Coordinate Positioning Patents (Class 702/95)
  • Patent number: 7263452
    Abstract: A resolver-to-digital converting apparatus calculates a resolver rotational angle from two-phase sampling values that are the result of sampling two-phase output signals, which are obtained from a single-phase-excited, two-phase output resolver, at peak timings of a waveform. The apparatus includes a determination unit for determining whether each of the two-phase sampling values has deviated from a prescribed path of rotation by more than a predetermined amount when the two-phase sampling values are represented by orthogonal coordinates; a correction processing unit, responsive to a determination that the predetermined amount has been exceeded, for applying a correction to the two-phase sampling values using an equation of a tangent to the path of rotation at a point on the path of rotation at which the previous resolver rotational angle was obtained; and an angle calculation unit for obtaining a resolver rotational angle at the corrected two-phase sampling values obtained by correction processing.
    Type: Grant
    Filed: March 11, 2005
    Date of Patent: August 28, 2007
    Assignee: NEC Electronics Corporation
    Inventor: Takumi Kawamura
  • Publication number: 20070192052
    Abstract: A correction method for correcting measurement error in data obtained when a stylus tip of a measurement apparatus that moves following the height of a workpiece traces the workpiece along a measurement axis, the measurement error having occurred due to stylus movement in a plane defined by the measurement axis and height directions, the method comprising the step of: a calibration measurement process of obtaining calibration measurement data that includes shift information on the position of the stylus tip, corresponding to the position of the stylus tip in the height directions while the stylus is moved in the correction target plane; and a correction-parameter setting process of simultaneously obtaining a correction parameter value optimal to correct the shift information on the position of the stylus tip, included in the calibration measurement data, for each of the sectors obtained by dividing a measurement range in the height directions.
    Type: Application
    Filed: January 30, 2007
    Publication date: August 16, 2007
    Applicant: MITUTOYO CORPORATION
    Inventors: Tomonori Goto, Soichi Kadowaki, Naoji Horiuchi, Jyota Miyakura
  • Patent number: 7254506
    Abstract: A method of measuring an object on a coordinate positioning apparatus. A first object is placed on a coordinate positioning apparatus and measured with a workpiece contacting probe to create measurement data. The measurement data is collected at multiple stylus deflections or probe forces. For a plurality of points on the surface of the first object, the measurement data is extrapolated to that corresponding to zero stylus deflection or zero probe force. An error function or map is created from the measurement data and the extrapolated data. Subsequent objects are then measured using a known stylus deflection or known probe force and the error function or map is used to apply an error correction to these measurements.
    Type: Grant
    Filed: July 4, 2003
    Date of Patent: August 7, 2007
    Assignee: Renishaw, PLC
    Inventors: David Roberts McMurtry, Geoffrey McFarland
  • Patent number: 7248967
    Abstract: Measurement of a spatial velocity vector in order to make determination of a geographical position possible. A spatial velocity meter includes an inertial measurement unit, a direction-sensing module and a velocity processor. The inertial measurement unit registers acceleration parameters and angular velocity parameters in three dimensions. The direction-sensing module registers a natural reference signal. The velocity processor receives the acceleration parameters, the angular velocity parameters and the natural reference signal, and based thereon, generates the spatial velocity vector.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: July 24, 2007
    Assignee: SAAB AB
    Inventor: Anders Hagstedt
  • Patent number: 7246021
    Abstract: The directions of optical axes of headlights of a vehicle are adjusted based on a steering angle by switching filters of different response speed characteristics. The filters are provided with hystereses along boundaries neighboring to each other. The filters are switched depending upon the steering angle and a steering angular velocity to vary the response of swivel control. Therefore, the start of swiveling is not quickened, the filter is not frequently switched, quick motion is suppressed and, hence, smooth motion is realized making it possible to execute a swivel control without causing discomfort.
    Type: Grant
    Filed: August 10, 2005
    Date of Patent: July 17, 2007
    Assignee: DENSO Corporation
    Inventor: Masahiko Morishita
  • Patent number: 7245982
    Abstract: A system and a process are disclosed, that are automated and integrated with numerically controlled systems, for measuring, compensating and testing numerically controlled machine tool heads (1) and/or tables. The system comprises: at least one support base (11) equipped with a plurality of distance sensors (14); at least one device (16) of the gage tool type composed of an elongated cylinder (17) that is equipped at one of its ends with connection means (18) for the heads (1) and is equipped at another opposite end with a ball (20), wherein the ball (20) is placed next to the sensors (14) so that they are able, always and in any position, to measure the distance that separates them from the ball (20) and determine thereby the position in the Cartesian space.
    Type: Grant
    Filed: September 19, 2003
    Date of Patent: July 17, 2007
    Assignee: FIDIA S.p.A.
