Abstract: According to the present invention, an optical device includes: a first electro-optical member and a second electro-optical member. The first electro-optical member has two convex portions spaced from each other by a recessed portion and a connecting portion arranged under the recessed portion to connect the two convex portions, the first electro-optical member exhibiting an electro-optical effect. The second electro-optical member has a recessed portion member arranged within the recessed portion, the second electro-optical member exhibiting an electro-optical effect. The permittivity of the first electro-optical member is higher than the permittivity of the second electro-optical member. The refractive index of the first electro-optical member is higher than the refractive index of the second electro-optical member. During application of an electric field, light to be transmitted is applied to the recessed portion member.

Abstract: According to the present invention, a somatic cell meter includes a somatic cell concentration measuring section, a time constant recording section, and a somatic cell concentration deriving section. The somatic cell concentration measuring section measures the somatic cell concentration of centrifuged raw milk in association with the duration of the centrifugation. The time constant recording section records a time constant in the association relationship between the somatic cell concentration and the duration. The somatic cell concentration deriving section derives the somatic cell concentration based on a measurement result from the somatic cell concentration measuring section and a recorded content from the time constant recording section.

Abstract: A testing apparatus comprises a test interface board comprising a plurality of socket interface boards, wherein each socket interface board comprises: a) an open socket to hold a DUT; b) a discrete active thermal interposer comprising thermal properties and operable to make thermal contact with the DUT; c) a superstructure operable to contain the discrete active thermal interposer; and d) an actuation mechanism operable to provide a contact force to bring the discrete active thermal interposer in contact with the DUT.

Abstract: A method for conducting bus arbitration in a hardware tester system comprising a single master controller and a multi-master controller comprises configuring the single master controller with arbitration logic operable to communicate on a bus in the hardware tester system using a same arbitration scheme as the multi-master controller, wherein the single master controller and the multi-master controller are connected to the bus. Further, responsive to a determination by the arbitration logic that the multi-master controller controls the bus, the method comprises withdrawing the single master controller from attempting to control the bus.

Abstract: An electronic component handling apparatus includes: a moving device that moves a device under test (DUT) including a first antenna and presses the DUT against a socket. The moving device includes a holder that holds the DUT and a second antenna that receives a radio wave radiated from the first antenna or that radiates the radio wave to the first antenna.

Abstract: A burn-in board includes: a board; a socket mounted on the board; a connector attached to the board; a wiring system that is disposed in the board and that connects the socket and the connector; and a compensation circuit that connects to the wiring system and that compensates a frequency characteristic of a signal transmitted through the wiring system.

Abstract: A biosensor includes: a flow channel through which a liquid sample flows, the liquid sample containing a specific component; a holding sheet that is disposed in the flow channel and holds a substance corresponding to the specific component; and a first temperature sensor that is disposed to correspond to the holding sheet and detects a reaction heat generated by a contact reaction between the specific component and the corresponding substance. The biosensor acquires information on the specific component based on the reaction heat.

Abstract: A burn-in board includes: a board; sockets mounted on the board; a connector mounted on the board; and wiring systems disposed in the board and connecting the sockets and the connector. The wiring systems comprise: a first wiring system that transmits a first signal; and a second wiring system that transmits a second signal different from the first signal, and a type of a first connection form of the first wiring system is different from a type of a second connection form of the second wiring system.

Abstract: A pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses. An optical path determining section receives the first pulses and determines one among a plurality of optical paths for each of the first pulses for output. A parallelizing section parallelizes a traveling direction of light beams traveling, respectively, through the plurality of optical paths. A wavelength changing section receives outputs from the parallelizing section and changes the outputs to have different wavelengths for output. A focusing section receives and focuses outputs from the wavelength changing section. An optical fiber receives an output from the focusing section at a core end face. A timing control section is arranged to time outputs from the optical path determining section to the output of the first pulses. The focusing section is arranged to focus the outputs from the wavelength changing section on the core end face.

Abstract: A power supply for providing an electric pulse to an electrical consumer is shown. The power supply has an input circuit, a storage capacitor, and an output circuit. The input circuit is configured to charge the storage capacitor up to a maximum voltage. The output circuit is configured to provide one or more pulses having a pulse voltage on the basis of a charge stored in the storage capacitor and to compensate for a reduction of the voltage of the storage capacitor by at least 30% down from the maximum voltage. Moreover, the power supply is configured such that the voltage of the storage capacitor is reduced by at least 30% during the generation of one or more pulses.

