Fault Detecting In Electric Circuits And Of Electric Components Patents (Class 324/500)
  • Patent number: 8981784
    Abstract: Disclosed are a method of manufacturing a composite bushing and a diagnostic system for the partial discharge of the composite bushing that may provide a thin-film ultra high frequency (UHF) sensor to a composite bushing, thereby measuring a partial discharge of a composite bushing and preventing a safety accident of the composite bushing that may occur due to the partial discharge.
    Type: Grant
    Filed: December 24, 2009
    Date of Patent: March 17, 2015
    Assignee: Hyosung Corporation
    Inventors: Young Soo Chung, Dong Woen Lee, Jung Bae Kim
  • Patent number: 8981785
    Abstract: A method and an apparatus for detecting an earth fault on a three-phase electric line are provided. The apparatus includes means for determining a neutral admittance on the basis of a residual current and a residual voltage, means for comparing the determined neutral admittance to a predetermined operation characteristic to detect an earth fault on the three-phase electric line, and means for determining one or more harmonic components of the residual current and one or more harmonic components of the residual voltage. The harmonic components have frequencies n*fn such that n?2 and fn is a fundamental frequency. The means for determining a neutral admittance are configured to use at least one of the determined one or more harmonic components of the residual current and at least one of the determined one or more harmonic components of the residual voltage for determining the neutral admittance.
    Type: Grant
    Filed: February 10, 2012
    Date of Patent: March 17, 2015
    Assignee: ABB Technology AG
    Inventors: Ari Wahlroos, Janne Altonen
  • Patent number: 8981787
    Abstract: A method is provided for detecting a state of a connection between an electrically driven motor vehicle (1) and a corresponding charging station. The motor vehicle (1) has a control pilot (CP) function with a vehicle-side control pilot (CP) line (3). The method includes using a power line communication (PLC) chip (2) of the motor vehicle (1) to measure the length of a control pilot line between the motor vehicle and the charging station.
    Type: Grant
    Filed: December 10, 2012
    Date of Patent: March 17, 2015
    Assignee: Dr. Ing. h.c.F. Porsche Aktiengesellschaft
    Inventors: Michael Scheu, Daniel Spesser
  • Patent number: 8970238
    Abstract: A probe module for testing an electronic device comprises at least two contacts, each contact including a first end portion extending in a first direction along a first line, a second end portion extending linearly in a second direction opposite from the first direction and along a second line, and a third curved portion extending between the first end portion and the second end portion. The first line is spaced apart from and in parallel with the second line, and the at least two contacts are spaced apart from each other in a direction perpendicular to the first line and the second line. Methods for making such a probe module are also taught.
    Type: Grant
    Filed: June 17, 2011
    Date of Patent: March 3, 2015
    Assignee: Electro Scientific Industries, Inc.
    Inventor: Douglas J. Garcia
  • Patent number: 8963555
    Abstract: A sensor includes a sensor head including an acoustic detector configured to receive light from a first light source and to reflect the light upon incidence of acoustic waves. The sensor also includes at least one optical fiber and at least one fluorescent material within at least one of the sensor head and the at least one optical fiber. The at least one fluorescent material is configured to receive light from a second light source external to the sensor and emit visible light in response to the light received from the second light source.
    Type: Grant
    Filed: May 13, 2011
    Date of Patent: February 24, 2015
    Assignee: General Electric Company
    Inventors: Juntao Wu, Glenn Alan Forman, Michael Shane Pilon, Zhihong Roy Mao, Chun Zhan, Maxine Marie Gibeau, Lubomir Hristov Sevov
  • Patent number: 8947096
    Abstract: A new portable, self-contained device for testing the full cycle of trailer light modes without additional manual actuation by the user and for identifying where and what type of specific error occurred, if any are detected. The inventive device generally comprises a compact portable housing with a fixedly attached handle and a removable housing top. Within the compact portable housing is a self-contained, rechargeable 12 volt power source to power all functionality over a sustained period of time. Also within the compact portable housing is a light mode control means that allows the device to cycle through multiple light modes for testing, and an error detection analysis means that indicates where and what type of fault is detected.
    Type: Grant
    Filed: April 12, 2010
    Date of Patent: February 3, 2015
    Inventor: Paul Wolf
  • Patent number: 8922220
    Abstract: A short detection circuit includes a voltage divider circuit, for generating, according to a bottom voltage of one or more light-emitting diode strings, a divided voltage less than the bottom voltage. Additionally, the short detection circuit includes a voltage clamp circuit, coupled to the voltage divider circuit, for clamping the divided voltage, and a comparator, coupled to the voltage divider circuit, for comparing the divided voltage and a reference voltage, to decide whether a short circuit occurs in the one or more light-emitting diode strings according to a result of the comparison.