    Inventor: Giuseppe Morfino
  • Patent number: 7233872
    Abstract: The error of a sensor in motion capture system is corrected. An acceleration sensor determines the direction of gravity (G1) in a still initial state. The direction G1 will never change always if a drift dose not occur. However, actually if an object to which an acceleration sensor is attached moves along a coordinate axis, the direction gradually changes due to a drift with time. According to the invention, after a given time has passed, the acceleration sensor is stopped to determine the direction of gravity. Referring to the data on this determination, the true direction of gravity to be judged is compared with the direction of gravity G1 influenced by the drift. The difference between them is assumed to be an error due to a drift, and the error is subtracted from the determined value to correct the error of the measurement value.
    Type: Grant
    Filed: February 16, 2004
    Date of Patent: June 19, 2007
    Assignee: Akebono Brake Industry Co., Ltd.
    Inventors: Ryosuke Shibasaki, Yusuke Konishi, Hiroshi Kanasugi, Nobuyuki Yoshida
  • Patent number: 7200950
    Abstract: The disclosed embodiments relate to calibrating a measuring device by comparing a set of master measurement data against a set of current measurement data. Adjustments are made to the measuring device based on the difference between the current measurement data and the master measurement data.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: April 10, 2007
    Assignee: Micron Technology, Inc.
    Inventor: Steve W. Bowes
  • Patent number: 7203618
    Abstract: A method for adjusting a determination rule for an error compensation of an angle sensor is designed to detect a first component of a direction along a first axis and a second component of a direction along a second axis, and to determine an angle of the direction according to the determination rule based on the first and second components. The method includes: detecting values of component pairs consisting of two predetermined components for the calculation of offset and/or amplitude and/or axis-angle errors. One variant consists of entering the component value pairs into an ellipse equation system, determining at least one ellipse coefficient from the ellipse equation system, and adjusting the determination rule depending on the one determined ellipse coefficient or the plurality of determined ellipse coefficients. A further variant is the determination of selected points, extremums or zero points for the determination of the offset and/or amplitude and/or axis-angle errors.
    Type: Grant
    Filed: May 17, 2005
    Date of Patent: April 10, 2007
    Assignee: Infineon Technologies AG
    Inventors: Dirk Hammerschmidt, David Tatschi, Wolfgang Granig
  • Patent number: 7184909
    Abstract: The position of the gripper axis of the chip gripper of a bondhead of an apparatus for mounting semiconductor chips is determined with the aid of a stationary arranged photodetector. The chip gripper contains a suction organ with a suction opening that defines the position of the gripper axis. The chip gripper contains a shaft with a longitudinal drill hole to which vacuum can be applied that is illuminated so that light emerges out of the suction opening of the suction organ. The bondhead is moved over edges of the photodetector and co-ordinates that characterise the position of the gripper axis are determined from the output signal of the photodetector and the position signal of the bondhead. If this method is carried out for different rotary positions of the chip gripper, then any offset of the gripper axis relative to the rotational axis of the bondhead can also be determined.
    Type: Grant
    Filed: December 8, 2004
    Date of Patent: February 27, 2007
    Assignee: Unaxis International Trading Ltd.
    Inventor: Daniel Bolliger
  • Patent number: 7171320
    Abstract: Geometrical errors in a coordinate measuring machine are measured while works with various weights are mounted on the coordinate measuring machine. Compensation parameters are derived from measured results per a weight of a work and stored. A compensation parameter corresponding to a weight of a work to be measured is appropriately read out to correct measured coordinates of the work to be measured.
    Type: Grant
    Filed: January 31, 2005
    Date of Patent: January 30, 2007
    Assignee: Mitutoyo Corporation
    Inventors: Katsuyuki Ogura, Ayako Sugita, legal representative, Hirokazu Michiwaki, Kozo Sugita, deceased
  • Patent number: 7162383
    Abstract: In a calibration method for a surface texture measuring instrument which measures a surface of a workpiece and includes an arm that is supported to be swingable around a base point thereof and is provided with a contact point at an end for scanning the workpiece surface, the calibration method includes a measurement step for measuring a calibration gauge of which cross section contains a part of a substantially perfect circle, an assignment step for assigning the detection results, which are obtained in the measurement step, in an evaluation formula based on a circle equation in which the center coordinates of the calibration gauge are (xc, zc) and the radius is “r”, and a calibration step for calibrating each parameter based on the evaluation formula obtained in the assignment step.
