Abstract: To clean a nozzle that is part of an automated analyzer and is provided with both a tubular discharge unit that discharges a cleaning liquid and a tubular suction unit that suctions in cleaning liquid that was discharged from the discharge unit and is running down an outer surface, first the discharge unit is made to start discharging, and then in parallel with said discharging, the suction unit is made to start suctioning. After the suction unit has suctioned in the cleaning liquid running down the aforementioned outer surface for a prescribed length of time, the suctioning is temporarily stopped. Next, after a prescribed amount of the cleaning liquid has accumulated in a cleaning tank, the discharging is stopped, and with the suction unit immersed in the cleaning liquid accumulated in the cleaning tank, the suctioning is restarted.

Abstract: A mass spectrometry data processing apparatus includes a data processing part and a calculation part. The calculation part calculates differences in mass among all pieces of the peak data from the peak list, calculates an intensity ratio that is a ratio of intensity between two pieces of the peak data used in calculating the difference, and generates difference-intensity ratio data. Further, the calculation part retrieves difference-intensity ratio data having the difference included in a section, calculates a sum of the intensity ratio of the retrieved difference-intensity ratio data, and calculates difference-intensity ratio distribution data.

Abstract: A sample holder capable of limiting X-rays accepted into an X-ray detector is provided. The sample holder is for use in an electron microscope equipped with a polepiece assembly and a semiconductor detector. The sample holder includes: a sample stage on which a sample is held; and a shield plate. When the sample stage has been introduced in the sample chamber of the electron microscope, the shield plate is located between the polepiece assembly and the semiconductor detector.

Abstract: Provided is an image processing apparatus, which is configured to perform smoothing processing on a mapping image obtained by detecting a signal emitted from one of a plurality of analysis areas of a specimen. The image processing apparatus includes: a memory; and a processor configured to execute a program stored in the memory to perform: processing for calculating a difference between a maximum value and a minimum value of signal intensity data being intensity information on the signal of one of pixels within the mapping image, and determining a degree of smoothing to be used for the smoothing processing based on the difference; and processing for performing the smoothing processing based on the determined degree of smoothing.

Abstract: There is disclosed an NMR signal processing method for accurately estimating the intensities of p peaks of interest in an NMR spectrum by the use of a mathematical model that represents a time-domain, free induction decay (FID) signal obtained by an NMR measurement as a sum of q signal components. First, q parameters (each being a combination of a pole and a complex intensity) defining q signal components are estimated for each value of the estimation order q of the mathematical model while varying the value of the estimation order q (S34). At each value of the estimation order q, p parameters are selected from the q parameters in accordance with selection criteria (S42, S46). The selected p parameters are evaluated (S48). An optimal value of the estimation order is determined based on the evaluation values produced at the various values of the estimation order q, and p parameters corresponding to the optimal value of the estimation order is identified.

Abstract: There is provided a method which is for use in a charged particle beam system including an illumination system equipped with an aberration corrector having a plurality of stages of multipole elements and a transfer lens system disposed between the multipole elements, the method being capable of correcting distortion in a shadow of an aperture of the illumination system. The method involves varying excitations of the transfer lens system to correct distortion in the shadow of the aperture of the illumination system.

Abstract: A sample tube carrier includes a housing space in which a sample tube can be accommodated, and a locking mechanism constituted by a valve and a spring. When introducing a sample tube, the sample tube carrier is mounted on one end of a sample tube passage member communicating with an NMR probe device and the one end comes into contact with the valve and brings the valve into an opened state, thereby introducing the sample tube into the NMR probe device through the sample tube passage member. When collecting the sample tube, gas is jetted into the sample tube passage member toward the housing space and the gas pressure acts to discharge the sample tube from the NMR probe device to the housing space through the sample tube passage member.

Abstract: A mass spectrometry data processing apparatus includes a computation unit and a seeking unit. The computation unit calculates the mass difference ?m/z between the peaks of two molecules selected from mass spectrum data or obtains the mass difference ?m/z. The seeking unit estimates a combination of atoms between the peaks of the two molecules in a range of the mass difference ?m/z. The seeking unit seeks the combination of atoms having a mass difference, which matches the mass difference ?m/z, between a set of atoms desorbed from a first molecule of the two molecules and a set of atoms added to the first molecule.

Abstract: A sample holder unit includes a sample holding portion, a shielding plate, and a rotating mechanism. The rotating mechanism supports the sample and the shielding plate and allows the sample and the shielding plate to rotate. The rotating mechanism is oriented such that an axis of rotation thereof is parallel to both a processing surface of the sample and a direction orthogonal to a direction of projection of the sample from the shielding plate. A center of rotation of the rotating mechanism resides on the processing surface of the sample.

Abstract: There is provided an electron microscope capable of recording images in a shorter time. The electron microscope (100) includes: an illumination system (4) for illuminating a sample (S) with an electron beam; an imaging system (6) for focusing electrons transmitted through the sample (S); an electron deflector (24) for deflecting the electrons transmitted through the sample (S); an imager (28) having a photosensitive surface (29) for detecting the electrons transmitted through the sample (S), the imager (28) being operative to record focused images formed by the electrons transmitted through the sample (S); and a controller (30) for controlling the electron deflector (24) such that an active electron incident region (2) of the photosensitive surface (29) currently hit by the beam is varied in response to variations in illumination conditions of the illumination system (4).

