Radiant Energy (e.g., X-ray, Infrared, Laser) Patents (Class 702/40)
  • Publication number: 20090177415
    Abstract: [Problem] To provide a surface roughness inspection system enabling suitable inspection even when the surface of the object being inspected is curved. [Means for Solution] A system having an imaging unit 20 having a line sensor 22 and scanning the surface of an object being inspected 101 in a direction perpendicular to the direction of extension of the line sensor 22 and outputting a density signal for each pixel from the line sensor 22 and a processing unit 50 processing the density signal from the line sensor 22 of the imaging unit 20, the processing unit 50 having a means for acquiring a pixel density value based on a density signal from the line sensor 22 (S2) and a density state generating means for generating a density state information Pf showing the density state in the scan direction of the object surface based on all of the pixel density values acquired for the object surface 101 being inspected (S7).
    Type: Application
    Filed: December 5, 2006
    Publication date: July 9, 2009
    Applicant: SHIBAURA MECHATRONICS CORPORATION
    Inventors: Yoshinori Hayashi, Hideki Mori
  • Patent number: 7549339
    Abstract: A method of identifying a flaw in a part is provided that includes vibrating a part to induce heat. The heat originates in any flaws in the part. A thermal image is obtained using, for example, an infrared camera. A mathematical representation of the thermophysics, such as the heat conduction or thermal energy equations using the boundary element method or finite element method is used to identify a source and an intensity of the heat identified with the thermal image. Using the source and intensity of the heat, flaw characteristics for the part can be determined. The method is employed using an inspection system that includes a vibration device for vibrating the part. An imaging device, such as an infrared camera, measures temperature on the surface of the part. An assumption is made or additional measurements are taken to obtain values for surface flux or surface heat transfer coefficients. A processor communicates with the imaging device for receiving the surface temperature.
    Type: Grant
    Filed: September 5, 2006
    Date of Patent: June 23, 2009
    Assignee: United Technologies Corporation
    Inventors: Alexander Staroselsky, Thomas J. Martin, Carroll V. Sidwell, Zhong Ouyang, Kevin D. Smith
  • Patent number: 7545502
    Abstract: Methods are provided for detecting compression wood, blue stain, or pitch in lumber. A light beam is projected towards the wood sample. Line or area cameras acquire images of light that is reflected from the wood sample. Based on the intensity of the reflected light at one or more locations on the wood sample, compression wood, blue stain, or pitch may be detected.
    Type: Grant
    Filed: September 27, 2006
    Date of Patent: June 9, 2009
    Assignee: Weyerhaeuser NR Company
    Inventor: Thomas J. Taylor
  • Patent number: 7541941
    Abstract: The present invention discloses a system for monitoring and estimating the consumption of energy resources in real-time. The system includes an interactive user module, a measuring unit and a wireless network. The measuring unit is interfaced to a utility meter. Optionally, the measuring unit can also function as a stand alone device. The measuring unit is further connected to the interactive user module via the wireless network. The system monitors energy resource consumption such as electricity, gas or water consumption in real-time, generates and displays graphs of energy resource consumption over user selected time periods and enables communication with at least one utility company. The system increases the users' awareness of their energy consumption and aids users in dynamic or deregulated pricing environments to shed load when the energy resource is most expensive. With knowledge of their energy use, the users can take proactive steps to control their energy consumption and save money.
    Type: Grant
    Filed: July 26, 2007
    Date of Patent: June 2, 2009
    Assignee: Greenbox Technology Inc.
    Inventors: Bradley D. Bogolea, Patrick J. Boyle, Andrei V. Shindyapin
  • Patent number: 7526388
    Abstract: Non-destructive testing is performed on individual pieces of scrap silicon using an energy dispersive x-ray fluorescent analyzer to determine from the obtained spectral data whether a prescribed impurity element is contained therein. The electrical resistivity of each piece of scrap silicon can be measured, and the concentration of the impurity element contained in the scrap on can be calculated from the resistivity.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: April 28, 2009
    Assignee: IIS Materials Corporation, Ltd.
    Inventors: Norichika Yamauchi, Takehiko Shimada
  • Patent number: 7487049
    Abstract: When detecting light scattered by an object to be inspected by using a pulse laser as a light source, noise increases unless a sampling repletion period of an A/D converter is determined so as to be related to a pulse oscillation repetition period of the light source. (1) The sampling repletion period of the A/D converter is set equal to the pulse oscillation repetition period of the light source or an integer times thereof, and the sampling is synchronized with oscillation of the light source. Or (2) the sampling repletion period of the A/D converter is set equal to a half-integer times the pulse oscillation repetition period of the light source. Even if a ripple component resulting from emission pulses of the light source remains in the scattered light signal supplied to the A/D converter remains, therefore, its influence can be eliminated or reduced.
