Abstract: A method and circuit implement testing of a circuit path including a memory array and logic including Logic Built in Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. Testing of the circuit path includes initializing the memory array in the circuit path with an initialization pattern, switching to Logic Built in Self Test (LBIST) mode and providing a read only mode for the memory array, and running Logic Built in Self Test (LBIST) testing of the circuit path.

Abstract: The current invention provides a mechanism for detecting and recovering from glitches on data strobes. In one embodiment, data is captured from an interlace by a receiver using at least one data strobe that is provided by the transmitter along with the data. A write address counter that is clocked by the data strobe is used to count the active edges of the data strobe. A read address counter that is periodically synchronized with the write address counter, but that is clocked by an internal clock of the receiver, is used to count units of data being received from the interface. Periodically, the contents of the read and write counters are compared. If the contents are not the same, a glitch has occurred on the data strobe. The glitch is recoverable if it occurs on, or after, a last strobe edge of a data transfer.

Abstract: A verification scenario generation device including a first input unit which accepts input of a device list showing devices connected with a circuit to be verified, parameter setting information for the devices, and a test bench combination list corresponding to the devices, a test bench library which holds the test bench, and a test bench generation unit to generate a test bench for verification, a scenario template generation unit which generates a scenario template. The device further includes a data combination list generation unit which generates a combination list of data kinds, a verification item generation unit which generates verification items based on a combination list of the data kind and a combination list of the test bench input, and a verification scenario generation unit which generates a verification scenario based on the scenario template, and the verification items.

Abstract: A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.

Abstract: A method of evaluating a design under test (DUT) can include executing a testbench involving the DUT and, during execution of the testbench, estimating an amount of time needed to perform a first transaction with the device under test according to resolved variables. The method also can include setting a timer with the estimated amount of time needed to perform the first transaction and invoking the first transaction with the device under test. Responsive to expiration of the timer, an indication as to whether the first transaction completed execution can be provided.

Abstract: A chip testing device having a plurality of testing units is provided. Each testing unit comprises a selector, a flip-flop unit, a first buffer and a second buffer. The selector is controlled by a control signal and has a first input terminal, a feedback input terminal, and a first output terminal. The flip-flop unit has a second input terminal coupled to the first output terminal, a clock signal input terminal for receiving a reference clock signal, and a second output terminal outputting an output data. The first buffer is coupled to the flip-flop unit to convert the output data to a high voltage data, and outputs the high voltage data. The second buffer is coupled to the first buffer to convert high voltage data to low voltage data and transmit the low voltage data to the feedback input terminal.

Abstract: A method, system, and machine-readable medium for controlling access to data of a tape data storage medium are disclosed. In accordance with one embodiment, a method is provided which comprises conveying data access control metadata from a tape cartridge comprising a tape data storage medium to a host, receiving decrypted metadata from the host, comparing a checksum value determined utilizing the decrypted metadata with checksum data stored within the tape cartridge; and processing a request to access the tape data storage medium received from the host based upon a comparison of the checksum value and checksum data. In the described method embodiment, the data access control metadata comprises encrypted metadata corresponding to a data storage parameter, where data is stored within the tape data storage medium utilizing the data storage parameter and the decrypted metadata is generated by the host utilizing the encrypted metadata.

Abstract: Pattern controllable LFSRs or MISRs are disclosed that are able to mask indeterminate states while performing tests on DUT outputs. At appropriate times, the MISRs or the LFSRs will mask the data being input to the MISRs or the LFSRs so that indeterminate states are not received. This allows fast/complex ATE Rx memory to be replaced by slower and smaller MISR pattern memory. At the end of a test period, the LFSRs or MISRs generate signatures which are then compared to a set of possible valid signatures for non-deterministic data. A pass/fail result is produced. By masking indeterminate states, fewer valid signatures need to be stored. Masking of the MISRs or LFSRs may be based on the fact that indeterminate states and good data in a serial output data stream tend to occur in predictable patterns, or that good data may follow alignment characters. MISR or LFSR output signatures may also be employed to test individual pattern segments instead of the entire input test pattern.

