Abstract: The identification of preferred seed calculations used to guide the determination of displacement vectors in elasticity imaging may evaluate seeds using a combination of a measure of the similarity of the data of the seed in pre- and post-compression data and continuity of the data in a path in the neighborhood of the seed. This dual evaluation helps avoid downstream error propagation.

Abstract: The present disclosure includes a method for optimizing value of current wood products dried in one or more current drying processes and associated computer software. The method comprises the steps of obtaining prior wood product data for prior wood products dried in one or more prior drying processes and generating a value function based on the prior wood product data. The method further includes identifying one or more sources of variability in the prior wood product data and quantifying a contribution to overall variability from each of the sources. The value function and the contributions to overall variability may be used to quantify one or more value opportunities associated with each the one or more sources, each value opportunity being associated with one or more executable steps for improving the one or more current drying processes.

Abstract: Herein is reported a method for determining whether a re-useable chromatography column packing, which is used at least for the second time in a purification step of a purification of a polypeptide, has reduced separation efficacy in said purification step of said purification of said polypeptide, comprising the following steps: a) identifying and determining the experimental data of an inert change of at least one physicochemical parameter of a mobile phase passing through said re-useable chromatography column packing, b) determining the parameters of a function of formula I by fitting the experimental data of the inert change of the physicochemical parameter of the at least second use, c) determining the difference between the experimental data of the inert change of the physicochemical parameter of the at least second use and the function of formula I with the parameters determined in step b), d) calculating the difference between the maximum value and the minimum value of the difference determined in step

Abstract: Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.

Abstract: An apparatus, method and an image quality guide document are disclosed. The method includes, for at least one image in a set of images undergoing image enhancement, identifying image quality-related features for the image based on enhancements being applied to the image, identifying image content-related features based on content of the image, determining a content-based degradation of the image based on the identified image quality-related features and image content-related features, and generating a thumbnail of the image. The method further includes generating an image quality guide document for the set of images in which at least one of the thumbnails is associated with a respective text description that is based on the determined content-based degradation.

Abstract: Machine vision is used to identify a discontinuity in the boundary of an object in an image. An image of one or more objects is captured. One or more skeletons of the one or more objects are calculated. One or more boundaries of the one or more objects are calculated. A plurality of radial lines is extended from a spine point of a skeleton to the one or more boundaries. Each radial line intersects a boundary at a radial endpoint producing a plurality of radial endpoints. For each radial endpoint an expected radial endpoint is calculated based on two or more neighboring radial endpoints. If the difference between the radial endpoint and its expected radial endpoint exceeds a threshold, a radial line including the radial endpoint is identified as a discontinuity in a boundary of an object.

Abstract: A substrate processing system provided with a plurality of modules for substrate processing. The substrate processing system includes an inspection substrate, which is transferred to the plurality of modules for processing therein, provided with a plurality of measuring devices which carry out a plurality of different kinds of measurements and a recorder which records measured data provided by the measuring devices. The substrate processing system includes a controller that executes control operations to subject the inspection substrate to predetermined processes in the plurality of modules. The controller obtains through data communication a plurality of different kinds of measured data recorded by the recorder as the inspection substrate is processed by the predetermined processes by the plurality of modules.

Abstract: A production information reporting/recording system is disclosed herein including a number of features to ensure efficient, flexible and reliable recording of production data in a manufacturing system. Such features include validating the content of event messages to ensure compliance of event report information with a standard. The system also supports caching IDs associated with particular aspects of an event message (e.g., a production request, a process segment) as well as a unique ID corresponding to the ID assigned by the production event database to reduce the need to access the database when assigning unique database IDs to received events. The production event messaging system also supports both asynchronous and synchronous transactional messaging between the sources of events and the production database service.

Abstract: A multiple inspection system and method that inspects packages filled with at least two different medications that are to be consumed by a patient is described. The method includes filling each package with the at least two different medications. A package that is to be inspected is selected by a process control module. A first automated inspection examines the different medications with a first measurement device. A first measurement result is generated. A first automated inspection result is generated by comparing a first expected inspection value with the first measurement result. A second automated inspection having a second measurement device generates a second measurement result. A second automated inspection result is generated by comparing a second expected inspection value with the second measurement result. An analytical module then proceeds to compare the first automated inspection result and the second automated inspection result.

Abstract: Operational speed of an integrated circuit chip is measured using one or more speed measurement elements, such as ring oscillators, disposed at various regions of the chip. Each speed measuring element can include several ring oscillators, each corresponding to a different technology threshold voltage. The speed measurement data collected from the speed measurement elements can be used to determine on-chip variation (OCV). Circuitry either on the chip itself or, alternatively, external to the chip can adjust a chip operational parameter, such as core voltage or clock speed, in response to the speed measurement data. Speed measurement data can be read out of the chip through JTAG pins or an interface to an external host.