    Type: Grant
    Filed: July 12, 2007
    Date of Patent: February 3, 2009
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Shigeru Matsui
  • Patent number: 7480574
    Abstract: The invention is directed to a system and method for detecting defects in a manufactured object. These defects may include flaws, delaminations, voids, fractures, fissures, or cracks, among others. The system utilizes an ultrasound measurement system, a signal analyzer and an expected result. The signal analyzer compares the signal from the measurement system to the expected result. The analysis may detect a defect or measure an attribute of the manufactured object. Further, the analysis may be displayed or represented. In addition, the expected result may be generated from a model such as a wave propagation model. One embodiment of the invention is a laser ultrasound detection system in which a laser is used to generate an ultrasonic signal. The signal analyzer compares the measured ultrasonic signal to an expected result. This expected result is generated from a wave propagation model. The analysis is then displayed on a monitor.
    Type: Grant
    Filed: October 28, 2004
    Date of Patent: January 20, 2009
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Peter W. Lorraine, Robert J. Filkins
  • Publication number: 20080312847
    Abstract: A method, apparatus, and computer usable program code for non-destructive detection of corrosion using quantum dots. In one embodiment, a surface of an area on a commodity associated with a set of quantum dots is tested. A pattern of wavelengths emitted by the set of quantum dots associated with the surface of the commodity is detected to form a quantum dot pattern. The quantum dot pattern is analyzed to determine whether corrosion has occurred in the area on the surface of the commodity.
    Type: Application
    Filed: June 15, 2007
    Publication date: December 18, 2008
    Inventors: Morteza Safai, Gary Georgeson
  • Patent number: 7460963
    Abstract: Device for health monitoring of a structure comprising a dielectric material of permittivity ?r, comprising a source of electromagnetic radiation, generating an electric field in the structure a detector measuring a component of the electric field, calculation means giving the value of ?r on the basis of the said component.
    Type: Grant
    Filed: March 30, 2004
    Date of Patent: December 2, 2008
    Assignees: Centre National de la Recherche Scientifique (CNRS), Office National d'etudes et de Recherches Aerospatiales (ONERA), Ecole Normale Superieure de Cachan
    Inventors: Michel Bernard Lemistre, Dominique Marc Placko
  • Patent number: 7460981
    Abstract: Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including, but not limited to, a presence of macro and micro defects. In this manner, a measurement device may perform multiple optical and/or non-optical metrology and/or inspection techniques.
    Type: Grant
    Filed: October 26, 2004
    Date of Patent: December 2, 2008
    Assignee: KLA-Tencor Technologies Corp.
    Inventors: Gary Bultman, Ady Levy, Kyle A. Brown, Mehrdad Nikoonahad, Dan Wack, John Fielden
  • Publication number: 20080281532
    Abstract: A system to facilitate reducing false train stops includes an infrared bearing scanner that is coupled to a processing unit. The processing unit is programmed to receive inputs from the infrared bearing scanner, generate a bearing profile for each bearing passing the Hot Box Detection System, assign a classification to each bearing profile, determine a quantity of bearing profiles assigned to each classification, and generate a maintenance alert if the quantity of bearings assigned to at least one classification exceeds a predetermined threshold. A method of reducing false trains stops is also described herein.
    Type: Application
    Filed: May 7, 2007
    Publication date: November 13, 2008
    Inventors: Benjamin Paul Church, Steven Hamerle
  • Publication number: 20080271509
    Abstract: There is provided a flexible rolling machine operative to form a metal panel. The machine includes a frame and a series of rollers. The machine includes at least one primary bottom roller, at least one secondary bottom roller, and at least one top roller. Each roller includes a cylinder. The cylinder comprises a proximal portion that is coupled to the frame and a distal portion that is coupled to at least one rolling member. The individual cylinders have independently adjustable lengths. The machine further includes a non-contact measuring system operative to measure the panel.
    Type: Application
    Filed: May 1, 2007
    Publication date: November 6, 2008
    Inventors: Ronald Young, Steven M. Riley
  • Publication number: 20080262752
    Abstract: The teachings provided herein are generally directed to a non-destructive method of measuring a moisture content profile across a dimension of a hygroexpansive, composite material using radiation and a volumetric shrinkage correction. The measurement of a series of moisture content profiles over time can provide, for example, a measure of the movement of moisture during the process of drying of the composite material.
