Quality Evaluation Patents (Class 702/81)
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Patent number: 8194828Abstract: A voice messaging system associates each stored voice message with a unique combination of a retrieval telephone number and a recipient identifier such as a recipient telephone number. When a voice message is received, the system sends a notification message containing the retrieval telephone number to the intended recipient. Upon receiving the notification message, the intended recipient can access the voice message directly by calling the message retrieval telephone number. The system detects the recipient identifier, for example, via caller identification of the recipient telephone number. Using the unique combination of retrieval telephone number and recipient identifier, the system retrieves and plays the appropriate voice message. In one embodiment, the access point for retrieving messages is different from the access point for leaving voice messages.Type: GrantFiled: December 15, 2008Date of Patent: June 5, 2012Assignee: Pinger, Inc.Inventor: Joseph K. Sipher
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Publication number: 20120136601Abstract: A method and system includes a first substrate and a second substrate, each substrate comprising a predetermined baseline transmittance value at a predetermine wavelength of light, processing regions on the first substrate by combinatorially varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production, performing a first characterization test on the processed regions on the first substrate to generate first results, processing regions on a second substrate in a combinatorial manner by varying at least one of materials, process conditions, unit processes, and process sequences associated with the graphene production based on the first results of the first characterization test, performing a second characterization test on the processed regions on the second substrate to generate second results, and determining whether at least one of the first substrate and the second substrate meet a predetermined quality threshold based on the second resType: ApplicationFiled: November 30, 2010Publication date: May 31, 2012Inventors: Charlene Chen, Tony P. Chiang, Chi-I Lang, Yun Wang
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Patent number: 8190378Abstract: An element damage determination unit calculates a cumulative value of a damage value using a Manson-Coffin law for a plurality of finite elements of a continuum based on a result of a stress/distortion analyzing process, and determines whether or not the cumulative value of the damage value is equal to or exceeds a threshold. A calculation unit obtains first correspondence information indicating the correspondence between the number of cycles of a load and a growth rate of a crack occurring in the continuum based on the determination result. A Manson-Coffin law change unit changes a Manson-Coffin law based on the first correspondence information and second correspondence information indicating the correspondence between an actual measurement value of the number of cycles of a load applied to the continuum and an actual measurement value of the growth rate of a crack occurring in the continuum at that time.Type: GrantFiled: October 30, 2008Date of Patent: May 29, 2012Assignee: Fujitsu LimitedInventors: Hidehisa Sakai, Katsufumi Morimune, Masanori Motegi, Tsutomu Iikawa
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Patent number: 8190391Abstract: A method includes receiving a first set of parameters associated with a plurality of die. A first die performance metric associated with a selected die is determined based on the first set of parameters. At least one neighborhood die performance metric associated with a set comprised of a plurality of die that neighbor the selected die is determined based on the first set of parameters. A second die performance metric is determined for the selected die based on the first die performance metric and the neighborhood die performance metric.Type: GrantFiled: March 29, 2007Date of Patent: May 29, 2012Assignee: GLOBALFOUNDRIES Inc.Inventors: Daniel Kadosh, Gregory A. Cherry, Carl I. Bowen, Luis De La Fuente, Rajesh Vijayaraghavan
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Patent number: 8190388Abstract: Aspects of a method and system for detecting Bluetooth signals utilizing a wideband receiver are provided. In this regard, a portion of a frequency band may be scanned multiple times, where each scan comprises receiving signals present in the scanned portion of the frequency band. Based on results of a Fast Fourier Transform performed on the received signals, presence of one or more Bluetooth transmissions in the received signals may be detected. In instances that a Bluetooth transmission is detected, a type of the Bluetooth transmission may be determined based on a number of the scans in which the Bluetooth transmission was detected. In instances that a detected Bluetooth transmission is a page, a Bluetooth transceiver in the wireless communication device may be powered up and/or enter a page scanning mode. The scans may be performed by a wireless local area networking receiver within the wireless communication device.Type: GrantFiled: October 26, 2009Date of Patent: May 29, 2012Assignee: Broadcom CorporationInventors: Brima Babatunde Ibrahim, Steven Deane Hall
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Patent number: 8185340Abstract: A recording-medium-type setting unit selects a type of a recording medium to be analyzed on the basis of information input with an input unit. A threshold-value setting unit sets a threshold value on which the determination of whether the calculation result is output in a file is based for each recording medium type selected by the recording-medium-type setting unit. An amount-of-variation calculating unit calculates the reaction force for every time step, stores the reaction force in the current time step in time integration in a RAM during the calculation, and monitors the amount of variation in the reaction force between each time step and the next time step. A file-output controlling unit calculates the difference between the reaction force stored by the amount-of-variation calculating unit and the reaction force in the current time step and, if the difference is larger than the threshold value, performs file output.Type: GrantFiled: April 8, 2009Date of Patent: May 22, 2012Assignee: Canon Kabushiki KaishaInventors: Tomohiro Watanabe, Kenji Taki
