Abstract: An electronic component handling apparatus includes: a moving device that presses a device under test (DUT) against a socket of a test head. The moving device includes: a pusher that contacts the DUT; and a heater that heats the DUT through the pusher. The pusher includes: an internal space; and a first flow path that communicates with the internal space. Fluid from the test head is supplied to the internal space through the first flow path.

Abstract: A waveform data acquisition module includes an A/D converter that converts an electrical signal relating to a DUT into a digital signal, and a first memory unit that stores waveform data configured as a digital signal sequence. A function test module includes a test unit and a second memory unit. A higher-level controller instructs the waveform data acquisition module to start data sampling, and holds the time point thereof. Furthermore, the higher-level controller instructs the function test module to start to execute a pattern program, and records the time point thereof. The first memory unit records the time point at which the data sampling is started. The higher-level controller records the time point at which the execution of the pattern program is started.

Abstract: A calibration arrangement for calibrating a power source includes first and second resistors with first and second resistances, respectively, which are usable in calibrating the power source. The second resistance is smaller than the first resistance and the calibration arrangement is configured to allow for a measurement of the first resistance of the first resistor. The calibration arrangement is configured to form a series connection of the first resistor and of the second resistor, to allow for at least two voltage measurements between at least two different pairs of circuit nodes of the series connection, wherein a same current is applied during the at least two voltage measurements, and to derive the second resistor with a second resistance on the basis of the at least two voltage measurements and a result of the measurement of the first resistance of the first resistor.

Abstract: A system for performing an automated test is disclosed. The method comprises receiving a plurality of work orders and a plurality of constraints for scheduling a plurality of tests on a plurality of DUTs using automated test equipment (ATE) available on a production floor, wherein the ATE comprises a plurality of test cells, and wherein each test cell comprises a plurality of testers and an automated handler. The method further comprises developing a test plan to execute the plurality of tests, wherein the test plan is customized in accordance with the information in the plurality of work orders and the plurality of constraints. Finally, the method comprises scheduling the plurality of tests to the plurality of test cells to maximize throughput of the plurality of DUTs.

Abstract: A system for performing tests using automated test equipment (ATE) is disclosed. The system comprises a robot comprising an end effector operable to pick up and transfer a DUT in-and-out of a test slot in a primitive. The system further comprises a system controller comprising a memory and a processor for controlling the robot. Also, the system comprises a test rack comprising a plurality of primitives, wherein the primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in the plurality of primitives within the test rack using the end effector.

Abstract: Fast Address to Sector Number/Offset Translation to Support Odd Sector Size Testing. A machine-implemented method of determining a sector number from a given address for testing a solid state drive (SSD), wherein the SSD sector size is not an integral power of 2, includes determining an approximate sector size as the closest power of 2 less than the sector size and determining an error factor as the ratio of the approximate sector size divided by the sector size. The method also includes forming the sector number by shifting the address right by the base 2 logarithm of the approximate sector size.

Abstract: A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.

Abstract: According to a laser beam output apparatus, a pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses. An optical path determining section receives the first pulses and determines one among a plurality of optical paths for each of the first pulses for output. A parallelizing section parallelizes the traveling direction of light beams traveling, respectively, through the plurality of optical paths. A wavelength changing section receives outputs from the parallelizing section and changes the outputs to have their respective different wavelengths for output. A focusing section receives and focuses outputs from the wavelength changing section. An optical fiber receives an output from the focusing section at a core end face. The focusing section is arranged to focus the outputs from the wavelength changing section on the core end face.

Abstract: Embodiments of the present invention provide an apparatus having a plurality of selectable entities having associated physical addresses, wherein the selectable entities are connected to a controller, wherein the selectable entities have a selectable processor configured to determine in response to a common control information a current select information on the basis of selectable logic combinations of a first information describing whether the selectable entity belongs to a first group and a second information describing whether the selectable entity belongs to a second group.

Abstract: According to the present invention, an optical device includes: a first electro-optical member and a second electro-optical member. The first electro-optical member has two convex portions spaced from each other by a recessed portion and a connecting portion arranged under the recessed portion to connect the two convex portions, the first electro-optical member exhibiting an electro-optical effect. The second electro-optical member has a recessed portion member arranged within the recessed portion, the second electro-optical member exhibiting an electro-optical effect. The permittivity of the first electro-optical member is higher than the permittivity of the second electro-optical member. The refractive index of the first electro-optical member is higher than the refractive index of the second electro-optical member. During application of an electric field, light to be transmitted is applied to the recessed portion member.

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.