    Type: Application
    Filed: March 28, 2008
    Publication date: October 23, 2008
    Applicant: The United States of America as Represented by the Secretary of Agriculture
    Inventor: Zhiyong Cai
  • Publication number: 20080237428
    Abstract: A honeycomb structure mounting base includes a mounting member having a structure mounting surface configured to contact an entire end face of a honeycomb structure including a periphery of the honeycomb structure; a preliminary mounting member having a preliminary mounting surface configured to have the honeycomb structure placed thereon before placement of the honeycomb structure on the mounting member; and an elevating mechanism configured to move the preliminary mounting member up and down in relation to the mounting member. The preliminary mounting surface is parallel to the structure mounting surface. The preliminary mounting surface has a shape allowing an entire periphery of the preliminary mounting surface to exist inside a periphery of the end face of the honeycomb structure in a case of superimposing the preliminary mounting surface onto an end face of the honeycomb structure.
    Type: Application
    Filed: October 4, 2007
    Publication date: October 2, 2008
    Applicant: IBIDEN CO., LTD.
    Inventors: Hiroyuki KOBAYASHI, Junji Furuya
  • Patent number: 7430481
    Abstract: A method of processing signals relating to a plurality of X-rays received in an X-ray spectrometry system that includes a pulse processor having a main channel and zero or more fast channels includes steps of receiving a main channel dead time signal and zero or more fast channel dead time signals generated by the pulse processor, detecting an occurrence of a plurality of piled-up X-rays in an X-ray pile-up sequence using one or more of the main channel dead time signal and the zero or more fast channel dead time signals, counting the X-rays in said pile-up sequence, and if one or more fast channels are present, classifying an energy band of each of the piled-up X-rays using one or more of the main channel dead time signal and the one or more fast channel dead time signals.
    Type: Grant
    Filed: January 12, 2007
    Date of Patent: September 30, 2008
    Assignee: R. J. Lee Group, Inc.
    Inventor: Richard B. Mott
  • Publication number: 20080195330
    Abstract: A crack inspection device (6) for a concrete structure (1) includes: storage means for storing raster data obtained by imaging a surface (2) of the concrete structure (1) having a crack (3); conversion means for performing raster vector conversion on the data obtained by digitizing the raster data; data superimposing means for superimposing the vector data of the crack (3) obtained by the conversion means on the graphic data of the surface (2) of the concrete structure (1) while matching the coordinates; and output means for outputting the superimposed data obtained by the data superimposing means.
    Type: Application
    Filed: November 1, 2005
    Publication date: August 14, 2008
    Applicant: Tooru Hara
    Inventors: Tooru Hara, Kenichi Kobori
  • Patent number: 7383142
    Abstract: A method and apparatus for resolving individual signals in detector output data, the method comprising determining a signal form of signals present in the data, making parameter estimates of one or more parameters of the signals, wherein the one or more parameters comprise at least signal temporal position, and determining the energy of the signals from at least the form and the parameter estimates.
    Type: Grant
    Filed: March 13, 2007
    Date of Patent: June 3, 2008
    Assignee: Southern Innovation International Pty Ltd.
    Inventors: Paul Andrew Basil Scoullar, Robin John Evans
  • Patent number: 7366620
    Abstract: Equipment extracts components of spatial frequency that need to be evaluated in manufacturing a device or in analyzing a material or process out of edge roughness on fine line patterns and displays them as indexes. The equipment acquires data of edge roughness over a sufficiently long area, integrates a components corresponding to a spatial frequency region being set on a power spectrum by the operator, and displays them on a length measuring SEM. Alternatively, the equipment divides the edge roughness data of the sufficiently long area, computes long-period roughness and short-period roughness that correspond to an arbitrary inspection area by performing statistical processing and fitting based on theoretical calculation, and displays them on the length measuring SEM.
    Type: Grant
    Filed: July 21, 2005
    Date of Patent: April 29, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsuko Yamaguchi, Hiroshi Fukuda, Hiroki Kawada, Tatsuya Maeda
  • Publication number: 20070288177
    Abstract: A method for processing thermography signals. A time series of radiometric data is measured from a surface (104) of an object (102) over a period of heating and subsequent cooling, and a mathematical curve (1, 2) is fit to the data. An amplitude aspect and one or more shape aspects are identified for each curve. The amplitude and shape aspects are then used together to characterize features such as defects in the object. The amplitude and shape aspects for an array of such data may be combined in a single noise-free visual display (100) by associating hue (color) with the shape-aspect and luminance (brightness) with the amplitude aspect. Optionally, a second shape aspect may be identified and associated with saturation on the display. A visible image of the object may be overlaid on the display.
