Calibration Or Correction System Patents (Class 702/85)
  • Patent number: 8384338
    Abstract: A system and method for determining the stator winding resistance of AC motors is provided. The system includes an AC motor drive having an input connectable to an AC source and an output connectable to an input terminal of an AC motor, a pulse width modulation (PWM) converter having switches therein to control current flow and terminal voltages in the AC motor, and a control system connected to the PWM converter. The control system generates a command signal to cause the PWM converter to control an output of the AC motor drive corresponding to an input to the AC motor, selectively generates a modified command signal to cause the PWM converter to inject a DC signal into the output of the AC motor drive, and determines a stator winding resistance of the AC motor based on the DC signal of at least one of the voltage and current.
    Type: Grant
    Filed: January 30, 2009
    Date of Patent: February 26, 2013
    Assignee: Eaton Corporation
    Inventors: Bin Lu, Thomas G. Habetler, Pinjia Zhang
  • Publication number: 20130046499
    Abstract: A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.
    Type: Application
    Filed: July 21, 2012
    Publication date: February 21, 2013
    Applicant: INSIGHT PHOTONIC SOLUTIONS, INC.
    Inventors: Michael Minneman, Michael Crawford, Jason Ensher
  • Patent number: 8378693
    Abstract: A front end of a vector network analyzer (VNA) on an integrated circuit includes a clock generator and two ports. The VNA couples to a device under test (DUT) using the two ports. Each port may include a plurality of receivers and a VSWR bridge, and can be configured as either an input or an output. The clock generator can generate a stimulus signal, an in-phase I clock signal, and a quadrature-phase Q clock signal. The output port provides the stimulus signal to the DUT and measures both reference and reflected power from the DUT, such as by utilizing two receivers by using direct conversion and the I and Q clock signals. The input port measures transmitted power through the DUT using a second VSWR bridge and one of its receivers by using direct conversion along with the I and Q clock signals. The VNA IC can provide S-parameter measurements to a processing unit for further processing and/or analysis to compute the DUT S-parameters.
    Type: Grant
    Filed: October 27, 2008
    Date of Patent: February 19, 2013
    Assignee: National Instruments Corporation
    Inventor: Michel M. Azarian
  • Publication number: 20130041609
    Abstract: A method processes measurement data of an object using a computing device. The method obtains measurement data of preselected feature elements of a measured object, inserts the measurement data of the preselected feature elements into a data list, obtains measured results of the preselected feature elements from a measurement tool, and calculates tolerance values of the preselected feature elements according to the measured results. The method further searches pixel icons of the preselected feature elements according to tolerance values and the measured results, inserts the pixel icons and the measured results into the data list, receives selections of a user and displays the data list in different list modes.
    Type: Application
    Filed: June 29, 2012
    Publication date: February 14, 2013
    Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
    Inventors: CHIH-KUANG CHANG, XIN-YUAN WU, WEI-QUAN WU
  • Patent number: 8374815
    Abstract: A test system may include multiple test stations. Electronic devices may be tested using the test system. Each test station may include a test unit such as a radio-frequency tester that can make wireless and wired radio-frequency signal measurements on devices under test. The test stations may be configured to perform pass-fail testing on devices under test during manufacturing. One or more selected devices under test that have passed the pass-fail tests may be retested using the test stations. Multiple tests may be performed at a given test station using the same selected device under test. Gathered test data may be analyzed to determine whether the test stations have sufficient accuracy and precision or need to be recalibrated or taken offline.
    Type: Grant
    Filed: April 28, 2010
    Date of Patent: February 12, 2013
    Assignee: Apple Inc.
    Inventors: Justin Gregg, Tomoki Takeya, Adil Syed
  • Patent number: 8374826
    Abstract: The present disclosure teaches a calibration system, a calibration apparatus and a method for calibrating a signal path and a method for calibrating a delay. The calibration system comprises an injector, a calibration signal generator, a correlator, a detector unit, a polygon former and a pattern classifier unit. The calibration system is adapted to calculate a fraction of a delay from a set of polygons. The delay is being accumulated along a signal path. The fraction of the delay is indicative of an accuracy of the delay at a fine sampling rate as if the delay was measured at the fine sampling rate being an integer multiple of the coarse sampling rate. The method for calibrating of the signal path uses a calibration signal sampled at a coarse sampling rate. Correlation techniques are used in order to detect a fraction of the delay from a set of polygons.
    Type: Grant
    Filed: February 22, 2010
    Date of Patent: February 12, 2013
    Assignee: Ubidyne, Inc.