    Type: Grant
    Filed: January 21, 2011
    Date of Patent: December 30, 2014
    Assignee: NOVATEK Microelectronics Corp.
    Inventors: Sih-Ting Wang, Chung-Wen Wu, Chien-Cheng Tu, Chia-Chun Liu
  • Patent number: 8922224
    Abstract: An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog.
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: December 30, 2014
    Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
    Inventors: Ronald L. Billau, Roger J. Gravrok, Brian G. Holthaus, Darryl Solie
  • Patent number: 8903100
    Abstract: A loudspeaker control apparatus of the present invention includes: an operation reception section that receives a user operation; a mode selection section that selects between two operation modes, based on the user operation, either a normal mode in which operations of a plurality of loudspeakers and lights are controlled independently or an inspection mode in which each of the plurality of loudspeakers is inspected to see whether it is operating normally; and a control section that controls the operations of the plurality of loudspeakers and lights based on the operation mode, and the control section, in the inspection mode, sequentially causes the plurality of loudspeakers to output an inspection tone and sequentially causes lights which correspond to the loudspeakers from which the inspection tone is being outputted to be turned on or to blink.
    Type: Grant
    Filed: December 15, 2011
    Date of Patent: December 2, 2014
    Assignee: Panasonic Corporation
    Inventor: Tatsushi Hiraki
  • Patent number: 8901946
    Abstract: Apparatus and methods for identifying a signal on a printed circuit board (‘PCB’) under test, including an integrated circuit mounted on the PCB, the integrated circuit having a test signal generator that transmits a test signal to an output pin of the integrated circuit, with the output pin connected to a test point on the PCB; the integrated circuit also having signal identification logic that inserts into the test signal, an identifier of the signal; a test probe in contact with the test point; and a signal-identifying controller that receives the test signal and the identifier from the test probe and displays, in dependence upon the identifier, the identity of the signal.
    Type: Grant
    Filed: May 24, 2010
    Date of Patent: December 2, 2014
    Assignee: International Business Machines Corporation
    Inventors: Bhyrav M. Mutnury, Nam H. Pham, Terence Rodrigues
  • Patent number: 8902072
    Abstract: Provided are an apparatus and a method for diagnosing an abnormality in a cell balancing circuit. The apparatus may include a plurality of cell balancing circuits respectively connected to a plurality of battery cells included in a battery pack for balancing the voltages of the battery cells, a diagnosis resistor respectively installed between the cell balancing circuit and a cathode terminal and an anode terminal of the corresponding battery cell, a voltage measuring unit for measuring a voltage difference of the balancing circuit corresponding to each of the battery cells, and a control unit for turning on or off a cell balancing circuit to be diagnosed and for determining whether there is an abnormality in the cell balancing circuit to be diagnosed, based on a variation pattern of a voltage difference of a cell balancing circuit adjacent to the cell balancing circuit to be diagnosed that is measured by the voltage measuring unit.
    Type: Grant
    Filed: August 1, 2011
    Date of Patent: December 2, 2014
    Assignee: LG Chem, Ltd.
    Inventors: Sang-Hoon Lee, Dal-Hoon Lee, Ju-Hyun Kang, Jee-Ho Kim
  • Patent number: 8896316
    Abstract: In a device having capacitive loads in which a plurality of capacitive loads are connected in parallel, power is supplied from an AC power source to a load group comprising the plurality of capacitive loads, the load group is divided into a plurality of small load groups, and a current detecting sensor for detecting a current which flows in at least one small load group at a side which is closer to the load side than a branch point at which the load group is divided into the plurality of small load groups and a current abnormality detecting part for determining an abnormality of a load by a current detecting signal which is detected by the current detecting sensor are equipped.
    Type: Grant
    Filed: June 17, 2010
    Date of Patent: November 25, 2014
    Assignee: Mitsubshi Electric Corporation
    Inventors: Kazutoshi Kurahashi, Takashi Kumagai, Taichiro Tamida, Hajime Nakatani, Daisuke Takauchi
  • Patent number: 8878542
    Abstract: A method for dealing with faults in an electrical drive system having an electrical machine and a pulse-controlled inverter which has a first and a second supply connection, the method including the steps of: detecting a first fault in the electrical drive system; selecting a first of a large number of circuit states (22, 23, 24) of the pulse-controlled inverter according to the detected first fault; and driving the pulse-controlled inverter to set the first circuit state (23), with the circuit states (22, 23, 24) including a short circuit (23) between the power connections of the electrical machine and the first supply connection, a short circuit (24) between the power connections of the electrical machine and the second power connection, and a free-running mode (22).