Abstract: The invention relates to a method for the automated detection of individual parts of a complex differential structure. The method comprises the following steps: a) acquiring the structure by conventional measurement methods, b) creating a measurement point cloud of the acquired structure, c) calculating one or more specification point clouds from a specification structure of the individual parts, d) carrying out a fit of the specification point cloud into the measurement point cloud, e) evaluating the fitting process in order to acquire the position deviation or missing or surplus individual parts.

Abstract: A method of analyzing integrated circuit (IC) product yield can include storing, within a memory of a system comprising a processor, parametric data from a manufacturing process of an IC and determining a measure of non-random variation for at least one parameter of the parametric data using a pattern detection technique. The processor can compare the measure of non-random variation to a randomness criteria and selectively output a notification indicating that variation in the parameter is non-random according to the comparison of the measure of non-random variation to the randomness criteria.

Abstract: A sample analyzer shows, on a display, a screen that includes a first quality control graph plotted by a time-series of quality control values, and a second quality control graph plotted by a time-series of quality control values; wherein when a first number of quality control values are included in the first quality control data in a predetermined period and a second number of quality control values, which is different from the first number, are included in the second quality control data in the predetermined period, the sample analyzer shows, on the screen, the first quality control graph of the first number of quality control values plotted in a range in the direction of the time axis of the graph and a second quality control graph of the second number of the second quality control values plotted in the range

Abstract: The present invention is a method and system for detecting an abnormal on-line analysis or laboratory measurement and for predicting an abnormal quality excursion due to an abnormal process condition.

Abstract: An information processing apparatus processes information generated by an exposure apparatus. The information processing apparatus includes a collecting unit and a converting unit. The collecting unit collects first apparatus information obtained by the exposure apparatus via an operation of the exposure apparatus with respect to each of a plurality of first regions which form a first array defined on a substrate. The converting unit converts at least part of the first apparatus information collected by the collecting unit into second apparatus information with respect to each of a plurality of second regions which form a second array.

Abstract: A method of analyzing production steps includes inputting application data associated with a production process having a plurality of process steps into a memory with each of the plurality of process steps including a plurality of tools. The method also includes loading process data associated with one of the plurality of process steps into the memory, performing a tool commonality analysis on each of the tools associated with the at least one of the plurality of process steps, identifying all tool-to-tool differences for the at least one of the plurality of process steps, performing a tool stratification analysis to identify one of the plurality of tools that provides the largest variance contribution to the at least one of the plurality of process steps, and stopping the one of the plurality of tools that provides the largest variance contribution to the at least one of the plurality of process steps.

Abstract: An abnormality detection system includes a measurement unit, a decision unit, an alarm unit, and storage units, and serves to detect the abnormality in a control characteristic value of a plurality of products manufactured on the same production line. The decision unit receives the control characteristic value stored in the storage unit, and decides whether an abnormality exists, based on that value. More specifically, the decision unit decides that the control characteristic value is abnormal when, with respect to m (m is a natural number) pieces of the products that are consecutively manufactured, an absolute value of a difference in control characteristic value between each of the products and another manufactured immediately before the former is equal to or less than a predetermined constant.

Abstract: A method includes passing a lot through a production process and evaluating a statistical quality of the production process. Additionally, the method includes calculating an advanced process control (APC) recipe parameter adjustment (RPA) distribution value and determining if sampling is indicated. Furthermore, the method includes, if sampling is indicated, performing a measurement process of the lot.

Abstract: A quality control method includes: extracting, from a time series distribution of troubles that have occurred in electronic equipments, a first characteristics of states of occurrence of the troubles; specifying one or more parts included in the electronic equipments, the parts being involved with the troubles; extracting, from another time series distribution of a rate of use corresponding to each of suppliers which supply the specified parts, a second characteristics of the parts; and specifying one or more of the suppliers supplying the parts correlated to the troubles based on a correlation between the extracted first characteristics and the extracted second characteristics.

Abstract: System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) are described. In one embodiment, the method comprises performing an inter-metal (“IM”) WAT on a plurality of processed wafer lots; selecting a subset of the plurality of wafer lots using a lot sampling process; and selecting a sample wafer group using the wafer lot subset, wherein IM WAT is performed on wafers of the sample wafer group to obtain IM WAT data therefore. The method further comprises estimating final WAT data for all wafers in the processed wafer lots from IM WAT data obtained for the sample wafer group and providing the estimated final WAT data to a WAT APC process for controlling processes.

