Abstract: Neutral particles are blocked by a deflector provided upstream of a detector. A controller changes a reference potential V2 of the deflector in connection with a change of a reference potential V1 of a collision cell such that a potential difference ?V between the reference potential V1 and the reference potential V2 is constant. The change of the reference potential V2 is executed during a period in which an ion pulse does not pass the deflector.

Abstract: Provided is a method for derivatizing an s-cis-diene compound with a Cookson-type derivatization reagent, the method including adding, in a reaction stopping step of stopping a derivatization reaction of the s-cis-diene compound, a decomposition inhibitor to inhibit decomposition of a derivative to be obtained.

Abstract: A charged particle beam apparatus acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample. The charged particle beam apparatus includes: a plurality of detection units that detect charged particles emitted from the sample; and an image processing unit that generates the scanned image based on a plurality of detection signals outputted from the plurality of the detection units. The image processing unit performs a process of calculating a tilt direction of a sample surface and a tilt angle of the sample surface based on the plurality of the detection signals for an irradiation position of the charged particle beam; and a process of determining a color of a pixel of the scanned image according to the calculated tilt direction and the calculated tilt angle.

Abstract: An aberration corrector includes: a first multipole, a second multipole, a third multipole, and a fourth multipole arranged along an optical axis A; a first transfer lens system arranged between the first multipole and the second multipole; a second transfer lens system arranged between the second multipole and the third multipole; and a third transfer lens system arranged between the third multipole and the fourth multipole, wherein each of the first multipole, the second multipole, the third multipole, and the fourth multipole generates a three-fold symmetric field.

Abstract: An X-ray analyzer includes: an X-ray detector that detects an X-ray emitted from a specimen and outputs a signal having a step that has a height corresponding to energy of the X-ray; a pulse generation circuit that converts the signal output from the X-ray detector into a first pulse signal; a pulse-width setting circuit that sets a pulse width; a pulse-width conversion circuit that converts a pulse width of the first pulse signal into the pulse width set by the pulse-width setting circuit to form a second pulse signal; a pulse-height discriminator that discriminates the second pulse signal according to a pulse height of the second pulse signal; a counting circuit that calculates a counting rate of the discriminated second pulse signal; and a counting-loss correction processing unit that corrects the counting rate. The counting-loss correction processing unit corrects the counting rate based on the pulse width.

Abstract: An image processing device includes a spectrum acquisition unit that acquires a plurality of spectra that respectively have different measurement energy ranges and energy resolutions and are acquired using an X-ray spectrometer having a plurality of dispersion elements with different spectral characteristics, a graph generation unit that sets the plurality of spectra on a single graph having an axis of an ath root of the energy (where a?2) as a first axis, and an axis based on an X-ray intensity as a second axis, and a display control unit that executes control to display the graph generated by the graph generation unit on a display unit.

Abstract: A three-dimensional image reconstruction method, in which a cross section preparation step includes: a specimen preparation step of attaching, on a surface of a specimen, a grid-like mark member in which rectangular openings are two-dimensionally arranged, and disposing the grid-like mark member under a shielding member so that a side of each of the rectangular openings of the grid-like mark member forms a 45-degree or 90-degree angle with respect to a direction in which a linear end edge of the shielding member extends; and a processing position determination step of adjusting relative positions of the shielding member and the grid-like mark member by using the grid-like mark member as an index of a processing position.

Abstract: An X-ray analyzer includes: a detector which detects X-rays generated from a specimen; a cooling element which cools the detector; and a spectrum generating unit which generates a spectrum based on a detection signal of the detector. The spectrum generating unit corrects an attenuation of intensity of a spectrum attributable to contamination of the detector, based on an elapsed time from a reference time until the X-rays are detected.

Abstract: An electron microscope comprises: an electron microscope main body including a phase plate that imparts a phase change to an electron wave, a moving mechanism that moves the phase plate, and a detector that acquires an image formed by an electron beam transmitted through a sample; and a control unit that controls the electron microscope main body. The control unit performs a phase plate image acquisition process of acquiring a phase plate image which is an image of the phase plate; an unevenness determination process of determining whether or not the phase plate has unevenness based on the phase plate image; and a moving mechanism control process of moving the phase plate by controlling the moving mechanism when the control unit has determined that the unevenness is present.

Abstract: A method of observing a liquid specimen in an electron microscope includes: housing the liquid specimen in a space formed by a specimen stage and a lid member; and observing the liquid specimen, wherein the lid member includes a water retaining material, and a supporting member for supporting the water retaining material, and the water retaining material is provided with a through-hole that enables passage of an electron beam with which the liquid specimen is irradiated.