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Publication number: 20120116704Abstract: A method and system for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method comprising the steps of positioning a component with a first surface at a first station, applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset, obtaining an image of the applied two dimensional mark at the first station using a stationary camera that has a field of view that is centered along a trajectory that forms an obtuse angle with at least a portion of the first surface and that includes at least a portion of the first surface, performing a mark quality assessment on the obtained image and performing a secondary function as a result of the mark quality assessment.Type: ApplicationFiled: October 11, 2011Publication date: May 10, 2012Applicant: COGNEX CORPORATIONInventors: Sateesha Nadabar, Venkat K. Gopalakrishnan, Carl W. Gerst
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Patent number: 8168949Abstract: A method for sample examination in a dual-beam FIB calculates a first angle as a function of second, third and fourth angles defined by the geometry of the FIB and the tilt of the specimen stage. A fifth angle is calculated as a function of the stated angles, where the fifth angle is the angle between the long axis of an excised sample and the projection of the axis of the probe shaft onto the X-Y plane. The specimen stage is rotated by the calculated fifth angle, followed by attachment to the probe tip and lift-out. The sample may then be positioned perpendicular to the axis of the FIB electron beam for STEM analysis by rotation of the probe shaft through the first angle.Type: GrantFiled: October 1, 2010Date of Patent: May 1, 2012Assignee: Omniprobe, Inc.Inventors: Lyudmila Zaykova-Feldman, Thomas M. Moore, Gonzalo Amador, Matthew Hammer
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Publication number: 20120101757Abstract: A method for performing a dimensional inspection of a fabricated composite part (9), comprising steps of: a) Providing a number of points (Iij, Oij) to be inspected in its inner and outer surface; b) Obtaining the positional data of said points (Iij, Oij) from the fabricated composite part (9) hold in a position that allows the access to its outer and inner surfaces as a first set of positional data (WIij, WOij); c) Using said first set of positional data (WIij, WOij) and a second set of positional data (TIij, TOij) of the same points (Iij, Oij) obtained from an analytical model defining its theoretical geometry for calculating the deviations between them taking into account the deformations suffered by the fabricated composite part (9) in said position. The invention also refers to a workstation (11) for performing the method.Type: ApplicationFiled: March 28, 2011Publication date: April 26, 2012Inventors: Josep MORANCHO RODRÏGUEZ, Nuria Rodrigo Caballero
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Publication number: 20120101758Abstract: A method of analyzing a cause of abnormality of a wafer processed by plasma in at least any one of two or more process modules disposed in a plasma processing system of a cluster type, the method includes recording information about transfer paths of the processing target from when the wafer is transferred from a shipping container and transferred to at least any one of the two or more process modules to when the processing target is returned to the shipping container, in relation with identification information of the wafer for each processing target; testing a state of the wafer after a plasma process has finished; and analyzing a cause of abnormality based on a result of comparison between recorded informations about transfer paths of the processing target determined to be abnormal and the processing target determined to be normal as a result of the testing.Type: ApplicationFiled: October 24, 2011Publication date: April 26, 2012Applicant: TOKYO ELECTRON LIMITEDInventor: Tatsuya OGI
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Patent number: 8160822Abstract: An apparatus for measuring optimum water-quality and informing quality of water 100 measures an amount of impurities of water, keeps to renew an optimum value by a lowest amount of the impurities until the present use, compares the optimum value with the present amount of the impurities measured in the water and informs the result.Type: GrantFiled: December 17, 2007Date of Patent: April 17, 2012Assignees: Sechang Instruments Co., Ltd.Inventor: Seung June Song
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Patent number: 8154602Abstract: In estimating subjective video quality corresponding to main parameters which are input as an input frame rate representing the number of frames per unit time, an input coding bit rate representing the number of coding bits per unit time, and an input packet loss rate representing a packet loss occurrence probability of an audiovisual medium, a degradation model specifying unit specifies a degradation model representing the relationship between the packet loss rate and the degradation in reference subjective video quality on the basis of the input frame rate and input coding bit rate. A desired subjective video quality estimation value is calculated by correcting the reference subjective video quality on the basis of a video quality degradation ratio corresponding to the input packet loss rate calculated by using the degradation model.Type: GrantFiled: November 28, 2006Date of Patent: April 10, 2012Assignee: Nippon Telegraph and Telephone CorporationInventors: Kazuhisa Yamagishi, Takanori Hayashi