    Type: Grant
    Filed: April 1, 2011
    Date of Patent: November 4, 2014
    Assignee: Robert Bosch GmbH
    Inventor: Tim Bruckhaus
  • Patent number: 8878546
    Abstract: An apparatus for quickly determining a fault in an electric power system includes a current transformer, a current determination unit and a fault determination unit. The current transformer detects current supplied to the electric power system and outputs a current detection voltage. The current determination unit respectively compares the current detection voltage, the first-order differential voltage of the current detection voltage and the second-order differential voltage of the current detection voltage with predetermined first, second and third reference voltages. The fault determination unit determines whether a fault occurs based on the compared result of the current determination unit and generates a trip signal when it is determined that the fault has occurred.
    Type: Grant
    Filed: August 25, 2011
    Date of Patent: November 4, 2014
    Assignee: LSIS Co., Ltd.
    Inventors: Young Woo Jeong, Hyun Wook Lee
  • Patent number: 8872521
    Abstract: An electrical parameter detection device is configured for detecting electrical parameters of a peripheral component interconnect (PCI) connector including a plurality of power pins. The electrical parameter detection device includes a processor module, a first detection module, and a second detection module. The processor module continuously detects voltage values of electric potentials provided by each of the power pins of the PCI connector using the first detection module, and determines time sequences of the electric potentials according to the voltage values of the electric potentials. Furthermore, the processor module detects the amount of power provided by each of the power pins of the PCI connector using the second detection module.
    Type: Grant
    Filed: March 20, 2012
    Date of Patent: October 28, 2014
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Ya-Jun Pan, Qi-Yan Luo, Peng Chen, Song-Lin Tong
  • Patent number: 8864373
    Abstract: A battery temperature monitoring circuit, which has a cold comparator and a hot comparator, achieves high accuracy in a small cell size by utilizing a cold current optimized for the cold comparator and a cold reference voltage, and a hot current optimized for the hot comparator and a hot reference voltage, along with switching circuitry that provides the cold current to the cold comparator as the battery temperature approaches the cold trip temperature, and the hot current to the hot comparator as the battery temperature approaches the hot trip temperature.
    Type: Grant
    Filed: September 12, 2011
    Date of Patent: October 21, 2014
    Assignee: National Semiconductor Corporation
    Inventors: Luan Minh Vu, Thomas Y. Tse, Tuong Hoang
  • Publication number: 20140268904
    Abstract: Methods and systems for calibrating an inductor-inductor-capacitor (LLC) resonant converter are provided herein. The method includes calculating input voltage mathematically as a function of at least one of an output voltage, a load current, and tolerances of components of the LLC resonant converter and operating the LLC resonant converter in an open loop mode at a nominal resonant frequency. The method also includes measuring output voltage of the LLC resonant converter and comparing the measured output voltage to the calculated input voltage.
    Type: Application
    Filed: February 25, 2014
    Publication date: September 18, 2014
    Applicant: General Electric Company
    Inventors: RAGHOTHAMA REDDY, Darwin Drake Smith
  • Patent number: 8810414
    Abstract: A method and system (30) are disclosed for providing situational awareness to a lineworker executing a switching order in a distribution substation (10). The method includes the steps of wirelessly transmitting a status of at least one circuit breaker (20) in the distribution substation (10), wirelessly receiving the status at a location adjacent a target switch (16) in the distribution substation (10); and displaying the status to a lineworker at the location to allow the lineworker to verify the status immediately prior to executing a switching order for the target switch (16). The system (30) includes a wireless transmitter (32) to perform the transmitting step of the method and one or more wireless receivers (34) to perform the receiving and displaying steps of the method.
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: August 19, 2014
    Assignee: Honeywell International Inc.
    Inventor: Antonio Vitucci
  • Patent number: 8781783
    Abstract: A system and method for checking a ground via of control chips of a printed circuit board (PCB) provides a graphical user interface (GUI) displaying a layout of the PCB. The control chip has a plurality of ground pins. The computer searches for signal path routing of each ground pin and ground vias along each signal path routing of each ground pin. If there are any ground vias having the same absolute coordinates, the computer determines that the ground vias are shared by more than one ground pin.
    Type: Grant
    Filed: February 5, 2010
    Date of Patent: July 15, 2014
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventors: Hsien-Chuan Liang, Shen-Chun Li, Chun-Jen Chen, Shou-Kuo Hsu, Yung-Chieh Chen, Wen-Laing Tseng
  • Patent number: 8773141
    Abstract: Provided are a first test substrate and a second test substrate opposing each other, a first test circuit testing a device under test and being disposed on a face of the first test substrate that faces the second test substrate, a second test circuit testing the device under test and being disposed on a face of the second test substrate that faces the first test substrate, and a sealing section that is formed by sealing a space between the first test substrate and the second test substrate to enclose the first test circuit and the second test circuit in a common space that is filled with coolant.