Abstract: A time domain measurement method and apparatus are provided. The method comprises the steps of acquiring a burst signal and determining a plurality of min/max values of the burst signal. The determined min values are connected to generate a lower floor outline. The determined max values are connected to generate an upper roof outline. The burst signal is displayed along with the lower and upper outlines.

Abstract: A technique facilitates substantially improved service quality and data quality with respect to measurement and analysis of reservoir fluid samples. The technique integrates a variety of components which simplify the actions involved in measurement and analysis of the reservoir fluid samples. As a result, the reservoir fluid analysis process is more reliable and repeatable during many or all phases of the procedure from job initiation to output of the data as a final report.

Abstract: Predictive Split Lot Emulator, and methods simulating integrated circuit performance variations, before IC fabrication. The emulator receives a split lot parameter, maps the split lot parameter onto an IC element model, and transforms the IC element into a predictive IC element model. The emulator uses the predictive model to determine simulated performance characteristic of the IC element model. Also, a predictive split lot analyzer, a CAD simulation system, and a PDK including the emulator. IC simulating methods include choosing a Split Condition from a Split Table; a Predictive Split Lot Emulator receiving the Condition, determining a Split Parameter Condition Perturbation, mapping the Perturbation into a Model Parameter Perturbation for an IC element, and storing the Model Perturbation for an IC element into a Model Parameter Perturbation Library. The Perturbation Library emulates IC element performance characteristic in a Split Condition.

Abstract: The present invention relates to a method for the calibration of a position determination system of a rear axle steering actuator for a motor vehicle. The rear axle steering actuator has an actuator element which can be driven by a rotary movement of a rotor to a translation movement and whose geometrical center position is determined by a reference measurement. The position determination system includes a linear sensor and a rotary sensor. During calibration, a piece of calibration information is generated which includes a piece of zero point information of the linear sensor and a piece of sector information. The measurement range of the rotary sensor is divided into at least two sectors. The sector information identifies that angle at which the angular position of the rotor lies when the actuator element is arranged in its geometrical center position. The calibration information is stored in the linear sensor.

Abstract: A method of yield management for semiconductor manufacture and an apparatus thereof are provided. The method includes the following steps. Defect data of a layer of a semiconductor wafer is obtained, wherein the defect data includes sizes and locations of defects with respect to the layer. A layout with respect to the layer is obtained. And a critical area analysis is performed in parallel for the layer by a plurality of processing devices according to the defect data and the layout to determine locations of defects falling into a critical area of the layer among the locations of the defects.

Abstract: An accounting method and system is disclosed that provides for real time financial accounting of plant performance at a sub-plant level. A multiplicity of process variable transmitters is utilized to sense, in real time, the current state of the processes and process equipment used in a manufacturing plant. Sub-plant accounting modules utilize the sensed process data to calculate a plurality of sub-plant accounting measures, which are stored in one or more real time plant historian. The accounting measures are typically converted to a suitable format and subsequently stored in a production model accounting database where they are accessible to an accounting module.

Abstract: A system and method for antenna analysis and electromagnetic compatibility testing in a wireless device utilizes a “parent” device that undergoes rigorous conventional testing. A “child” device having similar components may thereafter undergo abbreviated testing. Because the Total Isotropic Sensitivity of the parent device is known, testing may be performed on the child device to infer equivalence to the parent's TIS performance using the abbreviated test techniques.

Abstract: A control systems and methods are presented for controlling a production system, in which a model-based planner includes a formulation, such as a SAT formulation representing possible actions in the production, with a solver being used to provide a solution to the formulation based at least partially on production and diagnostic goals and the current plant condition, and a translation component translates the solution into a plan for execution in the plant.

Abstract: A system and method for analyzing mutilation defects including a benchmark image of a part and a grid having a plurality of cells plotted onto the benchmark image is provided. The system further includes a computer processing unit having an interface operable to associate each identified mutilation defects with the associated cell where the mutilation defect occurred. The system and method further includes a plotting circuit having a code. Each of the labels is associated with a predetermined occurrence of mutilation defects within a given cell. The plotting circuit counts each occurrence of a mutilation defect within each of the cells and plots the associated label within the cell so as to improve the quality control of a part by providing a map showing the frequency of mutilation defects on a particular part of a mass produced product.