    Type: Grant
    Filed: April 28, 2004
    Date of Patent: January 9, 2007
    Assignee: Mitutoyo Corporation
    Inventor: Isamu Takemura
  • Patent number: 7142999
    Abstract: A method for correcting errors in a coordinate measuring machine having a measuring head which is adapted to move in at least two different spatial directions. Measuring scales and measuring lines are assigned to each spatial direction. The measuring lines of different spatial directions intersect, and correction values are determined along the measuring lines at predetermined values of the scales in order to correct for elastic and/or geometric errors of the scales and/or of the guiding mechanism for moving the measuring head. According to one aspect of the invention, the correction values determined along a measuring line of a first spatial direction are modified such that the modified correction value of this measuring line assumes a predetermined value at the point of intersection with a first measuring line of a second spatial direction.
    Type: Grant
    Filed: September 20, 2004
    Date of Patent: November 28, 2006
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Günter Grupp, Andreas Fuchs, Walter Jenisch, Ralf Bernhardt, Harald Schmid, Ulrich Staaden
  • Patent number: 7142313
    Abstract: An interaxis-angle correction method comprising: a reference sphere measurement step of scanning, with the sensor, a reference sphere located on the table, in the measurement-axis direction at a translation-axis-direction position on the reference sphere to acquire measurement-axis-direction contour information, and performing the scanning at a plurality of different translation-axis-direction positions on the same reference sphere, with the table being linearly translated; a peak detection step of detecting a peak point in the measurement-axis-direction contour information, and performing the detection for each set of measurement-axis-direction contour information; an error information acquisition step of obtaining information related to the inclination of an actual straight line based on each peak point with respect to an ideal straight line; a correction information acquisition step of obtaining correction information for correcting a measurement error related to the position in the measurement-axis direct
    Type: Grant
    Filed: March 8, 2006
    Date of Patent: November 28, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Takao Ishitoya, Fumihiro Takemura
  • Patent number: 7143004
    Abstract: The device is a miniature, self-contained solid state orientation sensor. The unit utilizes three magnetometers and three accelerometers to calculate pitch, roll, and yaw (compass heading) angles relative to the earth's magnetic and gravitational fields. The three orientation angles are output in digital RS232 or optional multi-drop RS485. The device can also be programmed to provide raw accelerometer and magnetometer data in true physical units. The device is capable of measuring angles from 0 to 360 degrees on the yaw axis, 0 to 360 degrees on the pitch axis, and ?70 to +70 degrees on the roll axis. The yaw output is compensated for errors due to pitch and roll using embedded algorithms. Applications include fast solid state compassing, robotics, virtual reality, down-hole well drilling, and body position tracking for biomedical and multimedia applications.
    Type: Grant
    Filed: May 29, 2003
    Date of Patent: November 28, 2006
    Assignee: Microstrain, Inc.
    Inventors: Christopher P. Townsend, Steven W. Arms
  • Patent number: 7131207
    Abstract: A method of inspecting an artefact using a non contact measurement mounted on a coordinate measuring apparatus. An artefact is measured first with a contact probe (28) and then with a non contact probe (32). An error map or function is generated (34) which corresponds to the difference between the measurements taken with the contact and non-contact probes. This error map or function may be used to calibrate the probe. Alternatively subsequent artefact may be measured with the non contact probe (36) and the error map or function used to correct the measurements (38).
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: November 7, 2006
    Assignee: Renishaw PLC
    Inventor: Geoffrey McFarland
  • Patent number: 7133793
    Abstract: A calibration system is provided for use in generating calibration data for calibrating an X-Y digitiser. The calibration system uses an alignment head having an array of magnetic field generators which are for alignment with the X-Y digitiser. Each of the magnetic field generators is individually drivable so that calibration data can be obtained for different positions on the X-Y digitiser corresponding to the positions of the magnetic field generators in the array.
    Type: Grant
    Filed: July 23, 2004
    Date of Patent: November 7, 2006
    Assignee: Synaptics (UK) Limited
    Inventors: David Ely, Gareth McCaughan
  • Patent number: 7130754
    Abstract: A calibration information calculation unit 340 calculates the first coordinate positions of feature points included in images obtained by an image sensing apparatus at timings from an instruction unit 350 using position data, on world coordinate system, of a plurality of feature points held by a world coordinate holding unit 310 and the measured values of a position/posture sensor 130 input to a data management unit 330 at the timings. The unit 340 receives the second coordinate positions, which are acquired by an image coordinate acquisition unit 320, of the feature points included in the images obtained by the image sensing device at the timings. The unit 340 calculates calibration information using the first and second coordinate positions.