Abstract: A memory device includes a main memory cell array and a redundant memory cell array configured to store a first parity code for data stored in the main memory cell array. The device further includes a parity generator configured to generate a second parity code responsive to reading of the stored data from the main memory cell array, and a comparator configured to compare the first and second parity codes. In some embodiments, the parity generator configured to generate the second parity code during a copyback operation.

Abstract: Provided is test apparatus with higher testing efficiency, including: plurality of pattern generating sections generating test pattern to supply to devices under test; group control section controlling group of pattern generating sections out of the pattern generating sections, and generating control signal upon receiving signal output from any pattern generating section controlled; range information storage section storing range information indicating range of pattern generating sections, out of the pattern generating sections, that serve to test one independent device under test; and comprehensive control section receiving the control signal from the group control section, identifying any pattern generating section that supplies the test pattern to the same device under test as that to which the pattern generating section having output the signal supplies the test pattern based on the range information, and in response to the control signal, controlling any other group control section that controls the iden

Abstract: Clock signal control circuitry is disclosed along with a method for switching a clock between modes and a computer program product. The clock signal control circuitry is for receiving a clock signal from a clock signal generator and for outputting said clock signal to synchronous circuitry that is to be clocked by said clock signal.

Abstract: A system and method for loopback self testing. A system includes a host device and an endpoint device. The host device transmits unencoded test symbols. The endpoint device loops back the unencoded test symbols to the host device. The host device drives at least some bits of each unencoded test symbol onto host device data signals and drives at least some bits of each unencoded test symbol onto host device control signals.

Abstract: A tester for testing a semiconductor device is disclosed. The tester for testing the semiconductor device employs a data selector for converting a logical test pattern data transmitted from a pattern generator into a physical test pattern data and an expected data based on the logical test pattern data, thereby generating various timings based on a time delay instead of using a plurality of clocks to improve a test efficiency and reduce a manufacturing cost.

Abstract: A method of inspecting an electronic circuit that includes a first integrated circuit and a second integrated circuit formed on a circuit board. The first integrated circuit has a first power source, and an input circuit that has a test signal output section and the second integrated circuit has a second power source and an output circuit that has a signal input section. The method includes steps of: turning on the first and second power sources at prescribed voltage levels; changing voltage level of the first power source; applying a test signal to the signal input section of the second integrated circuit; detecting an output signal of the signal output section of the first integrated circuit; and examining whether there is a sufficient margin in the electronic circuit by comparing the test signal and the output signal.

Abstract: A boundary scan technique to generate toggling waveform such as a square wave signal to perform structural testing is disclosed. An instr_extesttoggle command is provided that enables IEEE 1149.1 boundary scan cell to selectively generate the toggling signal on the pre-specified output pads of the integrated circuit. The frequency of the toggling signal may be controlled by the JTAG clock signal and the frequency of the toggling signal may be independent of the length of the boundary scan chain. Such an approach circumvents provisioning test points on the interconnects of a printed circuit board.

Abstract: A method for monitoring a system, having a control unit defined as a master and a number of control units defined as slaves, with the aid of a monitoring module, in which in reply to an inquiry from the master and the slaves a response is given in each instance and a joint response provided on the basis of these responses is checked by the monitoring module.

Abstract: A test circuit for testing a command signal at a package level in a semiconductor device includes: a logic level determining unit for determining logic levels of a plurality of command flag signals in response to a plurality of internal command signals in a test mode; a storage unit for storing the plurality of command flag signals in response to a store control signal and outputting the plurality of command flag signals in series in response to an output control signal; and an output unit for driving an output signal of the storage unit to a data pad.

Abstract: An intertwined test specification (ITTS) is used for controlling Automated Test Equipment (ATE) to apply a sequence of stimulus signals to a device under test (DUT) during a stimulus run and to validate returned response signals during a validation run. The ITTS has response validation scripts intertwined with stimulus invoking scripts where the response validation scripts are conditionally executed during the validation run but not during the stimulus invoking run. Response signals are logically associated with unique stimulus identification codes so that appropriate response signals can be matched with corresponding validation scripts even if the response signals are returned out-of-order to the ATE or to a response logging unit interposed between the ATE and the DUT.

