Waveform Analysis Patents (Class 702/66)
  • Patent number: 7756654
    Abstract: A test apparatus for testing a device under test includes a multi-strobe generating section that generates a plurality of strobe signals with different phases in each of cycles of an output signal output from the device under test, a plurality of timing comparing sections that obtain a value of the output signal respectively at timings of the plurality of strobe signals, a transition detecting section that generates transition data identifying one of the plurality of strobe signals which is positioned at a transition of the output signal, based on the values of the output signal which are respectively obtained at the timings of the plurality of strobe signals, a transition memory that sequentially stores thereon the transition data input thereto, a selecting section that selects, in association with each of the cycles of the output signal, whether to input the transition data output from the transition detecting section into the transition memory, and a calculating section that calculates jitter of the output
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: July 13, 2010
    Assignee: Advantest Corporation
    Inventors: Kazuhiro Yamamoto, Toshiyuki Okayasu
  • Patent number: 7756651
    Abstract: A novel method and device for measuring electrical parameters in an energy meter in an electrical system is described. The novel method samples an electrical energy signal and determines a relevant portion of the sampled electrical energy signal. The relevant portion of the electrical energy signal is then separately multiplied by a first and second reference waveform. The relevant portion may be reflective of a particular line cycle at a particular frequency of interest. In addition, other samples in the line cycle may be accumulated. The samples whose portions may be determined may be the first and/or last signal, while other sampled signals may be evaluated in whole.
    Type: Grant
    Filed: May 5, 2006
    Date of Patent: July 13, 2010
    Assignee: Elster Electricity, LLC
    Inventor: Scott T. Holdsclaw
  • Patent number: 7747425
    Abstract: A peak current modeling method and system for modeling peak current demand of an integrated circuit (IC) block such as, e.g., a compilable memory instance. A current demand curve associated with the IC for a particular IC block event is obtained via simulation, for example. A defined time region associated with the particular IC block event is divided into multiple time segments, whereupon at least a first current value and a second current value for each time segment is obtained based on the current demand curve. Thereafter, the current demand curve is approximated, on a segment-by-segment basis, using a select approximate waveform depending on a relationship between the first and second current values.
    Type: Grant
    Filed: November 7, 2006
    Date of Patent: June 29, 2010
    Assignee: Virage Logic Corp.
    Inventors: Vipin Kumar Tiwari, Manish Bhatia, Abhijit Ray
  • Patent number: 7747401
    Abstract: Embodiments of the present invention provide techniques for decomposing a signal using a sawtooth, or triangle wave, transform. Specific embodiments transform an input signal into a piecewise-linear sawtooth or triangle wave function, and construct upper and lower envelopes for the input signal in sawtooth space. A component function for the input signal (e.g., an Intrinsic Mode Function (IMF)) is then generated based on the sawtooth or triangle wave function and the upper and lower envelopes. In various embodiments, the results generated in sawtooth space are reversely transformed into the original data space of the input signal. In this manner, an input signal may be decomposed into one or more component functions without the time-consuming and relatively unpredictable sifting process of the Empirical Mode Decomposition (EMD) method.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: June 29, 2010
    Assignee: Oracle International Corporation
    Inventor: Yu Lu
  • Patent number: 7743362
    Abstract: System and method for generating an application domain specific graphical program. A graphical user interface (GUI) for specifying functionality of a graphical program in an application domain is displayed, where the GUI corresponds specifically to the application domain. User input to the GUI specifying the functionality of the graphical program is received, and the graphical program generated in response, where the graphical program is executable to perform the specified functionality, and comprises multiple interconnected graphical program nodes that visually represent the graphical program functionality. The GUI includes graphical interface elements operable to indicate and/or specify, e.g.