    Type: Grant
    Filed: July 16, 2004
    Date of Patent: October 31, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kiyohide Satoh, Shinji Uchiyama, Toshihiro Kobayashi
  • Patent number: 7085664
    Abstract: A method for controlling the axes of motors, for machine tools and the like, including the steps of: calculating, from a sequence of relative position data of each axis and of actuation states at each definite instant, a path for each individual axis, starting from parameters of initial speed, number of steps and final speed; defining a three-dimensional matrix that contains, for each axis, initial speed, number of steps and final speed, each element of the three-dimensional table, constituted by the intersection in space of the three parameters, containing an address that is suitable to point to the vector which describes a corresponding waveform; driving the axis according to the waveform.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: August 1, 2006
    Inventor: Lucio Vaccani
  • Patent number: 7079969
    Abstract: A method of inspecting a series of workpieces using a coordinate measuring apparatus, comprising the steps of: measuring a calibrated artefact on a coordinate measuring apparatus at a fast speed 28; generating an error map corresponding to the difference between the calibrated artefact and the measured artefact 30; measuring subsequent workpieces at the same fast speed 34 and correcting the measurements of the subsequent workpieces using the error map 36. The artefact may be one of the workpieces.
    Type: Grant
    Filed: March 6, 2003
    Date of Patent: July 18, 2006
    Assignee: Renishaw PLC
    Inventors: Benjamin Roller Taylor, Geoffrey McFarland
  • Patent number: 7079968
    Abstract: A method for increasing the measuring accuracy for a limited path is described, where a map of the actual geometric path that is stored in a memory is obtained in a “learning phase.” In addition, a method for better controlling a camshaft offset in a combustion engine is described.
    Type: Grant
    Filed: March 19, 2004
    Date of Patent: July 18, 2006
    Assignee: AFT Atlas Fahrzeugtechnik GmbH
    Inventors: Dirk Heintzen, Andreas Nithammer
  • Patent number: 7069156
    Abstract: A method for adjusting the pitch and roll static torques (PST and RST) on a slider in a disk drive head-suspension assembly (HSA) during manufacturing assures that each HSA is manufactured with acceptable PST and RST values. The method includes measuring each slider's pitch and roll static attitudes (PSA and RSA) and determining each HSA's pitch and roll torsional stiffnesses. These values are then used to calculate the required amount of adjustment to PSA and RSA to achieve the desired values of PST and RST for each HSA. The suspension is then adjusted, such as by heating the flexure with a laser.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: June 27, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventor: Qinghua Zeng
  • Patent number: 7065462
    Abstract: Apparatus and methods are provided for measuring vehicle wheel alignment characteristics. According to one embodiment, during a first measurement cycle, spatial coordinates of multiple points on the wheel are obtained by positioning a vision sensor at various angular offsets relative to the wheel, the multiple points representative of samples from each of the various angular offsets. After the first measurement cycle and before the second measurement cycle, the wheel is rotated at least a partial revolution. During the second measurement cycle, spatial coordinates of multiple points on the wheel are obtained by positioning the vision sensor at various angular offsets relative to the wheel, the multiple points representative of samples from each of the various angular offsets. Finally, one or more characteristics of the wheel are determined based upon the spatial coordinates collected during the first measurement cycle and the spatial coordinates collected during the second measurement cycle.
    Type: Grant
    Filed: April 18, 2003
    Date of Patent: June 20, 2006
    Assignee: Merilab, Inc.
    Inventors: M. Stanley Merrill, Ted Combs, Richard Sutton
  • Patent number: 7055367
    Abstract: A method of calibrating an analogue probe (10) having a stylus (12) with a workpiece-contacting tip (14) or a non-contact probe (26). A calibration artefact such as a calibration sphere (16) is mounted on a coordinate measuring machine (CMM) (18). The probe (10,26) is mounted on an arm (8) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe (10) having a workpiece-contacting stylus (12), the path is such that the deflection of the stylus varies along the path. For a non-contact probe (26) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.
    Type: Grant
    Filed: November 1, 2002
    Date of Patent: June 6, 2006
    Assignee: Renishaw PLC
    Inventors: Peter Hajdukiewicz, Geoffrey McFarland, David Sven Wallace
  • Patent number: 7054775
    Abstract: A digitizing system and rotary table for determining the three dimensional geometry of an object is described. An apparatus includes at least one sensor that detects information describing the three-dimensional geometry of the object and provides the information to a host computer. A rotary table includes a base and a turntable rotatable about an axis positioned perpendicularly to the turntable surface. The turntable and object on its surface rotate about the axis, during or between the sensor detecting the information describing the three-dimensional geometry of the object. A turntable sensor coupled to the base measures the rotation of the turntable, where the turntable sensor outputs turntable data indicative of the rotation to the host computer.