    Type: Grant
    Filed: April 7, 2011
    Date of Patent: July 8, 2014
    Assignee: Advantest Corporation
    Inventors: Tsuyoshi Ataka, Shoji Kojima
  • Patent number: 8773144
    Abstract: To detect whether energy accumulated in an inductive load section has been discharged. Provided is a test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path between the power supply section and the device under test; a housing section that houses a substrate that includes at least the inductive load section; and a lock maintaining section that keeps an opening/closing section, which allows an operator to access the substrate within the housing section, in a locked state when a voltage at a predetermined position on the substrate is greater than a set voltage.
    Type: Grant
    Filed: October 6, 2011
    Date of Patent: July 8, 2014
    Assignee: Advantest Corporation
    Inventor: Kenji Hashimoto
  • Patent number: 8766182
    Abstract: An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application.
    Type: Grant
    Filed: June 21, 2013
    Date of Patent: July 1, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Minoru Yamazaki, Akira Ikegami, Hideyuki Kazumi, Osamu Nasu
  • Patent number: 8754663
    Abstract: A circuit for simulating an electrical load at a terminal of a test circuit having at least one first switch and at least one second switch includes a third switch connected to the first switch of the test circuit via a first external connection point. A fourth switch is connected to the second switch of the test circuit via a second external connection point. The first switch and the second switch are connected via a shared, first internal connection point to the terminal of the test circuit and the third switch and the fourth switch are connected via a shared, second internal connection point such that that the first switch, the second switch, the third switch and the fourth switch form an H-bridge circuit. A voltage source is configured to provide the first and second external connection points with a supply voltage. A controllable voltage source is connected in a transverse bridge branch between the terminal and the second internal connection point. An inductance is active in the transverse bridge branch.
    Type: Grant
    Filed: July 15, 2009
    Date of Patent: June 17, 2014
    Assignee: Dspace Digital Signal Processing and Control Engineering GmbH
    Inventors: Thomas Schulte, Joerg Bracker
  • Patent number: 8742777
    Abstract: Embodiments include a method and system for testing an electric circuit. A carrier signal of a first frequency is modulated with a multi-tone signal to generate a test signal. The test signal is applied to an input of a circuit under test (CUT). A crest factor of an output signal that corresponds to the test signal received at an output of the CUT is measured. A crest factor differential between the measured crest factor and a reference crest factor is determined. If the crest factor differential exceeds a threshold value, the CUT is determined to be defective.
    Type: Grant
    Filed: December 29, 2010
    Date of Patent: June 3, 2014
    Assignee: The Board of Trustees of the University of Alabama for and on behalf of the University of Alabama
    Inventors: Bruce C. Kim, Sukeshwar Kannan, Ganesh Srinivasan, Friedrich Taenzler
  • Patent number: 8724679
    Abstract: Transceiver calibration is a critical issue for proper transceiver operation. The transceiver comprises at least one RF transmit chain and one RF receive chain. A closed loop path is formed from the digital block, the RF transmit chain, the substrate coupling, the RF receive chain back to the digital block and is used to estimate and calibrate the transceiver parameters over the operating range of frequencies. The substrate coupling eliminates the need for the additional circuitry saving area, power, and performance. In place of the additional circuitry, the digital block which performs baseband operations can be reconfigured into a software or/and hardware mode to calibrate the transceiver. The digital block comprises a processor and memory and is coupled to the front end of the RF transmit chain and the tail end of the RF receive chain.
    Type: Grant
    Filed: April 9, 2012
    Date of Patent: May 13, 2014
    Assignee: Tensorcom, Inc.
    Inventor: Ismail Lakkis
  • Patent number: 8713404
    Abstract: In one implementation, a memory device includes non-volatile memory, a memory controller communicatively coupled to the non-volatile memory over a first bus, and a host interface through which the memory controller communicates with a host device over a second bus. The memory device can also include a signal conditioner of the host interface adapted to condition signals to adjust a signal level of signals received over the second bus based on signal level data received from the host device, wherein the signal level data relates to a voltage level of signals generated by the host device to encode data transmitted across the second bus.
    Type: Grant
    Filed: July 1, 2011
    Date of Patent: April 29, 2014
    Assignee: Apple Inc.
    Inventors: Anthony Fai, Nicholas Seroff, Nir Jacob Wakrat
  • Patent number: 8704529
    Abstract: A circuit test interface and a test method are disclosed. The circuit test interface may include a test voltage input pad, a test voltage output pad, and a plurality of input buffers. Each of the plurality of input buffers may have a first input terminal, a second input terminal, and an output terminal. The first input terminal of each respective input buffer may be coupled to one of a plurality of through-silicon vias (TSVs). The circuit test interface may further include a plurality of switch units. Each of the plurality of switch units may have a first terminal and a second terminal. The circuit test interface may further include a scan chain, coupled to both the output terminal of each of the plurality of input buffers and to the test voltage output pad.