    Type: Grant
    Filed: May 6, 2004
    Date of Patent: June 22, 2010
    Assignee: National Instruments Corporation
    Inventors: Joseph E. Peck, Matthew E. Novacek
  • Patent number: 7742894
    Abstract: In the present invention, a multi-person pose recognition system has been developed. This system includes a body pose detection module, a CC2420DBK board and a multi-person pose monitoring software module. The body pose detection module includes a triaxial accelerometer, a Zigbee chip and an 8-bit microcontroller. Several body pose detection modules and the CC2420DBK board form a Zigbee wireless sensor network (WSN). The CC2420DBK board functions as the receiver of the Zigbee WSN and communicates with a robot onboard computer or a host computer through a RS-232 port. The multi-person pose monitoring software monitors and records activities of multiple users simultaneously. The present invention provides a pose recognition algorithm by combining time-domain analysis and wavelet transform analysis. This algorithm has been implemented in the microcontroller of a body pose estimation module.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: June 22, 2010
    Assignee: National Chiao Tung University
    Inventors: Chun-Wei Chen, Kai-Tai Song
  • Publication number: 20100153040
    Abstract: Methods and apparatus are provided for use in devices adapted to perform waveform correlation result processing. An exemplary method may include accessing a plurality of collected measurement values stored in memory, establishing at least one combined measurement value based, at least in part, on at least two of the collected measurement values, and identifying at least one wireless signal within a reference waveform based, at least in part, on at least the combined measurement value. The method may also include establishing the at least one correlation result for at least one of the plurality of waveforms by correlating the at least one of the plurality of waveforms with the reference waveform.
    Type: Application
    Filed: December 12, 2008
    Publication date: June 17, 2010
    Applicant: QUALCOMM Incorporated
    Inventor: Rayman Wai Pon
  • Publication number: 20100153042
    Abstract: Provided is a measurement apparatus that measures, as an error under measurement, at least one of a gain error and a phase error of a quadrature demodulator or a quadrature modulator, the measurement apparatus comprising an output control section that causes the quadrature demodulator or the quadrature modulator serving as a measurement target to output a signal; a detecting section that detects a measured signal representing a real component and an imaginary component of the signal output from the quadrature demodulator or the quadrature modulator serving as the measurement target; and a calculating section that calculates, as the gain error or the phase error, a solution for a variable that maximizes a correlation value between the measured signal detected by the detecting section and an ideal signal that includes the error under measurement as the variable and that represents the measured signal that should be output by the quadrature demodulator or the quadrature modulator serving as the measurement targe
    Type: Application
    Filed: November 9, 2009
    Publication date: June 17, 2010
    Applicant: ADVANTEST CORPORATION
    Inventor: Takashi SHIMURA
  • Publication number: 20100153041
    Abstract: The present invention relates to a signal processing apparatus comprising a signal input and a signal output; a plurality of signal processing units, wherein each signal processing unit having the same structure and at least one spatial error, being connected to the signal input, and being adapted to subject an input signal from the signal input to predetermined signal processing; selection means configured to select and form a predetermined number of groups from the plurality of signal processing units in accordance with a predetermined criterion; and control means for controlling the groups of the signal processing units to be active in a time interleaved schema, wherein an active group provides a respective processed input signal as an output signal to the signal output; wherein the plurality of signal processing units comprises more signal processing units as required to realize a predetermined time interleaving factor.
    Type: Application
    Filed: May 27, 2008
    Publication date: June 17, 2010
    Applicant: NXP B.V.
    Inventor: Konstantinos Doris
  • Patent number: 7739084
    Abstract: A method for assessing wave propagation arising in a physical system by obtaining a numerical approximation of the physical system to be simulated, the method comprising defining a computational domain comprising a first grid having at least two dimensions and a plurality of first-grid cells, and a second grid having at least two dimensions and a plurality of second-grid cells, wherein the second grid is a refinement of at least part of the first grid, and wherein each of the first-grid cells and second-grid cells has one or more solution points at which values representing a physical quantity of the physical system to be simulated may be obtained, wherein defining the computational domain comprises defining the second grid to have a first refinement factor compared to the first grid in one of the at least two dimensions and to have a second refinement factor compared to the first grid in another of the at least two dimensions, and defining the first refinement factor to be different from the second refine
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: June 15, 2010
    Assignee: Fujitsu Limited
    Inventor: Peter Chow
  • Patent number: 7734435
    Abstract: This present specification provides, amongst other things, an electro-optical monitoring system for obtaining a once-per revolution signal based on the surface reflection of a rotating device that mandates non-contacting sensor input in potentially hostile environments. The system can use optical and electronic sections to illuminate and detect surface reflections from the rotating surface using existing mounting locations on the periphery of the machine to be measured. The electronic portion is configured to determine a unique mark as the once-per-revolution marker or allow an attending operator to assign a specific marker based on the observed reflected pattern. The optical portion consists of a light source, receiver, and optics that allow for focused and directed light paths.
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: June 8, 2010
    Assignee: Cognitive Vision Inc.