Abstract: A scanning electron microscope includes: a liner tube which transmits an electron beam; a scintillator having a through-hole into which the liner tube is inserted; a light guide which guides light generated by the scintillator; a conductive layer provided on a sensitive surface of the scintillator; and a conductive member provided in the scintillator, wherein the shortest distance between the liner tube and the conductive member is shorter than the shortest distance between the liner tube and the conductive layer, a voltage for accelerating electrons is applied to the conductive layer, and the conductive layer and the conductive member have a same potential.

Abstract: In a magnetic resonance measurement apparatus, when a frequency of an observation nucleus falls within a high frequency band, a frequency conversion scheme is selected. In this case, an intermediate frequency signal is generated as an original signal, which is then frequency-converted to generate an RF transmission signal. An RF reception signal is converted into an intermediate frequency signal by frequency conversion, and is sampled. When the frequency of the observation nucleus falls within a low frequency band, a non-conversion scheme is selected. In this case, an RF transmission signal is generated as the original signal, and an RF reception signal is sampled.

Abstract: There is provided a scanning transmission electron microscope capable of producing plural types of STEM (scanning transmission electron microscopy) images using a single detector. The electron microscope (100) has an electron source (10) emitting an electron beam, a scanning deflector (13) for scanning the beam over a sample (S), an objective lens (14) for focusing the beam, an imager (22) placed at a back focal plane of the objective lens (14) or at a plane conjugate with the back focal plane, and a scanned image generator (40) for generating scanned images on the basis of images captured by the imager.

Abstract: An aberration computing device (100) includes a fitting section (48) for fitting line profiles of a diffractogram taken in radial directions to a fitting function and finding fitting parameters of the fitting function and a computing section (49) for finding at least one of an amount of defocus and two-fold astigmatism, based on the fitting parameters.

Abstract: There is provided a charged particle system (100) that has: illumination optics (104) for illuminating a sample with charged particles; an imaging deflector system (112) disposed behind an objective lens (110); a detector (116) having a detection surface (115), imaging optics (114) disposed behind the imaging deflector system (112) and operative to focus the charged particles as diffraction discs (2) onto the detection surface (115); a storage unit (120) for storing intensity information detected by the detector (116); and a controller (130) for controlling the imaging deflector system (112). The controller (130) controls the imaging deflector system (112) to cause the charged particles passing through a given position of particle impingement on the sample to be deflected under successively different sets of deflection conditions and to bring the diffraction discs (2) into focus onto successively different regions of the detection surface (115).

Abstract: A device which computes an angular range of illumination of an electron beam in which aberrations in an optical system can be measured efficiently by a tableau method. The device (100) includes an aberration coefficient information acquisition portion (112) for obtaining information about aberration coefficients of the optical system, a phase distribution computing portion (114) for finding a distribution of phases in the electron beam passed through the optical system on the basis of the information about the aberration coefficients, and an angular range computing portion (116) for finding the angular range of illumination on the basis of the distribution of phases found by the phase distribution computing portion (114).

Abstract: Procedure instruction sequences (P1˜PN) in an instruction sequence (for example, an instruction sequence for an NMR spectrometer) are generated in a precedential manner, and transferred to a procedure storage area on a transmission and reception unit in a precedential manner. After the precedential transfer, a remaining portion of the instruction sequence (streaming instruction sequence (SM1, . . . )) is sequentially generated in predetermined units from the beginning, and sequentially transferred to a FIFO area on the transmission and reception unit. A sequencer refers to the streaming instruction sequence, executes the instruction, and refers to a procedure instruction sequence on the procedure storage area.

Abstract: In a magnetic resonance measurement apparatus such as an NMR measurement apparatus, when a frequency of an observation nucleus falls within a high frequency band, an RF reception signal is converted into an intermediate frequency signal, and is input to an analog-to-digital converter. In this case, under-sampling is executed for the intermediate frequency signal in the analog-to-digital converter, and a second-order aliased signal component generated from a target signal component is observed. On the other hand, when the frequency of the observation nucleus falls within a low frequency band, over-sampling for the RF reception signal is executed.

Abstract: A method includes forming N spin-cavity coupling states that are mutually different in coupling state between a cavity accommodating a sample therein and a spin of the sample, calculating N values of spin-cavity coupling constant, measuring N values of apparent relaxation time through magnetic resonance measurement applied on the sample, and calculating relaxation time corresponding to specific spin-cavity coupling constant based on the relationship between the N values of spin-cavity coupling constant and the N values of apparent relaxation time.

Abstract: A mass spectrometry data analysis method for analyzing a specimen having a composition where two different reference chemical structures A and B that are each repeated, includes acquiring exact mass information of each peak in a mass spectrum of the specimen by mass spectrometry, acquiring Kendrick mass defect information DA and DB where a decimal number part has been extracted from mass information obtained by performing Kendrick mass conversion computation processing on exact mass information of each peak, acquiring mass defect information dB and dA where a decimal number part has been extracted from mass information of B based on A and A based on B of the reference chemical structures A and B, calculating nA=DB/dA,nB=DA/dB regarding DA, DB, dA, and dB, and obtaining degree-of-polymerization information nA and nB, and displaying plots corresponding to each peak on two-dimensional coordinates where nA and nB are axes.