    Type: Grant
    Filed: October 4, 2011
    Date of Patent: April 22, 2014
    Assignee: Nanya Technology Corporation
    Inventors: Bret Dale, Oliver Kiehl
  • Patent number: 8704541
    Abstract: A circuit testing interface and test method are disclosed. The circuit testing interface may include a test current transmitting pad, a test voltage measuring pad, and at least one driving circuit comprising an output terminal. The output terminal of the at least one driving circuit may be coupled to a through-silicon via (TSV). The circuit testing interface may further include at least one switch module, coupled to (1) the output terminal of the driving circuit, (2) the test current transmitting pad, and (3) the test voltage measuring pad.
    Type: Grant
    Filed: December 1, 2011
    Date of Patent: April 22, 2014
    Assignee: Nanya Technology Corporation
    Inventors: Bret Dale, Oliver Kiehl
  • Patent number: 8698504
    Abstract: A method is provided for detection of a ground fault in a high resistance network in a voltage source power conversion circuit comprising a power converter that converts incoming AC power to DC power applied to a DC bus and an inverter that converts DC power from the DC bus to output AC power. The method includes detecting a midpoint-to-ground voltage between a low side of the DC bus and a ground potential and detecting the presence of a ground fault in a high resistance network based upon the detected midpoint-to-ground voltage.
    Type: Grant
    Filed: October 9, 2010
    Date of Patent: April 15, 2014
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Lixiang Wei, Zhijun Liu, Brian Patrick Brown, David W. Kirschnik, Russ J. Kerkman, Richard A. Lukaszewski, Gary Skibinski, Carlos Daniel Rodriguez-Valdez
  • Patent number: 8698083
    Abstract: A method and device for evaluating a solar cell each of which makes it possible to easily evaluate a defect of a solar cell especially in such a manner that an internal cause defect and an external cause defect are distinguished from each other. The device includes: electric current passing means for passing, in a forward direction, an electric current through a solar cell element constituting the solar cell; light emission detecting means for detecting, out of light emitted from the solar cell element due to the electric current passed by the electric current passing means, light in a first range of wavelengths from 800 nm to 1300 nm and light in a second range of wavelengths from 1400 nm to 1800 nm; and judging means for distinguishing between an internal cause defect and an external cause defect.
    Type: Grant
    Filed: August 3, 2010
    Date of Patent: April 15, 2014
    Assignee: National University Corporation Nara Institute of Science and Technology
    Inventors: Takashi Fuyuki, Ayumi Tani
  • Patent number: 8694148
    Abstract: A method and system increase processed specimen yield in the laser processing of target material that includes multiple specimens formed on a common substrate. Preferred embodiments implement a feature that enables storage in the laser processing system a list of defective specimens that have somehow been subject to error during laser processing. Once the common substrate has been completely processed, the system alerts an operator to the number of improperly processed specimens and gives the operator an opportunity to run a software routine, which in a preferred embodiment uses a laser to scribe a mark on the top surface of each improperly processed specimen.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: April 8, 2014
    Assignee: Electro Scientific Industries, Inc.
    Inventors: Michael Tyler, Robert W. Colby, Jeffrey W. Leonard, Lindsey M. Dotson, David A. Watt, Cris E. Hill, Laura H. Campbell
  • Patent number: 8669767
    Abstract: Aspects of the present disclosure provide for a cable tester that tests a cable to determine the cable length. The cable tester can include a clock generator that generates a clock that has clock period that is a multiple of the data symbol period and a signal generator that injects the training signal, which can be synchronous with the clock, into the cable. The cable tester can also include a receiver that samples the returned signal from the cable and adaptively filters the returned signal based on the training signal and a controller that determines the cable length from the adaptive filter tap coefficients.
    Type: Grant
    Filed: August 5, 2013
    Date of Patent: March 11, 2014
    Assignee: Marvell International Ltd.
    Inventors: Ozdal Barkan, William Lo, Tak-Lap Tsui
  • Patent number: 8650411
    Abstract: Energy management of an electronic device using multiple electric power sources. The electric power sources may include a parasitic electric power source, a rechargeable electric power source, an intermittent electric power source, and a continuous electric power source. The electronic device further may include a power supply for receiving the electric power from the source(s) and supplying electric power to the various components of the electronic device that require power. The electronic device may include a source selector for controlling which power source supplies electric power to the power supply. Energy management of the electronic device may be configured to use a permanently exhaustible power source such as a battery only when other power sources are unavailable.
