Abstract: An electronic component handling apparatus, for handling a DUT having a temperature detection circuit and pressing the DUT against a socket electrically connected to a tester testing the DUT, includes: a temperature adjuster adjusting a temperature of the DUT; a first calculator calculating the temperature of the DUT based on a detection result of the temperature detection circuit; a temperature controller controlling the temperature adjuster; and a first receiver receiving a first signal output from the tester, a temperature control including a first temperature control based on the temperature of the DUT calculated by the first calculator and a second temperature control, and the temperature controller switching the temperature control of the DUT from the first temperature control to the second temperature control when the first receiver receives the first signal after the temperature controller starts the first temperature control.

Abstract: A burn-in board capable of realizing a uniform temperature distribution inside a burn-in board is provided. A burn-in board includes: a plurality of sockets; a burn-in board body including an upper surface for mounting the sockets thereon and a lower surface on the side opposite to the upper surface; a reinforcement frame contacting the lower surface; a bottom cover contacting the reinforcement frame; a heat conduction plate interposed between the burn-in board body and the bottom cover; and a heat conduction sheet thermally connecting the burn-in board body to the heat conduction plate, in which the reinforcement frame presses the heat conduction plate toward the heat conduction sheet.

Abstract: An apparatus for providing a supply voltage to a device under test includes: a controlled source; a switchable resistor circuited between the output of the controlled source and a dut port, having a comparatively smaller first resistance in a first switch state and a second resistance in a second switch state; a regulator that provides a control signal to the controlled source, to regulate a voltage to be provided to the dut. The apparatus changes a switch state of the switchable resistor while a voltage is provided to the dut via the switchable resistor. The apparatus injects a compensation signal into a control loop including the regulator, the controlled source and the switchable resistor, to thereby cause a change of the voltage provided by the controlled source, to at least partially compensate a change of a voltage drop across the switchable resistor.

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.

Abstract: According to the present invention, a pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses. An optical path determining section receives the first pulses and determines one or more among two or more optical paths for each of the first pulses for output. A wavelength changing section receives light beams travelling, respectively, through the two or more optical paths and, when the power of the traveling light beams exceeds a threshold value, changes the light beams to have their respective different wavelengths for output. A multiplexer multiplexes outputs from the wavelength changing section. The optical path determining section allows for change in the power ratio between a first power of the light beam traveling through one of two among the two or more optical paths and a second power of the light beam traveling through the other of the two optical paths.

Abstract: An electronic component handling apparatus for handling a DUT and pressing the DUT against a socket electrically connected to a tester, including: a temperature adjuster adjusting a temperature of the DUT; a first calculator calculating the temperature of the DUT on the basis of a detection result of a temperature detection circuit disposed in the DUT; a temperature controller controlling the temperature adjuster; and a first controller outputting a first signal to the temperature controller. A temperature control includes a first temperature control based on the temperature of the DUT calculated by the first calculator and a second temperature control, and when the first signal is input from the first controller to the temperature controller after the temperature controller starts the first temperature control, the temperature controller switches the temperature control from the first temperature control to the second temperature control.

Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system comprises pre-qualifying test components, functional test components, a controller, a transceiver, and a switch. The pre-qualifying test components are configured to perform pre-qualifying testing on a device under test. The functional test components are configured to perform functional testing on the device under test. The controller is configured to direct selection between the pre-qualifying testing and functional testing. The transceiver is configured to transmit and receive signals to/from the device under test. The switch is configured to selectively couple the transceiver to the pre-qualifying test components and functional test components.

Abstract: The socket 20 comprises a first contact probe 21 which has a first end which is to contact with a first terminal 91 of the DUT 90, a second contact probe 22 which has a second end which is to contact with a second terminal 92 of the DUT 90, and an inner housing 23 which holds the first and second contact probes 21, 22 so that the first end and the second end are located on substantially the same virtual plane VP, and the length L2 of the second contact probe 22 is shorter than the length L1 of the first contact probe 21. The interposer 30 comprises a substrate 31 which has a through hole 311 into which the first contact probe 21 is to be inserted, and a wiring pattern 32 which is disposed on the substrate 31, and the wiring pattern 32 has a pad 321 with which the second contact probe 22 is to contact.

Abstract: A nanopore device includes an aperture and an electrode pair. A transimpedance amplifier converts a current signal IS that flows through the nanopore device into a voltage signal VS. The nanopore device measures small particles based on first data obtained by removing a DC component from the voltage signal VS and second data obtained based on the voltage signal VS from which the DC component has not been removed. Furthermore, the nanopore device is capable of monitoring the state of the nanopore device.

Abstract: An electronic component presser is included in an electronic component testing apparatus used to test a device under test (DUT). The electronic component testing apparatus includes an electronic component handler, an electronic component tester, and a first socket. The electronic component presser connects to the electronic component handler and to the electronic component tester. The electronic component presser includes: a holding plate that holds the DUT that has been carried to the holding plate by a contact arm of the electronic component handler; a transport unit that moves the DUT between the holding plate and the first socket; a pusher that presses the DUT that has been disposed on the first socket; and an antenna unit comprising a measurement antenna that faces a device antenna of the DUT disposed on the first socket.

