Abstract: Aspects of the present disclosure involve a system comprising a computer-readable storage medium storing at least one program, and a method of improving a speed of decoding digital data. The method may include receiving a digital communication that includes digital data; specifying a partition of a plurality of elements of a Galois field into a plurality of sets; specifying an error locator polynomial function for a Reed-Solomon forward error correction module; specifying, for each set of the plurality of sets, a second function dependent upon the error locator polynomial function and one or more characteristics of the respective set; computing the second function for each of the plurality of sets to find roots of the error locator polynomial function; outputting the roots of the error locator polynomial function to a Reed-Solomon forward error correction decoder module; and decoding the digital data included in the received digital communication using the roots.

Abstract: Disclosed are techniques for generating a parasitic-aware simulation schematic across multiple design fabrics. These techniques identify a first extracted model from existing extracted models for a first circuit component design in a first layout in a first design fabric of an electronic design that spans across multiple design fabrics. These techniques further generate a simulation schematic by inserting the first extracted model into the simulation schematic. In addition, a simulation may be performed with the simulation schematic to generate simulation results. Schematic models, if existing, may also be used to revise the simulation schematic. For circuit component designs corresponding to no extract models or schematic models, one or more extracted models placeable in the simulation schematic may also be constructed to update the simulation schematic.

Abstract: A single block shifter design performing arithmetic and logical shift operations on input operands of multiple types is disclosed. The shifter design may be configurable and automatically generated to support multiple partition types including at least one of 80-bit, 40-bit, and 20-bit partition type. The shifter may also be configured and automatically generated to perform rotate operations on input operands. The shifter may include two stages where the first stage includes multiple multiplexers performing shift or rotate operations by one or more shift or rotate amounts without saturation, and the second stage includes multiple multiplexers performing operations with saturation. The shifter includes an inversion block to process signed and unsigned input data. A method of automatically generating the shifter design with an electronic design tool is also disclosed.

Abstract: Various embodiments implementing a multi-fabric mixed-signal electronic system design spanning across multiple design fabrics with electrical and/or thermal analysis awareness. A schematic design may be extracted from and a power delivery network (PDN) model may be determined from a plurality of layouts in multiple design fabrics in a multi-fabric design environment platform. A PDN-aware, multi-fabric full system schematic may be constructed by assembling the PDN model and the schematic design into the PDN-aware, multi-fabric full system schematic. For a schematic generated for a circuit block of interest, chip power models may be determined for the remaining portion of the multi-fabric mixed-signal electronic system design, and the PDN-aware, multi-fabric full system schematic may be updated by accounting for the chip power models. The circuit block of interest may then be electrically and/or thermally analyzed within the context of the remaining portion.

Abstract: A method for minimizing skew in a High Bandwidth Memory (HBM) device is provided. The method includes grouping a plurality of information bits of the HBM device into at least two groups of information bits, wherein the plurality of information bits includes a plurality of data bits and a plurality of control bits, and the plurality of information bits are grouped such that each group of the at least two groups includes at least one control bit and the at least two groups form a byte of data. The method further includes delaying the plurality of information bits of each group of the at least two groups during a data transfer operation to minimize the skew between the at least two groups of information bits.

Abstract: A host system for transferring data to a target system is provided. The host system may include a layout database for storing mask layout data representing an integrated circuit (IC) in terms of planar geometric shapes. The hosts system may further include a processor configured to import the mask layout data from the layout database to a memory-mapped disk in the host system. The processor is further configured to translate the mask layout data into one or more cell views according to a table hierarchy in the memory-mapped disk. The processor is further configured to transmit the one or more cell views from the memory-mapped disk to a magnetic disk of the target system.

Abstract: The present disclosure relates to a system and method for electronic design automation. Embodiments may include receiving, using at least one processor, an electronic design and determining one or more graph based analysis (“GBA”) violating nodes associated with the electronic design. Embodiments may include identifying a non-covered violating node from the GBA violating nodes and determining a worst timing path through the non-covered violating node. Embodiments may further include invoking a path-based analysis (“PBA”) on the worst timing path and determining if the worst timing path satisfies the PBA analysis.

Abstract: An emulation system for efficient data streaming is provided. The emulation system comprises a first device configured to product machine readable binary data, and a second device configured to receive the data. The emulation system further comprises a centralized first-in first-out (FIFO) memory unit. The centralized FIFO memory unit interfaces between the first device and the second device. The centralized FIFO memory unit is configured to receive the data from the first device, and transmit to the second device on receiving a transfer request from the first device or the second device.

Abstract: Embodiments for diagnosing failure locations in one or more electronic circuits. Embodiments may include generating a plurality of core instances of at least one core, for each electronic circuit, with one or more outputs and compressing the outputs of each instance into primary output pins based upon compression equations. Embodiments may include applying test patterns to the plurality of core instances and identifying failures based upon compressed test patterns received at the primary output pins. Embodiments may include performing fault selection on a single core instance for each failure associated with the plurality of core instances and performing fault simulations on the single core instance for each candidate faults associated with the plurality of core instances. Embodiments may include generating fault signatures for each detected fault based upon the instances associated with each detected fault and analyzing each fault signature to determine failure locations.

Abstract: The present disclosure relates to a system and method for modeling an electronic circuit design. Embodiments may include receiving, at one or more computing devices, an electronic circuit design. Embodiments may also include partitioning, at a graphical user interface configured to display at least a portion of the electronic circuit design, at least one portion of the electronic circuit design into one or more sub-zones and generating, at the graphical user interface, one or more ports at each interface between one or more sub-zones. Embodiments may further include receiving a selection for an electromagnetic (EM) solver for each of the one or more sub-zones. Embodiments may also include modeling each of the one or more sub-zones.

