Abstract: A method for performing a dimensional inspection of a fabricated composite part (9), comprising steps of: a) Providing a number of points (Iij, Oij) to be inspected in its inner and outer surface; b) Obtaining the positional data of said points (Iij, Oij) from the fabricated composite part (9) hold in a position that allows the access to its outer and inner surfaces as a first set of positional data (WIij, WOij); c) Using said first set of positional data (WIij, WOij) and a second set of positional data (TIij, TOij) of the same points (Iij, Oij) obtained from an analytical model defining its theoretical geometry for calculating the deviations between them taking into account the deformations suffered by the fabricated composite part (9) in said position. The invention also refers to a workstation (11) for performing the method.

Abstract: An apparatus for measuring optimum water-quality and informing quality of water 100 measures an amount of impurities of water, keeps to renew an optimum value by a lowest amount of the impurities until the present use, compares the optimum value with the present amount of the impurities measured in the water and informs the result.

Abstract: In estimating subjective video quality corresponding to main parameters which are input as an input frame rate representing the number of frames per unit time, an input coding bit rate representing the number of coding bits per unit time, and an input packet loss rate representing a packet loss occurrence probability of an audiovisual medium, a degradation model specifying unit specifies a degradation model representing the relationship between the packet loss rate and the degradation in reference subjective video quality on the basis of the input frame rate and input coding bit rate. A desired subjective video quality estimation value is calculated by correcting the reference subjective video quality on the basis of a video quality degradation ratio corresponding to the input packet loss rate calculated by using the degradation model.

Abstract: A system and method for antenna analysis and electromagnetic compatibility testing in a wireless device utilizes a “parent” device that undergoes rigorous conventional testing. A “child” device having similar components may thereafter undergo abbreviated testing. Because the Total Isotropic Sensitivity of the parent device is known, testing may be performed on the child device to infer equivalence to the parent's TIS performance using the abbreviated test techniques.

Abstract: Measurement of the uncertainty used for quality control typically involves a plurality of factors. When the uncertainty exceeds a clinical permissible value, time is required for a medical technologist to investigate and to determine the factor causing the uncertainty. It is thus beneficial to automatically investigate factors in complicated uncertainty, particularly from the view point of reagents and samples which are subject to quality change and that are prone to affect the measurement quality. Quality control samples having a plurality of concentration levels are measured to calculate the average, coefficient of variation, standard deviation, and other numerical values. When quality control samples having n (n?2) different concentration levels are measured, variation patterns determine the factor causing the uncertainty, the factor being specific to each of 3n different combinations of variation patterns.

Abstract: A chiller's performance tester includes two flowrate sensors, four temperature sensors, one current sensor, one voltage sensor, all sensors being externally connectable, and an enclosure in which a thermal energy calculation IC board, an electrical power calculation IC board, and a programmable logic controller are arranged. The enclosure has a front side to which a man-machine interface panel that displays measurement readings and provides function-related operations is mounted. The enclosure has a back side to which a socket-carrying panel that is connectable to cables of the sensors is mounted. Readings of flowrate, temperature, current, and voltage are transmitted to the programmable logic controller in which software is executed to compile and integrate these signals to be further transmitted to a computer for subsequent analysis and monitoring. Test of a water chiller is made simple and cost, man power, and working hours are saved.

Abstract: A method for making a sample for evaluation of laser irradiation position and evaluating the sample, and an apparatus which is switchable between a first mode of modification of semiconductor and a second mode of making and evaluating the sample. Specifically, a sample is made by irradiating a semiconductor substrate for evaluation with a pulse laser beam while the semiconductor substrate is moved for evaluation at an evaluation speed higher than a modifying treatment speed, each relative positional information between pulse-irradiated regions in the sample is extracted, and stability of the each relative positional information between pulse-irradiated regions is evaluated. The evaluation speed is such a speed that separates the pulse-irradiated regions on the sample from each other in a moving direction.

Abstract: A method of directly measuring hydrogen permeability of a film is provided. The method of evaluating a film includes acquiring, with respect to a specimen including a plurality of films stacked on each other, ion dose-dependence data of intensity of ?-beam generated by hydrogen resonant nuclear reaction, and fitting the data with a functional equation of the ion dose.