    Type: Application
    Filed: June 6, 2006
    Publication date: December 13, 2007
    Inventors: Max Rothenfusser, Robert E. Shannon, Matthias Goldammer, Christian Homma
  • Publication number: 20070260406
    Abstract: An automated location system that includes providing the number of rows and columns of a receptacle to the automated location system; scanning the receptacle to determine changes in reflectivity; creating an X values list and a Y values list from the scan; and determining a location for each of a cavity from the X values list and from the Y values list.
    Type: Application
    Filed: May 2, 2007
    Publication date: November 8, 2007
    Applicant: DATA I/O CORPORATION
    Inventors: Simon B. Johnson, Lev M. Bolotin, Bradley Morris Johnson
  • Patent number: 7266234
    Abstract: Device and method to control the straightness and torsions of a long product (11), comprising at least two profile-detection devices (12a, 12b, 12c), each presenting a visual field (13) that includes a perimeter segment (18a, 18b, 18c) of the section of the product (11). The detection devices are aligned along the product (11) and are oriented so as to detect homologous perimeter segments (18a, 18b, 18c) located on different planes. The device also comprises a command unit which receives and compares with each other the section images detected at the same instant by the detection devices (12a, 12b, 12c) and determines, according to this comparison, the lack of straightness and/or the presence of torsions in the product (11).
    Type: Grant
    Filed: January 27, 2004
    Date of Patent: September 4, 2007
    Assignee: Danieli Automation SpA
    Inventor: Lorenzo Ciani
  • Patent number: 7262865
    Abstract: A method and apparatus for controlling when a calibration cycle is started for a metrology tool. The method and apparatus exploits a correlation between a drift of a first parameter (e.g., film thickness measurement drift) and a drift of a second parameter (e.g., CD measurement drift). One embodiment of the method comprises measuring a film thickness on one or more reference substrates to determine when a drift component of these measurements exceeds a pre-determined range and thereafter calibrating the metrology tool when the drift component of the film thickness measurements exceeds the pre-determined range. Generally, the drift of the film thickness measurement will occur prior to substantial drift of the CD measurement occurring.
    Type: Grant
    Filed: February 26, 2004
    Date of Patent: August 28, 2007
    Assignee: Applied Materials, Inc.
    Inventors: David Mui, Hiroki Sasano, Wei Liu
  • Patent number: 7202475
    Abstract: Disclosed are methods and apparatus for characterizing defects by using X-ray emission analysis techniques. The X-rays are emitted in response to an impinging beam, such as an electron beam, directed towards the sample surface where a defect resides. It may also be used to help determine where the void(s) are with respect to the interconnect structure. Methods disclosed are for spatially locating defects in or on integrated circuits. Also disclosed are methods for identifying the elemental composition of defects and spatially locating different elemental components of defects.
    Type: Grant
    Filed: March 8, 2004
    Date of Patent: April 10, 2007
    Assignee: KLA-Tencor Technologies Corporation
    Inventor: Anne L. Testoni
  • Patent number: 7194360
    Abstract: A method of simply and quickly determining ?-ray releasing nuclides having long half-life without carrying out a chemical separation is provided. By inputting a data of pulses incident to an ?-ray detector in a computer, obtaining time distribution of the incident pulses by using a very short time measuring timer and plotting, and fitting the linear originated in a random event corresponding to the background and the non-linear originated in the correlated events of parent nuclides-progenies by using the least squares method, the whole generating probability P (t) from the parent nuclide to the progeny thereof is obtained. By subtracting the random events portion from the P(t), the correlated events portion is extracted. The radioactivity per unit can be obtained by dividing the extracted correlated events portion by the measured time, the amount of the supplied sample and the counting efficiency.