    Type: Grant
    Filed: July 6, 2009
    Date of Patent: February 11, 2014
    Assignee: Schweitzer Engineering Laboratories Inc.
    Inventors: Laurence V. Feight, Ryan W. Swartzendruber
  • Patent number: 8648610
    Abstract: A signal input circuit includes: a signal input device having a signal input terminal; an inspection capacitor connected between the signal input terminal and a reference potential; a connection unit connecting/disconnecting an inspection path between the inspection capacitor and the signal input terminal; a charge and discharge unit charging/discharging the inspection capacitor; and a determination processing unit carrying out a terminal failure detection processing. The determination processing unit controls the connection unit to disconnect the inspection path and controls the charge and discharge unit to set the voltage of the inspection capacitor to a terminal inspection voltage in a charge and discharge procedure, controls the connection unit to connect the inspection path in a continuity establishing procedure, and detects the terminal failure at the signal input terminal or a communication path from the signal input terminal based on a voltage of the inspection path.
    Type: Grant
    Filed: November 28, 2011
    Date of Patent: February 11, 2014
    Assignee: Denso Corporation
    Inventors: Yuuki Mikami, Toru Itabashi, Yoshiharu Takeuchi, Kenji Mochizuki, Naoya Tsuchiya
  • Patent number: 8643539
    Abstract: The current invention relates to a monitoring and analysis device and a method for monitoring and analysis that utilizes the unintended electromagnetic emissions of electrically powered systems. The present invention monitors electrical devices by taking detailed measurements of the electromagnetic fields emitted by any component or system utilizing electricity. The measurements will be analyzed to both record a baseline score for future measurements and to be used in detailed analysis to determine the status of the analyzed system or component.
    Type: Grant
    Filed: September 1, 2009
    Date of Patent: February 4, 2014
    Assignee: Nokomis, Inc.
    Inventors: Gerald William Pauly, Walter John Keller, III
  • Patent number: 8638113
    Abstract: A wafer-scale probe card for temporary electrical contact to a sample wafer or other device, for burn-in and test. The card includes a plurality of directly metallized single-walled or multi-walled nanotubes contacting a pre-arranged electrical contact pattern on the probe card substrate. The nanotubes are arranged into bundles for forming electrical contacts between areas of the device under test and the probe card. The bundles are compressible along their length to allow a compressive force to be used for contacting the probe card substrate to the device under test. A strengthening material may be disposed around and/or infiltrate the bundles. The nanotubes forming the bundles may be patterned to provide a pre-determined bundle profile. Tips of the bundles may be metallized with a conductive material to form a conformal coating on the bundles; or metallized with a conductive material to form a continuous, single contact surface.
    Type: Grant
    Filed: May 4, 2010
    Date of Patent: January 28, 2014
    Assignee: FormFactor, Inc.
    Inventors: Douglas E. Crafts, Jyoti K. Bhardwaj
  • Patent number: 8635035
    Abstract: Methods and systems for monitoring operation of an LED string. An exemplary system includes an LED string, a circuit that supplies current to the LEDs, a current measuring circuit that measures current through the LEDs, a voltage measuring circuit that measures voltage across the LEDs, and a temperature sensor that measures temperature proximate to the LEDs. A processor calculates a predicted string voltage based on a predefined voltage-current curve, number of LEDs, a predefined temperature coefficient value, the measured string current, a measured junction temperature, a life curve function, a prestored calibration string current value, a prestored calibration string voltage value, a prestored junction calibration temperature and an accumulated time value. The process also calculates an error value based on the predicted string voltage and a measured string voltage and generates an indication that there is a failure in the LED string if the calculated error value is greater than the predefined error limit.
    Type: Grant
    Filed: March 15, 2011
    Date of Patent: January 21, 2014
    Assignee: Honeywell International Inc.
    Inventors: Len De Oto, Richard Policy, Stan Hodge
  • Patent number: 8629680
    Abstract: A central processing unit (CPU) test system includes a CPU socket, a CPU core controller, and a CPU test device. The CPU core controller stores a start voltage message. The CPU test device includes a voltage detection pin, an analog to digital (A/D) converter, and a microcontroller. The voltage detection pin detects a voltage of an electronic device connected to the CPU socket. The A/D converter converts the detected voltage into a digital signal. The microcontroller controls the CPU core controller to output the start voltage to the CPU socket according to the digital signal. The microcontroller stores a predetermined start voltage message. The microcontroller reads the start voltage message after controlling the CPU core controller to output the start voltage, and determines whether the CPU core controller supplies the start voltage to the CPU socket by comparing the read start voltage message with the predetermined start voltage message.
