Abstract: A method for determining elemental composition of ions from mass spectral data, comprising obtaining at least one mass measurement from mass spectral data; obtaining a search list of candidate elemental compositions whose exact masses fall within a given mass tolerance range from the accurate mass; reporting a probability measure based on a mass error; calculating an isotope pattern for each candidate elemental composition from the search list; constructing a peak component matrix including at least one of the isotope pattern and mass spectral data; performing a regression against at least one of isotope pattern, mass spectral data, and the peak component matrix; reporting a second probability measure for at least one candidate elemental composition based on the isotope pattern regression; and combining the two the probability measures into an overall probability measure. A method for determining elemental isotope ratios from mass spectral data.

Abstract: A mechanism for measuring the absolute duty cycle of a signal is provided. A non-inverted path from a signal source is selected and various DCC circuit setting indices are cycled through until a divider, coupled to the output of the DCC circuit, fails. A first minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of the failure. An inverted path from the signal source is selected and the various DCC circuit setting indices are cycled through again until the divider fails. A second minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of this second failure. The duty cycle is then calculated based on a difference of the first and second minimum pulse width values.

Abstract: A method of calibrating a model of a lithographic process includes a plurality of test features each having different widths that vary from a resolvable feature width that is known to be resolvable by the lithographic process, to a width that is known not to be resolvable by the lithographic process. The test features and patterns are specifically designed to include features that approach or exceed the resolution of the lithographic process, and range from known resolvable patterns to patterns that are expected to fail to be resolved. The printed test patterns are inspected for printability and the extremum intensity values associated with neighboring printable and non-printable test patterns are used to determine a constant threshold value to be used in a resist process model.

Abstract: The invention can provide a method of processing a substrate using Gate-Optimization processing sequences and evaluation libraries that can include gate-etch procedures, COR-etch procedures, and evaluation procedures.

Abstract: A method of calibrating an optical analysis system uses multivariate optical signal analysis. The method includes determining a parameter of a reference sample, and comparing the actually determined parameter with a reference parameter that represents a precise and real property of the reference sample. Based on the comparison, a calibration value is determined that is applicable to perform a calibration of the optical analysis system with respect to at least one compound or analyte of the reference sample. Parameters and reference parameters of a reference sample may refer to a concentration of an analyte dissolved in the sample, or to spectroscopic background signals that have to be taken into account when performing a spectral analysis based on optical signals obtained from the reference sample. Analyte-specific reference data is stored in a calibration unit of the optical analysis system and allows a high degree of automation of the calibration process.

Abstract: A measuring system and a calibration method for automatically calculating errors of mechanical parameters with high accuracy and correcting the parameters, by means of a relatively small and inexpensive measuring device. In relation to a plurality of positions of measurement, a robot is automatically moved such that, on a light receiving surface of a camera, the distance between the centers of an ellipse indicating a mark of a target and a circle of representing the shape of the target, and the difference between the length of the long axis of the ellipse and the diameter of the circle are within a predetermined error range.

Abstract: A system and method for determining at least one fluid characteristic of a downhole fluid sample using a downhole tool are provided. In one example, the method includes performing a calibration process that correlates optical and density sensor measurements of a fluid sample in a downhole tool at a plurality of pressures. The calibration process is performed while the fluid sample is not being agitated. At least one unknown value of a density calculation is determined based on the correlated optical sensor measurements and density sensor measurements. A second optical sensor measurement of the fluid sample is obtained while the fluid sample is being agitated. A density of the fluid sample is calculated based on the second optical sensor measurement and the at least one unknown value.

Abstract: The present invention is a system and methods of improved tomography imaging such as microwave tomography (MWT). An improved inversion technique surrounds the imaging region with an electrically conducting surface to create field distortions producing an improved tomographic image. The improved inversion technique of the present invention creates a new physical situation for proposed imaging systems.

Abstract: A method and apparatus for calibration of a result from a test device using a reagent are provided. The method includes measuring an optical signal for a sample contained in the test device to obtain a measured optical signal value, the sample having a known concentration; and determining a relationship between the known concentration of the sample and a ratio of an estimated optical signal value to the measured optical signal value of the sample.