    Type: Grant
    Filed: September 23, 2003
    Date of Patent: March 20, 2007
    Assignee: Japan Nuclear Cycle Development Institute
    Inventors: Yasuhiro Uezu, Tetsuo Hashimoto
  • Patent number: 7191091
    Abstract: The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: March 13, 2007
    Assignee: 3M Innovative Properties Company
    Inventors: Donald E. Yuhas, James H. Voth, Patrick Schneider, Keith H. Foster
  • Patent number: 7149633
    Abstract: A method of estimating the displaced size of a knot in a lumber piece includes the steps of: translating the lumber piece downstream along a flow path between a radiation source and sensor while simultaneously irradiating the lumber piece with radiation from the first radiation source whereby the radiation is attenuated by the lumber piece; collecting a set of radiation intensity data from the radiation sensor as the lumber piece is irradiated; processing the set of radiation intensity data to sum the radiation intensity data and to provide radiation intensity profiles transversely of the flow path direction and corresponding density profiles transversely of the flow path direction; mapping the density profiles to model a set of three dimensional density profiles of the lumber piece; processing the radiation intensity data to determine a clear wood density threshold value for the lumber piece and a maximum density value of the density profiles; and, computing a ratio of the summed density profile values to th
    Type: Grant
    Filed: February 22, 2005
    Date of Patent: December 12, 2006
    Assignee: Coe Newnes/McGettee Inc.
    Inventors: Steve Woods, Ron Lahoda, Jacek M. Biernacki, Carl Flatman
  • Patent number: 7142988
    Abstract: The present invention discloses a novel method and an information system for allowing a non-random selection of a genotype of a plant cultivar that yields a selected plant product with desired processing features. The method involves determining structural and functional variables of the selected plant product, genetic variables responsible for said structural and functional variables and processing variables of the selected plant, and correlating the structural and functional variables to the genetic variables and to the processing variables so as to make a non-random selection of the genotype of the plant cultivar that yields the plant product with desired processing features.
    Type: Grant
    Filed: March 9, 2000
    Date of Patent: November 28, 2006
    Assignee: Monsanto Company
    Inventor: Peter C. Johnson
  • Patent number: 7083327
    Abstract: A active thermographic method for detecting subsurface defects in a specimen, particularly kissing unbond defects, includes heating a specimen, applying a force to the surface of the specimen to shift and separate the walls of the defect, and obtaining thermographic images of the specimen over time to monitor the heat flow through the specimen and detect thermal discontinuities. Because kissing unbond defects normally have good physical contact, and therefore good thermal conductivity, between its walls, these defects can go undetected in conventional active thermographic methods. By distorting the surface of the specimen, the kissing unbond defect is enlarged enough to generate sufficient thermal contrast for the defect to appear in the thermographic images.
    Type: Grant
    Filed: December 2, 1999
    Date of Patent: August 1, 2006
    Assignee: Thermal Wave Imaging, Inc.
    Inventor: Steven M. Shepard
  • Patent number: 7079975
    Abstract: A system for monitoring and controlling the deposition of thin films employed in semiconductor fabrication is provided. The system includes one or more acoustic and/or ultrasonic wave sources, each source directing waves onto one or more thin films deposited on a wafer. Waves reflected from the thin film is collected by a monitoring system, which processes the collected waves. Waves passing through the thin film may similarly be collected by the monitoring system, which processes the collected waves. The collected waves are indicative of the presence of impurities and/or defects in the deposited thin film. The monitoring system analyzes and provides the collected wave data to a processor, which determines whether adjustments to thin film deposition parameters are needed. The system also includes a plurality of thin film deposition devices associated with depositing thin films on the wafer. The processor selectively controls thin film deposition parameters and devices to facilitate regulating deposition.
    Type: Grant
    Filed: April 30, 2001
    Date of Patent: July 18, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Arvind Halliyal, Bhanwar Singh, Ramkumar Subramanian
  • Patent number: 7076320
    Abstract: Systems and methods that improve process control in semiconductor manufacturing are disclosed. According to an aspect of the invention, conditions in a cluster tool environment and/or a wafer therein can be monitored in-situ via, for example, a scatterometry system, to determine whether parameters associated with wafer production are within control limits. A cluster tool environment can include, for example, a lithography track, a stepper, a plasma etcher, a cleaning tool, a chemical bath, etc. If an out-of-control condition is detected, either associated with a tool in the cluster tool environment or with the wafer itself, compensatory measures can be taken to correct the out-of-control condition. The invention can further employ feedback/feed-forward loop(s) to facilitate compensatory action in order to improve process control.