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Patent number: 8155639Abstract: A system and method for antenna analysis and electromagnetic compatibility testing in a wireless device utilizes a “parent” device that undergoes rigorous conventional testing. A “child” device having similar components may thereafter undergo abbreviated testing. Because the Total Isotropic Sensitivity of the parent device is known, testing may be performed on the child device to infer equivalence to the parent's TIS performance using the abbreviated test techniques.Type: GrantFiled: March 20, 2008Date of Patent: April 10, 2012Assignee: AT&T Mobility II LLCInventor: Scott Dale Prather
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Patent number: 8150645Abstract: Measurement of the uncertainty used for quality control typically involves a plurality of factors. When the uncertainty exceeds a clinical permissible value, time is required for a medical technologist to investigate and to determine the factor causing the uncertainty. It is thus beneficial to automatically investigate factors in complicated uncertainty, particularly from the view point of reagents and samples which are subject to quality change and that are prone to affect the measurement quality. Quality control samples having a plurality of concentration levels are measured to calculate the average, coefficient of variation, standard deviation, and other numerical values. When quality control samples having n (n?2) different concentration levels are measured, variation patterns determine the factor causing the uncertainty, the factor being specific to each of 3n different combinations of variation patterns.Type: GrantFiled: January 30, 2009Date of Patent: April 3, 2012Assignee: Hitachi High-Technologies CorporationInventors: Kumiko Kamihara, Tomonori Mimura, Shinichi Fukuzono
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Patent number: 8150654Abstract: A chiller's performance tester includes two flowrate sensors, four temperature sensors, one current sensor, one voltage sensor, all sensors being externally connectable, and an enclosure in which a thermal energy calculation IC board, an electrical power calculation IC board, and a programmable logic controller are arranged. The enclosure has a front side to which a man-machine interface panel that displays measurement readings and provides function-related operations is mounted. The enclosure has a back side to which a socket-carrying panel that is connectable to cables of the sensors is mounted. Readings of flowrate, temperature, current, and voltage are transmitted to the programmable logic controller in which software is executed to compile and integrate these signals to be further transmitted to a computer for subsequent analysis and monitoring. Test of a water chiller is made simple and cost, man power, and working hours are saved.Type: GrantFiled: December 17, 2009Date of Patent: April 3, 2012Inventors: Chung Yueh Ho, Cheng-Ta Ho
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Patent number: 8144341Abstract: A method for making a sample for evaluation of laser irradiation position and evaluating the sample, and an apparatus which is switchable between a first mode of modification of semiconductor and a second mode of making and evaluating the sample. Specifically, a sample is made by irradiating a semiconductor substrate for evaluation with a pulse laser beam while the semiconductor substrate is moved for evaluation at an evaluation speed higher than a modifying treatment speed, each relative positional information between pulse-irradiated regions in the sample is extracted, and stability of the each relative positional information between pulse-irradiated regions is evaluated. The evaluation speed is such a speed that separates the pulse-irradiated regions on the sample from each other in a moving direction.Type: GrantFiled: October 24, 2011Date of Patent: March 27, 2012Assignee: Semiconductor Energy Laboratory Co., Ltd.Inventors: Ryusuke Kawakami, Miyuki Masaki
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Patent number: 8131492Abstract: A method of directly measuring hydrogen permeability of a film is provided. The method of evaluating a film includes acquiring, with respect to a specimen including a plurality of films stacked on each other, ion dose-dependence data of intensity of ?-beam generated by hydrogen resonant nuclear reaction, and fitting the data with a functional equation of the ion dose.Type: GrantFiled: December 26, 2007Date of Patent: March 6, 2012Assignees: Renesas Electronics Corporation, The Foundation for the Promotion of Industrial ScienceInventors: Shien Cho, Markus Wilde, Katsuyuki Fukutani
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Patent number: 8131285Abstract: Disclosed herein is a transmission/reception channel matching apparatus for a mobile communication terminal and a mobile phone test equipment. The transmission/reception channel matching apparatus includes a Printed Circuit Board (PCB), a Dual In-line Package (DIP) switch, and a fastening casing. The PCB includes mobile communication terminal-side terminals to be electrically connected to option pins provided in the serial communication connector of the mobile communication terminal, and transmission and reception terminals corresponding to the transmission and reception channels of the mobile phone test equipment for transmitting a transmission signal to the mobile communication terminal and receiving a reception signal from the mobile communication terminal. The DIP switch is provided with a plurality of switches, is combined with the PCB, and selectively connects the mobile communication terminal-side terminals to the transmission and reception terminals depending on ON/OFF information.Type: GrantFiled: May 23, 2008Date of Patent: March 6, 2012Assignee: Innowireless Co., Ltd.Inventors: Jinsoup Joung, Kyeongmin Ha, Jongmin Kim, Sunglyong Lim