    Inventors: Georg Schmidt, Markus Hilsenbeck, Maik Riegler
  • Publication number: 20130030716
    Abstract: A digital precious metal testing apparatus utilizes a probe that generates a galvanic voltage when an electrical circuit is completed with the object being tested being placed between the probe and the meter test pad formed of a copper pour with a gold coating. A microprocessor signals the percentage of precious metal through an indicator bar of LEDs. A calibration system is provided to enhance the accuracy of the testing apparatus by comparing a test reading from a known test specimen with a corresponding theoretical reading for that specimen. The calibration procedure establishes a recalibration curve from the test reading against which all subsequent readings will be compared to determine the content of precious metal. Calibration of the testing apparatus is initiated with the depression of a calibration switch and is undertaken with each power-up of the meter, with each probe replacement and with any substantial change in environmental conditions.
    Type: Application
    Filed: July 29, 2011
    Publication date: January 31, 2013
    Inventors: Jarrett Schaffer, Aaron Muller, Brent Miller
  • Publication number: 20130030745
    Abstract: A method including switching hardware into a pre-calibration mode; and using the hardware to selectively pre-store measured data for calibration.
    Type: Application
    Filed: July 29, 2011
    Publication date: January 31, 2013
    Inventors: Mika H. LAAKSONEN, Vesa KOIVUAHO
  • Publication number: 20130030708
    Abstract: A method for correcting a measurement of a property of a subsurface material includes: selecting an instrument having a test circuit and a separate sensor, the test circuit configured for generating a test signal having a characteristic that mimics a downhole measurement environment to generate correction information. The sensor is configured for: transmitting a signal into the subsurface material; and receiving a data signal from the subsurface material; wherein the test circuit and the sensor are switchably coupled to an electronics unit of the instrument. The sensor is further configured for: receiving the test signal from the test circuit in the electronics unit; using the electronics unit, measuring at least one output characteristic of the instrument; and applying the correction information to the data signal according to the measured output characteristic.
    Type: Application
    Filed: September 26, 2012
    Publication date: January 31, 2013
    Inventors: Stanislav Wihelm Forgang, Randy Gold
  • Patent number: 8364433
    Abstract: A calibration system employed for use with a resistance capacitance (RC) filter having resistors and capacitors with parasitic capacitance associated therewith. The calibration system has a digital calibration circuit receiving a time constant signal and generating, based thereon, a control word of N digital bits. The calibration system includes an analog monitor circuit having monitor capacitance assembly having a particular equivalent resistor and capacitor configuration. The analog monitor circuit generates the time constant signal and includes N switches, where each switch is controlled by one of the N bits of the control word, each switch is configured to connect or disconnect one or more capacitors of the monitor capacitor assembly thereby generating a time constant signal that represents the time constant of the RC integrated filter.
    Type: Grant
    Filed: December 18, 2008
    Date of Patent: January 29, 2013
    Assignee: Integrated Device Technology, Inc.
    Inventors: Mansour Keramat, Syed S. Islam, Mehrdad Heshami
  • Patent number: 8364431
    Abstract: A calibrator for field devices is provided. In one aspect, the calibrator has the ability to communicate in accordance with at least two process communication protocols, and tests an attached process connection before engaging communication. In another aspect, the calibrator includes isolation circuitry to facilitate compliance with at least one intrinsic safety requirement, while communicating with field devices using an all-digital process communication protocol. In another aspect, a method of calibrating field devices is provided which accesses device descriptions of the field devices to generate calibration tasks.
    Type: Grant
    Filed: October 12, 2007
    Date of Patent: January 29, 2013
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventors: Alden C. Russell, Alan R. Dewey
  • Publication number: 20130024013
    Abstract: Information from a real sensor and a virtual sensor are fused to form a hybrid sensor. Control signals (and/or the absolute value of the control signals) applied to an actuator are accumulated and converted to a position the actuator should be in based on the accumulated control signals to form the virtual sensor. The actuator position from the virtual sensor is fused with an actuator position from a real sensor to form the hybrid sensor. Small periodic corrections can be made to the accumulating control signals to maintain or achieve, if possible, correlation between the virtual sensor and the real sensor over time. The corrections slowly decrement errors in the actuator position indicated by the virtual sensor. Accumulating numerical errors in the accumulating control signals are reduced and the significance of long past events is de-emphasized by a forgetting factor (kff) used at defined periods of time (tff).
    Type: Application
    Filed: June 26, 2012
    Publication date: January 24, 2013
    Applicant: ABB TECHNOLOGY AG
    Inventor: Francis P. Mullin
  • Publication number: 20130024151
    Abstract: Objects such as manufactured goods or articles, works of art, media such as identity documents, legal documents, financial instruments, transaction cards, other documents, and/or biological tissue are sampled via sequential illumination in various bands of the electromagnetic spectrum, a test response to the illumination is analyzed with respect to reference responses of reference objects. The sequence may be varied. The sequence may define an activation order, a drive level and/or temperature for operating one or more sources. Illumination may be in visible, infrared, ultraviolet, or other portions of the electromagnetic spectrum. Elements of the evaluation system may be remote from one another, for example coupled by a network.