    Inventors: John Gordon Thomas, Peter James Neild, Raymond Joseph Schumacher
  • Patent number: 7729872
    Abstract: Selectable portions of a display on a display screen allow a user to select bits of a digital signal. A mode selection menu changes the bit selection to select bits in different ways. If an individual bit designation mode is selected, objects are displayed that correspond to the respective bits of the digital signal. A user selects the object corresponding to a desired bit by use of a mouse. After bit selection, an eye pattern, derived from only selected bits, is displayed. Additionally, jitter analysis results derived from only the selected bits are displayed.
    Type: Grant
    Filed: March 22, 2007
    Date of Patent: June 1, 2010
    Assignee: Tektronix, Inc.
    Inventor: Toshiaki Obata
  • Patent number: 7725276
    Abstract: A signal waveform analyzing device includes an extracting unit that extracts, from waveform information indicating temporal variation in signal level of a component of an electronic circuit, a signal level that satisfies a condition for a phenomenon to be observed, and outputs extracted signal level as an extraction result.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: May 25, 2010
    Assignee: Mitsubishi Electric Corporation
    Inventor: Tatsuya Kimishima
  • Patent number: 7720626
    Abstract: A method, apparatus, and computer program product for identifying dissimilarity indices for a structure is presented. A first test signal is sent into a baseline model of the structure. An estimated response signal to the first test signal sent into the baseline model of the structure is received. A second test signal is sent into the structure. A second response single to the second test signal is received. A value is assigned to a model-based dissimilarity index using the first response compared to the second response.
    Type: Grant
    Filed: September 22, 2008
    Date of Patent: May 18, 2010
    Assignee: The Boeing Company
    Inventor: V. John Mathews
  • Publication number: 20100116994
    Abstract: A method and apparatus are provided for correcting primary and secondary emission data. The method includes obtaining an emission data set having primary and secondary emission data representative of primary and secondary emission particles emitting from a region of interest and applying a scatter correction model to the emission data set to derive an estimated scatter vector. The method also includes comparing the emission data set to the estimated scatter vector to identify an amount of secondary emission data in the emission data set and correcting the emission data set based on the amount of secondary emission data identified in the comparing operation.
    Type: Application
    Filed: November 13, 2008
    Publication date: May 13, 2010
    Applicant: General Electric Company
    Inventors: Scott David Wollenweber, David Leo McDaniel, Charles William Stearns
  • Publication number: 20100121595
    Abstract: A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.
    Type: Application
    Filed: December 18, 2009
    Publication date: May 13, 2010
    Applicant: LeCroy Corporation
    Inventors: Peter James Pupalaikis, Lawrence W. Jacobs, Stephen M. Sekel
  • Publication number: 20100113951
    Abstract: A method of attenuating spikes in a complex signal comprises examining the complex signal to detect spikes therein and for each detected spike, generating an estimate inverse signal and applying the estimate inverse signal to the complex signal to attenuate the spike associated with the estimate inverse signal.
    Type: Application
    Filed: October 20, 2009
    Publication date: May 6, 2010
    Inventors: Osbert C. Zalay, Berj L. Bardakjian
  • Patent number: 7706993
    Abstract: The invention relates to a peak position correcting method that is a pre-process for testing whether properties of a product, a raw material, etc., are good or defective from a spectrum waveform pattern. The method involves setting a reference peak position in a single region including a spectrum waveform pattern, or setting reference peak positions in each of a plurality of regions; specifying a peak to be corrected as an object of correction in the single region or each of the plurality of regions; shifting the peak to be corrected to the reference peak position in the single region or in each of the plurality of regions; and substantially proportionally expanding or contracting the spectrum waveform pattern positioned at both sides of the peak to be corrected in the horizontal axis direction.
    Type: Grant
    Filed: October 25, 2006
    Date of Patent: April 27, 2010
    Assignee: Angletry Associates
    Inventor: Shoichi Teshima
  • Patent number: 7706992
    Abstract: The present invention provides a system and method for representing quasi-periodic (“qp”) waveforms comprising, representing a plurality of limited decompositions of the qp waveform, wherein each decomposition includes a first and second amplitude value and at least one time value. In some embodiments, each of the decompositions is phase adjusted such that the arithmetic sum of the plurality of limited decompositions reconstructs the qp waveform. These decompositions are stored into a data structure having a plurality of attributes. Optionally, these attributes are used to reconstruct the qp waveform, or patterns or features of the qp wave can be determined by using various pattern-recognition techniques. Some embodiments provide a system that uses software, embedded hardware or firmware to carry out the above-described method. Some embodiments use a computer-readable medium to store the data structure and/or instructions to execute the method.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: April 27, 2010
    Assignee: Digital Intelligence, L.L.C.
