Patents Assigned to JEOL Ltd.
  • Patent number: 10714308
    Abstract: Provided is a measurement method for measuring, in an electron microscope including a segmented detector having a detection plane segmented into a plurality of detection regions, a direction of each of the plurality of detection regions in a scanning transmission electron microscope (STEM) image, the measurement method including: shifting an electron beam EB incident on a sample S under a state where the detection plane is conjugate to a plane shifted from a diffraction plane to shift the electron beam EB on the detection plane, and measuring a shift direction of the electron beam EB on the detection plane with the segmented detector; and obtaining the direction of each of the plurality of detection regions in the STEM image from the shift direction.
    Type: Grant
    Filed: September 14, 2018
    Date of Patent: July 14, 2020
    Assignee: JEOL Ltd.
    Inventor: Yuji Kohno
  • Patent number: 10705164
    Abstract: A pair of detection coils, one coil provided on each side of a sample container across the width of the sample container. The detection coil is made of a superconductor and has an electric circuit pattern capable of detecting a magnetic resonance signal from a sample. The detection coil includes a lateral component intersectional to a static magnetic field H0 and having a part disposed at a position spaced away from a detection region, as compared to the remaining part.
    Type: Grant
    Filed: May 11, 2017
    Date of Patent: July 7, 2020
    Assignee: JEOL Ltd.
    Inventors: Fumio Hobo, Katsuyuki Toshima, Shinji Nakamura, Shigenori Tsuji, Ryoji Tanaka, Hiroto Suematsu
  • Patent number: 10705165
    Abstract: A magnetic resonance signal detection module includes an insulator block having a coil mounting section including a through hole serving as a detection hole into which a sample container is inserted. A low-frequency coil is provided on an inner surface of the through hole. A high-frequency primary resonator is embedded in the coil mounting section so as to surround the low-frequency coil.
    Type: Grant
    Filed: July 12, 2018
    Date of Patent: July 7, 2020
    Assignees: JEOL Ltd., National Institute for Materials Science
    Inventors: Tadashi Shimizu, Takashi Mizuno, Mitsuru Toda, Takahiro Nemoto, Hideo Shino
  • Patent number: 10699870
    Abstract: A sample carrier capable of preventing damage to a support stage on which a sample holder is placed while ensuring a sufficient level of conveyance speed includes a sample holder, a holder mounting member, and a transport portion. The transport portion has a drive source (constant-speed motor), a rotary member (second toothed wheel), a guide portion (linear guide), and a rod. The rotary member is rotated about its axis of rotation by the drive source. The guide portion operates to guide the holder mounting member in a linear direction perpendicular to the axis of rotation of the rotary member. The rod is rotatably coupled to the rotary member and to the holder mounting member and has a coupled portion coupled to the rotary member. At a midpoint of the range of movement of the holder mounting member, the shortest distance from the coupled portion to the guide portion is greatest.
    Type: Grant
    Filed: August 5, 2019
    Date of Patent: June 30, 2020
    Assignee: JEOL Ltd.
    Inventor: Shuho Yoshida
  • Patent number: 10690691
    Abstract: According to an aspect of the present invention, there is provided an automatic analyzer that detects a liquid level by using an electrostatic capacity system. Feature values are extracted from time-series oscillating frequency data of an alternating current signal that is output by an oscillation circuit in a period from a time point at which a dispensing probe starts moving downward till a time point at which a certain period of time has elapsed. On the basis of the feature values from the time-series oscillating frequency data, it is determined whether or not the liquid level in a container has been detected properly, by using different methods. Whether a gap is present between the tip portion of the dispensing probe and the liquid level in the container and a reason for the gap are determined from a combination of multiple determination results obtained by using the methods.
    Type: Grant
    Filed: July 24, 2017
    Date of Patent: June 23, 2020
    Assignee: JEOL Ltd.
    Inventor: Tsuyoshi Yaita
  • Patent number: 10636643
    Abstract: An ionization method selection assisting image includes a coefficient axis indicating the magnitude of a partition coefficient, a plurality of method indicators representing a plurality of coefficients or a plurality of coefficient ranges corresponding to a plurality of ionization methods, and a sample marker representing the partition coefficient specified for a sample. The ionization method selection assisting image is displayed to a user. A partition coefficient may be specified for a sample after derivatization.
    Type: Grant
    Filed: February 13, 2018
    Date of Patent: April 28, 2020
    Assignee: JEOL Ltd.