Abstract: This disclosure provides for an impression scanner system having improved calibration having a housing and a calibration plate of known geometry. The calibration plate has a plurality of different shapes thereon. The system also has a radiation source for emitting radiation towards the shapes on the plate and a surface for reflecting images created by the radiation on the shapes. A sensor for receiving the images of the shapes as the plate moves relative to the housing is also provided. A processor compares known geometry of the plate to the images received by the sensor and calibrates the sensor based upon the known geometry and images to reduce system aberration and distortion.

Abstract: A tamper detection system for a control module of a vehicle comprises first nonvolatile memory that stores N rewriteable components including at least one of calibration and software that is used to operate a controlled device of the vehicle, wherein N is an integer greater than zero. The N rewriteable components include an embedded part number (EPN) and an embedded verification number (EVN). Second nonvolatile memory includes a history buffer. A tampering detection module includes a calculated verification number (CVN) generator that generates a CVN for at least one of the N rewriteable components and that stores the CVN in the history buffer. A locking module selectively locks the history buffer under certain conditions.

Abstract: A method and apparatus for remotely verifying the calibration status of a diagnostic instrument, for example, following remote installation of a software upgrade on the instrument. In one example, a method of verifying the calibration status of the instrument, includes retrieving stored raw calibration test data generated during a previously-performed calibration of the instrument, processing the raw calibration test data to generate a diagnostic reading, comparing the diagnostic reading to a known nominal reading, and based on the comparison, generating an output indicative of the calibration status of the instrument. In one example, the method is performed without contemporaneously measuring a calibration object with the instrument and therefore, without activating the measurement head or measurement optics of the instrument.

Abstract: The acoustographic dynamic range extending device and method determines thresholds to reach a preset brightness with a test part and without a test part and transforms these thresholds to image data, where the thresholds can be time thresholds obtained with a single driving voltage and can be voltage thresholds obtained with an increasing driving voltage.

Abstract: The invention is directed to a procedure for fitting relevant parameters in SCR catalyst models and to an apparatus for carrying out such procedures. Following the procedure of the present invention, it is possible to make a first estimate of the SCR model parameters by fitting the parameters individually. This is possible because of special measurements that simplify and isolate reactions in the SCR model. The set of parameters determined via this method are used as a starting point for a global optimization of the model parameters.

Abstract: A method and system for determining a physical property as a function of position. A data series including data point from one or more channels is obtained by frequency modulation continuous wave. A number of data points correspond to Nda different values of frequency of modulation. One or more processing steps are performed including at least part of said primary data series to obtain at least one secondary data series comprising N (N>Nda) data points from the values of frequency of modulation. The secondary data series from frequency domain is transformed to obtain at least one back scattering curve in space domain, and optionally the back scattering curve(s) to one or more physical properties as a function of position.

Abstract: The present invention provides a method for estimating crystal efficiency in a PET detector that takes axial compression into account. It does so via an iterative methodology in which a ?-map is first generated and then is used to obtain a solution for the equation L ? ( ? i ) = ? n ? N ? ? y n ? log ? ? i , j ? span ? ? g ij ? ? i ? ? j ? x ij - ? i , j ? span ? ? g ij ? ? i ? ? j ? x ij , wherein gij is a geometric factor for LOR(i,j), ?i and ?j are the efficiencies for crystal i and crystal j, and xij is the line integral of the source distribution along LOR(i,j). Once efficiencies are determined, they are used to calibrate the PET detector.

Abstract: A method for correcting a measurement of a property of a subsurface material includes: selecting an instrument that includes a test circuit and a separate sensor, the test circuit configured for providing a standard for referencing to generate correction information, the sensor configured for: transmitting an electric signal into the subsurface material; and receiving a data signal from the subsurface material; wherein the test circuit and the sensor are switchably coupled to an electronics unit of the instrument; receiving the electric signal from the test circuit in the electronics unit; using the electronics unit, measuring at least one output characteristic of the instrument; and applying the correction information to the data signal according to the measured output characteristic.