    Type: Application
    Filed: September 11, 2012
    Publication date: January 24, 2013
    Applicant: Visualant, Inc
    Inventors: Brian T. Schowengerdt, Thomas A. Furness, III, Nicholas E. Walker
  • Patent number: 8359178
    Abstract: A method for identifying erroneous sensor outputs is provided. The method includes obtaining a first plurality of samples from a sensor over a period of time. A mean of the plurality of samples is determined. A first additional sample from the sensor at a time subsequent to times that the first plurality of samples were obtained is also received. A divergence of the first additional sample from the mean is determined. The first additional sample is identified as erroneous when the divergence is greater than a threshold.
    Type: Grant
    Filed: March 4, 2009
    Date of Patent: January 22, 2013
    Assignee: Honeywell International Inc.
    Inventors: Eric Rowe, Mike Gruer
  • Publication number: 20130013242
    Abstract: A method of calibration of a dataset for spectroscopically resolved radiation scanning, comprising the steps of: generating an apparatus condition specific calibration dataset of emergent radiation intensity information generated after interaction in the scanning zone of at least one standard object spectroscopically resolved into a plurality of frequency bands; providing a transferable database comprising a dataset of transferable data items of emergent intensity information for a range of component materials, each spectroscopically resolved into a plurality of frequency bands and linked to the condition specific calibration dataset; defining a reference calibration dataset; generating a transfer function between the data item and the reference calibration dataset; applying the transfer function to the transferable data item to generate a dynamic data item adjusted to the reference calibration; populating a data register with a dynamic dataset comprising a dataset of data items each dynamically adjusted to t
    Type: Application
    Filed: January 10, 2011
    Publication date: January 10, 2013
    Inventors: David Edward Joyce, Timothy Simon Wright, Ian Radley
  • Patent number: 8352205
    Abstract: The present subject matter is direct to methodologies for calibrating data obtained from an optical analysis system. An initial calibration matrix of sampled analyte concentrations is modified using mean-centering techniques and selection of low and high analyte concentration spectra to produce a two-point calibration. A modified calibration matrix is produced by generating a non-linear calibration matrix by multiplying the initial calibration matrix by the two-point calibration. In an alternate embodiment, an initial multivariate optical element design is modified by iteratively adjusting the design based on standard error of calibration determination based on non-linerly fitted functions.
    Type: Grant
    Filed: February 25, 2008
    Date of Patent: January 8, 2013
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Michael L. Myrick, Luisa Profeta
  • Patent number: 8344919
    Abstract: A processing system including a first processing module and a second processing module is disclosed. The first processing module transforms and amplifies a grounded signal to generate a first processed signal and transforms and amplifies a predetermined signal to generate a second processed signal. The second processing module transforms the first processed signal to a first digital code according to a first reference voltage group and transforms the second processed signal to a second digital code according to a second reference voltage group. The second processing module adjusts a third reference voltage group according to the first and the second digital codes, and during a normal mode, the second processing module generates a third digital code according to the adjusted third voltage group.
    Type: Grant
    Filed: March 28, 2011
    Date of Patent: January 1, 2013
    Assignee: Industrial Technology Research Institute
    Inventor: Chung-Lin Tseng
  • Publication number: 20120330592
    Abstract: A method defines one or more monitoring target profiles, collects and stores initial calibration data of the metrology apparatus, compiling a library of spectra that would be observed from inspection of the monitoring target profiles using the metrology apparatus calibrated according to the initial calibration data. Some operations can be performed periodically, e.g., on a daily basis: obtaining current calibration data from the apparatus, modeling the effect of the current calibration data on the metrology apparatus operation, and using the result of the modeling and the contents of the library to determine any differences between one or more values of the initial calibration data and the current calibration data, and how these changes will be translated into changes in the measurement output for a given number of stacks and geometries.
    Type: Application
    Filed: May 29, 2012
    Publication date: December 27, 2012
    Applicant: ASML Netherlands B.V.
    Inventors: Gerardo Bottiglieri, Elliott Gerard Mc Namara, Ruben Alvarez Sanchez
  • Publication number: 20120330593
    Abstract: Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.