Abstract: A semiconductor device that includes a module under test that is integrated with the semiconductor device, that receives an input signal from a test module, and that provides an output signal to at least one output terminal based on the input signal. An error detecting module is integrated with the semiconductor device, samples values of the output signal, and outputs the sampled values to the test module.

Abstract: A method is provided for certifying safety logic code in a manufacturing automation system. A plurality of safety related test scenarios is provided for testing the safety logic code in the manufacturing automation system. A processing unit is configured for communication with the logic controller. The processing unit generates logic input signals in response to the plurality of safety related test scenarios and provides the logic input signals to the logic controller. Execution of the plurality of safety related test scenarios via the safety logic code is triggered in response to the processing unit providing the logic input signals to the logic controller. Response output signals are generated by the logic controller in response to the safety related test scenarios being executed by the safety logic code. Compliancy of the safety logic code is determined by evaluating response output signals and associated logic input signals to a predetermined standard.

Abstract: Methods and structures for performing field flawscan to reduce manufacturing costs of a dynamic mapped storage device. In a dynamic mapped storage device in which all user supplied logical blocks are dynamically mapped by the storage device controller to physical disk blocks, features and aspects hereof permit flawscan testing of a storage device to be completed substantially concurrently with processing write requests for its intended application. A fraction of the storage device may be certified by an initial flawscan performed during manufacturing testing. Statistical sampling sufficient to assure a high probability of achieving specified capacity may be performed to reduce manufacturing time and costs in testing. Final flawscan of the remainder of the storage locations may be performed substantially concurrently with processing of write requests after the device is installed for its intended application.

Abstract: A method according to one embodiment may include communicating, by a far end device with a near end device, using a Serial ATA (SATA) communications protocol; receiving, by the far end device, a SATA signal sequence having two bits, the state of which define at least one loopback mode; defining, by the far end device, a reserved and/or error state if both of the bits are set; and processing, by the far end device, the two bits together to determine if the two bits are in a state that defines at least one loopback mode or if the two bits are set. Of course, many alternatives, variations, and modifications are possible without departing from this embodiment.

Abstract: An interface test can be performed by, for example, only a self apparatus when interface operation specifications are different between the self apparatus and an original connection partner apparatus. An LSI has a plurality of interfaces (IFs) for transmission/reception of data with an external device, and the LSI includes an emulation control unit for allowing one of the two of the plurality of IFs to perform an operation of emulating an IF of a connection partner device having operation specifications different from those of the LSI, when two IFs are connected to each other via a transmission line.

Abstract: A method for performing a test of a high-speed integrated circuit with at least one functional unit and built-in self-test features by a low-speed test system. The method comprises the steps of transforming an external clock signal from the test system into a faster internal clock signal within the integrated circuit, generating a test pattern according to a predetermined scheme, and applying the test pattern to the functional unit, comparing a response from the functional unit with an expected test pattern. If the response differs from the expected test pattern, then an internal failure signal is generated and the internal failure signal is extended to a length, which may be recognized by the test system. Further the present invention relates to a high-speed integrated circuit with at least one functional unit and built-in self-test features.

Abstract: A method for executing a program verify operation in a non-volatile memory. A data register having master and slave latching circuits is used for concurrently storing two different words of data. In a program operation, the master latch stores program data which is used for programming selected memory cells. In a program verify operation, the data programmed to the memory cells are read out and stored in the slave latches. In each data register stage, the logic states of both latches are compared to each other, and a status signal corresponding to a program pass condition is generated if opposite logic states are stored in both latches. The master latch in each stage is inverted if programming was successful, in order to prevent re-programming of that bit of data.

Abstract: A target interface system for interfacing selected components of a communication system and methods for manufacturing and using same. The target interface system includes target interface logic that is distributed among a plurality of reconfigurable logic devices. Being coupled via a serial link, the reconfigurable logic devices each have an input connection for receiving incoming data packets and an output connection for providing outgoing data packets. The serial link couples the input and output connections of successive reconfigurable logic devices to form a dataring structure for distributing the data packets among the reconfigurable logic devices. Thereby, the dataring structure maintains data synchronization among the reconfigurable logic devices such that the distribution of the target interface logic among the reconfigurable logic devices is transparent to software.

