Abstract: A detection unit (231) detects, based on synthesis result data obtained by logic synthesis on design data of a target circuit, a predicted place where a glitch is predicted to occur in the target circuit. An insertion unit (232) inserts a glitch removal circuit in an output side of the predicted place by making a change to at least one of the synthesis result data and the design data.

Abstract: Various examples are provided related to automated chip design, such as a pareto-optimization framework for automated network-on-chip design. In one example, a method for network-on-chip (NoC) design includes determining network performance for a defined NoC configuration comprising a plurality of n routers interconnected through a plurality of intermediate links; comparing the network performance of the defined NoC configuration to at least one performance objective; and determining, in response to the comparison, a revised NoC configuration based upon iterative optimization of the at least one performance objective through adjustment of link allocation between the plurality of n routers. In another example, a method comprises determining a revised NoC configuration based upon iterative optimization of at least one performance objective through adjustment of a first number of routers to obtain a second number of routers and through adjustment of link allocation between the second number of routers.

Abstract: The present disclosure relates to a computer-implemented method for electronic design. Embodiments may include receiving, using at least one processor, an electronic design schematic and optionally an electronic design layout. Embodiments may further include analyzing the electronic design schematic to determine if one or more required features of a particular circuit structure are present. If the one or more required features are present, embodiments may include analyzing, using a machine learning model, the electronic design schematic to determine if one or more optional features of the particular circuit structure are present.

Abstract: A system and method for placing Josephson junction splitters on a superconducting circuit layout receives a specification of locations to be connected by a number of Josephson transmission lines. The system determines, based on the specification, a topology specifying connections between the locations, the topology including a plurality of 1-to-2 Josephson junction splitter nodes. The system determines splitter node locations based at least on ranges determined from distances between adjacent range endpoints of a previous level of the topology, and the system places each of the 1-to-2 Josephson junction splitter nodes at the determined splitter node locations.

Abstract: A method for providing an integrated circuit design is disclosed. The method includes receiving and synthesizing a behavioral description of an integrated circuit design. The method includes generating, based on the synthesized behavioral description, a layout by placing and routing a plurality of transistor-based cells. The method includes selectively accessing a cell library that includes a plurality of non-transistor-based cells, each of the plurality of non-transistor-based cells associated with a respective delay value. The method includes updating the layout by inserting one or more of the plurality of non-transistor-based cells.

Abstract: Metrology methods and targets are provided for reducing or eliminating a difference between a device pattern position and a target pattern position while maintaining target printability, process compatibility and optical contrast—in both imaging and scatterometry metrology. Pattern placement discrepancies may be reduced by using sub-resolved assist features in the mask design which have a same periodicity (fine pitch) as the periodic structure and/or by calibrating the measurement results using PPE (pattern placement error) correction factors derived by applying learning procedures to specific calibration terms, in measurements and/or simulations. Metrology targets are disclosed with multiple periodic structures at the same layer (in addition to regular target structures), e.g., in one or two layers, which are used to calibrate and remove PPE, especially when related to asymmetric effects such as scanner aberrations, off-axis illumination and other error sources.

Abstract: A system and method for providing timing and placement co-optimization for engineering change order (ECO) cells is described. According to one embodiment, an ECO for a current design of an integrated circuit is accessed. The ECO includes inserting an ECO cell among placed and routed current cells of the current design. A target region in the current design is identified for placement of the ECO cell, but the target region has insufficient open space to place the ECO cell. At least one current cell will have to be moved in order to place the ECO cell in the target region. Timing slacks for current cells in a neighborhood of the target region are determined. Based on the timing slacks of the current cells, at least one of the current cells is moved to a different location to create sufficient open space to place the ECO cell within the target region.

Abstract: A power supply is disclosed for an industrial control system or any system including a distributed power supply network. In embodiments, the power supply comprises: a battery module including a battery cell and a battery monitor configured to monitor the battery cell; and a self-hosted server operatively coupled with the battery module, the self-hosted server being configured to receive diagnostic information from the battery monitor and provide network access to the diagnostic information. In implementations, the diagnostics stored by the self-hosted server can be broadcast to or remotely accessed by enterprise control/monitoring systems, application control/monitoring systems, or other remote systems via a secured network (e.g., secured access cloud computing environment).

Abstract: An optimized reconfiguration algorithm based on dynamic voltage and frequency scaling (DVFS) is provided, which mainly has the following contributions. The optimized reconfiguration algorithm based on DVFS proposes a DVFS-based reconfiguration method, which schedules user tasks according to a degree of parallelism (DOP) of the user tasks so as to reconfigure more parallel user tasks, thereby achieving higher reliability. The optimized reconfiguration algorithm based on DVFS proposes a K-means-based heuristic approximation algorithm, which minimizes the delay of the DVFS-based reconfiguration scheduling algorithm. The optimized reconfiguration algorithm based on DVFS proposes a K-means-based method, which reduces memory overhead caused by DVFS-based reconfiguration scheduling. The optimized reconfiguration algorithm based on DVFS improves the reliability of a field programmable gate array (FPGA) system and minimizes the area overhead of a hardware circuit.

