings, or of the individual layers of a multilayered structure is described. Multi-wavelength analysis in combination with phase and amplitude mapping is utilized. Methods of improving phase and surface topography measurements by wavefront propagation and refocusing, using virtual wavefront propagation based on solutions of Maxwell's equations are described. Reduction of coherence noise in optical imaging systems is achieved by such phase manipulation methods, or by methods utilizing a combination of wideband and coherent sources.
    Type: Application
    Filed: March 11, 2005
    Publication date: January 7, 2010
    Applicant: ICOS VISION SYSTEMS NV
    Inventors: Yoel Arieli, Shay Wolfling, Emmanuel Lanzmann, Gavriel Feigin, Tal Kuzniz, Yoram Saban
  • Patent number: 7640137
    Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: December 29, 2009
    Assignee: Hitachi, Ltd
    Inventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
  • Publication number: 20090319224
    Abstract: A method for characterising the surface profile of a component comprises the steps of a) dividing the surface into at least two regions; b) for each region, measuring the surface and selecting a number of measured points to define a co-ordinate dataset for the region; c) for each region, applying a curve-fitting algorithm to the dataset for the region to define the surface profile of the region; d) combining the defined surface profiles for the regions to produce a defined surface profile for the aerofoil surface. The characterisation may be used in the design, analysis and manufacturing steps of product development, thereby decreasing the total time and work required.
    Type: Application
    Filed: June 21, 2007
    Publication date: December 24, 2009
    Applicant: ROLLS-ROYCE PLC
    Inventors: Andrew D. Jackson, Peter I. Wright, Michael A. Howard, Robert J. Stafford