    Inventors: Carlos A. Ricci, Vladimir V. Kovtun
  • Publication number: 20100097601
    Abstract: A measurement apparatus for measuring an optical fiber transmission line used to connect to an opposite apparatus, the measurement apparatus includes a transmission part for generating a measurement packet used for measuring a length of a first and second optical fiber transmission line, and transmitting the measurement packet to the opposite apparatus through the first optical fiber transmission line, a reception part for detecting the measurement packet returned from the opposite apparatus that perform a loopback processing of the measurement packet through the second optical fiber transmission line, a calculation part for calculating a packet transmission time which is a processing time required from the generation of the measurement packet to the detection of the measurement packet, and a measurement part for performing a measurement control of the length of the first and second optical fiber transmission line based on the packet transmission time calculated by the calculation part.
    Type: Application
    Filed: October 9, 2009
    Publication date: April 22, 2010
    Applicant: Fujitsu Limited
    Inventors: Koji Bato, Taro Asao, Yoshinori Tochiki, Haruka Miyazaki, Akira Yamamoto, Katsumi Sugawa, Tatsuo Nagayoshi, Kousuke Nakamura
  • Publication number: 20100094576
    Abstract: Apparatus and method for increasing the sensitivity in the detection of optical coherence tomography and low coherence interferometry (“LCI”) signals by detecting a parallel set of spectral bands, each band being a unique combination of optical frequencies. The LCI broad bandwidth source is split into N spectral bands. The N spectral bands are individually detected and processed to provide an increase in the signal-to-noise ratio by a factor of N. Each spectral band is detected by a separate photo detector and amplified. For each spectral band the signal is band pass filtered around the signal band by analog electronics and digitized, or, alternatively, the signal may be digitized and band pass filtered in software. As a consequence, the shot noise contribution to the signal is reduced by a factor equal to the number of spectral bands. The signal remains the same. The reduction of the shot noise increases the dynamic range and sensitivity of the system.
    Type: Application
    Filed: September 30, 2009
    Publication date: April 15, 2010
    Applicant: The General Hospital Corporation
    Inventors: Johannes F. de Boer, Guillermo J. Tearney, Brett Eugene Bouma
  • Patent number: 7693672
    Abstract: A signal processing method includes receiving an unknown signal that includes a distorted component and an undistorted component, and performing self-linearization based at least in part on the unknown signal to obtain an output signal that is substantially undistorted, wherein performing self-linearization includes adaptively generating a replica distortion signal that is substantially similar to the distorted component, and subtracting the replica distortion signal from the unknown signal to obtain the output signal.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: April 6, 2010
    Assignee: Optichron
    Inventor: Roy G. Batruni
  • Patent number: 7684952
    Abstract: Method for subsurface exploration. In one implementation, the method may include receiving a gamma value at a subsurface interface, wherein the gamma value is a ratio of Vp/Vs at the subsurface interface. Vp is the average P wave velocity and Vs is the average S wave velocity. The method may further include receiving a converted wave reflection coefficient at the subsurface interface. The converted wave reflection coefficient is a function of a density contrast at the subsurface interface and a shear velocity contrast at the subsurface interface. The method may further include determining a P wave incident angle such that the converted wave reflection coefficient is a function of substantially only the density contrast at the P wave incident angle. The P wave incident angle is referred to herein as ?. The method may further include calculating the density contrast based on the converted wave reflection coefficient at ?.
    Type: Grant
    Filed: June 13, 2007
    Date of Patent: March 23, 2010
    Assignee: WesternGeco L.L.C.
    Inventor: Keshan Zou
  • Patent number: 7684467
    Abstract: In one embodiment, the present invention includes a method for receiving data corresponding to a portion of an incoming radio frequency (RF) spectrum, determining a set of estimates including one or more pairs of a channel frequency estimate and a symbol rate estimate from the data via a linear spectrum analysis, and determining a refined set of estimates from the set of estimates via at least one non-linear spectrum analysis.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: March 23, 2010
    Assignee: Silicon Laboratories Inc.