Abstract: An integrated circuit apparatus including an improved test circuit and a method of testing the integrated circuit apparatus are provided. The integrated circuit apparatus determines pass or fail of the integrated circuit apparatus itself by comparing internal DQ data output by a core logic circuit with test patterns set by a mode register set (MRS) code or test patterns directly input from an external source.

Abstract: The apparatus for analyzing a delay defect of the present invention obtains the RC of the maximal incidence among region codes (RCs) to which check circuits detecting errors caused with gradual increase in the frequency of an operational clock pulse fed to an integrated circuit belongs. The apparatus obtains information on latch in which an error is caused with the RC of the maximal incidence, with reference to a mapping table that describes the mapping relationship between an RC and a latch. The apparatus extracts a circuit portion in which an error can be captured with the region code of the maximal incidence by exhaustively tracing back circuit portions connected with each obtained latch, from the latch to the latch described in the mapping table. The apparatus gives delay defects to the input and the output pin of each of logic elements included in the extracted circuit portion, generates test patterns for detecting the given delay defects, and performs delay tests.

Abstract: A method for enabling bitwise or bit slice constraints to be provided as part of the test generation process, by providing a language structure which enables these constraints to be expressed in a test generation language such as e code for example. The language structure for such bitwise constraints is then handled in a more flexible manner, such that the test generation process does not attempt to rigidly “solve” the expression containing the constraint as a function. Therefore, the propagation of constraints in such a structure do not necessarily need to be propagated from left to right, but instead are generated in a multi-directional manner. The language structure is particularly suitable for such operators as “[: ]”, “|”, “&”, “^”, “˜”, “>>” and “<<”.

Abstract: A method for updating the value of a time-out period in a data unit sender. The updating includes deriving an intermediate value from the n most recently measured values of a response time, augmenting the intermediate value, reducing the current value of the time-out period, determining the maximum from among the augmented intermediate value and the reduced current value of the time-out period, and setting a new value of the time-out period to set a maximum value.

Abstract: To copy protect an optical disc, such as a DVD, program chains additional to the main program chain are provided. These program chains may lead to the genuine data but in an incomplete or incorrect order or to false data. Sufficient additional program chains are provided to make it difficult to identify the main program chain amongst all of the program chains provided on the disc. The structure of the further program chains ape that of the main program, again to hide the main program chain. The navigation path which leads to the main program chain, and hence to the content on the DVD, is dynamically generated and at least some of the information required to generate the navigational path arises by setting parameters associated with a player or with a user. Thus a search of all of the navigation information on the disc will fail to reveal the navigation path to the content.

Abstract: Disclosed herein is a semiconductor test apparatus for simultaneously testing a plurality of semiconductor devices. The semiconductor test apparatus includes a plurality of pattern generation boards, a DUT board, a backplane board, and a power supply unit.

Abstract: The invention relates to a detection of a simultaneous occurrence of an event of a predetermined kind at a plurality of electronic devices. At least two devices detect the event and record at their end the time elapsing after this detection. Then, a communication channel is established between the devices. Once the communication channel has been established, an indication of the recorded elapsed times can be exchanged. At least one of the devices compares a recorded elapsed time with an indicated elapsed time received from another device. If both elapsed times are similar to each other, it can be assumed that the event occurred simultaneously at both devices. The invention relates equally to corresponding devices, to a corresponding data transfer system and to corresponding software program products.

Abstract: A memory device capable of detecting its failure, the memory device includes a data input section for receiving data applied from an external part of the memory device; a latch section for receiving and storing therein the data which have passed through the data input section; memory cell arrays for storing therein the data which have passed through the data input section; and a data compressor for determining whether or not the data stored in the latch section and the data stored in the memory cell arrays are identical to each other.

Abstract: An integrated circuit includes a first deserializer that deserializes serial data containing at least one of test instructions and/or data in a first format. A monitor module communicates with the first deserializer and interprets the test instructions and data using the first format. A frame capture module receives test results according to the interpreted test instructions and data. A first control module communicates with the frame capture module and generates first format control data. The frame capture module packages the test results and the first format control data into frames. A first serializer serializes the frames.