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Publication number: 20120053876Abstract: Methods and systems are provided for monitoring a structural health of an object. A state of fluorescence of at least one particle associated with the object is identified, and a structural health parameter associated with the object is determined based on the identified state of fluorescence of the at least one particle.Type: ApplicationFiled: August 26, 2010Publication date: March 1, 2012Inventor: David A. Followell
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Patent number: 8122848Abstract: A film forming apparatus which forms a film on a substrate by utilizing a chemical solution, including: a correlation data creating unit which creates a correlation data that is related to the quality of a chemical solution, from data that is related to the properties of the chemical solution including at least one of data on storage temperature for the chemical solution to be loaded and data on pressure applied to the chemical solution to be loaded; and a determining unit which determines whether or not the chemical solution holds expected quality thereof on the bases of the correlation data.Type: GrantFiled: November 10, 2009Date of Patent: February 28, 2012Assignee: Kabushiki Kaisha ToshibaInventor: Daisuke Kawamura
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Patent number: 8126581Abstract: A system for optimizing at least one of a design, production, or testing process of a product in a mass manufacturing process includes: a central processing unit; a network interface operatively connected to the central processing unit; a storage device; a memory including logic for execution by the central processing unit, wherein the logic includes: a server handler made up of a client applet and a client interface servlet which are configured for enabling authorized end-user communication; an error data collection handler configured for gathering error data; an error data classification handler; an analysis handler; a suggested actions report handler; and the system further includes a server database configured for storing, modifying, and deleting data.Type: GrantFiled: October 22, 2007Date of Patent: February 28, 2012Assignee: International Business Machines CorporationInventors: Timothy J. Kostyk, Theresa C. Kratschmer, Jeff R. Layton, Peter Kenneth Malkin, Stephen G. Perun, Kenneth L. Pyra, Padmanabhan Santhanam, John C. Thomas, Scott W. Weller
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Publication number: 20120046826Abstract: Disclosed are systems and methods for a vehicle scanner to automatically execute applications from a removable storage card. The method includes detecting a presence of one or more executable diagnostic requests in removable data storage, and responsive to the detection, transmitting one or more corresponding requests for vehicle diagnostic data to the vehicle via a vehicle interface. Responsive to the transmission, the vehicle scanner receives and processes diagnostic data from the vehicle. The vehicle scanner may store the data back to the removable storage card, or may transmit the data via a wired or wireless interface to a display device. As part of the detection process, the vehicle scanner may first authenticate the removable storage card before executing vehicle diagnostic instructions from the card.Type: ApplicationFiled: August 4, 2011Publication date: February 23, 2012Applicant: Snap-on IncorporatedInventor: James A. Panko
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Patent number: 8121799Abstract: A method of estimating the life of a heater wire, including the steps of: detecting a maximum value of electric power supplied to the heater wire during a temperature rising period during which a temperature is elevated to a preset heating temperature, obtaining an index indicative of the amplitude of the electric power, and giving a notice that the heater wire is approaching the end of its life when the electric power and the index indicative of the of amplitude of the electric power exceed threshold values respectively provided thereto.Type: GrantFiled: April 15, 2008Date of Patent: February 21, 2012Assignee: Tokyo Electron LimitedInventors: Nobutoshi Terasawa, Minoru Obata, Noriaki Koyama
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Publication number: 20120035876Abstract: A method that includes affixing a radio frequency identification tag on a storage battery at a battery manufacturing plant. The method also includes storing battery manufacturing information into the radio frequency identification tag at the battery manufacturing plant. The battery manufacturing information includes a battery algorithm suitable for use in testing the storage battery.Type: ApplicationFiled: October 11, 2011Publication date: February 9, 2012Applicant: MIDTRONICS, INC.Inventors: Kevin I. Bertness, John S. Philbrook
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Patent number: 8108060Abstract: System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) are described. In one embodiment, the method comprises performing a key process on a sample number of wafers of a lot of wafers; performing a key inline measurement related to the key process to produce metrology data for the wafers; predicting WAT data from the metrology data using an inline-to-WAT model; and using the predicted WAT data to tune a WAT APC process for controlling a tuning process or a process APC process.Type: GrantFiled: May 13, 2009Date of Patent: January 31, 2012Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Andy Tsen, Jo Fei Wang, Po-Feng Tsai, Ming-Yu Fan, Jill Wang, Jong-I Mou, Sunny Wu