    Type: Application
    Filed: September 5, 2012
    Publication date: December 27, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Mark C. Johnson, Deepak S. Turaga, Olivier Verscheure
  • Patent number: 8340935
    Abstract: A network analyzer contains a processing device, at least one signal generator and at least four measuring points. The processing device controls the signal generator and processes measured values picked up from the measuring points. The network analyzer implements several calibration measurements on calibration standards, before it implements measurements on a device under test. The network analyzer implements the calibration measurements using the measuring points. The processing device determines error matrices on the basis of the results of the calibration measurements. The network analyzer implements measurements on the device using simultaneously, exactly three measuring points. The processing device determines measured values in each case of a fourth measuring point on the basis of the calibration measurements and the measured values of the three measuring points.
    Type: Grant
    Filed: December 18, 2009
    Date of Patent: December 25, 2012
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Martin Leibfritz, Werner Held
  • Patent number: 8335582
    Abstract: In one embodiment, a method for providing a user interface to graphically indicate a cause for fault-related events includes providing a user interface to illustrate a plurality of fault-related events for a plurality of recipes performed on a plurality of manufacturing process hardware tools, presenting in the user interface the plurality of recipes in a first axis and the plurality of manufacturing process hardware tools in a second axis, and graphically indicating in the user interface whether the plurality of fault-related events were caused by one of the plurality of manufacturing process hardware tools or one of the plurality of recipes performed on the one manufacturing process hardware tools.
    Type: Grant
    Filed: February 10, 2009
    Date of Patent: December 18, 2012
    Assignee: Applied Materials, Inc.
    Inventor: Rinat Shimshi
  • Patent number: 8335659
    Abstract: A position sensor measures a magnetic flux of a magnetic field produced by a magnet system in a first direction and a second direction. Values associated with the measured magnetic flux in the first direction are adjusted based on a first gain and a first offset that are determined based on the measured magnetic flux and a reference magnetic flux in the first direction. Values associated with the measured magnetic flux in the second direction are adjusted based on a second gain and a second offset that are determined based on the measured magnetic flux and a reference magnetic flux in the second direction. A position of the magnet system with respect to the position sensor at a given time may then be determined based on the adjusted values of the magnetic flux in the first and second directions at the given time.
    Type: Grant
    Filed: July 15, 2010
    Date of Patent: December 18, 2012
    Assignee: Tyco Electronics Corporation
    Inventors: Salvador Hernandez-Oliver, Lyle Stanley Bryan, Marco Wolf, Stefan Trauthwein
  • Patent number: 8335670
    Abstract: A system for determining the calibration factor uncertainty of a radiation sensor. A computing device accepts a mathematical model of the sensor, sample, and other items affecting the calibration factor, wherein each known mathematical model parameter is assigned its normal dimensions or values and each not-well-known parameter is assigned a variable with an upper and lower limit, and a shape parameter that describes the parameter may vary within or about the limits. Random values consistent with the upper and lower limits and shape parameters for each of the variable parameters in the model are then selected, to create a mathematical model of one possible variation of source-detector measurement configuration. The selection and calibration factor computation are then repeated a large number of times and statistical parameters describing the calibration factor and uncertainty are then computed. Another embodiment performs the steps at different energies for spectroscopic detectors.
    Type: Grant
    Filed: March 19, 2007
    Date of Patent: December 18, 2012
    Assignee: Canberra Industries, Inc.
    Inventors: Frazier Bronson, Valery Atrashkevich
  • Publication number: 20120316810
    Abstract: Methods and systems are provided for calibrating one or more limits of a battery of a vehicle, the battery having state of charge limits and power limits. A history of environmental conditions for the vehicle is obtained and stored in a memory. One or more of the state of charge limits, one or more of the power limits, or both are adjusted based on the history of environmental conditions and usage severity using a processor.
    Type: Application
    Filed: June 8, 2011
    Publication date: December 13, 2012
    Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC
    Inventors: Asif A. SYED, Sudhakar INGUVA, Joseph M. LOGRASSO, Christopher R. NEUMAN, Ryan B. MOULLIET
  • Patent number: 8330603
    Abstract: A dewatering system includes a selective calibrating sensor circuit configured to receive sensor readings from an electronic sensor, to determine if the electronic sensor is immersed in water, to allow a user to adjust a pump down time in the field, and to generate a control output signal accordingly. The selective calibrating sensor circuit periodically performs a self-calibration when the electronic sensor is not immersed in water to cancel the effect of potential contaminants deposited on the electronic sensor over its operating life. The selective calibrating sensor circuit inhibits calibration when the electronic sensor is immersed in water. In some applications with multiple electronic sensors, the selective calibrating sensor circuit disconnects from one of the electronic sensors before performing the self-calibration.
    Type: Grant
    Filed: June 26, 2009
    Date of Patent: December 11, 2012
    Assignee: SEEwater, Inc.