    Inventors: Junsong Li, Yan Zhou
  • Publication number: 20100070226
    Abstract: Log chirp testing where a log chirp may be provided to a device under test and a first time domain response from the device under test may be received. The first time domain response may be in the time domain. The first time domain response may be converted to the angular domain to create an angular domain response. Converting to the angular domain response may include resampling the time domain response from the time domain to the angular domain. The angular domain response may be filtered and/or analyzed. The angular domain response may be converted to a second time domain response. Similar to above, the conversion may include resampling the angular domain response from the angular domain to the time domain. The first time domain response and the second time domain response may be analyzed. Testing results of the device under test may be generated and stored based on said analyzing.
    Type: Application
    Filed: January 13, 2009
    Publication date: March 18, 2010
    Inventors: Jack Harris Arnold, Douglas Scott Bendele, Xianglin Mo, Chen Zhang
  • Publication number: 20100070222
    Abstract: The present invention provides a test device and a method for carrying out a function test on a communication system. The test device contains a transmission path having at least one leaky line antenna arranged in the aircraft cabin, a control device coupled to the transmission path for feeding an HF signal at a predetermined power level into the leaky line antenna, and at least one measuring mechanism coupled at a predetermined coupling point to the transmission path to measure the power level of the HF signal at the coupling point and to transmit a result signal which depends on the measured power level via the leaky line antenna to the control device.
    Type: Application
    Filed: September 18, 2009
    Publication date: March 18, 2010
    Inventors: Martin SCHIRRMACHER, Uwe SCHWARK, Uwe DONNIG
  • Publication number: 20100070215
    Abstract: Illustrative embodiments provide systems, applications, apparatuses, computer software program products, and methods related to identification of electrical appliances by electrical characteristics.
    Type: Application
    Filed: October 30, 2008
    Publication date: March 18, 2010
    Inventors: Roderick A. Hyde, Jordin T. Kare, Lowell L. Wood,, JR.
  • Publication number: 20100070221
    Abstract: A signal analysis system that may include threshold setting for analyzing analog signals. The system may include a plurality of digitizers and adjustable power supplies for supplying threshold voltages for the digitizers. The system may digitize a set of analog signals, locate features and attributes in the digitized signals and determine a duty cycle for signals based on the signal features and attributes. The determined duty cycle may then be used to set threshold voltages on the power supplies.
    Type: Application
    Filed: May 1, 2009
    Publication date: March 18, 2010
    Applicant: Nexus Technology
    Inventor: Richard A. Altimus
  • Patent number: 7676336
    Abstract: According to an inventive scheme for introducing a watermark into an information signal, the information signal is at first transferred from a time representation to a spectral/modulation spectral representation). The information signal is then manipulated in the spectral/modulation spectral representation in dependence on the watermark to be introduced to obtain a modified spectral/modulation spectral representation, and subsequently an information signal provided with a watermark is formed based on the modified spectral/modulation spectral representation. An advantage is that, due to the fact that the watermark is embedded and/or derived in the spectral/modulation spectral representation or range, traditional correlation attacks as are used in watermark methods based on a spread-band modulation cannot succeed easily.
    Type: Grant
    Filed: October 30, 2006
    Date of Patent: March 9, 2010
    Assignee: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V.
    Inventors: Juergen Herre, Ralph Kulessa, Sascha Disch, Karsten Linzmeier, Christian Neubauer, Frank Siebenhaar
  • Patent number: 7671602
    Abstract: A method and apparatus for cross-point detection in devices have been disclosed where each leg of a differential signal is compared to a reference voltage and time lags for each are noted in crossing the reference voltage and this information is used to identify characteristics of the differential signal.
    Type: Grant
    Filed: January 24, 2007
    Date of Patent: March 2, 2010
    Assignee: Integrated Device Technology, Inc.
    Inventor: Stanley Hronik
  • Publication number: 20100042347
    Abstract: A reflection element determination device derives error factors in a first signal source and a second signal source based on measurement results of a signal in respective states in which reflection elements are respectively connected to the first signal source and the second signal source, and measurement results of a signal in a state in which the first signal source and the second signal source are connected with each other via a transmission element, derives transmission characteristics of the transmission element based on the measurement results of a signal in the state in which the first signal source and the second signal source are connected with each other via the transmission element and the derived error factors, and determines whether the reflection elements realize predetermined reflection states based on the derived transmission characteristics of the transmission element and transmission characteristics of the transmission element which have been known before the derivation, where the transmissi
    Type: Application
    Filed: August 24, 2007
    Publication date: February 18, 2010
    Applicant: ADVANTEST CORPORATION
    Inventors: Yoshikazu Nakayama, Takao Kawahara, Masato Haruta
  • Publication number: 20100036629
    Abstract: A series (FA) of scanning values (AW) is transformed into a series (FT) of transformation values (TW) by adding one respective transformation value (TW) representing a current scanning value (AW) of the series (FA) of scanning values (AW) to the series (FT) of transformation values (TW) if the current scanning value (AW) of the series (FA) of scanning values (AW) deviates from a given reference scanning value (REF) at least by a given net value (MDIFF). The current scanning value (AW) of the series (FA) of scanning values (AW) which deviates from the given reference scanning value (REF) at least by the given net value (MDIFF) is predefined as the given reference scanning value (REF) for subsequent current scanning values (AW). A moving average (M) is determined in accordance with the series (FT) of transformation values (TW). Pulses (IMP) are recognized in accordance with the moving average (M).