    Type: Grant
    Filed: September 22, 2011
    Date of Patent: January 14, 2014
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd, Hon Hai Precision Industry Co., Ltd.
    Inventors: Ying-Bin Fu, Ting Ge, Ya-Jun Pan
  • Patent number: 8618789
    Abstract: In a method for current measurement in a multiphase current network, a conductive connection is produced between a plurality of the phases of the multiphase current network such that the plurality of the phases is short-circuited with one another. At a detection time, a current value flowing between the conductive connection and a first voltage potential is detected.
    Type: Grant
    Filed: February 12, 2009
    Date of Patent: December 31, 2013
    Assignee: Robert Bosch GmbH
    Inventors: Sven Finke, Timo Kuehn
  • Patent number: 8618829
    Abstract: The method of detecting the failure of the excitation circuit of a polyphase alternator controlled by a regulator comprises the following steps: a) electrical information (Iexc) is continuously taken from the excitation circuit (1); b) the electrical information taken in step a) is continuously compared with a predetermined threshold value (Iref); c) a logic state (LT) is continuously determined according to the result of the comparison made in step b); and d) if the logic state (LT) determined in step c) persists for a time at least equal to a predetermined delay time (6), an electrical continuity fault of said excitation circuit is signalled. This method is particularly suitable for machines having a rotor equipped with permanent magnets or having a high remanence of the magnetic circuit of the rotor.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: December 31, 2013
    Assignee: Valeo Equipements Electriques Moteur
    Inventors: Jean-Marie Pierret, Philippe Masson
  • Patent number: 8618808
    Abstract: Disclosed is a field device which determines whether or not an abnormality which was detected is the type of abnormality which may not allow the output of a burn-out H signal, and sets a signal output for the abnormality to a burn-out L signal when the type of abnormality was one which may not allow the output of a burn-out H signal. For example, an abnormality in the D/A converter or the power supply. Therefore, a burn-out L signal is always output for an abnormality judged likely not to be able to output a burn-out H signal, and the certainty of reporting an abnormality when burn-out H is set is enhanced.
    Type: Grant
    Filed: April 20, 2009
    Date of Patent: December 31, 2013
    Assignee: Azbil Corporation
    Inventor: Kentaro Ohya
  • Patent number: 8618807
    Abstract: A method for detecting an in-situ fast transient event within a processing chamber during substrate processing is provided. The method includes a set of sensors comparing a data set to a set of criteria (in-situ fast transient events) to determine if the first data set includes a potential in-situ fast transient event. If the first data set includes the potential in-situ fast transient event, the method also includes saving an electrical signature that occurs in a time period during which the potential in-situ fast transient event occurs. The method further includes comparing the electrical signature against a set of stored arc signatures. If a match is determined, the method yet also includes classifying the electrical signature as a first in-situ fast transient event and determining a severity level for the first in-situ fast transient event based on a predefined set of threshold ranges.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: December 31, 2013
    Assignee: Lam Research Corporation
    Inventors: Luc Albarede, Vijayakumar C Venugopal
  • Patent number: 8603840
    Abstract: To improve the reliability in an electric inspection of a semiconductor device. When a movable pedestal 15 is being positioned relative to an arrangement direction of a plurality of second contact pins 13a by a positioning pin 13b which a socket 12 includes, a substrate conduction test is performed by bringing a first contact pin 14a into contact with a pre-stack land 5c of a wiring substrate 5 and of the a lower package 2 and moreover bringing the second contact pin 13a into contact with a solder ball 7, and thus the electric inspection can be performed by precisely positioning the first contact pin 14a side and the second contact pin 13a side. Then, the reliability of the electric inspection can be improved.
    Type: Grant
    Filed: March 11, 2012
    Date of Patent: December 10, 2013
    Assignee: Renesas Electronics Corporation
    Inventors: Jun Matsuhashi, Naohiro Makihira
  • Patent number: 8604802
    Abstract: A checking circuit for a serial port connector includes a first inverter, a second inverter, a third inverter, and a first light emitting diode (LED) and a second LED with different colors. An input of the first inverter is connected to a transmitted data pin of the serial port connector. An output of the first inverter is connected to an anode of the first LED. An input of the second inverter is connected to the transmitted data pin of the serial port connector. An output of the second inverter is connected to an input of the third inverter. An output of the third inverter is connected to an anode of the second LED. Cathodes of the first and second LEDs are grounded.
    Type: Grant
    Filed: April 26, 2011
    Date of Patent: December 10, 2013
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Wen-Sen Hu, Ting Ge
  • Publication number: 20130314096
    Abstract: Devices, systems and methods for operating, monitoring and diagnosing photovoltaic arrays used for solar energy collection. The system preferably includes capabilities for monitoring or diagnosing an array, under some circumstances, by using a bidirectional power converter not only to convert the DC output of the array to output power under some conditions, but also, for diagnostic operations, applying a back-converted DC voltage to the array.