Abstract: A computer-implemented method and apparatus for correcting data sets from microarray measurements of gene expression values made with several different microarray versions. The method comprises obtaining data sets (210) of expression values of several genes of biological samples (202), made with several different microarray versions; normalizing (212) the data sets; determining a first gene-specific distribution parameter (220) for each microarray version and a second gene-specific distribution parameter (222) for a combination of microarray versions; determining a gene-specific correction element (226) for each microarray version based on the discrepancy (224) between the first and second gene-specific distribution parameters; correcting a gene's expression value with the gene-specific correction element (226) for the microarray version on which the gene's expression value is based; and storing (118) the gene's corrected expression value (228) in a physical memory (230).

Abstract: A system and method of calibrating optical line shortening measurements, and lithography mask for same. The lithography mask comprises a plurality of gratings, with a calibration marker disposed within each grating. The mask is used to pattern resist on a semiconductor wafer for purposes of measuring and calibrating line shortening. The pattern on the wafer is measured and compared to measurements made of the pattern on the mask. The difference gives the amount of line shortening due to flare, and may be used to calibrate line shortening measurements made using optical measurement tools.

Abstract: Embodiments of the invention include a system and a method for determining whether a person is carrying concealed contraband, such as an improvised explosives device or other weapon. The system includes a people tracking video subsystem, a people tracking decisioning subsystem, a concealed contraband detection aiming subsystem, and a concealed contraband detection decisioning subsystem.

Abstract: A target turning angle calculation part 51 calculates a target turning angle ? on the basis of a steering angle ? and a vehicle speed V. A correction turning angle calculation part 52 calculates a transfer function K(s) which is a second transfer function, depending on the vehicle speed V, by using a difference between a transfer function G(s) which is a first transfer function determined on the basis of the specification of the vehicle and a stationary component G(0) of the transfer function G(s), the first transfer function having as an input a turning angle ? and as an output a yaw rate ? of the vehicle, the second transfer function having as an input a target turning rate ?*? obtained by temporally differentiating the target turning angle ?* and as an output a correction turning angle ?c. The correction turning angle calculation part 52 calculates a correction turning angle ?c by multiplying the transfer function K(s) by the target turning rate ?*?.

Abstract: An optical detection device comprising an optical sensing section that has an optical detection transistor, a threshold voltage detecting section that has a threshold value detection transistor, a sensor output value generating section that generates a sensor output value on the basis of a signal outputted from the optical sensing section, a correction coefficient determining section that determines a correction coefficient that is used for correcting a change in the sensor output value that corresponds to a threshold voltage detected at the threshold voltage section, and a correction processing section that corrects the sensor output value on the basis of the correction coefficient.

Abstract: The invention relates to systems and methods for measuring properties of samples with standardized spectroscopic systems. The methods can include (i) measuring, with a first spectroscopic system, spectra of at least three different reference targets; (ii) calibrating the first spectroscopic system; (iii) measuring, with the first spectroscopic system, a spectrum of a known reference specimen having a known value of the property; (iv) generating a model for the measured property using the spectrum of the known reference specimen; (v) measuring, with a second spectroscopic system, the spectra of at least three different reference targets; (vi) calibrating the second spectroscopic system; (vii) applying the model to the second spectroscopic system; (viii) measuring a spectrum of the sample using the second spectroscopic system; and (ix) determining a value of the property using the model.

Abstract: A method for processing a two-parameter spectrum including selecting a profile parameter for the spectrum and an initial correction function, for any profile selected according to this parameter, carrying out at least a correction operation by multiplying this selected profile by a correction function, equal to the sum of at least a portion of the already corrected profiles.

Abstract: There is described herein method and apparatus to produce precision profiles for scientific measurement equipment in general, and in particular clinical laboratory analyzers, and to use those profiles for various purposes in using, designing, calibrating and managing such equipment, for example to carry out critical laboratory testing. In this approach, either the analyzers' quality control data or serial patient data are numerically reduced to generate graphical precision profiles. Precision profiles for serial patient data show increased (im)precision vs time implying increased patient variation over increased time.