Abstract: A calibrating method for adjusting related parameters when a first chip and a second chip switch signals is disclosed. The calibrating method includes: utilizing the first chip to output a test signal through using a first driving force in order to represent a test value; utilizing the second chip to receive the test signal and utilizing the second chip to read the test signal to determine a value; and performing a comparison step for comparing the value with the test value to detect whether said value complies with the test value.

Abstract: An input circuit of a semiconductor memory device includes a data input circuit and a data pattern setting circuit. The data input circuit receives first data, and generates second data by buffering the first data, sampling buffered first data responsive to a write data strobe (WDQS) signal, and parallelizing sampled data. The data pattern setting circuit sets a pattern of the second data responsive to a test mode signal and a data pattern select signal to generate third data. Accordingly, the semiconductor memory device including the input circuit may generate data of various patterns in a test mode, and may perform a high-speed test using a low-speed tester.

Abstract: A method of diagnosing semiconductor device functional testing failures by combining deterministic and functional testing to create a new test pattern based on functional failure by determining the location of the type of error in the failing circuit. This is accomplished by identifying the failing vector during the functional test, observing the states of the failed device by unloading the values of the latches from the LSSD scan chain before the failing vector, generating a LOAD from the unloaded states of the latches, applying the generated LOAD as the first event of a newly created independent LSSD deterministic pattern, applying the primary inputs and Clocks that produced the failure to a correctly operating device, unloading the output of the correctly operating device to generate a deterministic LSSD pattern; and applying the generated deterministic LSSD pattern to the failing device to diagnose the failure using existing LSSD deterministic tools.

Abstract: There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable delay circuits that delays a reference clock, a plurality of timing clock generating sections that outputs a timing clock having a phase obtained by shifting a phase of the delayed reference clock by a designated phase shift amount, a timing comparator that acquires a data signal in accordance with the timing clock, a plurality of second variable delay circuits that delays the timing clock, a plurality of phase comparators that outputs a phase shift amount according to a phase difference between a clock signal and the timing clock, a first adjusting section that adjusts a delay amount of the first variable delay circuit so that the timing comparator acquires a data signal based on the timing clock, and a second adjusting section that adjusts a delay amount of the second variable delay circuit so that the timing compara

Abstract: In one embodiment of the invention, a write cache line with a unique bit pattern is written into memory in a memory channel at a starting address. An attempt is made to enable micro-tile memory accesses into each memory integrated circuit on memory modules in the memory channel. A read cache line is read from memory in the memory channel at the starting address. The bit patterns of the read cache line and the write cache line are compared. If in the comparison it is determined that the bit pattern of the read cache line differs from the write cache line, then micro-tile memory access is enabled into each memory integrated circuit on memory modules in the memory channel. If in the comparison it is determined that the bit pattern of the read cache line is the same as the bit pattern of the write cache line, then micro-tile memory access is not supported and cannot be enabled in each memory integrated circuit on memory modules in the memory channel.

Abstract: A circuit arrangement comprising a logic circuit to be tested and a test circuit is provided. The logic circuit is designed to provide output data from input data, said output data being generated from the input data by logic-circuit-internal combinations, such that the output data are in a predetermined relationship with the input data. The logic circuit is designed to detect whether the relationship is fulfilled and to provide an error signal if the relationship is not fulfilled. The test circuit is designed to alter logic-circuit-internal combinations. The test circuit is designed to detect the error signal, and is furthermore designed to output an alarm signal if the error signal is not detected upon alteration of the logic-circuit-internal combinations.

Abstract: The invention relates to a method for monitoring the execution of a program in a microcomputer of an electronic device, especially a sensor circuit for motor vehicles. According to the inventive method, the program processes input data and produces output data, copies a program in addition to the program which is executed, said copy being stored in an address area in the micro-computer other than the program, using the input data provided for the program. The output data of the copy is compared to the data of the program and an error message is produced if the programs are not consistent.