Abstract: Embodiments of the present invention provide a method of simulating a memory-based communication protocol for testing a simulated device. The method includes storing data in known locations of a host data buffer, where the host data buffer is implemented in a shared memory space, executing instructions of a first program to store a command in the shared memory space using a data structure including an index, an ID, and a memory location, executing instructions of a second program to read the command from the host data buffer, access the data in the shared memory space to perform an operation defined by the ID using the data, where a location of the data is indicated by the index, and send a completion indicator to the first program after the operation is complete.

Abstract: A test apparatus includes an electrical connection unit electrically connected to respective terminal of each of a plurality of LEDs to be tested, a light source unit which collectively irradiates the plurality of LEDs with light, a measuring unit which measures a photoelectric signal that each of the plurality of LEDs outputs via the electrical connection unit after photoelectrically converting the light with which the light source unit irradiates the plurality of LEDs, and a determination unit which determines pass or fail of each of the plurality of LEDs based on the measurement results by the measuring unit.

Abstract: There is provided a calibration device including: a calibration signal supply unit configured to supply, as a calibration input signal, a multitone signal having tones in a plurality of frequency bands to a converter configured to multiply an input signal by each of a plurality of signal patterns and limit a band to obtain each of a plurality of bandpass signals, and reconstruct an output signal in accordance with an input signal from the plurality of bandpass signals; a calibration bandpass signal acquisition unit configured to acquire a plurality of calibration bandpass signals obtained by the converter in response to the multitone signal; and a calibration processing unit configured to calibrate a parameter for the reconstruction in the converter based on the plurality of calibration bandpass signals.

Abstract: An electronic component handling apparatus includes: a thermostatic chamber in which a socket disposed, the socket electrically being connectable to a device under test (DUT) including a first antenna; a moving device that moves the DUT and presses the DUT against the socket; an anechoic chamber disposed adjacent to the thermostatic chamber; a second antenna disposed inside the thermostatic chamber; and a first window that transmits radio waves radiated from the first or second antenna. The thermostatic chamber has a first opening on a wall surface of the thermostatic chamber. The anechoic chamber has a radio wave absorber and a second opening that opens toward a transmission direction of the radio waves from or to the second antenna. The thermostatic chamber and the anechoic chamber are connected to each other to make the first opening and the second opening face each other.

Abstract: Provided is an apparatus including a generating section that generates an altered test candidate obtained by adding an alteration shortening an execution time of a test to a target test for testing a device under test; a test processing section that causes a test apparatus to perform the altered test candidate on the device under test; and a comparing section that compares an altered test result of the device under test resulting from the altered test candidate to a target test result of the device under test resulting from the target test; and a judging section that judges whether the target test can be replaced by the altered test candidate, based on the comparison result of the comparing section.

Abstract: An electronic component presser is included in an electronic component testing apparatus used to test a device under test (DUT). The electronic component testing apparatus includes an electronic component handler, an electronic component tester, and a first socket. The electronic component presser connects to the electronic component handler and to the electronic component tester. The electronic component presser includes: a holding plate that holds the DUT that has been carried to the holding plate by a contact arm of the electronic component handler; a transport unit that moves the DUT between the holding plate and the first socket; a pusher that presses the DUT that has been disposed on the first socket; and an antenna unit comprising a measurement antenna that faces a device antenna of the DUT disposed on the first socket.

Abstract: A waveform data acquisition module acquires the waveforms of electrical signals for multiple channels. A memory controller continuously writes a digital signal S3 to one from among a first memory unit and a second memory unit. When a given memory unit has become full, the memory controller notifies an external higher-level controller that the corresponding memory unit is full and switches the wiring target to the other memory unit.

Abstract: A nanopore device includes an aperture and an electrode pair. A transimpedance amplifier converts a current signal IS that flows through the nanopore device into a voltage signal VS. The nanopore device measures small particles based on first data obtained by removing a DC component from the voltage signal VS and second data obtained based on the voltage signal VS from which the DC component has not been removed. Furthermore, the nanopore device is capable of monitoring the state of the nanopore device.

Abstract: A front-end circuit is used to test an RF signal from an RF device. The RF signal is generated by modulating a carrier signal having a carrier frequency with a wideband baseband signal. A variable frequency oscillator generates a local signal having a variable local frequency. The first frequency mixer frequency mixes a local signal and an RF signal to generate an IF signal having a frequency. A band-pass type first filter filters the IF signal. The local frequency can be selected from a plurality of frequencies having a frequency interval equal to or narrower than a bandwidth of the first filter.

Abstract: Provided is an examination apparatus including a target image acquiring section that acquires a target image obtained by capturing an examination target; a target image masking section that masks a portion of the target image; a masked region predicting section that predicts an image of a masked region that is masked in the target image; a reproduced image generating section that generates a reproduced image using a plurality of predicted images predicted respectively for the plurality of masked regions; and a difference detecting section that detects a difference between the target image and the reproduced image.