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Patent number: 8108168Abstract: A method, apparatus and program product manage non-destructive evaluation (“NDE”) data. NDE data and inspection information for at least a portion of an asset are received and at least one alignment algorithm to align the NDE data to a simulated model of the at least a portion of the asset is determined based upon at least one of the NDE data and the inspection information. The NDE data is automatically aligned to the simulated model with the at least one alignment algorithm and a display representation that visually represents the aligned NDE data on the simulated model is generated.Type: GrantFiled: March 12, 2009Date of Patent: January 31, 2012Assignee: Etegent Technologies, Ltd.Inventors: Thomas D. Sharp, Richard A. Roth, II, Uriah M. Liggett, Joseph M. Kesler
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Patent number: 8108178Abstract: A method of validating a probability of detection (POD) testing system using directed design of experiments (DOE) includes recording an input data set of observed hit and miss or analog data for sample components as a function of size of a flaw in the components. The method also includes processing the input data set to generate an output data set having an optimal class width, assigning a case number to the output data set, and generating validation instructions based on the assigned case number. An apparatus includes a host machine for receiving the input data set from the testing system and an algorithm for executing DOE to validate the test system. The algorithm applies DOE to the input data set to determine a data set having an optimal class width, assigns a case number to that data set, and generates validation instructions based on the case number.Type: GrantFiled: May 18, 2009Date of Patent: January 31, 2012Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventor: Edward R. Generazio
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Patent number: 8103478Abstract: By dividing a complex set of parameters of a production process in forming semiconductor devices into individual blocks, respective PCA models may be established for each block and may thereafter be combined by operating on summary statistics of each model block in order to evaluate the complete initial parameter set. Thus, compared to conventional strategies, a significant reduction of the size of the combined PCA model compared to a single PCA model may be obtained, while also achieving an enhanced degree of flexibility in evaluating various subsets of parameters.Type: GrantFiled: February 18, 2009Date of Patent: January 24, 2012Assignee: GLOBALFOUNDRIES Inc.Inventors: Richard Good, Daniel Kost
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Patent number: 8094196Abstract: A matched state detection unit (33) of a video matching device (100) detects a reference video frame, of the respective video frames of a reference video (1) and degraded video (2B), which is in a matched state in which it is spatially and temporally matched with each degraded video frame. A matching degree derivation unit (34) controls a degradation amount derivation unit (40) to acquire the first degradation amount indicating the degradation amount between a reference video frame and a degraded video frame in the matched state and the second degradation amount indicating the degradation amount between a reference video frame and a degraded video frame in a state shifted from the matched state by a predetermined number of pixels and calculate a matching degree on the basis of the ratio between the first degradation amount and the second degradation amount. A matching information output unit (35) outputs the matching degree between the reference video and the degraded video after matching.Type: GrantFiled: July 11, 2006Date of Patent: January 10, 2012Assignee: Nippon Telegraph and Telephone CorporationInventors: Jun Okamoto, Takaaki Kurita
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Patent number: 8086424Abstract: A method for dynamically determining a remaining actual operational period for a filter in a filtration device including: determining an initial remaining operational period based on an installation date of the filter and an initial expected operational period; periodically determining a remaining actual operational period of the filter based on the initial remaining operational period based and an elapsed operational period from the installation date; monitoring at least one operating parameter in the filtration device; adjusting the remaining actual operational period based on the monitored operating parameter, and continuing to periodically determine the remaining actual operational period based on the adjusted remaining actual operational period and the elapsed operational period.Type: GrantFiled: July 11, 2008Date of Patent: December 27, 2011Assignee: General Electric CompanyInventor: Terry Lewis Farmer
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Publication number: 20110307095Abstract: A method for processing a plurality of flat printed products is provided. The method includes the steps of determining one of at least two quality statuses for each flat printed product and for each flat printed product, storing a first information representing the determined quality status and a second information combining the first information with said flat printed product. The invention also relates to a corresponding device for processing flat printed products.Type: ApplicationFiled: June 13, 2011Publication date: December 15, 2011Applicant: GOSS INTERNATIONAL MONTATAIRE SAInventor: Michel Chretinat
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Patent number: 8078434Abstract: A method (300, 400, 500, 1200) for offline/online monitoring of batch processes. The method involves (312) decomposing a time domain of a batch process run (BPR) into several blocks and (334) building multivariate statistical models (MSMs) for each of them using archived data for a batch process (ABPD). ABPD comprises stored data obtained during BPRs. The method also involves (506, 1204) retrieving recently stored data (RSD) for a recent fully performed BPR run (FPRNEW) or current BPR run. The method further involves (520, 1210) building a feature vector matrix (FVM) using RSD. FVM contains feature vectors representing statistical measures of wavelet coefficients determined for variables (v0, . . . , vJ). A projection (1100, 1150, 1190) is formed by projecting feature vectors onto at least one MSM or a combined multivariate statistical model (CMSM). CMSM is a weighted average of at least two MSMs.Type: GrantFiled: July 17, 2008Date of Patent: December 13, 2011Assignee: Honeywell International Inc.Inventors: Ramprasad Yelchuru, Srikanth Ryali, Shailesh Rajnikant Patel, Gudi Ravindra