Abstract: Methods and systems for verifying a hardware design for a component that evaluates a main algebraic expression comprising at least two variables wherein the main algebraic expression is representable as a lossless combination of a plurality of sub-algebraic expressions, and one or more of the at least two variables can be constrained to cause an instantiation of the hardware design to evaluate each of the sub-algebraic expressions.

Abstract: A system and method for performing operating state analysis of an integrated circuit (IC) design is disclosed. The method includes simulating a switching operation from a first operating state to a second operating state for one or more cells of the IC design using a plurality of vectors corresponding to one or more user-specified constraints. The method include generating a time-based waveform for each cell of the one or more cells changing an operating state from the first operating state to the second operating state, and based on the generated time-based waveform, identifying one or more operating state changes corresponding to the operating state analysis and associated timing window and cell information. The method includes verifying the one or more operating state changes by the each cell of the one or more cells of the IC design meet the one or more user-specified constraints for generating an analysis report.

Abstract: Formal verification methods are used to solve a valid model of a design-under-test (DUT) to enumerate valid coverage points based on an architectural specification of the DUT. A formal solver can be queried to solve for valid solutions by crossing one or more fields of a variable. After each valid solve, values of the variable fields can be recorded and a count for number of valid solutions can be incremented. A new rule can be added to the solving process after each valid solve to invalidate the recorded values of the variable fields for subsequent solves. The count for the number of valid solutions can provide a running total of the valid solutions found for the query. Results of the query can be processed to convert the recorded values to provide the enumerated coverage points. The enumerated coverage points can be converted to test cases for running simulations on the DUT.

Abstract: Provided is a method of controlling a battery pack, and a battery pack controlled by the method. A battery pack includes a plurality of slave battery modules, each of the slave battery modules including a battery that includes at least one battery cell and a slave controller that is configured to control charge and discharge of the battery, a master battery module including a master controller that is configured to control the slave controller, and a communication cable having formed thereon a first port to which the master controller is connected and a plurality of second ports to which the slave controller is connected. The first port includes an identification terminal configured to output an identification signal which is an electrical signal corresponding to the number of the second ports. A method of controlling the battery pack is provided.

Abstract: An implementation-quality synthesis process begins with a logical design of an integrated circuit and, through a series of steps, generates a fully synthesized physical design of the integrated circuit. One of the steps is clock synthesis, which generates the clock network for the integrated circuit. In certain embodiments, a method includes the following steps. A reduced clock synthesis process is applied, rather than the implementation-quality clock synthesis process. This generates a clock network for the logical design, which will be referred to as a proxy clock network because it is used as a proxy to estimate power consumption of the fully synthesized clock network. Because the reduced clock synthesis process runs much faster than the implementation-quality clock synthesis process, the front end designer may use these power estimates in the front end design process, including to explore different design variations in the logical design.

Abstract: Disclosed is an electronic device. The electronic device may include a plurality of interfaces each of which is connected to one peripheral electronic device in a wired manner to deliver power to the connected peripheral electronic device, a power supply circuit connected to the plurality of interfaces, and a control circuit including a plurality of pins each connected to one interface to allow the power supply circuit to supply power to the plurality of interfaces. In addition, various embodiments understood from the disclosure are possible.

Abstract: The present disclosure relates to a system and method for assertion-based formal verification in an electronic design environment. Embodiments may include executing, using a processor, an assertion-based formal verification proof process on a model of an electronic design and analyzing a first property associated with the model. Embodiments may further include generating at least one trace of the first property and determining a mapping function associated with the first property. Embodiments may also include storing the at least one trace and the mapping function. Embodiments may further include determining that a second property associated with the model shares a cone of influence with the first property and generating a new trace based upon, at least in part, the mapping function.

Abstract: A power supply system includes a plurality of sweep modules, a defect detecting unit, and a control unit. Each sweep module includes a battery module and a power circuit module. The defect detecting unit detects a defect for each sweep module. The number of sweep modules is greater S (S?2) than a minimum number of sweep modules required for operation. When the number of defective sweep modules in which a defect has been detected is equal to or less than F (2?F?S), the control unit is configured to disconnect the defective sweep modules from a main line and to continuously execute sweep control.

Abstract: A system having design tools and methods for using the same in designing an integrated circuit (IC) are described.

Abstract: Disclosed are embodiments to provide a multi-battery energy storage device. One embodiment comprises a first battery and a second battery, with a first circuit branch coupling a positive side of the first battery to a positive side of the second battery, a second circuit branch coupling a positive side of the first battery to a negative side of the second battery, a third circuit branch coupling the negative side of the first battery to the negative side of the second battery, and multiple switchable devices configured to control flow of current through corresponding branches. Other embodiments comprise other configurations and operations.

Abstract: Systems and methods related to learning-based analyzers (both supervised and unsupervised) for mitigating latch-up in integrated circuits are provided. An example method includes obtaining latch-up data concerning at least one integrated circuit configured to operate under a range of temperature conditions, where the at least one integrated circuit comprises a core portion including at least a plurality of devices each having one or more structural features formed using a lithographic process, and an input/output portion. The method further includes training the learning-based system based on training data derived from the latch-up data and a first layout rule concerning a first spacing between the core portion and the input/output portion. The method further includes using the learning-based system generating a second layout rule concerning the first spacing between the core portion and the input/output portion, where the second layout rule is different from the first layout rule.