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: May 30, 2006
    Assignee: Immersion Corporation
    Inventors: Louis B. Rosenberg, Bruce M. Schena, Bernard G. Jackson
  • Patent number: 7043396
    Abstract: A method and apparatus for guiding an operator in the alignment of the wheels of an automotive vehicle which has been either modified from a original manufacturer configuration, or for which no previously established alignment settings are known. Initially, the operator identifies known information about the vehicle and selects a desired characteristic of the vehicle for which the vehicle alignment is to be optimized. A set of initial alignment settings are presented to the operator, based upon the selected characteristic for the vehicle, and the vehicle alignment is adjusted thereto. One or more subsequent measurements of the vehicle are acquired. Alignment adjustments to further improve the selected characteristic, identified in response to the vehicle measurements are presented to the operator. The process of alignment adjustment, measurement, and presented adjustments is repeated until an optimal alignment setting for the selected characteristic is reached.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: May 9, 2006
    Assignee: Hunter Engineering Company
    Inventors: Timothy A. Larson, Dennis D. Bowen, Michael T. Stieff
  • Patent number: 7024333
    Abstract: A coordinate measuring apparatus includes probe pin(s) fixed to a probe head displaceable in coordinates. The probe pin includes probe shafts having respective ends to which probe balls are attached. At least two of the probe shafts are differently oriented when the probe pins are fixed to the probe head. A control and evaluation unit controls the course of measurement and evaluates the measuring points recorded. At least one probe shaft is determined for measuring a geometric element on a workpiece by determining at least one characteristic piece of directional information for the points to be measured of a geometric element to be measured on the workpiece, either on the basis of the measured measuring points or according to predefined nominal data of the geometric element. At least one probe shaft for measuring the measuring points is determined from the directional information.
    Type: Grant
    Filed: September 10, 2003
    Date of Patent: April 4, 2006
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Rudolf Rögele, Dieter Kalmbach
  • Patent number: 7006674
    Abstract: An apparatus and method for verifying the location of an area of interest within a sample are disclosed. An imaging system includes an optical system and a stage movable relative to the optical system. A computer server is in communication with the imaging system and with a review station. The imaging system is capable of spatially locating a datum mark on the sample and determining a spatial offset value of the mark relative to a nominal position thereof. The coordinate systems of a respective one of the imaging system and the review station can be standardized. The method includes locating a datum mark on the sample, and identifying an area of interest within the sample. The method further includes determining the location of the area of interest relative to the mark. The method further includes locating again the datum, and checking that a dimensional error in locating the datum mark is less than a tolerance value to verify location of the area of interest.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: February 28, 2006
    Assignee: Cytyc Corporation
    Inventors: David J. Zahniser, Theodore S. Geiselman
  • Patent number: 6993443
    Abstract: With a method for determining and tracking a changing, true position and orientation of a magnetic field sensor within a three-dimensional magnetic field space from the values measured by the magnetic field sensor, the magnetic field space is structured in a preceding calibration mode into a three-dimensional grid with equidistant grid points. All values measured by the magnetic field sensor are then stored in a calibration table as calibration positions and calibration orientations allocated to the real positions of the grid points in the magnetic field space. A linear interpolating transformation of the measuring position in the real magnetic field space is executed for the measuring values from the magnetic field sensor by using respectively four calibration positions taken from the calibration table, which span a tetrahedron that encloses the measuring position.
    Type: Grant
    Filed: February 23, 2004
    Date of Patent: January 31, 2006
    Assignee: Rheinmetall Defence Electronics GmbH
    Inventor: Norbert Härle
  • Patent number: 6990743
    Abstract: The disclosed embodiments relate to calibrating a measuring device by comparing a set of master measurement data against a set of current measurement data. Adjustments are made to the measuring device based on the difference between the current measurement data and the master measurement data.
    Type: Grant
    Filed: August 29, 2002
    Date of Patent: January 31, 2006
    Assignee: Micron Technology, Inc.
    Inventor: Steve W. Bowes
  • Patent number: 6978215
    Abstract: This invention allows the scan nonlinearity of different type of scanning microscopes to be measured, including: optical, confocal, scanning electron and scanning probe microscopes. The scan nonlinearity of the scanning type measuring microscopes can be considerable source of errors in precise measurements of the Critical Dimension—CDs. The invention allows scanning measuring microscopes to be certified for scan nonlinearity; this invention can be used for the monitoring, adjustment and/or alignment of these type instruments. The high reliability of scan nonlinearity determination is achieved with the use of a pair of offset images of a calibration structure and consequent computer analysis of the signal differences. In addition to scan nonlinearity of a scanning measuring microscope being determined this proposed invention allows determination of heterogeneity of the pitch values intrinsic to any test-objects with periodic structure used as calibration references.
    Type: Grant
    Filed: September 4, 2001
    Date of Patent: December 20, 2005
    Assignee: General Phosphorix LLC
    Inventor: Arkady Nikitin
  • Patent number: 6974964
    Abstract: An apparatus and method to scan and collect data relative to the position of a moving object. The method includes the calibration, equations, and algorithm needed to compute the surface coordinates of an object. The preferred embodiment of the apparatus includes two light sources and four area array image sensors, one moving device, and one computing device. The device scans the object, generates data, computes the position, and provides a complete measure of the 3D surface coordinates of an object. The methodology includes calibration of a known pattern to the area array image sensor, equations to map the physical points to the image sensor, algorithms to determine a best estimate of the coordinates of occluded points, and techniques to merge the computed coordinates from different sections of the object.