Abstract: Disclosed herein is a transmission/reception channel matching apparatus for a mobile communication terminal and a mobile phone test equipment. The transmission/reception channel matching apparatus includes a Printed Circuit Board (PCB), a Dual In-line Package (DIP) switch, and a fastening casing. The PCB includes mobile communication terminal-side terminals to be electrically connected to option pins provided in the serial communication connector of the mobile communication terminal, and transmission and reception terminals corresponding to the transmission and reception channels of the mobile phone test equipment for transmitting a transmission signal to the mobile communication terminal and receiving a reception signal from the mobile communication terminal. The DIP switch is provided with a plurality of switches, is combined with the PCB, and selectively connects the mobile communication terminal-side terminals to the transmission and reception terminals depending on ON/OFF information.

Abstract: Methods and systems are provided for monitoring a structural health of an object. A state of fluorescence of at least one particle associated with the object is identified, and a structural health parameter associated with the object is determined based on the identified state of fluorescence of the at least one particle.

Abstract: A system for optimizing at least one of a design, production, or testing process of a product in a mass manufacturing process includes: a central processing unit; a network interface operatively connected to the central processing unit; a storage device; a memory including logic for execution by the central processing unit, wherein the logic includes: a server handler made up of a client applet and a client interface servlet which are configured for enabling authorized end-user communication; an error data collection handler configured for gathering error data; an error data classification handler; an analysis handler; a suggested actions report handler; and the system further includes a server database configured for storing, modifying, and deleting data.

Abstract: A film forming apparatus which forms a film on a substrate by utilizing a chemical solution, including: a correlation data creating unit which creates a correlation data that is related to the quality of a chemical solution, from data that is related to the properties of the chemical solution including at least one of data on storage temperature for the chemical solution to be loaded and data on pressure applied to the chemical solution to be loaded; and a determining unit which determines whether or not the chemical solution holds expected quality thereof on the bases of the correlation data.

Abstract: Disclosed are systems and methods for a vehicle scanner to automatically execute applications from a removable storage card. The method includes detecting a presence of one or more executable diagnostic requests in removable data storage, and responsive to the detection, transmitting one or more corresponding requests for vehicle diagnostic data to the vehicle via a vehicle interface. Responsive to the transmission, the vehicle scanner receives and processes diagnostic data from the vehicle. The vehicle scanner may store the data back to the removable storage card, or may transmit the data via a wired or wireless interface to a display device. As part of the detection process, the vehicle scanner may first authenticate the removable storage card before executing vehicle diagnostic instructions from the card.

Abstract: A method of estimating the life of a heater wire, including the steps of: detecting a maximum value of electric power supplied to the heater wire during a temperature rising period during which a temperature is elevated to a preset heating temperature, obtaining an index indicative of the amplitude of the electric power, and giving a notice that the heater wire is approaching the end of its life when the electric power and the index indicative of the of amplitude of the electric power exceed threshold values respectively provided thereto.

Abstract: A method that includes affixing a radio frequency identification tag on a storage battery at a battery manufacturing plant. The method also includes storing battery manufacturing information into the radio frequency identification tag at the battery manufacturing plant. The battery manufacturing information includes a battery algorithm suitable for use in testing the storage battery.

Abstract: A method, apparatus and program product manage non-destructive evaluation (“NDE”) data. NDE data and inspection information for at least a portion of an asset are received and at least one alignment algorithm to align the NDE data to a simulated model of the at least a portion of the asset is determined based upon at least one of the NDE data and the inspection information. The NDE data is automatically aligned to the simulated model with the at least one alignment algorithm and a display representation that visually represents the aligned NDE data on the simulated model is generated.

Abstract: System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) are described. In one embodiment, the method comprises performing a key process on a sample number of wafers of a lot of wafers; performing a key inline measurement related to the key process to produce metrology data for the wafers; predicting WAT data from the metrology data using an inline-to-WAT model; and using the predicted WAT data to tune a WAT APC process for controlling a tuning process or a process APC process.