Abstract: A method for detecting atypical electronic components for the quality control of a set of n electronic components at the end of the manufacturing process, the components being subject to a number p of unit tests providing digital data, this set of n components consisting of electronic components whose response to each of the p unit tests is contained within pre-defined limits specific to each of the p tests, uses the multidimensional information of the p dimension responses of these n electronic components. The method uses a generalized principal component analysis for detecting atypical items in the semiconductor field, or in fields including modules assembled using electronic components (e.g. an ABS module, a smart card, etc.). The aim of the method is to get close to “zero defect”, in which no parts are detected as non-compliant by the client.

Abstract: A film forming apparatus which forms a film on a substrate by utilizing a chemical solution, including: a correlation data creating unit which creates a correlation data that is related to the quality of a chemical solution, from data that is related to the properties of the chemical solution including at least one of data on storage temperature for the chemical solution to be loaded and data on pressure applied to the chemical solution to be loaded; and a determining unit which determines whether or not the chemical solution holds expected quality thereof on the bases of the correlation data.

Abstract: According to one aspect of the invention a system and method for minimizing assembly line manufacturing including an override is provided. Each workstation is equipped with a docking station. A first database is in communication with the programmable controller and the docking station, and the docking station is also in communication with the workstation tools as well as the programmable controller. The override is disposed on a docking station. The system includes a checklist of tasks that each workstation tool is to perform. Accordingly the first database will receive the checklist for each part and will record whether or not each particular part had each of its tasks performed properly. The override may be actuated so as to allow a part to flow downstream the assembly line even though the all the tasks were not completed properly, thus minimizing manufacturing disruptions.

Abstract: In one embodiment, the present invention is a method and apparatus for matching translucent coatings of absorbent substrates. In one embodiment, a method for matching a color of a sample includes generating a plurality of recipes, each of the recipes representing a mixture of one colorant and a clear vehicle and defining a concentration of the one colorant and a concentration of the clear vehicle, applying each of the recipes to one or more absorbent substrates, determining an absorption value and a scattering value for each of the recipes as applied to the absorbent substrates, storing the recipes in a database, where each of the recipes is stored with an associated absorption value and an associated scattering value, selecting a first recipe from among the recipes stored in the database, and evaluating a quality of the first recipe as a match to the color of the sample.

Abstract: System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) are described. In one embodiment, the method comprises performing a key process on a sample number of wafers of a lot of wafers; performing a key inline measurement related to the key process to produce metrology data for the wafers; predicting WAT data from the metrology data using an inline-to-WAT model; and using the predicted WAT data to tune a WAT APC process for controlling a tuning process or a process APC process.

Abstract: A system, method and program product for processing irregularly occurring data events in real time. A system is provided for processing a stream of data events occurring over irregular time periods, including: a system for updating a running estimate each time a new data event is detected, wherein the running estimate is calculated based on a value associated with the new data event, an amount of time that elapsed since a previous data event was detected, and a previously calculated running estimate; and an analysis system that analyzes the running estimate after it is updated to identify a suspect data event value.

Abstract: Method for quality control of mechanical pieces, such as screws, pins, pivots and similar, intended for mass-production mechanical industries such as automobile and household appliances industries and similar, by means of an apparatus comprising in casings a plurality of operation stations and a piece-holder table which is pitched revolving to convey the pieces to the operation stations.

Abstract: Systems and methods configured to guide and manage laboratory analytical process control operations. A Biometric quality control (QC) process application is configured to monitor bias and imprecision for each test, characterize patient population data distributions and compare, contrast, and correlate changes in patient data distributions to any change in QC data populations. The Biometric QC process monitors the analytical process using data collected from repetitive testing of quality control materials and patient data (test results). The QC process identifies the optimal combination of, for example, frequency of QC testing, number of QCs tested, and QC rules applied in order to minimize the expected number of unacceptable patient results produced due to any out-of-control error condition that might occur. A method of determining an optimum frequency for bracketing patient data into batches using a minimum number of quality control samples is also provided.

Abstract: A method for controlling mask fabrication is provided, wherein the method uses statistical process control analysis. A manufacturing model is defined. A process run of a mask is performed as defined by the manufacturing model. A fault detection analysis is performed to reduce a bias in the manufacturing model. A fine-tuning signal is generated in response to a result of the fault detection analysis. The process run operation is adjusted according to the fine-tuning signal.

Abstract: A method and hand-held scanning apparatus for three-dimensional scanning of an object is described. The hand-held self-referenced scanning apparatus has a light source for illuminating retro-reflective markers, the retro-reflective markers being provided at fixed positions on or around the object, a photogrammetric high-resolution camera, a pattern projector for providing a projected pattern on a surface of the object; at least a pair of basic cameras, the basic camera cooperating with light sources, the projected pattern and at least a portion of the retro-reflective markers being apparent on the 2D images, a frame for holding all components in position within the hand-held apparatus, the frame having a handle, the frame allowing support and free movement of the scanning apparatus by a user.