    Type: Grant
    Filed: June 11, 2003
    Date of Patent: December 13, 2005
    Inventor: Bu-Chin Wang
  • Patent number: 6959253
    Abstract: An apparatus and method for calibrating machine vision measuring systems that have more than one camera are disclosed. A first calibration target is mounted in a fixed relationship to a first camera of the machine vision measuring system. A third camera mounted in a fixed relationship to a second camera of the machine vision measuring system. Second and third calibration targets are mounted in a fixed relationship to one another and viewable by the first camera and by the third camera. A data processor is programmed to compute calibration of the first camera and the second camera, based on a position of the second calibration target relative to the third calibration target and based on a position of the first camera with respect to the third camera. The apparatus and method provide a way to continuously measure the positions of two or more cameras used in the measuring system, and to use such measurements to calibrate the system.
    Type: Grant
    Filed: March 14, 2003
    Date of Patent: October 25, 2005
    Assignee: Snap-On Incorporated
    Inventors: David A. Jackson, Michael J. Robb, Donald L. Walchuk
  • Patent number: 6941189
    Abstract: A positioner for use in a tooling apparatus, the positioner including a tool, at least one servo-motor for actuating said tool, a controller for controlling the servo-motor, nonvolatile memory in the controller, and a calibration stored in the nonvolatile memory, the calibration including compensation parameters for the build variance of the positioner.
    Type: Grant
    Filed: December 15, 2000
    Date of Patent: September 6, 2005
    Assignee: General Motors Corporation
    Inventors: Douglas Martin Linn, Gerald Charles Rieck, Charles Weldon Wampler, II, Kevin U. Carriere
  • Patent number: 6941530
    Abstract: A method of cross-mapping integrated circuit (“IC”) elements nets in a IC and/or directing a probe to points on an IC to achieve minimal interference from adjacent structures is disclosed. The method of provides a more streamlined approach than referencing points from a physical layout representation of the IC to the actual IC being tested. The improved correlation between the actual packaged IC and the layout of the IC is accomplished using artificial locator cells. Preferably, the artificial locator cells are generated from mathematical operations of the extracted version of the layout, and they further provide coordinate information for where minimal interference from adjacent structures may be accomplished. Artificial locator cells may be generated from a layout representing a hierarchical representation or alternately each element that is instantiated from a reference library may already have artificial locator cells included.
    Type: Grant
    Filed: March 24, 2003
    Date of Patent: September 6, 2005
    Assignee: Texas Instruments Incorporated
    Inventors: Hemant Joshi, David A. Thomas, John Bach, Rand B. Carawan
  • Patent number: 6931337
    Abstract: Electron beam lithography tool image quality evaluating and correcting including a test pattern with a repeated test pattern cell, an evaluation method and correction program product are disclosed. The test pattern cell includes a set of at least three elongated spaces with each elongated space having a different width than other elongated spaces in the set such that evaluation of a number of space widths in terms of tool image quality and calibration can be completed. The evaluation method implements the test pattern cell in a test pattern in at least thirteen sub-field test positions across an exposure field, which provides improved focus and astigmatism corrections for the lithography tool. The program product implements the use of corrections from the at least thirteen sub-field test positions to provide improved corrections for any selected sub-field position.
    Type: Grant
    Filed: June 24, 2003
    Date of Patent: August 16, 2005
    Assignee: International Business Machines Corporation
    Inventors: William A. Enichen, Christopher F. Robinson
  • Patent number: 6931339
    Abstract: A system and method indicate azimuth of a diver to a remote console. A compass sensor module on a headgear worn by the diver has a two-axis gimbal mechanism provided with a protective housing around ring and two orthogonal axis structures. A magnetic field sensor unit mounted on one axis structure provides magnetic field data signals representative of the azimuth faced by the diver. A processor section of the compass module connected to the sensor unit provides azimuth data signals from the magnetic field data signals. A data transmission module has a conductor extending from the compass module to an amplifier and cable for amplifying azimuth data signals and remotely transmitting them. An acoustic transducer in the data module can also transmit azimuth data signals as acoustic signals through water. The console connected to the cable and water receives and displays the remotely transmitted azimuth data signals.
