Abstract: A semiconductor device includes a primary voltage rail, a secondary voltage rail, a plurality of transistors coupled between the primary and secondary voltage rails, and control logic operable to enable a first subset of the plurality of transistors to couple the primary voltage rail to the secondary voltage rail. During a steady state condition, the first subset comprises less than all of the plurality of transistors.

Abstract: An integrated circuit includes, in one example, an active memory cell array and a passive variable resistance memory cell array positioned above the active memory cell array, such as in upper layers of the integrated circuit. The active memory cell array and the passive variable resistance memory cell array share one or more components of memory control logic such as address decode logic, data read logic and/or data write logic. As such, a type of active memory and passive variable resistance memory hybrid structure shares memory control logic such as word line drivers, bit line drivers and read logic. The active memory cell array and passive variable resistance memory cell array overlap reducing integrated circuit die size, improving power reduction and reducing costs by sharing peripheral circuits.

Abstract: An apparatus and methods for hardware-based performance monitoring of a computer system are presented. The apparatus includes: processing units; a memory; a connector device connecting the processing units and the memory; probes inserted the processing units, and the probes generating probe signals when selected processing events are detected; and a thread trace device connected to the connector device. The thread trace device includes an event interface to receive probe signals, and an event memory controller to send probe event messages to the memory, where probe event messages are based on probe signals. The probe event messages transferred to memory can be subsequently analyzed using a software program to determine, for example, thread-to-thread interactions.

Abstract: A power-up control circuit utilizes on-chip circuits, multiple voltages, a ring oscillator and counter, and edge and level detection circuits to guarantee reset during power-up conditions and continues the reset state with a variable length counter to guarantee a predictable reset. In addition, a clean start-up after a logical power-down condition is provided.

Abstract: A method and apparatus for dynamically controlling a cache size is disclosed. In one embodiment, a method includes changing an operating point of a processor from a first operating point to a second operating point, and selectively removing power from one or more ways of a cache memory responsive to changing the operating point. The method further includes processing one or more instructions in the processor subsequent to removing power from the one or more ways of the cache memory, wherein said processing includes accessing one or more ways of the cache memory from which power was not removed.

Abstract: A computer-implemented method and article of manufacture is disclosed for enabling computer programs utilizing hardware transactional memory to safely interact with code utilizing traditional locks. A thread executing on a processor of a plurality of processors in a shared-memory system may initiate transactional execution of a section of code, which includes a plurality of access operations to the shared-memory, including one or more to locations protected by a lock. Before executing any operations accessing the location associated with the lock, the thread reads the value of the lock as part of the transaction, and only proceeds if the lock is not held. If the lock is acquired by another thread during transactional execution, the processor detects this acquisition, aborts the transaction, and attempts to re-execute it.

Abstract: An apparatus and method for computing a rounded floating point number. A floating point unit (FPU) receives an instruction to round a floating point number to a nearest integral value and retrieves a binary source operand having an exponent of a fixed first number of bits and a mantissa of a fixed second number of bits. If the unbiased exponent value is greater than or equal to zero and less than the fixed second number, the FPU generates a mask having N consecutive ‘1’ bits beginning with the least significant bit and whose remaining bits have a value of ‘0’, where N is equal to the fixed second number minus the unbiased exponent value. The FPU computes a bitwise OR of the source operand with the mask, increments the result if the instruction is to round up, and computes a bitwise AND of the result with the inverse of the mask.

Abstract: A system and method are disclosed for recreating graphics processing unit (GPU) state information associated with a migrated virtual machine (VM). A VM running on a first VM host coupled to a first graphics device, comprising a first GPU, is migrated to a second VM host coupled to a second graphics device, in turn comprising a second GPU. A context module coupled to the first GPU reads its GPU state information in its native GPU state representation format and then converts the GPU state information into an intermediary GPU state representation format. The GPU state information is conveyed in the intermediary GPU state representation format to the second VM host, where it is received by a context module coupled to the second GPU. The context module converts the GPU state information related to the first GPU from the intermediary GPU state representation format to the native GPU state representation format of the second GPU.

Abstract: An integrated circuit device includes a plurality of functional tiles. Each functional tile may be configured into a scan chain. A clock generator is operable to generate an internal clock signal that is distributed to each of the functional tiles. A clock gater is associated with each of the functional tiles. Each clock gater is operable to receive an external enable signal and the internal clock signal, generate a scan clock signal for loading a test pattern into the scan chain based on the external enable signal and the internal clock signal, and generate at least one capture clock signal for capturing a response of the tile to the test pattern responsive to identifying the loading of the test pattern.

Abstract: A method for switching decoding and rendering of a digital video stream from a first graphics processing unit (GPU) to a second GPU. The digital video stream is evaluated to determine an amount of time until a next intra-coded frame (I-frame) in the digital video stream. If the amount of time is below a threshold, decoding and rendering of the digital video stream is switched to the second GPU on the next I-frame in the digital video stream and decoding the digital video stream by the first GPU is stopped. If the amount of time is above the threshold, the digital video stream is decoded on both the first GPU and the second GPU, the rendering of the digital video stream is switched to the second GPU, and decoding the digital video stream by the first GPU is stopped.

