Abstract: Some embodiments of the present invention provide a system that determines whether a cooling device in a computer system is responsive to control signals. During operation of the computer system, a control signal is sent to the cooling device. Next, a response of the computer system to the control signal is measured, wherein the response includes a temperature profile. The frequency content of the control signal is then compared to the frequency content of the temperature profile to determine whether the cooling device is responsive to the control signal.

Abstract: A charged particle beam writing apparatus includes a storage unit configured to store writing data in which there are defined a plurality of figures and resizing information indicating, with respect to each of the plurality of figures, a resizing status whether or not to perform resizing and a resizing direction used when performing resizing, a judgment determination unit configured to input the writing data and judge, with respect to each of the plurality of figures, the resizing status whether or not to perform resizing and the resizing direction used when performing resizing, a resize processing unit configured to resize, with respect to each of the plurality of figures, a dimension of a figure concerned in a judged resizing direction when it is judged to perform resizing, and a writing unit configured to write a pattern onto a target workpiece with using a resized figure and a charged particle beam.

Abstract: A binning process uses curve fitting to create and assign one or more bins based on testing data of operating voltage versus leakage current for test integrated circuits. Each bin is created by assigning an initial operating voltage to the bin and fitting a curve to the testing data population. An equation is generated describing the fitted curve. Integrated circuits are binned by measuring the leakage current at a selected operating voltage and testing the integrated circuit at one or more operating voltages determined based on the fitted curves. The integrated circuits are assigned a maximum operating voltage that corresponds to the lowest tested operating voltage at which the integrated circuit passes the test.

Abstract: Automated provisioning of radiotelephone handsets 20 at a fulfillment center and automated quality assurance uses a computer database of specifications 16 for authentication and activation from multiple handset manufacturing vendors, radiotelephone service providers, and distributors. A universal interface system 10 is provided to efficiently access diverse makes and models of handsets. The handsets are attached to the interface system in accordance with a build request, checked to see if the attached handset matches the build request, and automatically provisioned via the interface in accordance with the build request.

Abstract: Methods and systems for dynamic design attributes for wafer inspection are provided. One method includes, at run time of a wafer inspection recipe, prompting a user of a wafer inspection tool on which the wafer inspection recipe is performed for information for a design based binning (DBB) process. The information includes one or more formulae for calculating design attributes from a design for a wafer. The design attributes are used to bin the defects in the DBB process. The method also includes performing inspection of a wafer according to an updated wafer inspection recipe. Performing the inspection includes binning defects detected on the wafer according to the DBB process in the updated wafer inspection recipe.

Abstract: A system and a method for ESD testing are contained in an ESD testing system which is running on an electronic device. A storage unit of the electronic device pre-stores a layout file which includes a layout pattern having electrical traces, an ESD entry point, and mounted positions of multiple electronic elements. The ESD testing method obtains the layout file from the storage unit; displays the layout pattern on a display unit of the electronic device, simulates ESD in the ESD entry point of the displayed layout pattern, tests electrical characteristics of the electrical traces between the ESD entry point and the mounted positions of multiple electronic elements to determine whether the electrical characteristics of the electrical traces pass or fail the ESD test, and marks the electrical traces which fail the ESD test on the displayed layout pattern.

Abstract: A factory control server stores module configuration data for modules. The modules include processes for producing a final product and have corresponding module requirements. The factory control server analyzes in real-time actual product output data that is generated by a final product tester after a factory produces at least one final product to determine whether the actual product output data meets an expected product output. The factory control server analyzes actual module data in real-time to determine a new module requirement to cause new actual product output data for a subsequent final product to meet the expected product output in response to a determination that the actual product output data does not meet the expected product output. The factory control server notifies a module controller in real-time of the new module requirement. The module controller changes parameters in real-time to manufacture the subsequent final product.