    Type: Grant
    Filed: March 15, 2004
    Date of Patent: August 16, 2005
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: William D. Olstad, Dennis G. Gallagher
  • Patent number: 6922904
    Abstract: A method and a system is for evaluating the transmitted signals of a probe system, which has a probe element that is deflectable out of a rest position and which generates transmitted signals, which include a switch-on signal during a deflection of the probe element out of its rest position and which, together with interference signals, are transmitted to a receiving unit, in which the received signals made up of the transmitted signals and the interference signals, are compared to a reference signal. In this context, the reference signal is formed by interlinking information signals generated from the received signals, and the interference signals, and/or the received signals are differentiated by time, prior to the comparison with the reference signal.
    Type: Grant
    Filed: January 29, 2004
    Date of Patent: August 2, 2005
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Klaus Groell, Christian Eisenberger
  • Patent number: 6920406
    Abstract: A method of measuring the azimuth and resetting to zero azimuth automatically is disclosed. Multiple azimuths in longitudinal and latitudinal orientations are sampled by two orthogonal magnetic sensors installed in an azimuth meter, and then are output by corresponding first and second sine wave signals. These two sine wave signals are normalized by adjusting them to be of equal amplitude. The maximum and minimum values of the normalized sine wave signals are used to compute the average values of the respective normalized sine wave signals being of equal amplitude on the positive and negative sides. The resultant sine wave signals serve as the zero reference values for comparison with subsequently taken measuring signals to yield the actual azimuth. The numerical computation for the azimuth can be performed by a microprocessor with accuracy and high speed.
    Type: Grant
    Filed: January 12, 2004
    Date of Patent: July 19, 2005
    Assignee: Asia Optical Co., Inc.
    Inventors: Ai-Ling Lin, Kuo-Hua Yang
  • Patent number: 6909983
    Abstract: A method of calibrating a probe mounted on a machine in which the probe has a probe calibration matrix which relates the probe outputs in three orthogonal axes to the machine's X, Y and Z coordinate system. A datum ball mounted on the machine is bi-directionally scanned by the probe in one or more planes. For each plane, the mean direction of two approximate probe vectors in the plane is rotated about an axis orthogonal to that plane until the apparent material condition from the scan in each direction is the same. This process may be iterative. The mean values of the directions of the probe vectors for each plane are rotated, thus forming a corrected probe calibration matrix. The datum ball is preferably bi-directionally scanned in three orthogonal planes.
    Type: Grant
    Filed: March 13, 2002
    Date of Patent: June 21, 2005
    Assignee: Renishaw PLC
    Inventor: Alexander Tennant Sutherland
  • Patent number: 6909984
    Abstract: A system is provided for producing an integrated circuit using a stepper and a scanner in successive stages. Calibration data developed for the transfer of a wafer from the stepper to the scanner while maintaining the same orientation is transformed, and the transformed data is used to align a rotated wafer on the scanner.
    Type: Grant
    Filed: February 5, 2004
    Date of Patent: June 21, 2005
    Assignee: Micron Technology, Inc.
    Inventors: James W. Laursen, Craig A. Hickman
  • Patent number: 6901673
    Abstract: There is provided a tie-in device for correlating at least two different coordinate systems. The tie-in device comprises an outer surface having a predefined geometric shape, such as a generally spherical surface, located at a first predefined distance from a reference point of the tie-in device, such as the center of the generally spherical surface. The outer surface of the tie-in device is mappable to determine the location of the reference point in a first coordinate system. The tie-in device comprises at least one target located at a second predefined distance from the reference point. The target is locatable in a second coordinate system to determine a location of the reference point in a second coordinate system. The relative locations of the reference point are tied-in, advantageously by processing circuitry, to correlate the first and second coordinate systems.
    Type: Grant
    Filed: May 20, 2004
    Date of Patent: June 7, 2005
    Assignee: The Boeing Company
    Inventors: James M. Cobb, James A. DeLand, Timothy G. Nielsen
  • Patent number: 6898559
    Abstract: The automatic building mapping system comprises a tracker module that can be carried by a user and an optional command module which operate to automatically map the rooms of a building as a user traverses the rooms of the building. The tracker module includes a transducer system that determines the present distance from the user to each of the walls of the room, the location of openings in the walls as well as an inertial guidance system that precisely locates the user with respect to a known reference point. The data produced by the tracker module of the automatic building mapping system can be transmitted to a centrally located command module so that multiple units can simultaneously be tracked and a mapping of the building effected from different perspectives to thereby create an accurate composite layout map.
    Type: Grant
    Filed: December 8, 2000
    Date of Patent: May 24, 2005
    Assignee: Tracker R&D, LLC
    Inventor: Paul A. Saitta
  • Patent number: 6885969
    Abstract: A method locates a mobile node in a partially synchronized wireless network comprised of nodes with heterogeneous communication ranges. The time intervals it takes for messages to travel from stationary nodes at known location to a mobile node at an unknown location are measured and used to determine a set of possible coordinates of the mobile node. This time-based set of coordinates is in the form of a hyperbolic function. The received signal strengths of a message received from the mobile node is measured in two additional stationary nodes at known location. These RSS-based measurements provide two more sets of possible coordinates of the mobile node. The three sets are then intersected to estimate the location of the mobile node.