Abstract: An integrated circuit employs at least one active memory circuit and at least one memory state backup circuit wherein the at least one memory state backup circuit includes at least one passive variable resistance memory cell and at least one passive variable resistance memory cell interface that are used to backup data from the active memory circuit to the PVRM cell. Data is then placed back into the active memory circuit from the PVRM cell during a restore operation. The PVRM cell interface is operative to read the PVRM cell in response to a restore signal. PVRM cell interface control logic is operative to remove power to the PVRM cell after backup of the data to the PVRM cell from the active memory circuit. A PVRM cell (e.g., a bit cell) is added to each memory circuit that stores state information on an integrated circuit.

Abstract: A method for forming an integrated circuit system includes providing an integrated circuit device; and forming an integrated contact over the integrated circuit device including: providing a via over the integrated circuit device; forming a selective metal in the via; forming at least one nanotube over the selective metal; and forming a cap over the nanotubes.

Abstract: An integrated circuit (IC) is disclosed. The IC includes a first global voltage node and a second global voltage node. The IC further includes two or more power domains each coupled to the first global voltage node. Each of the two or more power domains includes a functional unit and a local voltage node coupled to the functional unit. Each of the plurality of power domains further includes a power-gating transistor coupled between the local voltage node and the second global voltage node, and an ESD (electrostatic discharge) circuit configured to detect an occurrence of an ESD event and further configured to cause activation of the transistor responsive to detecting the ESD event.

Abstract: A floating point unit includes a floating point adder to perform a floating point addition operation between first and second floating point numbers each having an exponent and a mantissa. The floating point unit also includes an alignment shifter that may calculate a shift value corresponding to a number of bit positions to shift the second mantissa such that the second exponent value is the same as the first exponent value. The alignment shifter may detect an overshift condition, in which the shift value is greater than or equal to a selected overshift threshold value. The selected overshift threshold value comprises a base 2 number in a range of overshift values including a minimum overshift threshold value and a maximum overshift threshold value, and which has a largest number of a consecutive of bits that are zero beginning at a least significant bit.

Abstract: A wafer is disclosed that includes a plurality of pipeline interconnected integrated circuit dies that form a plurality of pipelines. A plurality of dies in each pipeline is connected to receive scanned output test data from a neighboring die in a pipeline. A wafer level test access mechanism (TAM) transceiver circuitry, located outside the plurality of pipeline interconnected IC dies, is connected in common to each of the pipelines to provide input test data in a parallel fashion to the plurality of pipelines. The wafer level test access mechanism transceiver circuitry also provides output test results from each of the pipelines for evaluation by a computerized test system. In one embodiment, the wafer level test access mechanism transceiver circuitry is wireless so that it wirelessly receives test data to be passed through the multiple pipelines on a wafer and also includes wireless transmit circuitry to transmit test results from each of the pipelines.

Abstract: An integrated circuit device includes a first plurality of non-volatile memory locations such as fuses that supply programmed values corresponding to initially selected device features such as voltage, frequency, clock speed, and cache parameters. The device is programmed with a lock value in a second plurality of non-volatile memory locations. That lock value may be a randomly generated number that is unique for each device. After initial programming of the device, access to the device is prevented by appropriately programming access control. In order to unlock the device and modify device features, an unlock key value is supplied to the device. If the unlock key value correctly corresponds to the lock value, the device features can be modified. In that way device features can be modified, but security is maintained to prevent unauthorized modification to device features.

Abstract: A semiconductor chip device includes a first semiconductor chip adapted to be stacked with a second semiconductor chip wherein the second semiconductor chip includes a side and first and second conductor structures projecting from the side. The first semiconductor chip includes a first edge, a first conductor pad, a first conductor pillar positioned on but laterally offset from the first conductor pad toward the first edge and that has a first lateral dimension and is adapted to couple to one of the first and second conductor structures, a second conductor pad positioned nearer the first edge than the first conductor pad, and a second conductor pillar positioned on but laterally offset from the second conductor pad and that has a second lateral dimension larger than the first lateral dimension and is adapted to couple to the other of the first and second conductor structures.

Abstract: A method and apparatus for reducing motion judder in a 3D input source are disclosed. The 3D input source is separated into left and right images. Motion vectors for the left and right images are calculated. Frame rate conversion is performed on the left and right images, to produce motion compensated left and right images. The left and right images and the motion compensated left and right images are reordered for display. Alternatively, the motion estimation and motion compensation can be performed on the 3D input source, and the input image and the motion compensated image can then be separated into respective left and right images. The method and apparatus can be adapted to perform 2D to 3D conversion by extracting a 2D input source into left and right 3D images and performing motion estimation and motion compensation.

Abstract: A system for performing efficient continuous grading flow for test coverage analysis. The system provides for continuous test coverage grading. The continuous grading flow analyzes individual tests upon completion without requiring an entire set of tests to finish. As a result, the grading process at the end of the regression run is no longer necessary, disk space and memory requirements are dramatically reduced, and partial results are produced as the grading of individual tests complete, allowing engineers to track progress and make real-time decisions based on the intermediate results. The resource requirements of our continuous flow scale linearly with the number of tests rather than exponentially as with traditional approaches.

Abstract: A method for performing channel estimation in an orthogonal frequency division multiplexing (OFDM) signal includes choosing reserved tones to be part of a pilot pattern, and using the reserved tones in the pilot pattern to perform the channel estimation. An apparatus for use in performing channel estimation in an OFDM system includes a receiver configured to receive a transmitted OFDM signal; a pilot symbol extractor configured to extract pilot symbols from the OFDM signal; and a channel estimator configured to perform the channel estimation, including using reserved tones as pilot tones.