Abstract: To provide a three-dimensional printing device that irradiates approximately the same ranges on the surface of a powder layer simultaneously with a plurality of electron beams having different beam shapes. An electron beam column 200 of the three-dimensional printing device 100 includes a plurality of electron sources 20 including electron sources having anisotropically-shaped beam generating units, and beam shape deforming elements 30 that deform the beam shapes of electron beams output from the electron sources 20 on a surface 63 of a powder layer 62. A deflector 50 included in the electron beam column 200 deflects an electron beam output from each of the plurality of electron sources 20 by a distance larger than the beam space between electron beams before passing through the deflector 50.

Abstract: A wiring board includes a wiring board body and a coaxial connector. The coaxial connector includes coaxial terminals and a housing. The coaxial terminals are arranged in row. Each of the coaxial terminals includes a signal terminal and a ground terminal. The ground terminal includes a tubular main body and first and second contact pieces that respectively extend from the main body and respectively include first and second contact portions in contact with the wiring board body, in a transparent plan view seen through the wiring board along a normal direction of the wiring board body. A part of the first contact piece of a first coaxial terminal overlaps with a part of the second contact piece of a second coaxial terminal adjacent to the first coaxial terminal.

Abstract: A coaxial terminal includes a signal terminal, a tubular ground terminal that covers the signal terminal, and an insulating member interposed between the signal terminal and the ground terminal. The signal terminal includes a main body that is covered by the insulating member, an upper contact piece that extends from the main body to +Z direction side, and a lower contact piece that extends from the main body to ?Z direction side. The insulating member has an opening through which a part of the main body is exposed. A following formula (1) is satisfied: L2?½×L1??(1) where L1 is a length of the insulating member along an axial direction of the coaxial terminal, L2 is a length of the opening along the axial direction.

Abstract: According to the present invention, an identification information readout apparatus includes an identification information readout section, a somatic cell concentration measuring section, and a measurement result recording section. The identification information readout section reads cow identification information out of a recording medium with the cow identification information recorded therein. The somatic cell concentration measuring section measures the somatic cell concentration of milk obtained from a cow. The measurement result recording section records the somatic cell concentration and the cow identification information in association with each other. The recording medium is attached to the cow.

Abstract: According to the present invention, an optical testing apparatus is used in testing an optical measuring instrument. The optical measuring instrument provides an incident light pulse from a light source to an incident object and receives a reflected light pulse as a result of reflection of the incident light pulse at the incident object. The optical testing apparatus includes a testing light source and a rise time control section. The testing light source is arranged to generate a testing light pulse to be provided to the optical measuring instrument. The rise time control section is arranged to control the rise time of the testing light pulse.

Abstract: An automated test equipment (ATE) system comprises a computer system comprising a system controller, wherein the system controller is communicatively coupled to a tester processor, wherein the system controller is operable to transmit instructions to the tester processor. The tester processor is operable to generate commands and data from the instructions for coordinating testing of a device under test (DUT), wherein the DUT supports an arbitrary sector size, and wherein software layers on the tester processor perform computations to be able control data flow between the tester processor and sectors of arbitrary size in the DUT.

Abstract: A control device controls a magnetic field generated by a magnetic field generator, and includes a magnetic field controller that controls the magnetic field generator based on a detected value by a magnetic field sensor. The magnetic field controller receives a command value generated by the magnetic field generator, and the detected value. The magnetic field controller generates an error signal based on an error between the command value and the detected value and outputs to the magnetic field generator a control signal amplified by a control gain against the error. The control gain includes: a first gain that becomes smaller as a frequency of the error signal gets higher; and a second gain that gets larger as an amplitude of the error signal gets larger.

Abstract: An automated test equipment for testing one or more devices under test comprising a plurality of port processing units, comprising at least a respective buffer memory, and a respective high-speed-input-output, HSIO, interface for connecting with at least one of the devices under test. The port processing units are configured to receive data, store the received data in the respective buffer memory, and provide the data stored in the respective buffer memory to one or more of the connected devices under test via the respective HSIO interface for testing the one or more connected devices under test. A method and computer program for automated testing of one or more devices under test are also described.

Abstract: An automated test equipment for testing a device under test comprises an on-chip-system-test controller. The on-chip system test controller comprises at least one debug interface or control interface configured to communicate with the device under test. The on-chip-system-test controller optionally comprises at least one high bandwidth interface configured to communicate with the device under test. The on-chip-system-test controller is configured to control a test of a device-under-test which is a system-on-a chip.

Abstract: A power supply comprises an output stage configured to provide a supply current, in order to obtain a supply voltage. The power supply also comprises a digital regulator configured to receive a reference voltage information and a measured voltage information and to provide a control signal. The power supply further comprises an inner analog control loop, wherein the inner analog control loop is configured to provide an analog feedback signal, which is based on the supply voltage, to the output stage, to make an analog regulation contribution to a regulation of the supply voltage. A method for supplying power to a load is also disclosed.