Abstract: A method of validating a probability of detection (POD) testing system using directed design of experiments (DOE) includes recording an input data set of observed hit and miss or analog data for sample components as a function of size of a flaw in the components. The method also includes processing the input data set to generate an output data set having an optimal class width, assigning a case number to the output data set, and generating validation instructions based on the assigned case number. An apparatus includes a host machine for receiving the input data set from the testing system and an algorithm for executing DOE to validate the test system. The algorithm applies DOE to the input data set to determine a data set having an optimal class width, assigns a case number to that data set, and generates validation instructions based on the case number.

Abstract: By dividing a complex set of parameters of a production process in forming semiconductor devices into individual blocks, respective PCA models may be established for each block and may thereafter be combined by operating on summary statistics of each model block in order to evaluate the complete initial parameter set. Thus, compared to conventional strategies, a significant reduction of the size of the combined PCA model compared to a single PCA model may be obtained, while also achieving an enhanced degree of flexibility in evaluating various subsets of parameters.

Abstract: A matched state detection unit (33) of a video matching device (100) detects a reference video frame, of the respective video frames of a reference video (1) and degraded video (2B), which is in a matched state in which it is spatially and temporally matched with each degraded video frame. A matching degree derivation unit (34) controls a degradation amount derivation unit (40) to acquire the first degradation amount indicating the degradation amount between a reference video frame and a degraded video frame in the matched state and the second degradation amount indicating the degradation amount between a reference video frame and a degraded video frame in a state shifted from the matched state by a predetermined number of pixels and calculate a matching degree on the basis of the ratio between the first degradation amount and the second degradation amount. A matching information output unit (35) outputs the matching degree between the reference video and the degraded video after matching.

Abstract: A method for dynamically determining a remaining actual operational period for a filter in a filtration device including: determining an initial remaining operational period based on an installation date of the filter and an initial expected operational period; periodically determining a remaining actual operational period of the filter based on the initial remaining operational period based and an elapsed operational period from the installation date; monitoring at least one operating parameter in the filtration device; adjusting the remaining actual operational period based on the monitored operating parameter, and continuing to periodically determine the remaining actual operational period based on the adjusted remaining actual operational period and the elapsed operational period.

Abstract: A method for processing a plurality of flat printed products is provided. The method includes the steps of determining one of at least two quality statuses for each flat printed product and for each flat printed product, storing a first information representing the determined quality status and a second information combining the first information with said flat printed product. The invention also relates to a corresponding device for processing flat printed products.

Abstract: A defect testing apparatus for testing defects of optical film sheet-shaped product of an optical displaying apparatus, which includes a defect detecting means for detecting defects of a monolayer body and/or a laminate body constituting the sheet-shaped product in a state in which a protective layer on a surface of the sheet-shaped product is not disposed and defect information preparing means for preparing defect information which is information related to the defects detected by the defect detecting means, and the defect information is used for producing the sheet-shaped product provided in a roll form or in separate sheets.

Abstract: A method (300, 400, 500, 1200) for offline/online monitoring of batch processes. The method involves (312) decomposing a time domain of a batch process run (BPR) into several blocks and (334) building multivariate statistical models (MSMs) for each of them using archived data for a batch process (ABPD). ABPD comprises stored data obtained during BPRs. The method also involves (506, 1204) retrieving recently stored data (RSD) for a recent fully performed BPR run (FPRNEW) or current BPR run. The method further involves (520, 1210) building a feature vector matrix (FVM) using RSD. FVM contains feature vectors representing statistical measures of wavelet coefficients determined for variables (v0, . . . , vJ). A projection (1100, 1150, 1190) is formed by projecting feature vectors onto at least one MSM or a combined multivariate statistical model (CMSM). CMSM is a weighted average of at least two MSMs.

Abstract: A method, apparatus and program storage device for managing multiple step processes triggered by a signal is disclosed. Status records are created for each process step. When an error occurs, error status record in recorded in the status record. A user may then use the status record to identify the error, take corrective action and restart the process at the appropriate point for reprocessing the signals.