Abstract: Systems and methods are disclosed to predict one or more missing elements from a partially-observed matrix by receiving one or more user item ratings; generating a model parameterized by matrices U, S, V; applying the model to display an item based on one or more predicted missing elements; and applying the model at run-time and determining UiTSVj.

Abstract: The present invention is concerned with the estimation of health parameters p(k) representing symptoms of a slowly degrading system, in particular industrial gas turbines. According to the invention, an estimation of a true health or independent parameter vector at time step k uses the estimation of the true health or parameter vector at a previous time step k?1 as a starting value for the production of a predicted health parameter vector at time step k. Based on the latter and a set of measured values of input variables of an extended model of the system, a prediction of output variables of the model is produced. This predicted model output is compared with measured values of the output variables to yield an error. From this error, a health parameter estimator in turn produces a health parameter estimate as a revision of the predicted health parameters.

Abstract: A information processing apparatus 100 for processing an acquired value, which is a value acquired in regard to a state during a treatment, performed by a semiconductor manufacturing apparatus 200 for performing a treatment on a treatment target containing a semiconductor according to a set value, which is a value for setting a condition of a treatment, includes: a set value receiving portion 101 for receiving the set value; a state value receiving portion 102 for receiving the acquired value; a correction amount calculating portion 103 for calculating a correction amount of the acquired value, using a correction function indicating a relationship between the set value and the acquired value; a correcting portion 104 for correcting the acquired value received by the state value receiving portion 102, using the correction amount calculated by the correction amount calculating portion 103; and an output portion 105 for outputting a result of correction performed by the correcting portion 104.

Abstract: A diagnostic system designed such that an aggregate of parameter combinations is stored, which is an aggregate of combinations of parameters consisting of a first parameter for determining the output of the high-frequency power source, a second parameter for determining the flow rate of the carrier gas in the aerosol, and a third parameter for determining the distance between the plasma torch and the interface, and which forms a specific array such that the measurement points corresponding to the respective combinations are lined up in order along the direction of length of an envelope that forms the end on the high-sensitivity side of a graph drawn as an aggregate of all measurement points on a sensitivity-oxide ion ratio graph, and a diagnostic measurement is performed with a specific diagnostic sample using the parameter value of each combination of the above-mentioned parameter combinations that form the aggregate such that the device properties can be confirmed from the position on the envelope on the se

Abstract: A method and arrangement for detecting failure of an actuated component, particularly a valve. The method comprises determining a calibration step response and an in-use step response for the actuated component, determining any difference between the responses and comparing the difference to a pre-determined threshold indicating failure.

Abstract: An apparatus and method for identifying the position of a magnetic shaft are provided. N field sensors are adjacently positioned at fixed locations relative to the shaft's periodic field, corresponding to 180/N relative phase shifts. A table provides N>2 predetermined signal models and a pre-identified position associated with each. An interpolator compares a representation of the N measured sensor signals to at least two predetermined models to generate a correction signal that provides another pre-identified position. The correction signal depends on N sensors for every position of the shaft. The correction signal is used to incrementally choose said another pre-identified position from the table as an approximate position of the shaft in an iterative process to find the minimum correction signal and identify the position.

Abstract: Methods and systems are provided for deriving and analyzing shape metrics, including skewness metrics, from physiological signals and their derivatives to determine measurement quality, patient status and operating conditions of a physiological measurement device. Such determinations may be used for any number of functions, including indicating to a patient or care provider that the measurement quality is low or unacceptable, alerting a patient or care provider to a change in patient status, triggering or delaying a recalibration of a monitoring device, and adjusting the operating parameters of a monitoring system.