    Type: Application
    Filed: January 15, 2008
    Publication date: February 11, 2010
    Applicant: Continental Automotive GmbH
    Inventor: Sven Semmelrodt
  • Patent number: 7660685
    Abstract: A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: February 9, 2010
    Assignee: LeCroy Corporation
    Inventors: Peter J. Pupalaikis, Lawrence W. Jacobs, Stephen M. Sekel
  • Publication number: 20100030502
    Abstract: A method of and system for processing stray flux data associated with a synchronous electrical machine; the method comprising capturing stray flux data from the synchronous electrical machine; generating a stray flux waveform using at least the captured stray flux data; analysing the generated stray flux waveform and the captured stray flux data; and storing the generated stray flux waveform and the captured stray flux data in a database.
    Type: Application
    Filed: July 28, 2009
    Publication date: February 4, 2010
    Applicant: Eskom Holdings (Pty) Ltd
    Inventor: Simon HIGGINS
  • Patent number: 7657387
    Abstract: A data compression technique is disclosed for Fourier Transform Mass Spectrometry (FTMS). A statistical analysis is applied to the data in the frequency domain since most of this data is a result of randomly distributed electronic noise. A fit of the whole frequency dataset to the distribution is made to determine preliminary moments of the distribution. The data in the tail of that distribution (which is mainly the peak data) is then removed and the remaining data points are re-fitted to the distribution, to identify the moments of distribution of that remaining noise data. A noise threshold for the mass spectrum is then applied using the calculated moments. The data above the threshold is kept. The whole spectrum can be reconstituted by storing the moments of distribution along with the peak data and then regenerating the noise from those moments and adding it to the peak data.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: February 2, 2010
    Assignee: Thermo Finnigan LLC
    Inventors: Robert Malek, Oliver Lange
  • Patent number: 7657409
    Abstract: A method for assessing wave propagation in a physical system by numerical simulation; a computational domain comprises first grid cells with a first-grid time step, refined second grid cells with a second-grid time step, and intermediate grid cells of first-grid cell size and second-grid time step, with solution points located on the cells; obtaining values of a physical quantity after a first-grid time step at a solution point of one first-grid cell; using values from the first grid to obtain values at a perimeter of the intermediate grid; obtaining values of the physical quantity after the second-grid time step; using values from the intermediate grid to obtain the values at the perimeter of the second grid; using the values at the perimeter of the second grid, to obtain values of the physical quantity after a second-grind time step for solution points of the second-grind cell.
    Type: Grant
    Filed: November 25, 2008
    Date of Patent: February 2, 2010
    Assignee: Fujitsu Limited
    Inventor: Peter Chow
  • Patent number: 7657388
    Abstract: Non-intrusive speech quality assessment method and apparatus for storing a sequence of intercepted packets associated with a call, each packet containing speech data, and an indication of a transmission time of the packet; storing with each intercepted packet an indication of an intercept time of the packet; extracting a set of parameters from the sequence of packets; and generating an estimated mean opinion score in dependence upon the set of parameters. The extracting step comprises the sub steps of: generating a jitter parameter for each packet of the sequence of stored packets; generating a long term average jitter parameter for the stored packet; and generating a differential jitter parameter in dependence upon the jitter parameter for the stored packet and the long term average jitter parameter.