Abstract: An electron microscope includes: a display control unit which sequentially acquires electron microscope images of a sample and causes a display unit to display the electron microscope images as a live image; an analysis area setting unit which sets an analysis area on the sample based on a designated position on the live image designated by pointing means; and an analysis control unit which performs control for executing elemental analysis of the set analysis area. The analysis area setting unit sets, as the analysis area, an area on the sample which corresponds to a continuous area including the designated position and having brightness comparable to brightness of the designated position.

Abstract: An aberration corrector for an electron microscope includes a geometric aberration corrector provided with a transfer lens system, wherein the transfer lens system includes an optical system for chromatic aberration correction, the optical system for chromatic aberration correction has a first portion, a second portion, and a third portion disposed along an optical axis, and each of the first portion, the second portion, and the third portion has a thickness in a direction along the optical axis and generates an electromagnetic field having two-fold symmetry in which an electric field having two-fold symmetry and a magnetic field having two-fold symmetry are superimposed.

Abstract: An electron microscope includes: an optical system including an aberration correction device; and a control unit that controls the aberration correction device, wherein the control unit performs: processing for displaying, on a display unit, an image for designating a direction of aberration in superposition on an aberration pattern representing a state of aberration, processing for specifying the direction of aberration from the image that has been subjected to a rotation operation, and processing for controlling the aberration correction device to cause the aberration correction device to introduce an aberration in the specified direction.

Abstract: A charged particle beam apparatus acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample. The charged particle beam apparatus includes: a plurality of detection units that detect charged particles emitted from the sample, and an image processing unit that generates the scanned image based on a plurality of detection signals outputted from the plurality of the detection units.

Abstract: When a first scheme (transition observation time optimization scheme) is selected, a computation unit computes an actual transition observation time as a time of an integer multiple of a storage-ejection time of a collision cell within a frame of a transition observation time. When a second scheme (storage-ejection time optimization scheme) is selected, the computation unit divides the transition observation time by a maximum storage-ejection time to determine a number of repetitions of a storing-ejecting operation of the collision cell, and determines a storage-ejection time based thereon.

Abstract: A magnetic field generator includes a refrigerating machine, a cold head, a superconductor which is formed in a cylindrical shape, a cold head extension portion which extends from the cold head and is brought into thermal contact with the superconductor at its extended end; and a vacuum heat insulating container having an internal space in which the cold head, the cold head extension portion, and the superconductor are received. The superconductor has a room temperature bore space, which is formed on its inner peripheral side along an axial direction of the superconductor, and is spatially isolated from the internal space of the vacuum heat insulating container. The room temperature bore space has both ends communicating to an outside of the magnetic field generator.

Abstract: A baseline component in an NMR spectrum (observed spectrum) is expressed as a sparse signal in a time space. In a nonlinear fitting under a condition of minimizing an Lp norm (wherein p?1), the Lp norm functions to emphasize the sparsity of a norm computation target. Using these two properties, an optimum solution of a coefficient vector to be given to a computed vector is searched to minimize the Lp norm for a residual vector in the time space corresponding to a residual spectrum.

Abstract: Provided is a measurement method for measuring, in an electron microscope including a segmented detector having a detection plane segmented into a plurality of detection regions, a direction of each of the plurality of detection regions in a scanning transmission electron microscope (STEM) image, the measurement method including: shifting an electron beam EB incident on a sample S under a state where the detection plane is conjugate to a plane shifted from a diffraction plane to shift the electron beam EB on the detection plane, and measuring a shift direction of the electron beam EB on the detection plane with the segmented detector; and obtaining the direction of each of the plurality of detection regions in the STEM image from the shift direction.

Abstract: A pair of detection coils, one coil provided on each side of a sample container across the width of the sample container. The detection coil is made of a superconductor and has an electric circuit pattern capable of detecting a magnetic resonance signal from a sample. The detection coil includes a lateral component intersectional to a static magnetic field H0 and having a part disposed at a position spaced away from a detection region, as compared to the remaining part.

Abstract: A magnetic resonance signal detection module includes an insulator block having a coil mounting section including a through hole serving as a detection hole into which a sample container is inserted. A low-frequency coil is provided on an inner surface of the through hole. A high-frequency primary resonator is embedded in the coil mounting section so as to surround the low-frequency coil.