    Type: Grant
    Filed: May 4, 2004
    Date of Patent: July 11, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Khoi A. Phan, Bhanwar Singh, Ramkumar Subramanian
  • Patent number: 7069182
    Abstract: A database interpolation method is used to rapidly calculate a predicted optical response characteristic of a diffractive microstructure as part of a real-time optical measurement process. The interpolated optical response is a continuous and (in a preferred embodiment) smooth function of measurement parameters, and it matches the theoretically-calculated optical response at the database-stored interpolation points.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: June 27, 2006
    Assignee: Tokyo Electron Limited
    Inventors: Kenneth C. Johnson, Fred E. Stanke
  • Patent number: 7064336
    Abstract: A portable radioactive-material detection system capable of detecting radioactive sources moving at high speeds. The system has at least one radiation detector capable of detecting gamma-radiation and coupled to an MCA capable of collecting spectral data in very small time bins of less than about 150 msec. A computer processor is connected to the MCA for determining from the spectral data if a triggering event has occurred. Spectral data is stored on a data storage device, and a power source supplies power to the detection system. Various configurations of the detection system may be adaptably arranged for various radiation detection scenarios. In a preferred embodiment, the computer processor operates as a server which receives spectral data from other networked detection systems, and communicates the collected data to a central data reporting system.
    Type: Grant
    Filed: June 21, 2004
    Date of Patent: June 20, 2006
    Assignee: The Regents of the University of California
    Inventors: Daniel E. Archer, Brock R. Beauchamp, G. Joseph Mauger, Karl E. Nelson, Michael B. Mercer, David C. Pletcher, Vincent J. Riot, James L. Schek, David A. Knapp
  • Patent number: 7046908
    Abstract: The invention relates to a method for computationally determining optical properties of a channel waveguide, according to which, for an incident ray entering an entrance surface, the distribution of intensity over an emergence surface is determined by adjoined partial rays that possibly split up. From an incident partial ray striking the outer surface, a predetermined algorithm determines a reflected main ray and, in so far as it is necessary according to the ensuing course of events, determines a number of scattered rays of a higher order, which depict partial rays and are recursively traced further. Each partial ray is either a primary ray or a secondary ray. When the incident partial ray is a primary ray, the reflected main ray is a primary ray once again, and the scattered rays are secondary rays. During the reflection of secondary ray, only the reflected main ray is considered as the secondary ray.
    Type: Grant
    Filed: October 17, 2001
    Date of Patent: May 16, 2006
    Assignee: Siemens Aktiengellschaft
    Inventors: Thomas Bierhoff, Andreas Himmler
  • Patent number: 6990412
    Abstract: Techniques to speed the manufacturing process of devices such as optical signal transmitters, transponders, or transceivers by utilizing automated extinction ratio adjustment.
    Type: Grant
    Filed: October 17, 2002
    Date of Patent: January 24, 2006
    Assignee: Intel Corporation
    Inventor: Yingfan Zhang
  • Patent number: 6970811
    Abstract: Via simple electronic circuitry, an analog voltage that tracks the LED light output is produced. This analog voltage is read by an A/D converter to ascertain an approximate relative light output of the LED so that light output compensation can be quickly calculated. A resistor-capacitor circuit is used to approximate the behavior of the LED light output. The output voltage from this circuit is sampled and used along with a sensed ambient temperature to adjust the exposure time of an image capture system.
    Type: Grant
    Filed: March 22, 2000
    Date of Patent: November 29, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Paul A. Boerger, Keith Forrest
  • Patent number: 6959266
    Abstract: A method and system for physiological gating for radiation therapy is disclosed. A method and system for detecting and predictably estimating regular cycles of physiological activity or movements is disclosed. Another disclosed aspect of the invention is directed to predictive actuation of gating system components. Yet another disclosed aspect of the invention is directed to physiological gating of radiation treatment based upon the phase of the physiological activity.
    Type: Grant
    Filed: September 16, 2003
    Date of Patent: October 25, 2005
    Assignee: Varian Medical Systems
    Inventor: Hassan Mostafavi
  • Patent number: 6950780
    Abstract: A database interpolation method is used to rapidly calculate a predicted optical response characteristic of a diffractive microstructure as part of a real-time optical measurement process. The interpolated optical response is a continuous and (in a preferred embodiment) smooth function of measurement parameters, and it matches the theoretically-calculated optical response at the database-stored interpolation points.
    Type: Grant
    Filed: February 12, 2004
    Date of Patent: September 27, 2005
    Assignee: Tokyo Electron Limited
    Inventors: Kenneth C. Johnson, Fred E. Stanke
  • Patent number: 6934929
    Abstract: The invention provides a method for OPC modeling. The procedure for tuning a model involves collecting cross-section images and critical dimension measurements through a matrix of focus and exposure settings. These images would then run through a pattern recognition system to capture top critical dimensions, bottom critical dimensions, resist loss, profile and the diffusion effects through focus and exposure.