    Type: Grant
    Filed: January 15, 2004
    Date of Patent: February 2, 2010
    Assignee: Psytechnics Limited
    Inventors: Richard Reynolds, Simon Broom, Paul Barrett
  • Publication number: 20100023288
    Abstract: Rational macromodeling of multiport devices is disclosed that can ensure high accuracy with arbitrary terminal conditions. This can be achieved by reformulating a vector fitting technique to fit eigenpairs rather than matrix elements, and weighting can be chosen equal to an inverse of an eigenvalue magnitude in order to achieve a relative accuracy criterion for the eigenvalue fit. The procedure can improve accuracy for cases with a large eigenvalue spread. Impedance characteristics of an adjacent network can be used to lessen the complexity of the fitting and to improve accuracy.
    Type: Application
    Filed: October 2, 2009
    Publication date: January 28, 2010
    Applicant: ABB Technology AG
    Inventors: Bjorn GUSTAVSEN, Christoph Heitz, Martin Tiberg
  • Patent number: 7650248
    Abstract: In-system signal monitoring using an integrated circuit such as a programmable logic device is described. An analog-to-digital converter is disposed in the programmable logic device. A sampling bridge is coupled to provide an analog input to the analog-to-digital converter and to receive first signaling of a first frequency. A signal generator is configured to provide second signaling at a second frequency which is a fraction of the first frequency. Sample window circuitry is coupled to receive the second signaling and configured to provide third signaling to the sampling bridge at least partially responsive to the second signaling and at least partially responsive to an adjustable impedance setting of the sample window circuitry. The sample window circuitry is configured to provide an adjustable sample window within a pulse-width range.
    Type: Grant
    Filed: February 10, 2006
    Date of Patent: January 19, 2010
    Assignee: Xilinx, Inc.
    Inventor: Michael A. Baxter
  • Patent number: 7650249
    Abstract: A compressor for waveforms having at least two waveform states separates the waveform samples into waveform state sample vectors for each waveform state. Waveform state encoders encode the waveform state sample vectors separately to provide compressed waveform data. The waveform state encoder selects waveform state pattern vector and associated codes to represent the waveform state sample vectors. The differences between samples of the waveform state sample vector and waveform state pattern vector are calculated and encoded. Encoding can be lossless or lossy. The waveform state pattern vectors and other parameters for compression are determined during a training period. The waveform state encoders detect features in the waveform state sample vectors and waveform state pattern vectors that are useful for common oscilloscope measurements. Typical waveform states include level states and edge states.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: January 19, 2010
    Assignee: Samplify Systems, Inc.
    Inventor: Albert William Wegener
  • Publication number: 20100010760
    Abstract: Provided is a method for analyzing a reflection wave using effective impedance. The method includes the steps of: a) modeling a reflection surface of a building two-dimensionally; and b) obtaining a reflection wave by radiating a radio wave to the modeled reflection surface and analyzing the obtained reflection wave through making medium uniform.
    Type: Application
    Filed: September 19, 2007
    Publication date: January 14, 2010
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Jong Ho Kim, Heon Jin Hong, Chang Joo Kim, Il Suek Koh, Jae Woo Lim
  • Publication number: 20100001726
    Abstract: In a magnetic resonance imaging apparatus, an event generating substrate included in a sequence control unit generates an event code to make an instruction for switching a receiving path during a scan based on scanning conditions that are set in advance of the scan. When the event code is generated, a radio-frequency switch-matrix substrate of a gantry unit switches the receiving path that connects a receiving coil and a receiving circuit.
    Type: Application
    Filed: July 1, 2009
    Publication date: January 7, 2010
    Inventors: Masashi Hori, Akio Mori, Mitsuo Takagi
  • Publication number: 20100004887
    Abstract: Apparatus for registering the spectral signature of a dynamic source event include an imaging-sensor array configured to register electromagnetic energy over a predetermined range of electromagnetic wavelengths and an optical system configured for imaging onto the imaging-sensor array a dispersion pattern of electromagnetic energy emitted from a source event external to the optical system. The optical system includes (i) a focusing element and (ii) a selected set of optical dispersion apparatus.
    Type: Application
    Filed: March 2, 2009
    Publication date: January 7, 2010
    Inventor: Johnathan Martin Mooney
  • Patent number: 7643921
    Abstract: A method of estimating values beyond sensor limits accurately and simply includes the initial step of determining an actual slope utilizing measured data. An estimated slope is then determined as a percentage of the actual slope to provide an estimation of data values outside of the sensor limits until measured values return to within sensor limits. The estimation method according to this invention increases sensor range without sacrificing resolution with a desired accuracy.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: January 5, 2010
    Assignee: Continental Automotive Systems US, Inc.