    Inventor: Robert F. Gibb
  • Patent number: 8326073
    Abstract: A method for beautifying a human face in a digital image is adapted to beautify a face area of an input image. The method includes setting a selection window to select a partial image area in the input image; setting a target pixel in the selection window, and setting other pixels as comparison pixels; performing a detail checking process according to a variance between the target pixel; performing a luminance checking process on the target pixel to determine; performing a nonlinear filtering process to filter the target pixel by using a nonlinear filter to generate a filtered value, and providing a mixing ratio to mix the target pixel with the filtered value at the mixing ratio to generate a completed pixel; replacing the original target pixel with the completed pixel; and repeating the above steps until all pixels are completed.
    Type: Grant
    Filed: May 22, 2009
    Date of Patent: December 4, 2012
    Assignee: Altek Corporation
    Inventors: Chen-Hung Chan, Hong-Long Chou
  • Patent number: 8326533
    Abstract: Techniques for estimating compass and gyroscope biases for handheld devices are disclosed. The compass bias can be determined by causing a small movement of the handheld device and comparing the data obtained from the compass with the data obtained from the gyroscope. The gyroscope bias can be determined by obtaining a quaternion based angular velocity term of the handheld device when the accelerometer and compass data are reliable, and then comparing the angular velocity term with the gyro data to estimate the gyro bias. When the compass and/or the accelerometer data are unreliable, a previously determined quaternion angular velocity term is used. The gyroscope bias can also be determined by measuring gyroscope biases at various temperatures in a non-factory setting, storing the data in a memory, and using the data to estimate gyro biases when the accelerometer and/or the compass data are unreliable.
    Type: Grant
    Filed: January 21, 2010
    Date of Patent: December 4, 2012
    Assignee: Invensense, Inc.
    Inventors: David Sachs, Shang-Hung Lin
  • Patent number: 8321179
    Abstract: A three dimensional radiation measurement scanning system includes a circular drive operable with horizontal and vertical drives for moving a radiation detector through first, second and third orthogonal axes in a three dimensional scanning of the detector in a water tank. Motor are coupled to the drives and activated by a controller for providing the movement of the radiation detector which providing radiation field sensing signals for locations of the detector throughout the tank. A reference detector is fixed for comparing its radiation field measurements with those of the scanned radiation detector. An offset mount carries the radiation detector allowing it to be extended beyond the circular ring gear during horizontal movement of the radiation detector and thus position the radiation detector at wall surfaces of the water tank.
    Type: Grant
    Filed: July 21, 2010
    Date of Patent: November 27, 2012
    Assignee: Sun Nuclear Corporation
    Inventors: William E. Simon, Mark Rose, Ronald J. Watts, Seth Brechbill, William Austhof, Thomas Allan Simon, Jakub Kozelka
  • Patent number: 8315831
    Abstract: A method includes receiving multiple measurements of an analog signal, where the measurements are taken using multiple measuring devices. The method also includes identifying whether any of the measurements are valid. In addition, the method includes, if at least one of the measurements is valid, generating a final measurement of the analog signal based on the at least one valid measurement.
    Type: Grant
    Filed: January 29, 2010
    Date of Patent: November 20, 2012
    Assignee: Honeywell International Inc.
    Inventors: Shivakumar Nagammanapalya Siddaraju, Adrianus Cornelis Maria Hamers
  • Patent number: 8313271
    Abstract: The present invention provides a method for machining a part from a workpiece. The workpiece is divided into a plurality of sectors and a plurality of fiducials are disposed within each sector. The separation distance between each fiducial is then calibrated to a workpiece distance unit. The present invention then includes the steps of a) positioning the workpiece into the desired position relative to a cutting machine; b) calibrating the cutting machine to the workpiece distance units of one sector; c) cutting one sector with the calibrated cutting machine; d) repeating steps a-c until the part is completed.
    Type: Grant
    Filed: July 13, 2007
    Date of Patent: November 20, 2012
    Assignee: University of North Carolina at Charlotte
    Inventor: Kevin Scott Smith
  • Patent number: 8311756
    Abstract: A setup and calibration unit for a barrier operator is operable to communicate with the operator's own controller. The calibration unit includes a control circuit connected to a visual display and to a set of switches controlled by switch actuators for placing the operator controller in a controller run mode or calibration mode, scrolling through selected actions displayed on the display in one direction or the other, a set/clear function and display backlighting for user interaction with the setup and calibration unit. The setup and calibration unit is particularly adapted for use with upward acting sectional and roll-up doors and other types of barriers movable between open and closed positions by motorized operators. The calibration unit may be operably connected to the operator controller via hard wiring, a radio frequency link or an infrared or visible light transmission link.