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Patent number: 8078919Abstract: A method, apparatus and program storage device for managing multiple step processes triggered by a signal is disclosed. Status records are created for each process step. When an error occurs, error status record in recorded in the status record. A user may then use the status record to identify the error, take corrective action and restart the process at the appropriate point for reprocessing the signals.Type: GrantFiled: June 14, 2005Date of Patent: December 13, 2011Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventor: Eden Garia
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Patent number: 8078307Abstract: A defect testing apparatus for testing defects of optical film sheet-shaped product of an optical displaying apparatus, which includes a defect detecting means for detecting defects of a monolayer body and/or a laminate body constituting the sheet-shaped product in a state in which a protective layer on a surface of the sheet-shaped product is not disposed and defect information preparing means for preparing defect information which is information related to the defects detected by the defect detecting means, and the defect information is used for producing the sheet-shaped product provided in a roll form or in separate sheets.Type: GrantFiled: November 10, 2010Date of Patent: December 13, 2011Assignee: Nitto Denko CorporationInventor: Hiromichi Ohashi
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Patent number: 8078924Abstract: The present invention is directed to a system and method for a quality assurance tool generating test plans and identifying new test requirements for a new version of a product. Old versions of the product may be previously tested and test plan documents associated with previously tested versions of the product may be stored in a database. The database may store test plans, test configurations, test scopes, and the like for previously tested versions of the product. Product design requirements may be determined based on received customer desired features for the new version. The database may be updated by adding new tests for new features of the new version. A test plan document for the product may be generated based on the updated database. The generated test document may be verified through automatically generating a general test plan for the new version of the product by querying updated database with the product design requirements.Type: GrantFiled: September 16, 2005Date of Patent: December 13, 2011Assignee: LSI CorporationInventor: Mahmoud K. Jibbe
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Publication number: 20110288803Abstract: The present invention provides a quality inspection method of a glass plate, which can predict the shape of the glass plate on a four-point supporting type actual measurement inspection stand from the shape of the glass plate on a three-point supporting type universal actual measurement inspection stand.Type: ApplicationFiled: August 3, 2011Publication date: November 24, 2011Applicant: Asahi Glass Company, LimitedInventor: Yoshiyuki SONDA
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Patent number: 8065100Abstract: A system and method for using loop topology identification to investigate a transmission line having a plurality of cable segments. At a measurement plane for each segment, a probing signal is transmitted into the cable. A reflected signal is detected, and an equivalent total input impedance is calculated. The system iteratively calculates the distance between the measurement planes as well as the length, characteristic impedance, and the propagation constant of each segment. A model is used to calculate the respective equivalent input impedance of each segment using the calculated characteristic impedance, propagation constant, and length of the preceding segment. The equivalent total input impedance is then calculated from the iteratively calculated segment values.Type: GrantFiled: January 31, 2006Date of Patent: November 22, 2011Assignee: Telefonaktiebolaget LM Ericsson (publ)Inventors: Fredrik Lindqvist, Antoni Fertner, Per Ola Börjesson
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Patent number: 8060332Abstract: A sensor function testing method and a computer program product thereof are provided. In the present method, a rearm type corresponding to a rearm function of a sensor in a server is obtained, wherein the sensor is in a normal status or one of a plurality of failure statuses. Then, the sensor is respectively triggered to enter and exit each of the failure statuses. If the rearm type is an auto rearm type and the sensor automatically returns to the normal status every time when the sensor is triggered to exit one of the failure statuses, the rearm function is determined as normal. If the rearm type is a manual rearm type and the sensor only returns to the normal status after receiving a rearm instruction every time when the sensor is triggered to exit one of the failure statuses, the rearm function is determined as normal.Type: GrantFiled: May 15, 2009Date of Patent: November 15, 2011Assignee: Inventec CorporationInventor: Chung-Nan Chen