Abstract: A method is provided for qualifying a semiconductor wafer for subsequent processing, such as thermal processing. A plurality of locations are defined about a periphery of the semiconductor wafer, and one or more properties, such as oxygen concentration and a density of bulk micro defects present, are measured at each of the plurality of locations. A statistical profile associated with the periphery of the semiconductor wafer is determined based on the one or more properties measured at the plurality of locations. The semiconductor wafer is subsequently thermally treated when the statistical profile falls within a predetermined range. The semiconductor wafer is rejected from subsequent processing when the statistical profile deviates from the predetermined range. As such, wafers prone to distortion, warpage, and breakage are rejected from subsequent thermal processing.

Abstract: A package coding system for a cigarette manufacturing process is provided. An imprinting device imprints an alphanumeric code on each of a series of cigarette packages. A conveyor device conveys the cigarette packages in a feed direction. An inspection device is operably engaged with the conveyor device and inspects the alphanumeric code imprinted on each cigarette package conveyed by the conveyor device to determine whether any of the cigarette packages includes a defect in the imprinted alphanumeric code, and thus comprises a defective cigarette package. A removal device is operably engaged with the conveyor device and is configured to be in communication with the inspection device. The removal device is configured to remove the defective cigarette package from the series of cigarette packages conveyed by the conveyor device in response to identification thereof by the inspection device. An associated method is also provided.

Abstract: A combination of a hardware-secured reject bin and a programmed controller that together function to create an interlock that limits access to a reject bin to only those users with specific access rights. Access is gained by entering a user ID or some other authorized reject bin user access information into the user interface of a checkweigher controller or another controller in communication with a checkweigher controller. Access attempts and events may be tracked and the removal of objects from an interlocked bin may be recorded to provide for improved object traceability.

Abstract: Methods and apparatus for providing data processing and control for use in a medical communication system are provided.

Abstract: Methods, systems, and computer-readable media provide for facility integrity testing. According to embodiments, a method for populating a watch list with circuits of a communications network to be monitored for repeat failures is provided. According to the method, a trouble ticket associated with one of the circuits and a trouble code and analysis code (TC/AC) combination associated with the trouble ticket is retrieved. Whether the trouble ticket meets a watch list criterion is determined. In response to determining that the trouble ticket meets the watch list criterion, the trouble ticket and the TC/AC combination are added to the watch list.

Abstract: Methods, systems, computer-program products and program-storage devices for determining whether or not to perform an action based at least partly on an estimated maximum test-range. One method comprises: attaining results generated from a parametric test on semiconductor devices included in a control set; selecting from the semiconductor devices at least one extreme subset including at least one of a high-scoring subset and a low-scoring subset; plotting at least results of the at least one extreme subset; fitting a plurality of curves to a plurality of subsets of the results; extending the curves to the zero-probability axis for the low-scoring subset or the one-probability axis for the high-scoring subset to define a corresponding plurality of intersection points; defining an estimated maximum test range based on at least one of the intersection points; and determining whether or not to perform an action based at least partly on the estimated maximum test range.

Abstract: Disclosed is a test method an apparatus in which an area for test and an area for analysis are specified based on the design information of the display device having a non-rectangular display area. To carry out testing, parasitic capacitances are found using the design information, and operations for weighting are performed on test data or threshold values based on which a decision on pass/fail is to be made.

Abstract: A quality validation method to improve inspection and validation processes by increasing their quality, efficiency, and positive impact. This method automatically prompts operators at one or more validation stations to follow a validation path comprising one or more validation items configurable by part number. It allows for automatic or manual feedback on the result of each item checked, the ability to enforce a particular pack-out consist based upon user provided specifications, and the ability of historically storing inspection results comprising container, part and inspection item information and results. It additionally provides an easily accessible interface to configure validation items and areas by part number, configure validation paths comprising of a variable quantity and order of validation items, and obtain information in a variety of useful formats.

Abstract: Ground-based measurements of agricultural metrics such as NDVI are used to calibrate wide-area aerial measurements of the same metrics. Calibrated wide-area data may then be used as an input to a field prescription processor.