Abstract: The present invention is directed to a system and method for a quality assurance tool generating test plans and identifying new test requirements for a new version of a product. Old versions of the product may be previously tested and test plan documents associated with previously tested versions of the product may be stored in a database. The database may store test plans, test configurations, test scopes, and the like for previously tested versions of the product. Product design requirements may be determined based on received customer desired features for the new version. The database may be updated by adding new tests for new features of the new version. A test plan document for the product may be generated based on the updated database. The generated test document may be verified through automatically generating a general test plan for the new version of the product by querying updated database with the product design requirements.

Abstract: The present invention provides a quality inspection method of a glass plate, which can predict the shape of the glass plate on a four-point supporting type actual measurement inspection stand from the shape of the glass plate on a three-point supporting type universal actual measurement inspection stand.

Abstract: A system and method for using loop topology identification to investigate a transmission line having a plurality of cable segments. At a measurement plane for each segment, a probing signal is transmitted into the cable. A reflected signal is detected, and an equivalent total input impedance is calculated. The system iteratively calculates the distance between the measurement planes as well as the length, characteristic impedance, and the propagation constant of each segment. A model is used to calculate the respective equivalent input impedance of each segment using the calculated characteristic impedance, propagation constant, and length of the preceding segment. The equivalent total input impedance is then calculated from the iteratively calculated segment values.

Abstract: A sensor function testing method and a computer program product thereof are provided. In the present method, a rearm type corresponding to a rearm function of a sensor in a server is obtained, wherein the sensor is in a normal status or one of a plurality of failure statuses. Then, the sensor is respectively triggered to enter and exit each of the failure statuses. If the rearm type is an auto rearm type and the sensor automatically returns to the normal status every time when the sensor is triggered to exit one of the failure statuses, the rearm function is determined as normal. If the rearm type is a manual rearm type and the sensor only returns to the normal status after receiving a rearm instruction every time when the sensor is triggered to exit one of the failure statuses, the rearm function is determined as normal.

Abstract: Embodiments of a method and apparatus for variable sensing using the frequency domain are taught herein. An exposure of a system to a physical variable is determined by periodically sensing the physical variable to produce a plurality of digital samples. The plurality of digital samples is converted to respective frequency domain representations. The exposure is calculated using the frequency domain representations.

Abstract: A process variation detection apparatus and a process variation detection method are provided. The process variation detection apparatus includes a process variation detector and a compensation signal generator. The process variation detector includes a first process variation detection component, a second process variation detection component and a current comparator. The channel of the first process variation detection component is a first conductive type, and the channel of the second process variation detection component is a second conductive type, wherein the above-mentioned first conductive type is different from the second conductive type. The current comparator is connected to the first process variation detection component and the second process variation detection component for comparing the current difference between the two components and outputting a current comparison result.

Abstract: The present invention is concerned with the estimation of health parameters p(k) representing symptoms of a slowly degrading system, in particular industrial gas turbines. According to the invention, an estimation of a true health or independent parameter vector at time step k uses the estimation of the true health or parameter vector at a previous time step k?1 as a starting value for the production of a predicted health parameter vector at time step k. Based on the latter and a set of measured values of input variables of an extended model of the system, a prediction of output variables of the model is produced. This predicted model output is compared with measured values of the output variables to yield an error. From this error, a health parameter estimator in turn produces a health parameter estimate as a revision of the predicted health parameters.

Abstract: A method for making a sample for evaluation of laser irradiation position and evaluating the sample, and an apparatus which is switchable between a first mode of modification of semiconductor and a second mode of making and evaluating the sample. Specifically, a sample is made by irradiating a semiconductor substrate for evaluation with a pulse laser beam while the semiconductor substrate is moved for evaluation at an evaluation speed higher than a modifying treatment speed, each relative positional information between pulse-irradiated regions in the sample is extracted, and stability of the each relative positional information between pulse-irradiated regions is evaluated. The evaluation speed is such a speed that separates the pulse-irradiated regions on the sample from each other in a moving direction.

