Abstract: A method for operating a test apparatus including a plurality of shared resources is shown, wherein the plurality of shared resources can be used in different instruments. The method includes blocking a first set of resource blockers when a first instrument, which requires a first subset of the shared resources, is to be executed. Furthermore, the method tries to block a second set of resource blockers, when a second instrument, which requires a second subset of the shared resources, is to be executed. Therefore, the first set of resource blockers is different from the second set of resource blockers and a plurality of resource blockers are assigned to a shared resource, which is involved in a conflicting combination of instruments and in a non-conflicting combination of instruments.

Abstract: A measurement result receiving apparatus receives measurement results transmitted from a plurality of measuring devices, the measurement results obtained by conducting a measurement at a predetermined sampling interval according to a reference clock of each measuring device. The measurement result receiving apparatus includes a receiving section that receives the measurement results from the plurality of measuring devices; and a sampling interval converting section that converts the measurement results into measurement values associated with a common sampling interval.

Abstract: Non-standard sector size system support for SSD testing. An automated test equipment for simultaneous testing of multiple solid state drives (SSDs), wherein the SSD has a sector size that is not an integral power of two, includes a tester block configured to receive a command to read and verify an amount of data from the SSD starting at a starting address. The starting address is not constrained to correspond to a sector boundary and the amount of data is not constrained to be an integral multiple of the SSD data sector size. The test equipment also includes logic within said tester block configured to determine a starting sector of the SSD that the starting address points to, and logic within said tester block configured to determine a number of sectors required for the amount of data to be read. The tester block is configured to read a sector from the SSD.

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: transfer units that each include a DUT transfer part that mounts the DUT on a first tray and removes the DUT from the first tray; contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and a tray transporter that transports the first tray between the contact units and the transfer units. Either or both of (i) at least one of the contact units and (ii) at least one of the transfer units are removably disposed on the electronic component handling apparatus.

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another. The socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester. At least one of the contact units is removably disposed on the electronic component handling apparatus.

Abstract: Provided is a three-dimensional laminating and shaping apparatus 100 including a column unit 200 that is configured to output an electron beam EB and deflect the electron beam EB toward the front surface of a powder layer 32, an insulating portion that electrically insulates a three-dimensional structure 36 from a ground potential member, an ammeter 73 that is configured to measure the current value indicative of the current flowing into the ground after passing through the three-dimensional structure 36, a melting judging unit 410 that is configured to detect that the powder layer 32 is melted based on the current value measured by the ammeter 73 and generate a melting signal, and a deflection controller 420 that is configured to receive the melting signal to determine the condition for the irradiation with the electron beam.

Abstract: An apparatus for providing a supply voltage to a device under test includes a controlled source configured to provide a voltage in dependence on one or more control signals; a switchable resistor circuited between the output of the controlled source and a DUT port, having first and second resistances in first and second switch states, respectively, the second resistance being smaller than the first resistance; a regulator configured to provide a control signal to the controlled source, to regulate a voltage to be provided to the DUT in dependence on information about a desired voltage; a capacitor circuited in parallel to the switchable resistor at least during switching of the switchable resistor and configured to slow a voltage change across the switchable resistor which is caused by changing a switch state of the switchable resistor; the apparatus being configured to change a switch state of the switchable resistor while a voltage is provided to the DUT via the switchable resistor.

Abstract: A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body. The lid member includes a through-hole for sucking the DUT that is provided to face the DUT and penetrating through the lid member.

Abstract: A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; a lid member that covers the DUT and is attached to the carrier body; and an identifier for identifying an individual of the test carrier.

Abstract: A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body. The lid member includes: a plate-like main body; and a pusher protruding from the main body in a convex shape.

Abstract: A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT, and a lid member that covers the DUT and is attached to the carrier body. The carrier body has a first through-hole for positioning that is provided to face the DUT.

Abstract: Method for providing an electrical connection, comprising connecting a first cable to a first conducting structure on a printed circuit board, connecting a second cable to a second conducting structure on the printed circuit board, comparing a propagation delay of a first signal path comprising the first cable and the first conducting structure on the printed circuit board, and a propagation delay of a second signal path comprising the second cable and the second conducting structure on the printed circuit board; and removing conductive material of the first conducting structure and/or of the second conducting structure, in order to modify an electrical length of the first conducting structure and/or of the second conducting structure, to obtain a first conducting path and a second conducting path, in dependence on a result of the comparison, in order to reduce a difference of the propagation delays between the first signal path and the second signal path.