Abstract: A wafer acceptance test (WAT) system and method that, in one embodiment, includes: (1) a saturation current WAT subsystem operable to generate a weighted standard deviation based on target NMOS and PMOS saturation currents and saturation current WAT results, (2) a wafer IC speed WAT subsystem operable to generate a speed performance probability distribution of wafer ICs based on the weighted standard deviation and speed WAT results, (3) a wafer IC power WAT subsystem operable to employ the speed WAT results and power WAT results to generate a power performance model of wafer ICs, and (4) a yield calculator operable to generate a power performance variance probability distribution of wafer ICs based on the power performance model and the power WAT results, and to employ the speed performance probability distribution and the power performance variance probability distribution to generate the yield forecast with respect to a target performance profile.

Abstract: Embodiments of the present invention provide a chip authentication system using multi-domain intrinsic identifiers. Multiple intrinsic identifiers taken from multiple domains (areas or sections of the chip) are compared against the intrinsic identifiers collected during the manufacture of the chip. If at least one intrinsic identifier matches those collected during manufacture, the chip may be designated as authentic.

Abstract: A method includes receiving tool trace data from a group of tools of the same type in a computing device. A tool fingerprint is generated for each tool using the tool trace data for the tools in group other than the tool for which the tool fingerprint is generated in the computing device. A tool score is generated for each tool based on its tool trace data and its associated fingerprint in the computing device. A fault condition with at least a selected tool is identified based on the tool scores in the computing device.

Abstract: It is intended to provide a drug delivery system which makes it possible to solve the existing technical problems and is easily usable in practice. A drug, which comprises an organic compound or an inorganic compound and has been magnetized by modifying a side chain and/or crosslinking side chains, is induced by a magnetic force into target tissues or an affected part.

Abstract: A method for determining a paint formulation includes: obtaining target color information for a target color, identifying a plurality of toners and corresponding concentrations of the toners in a paint formula that can be used to produce a paint having a color that is similar to the target color, and modifying the paint formula by removing one of the identified toners having a lowest concentration to produce a modified paint formula that can be used to produce a paint having a color that is similar to the target color, and determining if the modified paint formula meets user specified acceptance criteria. An apparatus that can be used to perform the method is also described.

Abstract: A method and system for determining line edge roughness is disclosed. The method involves computing a first length for a plurality of points based on a first line size, computing a second length for the plurality of points based on a second line size, and determining a fractal dimension line edge roughness parameter based on a difference between the first length and the second length.

Abstract: The present invention discloses a system for testing illuminating elements and a method for testing illuminating elements, wherein the method includes the following steps. Firstly, an illuminating element and an unilluminated area on a circuit board are covered respectively. A reference voltage is obtained according to a brightness of the unilluminated area and a testing voltage is obtained according to a brightness of the illuminating element being driven. Afterwards, whether the illuminating element passes a testing process or not is judged from the reference voltage and the testing voltage.

Abstract: Disclosed are system and method embodiments for determining the root-causes of a performance objective violation, such as an end-to-end service level objection (SLO) violation, in a large-scale system with multi-tiered applications. This determination is made using a hybrid of component-level snapshots of the state of the system during a period in which an abnormal event occurred (i.e., black box mapping) and of known events and their causes (i.e., white-box mapping). Specifically, in response to a query about a violation (e.g., why did the response time for application a1 increase from r1 to r2), a processor will access and correlate the black-box and white-box mappings to determine a short-list of probable causes for the violation.

Abstract: The present invention makes it possible to determine whether a mechanical component can be reused, without consulting a specialist, by: attaching to the mechanical component an IC tag that records identification information that includes at least one among the type, manufacturing time, manufacturing lot, and manufacturing history of the mechanical component, and that enables the identification information to be externally read by an electromagnetic method; recording, in the memory unit of an inspection device that can read the IC tag, inspection items corresponding to the identification information and the evaluation criteria of the inspection items; displaying an inspection item corresponding to the mechanical component on a display unit; obtaining result information from an input unit; and comparing the result information to the evaluation criteria and displaying, on the display unit, whether the part can be reused.

Abstract: An improved fault detection system and method is provided. The fault detection system and method combines the use of discrimination and representation based feature extraction to reliably detect symptoms of faults in turbine engines. Specifically, the fault detection system and method uses a kernel-based Maximum Representation Discrimination Features (MRDF) technique to detect symptoms of fault in turbine engines. The kernel-based MRDF system and method combines the use of discriminatory features and representation features in historical sensor data to facilitate feature extraction and classification of new sensor data as indicative fault in the turbine engine. Furthermore, the kernel-based MRDF technique facilitates the uncovering of nonlinear features in the sensor data, thus improving the reliability of the fault detection.