    Type: Grant
    Filed: January 13, 2003
    Date of Patent: August 23, 2005
    Assignee: LSI Logic Corporation
    Inventors: Travis Brist, George Bailey
  • Patent number: 6920612
    Abstract: A method for providing help services in a graphical user interface-based computer application includes providing a first display portion and a second display portion. The first display portion provides standard application services and the second display portion provides dedicated help services based on the standard application services provided in the first display portion. The method also includes determining a user interaction via the first display portion, and, based on the user interaction, providing a standard application service associated with the computer application in the first display portion. Furthermore, the method includes providing dedicated help services in the second display portion based on the standard application service provided in the first display portion.
    Type: Grant
    Filed: November 29, 2001
    Date of Patent: July 19, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Bruce A Makinen
  • Patent number: 6915217
    Abstract: A method and system for remotely inspecting the integrity of a structure. This can be performed by a method creating a vibratory response in the structure from a remote location and then measuring the vibratory response of the structure remotely. Alternatively, this can be performed by a system for remotely measuring the integrity of a structure using a vehicle and an artificial neural network, where the vehicle is equipped with a vibratory response device. The vibratory response can be produced by infrasonic and audio frequencies that can be produced by at least a vehicle, motor, or sound recording. The vibratory response can be measured with a laser vibrometer or an audio recording device.
    Type: Grant
    Filed: May 20, 2002
    Date of Patent: July 5, 2005
    Assignee: Georgia Tech Research Corp.
    Inventors: Paul LeBaron Springer, III, James E. Mahaffey, Ronald Gordon Harley
  • Patent number: 6907359
    Abstract: A superconducting radiation detector relies upon the abruptness of a superconducting transition edge to converts a slight heat generated by an X-ray into a high signal current and uses an electrothermal self-feedback mechanism to provide a high energy resolution and a high counting rate. A calorimeter incorporating such a radiation detector has an absorber for absorbing X-rays, a resistor formed of a superconductor provided under the absorber and having a resistance value that varies with heat generated in the absorber, superconducting wires for connecting the resistor to an external current detector, a membrane on which the resistor is provided, and an insulating film provided between the resistor and the absorber and having at least one hole penetrating therethrough, the resistor and the absorber being in contact through the hole.
    Type: Grant
    Filed: April 17, 2003
    Date of Patent: June 14, 2005
    Assignee: SII NanoTechnology Inc.
    Inventors: Keiichi Tanaka, Toshimitsu Morooka, Satoshi Nakayama
  • Patent number: 6880379
    Abstract: In a method of detecting damage in materials or objects (4) the material or object is physically influenced to produce a physical change of the material or object inducing transient slow dynamics in case of damages in the material or object. Slow dynamics induced material elastic modulus changes are detected as indication of damages of the material or object. In a device for non-destructive detection of damage in materials or objects (4), an impact source (16) is provided to impact the material or object to physically influence the material or object to produce a physical change of the material or object inducing transient slow dynamics in case of damages in the material or object. A detector (2,8,10,12,14,6) is provided to detect by said slow dynamics induced material elastic modulus changes as indications of damages of the material or object.
    Type: Grant
    Filed: February 14, 2002
    Date of Patent: April 19, 2005
    Assignee: Impressonic AB
    Inventors: Claes Hedberg, Alexander Sutin, Paul A. Johnson
  • Patent number: 6872895
    Abstract: This invention relates to a method and apparatus for mass and/or volume measurements of manufactured articles. More particularly, this invention relates to a method and apparatus for mass and/or volume measurements that can be performed on-line in a part manufacturing process. On-line measurement of the mass or volume of material contained in a specific region of interest of the manufactured items is performed 100% on-line. Real-time process control information is based on real-time measurement of the mass or volume of material contained in a specific region of interest of a manufactured item. Automated quality control inspection for manufactured articles is based on real-time measurement of the mass or volume of material contained in a specific region of interest of manufactured items.
    Type: Grant
    Filed: February 12, 2002
    Date of Patent: March 29, 2005
    Assignee: Pressco Technology Inc.