    Type: Grant
    Filed: July 29, 2011
    Date of Patent: November 13, 2012
    Assignee: Overhead Door Corporation
    Inventors: Brett A. Reed, Ralph C. Angiuli, Michael T. McMahon
  • Publication number: 20120283976
    Abstract: Described are embodiments to ensure that the equipment utilized to detect antigens is reliable and accurate. If it is determined that a read sensor is degraded a method of calibrating a read sensor of a read head is described. In one embodiment, a method of calibrating a magnetic read sensor includes measuring a first resistance of the magnetic read sensor upon an application of a forward bias current to the magnetic read sensor and measuring a second resistance of the magnetic read sensor upon an application of a reverse bias current to the magnetic read sensor. A calibration constant is determined based on at least the first measured resistance and the second measured resistance. In one embodiment the method further includes storing the determined calibration constant for the magnetic read sensor in memory. Further, in one embodiment the head module having the magnetic read sensor is swept over at least one nanoparticle to obtain a read response of the magnetic read sensor to the nanoparticle.
    Type: Application
    Filed: May 3, 2011
    Publication date: November 8, 2012
    Applicant: International Business Machines Corporation
    Inventors: David Berman, Dylan Joseph Boday, Icko E.T. Iben, Wayne Isami Imaino, Stephen Leonard Schwartz, Anna Wanda Topol, Daniel James Winarski
  • Patent number: 8306768
    Abstract: Operation data including at least acceleration data and angular speed data is obtained from an input device including at least an acceleration sensor and a gyroscopic sensor. Next, at least one of an attitude and a position of a predetermined object in a virtual space is controlled based on the angular speed data. When at least one of the attitude and the position of the predetermined object is controlled based on the angular speed data, it is determined whether or not the acceleration data satisfies predetermined conditions. As a result, if the acceleration data satisfies the predetermined conditions, the predetermined object is caused to start a predetermined motion.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: November 6, 2012
    Assignee: Nintendo Co., Ltd.
    Inventors: Yoichi Yamada, Hidemaro Fujibayashi, Eiji Aonuma
  • Patent number: 8306758
    Abstract: Reference features are updated based on a previous scan during each mass spectrometry scan of a sample. Reference features with reference feature confidence values are generated from a plurality of initial scans. For each subsequent scan of a sample, sample features and sample feature confidence values are calculated. The reference features and sample features are aligned to determine common features. Constants are determined for an equation of mass of the mass spectrometer using confidence weighted regression of the common features. The constants and the equation of mass are used to calculate new mass values for the sample features. The reference features are updated using the sample features and the reference feature confidence values are recalculated in order to maintain the accuracy of reference features for calibration.
    Type: Grant
    Filed: October 2, 2009
    Date of Patent: November 6, 2012
    Assignee: DH Technologies Development Pte. Ltd.
    Inventors: Nic G. Bloomfield, Gordana Ivosev
  • Patent number: 8306766
    Abstract: A method of calibrating glucose monitor data includes collecting the glucose monitor data over a period of time at predetermined intervals, obtaining reference glucose values from a reference source that temporally correspond with the glucose monitor data obtained at the predetermined intervals, calculating the calibration characteristics using the reference glucose values and corresponding glucose monitor data to regress the obtained glucose monitor data, and calibrating the obtained glucose monitor data using the calibration characteristics. In additional embodiments, calculation of the calibration characteristics includes linear regression and, in particular embodiments, least squares linear regression. Alternatively, calculation of the calibration characteristics includes non-linear regression. Data integrity may be verified and the data may be filtered.
    Type: Grant
    Filed: June 30, 2010
    Date of Patent: November 6, 2012
    Assignee: Medtronic MiniMed, Inc.
    Inventors: John C. Mueller, Jr., Desmond Barry Keenan, Lu Wang, John J. Mastrototaro
  • Publication number: 20120278022
    Abstract: Disclosed are systems and methods for managing testing unit latency and measurement uncertainty in computer-based stimulus-response tests. An estimated latency LE and an associated measurement uncertainty are determined as characteristics of a particular testing unit. LE is used as offset for all measurements taken on the testing unit, and results treated subject to the characteristic measurement uncertainty when determining test-taker performance. Estimated actual response times RTE are processed subject to a confidence value determined from the uncertainty. Uncertainty propagation determines test metrics involving a plurality of estimated actual response times RTE, where cumulative uncertainty is reported as a confidence rating in the metric. Overall test results (e.g., pass vs. fail) based on one or more metrics are also reported according to a confidence rating associated with the cumulative uncertainty propagated through the relevant metrics.
    Type: Application
    Filed: April 30, 2012
    Publication date: November 1, 2012
    Applicant: Pulsar Informatics, Inc.
    Inventors: Kevin Gar Wah Kan, Daniel J. Mollicone, Christopher G. Mott
  • Publication number: 20120278021
    Abstract: A method of detecting anomalies from a bipartite graph includes analyzing the graph to determine a row-cluster membership, a column-cluster membership and a non-negative residual matrix, and in a processor, detecting the anomalies from the non-negative residual matrix.