    Type: Application
    Filed: April 29, 2013
    Publication date: November 28, 2013
    Applicant: Ideal Power Converters, Inc.
    Inventor: Ideal Power Converters, Inc.
  • Patent number: 8587323
    Abstract: A output assembly and method for diagnosing an electrical connection for reliably identifying a possible wire break to a load in redundantly connected output assemblies in which a control device for operating a switching device is configured such that the control device subjects the measured value to a test criterion, wherein satisfaction of the test criterion initially noted in the output assembly as a diagnosis fault, and the test criterion is applied cyclically within a time period comprising a waiting time, and wherein another output assembly performs a switch-off test during this time, thus allowing a statement to be made as to whether a wire break is present.
    Type: Grant
    Filed: January 25, 2011
    Date of Patent: November 19, 2013
    Assignee: Siemens Aktiengesellschaft
    Inventors: Martin Fichtlscherer, Tobias Gramolla, Mario Maier
  • Patent number: 8587333
    Abstract: A probe used for electrical measurement includes first and second internal electrically-conductive parts; first and second terminal contact parts configured to contact first and second external electrode terminals, respectively; first and second spring parts each having a meandering pattern; a housing part configured to surround the first and second internal electrically-conductive parts. The first internal electrically-conductive part, the first terminal contact part, the first spring part, the housing part, the second spring part, the second terminal contact part, and the second internal electrically-conductive part are successively connected in a single metal plate from a first end to a second end thereof. The first and second terminal contact parts are in first and second bent portions, respectively, of the single metal plate. The first and second internal electrically-conductive parts are configured to contact each other at the time of performing the electrical measurement.
    Type: Grant
    Filed: April 12, 2011
    Date of Patent: November 19, 2013
    Assignee: Fujitsu Component Limited
    Inventors: Koki Sato, Koki Takahashi
  • Patent number: 8587320
    Abstract: A system, apparatus and method are provided for testing a secondary servo control circuit in a redundant control configuration. A first circuit is configured to receive a control signal and to control an attribute of an actuator based on the control signal using a first control input of the actuator. A second circuit is configured to test operation of an actuator circuit using a test signal. The actuator circuit includes at least part of the second circuit and a second control input of the actuator. The test signal is selected to avoid causing independent motion of the actuator. The actuator could be a dual coil servo valve, and the test signal could be a current (such as a DC current, an AC current, or a pulsed current) having a magnitude less than a bias current of the actuator.
    Type: Grant
    Filed: November 9, 2010
    Date of Patent: November 19, 2013
    Assignee: Honeywell International Inc.
    Inventors: Dinesh Kumar Kn, Nagaraja Sundaresh, Karthik Giritharan, Srinivasan Rajagopal, Amol Kinage, Rakesh Damodaran Nair, Sai Krishnan Jagannathan, Sunil M. Ingawale, Sachin Kumar
  • Patent number: 8581608
    Abstract: The present invention provides an apparatus for easily detecting an abnormal status of power generation of a solar cell panel in a solar cell power generation system having the power generation of 1 MW or higher. The present invention provides an abnormality detecting apparatus for a solar cell power generation system including a plurality of solar cell strings each having a plurality of solar cell modules connected to each other in series and a backflow preventing diode connected to a power output terminal of each of the solar cell strings, characterized in that the abnormality detecting apparatus further includes measuring means for measuring a current flowing in the backflow preventing diode; and that the measuring means is supplied with electric power from both terminals of the backflow preventing diode.
    Type: Grant
    Filed: May 22, 2009
    Date of Patent: November 12, 2013
    Assignee: Onamba Co., Ltd.
    Inventors: Osamu Shizuya, Jun Ishida, Hideki Furubayashi, Yukitaka Miyata
  • Patent number: 8581610
    Abstract: A method is provided for design and programming of a probe card with an on-board programmable controller in a wafer test system. Consideration of introduction of the programmable controller is included in a CAD wafer layout and probe card design process. The CAD design is further loaded into the programmable controller, such as an FPGA to program it: (1) to control direction of signals to particular ICs, even during the test process (2) to generate test vector signals to provide to the ICs, and (3) to receive test signals and process test results from the received signals. In some embodiments, burn-in only testing is provided to limit test system circuitry needed so that with a programmable controller on the probe card, text equipment external to the probe card can be eliminated or significantly reduced from conventional test equipment.
    Type: Grant
    Filed: June 13, 2006
    Date of Patent: November 12, 2013
    Inventors: Charles A Miller, Matthew E Chraft, Roy J Henson