Abstract: The present disclosure is directed to an automated precious metal bullion authentication apparatus and system that, without human intervention, develops and disseminates information to enable a user to distinguish between genuine and non-genuine precious metals bullion items. The systems and devices may work together with third-party hardware or software and, with Internet access, may be utilized 24/7, 365 days a year. The system or device enables a user to receive directly at a point of sale, or anywhere in public or private, information regarding whether an item is genuine or not. Information regarding genuineness of an item may be provided to the user before, during, or after a monetary or non-monetary exchange or transaction between individuals or entities. The system or device identifies and authenticates precious metal bullion items automatically through a multiplicity of procedures and renders a conclusion based on data from acquired digital images and other physical measurements.

Abstract: A full-automatic detecting system and method for a transformer. The system comprises a material delivery line; a feed device; a detection delivery line; insulating test devices; error detecting devices; a laser marking device; a discharge device; and a detection management system. The insulating test devices, the error detecting devices, and the laser marking device are sequentially arranged beside the detection delivery line. The material delivery line, the detection delivery line, and the devices work in coordination, to realize full-automatic detection of the transformer, avoid manual detection errors and improve the sorting accuracy.

Abstract: Techniques for hard press rejection are described herein. In an example embodiment, a touch area on a sensor array is determined, where the touch area corresponds to a detected object and is associated with multiple signal values. A slope value for the detected object is computed based on a ratio of a signal distribution value in the touch area to a metric indicating a size of the touch area with respect to the sensor array. The slope value is compared to a threshold in order to determine whether to accept or to reject the detected object, and the detected object is rejected based on the comparison.

Abstract: A door closing-inspection apparatus for a vehicle includes a first lightening and light-receiving device which strides over a transferring conveyer in a finished vehicle inspection line which inspects a finished vehicle while being transferred; a pair of door-closing devices arranged at positions on a downstream side of the first lightening and light-receiving device and on symmetrically both sides of a length of the transferring conveyer; a second lightening and light-receiving device arranged on a downstream side of the door-closing devices which strides over the transferring conveyer; a pair of door distance-measuring sensors arranged at positions on a downstream side of the second lightening and light-receiving device is on symmetrically both sides of the length of the transferring conveyer; and a controller which is connected to the first and second lightening and light-receiving devices, the door-closing devices, the sensors, and a driving source controller of the transferring conveyer.

Abstract: A method of integrated circuit (IC) disposition includes the steps of determining one or more disposition criteria based at least in part on statistical timing of a given IC design; and determining whether a given IC according to the given IC design satisfies the one or more disposition criteria based at least in part on one or more measurements of at least one test structure.

Abstract: Methods and systems are described for tracking material through a production chain or operational process chain in which the material is transferred via a plurality of spatially distinct lumped masses of material (12, 14, 16, 18). A dynamic state space (430) is maintained descriptive of the plurality of spatially distinct lumped masses of material, wherein a quantity of entries in the dynamic state space is augmented or diminished dependent on a quantity of spatially distinct lumped masses being tracked. Measurements relating to an observed lumped mass of material are fused into the dynamic state space and a dynamic covariance matrix to provide an updated estimate of material in the plurality of spatially distinct lumped masses of material.

Abstract: A method for testing a plurality of fire hoses having respective service test pressures and the test apparatus therefor wherein each hose is required to maintain a test pressure for a specified duration to pass the test. The test pressure is proportional to the service test pressure. Each hose is coupled to a respective hose fitting of a respective branch test conduit. Each branch test conduit includes an isolation valve, a pressure transducer, and a hose fitting downstream of the isolation valve. A variable frequency-variable speed controls a motor which drives a positive displacement water pump supplying water to and pressurizing a water header conduit and a plurality of branch test conduits interconnected therewith. An algorithm applied to the error signal for a respective hose line generates a pump speed command limited by the controller to regulate the rate of increase of pump output pressure.