    Type: Application
    Filed: April 26, 2011
    Publication date: November 1, 2012
    Applicant: International Business Machines Corporation
    Inventors: Ching-Yung Lin, Hanghang Tony
  • Patent number: 8301429
    Abstract: Computer-implemented iterative multi-scale methods and systems are provided for handling simulation of complex, highly anisotropic, heterogeneous domains. A system and method can be configured to achieve simulation of structures where accurate localization assumptions do not exist. The iterative system and method smoothes the solution field by applying line relaxation in all spatial directions. The smoother is unconditionally stable and leads to sets of tri-diagonal linear systems that can be solved efficiently, such as by the Thomas algorithm. Furthermore, the iterative smoothing procedure, for the improvement of the localization assumptions, does not need to be applied in every time step of the computation.
    Type: Grant
    Filed: October 8, 2009
    Date of Patent: October 30, 2012
    Assignees: Chevron U.S.A. Inc., Schlumberger Technology Corporation, ETH Zurich
    Inventors: Hadi Hajibeygi, Giuseppe Bonfigli, Marc Andre Hesse, Patrick Jenny
  • Patent number: 8295586
    Abstract: A position detection method and a position detection device for detecting with sufficient accuracy the position or the attitude of an object by using an image of the object captured by a single camera. The position detection method detects the position or the attitude of the object by using a measurement pixel position in images of multiple points on the object, which images are captured by the single camera and have a known positional relationship.
    Type: Grant
    Filed: January 25, 2008
    Date of Patent: October 23, 2012
    Assignee: Honda Motor Co., Ltd.
    Inventor: Chiaki Aoyama
  • Patent number: 8296088
    Abstract: Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
    Type: Grant
    Filed: May 17, 2010
    Date of Patent: October 23, 2012
    Assignee: Luminex Corporation
    Inventors: Wayne D. Roth, Charles J. Collins, William R. Deicher, Jarden E. Krager, Adam R. Schilffarth, Ross G. Johnson, Colin D. Bozarth, Victor Selvaraj, Nicolas F. Arab, Bruce J. C. Bernard, Donald A. Conner, Robert S. Roach
  • Publication number: 20120265469
    Abstract: A calibration method and device calibrate a signal to be calibrated and measured. The signal to be calibrated and measured is outputted by a linear measurement system in a test stage. The method includes inputting a default input signal to the linear measurement system to obtain a default measurement signal; determining a linear strength between the default measurement signal and the default input signal; obtaining a calibration formula according to linear retrogression to calibrate the signal to be calibrated and measured, thereby obtaining a calibrated value and effectuating precise linear measurement.
    Type: Application
    Filed: June 10, 2011
    Publication date: October 18, 2012
    Applicant: ASKEY COMPUTER CORP.
    Inventors: SHENG-HUEI YANG, CHING-FENG HSIEH
  • Publication number: 20120265470
    Abstract: Sensor devices and methods for producing corrected sensor vectors are disclosed. According to one embodiment, a method of correcting a sensor vector provided by a sensor includes determining a largest magnitude vector component of a sensor vector having N dimensions, and determining a sign of the largest magnitude vector component. The method further includes selecting a major region of interest of a look-up table based on the largest magnitude vector component of the sensor vector and the sign of the largest magnitude vector component, wherein the look-up table includes 2*N major regions of interest, and each major region of interest has a plurality of cells. A cell that is nearest to the sensor vector is selected, and a final corrective data cv is applied to the sensor vector to obtain a corrected sensor vector, wherein the final corrective data cv is associated with the selected cell.
    Type: Application
    Filed: May 23, 2012
    Publication date: October 18, 2012
    Applicant: YOST ENGINEERING, INC.
    Inventors: Paul W. Yost, Stephen P. Landers
  • Publication number: 20120265468
    Abstract: The present disclosure relates to a method to calibrate logging measurements from a logging tool for which one or more attributes vary over the course of logging. A logging tool is provided and a pre-logging calibration function for the logging tool is obtained. Logging measurements are made using the logging tool, and a post-logging calibration function for the logging tool is obtained. A variable calibration function using the pre-logging calibration function and the post-logging calibration function is determined, and the logging measurements are calibrated using the variable calibration function. The variable calibration function may be discreet or continuous and linear or non-linear. A non-linear calibration function may be based on measurements of one or more of the varying attributes of the logging tool. A discreet calibration function may have three or more calibration factors.