    Inventors: Don W. Cochran, Steven D. Cech
  • Patent number: 6859741
    Abstract: The invention relates to an apparatus and to a method for adapting the size of an ion beam spot in tumor irradiation. For that purpose, the apparatus has a raster scanning device composed of raster scanning magnets (20) for raster scanning the ion beam (19). In addition, the apparatus comprises quadrupole magnets (10) determining the size of the ion beam spot, which quadrupole magnets (10) are arranged directly in front of the raster scanning magnets (20), and finally two magnet power supply units (18) for the quadrupole doublet of the quadrupole magnets (10) determining the size of the ion beam spot, the apparatus having a control loop for obtaining current correction values, by comparing desired and actual values of the prevailing dimension of the beam, for two magnet power supply units (18) of the quadrupole doublet arranged directly in front of the raster scanning magnets (20), for defined homogenization and/or for defined variation of the size of the ion beam spot.
    Type: Grant
    Filed: November 21, 2001
    Date of Patent: February 22, 2005
    Assignee: Gesellschaft fuer Schwerionenforschung mbH
    Inventors: Thomas Haberer, Wolfgang Ott
  • Patent number: 6856919
    Abstract: A device for a motor vehicle includes at least one laser sensor. The laser sensor includes a device configured to sweep a scanning area with at least one laser beam emitted by the laser sensor and a power supply device for the laser sensor. In a method for operating a laser sensor in a scanning area with at least one laser beam, the power of the laser beam emitted by the laser sensor is varied in accordance with its direction of radiation.
    Type: Grant
    Filed: March 6, 2000
    Date of Patent: February 15, 2005
    Assignee: Volkswagen AG
    Inventors: Andreas Bastian, Arthur Schneider
  • Patent number: 6853926
    Abstract: The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.
    Type: Grant
    Filed: June 5, 2003
    Date of Patent: February 8, 2005
    Assignees: Research Foundation of CUNY, Lockheed Martin Corporation
    Inventors: Robert R. Alfano, Iosif Zeylikovich, Wubao Wang, Jamal Ali, Vincent Benischek, Yury Budansky
  • Patent number: 6845326
    Abstract: An optical sensor for use in measuring constituents of an agricultural product. An optical sensing window passes a stream of the agricultural product, and a radiation source irradiates the stream as it passes through the optical sensing window. A receiver receives radiation transmitted through the stream and converts it into a corresponding electrical signal using a spectrometer. The electrical signal is digitized to produce a series of data points corresponding to particular wavelengths. A processor normalizes the data points using a reference value in order to generate processed data points that can be used to predict a constituent content of the agricultural product.
    Type: Grant
    Filed: November 7, 2000
    Date of Patent: January 18, 2005
    Assignee: NDSU Research Foundation
    Inventors: Suranjan Panigrahi, Guangjun Zhang
  • Patent number: 6813569
    Abstract: The invention concerns an assembly comprising: (a) means for determining the intensity of a plurality of electromagnetic signals, (b) a correlator for correlating or autocorrelating said signals, (c) means for continuously calculating the variance and/or the standard deviation of said signals. It also concerns a method for analysing the intensity of a plurality of electromagnetic radiations scattered and/or emitted from solid, fluid or gaseous samples.
    Type: Grant
    Filed: November 4, 2002
    Date of Patent: November 2, 2004
    Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
    Inventors: Thorsten Wohland, Horst Vogel, Rudolf H. A. Rigler
  • Patent number: 6809756
    Abstract: The invention relates to a method for monitoring a process. The image information received from cameras monitoring various positions of the process is stored in digital form and various cameras positions are alternately selected for a display and analysis on the screen of a computer. The screen is also used for displaying an image variation graph representing the image variation data of images preceding and following the image to be analyzed. The system includes selector elements (5) for selecting a camera position representing the highest-level image variation for an automated display.
    Type: Grant
    Filed: January 21, 2000
    Date of Patent: October 26, 2004
    Assignee: Honeywell Oy
    Inventors: Mika Valkonen, Jorma Snellman, Juha Toivonen
  • Patent number: 6791075
    Abstract: The present invention relates to a method for extracting individual band components from heavily overlapping bands. The method is based on first derivative-second derivative plots of an experimental spectrum and consists of two stases. The first stage is concerned with the geometric approach that estimates a set of values for the parameters of a component band in the overlapping bands, and repeats band decomposition of the remaining bands in the same manner after removing the estimated band from the overlapping bands. The second stage is to minimize the difference between the profiles of the estimated band and its complementary band by a least-squares optimization, and then to determine the optimum values of the band parameters.
    Type: Grant
    Filed: February 13, 2001
    Date of Patent: September 14, 2004
    Inventor: Katsue Koashi