Abstract: The method and systems of the embodiments proposes to calculate Effectiveness of the Automation infrastructure of the plant by monitoring the control loop information using 3 primary data perspectives like availability, conformity and efficiency, by acquiring all data from the Distributed Control Systems (DCS)/Process Control Systems (PCS).

Abstract: An improved system and method for automatically inspecting the quality of newly-manufactured containers is disclosed that detects containers that are out-of-round by more than a predetermined amount so that they may be rejected to ensure that containers that are passed are of acceptable quality. One or more ultrasonic sensors are located at fixed positions with reference to a container that is rotated. If any sensor detects that the distance between the sensor and the container falls outside of an acceptable range, the container is rejected.

Abstract: A system and method of controlling a semiconductor wafer fabrication process. The method includes positioning a semiconductor wafer on a wafer support assembly in a wafer processing module. A signal is transmitted from a signal emitter positioned at a predetermined transmission angle relative to an axis normal to the wafer support assembly to check leveling of the wafer in the module, so that the signal is reflected from the wafer. The embodiment includes monitoring for the reflected signal at a predetermined reflectance angle relative to the axis normal to the wafer support assembly at a signal receiver. A warning indication is generated if the reflected signal is not received at the signal receiver.

Abstract: In order to test the integrity of products in containers, several characteristics of the products are detected with physical measuring methods and a good-bad signal is produced on the basis of the measuring results, for which purpose several of the measuring results are placed in relation to each other, which can consist in the following: the deviations of the individual measuring results from a reference value, optionally after weighting and standardization are added up and the sum is compared to a threshold value. The measuring results can also form a multidimensional area in which one or several boundary surfaces separate the good value areas from the bad value areas.

Abstract: A method of integrated circuit (IC) disposition includes the steps of determining one or more disposition criteria based at least in part on statistical timing of a given IC design; and determining whether a given IC according to the given IC design satisfies the one or more disposition criteria based at least in part on one or more measurements of at least one test structure.

Abstract: A printing inspection apparatus includes a measurement unit and a controller. The measurement unit is configured to measure solder that is printed on a substrate with a squeegee of a screen printing apparatus, the screen printing apparatus including a plurality of squeegees that slide on a screen in different slide directions to print solder on different substrates. The controller is configured to determine a slide direction of the squeegee that prints the solder based on measured data of the solder, the measured data being obtained by the measurement unit, and execute statistical processing of inspection data of the solder based on the measured data of the solder for each of the slide directions of the squeegees.

Abstract: A method for streamlining a production parts approval process is disclosed. The method includes receiving a master file. The master file includes nominals and tolerances of a production part for a plurality of dimensions of the production part. The method further includes receiving a measurement results file containing results of measurements taken on the production part. The method also includes creating a verification report. The verification report includes a summary of a comparison of the measurement results file with the master file.

Abstract: According to one embodiment, a quality analyzer receives aerodynamic performance data for a part that has been manufactured according to a design. The aerodynamic performance data expresses aerodynamic performance of the part as calculated from a plurality of coordinates measured on the part. The quality analyzer determines whether the aerodynamic performance data for the part satisfies minimum aerodynamic performance requirements.

Abstract: According to one embodiment, an evaluating apparatus includes an operation data storage unit, a labeling unit, a learning unit, and an evaluating unit. The labeling unit applies a failure label, indicating that a product is broken down, to operation data of the product that is broken down within a designated period of time from the observation date of the operation data, while applies a non-failure label, indicating that the product is not broken down, to the operation data of the product that is not broken down within a designated period of time from the observation date of the operation data. The labeling unit applies neither the failure label nor the non-failure label to the operation data of the product, which is not certain that it is broken down or not within a designated period of time from the observation date of the operation data.

Abstract: Apparatuses and method capable of reliably tracking processes through which products have passed without calling for expensive setup are necessary in production and distribution processes of the products. A process management apparatus including a data transmission/reception unit to and from an RFID tag of an information recording medium and a data generation unit comprises a process data generation unit for representing a process, a process pass certificate data generation unit for generating process data pass certificate data and a transmission/reception unit for the process data with the information recording medium and the process pass certificate data can track the processes through which the object products have passed.