    Inventors: Kazuko Oka, Haruo Iwabuchi, Takaya Sato
  • Patent number: 10629407
    Abstract: A charged particle beam device includes: a detection chamber flange; a detector; a detector holding stand which holds the detector; a first shaft which is slidably inserted into a guide hole and connected to the detector holding stand, the guide hole being provided in the detection chamber flange; a first flange which is attached to the detection chamber flange and has a spherical bearing; a second flange which is supported by the spherical bearing of the first flange; and a second shaft which is slidably inserted into a guide hole provided in the second flange and passes through a through-hole in the detection chamber flange to be connected to the detector holding stand, each of the first shaft and the second shaft being provided with a flow channel of a heat transfer medium for cooling or heating the detector.
    Type: Grant
    Filed: November 8, 2018
    Date of Patent: April 21, 2020
    Assignee: JEOL Ltd.
    Inventor: Tomohisa Fukuda
  • Patent number: 10629420
    Abstract: An ion intensity array is computed for each mass spectrum forming a mass spectrum array. For each ion intensity array, a plurality of indices a˜e showing a plurality of characteristics of the mass spectrum as a whole are computed. Based on the plurality of indices, a plurality of index distribution images are computed. A plurality of index distribution images may alternatively be computed based on a mass image array generated from the mass spectrum array.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: April 21, 2020
    Assignee: JEOL Ltd.
    Inventor: Takaya Satoh
  • Patent number: 10628005
    Abstract: An image display device includes: a selection screen display control section that performs a control process that displays a selection screen on a display section, a plurality of element buttons for selecting an analysis target element being arranged within the selection screen; and a sub-image display control section that performs a control process that reads analytical condition information about an element that corresponds to an element button among the plurality of element buttons that has been selected by using pointing means from a storage section, and displays a sub-image that represents the analytical condition information with a character that is larger than a character used for the element button on the display section.
    Type: Grant
    Filed: March 2, 2016
    Date of Patent: April 21, 2020
    Assignee: JEOL Ltd.
    Inventor: Kazuhiro Tachibana
  • Patent number: 10620282
    Abstract: In various embodiments of the invention, inductive coupling can be to a secondary coil rather than a primary coil in order to optimize the topology of the NMR probe. In addition, by coupling to a secondary coil using a detection coil located below the lower insulator the RF homogeneity and signal to noise can be improved together with the NMR probe topology. By effecting inductive coupling to an inductor in a multiple resonance circuit, rather than to the sample inductor parameters associated with the NMR, probe construction can be arranged to increase RF homogeneity and signal to noise, while reducing space utilization constraints. In various embodiments of the invention, the primary mode in a secondary coil can be split into two modes with a resonator with inductive coupling to the secondary coil.
    Type: Grant
    Filed: August 3, 2018
    Date of Patent: April 14, 2020
    Assignee: JEOL, Ltd.
    Inventor: Albert Zens
  • Patent number: 10613043
    Abstract: A method of sample analysis is offered which provides improved quantitative accuracy. This method starts with irradiating a sample with an electron beam. Characteristic X-rays emanating from the sample are detected. Plural data sets about intensities of characteristic X-rays corresponding to a specific element contained in the sample are obtained. The element is quantitatively analyzed based on the plural data sets. This method includes a step (S20) for calculating quantitative values for the element for the plural data sets, respectively, about the characteristic X-ray intensities, a step (S30) for calculating weights for the quantitative values, respectively, based on the plural data sets about the characteristic X-ray intensities, and a step (S40) for calculating a weighted average of the quantitative values based on the weights.
    Type: Grant
    Filed: February 12, 2019
    Date of Patent: April 7, 2020
    Assignee: JEOL Ltd.
    Inventor: Shingo Kinoshita
  • Patent number: 10607803
    Abstract: An electron microscope includes an electron source, an extraction electrode that extracts an electron beam emitted from the electron source, a monochromator having an energy filter that disperses the electron beam emitted from the electron source based on an energy thereof and an energy selection slit that selects the energy of the electron beam, an incident-side electrode provided between the extraction electrode and the monochromator, and an incident-side electrode controller that controls the incident-side electrode based on a change in a voltage applied to the extraction electrode.
    Type: Grant
    Filed: November 1, 2018
    Date of Patent: March 31, 2020
    Assignee: JEOL Ltd.
    Inventor: Masaki Mukai
  • Patent number: 10593072
    Abstract: An image processing apparatus including a processor and a memory, the processor executing a program stored in the memory to: acquire elemental map data representing a distribution of X-ray intensity or a distribution of concentration for each element; generate a phase map indicating a distribution of phases of compounds based on the elemental map data; and generate graphs representing X-ray intensity of each element or a concentration of each element as an area for the respective phases of the compounds included in the phase map and cause a display section to display the graphs.
    Type: Grant
    Filed: May 25, 2018
    Date of Patent: March 17, 2020
    Assignee: JEOL Ltd.