Abstract: A method for controlling devices in a de-centralized storage environment comprises partitioning a plurality of devices in a network into a plurality of super-cells, wherein each super-cell comprises a subset of the plurality of devices. For each super-cell, a system controller is configured to nominate a device in the super-cell as a nucleus device, wherein the nucleus device in the super-cell controls member devices in the super-cell. The system controller is further configured to transmit commands associated with a specific task to the nucleus device and receive information from the nucleus device regarding performance of the specific task, wherein the information comprises information aggregated from the member devices of the super-cell associated with a performance of a respective portion of the specific task.

Abstract: An apparatus for determining a single decision function is configured to obtain measurements from a plurality of devices under test corresponding to stimulating signals applied to the plurality of devices under test. The stimulating signals correspond to a set of tests performed on the plurality of devices under test. The apparatus may further determine a subset of tests from the set of tests, such that the subset of tests is relevant for indicating whether the plurality of devices under test pass the set of tests. The apparatus may also determine the single decision function applicable to measurements from an additional device under test tested using the subset of tests, such that the single decision function is adapted to predict a test result for the set of tests on the basis of the subset of tests.

Abstract: A multi-beam exposure device reducing variations of electron beam optical systems for electron beams, and preventing vacuum leakage. An exposure device is provided, including: a body tube depressurized to produce a vacuum state therein; multiple charged particle beam sources provided in the body tube, and emitting multiple charged particle beams in a direction of extension of the body tube; multiple electromagnetic optical elements, each provided corresponding to one of the multiple charged particle beams in the body tube, and controlling the one of the multiple charged particle beams; first and second partition walls arranged separately from each other in the direction of extension in the body tube, and forming a non-vacuum space between at least parts of the first and second partition walls; and a supporting unit provided in the body tube, and supporting the multiple electromagnetic optical elements for positioning of the multiple electromagnetic optical elements.

Abstract: Presented embodiments facilitate efficient and effective access to a device under test. In one embodiment, a test system comprises: a primitive configured to control testing of a device under test (DUT) and a device interface board (DIB). The device interface board comprises: a loadboard, an environmental control component and a device under test access interface. The loadboard is configured to selectively couple with a device under test and a primitive. The environmental control component is configured to control environmental conditions. The device under test access interface is configured to allow robotic manipulation of the device under test. The manipulation can include selectively coupling the device under test to the loadboard. The device under test access interface can be configured to enable unobstructed access for robotic manipulation of the device under test.

Abstract: A pulse wave sensor unit includes a pressure sensor, and an adhesive tape to attach the pressure sensor to a measurement portion to be measured. The pressure sensor includes a diaphragm part, and an annular support part which supports the diaphragm part and has an aperture for allowing the diaphragm part to face the measurement portion, and a closed space is able to be formed between the diaphragm part and the measurement portion by attaching the pressure sensor to the measurement portion using the adhesive tape.

Abstract: A test system tests a DUT configured as a wireless device. A golden device is configured to provide bidirectional communication between it and the DUT. A measurement device acquires a first signal S1 including at least an output SDUT of the DUT. An interface unit monitors a second signal S2 including at least one of the output SGD of the golden device and the output SDUT of the DUT. In response to the occurrence of a predetermined waveform pattern in the second signal, the interface unit generates a trigger signal TRIG for instructing the measurement device to acquire a signal.

Abstract: An electronic component handling apparatus includes: a thermostatic chamber in which a socket disposed, the socket electrically being connectable to a device under test (DUT) including a first antenna; a moving device that moves the DUT and presses the DUT against the socket; an anechoic chamber disposed adjacent to the thermostatic chamber; a second antenna disposed inside the thermostatic chamber; and a first window that transmits radio waves radiated from the first or second antenna. The thermostatic chamber has a first opening on a wall surface of the thermostatic chamber. The anechoic chamber has a radio wave absorber and a second opening that opens toward a transmission direction of the radio waves from or to the second antenna. The thermostatic chamber and the anechoic chamber are connected to each other to make the first opening and the second opening face each other.

Abstract: An electronic component handling apparatus includes: a moving device that moves a device under test (DUT) including a first antenna and presses the DUT against a socket. The moving device includes a holder that holds the DUT and a second antenna that receives a radio wave radiated from the first antenna or that radiates the radio wave to the first antenna.

Abstract: An electronic component testing apparatus is used for testing a device under test (DUT). The electronic component testing apparatus includes: a socket unit that is electrically connected to the DUT; a first wiring board; and a tester that comprises a test head in which the first wiring board is mounted. The socket unit includes a first socket and a second socket. The second socket includes a base and a test antenna unit. The tester tests the DUT by transmitting and receiving radio waves between a device antenna unit of the DUT and the test antenna unit while the DUT is electrically connected to the first socket and the first socket is electrically connected to the test head through the second socket.