Abstract: A computer-based method and a computing device for checking differential pairs of a printed circuit board layout are provided. The computing device determines the via pitch between switching vias of a differential pair according to the coordinates of the centers of the switching vias, determines the via gap between the switching vias of adjacent two differential pairs according to the radius and the coordinates of the centers of the switching vias, and determines that the switching vias does not satisfy design standards if the via pitch does not fall in an input via pitch range, or the via gap does not fall in an input via gap range.

Abstract: The present invention relates to a disk protrusion detection/flatness measurement circuit and a disk glide tester, in which protrusion detection and average value calculation can be performed without switching signal processing circuits of two systems, one for the protrusion detection of a disk and the other for the average value calculation with respect to a track or a sector of the disk. This also makes it possible to reduce the size of the measurement circuit. In the protrusion detection/flatness measurement circuit, a signal from a protrusion detection sensor is amplified and converted from an analog signal to a digital signal. The signal passes through a band-pass filter to obtain a digital signal with a predetermined bandwidth. Then, peak detection and average value calculation processes are applied in parallel to the obtained digital signal. Thus, pass/fail decision of the disk can be made based on the detected peak and average values.

Abstract: Various embodiments related to identifying regions including physical defects in semiconductor devices are disclosed. For example, one embodiment includes receiving an electrical test mismatch reported for a scan chain; identifying a suspect logical region including a plurality of logic cones electrically connected with the scan chain; adjusting a scope of the suspect logical region by simulating data flow within the logic cones, generating simulated scan chain output based on the simulated data flow within the logic cones, and excluding at least one of the logic cones from the suspect logical region based on a comparison of the electrical test mismatch and the simulated scan chain output; after adjusting the scope of the suspect logical region, generating a candidate defect region, the candidate defect region being defined to include physical instantiations of logical cells and logical interconnections included in the suspect logical region; and displaying the candidate defect region.

Abstract: Provided is a measurement apparatus that measures a signal under measurement, including a strobe timing generator that sequentially generates strobes arranged at substantially equal time intervals; a level comparing section that detects a signal level of the signal under measurement at a timing of each sequentially provided strobe; a capture memory that stores therein a data sequence of the signal levels sequentially detected by the level comparing section; a window function multiplying section that multiplies the data sequence by a window function; a frequency domain converting section that converts the data sequence multiplied by the window function into a spectrum in the frequency domain; and an instantaneous phase noise calculating section that calculates instantaneous phase noise on a time axis of the signal under measurement, based on the spectrum.

Abstract: A technique for identifying a defect in an object produced by a controllable process is disclosed. A first type of data generated as a result of production of the object by the controllable process is obtained. A second type of data generated as a result of production of the object by the controllable process is obtained. The first type of data and the second type of data are jointly analyzed. A defect is identified in the object based on the joint analysis of the first type of data and the second type of data.

Abstract: An alarm apparatus for sensing occurrence of abnormality in a plant that manufactures products by processing substrates, the alarm apparatus includes: means responsive to an inspection result of a surface of the substrates during manufacturing the products for aggregating degree of occurrence of defects for each monitoring unit region to produce an aggregation result, the monitoring unit region having a prescribed size configured for each type of the abnormality; means for comparing the degree of occurrence of defects in each of the monitoring unit regions with a reference; and means responsive to detection of the monitoring unit region with the degree of occurrence of defects being higher than the reference for transmitting an alarm and outputting the aggregation result.

Abstract: Methods, systems, and computer-readable media provide for facility integrity testing. According to embodiments, a method for populating a watch list with circuits of a communications network to be monitored for repeat failures is provided. According to the method, a trouble ticket associated with one of the circuits and a trouble code and analysis code (TC/AC) combination associated with the trouble ticket is retrieved. Whether the trouble ticket meets a watch list criterion is determined. In response to determining that the trouble ticket meets the watch list criterion, the trouble ticket and the TC/AC combination are added to the watch list.