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Patent number: 8060325Abstract: Embodiments of a method and apparatus for variable sensing using the frequency domain are taught herein. An exposure of a system to a physical variable is determined by periodically sensing the physical variable to produce a plurality of digital samples. The plurality of digital samples is converted to respective frequency domain representations. The exposure is calculated using the frequency domain representations.Type: GrantFiled: November 12, 2007Date of Patent: November 15, 2011Assignee: 2 Bit, Inc.Inventor: Rodney J. Lambert
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Publication number: 20110270555Abstract: A process variation detection apparatus and a process variation detection method are provided. The process variation detection apparatus includes a process variation detector and a compensation signal generator. The process variation detector includes a first process variation detection component, a second process variation detection component and a current comparator. The channel of the first process variation detection component is a first conductive type, and the channel of the second process variation detection component is a second conductive type, wherein the above-mentioned first conductive type is different from the second conductive type. The current comparator is connected to the first process variation detection component and the second process variation detection component for comparing the current difference between the two components and outputting a current comparison result.Type: ApplicationFiled: August 5, 2010Publication date: November 3, 2011Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Ku-Feng Lin, Meng-Fan Chang, Shyh-Shyuan Sheu, Pei-Chia Chiang, Wen-Pin Lin, Chih-He Lin
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Patent number: 8050843Abstract: The present invention is concerned with the estimation of health parameters p(k) representing symptoms of a slowly degrading system, in particular industrial gas turbines. According to the invention, an estimation of a true health or independent parameter vector at time step k uses the estimation of the true health or parameter vector at a previous time step k?1 as a starting value for the production of a predicted health parameter vector at time step k. Based on the latter and a set of measured values of input variables of an extended model of the system, a prediction of output variables of the model is produced. This predicted model output is compared with measured values of the output variables to yield an error. From this error, a health parameter estimator in turn produces a health parameter estimate as a revision of the predicted health parameters.Type: GrantFiled: January 10, 2011Date of Patent: November 1, 2011Assignee: ABB Research LtdInventors: Thomas von Hoff, Andreas Poncet, Konrad Stadler
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Patent number: 8045184Abstract: A method for making a sample for evaluation of laser irradiation position and evaluating the sample, and an apparatus which is switchable between a first mode of modification of semiconductor and a second mode of making and evaluating the sample. Specifically, a sample is made by irradiating a semiconductor substrate for evaluation with a pulse laser beam while the semiconductor substrate is moved for evaluation at an evaluation speed higher than a modifying treatment speed, each relative positional information between pulse-irradiated regions in the sample is extracted, and stability of the each relative positional information between pulse-irradiated regions is evaluated. The evaluation speed is such a speed that separates the pulse-irradiated regions on the sample from each other in a moving direction.Type: GrantFiled: January 28, 2009Date of Patent: October 25, 2011Assignee: Semiconductor Energy Laboratory Co., Ltd.Inventors: Ryusuke Kawakami, Miyuki Masaki
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Publication number: 20110257919Abstract: The present invention relates to a computer-implemented quality assurance system, which includes the steps of retrieving quality assurance and supporting information from a database; receiving information on technical variables from monitoring of the patient, and on radiographic equipment in the performance of an imaging study; generating a quality assurance score after said imaging study based on said technical variables and said quality assurance and supporting information; and performing a quality assurance analysis of the imaging study based on the quality assurance score.Type: ApplicationFiled: June 23, 2011Publication date: October 20, 2011Applicant: QAMIInventor: Bruce Reiner
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Patent number: 8041525Abstract: In the present invention, for measurement of line widths, for example, at 36 locations within a substrate processed in a coating and developing treatment system, the 36 measurement points are divided and, for example, six substrates are used to measure the line widths at all of measurement points. In this event, the line widths at six measurement points are measured in each of the substrate, which exist in substrate regions different for each substrate. Then, the measurement results of the line widths at the measurement points of the substrates are combined, so that the line widths at 36 measurement points are finally detected. According to the present invention, the measurements of product substrates can be performed without decreasing the throughput of processing of the product substrates.Type: GrantFiled: September 17, 2007Date of Patent: October 18, 2011Assignee: Tokyo Electron LimitedInventors: Yoshihiro Kondo, Kunie Ogata, Shinichi Shinozuka