Abstract: Described is a system for remotely monitoring water quality at one or more locations via a web-enabled application.

Abstract: The present invention relates to rapidly dissolving edible film dosage form incorporating indicia. The indicia may correspond to an active ingredient that may be evenly distributed throughout the film. The indicia may be associated with at least one surface of the film composition and provide information to the consumer that is relevant to the edible film dosage form.

Abstract: The present invention provides a quality inspection method of a glass plate, which can predict the shape of the glass plate on a four-point supporting type actual measurement inspection stand from the shape of the glass plate on a three-point supporting type universal actual measurement inspection stand.

Abstract: Techniques for grouping events in a computing system are provided. A registrant sends, to a database server, a request to register to receive a single notification based the occurrence of multiple events that satisfy certain criteria, referred to as grouping attributes. Such registrations are referred to as grouping registrations. An eventing mechanism in the database server receives and maintains grouping registrations. When an event is received, the eventing mechanism determines whether the event has been registered for in an active grouping registration, i.e., one whose start time has passed but whose completion criteria are not yet satisfied. If so, then the eventing mechanism updates grouping data associated with the grouping registration. When the completion criteria of a grouping registration are satisfied, the eventing mechanism sends a notification to the registrant and/or other intended recipient(s).

Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from an assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when problems arise, repair from the control device (1) is possible. The control device (1) tallies sample data and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and it can perform external quality control in real time.

Abstract: An automatic wafer storage system and a method of controlling the system are disclosed. The automatic wafer storage system includes an analysis module and a storage unit. The analysis module estimates the locations between an idle equipment, a transport tool, and the storage unit, so as to control the storage unit and the transport tool to move to the best location for the transport tool to receive wafers from the storage unit. After that, the transport tool carries the wafers to the idle equipment for processing.

Abstract: A sensor network collects time-series data from a process tool and supplies the data to an analysis system where pattern analysis techniques are used to identify structures and to monitor subsequent data based on analysis instructions or a composite model. Time-series data from multiple process runs are used to form a composite model of a data structure including variation. Comparison with the composite model gives an indication of tool health. A sensor network may have distributed memory for a more simplified configuration.

Abstract: A production system includes at least one production component having a production cycle which is interruptible by a detected production failure, at least one detector configured to monitor an output of the at least one production component, the detector configured to detect a production failure and to generate a signal indicative of the production failure, and a control unit. The control unit is configured to, in response to the signal from the detector, cause the respective production component to reject production material for a first predetermined duration of time, and in response to the expiration of the first predetermined duration of time, to slow down production for at least a second predetermined duration of time. The control unit can further return the production system to a normal production state in response to receiving a restart signal before the expiration of the first or second predetermined duration of time.

Abstract: The present invention pertains to the technical fields of production and testing of condom and glove products. The invention specifically discloses a type of real-time monitoring, feedback, identification and consistent labeling system for quality information of condom and glove products. The system includes a collection module, a processing output module connected to the collection module, an application module connected to the processing output module, and also a query module. This system allows users (consumers) to obtain real-time collected product production data or pre-entered, encryption code or pre-entered information data from each product and to compare these data with pre-entered product performance indexes.

Abstract: A product repair support system is configured to support repair of a product rejected in an inspection based on a prescribed inspection standard. The product repair support system includes: repair information storage part; reference information storage part; and repair condition optimization part. The repair information storage part is configured to store a result of the inspection of the repaired product as repair information. The reference information storage part is configured to store reference information related to the product. The repair condition optimization part is configured to determine appropriateness of a repair condition or selection of the repair condition on basis of the repair information and, in response to a determination of being inappropriate, to optimize data of the repair condition or the selection on basis of at least one of the repair information and the reference information.

Abstract: A method of displaying a measurement result in an inspection process using network, the method includes a first step that a host, which intensively controls and manages a device for inspecting a lot to be processed in one or a plurality of steps, transmits to the device a condition of measuring a lot determined to be put in, a second step that the device measures the lot based on the measurement condition received via the network and then obtains measured data, a third step that the host determines whether the measured data received via the network is abnormal or normal based on a predetermined assessment standard and then produces a result of assessing a measured value so as to transmit the result to the device and a fourth step that the device provides a display corresponding to the result of assessing the measured value in accordance with the received result of assessing the measured value as well as a previously registered display standard.