    Type: Application
    Filed: April 15, 2011
    Publication date: October 18, 2012
    Inventors: Mark Kenneth Dennis, Swapnesh Ramachandran
  • Patent number: 8290725
    Abstract: Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: October 16, 2012
    Assignee: National Instruments Corporation
    Inventor: Sead Suskic
  • Patent number: 8290730
    Abstract: Methods and systems are provided for deriving and analyzing shape metrics, including skewness metrics, from physiological signals and their derivatives to determine measurement quality, patient status and operating conditions of a physiological measurement device. Such determinations may be used for any number of functions, including indicating to a patient or care provider that the measurement quality is low or unacceptable, alerting a patient or care provider to a change in patient status, triggering or delaying a recalibration of a monitoring device, and adjusting the operating parameters of a monitoring system.
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: October 16, 2012
    Assignee: Nellcor Puritan Bennett Ireland
    Inventors: James N. Watson, Clark R. Baker, Jr., Paul Stanley Addison
  • Publication number: 20120259571
    Abstract: The present invention relates to an automatic calibration method of a test device for testing a wireless communication system such as a DVB-H or the like, a device, and a manufacturing method thereof, and more specifically, to a calibration method and device for providing an automatic calibration data generation function, in which the same frequency characteristic of the test device is maintained in various frequency bands and the test device is capable of generating an exact and reliable test signal.
    Type: Application
    Filed: December 24, 2009
    Publication date: October 11, 2012
    Applicant: INNOWIRELESS CO., LTD.
    Inventors: Myoung Koo Kang, Chang Bok Yang, Jong Min Kim, Jin Soup Joung
  • Patent number: 8285506
    Abstract: An apparatus for generating a measure of fluid. The apparatus comprises a flow meter and a pulser having an identifier and a memory. The pulser is associated with the flow meter for generating pulser data indicative of a volume of fluid delivered through the flow meter. The pulser may alter the pulser data using correction data stored in its memory to generate altered pulser data. The pulser may store at least one of the pulser data and the altered pulser data in the memory. The apparatus further comprises a switch operatively connected to the pulser's memory. The switch is operative to vary the memory of the pulser between a write-protected and a write-enabled mode. Also, the apparatus comprises a controller in communication with the pulser and a serial communication circuit which enables communication between the pulser and the controller. Communication between the controller and the pulser includes the identifier.
    Type: Grant
    Filed: February 2, 2010
    Date of Patent: October 9, 2012
    Assignee: Gilbarco Inc.
    Inventors: Christopher Adam Oldham, Christopher Eric Scott, Juergen Voss
  • Patent number: 8275564
    Abstract: A method and system for inspecting a surface of a material having a repeating pattern of relative work function. The method and system processes sensor data to identify data characteristic of the repeating pattern, and the sensor data is then further processed to remove the data characteristic of the repeating data, leading to a characteristic of non-uniformities of the material surface.
    Type: Grant
    Filed: January 26, 2010
    Date of Patent: September 25, 2012
    Assignee: Qcept Technologies, Inc.
    Inventors: Mark A. Schulze, Jun Liu, Jeffrey Alan Hawthorne
  • Patent number: 8274043
    Abstract: The present invention comprises a method and system for accurate estimation of the ion cyclotron resonance (ICR) parameters in Fourier-transform mass spectrometry (FTMS/FT-ICR MS). The parameters are essential to estimating the mass to charge ratio of an ion from FT-ICR MS data, the intended purpose of the instrument. Achieving greater accuracy in the parameters assists in greater accuracy of the mass to charge ratio of an ion, and obtaining an accurate estimation of the mass to charge ratio of an ion further aides in detecting mass with sub-ppm accuracy. Estimating mass in this manner enhances identification and characterization of large molecules. The inventive method and system thereby enhances the data obtained by conventional FTMS by accurately estimating ICR parameters. Ultimately, accurate estimates of the masses of molecules and detection and characterization of molecules from FT-ICR MS data are obtained.
    Type: Grant
    Filed: May 25, 2007
    Date of Patent: September 25, 2012
    Assignee: Cedars-Sinai Medical Center
    Inventor: Robert A. Grothe, Jr.
  • Publication number: 20120239330
    Abstract: A method for radiometric calibration of an infrared detector, the infrared detector measuring a radiance received from a scene under observation, the method comprising: providing calculated calibration coefficients; acquiring a scene count of the radiance detected from the scene; calculating a scene flux from the scene count using the calculated calibration coefficients; determining and applying a gain-offset correction using the calculated calibration coefficients to obtain a uniform scene flux. In one embodiment, the method further includes transforming the uniform scene flux to a radiometric temperature using the calculated calibration coefficients.
    Type: Application
    Filed: December 7, 2010
    Publication date: September 20, 2012
    Inventors: Pierre Tremblay, Louis Belhumeur, Martin Chamberland, André Villemaire