Abstract: Empirical Profile Fits are used to quantitate Surface-binding Optical Resonance profiles. The EPF process has two stages, Calibration and Fit. In the Calibration stage, a calibration surface-binding optical resonance scan is obtained with relatively fine angle or wavelength spacing over a range sufficient to include full resonance profiles for all regions. Smoothed, subsampled empirical profiles for each Region of Interest are generated by the main calibration module, together with first derivative curves and diagnostic information. Properties returned may include approximate resonance position, depth, and width. In the Fit stage, individual ROI scans are used for measurement of resonance shifts relative to the empirical profile.

Abstract: A probe for insertion into the body of a subject includes a sensor, a first microcircuit, which stores first calibration data with respect to the sensor, and a first connector at the proximal end of the probe. A probe adapter includes a second connector, which mates with the first connector, a signal processing circuit, which is processes the sensor signal, and a second microcircuit, which stores second calibration data with respect to the signal processing circuit. A microcontroller in the adapter receives the first and second calibration data and computes combined calibration data. The adapter includes a third connector, which mates with a fourth connector on a console. The console includes signal analysis circuitry, which analyzes the processed signal using the combined calibration data provided by the probe adapter.

Abstract: A bias value associated with a sensor, e.g., a time-varying, non-zero value which is output from a sensor when it is motionless, is estimated using at least two, different bias estimating techniques. A resultant combined or selected bias estimate may then be used to compensate the biased output of the sensor in, e.g., a 3D pointing device.

Abstract: The present invention provides a method and system for optimizing the time required for scanning a document with any conventional scanner. More specifically, the present invention will utilize calibration information from the initial power-up calibration or any other calibration, and the information from any previous scans to expedite or eliminate the need for future calibration requests. This process will save time for the user to obtain an optimal scan and increase the operable life span of the scanner by eliminating many repetitive scan cycles.

Abstract: A system and a method for effectively determining the measurement sensitivity, repeatability, and probe commonality to assist a test engineer determine if the tester meets the specified resolution at every test. A statistical measurement of inherent tester specifications are provided with the added accumulation of the probe contact resistance during the probing process. It further provides a feedback to the test probe card noise level while testing is in progress. Moreover, the system and the method determine the test probing integrity in-situ when testing integrated circuit chips or wafers, dynamically detecting probing errors, and modifying data associated with defective test probes.

Abstract: In a power-loss reducing system, a transmitting unit causes a radar to transmit a measurement radio wave, and a power monitoring unit monitors power of the measurement radio wave transmitted from the radar through a cover while changing a positional relationship between the cover and the radar. An extracting unit extracts a value of the changed positional relationship between the cover and the radar based on a result of the monitoring of the power such that the extracted value of the positional relationship allows reduction of power loss of a radar wave transmitted, through the cover, from the radar located based on the extracted value of the positional relationship.

Abstract: An auto-trim circuit that sets trim bits for an integrated circuit includes a coarse bit calibration circuit for determining a first portion of the trim bits as a set of coarse bits, and a fine bit calibration circuit for determining a second portion of the trim bits as a set of fine bits wherein said fine bits.

Abstract: Disclosed are embodiments that relate to algorithms and methods for calibrating an analyte sensor, and more particularly, to algorithms for calibrating an optical glucose sensor comprising an equilibrium fluorescent chemical indicator system. In particular, a method of detecting an analyte concentration is disclosed where a modified Michaelis-Menten equation comprising Michaelis-Menten parameters is used to characterize the signal generated by the analyte sensor.

Abstract: Techniques are disclosed for computing distance-to-fault (DTF) in communication systems. The techniques can be embodied, for instance, in a DTF system that provides a multi-port probing device and DTF functionality, including computing distances to faults and the fault magnitudes. In addition, the DTF system is further configured with the ability to accurately measure complex reflection coefficient of the UUT, and/or return loss of the UUT. The complex reflection coefficient and/or return loss of the UUT can be computed as a function of known scattering parameters of a multi-port measurement circuit included in the probe of the DTF system.

Abstract: Methods are provided for calibrating stimulus-response test systems which include a stimulus output device for delivering a stimulus to a subject; and a response input device for receiving a response from the subject.