Abstract: An information input unit inputs functional configuration information representing a function of a device to be validated. A condition input unit inputs conditions concerning input/output sequence that is given to the device. A function generation unit generates a validation item function that fulfills all of the conditions based on the functional configuration information. An extraction unit extracts a combination of configuration elements that constitute the functional configuration information as a validation item based on the validation item function.

Abstract: A method for testing an internal bus of a random access memory (“RAM”) device, the RAM device having an internal cache coupled to a memory array by the internal bus, the method comprising: writing a value to an address in the RAM device, the value being stored in the internal cache, the value corresponding to at least one line of an external bus; writing a number of additional values to addresses in the RAM device other than the address to push the value from the internal cache into the memory array; reading a value from the address; and, determining whether the internal bus is faulty by comparing the value written to the value read.

Abstract: A method to reduce logic built in self test manufacturing test time of integrated circuits, comprising: loading a plurality of test seeds in bulk into a locally accessible on-chip memory array locally disposed on an integrated circuit, each of the plurality of test seeds is associated with a set of LBIST control information; sending the plurality of test seeds from the locally accessible on-chip memory array repetitively into a pseudo-random pattern generator one at a time during an LBIST operation being under the control from the set of LBIST control information; generating random bit streams serially into a plurality of parallel shift registers of the integrated circuit through the use of the plurality of test seeds; and performing a logic built-in self test on a plurality of logic blocks in the integrated circuit to detect defects within the integrated circuit.

Abstract: A data inversion register technique for integrated circuit memory testing in which data input signals are selectively inverted in a predetermined pattern to maximize the probability of identifying failures during testing. In accordance with the technique of the present invention, on predetermined input/outputs (I/Os,) data inputs may be inverted to create a desired test pattern (such as data stripes) which are “worst case” for I/O circuitry or column stripes which are “worst case” for memory arrays. A circuit in accordance with the technique of the present invention then matches the pattern for the data out path, inverting the appropriate data outputs to obtain the expected tester data. In this way, the test mode is transparent to any memory tester.

Abstract: An extracting unit extracts unprocessed capturing destination in a circuit. A tracing unit traces an output branch point from a capturing destination and a determining unit determines an estimated failure site and a non-failure site in the circuit. A detecting unit narrows down an estimated failure site using a fail address. It is determined whether an identifying unit has identified a failure site. If the failure site has not been identified, a delay failure simulation is performed and a comparing unit compares the comparison result of the tester measurement and the result in the delay failure simulation to determine consistency between the results. The identifying unit identifies the failure site based on the consistency.

Abstract: A data receiver circuit in a receiving chip provides the capability to characterize an interface, which includes one or more inter-chip communication lines, between a transmitting chip and the receiving chip by transmitting the data across a primary data path and a secondary data path, latching the data in the secondary data path using a clock signal that is skewed relative to a clock signal used to latch the primary data path, comparing the data latched from the primary and secondary data paths, and recording errors. Because the primary data path is not impacted by the test cycle, the test cycle may be run while data associated with applications running on the system are transmitted across the inter-chip communication lines.

Abstract: A circuit verifying method is provided for a logic circuit of a first sequential circuit which outputs a first data based on an input data in synchronization with a first clock signal, and a second sequential circuit which outputs a second data based on the first data in synchronization with a second clock signal with a period longer than that of a first clock signal. The circuit verifying method includes detecting a change of the input data in synchronization with the first clock signal; outputting a data indicating a meta stable state during a period longer than one period of the first clock signal based on the change of the input data as the first data; storing the changed input data in a storage unit based on the change of the input data; and outputting the changed input data which has been stored in the storage unit as the first data after stop the output of the data indicating the meta stable state.

Abstract: A method, system and apparatus for detecting soft errors in non-dataflow circuits. In a preferred embodiment, input is received at a latch system. The latch system consists of two pairs of latches. The second pair of latches is parallel to the first pair of latches. Both pairs of latches capture the input. However, the second pair of latches captures the input later in time relative to the first pair of latches latch. The captured input is then transferred from the first latch in each pair of latches to the second latch in each pair of latches. A comparison is made of the input in the two second latches. If the input captured in the two second latches is not the same, then a message is sent to a recovery unit.