Abstract: Method and apparatus for testing the memory components of an integrated Circuit (IC) using a routing logic and a built-in design for test (DFT) hardware processing device. Based on input provided from an interface controller to the IC, the IC is tested according to one of at least two modes. In a first mode, the built-in DFT hardware processing device executes a test that checks for faults in the physical memory of the IC. In a second mode, the built-in DFT hardware processing device executes a test that checks for faults in the error correction logic of the IC. By using the same routing logic and built-in DFT hardware processing device, tests of the memory components according to the first and second mode can be executed on an automatic and serial basis, even after the manufacture of the IC.

Abstract: Disclosed are techniques for implementing formal verification of an electronic design. These techniques identify a target property for verification in a hierarchical electronic design that has a plurality of hierarchies and perform hierarchical synthesis on a hierarchy or a portion thereof in the plurality of hierarchies while black-boxing a remaining portion of the hierarchical electronic design. Cone of influence (COI) data that is relevant to the target property may be determined at least by extracting the cone of influence data from a hierarchically synthesized hierarchy or portion of the hierarchy or the portion thereof. At least the cone of influence data may be forwarded to a formal engine that uses the cone of influence data to verify the target property.

Abstract: Systems and methods disclosed herein provide for a fractional feedback divider with reduced jitter at the output without increasing the input clock frequency and with minimal power increase. Embodiments of the system provide for interpolating, with a multiplexer, different output clock signals depending on whether an extra half period of resolution from the input clock is needed for a certain output clock cycle.

Abstract: A method for generating a minimized combined scenario for use in simulation, from a post-silicon validation test that includes a combined scenario, may include obtaining a failed scenario loop of a scenario of the combined scenario that includes combined action scenarios that were executed in loops during a post-silicon validation test of a system on chip; and adding any loops of other scenarios of the combined scenario that were executed at least partially concurrently with the failed scenario loop, while discarding any loops of other scenarios of the combined scenario that were completed during the post-silicon validation test before the failed scenario loop or did not commence before the failed scenario loop was completed.

Abstract: An improved approach is provided to displaying waveform data, where a schematic and corresponding waveform data can be displayed directly on a schematic of an electronic circuit. By providing both the schematic and waveform results in a same display, circuit designers and verification engineers are given more control over their working environments and can more efficiently utilize available data including the schematic and the waveform data. Furthermore, results can be pinned to a relevant net to which those results correspond providing circuit designers and verification engineers with an ability to view only the available data they wish to view, and to do so in a context of the electronic circuit itself on the schematic.

Abstract: Disclosed herein are components of an emulation system capable of efficiently recreating the functionality a CAM/TCAM memory circuit. Rather than using specialized gates or the existing processors, the embodiments described herein configure/instruct the existing memory circuits of the emulation system to imitate a search engine function that queries the existing RAM circuits, portions of which are reconfigured to function as CAM/TCAM memory. The hardware-based search engine and the repurposed memory (e.g., RAM, SRAM, DRAM) allow an emulation system to emulate the functionality of a CAM/TCAM memory. This can be implemented at a low processing cost to the emulation system, as it provides the ability to store more CAM/TCAM data at a very low cost. It can also use the existing system and emulation buses that other components (e.g., processors) of the system use to communicate with the memory, so expansion of the emulation system may not be required.

Abstract: A method and system for debugging memory allocation and memory release may include recording execution events of an execution run of a program including data related to objects pertaining to that program, and data related to object association pertaining to that program at a plurality of points in time. The method may also include receiving via a user interface a user selection of an object of said objects. The method may further include identifying one or a plurality of pointers pointing from one or a plurality of objects at the selected object based on the recorded data related to object association and finding one or a plurality of execution events of said execution events corresponding to assignments of said one or a plurality of pointers. The method may further include distinctly marking a portion of the code, presented to the user on a display device, representing said one or a plurality of execution events that correspond to assignments of said one or a plurality of pointers.

Abstract: Disclosed is an approach to implement a requirements-driven analog verification flow. Disparate islands of verification tasks are performed with individual cellviews to be set into an overarching and closed loop verification flow context for a project or a complex verification task.

Abstract: Disclosed herein are systems and methods that allow a layout editor function, presented in a graphical user interface, of an EDA, to indicate certain layout instances or “cell views” as “transparent.” The instances are indicated as transparent using various layout editor commands or layout designer markers. Unlike conventional solutions, a binder within the layout editor of the EDA is not required to bind layout transparent instances to corresponding instances in a related schematic design file or records. Instead, the EDA may identify non-transparent instances at a lower-level of the layout design's hierarchy to bind, because the systems and methods described herein provide for a transparent instance container at a hierarchically higher-level.

Abstract: Aspects of the present disclosure involve a system comprising a computer-readable storage medium storing at least one program, and a method for behavioral modeling of jitters due to power supply noise for input/output (I/O) buffers. The method may include accessing physical model data describing a physical structure of an integrated circuit device, and accessing a behavioral model schema for evaluating electrical characteristics of the integrated circuit device including jitter effects introduced by power noise in the integrated circuit device. The method may further include generating behavioral model data based on the physical model data, the behavioral model data including the electrical characteristics of integrated circuit device. The method may further include providing a data file including the behavioral model data.