    Inventors: Naoki Katoh, Norihisa Mori
  • Patent number: 10571533
    Abstract: A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. The method further includes irradiating the shape-processed superconductive thin-film layer with ions. Accordingly, lattice defects serving as pinning can be formed in the superconductive thin-film layer.
    Type: Grant
    Filed: July 19, 2017
    Date of Patent: February 25, 2020
    Assignee: JEOL Ltd.
    Inventors: Shigetoshi Oshima, Shigenori Tsuji
  • Patent number: 10562039
    Abstract: An automatic analysis device and method having a BF separation process, wherein the width in a container conveyance direction of a surface facing a reaction container of a magnet for preliminary magnetic collection of a first magnetic generation part (32p) is set to have a length including a region for housing a liquid sample of the reaction container conveyed to a magnetic collection position of the first magnetic generation part. An end in the container conveyance direction of a surface facing the reaction container of a magnet for regular magnetic collection of a second magnetic generation part (32m) is designed to be close to the center of the region for housing the liquid sample of the reaction container conveyed to a magnetic collection position of the second magnetic generation part.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: February 18, 2020
    Assignees: JEOL Ltd., Fujirbio Inc.
    Inventors: Mizuki Nakamura, Tomohiro Endo, Kazuyuki Oguri
  • Patent number: 10546714
    Abstract: There is provided an energy filter capable of being simplified in structure and of achieving low aberrations. The energy filter (100) includes a first sector magnet (10) and a second sector magnet (20). The first and second magnets (10, 20) are configured mirror-symmetrically with respect to a symmetry plane (M). There are one focal point of crossover in the X direction and one focal point of crossover in the Y direction. The focal point of crossover in the X direction and the focal point of crossover in the Y direction are at an energy dispersive plane (S2). There are two focal points of image in the X direction and two focal points of image in the Y direction. The focal points of image in the X direction and the focal points of image in the Y direction are at the symmetry plane (M) and at an achromatic plane (A2).
    Type: Grant
    Filed: February 7, 2018
    Date of Patent: January 28, 2020
    Assignee: JEOL Ltd.
    Inventor: Kazuya Omoto
  • Patent number: 10541107
    Abstract: A three-dimensional image reconstruction method associated with the present invention includes the steps of: obtaining a first transmission electron microscope image of a sample containing the membrane proteins present within a lipid membrane, the image having been taken by illuminating an electron beam on the sample from a direction tilted relative to a line normal to the membrane surface of the lipid membrane; obtaining a second transmission electron microscope image of the sample taken by illuminating the electron beam on the sample perpendicularly to the membrane surface of the lipid membrane; identifying orientations of the membrane proteins of the first transmission electron microscope image on a basis of the second transmission electron microscope image; and analyzing a three-dimensional structure of the membrane proteins from the first transmission electron microscope image on a basis of information about the identified orientations of the membrane proteins.
    Type: Grant
    Filed: August 21, 2015
    Date of Patent: January 21, 2020
    Assignees: National University Corporation Nagoya University, JEOL Ltd.
    Inventors: Yoshinori Fujiyoshi, Isamu Ishikawa, Naoki Hosogi
  • Patent number: 10539634
    Abstract: A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. The method further includes irradiating the shape-processed superconductive thin-film layer with ions. Accordingly, lattice defects serving as pinning can be formed in the superconductive thin-film layer.
    Type: Grant
    Filed: July 19, 2017
    Date of Patent: January 21, 2020
    Assignee: JEOL Ltd.
    Inventors: Shigetoshi Oshima, Shigenori Tsuji
  • Patent number: 10541111
    Abstract: A distortion measurement method for an electron microscope image includes: loading a distortion measurement specimen having structures arranged in a lattice to a specimen plane of an electron microscope or a plane conjugate to the specimen plane in order to obtain an electron microscope image of the distortion measurement specimen; and measuring a distortion from the obtained electron microscope image of the distortion measurement specimen.
    Type: Grant
    Filed: May 25, 2018
    Date of Patent: January 21, 2020
    Assignee: JEOL Ltd.
    Inventors: Yuji Konyuba, Kazuya Omoto, Hidetaka Sawada
  • Patent number: 10529530
    Abstract: There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (S); a detector (40) for detecting, in the analysis position, a signal produced from the sample (S) by impingement of the charged particles on the sample (S); a drive mechanism (42) for moving the detector (40) into the analysis position; and a controller (52) for controlling the drive mechanism (42). The controller (52) performs the steps of: obtaining information about the type of the sample holder (20); determining the analysis position on the basis of the obtained information about the type of the sample holder (20); and controlling the drive mechanism (42) to move the detector (40) into the determined analysis position.
    Type: Grant
    Filed: November 2, 2016
    Date of Patent: January 7, 2020
    Assignee: JEOL Ltd.
    Inventor: Shuji Kawai