Abstract: The present invention relates to a computer-implemented quality assurance system, which includes the steps of retrieving quality assurance and supporting information from a database; receiving information on technical variables from monitoring of the patient, and on radiographic equipment in the performance of an imaging study; generating a quality assurance score after said imaging study based on said technical variables and said quality assurance and supporting information; and performing a quality assurance analysis of the imaging study based on the quality assurance score.

Abstract: In the present invention, for measurement of line widths, for example, at 36 locations within a substrate processed in a coating and developing treatment system, the 36 measurement points are divided and, for example, six substrates are used to measure the line widths at all of measurement points. In this event, the line widths at six measurement points are measured in each of the substrate, which exist in substrate regions different for each substrate. Then, the measurement results of the line widths at the measurement points of the substrates are combined, so that the line widths at 36 measurement points are finally detected. According to the present invention, the measurements of product substrates can be performed without decreasing the throughput of processing of the product substrates.

Abstract: A method is provided to determine a quality acceptance criterion using force signatures measured on a first and a second set of elements. The first set has no quality defect and the second set has a deliberate quality defect. Selection of an initial subset of time points is based on statistical analysis of the force data on the force signatures in the two sets. The quality acceptance criterion includes a quality threshold established using Mahalanobis Distance (MD) values and the MD values are produced from force data at a selected initial subset of time points for each element in the two sets. An output of the determined quality acceptance criterion is using the defined quality threshold to separate an element having a force signature into a group of elements having no quality defect or into a group of elements having a quality defect like the deliberate quality defect.

Abstract: In some embodiments, each interferometric modulator has a stiction threshold voltage. If a voltage above the stiction threshold voltage is applied to the interferometric modulator, the interferometric modulator enters a stiction state permanently, i.e., becomes “stuck,” and the interferometric modulator becomes inoperable. Disclosed are apparatuses, methods and computer-readable media for testing a panel of interferometric modulators. A ramped voltage waveform is applied to a plurality of interferometric modulators of the panel. In response to applying the ramped voltage, the stiction threshold voltage is identified. At or above this voltage, the number of stuck interferometric modulators in the panel reaches or exceeds a first threshold number, for example, 50% of the total number of the interferometric modulators constituting the panel. The embodiments can be used to establish stiction benchmark for panel manufacturing processes, to collect data for generating statistical distribution, etc.

Abstract: A disclosed identification method of identifying a data point distribution area on a coordinate plane includes dividing an area on the coordinate plane into divided areas so that the divided areas radiate from a division center point; selecting, in each of the divided areas, from among the data points in the divided area, a data point having the greatest distance from the division center point as a representative point; determining whether there is an overlapping area where a distribution representative point area overlaps a determination area; and determining, when there is the overlapping area, that the data group to be determined is a relevant data group.

Abstract: A gas sensor which includes: a plurality of gas detectors, each detects a target gas; an error detector which detects the occurrence of an error on each of gas sensors; an output selector which selects one output from among outputs entered from each gas sensor, the output selected by the output selector is the output from the gas detector in which no error exists; and an output unit which generate a normal output based on the output selected by the output selector and outputs the normal output to an external electrical device through a single output system, the output unit generates an abnormal output based on the output from the gas detector, in which the error exists, when the gas detector, in which an error exists, is detected, and outputs alternately the normal output and the abnormal output.

Abstract: In an example configuration, a power supply manager receives an output current value representing an amount of output current supplied by one or more power converter phases to a load. The power supply manager also receives a duty cycle value representing a duty cycle for controlling operation of the at least one power converter phase. The power supply manager produces an estimate of input current supplied to the power supply circuit based at least in part on multiplying the output current value by the duty cycle value. Contrary to conventional methods such as physically measuring an input current using complex measuring circuitry, embodiments herein include utilizing parameter information such as output current information and duty cycle information to deduce an amount of input current.

Abstract: A method for providing a service to assist in obtaining regulatory approval of a product includes using a computing device programmed to search at least one database of literature and programmed to identify data relative to determining substantial equivalence for the product to provide a first data set. The method further includes determining experimental data to collect for the product based in part on the first data set, collecting the experimental data for the product to provide a second data set, and documenting comparative data comprising comparisons between the first data set and the second data set data indicative of substantial equivalence for the product.