    Type: Grant
    Filed: August 26, 2003
    Date of Patent: April 26, 2005
    Assignee: Mitsubishi Electric Research Laboratories, Inc.
    Inventor: Zafer Sahinoglu
  • Patent number: 6876945
    Abstract: The Seamless Sensory System (3S), the invention, integrates state-of-the-art sensor technology with modern software engineering practices to create seamless positioning. The invention can include the incorporation of GPS/Inertial Navigation/IR and other technologies into a handheld/man wearable/mounted system that will not be compromised in hostile environments. The invention continues accurate navigation in the absence of GPS satellite signals. The invention utilizes a “continuous calibration” Kalman Filter methodology and motion sensor(s) to maintain “GPS-like” accuracy after GPS signals are no longer available. A proprietary technology called an Ultrasonic Doppler Velocity Measurement (UVM) Sensor is the invention's ‘key component’ to create “GPS like performance” under any GPS denied condition. Additional sensors are included to complete the picture of the local environment.
    Type: Grant
    Filed: March 25, 2003
    Date of Patent: April 5, 2005
    Inventor: Nicholas Jon Emord
  • Patent number: 6868360
    Abstract: A system and method indicate the direction faced by an operator. A waterproof housing has a mounting mechanism to engage a part of a headgear worn by an operator to position the housing in a portion of the operator's forward field of view. A two-axis gimbal mechanism is inside the waterproof housing and has a protective housing connected to the waterproof housing. The protective housing contains ring structure coupled to two orthogonal axis structures. A magnetic field sensor module is mounted on one of the axis structures and provides magnetic field data signals representative of the direction faced by the operator. An optical element has a wide field of view to transmit compass data images representative of the magnetic field data signals to the eyes of the operator.
    Type: Grant
    Filed: November 3, 2003
    Date of Patent: March 15, 2005
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: William D. Olstad, Dennis G. Gallagher
  • Patent number: 6868356
    Abstract: Accelerations of a probe or probe head due to vibrations of a machine during a measuring operation are measured using accelerometers placed in the probe or probe head. The acceleration signals are double integrated to determine the corresponding displacements of the probe or probe head and these are added to the readings of displacement of the machine taken from the machine scales using a data fusion algorithm to correct the scale readings for the vibration of the probe. Both linear and angular accelerations of the probe can be corrected in this way.
    Type: Grant
    Filed: July 4, 2001
    Date of Patent: March 15, 2005
    Assignee: Renishaw PLC
    Inventors: Kenneth Cheng-Hoe Nai, David Allan Wright
  • Patent number: 6865490
    Abstract: A method of separating and localizing sources of traveling waves, by obtaining linearly independent time-differentiated instantaneous observations of the sources, from spatial derivatives of the traveling wave acquired using a distributed sensor or a sensor array. The sources are blindly separated by direct application of (static) independent component analysis on the time-differentiated observations, yielding both the sources and their direction cosines relative to the sensor geometry. The method is suited for arrays of small aperture, with dimensions shorter than the coherence length of the waves. In one preferred embodiment, three sources are separated and localized from differential observations on four coplanar sensors positioned on the corners of a square.
    Type: Grant
    Filed: May 6, 2003
    Date of Patent: March 8, 2005
    Assignee: The Johns Hopkins University
    Inventors: Gert Cauwenberghs, Milutin Stanacevic, George Zweig
  • Patent number: 6865498
    Abstract: A method and system for calibrating a machine capable of automatically calibrating the axes of the machine by comparing an initial calibration state of a particular axis with a subsequent motion of the machine along the same axis. The machine adjusts the motion along such axis based on the angular displacement by modifying the reference data in the computer memory of the machine to accord with the subsequent motion along the axis.
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: March 8, 2005
    Assignee: Thermwood Corporation
    Inventor: Michael P. Hardesty
  • Patent number: 6862544
    Abstract: A device and method for measuring vehicle wheel alignment characteristics, and in particular measuring wheel camber and toe, uses a rotating vision sensor such as a laser sensor to map a portion of the vehicle tire and/or rim, allowing for the determination of wheel camber and toe without rotating the wheel. The sensor may be repositioned between the rear and front vehicle wheels. A separate sensor may be used for the left and the right vehicle wheels. The invention has particular utility for auditing of the alignment of vehicles in production lines. The devices and methods may also be used for more general imaging purposes.
    Type: Grant
    Filed: June 9, 2000
    Date of Patent: March 1, 2005
    Assignee: Merilab, Inc.
    Inventor: M. Stanley Merrill