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Publication number: 20110251811Abstract: A method is provided to determine a quality acceptance criterion using force signatures measured on a first and a second set of elements. The first set has no quality defect and the second set has a deliberate quality defect. Selection of an initial subset of time points is based on statistical analysis of the force data on the force signatures in the two sets. The quality acceptance criterion includes a quality threshold established using Mahalanobis Distance (MD) values and the MD values are produced from force data at a selected initial subset of time points for each element in the two sets. An output of the determined quality acceptance criterion is using the defined quality threshold to separate an element having a force signature into a group of elements having no quality defect or into a group of elements having a quality defect like the deliberate quality defect.Type: ApplicationFiled: April 9, 2010Publication date: October 13, 2011Applicant: DELPHI TECHNOLOGIES, INC.Inventors: JEFFREY M. HANDEL, ROBERT W. CAVEN
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Patent number: 8027800Abstract: In some embodiments, each interferometric modulator has a stiction threshold voltage. If a voltage above the stiction threshold voltage is applied to the interferometric modulator, the interferometric modulator enters a stiction state permanently, i.e., becomes “stuck,” and the interferometric modulator becomes inoperable. Disclosed are apparatuses, methods and computer-readable media for testing a panel of interferometric modulators. A ramped voltage waveform is applied to a plurality of interferometric modulators of the panel. In response to applying the ramped voltage, the stiction threshold voltage is identified. At or above this voltage, the number of stuck interferometric modulators in the panel reaches or exceeds a first threshold number, for example, 50% of the total number of the interferometric modulators constituting the panel. The embodiments can be used to establish stiction benchmark for panel manufacturing processes, to collect data for generating statistical distribution, etc.Type: GrantFiled: June 24, 2008Date of Patent: September 27, 2011Assignee: QUALCOMM MEMS Technologies, Inc.Inventors: Ramez Nachman, Lei Chen, Tao Yu
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Publication number: 20110231129Abstract: A disclosed identification method of identifying a data point distribution area on a coordinate plane includes dividing an area on the coordinate plane into divided areas so that the divided areas radiate from a division center point; selecting, in each of the divided areas, from among the data points in the divided area, a data point having the greatest distance from the division center point as a representative point; determining whether there is an overlapping area where a distribution representative point area overlaps a determination area; and determining, when there is the overlapping area, that the data group to be determined is a relevant data group.Type: ApplicationFiled: March 10, 2011Publication date: September 22, 2011Applicant: RICOH COMPANY, LTD.Inventor: Hirokazu YANAI
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Patent number: 8024134Abstract: A gas sensor which includes: a plurality of gas detectors, each detects a target gas; an error detector which detects the occurrence of an error on each of gas sensors; an output selector which selects one output from among outputs entered from each gas sensor, the output selected by the output selector is the output from the gas detector in which no error exists; and an output unit which generate a normal output based on the output selected by the output selector and outputs the normal output to an external electrical device through a single output system, the output unit generates an abnormal output based on the output from the gas detector, in which the error exists, when the gas detector, in which an error exists, is detected, and outputs alternately the normal output and the abnormal output.Type: GrantFiled: July 31, 2006Date of Patent: September 20, 2011Assignee: Honda Motor Co., Ltd.Inventors: Takashi Sasaki, Akihiro Suzuki
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Patent number: 8024138Abstract: In an example configuration, a power supply manager receives an output current value representing an amount of output current supplied by one or more power converter phases to a load. The power supply manager also receives a duty cycle value representing a duty cycle for controlling operation of the at least one power converter phase. The power supply manager produces an estimate of input current supplied to the power supply circuit based at least in part on multiplying the output current value by the duty cycle value. Contrary to conventional methods such as physically measuring an input current using complex measuring circuitry, embodiments herein include utilizing parameter information such as output current information and duty cycle information to deduce an amount of input current.Type: GrantFiled: June 20, 2008Date of Patent: September 20, 2011Assignee: International Rectifier CorporationInventors: Robert T. Carroll, James Noon, Venkat Sreenivas, Gary D. Martin
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Patent number: RE43405Abstract: A method of displaying a measurement result in an inspection process using network, the method includes a first step that a host, which intensively controls and manages a device for inspecting a lot to be processed in one or a plurality of steps, transmits to the device a condition of measuring a lot determined to be put in, a second step that the device measures the lot based on the measurement condition received via the network and then obtains measured data, a third step that the host determines whether the measured data received via the network is abnormal or normal based on a predetermined assessment standard and then produces a result of assessing a measured value so as to transmit the result to the device and a fourth step that the device provides a display corresponding to the result of assessing the measured value in accordance with the received result of assessing the measured value as well as a previously registered display standard.Type: GrantFiled: January 23, 2008Date of Patent: May 22, 2012Assignee: Seiko Epson CorporationInventor: Kazufumi Kato