Abstract: Systems and methods for monitoring time-varying classification performance are disclosed.

Abstract: A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.

Abstract: Techniques for controlling an output property during wafer processing include forwarding feedforward and feedback information between functional units in a wafer manufacturing facility. At least some embodiments of the invention envision implementing such techniques in a copper wiring module to optimize a sheet resistance or an interconnect line resistance. Initially, a first wafer property is measured during or after processing by a plating process. Subsequently, the wafer is forwarded to a polishing process. A second wafer property is then measured during or after processing by the second process. At least one of these first and second wafer properties are used to optimize the second process. Specifically, one or more target parameters of a second process recipe are adjusted in a manner that obtains a desired final output property on the wafer by using these first and second wafer properties.

Abstract: Systems and methods that process a plurality of surgical instruments for cleaning and/or packaging. A device identifies a robot-ready insert having a predetermined configuration for accepting at least one type of surgical instrument. The surgical instruments are identified and oriented according to type using an automated apparatus. Specialized tools are also provided for automatically opening and closing surgical instruments, flipping instruments and assisting in the processing and maintenance of surgical instruments. The automated apparatus then places each of the surgical instrument types in one or more predetermined areas of the insert, configured to accept a predetermined set of surgical instrument types.

Abstract: The invention related to a method and circuit that is used to compensate for S-parameters of a passive circuit which do not satisfy passivity. The method includes the following steps: (1) getting S-parameters which do not satisfy passivity, these S-parameters being composed of an S-parameter matrix S; (2) computing matrix [S×S?], wherein matrix S? is a complex conjugate transposed matrix of the S-parameter matrix S; (3) computing the eigenvalues of the matrix [S×S?], and choosing an eigenvalue ? whose real part real(?) is the biggest; (4) computing a compensating value ?, the compensating value ? being equal to real(?)1/2×(1+?), wherein the ? is a very small positive number; and (5) dividing each of the S-parameters by the compensating value ? to get the compensated S-parameters.

Abstract: In a method for verifying manufacturing accuracy, a point cloud of a workpiece is read. A first determined point is determined according to the first point of the point cloud and a second determined point is determined according to the final point of the point cloud. A first line, a second line, and a third line are all located by respectively connecting the first point and the first determined point, the final point and the second determined point, and the first determined point and the second determined point. Qualification of the workpiece is determined by measuring a first angle of the first line and the third line, a second angle of the second line and the third line, a first distance between the first determined point and the second line, and a second distance between the second determined point and the first line.

Abstract: A method, system and computer program product for filtering systematic differences from wafer evaluation parameters provides an efficient visual display and numerical map technique for observing wafer-level process variation. Measurement data is gathered from electronic circuits at multiple positions within multiple regions on one or more wafers and parameters are computed from the measurement data, which may be the measurement data values themselves. The set of parameters is filtered for expected systematic variation by computing a set of normalization values from the set of parameters and normalizing the data according to the normalization values. The normalized parameter set is then either presented in a visual display, e.g., by color mapping, or arranged in a numerical map of parameter value by location.

Abstract: A thermal inspection method is disclosed. The inspection method includes disposing a component in a wind tunnel configured to create a predetermined Mach number distribution for an external surface of the component. A gas is supplied at a known temperature T into the wind tunnel to create an external flow of gas over the external surface of the component in accordance with the predetermined Mach number distribution. The inspection method further includes directly or indirectly measuring one or more external surface temperatures of the component to generate an external surface temperature distribution for the external surface of the component and using the external surface temperature distribution to perform a quality control inspection of the component. A thermal inspection system is also provided.

Abstract: By performing a two-step approach for predicting a quality distribution during the fabrication of semiconductor devices, enhanced flexibility and efficiency may be accomplished. The two-step approach first models electrical characteristics on the basis of measurement data, such as inline measurement data, and, in a second step, an appropriate distribution for the electrical characteristics may be established, thereby obtaining modeled wafer sort data which may then be used for predicting a quality distribution of the semiconductor devices under consideration.