Abstract: According to the present invention, an optical ultrasonic wave measuring apparatus includes an ultrasonic pulse output section, a light pulse output section, a reflected wave measuring section, an optoacoustic wave measuring section, an exceeding time point acquiring section, and a measurement result shifting section. The reflected wave measuring section measures, in correspondence to time, a reflected wave as a result of reflection of the ultrasonic pulse at a measuring target. The optoacoustic wave measuring section measures, in correspondence to time, an optoacoustic wave generated by the light pulse at the measuring target. The exceeding time point acquiring section acquires an exceeding time point at which a measurement result of the reflected wave exceeds a predetermined threshold value. The measurement result shifting section shifts a measurement result of the optoacoustic wave by a first shift time toward the time point of output of the light pulse.

Abstract: A tester for testing a device under test is shown, having a test unit configured for performing a test of the device under test using multiple test cases, each test case having variable values of a set of predetermined variables, the test units configured to derive an output value for each test case indicating whether the device under test validly operates at a current test case or whether the device under test provides an error at the current test case; and an evaluation unit configured for evaluating the multiple test cases based on a plurality of subsets of the predetermined input variables with respect to the output value, the evaluation unit configured for providing a number of plots of the evaluation of the multiple test cases where each plot indicates the impact of one subset of the plurality of subsets of the predetermined input variables to the output value in dependence on respective relevance scores or associated with the respective relevance scores.

Abstract: A wiring board includes a wiring board body and a coaxial connector. The coaxial connector includes coaxial terminals and a housing. The coaxial terminals are arranged in row. Each of the coaxial terminals includes a signal terminal and a ground terminal. The ground terminal includes a tubular main body and first and second contact pieces that respectively extend from the main body and respectively include first and second contact portions in contact with the wiring board body, in a transparent plan view seen through the wiring board along a normal direction of the wiring board body. A part of the first contact piece of a first coaxial terminal overlaps with a part of the second contact piece of a second coaxial terminal adjacent to the first coaxial terminal.

Abstract: A coaxial terminal includes a signal terminal, a tubular ground terminal that covers the signal terminal, and an insulating member interposed between the signal terminal and the ground terminal. The signal terminal includes a main body that is covered by the insulating member, an upper contact piece that extends from the main body to +Z direction side, and a lower contact piece that extends from the main body to ?Z direction side. The insulating member has an opening through which a part of the main body is exposed. A following formula (1) is satisfied: L2?½×L1??(1) where L1 is a length of the insulating member along an axial direction of the coaxial terminal, L2 is a length of the opening along the axial direction.

Abstract: An automated test equipment for testing devices under test is configured to combine different output signals from multiple pins of a single device under test or from pins of a plurality of devices under test to obtain a combined signal; and to extract individual signals or properties of the individual signals from the combined signal.

Abstract: An amplifier includes an amplifying device and a bias circuit for providing a bias voltage for the amplifying device. The bias circuit is configured to provide the bias voltage in dependence of an output signal of an optical coupling arrangement which provides for electrical isolation.

Abstract: A test apparatus for performing a test on a device under test includes a data storage unit being configured to store sets of input data applied to the device under test during the test and to store the respective output data of the device under test, the output data being obtained from the device under test as a response to the input data including values of setting variables related to settings of the device under test and values of input variables including further information, each set of input data representing one test case; and a data processor configured to process the data stored in the data storage unit such that a best combination of setting variables of the device under test is determined for one or more combinations of the input variables to obtain an optimized setting of the device under test for the one or more combinations of the input variables.

Abstract: A nanopore device measures a current signal Is that flows through the nanopore device, which has an aperture and an electrode pair. A transimpedance amplifier converts the current signal Is into a voltage signal Vs. A voltage source is configured to apply a DC bias voltage Vb across the electrode pair in a normal measurement mode, and to apply a calibration voltage Vcal across the electrode pair in a calibration mode. In the calibration mode, at least one circuit constant of a measurement apparatus is calibrated based on the output signal Vs of the transimpedance amplifier and the calibration voltage Vcal.