    Inventors: Robert M. Andres, Douglas A. McConnell
  • Patent number: 7640123
    Abstract: Aspects of a method and system for detecting Bluetooth signals utilizing a wideband receiver are provided. In this regard, a frequency band may be scanned by receiving signals on each of a plurality of sub-bands for an amount of time, the energy received in each band may be compared to a threshold, and whether each sub-band comprises a Bluetooth transmission may be determined based on a FFT. Additionally, the FFT may enable determining on which Bluetooth channel a detected transmission occurred. A FFT may be performed when energy detected in a sub-band is higher than a threshold. The sub-bands may each be a WLAN channel. A type of a detected Bluetooth transmission may be determined based on a number of scans in which the transmission is detected. Each sub-band may be received for less than or equal to 68 ?s divided by the number of sub-bands.
    Type: Grant
    Filed: October 30, 2007
    Date of Patent: December 29, 2009
    Assignee: Broadcom Corporation
    Inventors: Brima Ibrahim, Steven Deane Hall
  • Patent number: 7640121
    Abstract: The present invention provides for disambiguating the phase of a field received from a wireless tracker in an electromagnetic (“EM”) tracking system. In a first method, a carrier wave signal is modulated with a tracking signal transmitted by an EM tracker. A time reference indicating a starting point for a particular phase of the carrier wave signal is determined and is used to determine the proper phase for the tracking signal. In a second method, the EM tracker transmits auxiliary data that includes the proper phase of the tracking signal. In a third method, the EM tracker includes a passive transponder that receives a desired phase of a tracking signal as auxiliary data in an excitation signal. In response, the EM tracker transmits the tracking signal according to the desired phase. Tracking electronics may then lock onto the proper or desired phase determined according to any of the disclosed methods.
    Type: Grant
    Filed: November 30, 2005
    Date of Patent: December 29, 2009
    Assignee: General Electric Company
    Inventor: Peter Traneus Anderson
  • Publication number: 20090312967
    Abstract: A phasor representation of an electrical entity at a geographical location in a multiple phase AC electric power system is produced by receiving a synchronization signal from a remote source, producing a sampling time signal in response to the synchronization signal and a local reference time signal, and producing samples representing an amount of the entity in respective ones of the phases in the AC power system in response to the sampling time signal and the electrical entity in respective ones of the phases in the AC power system. A transformation is performed on the samples to produce a two-axis rotating reference frame representation of the electrical entity in a two-axis rotating reference frame. For each sample, a representation of a sampling time associated with the sample is produced. The two-axis rotating reference frame representation and the representation of the sampling time comprise the phasor representation.
    Type: Application
    Filed: August 2, 2006
    Publication date: December 17, 2009
    Inventor: Ziwen Yao
  • Patent number: 7634370
    Abstract: A waveform input circuit, waveform observation unit and semiconductor test apparatus allow to faithfully observe waveform of a device under test with high output impedance and low load driving capability. A waveform input circuit includes a high input impedance terminating resistance which receives an input signal from a transmission line, a relay which selects a terminating resistance, an input buffer which is connected when the high input impedance terminating resistance is selected. A reference potential switch is further provided to select a reference potential of the transmission line where one reference potential is controlled to be in phase with the input signal by an input buffer which is connected when the high input impedance terminating resistance is selected.
    Type: Grant
    Filed: March 3, 2006
    Date of Patent: December 15, 2009
    Assignee: Advantest Corp.
    Inventor: Masayuki Kawabata
  • Publication number: 20090306917
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that stores the sample data, and a waveform generating section that generates a waveform of the signal under measurement based on the sample data read from the storage section. The sample processing section includes a sampler that samples the signal under measurement in synchronization with the reference clock and a data thinning section that thins the sample data output by the sampler and outputs this thinned data as sample data with the sampling timing at non-uniform intervals.
    Type: Application
    Filed: June 10, 2008
    Publication date: December 10, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: EIJI KANOH, TAKAYUKI AKITA, MASAYUKI KAWABATA
  • Publication number: 20090292490
    Abstract: One embodiment of the present invention provides a system that determines a total whisker length for conductive whiskers on a circuit in a computer system. During operation, a target electromagnetic signal radiating from the computer system is monitored. Then, the target electromagnetic signal is analyzed to determine the total whisker length for conductive whiskers on the circuit in the computer system.
    Type: Application
    Filed: May 23, 2008
    Publication date: November 26, 2009
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: David K. McElfresh, Kenny C. Gross, Ramakrishna C. Dhanekula