Abstract: A method for calibrating an apparatus for ellipsometric measurements performed on an arbitrarily large or continuously moving sample, using a visible sample reference frame, and one or more laser sources in order to calibrate the ellipsometer for variations in the distance between the ellipsometer apparatus and the sample of interest. Included are techniques for projecting a first laser beam spot from an incident laser source onto a sample, then analyzing the position of the first laser beam spot relative to the center of the sample reference frame using human-aided measurements and confirmations and/or computer vision techniques. Then adjusting pivot points and/or apparatus-to-sample distance to achieve a first beam spot being located about the center of the sample reference frame, and concurrently intersecting the plane of the sample. Other techniques include changing the incidence and reflectance angle using a semi-circular track arc design with a stepping motor activating each goniometer arm.

Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.

Abstract: A field device for process instrumentation, in particular a measuring transducer, comprising an analogue output to which a two-wire line is connectable for transmitting an analogue output signal. The output circuit contains a controller with an actuator connected downstream for the analogue output signal. A monitoring unit monitors whether an actuating signal remains within a predeterminable value range to monitor the output circuit for correctly setting the loop current. If the actuating signal is outside the value range, an indicator signal is output to a computing unit so that suitable measures can be introduced in response to an error state that has thus been identified.

Abstract: A method of calibrating an individual sensor of a particular sensor type whose output varies non-linearly with at least one measured quantity and at least one operating condition. The first step includes producing a set of calibration curves for each sample sensor of the particular sensor type. The resulting sets of calibration curves are then averaged and the results used to produce a generic calibration surface for the particular sensor type showing its variation. Individual calibration measurements are then taken for a number of different values of the measured quantity at a small number of discrete values. The individual calibration readings are then used to map the generic calibration surface to the individual calibration measurements of the individual sensor.

Abstract: A technology is provided in which it is not necessary to modify a system on a production side, and in which man-hours required for registering an environmental load value on a supplier side are not increased, in cases of an item having a mismatch between units, in a process of adding up the environmental load values of a post-production product. The technology includes generating correction information for calculating the environmental load that is registered by the supplier at design time, and calculating the environmental load value at design time by using the correction information. In cases of calculating the environmental load value of a product actually produced from a designed product, the environmental load value is calculated using the correction information generated at design time.

Abstract: A method for calibrating a volatile organic compound (VOC) detector. In one implementation, an initiation request may be received indicating a gas concentration level amount to be used for calibrating a VOC detector. A gas may be provided to the VOC detector according to the gas concentration level amount. The VOC detector may be provided with the gas concentration level amount. A calibration log may be received from the VOC detector. The calibration log may comprise an identifier of the VOC detector, the gas concentration level amount, and a date indicating when the VOC detector received the gas concentration level amount and the gas according to the gas concentration level amount.

Abstract: Disclosed are a method and an apparatus for estimating the features (concentration, weight, volume, etc.) of target materials, by using kinetic change information along time, when measuring the results of a chemical reaction between two materials, target materials and reactant, with an optical or electrochemical method. More precisely, the disclosed method and apparatus obtain in advance the correlation between accurate feature values of the target materials measured by a reference equipment and the kinetic change information related to the feature values of the target materials which is varying along the passage of time and indicates the results of chemical reaction measured by an optical or electrochemical method, and then estimates the feature values of the new samples using the correlation and the kinetic change information obtained from the new sample.

Abstract: An integrated circuit for controlling a DC motor is disclosed. The integrated circuit includes at least one digital position and speed circuit (DPS) for providing measurements of speed, position, and direction of the motor, the DPS being in signal communication with the motor for receiving a pair of signals having a quadrature relationship; and at least one programmable gain amplifier (PGA) electrically coupled to the motor, the PGA being configured to receive a feedback signal indicative of current flowing through the motor and to apply a second signal to the motor for adjusting the speed of the motor; and at least two analog-to-digital converters (A/D), one A/D being used to quantize the output of the PGA for an off-chip processor; and another A/D to provide motor reference position from an analog sensor, such as a potentiometer; and at least two digital-to-analog converters (D/A), one D/A used to set the motor voltage; and another D/A used to set the motor current limit.