Abstract: There is provided a primary beam scanning apparatus capable of producing data having a bit depth higher than the resolution of an analog-to-digital converter. The primary beam scanning apparatus is capable of controlling a scan rate of a primary beam for scanning a specimen. The scanning apparatus includes a detector for detecting signals generated in response to irradiation of the specimen with the primary beam and providing an analog output signal, an analog-to-digital converter for sampling the analog signal and converting it into a digital signal, and an arithmetic section for averaging the digital signal.

Abstract: There is provided a method of image acquisition capable of reducing the effects of diffraction contrast. This method of image acquisition is implemented in an electron microscope for generating electron microscope images with electrons transmitted through a sample. The method starts with obtaining the plural electron microscope images while causing relative variations in the direction of incidence of an electron beam with respect to the sample. An image is generated by accumulating the plural electron microscope images.

Abstract: A rotor contains a sample. A turbine cap is fitted into an opening of one end of the rotor, and a bottom cap is fitted into an opening of the other end of the rotor. A recess portion is formed in the turbine cap, and a recess portion is formed in the bottom cap. Insert members having a negative linear expansion coefficient are disposed in the recess portions.

Abstract: This sample rack conveying apparatus is provided with a pusher unit, a linear motion guide, and a conveyance drive mechanism. The pusher unit has a base portion, a moving member, and a base-side guide. The base portion is supported by the linear motion guide so as to be movable in a first guide direction. The moving member is provided with a pusher that pushes a sample rack. The base-side guide supports the moving member such that the moving member is movable in a second guide direction that crosses the first guide direction.

Abstract: In a first aspect, the present invention relates to a Nuclear Magnetic Resonance (NMR) probe and method of use of a NMR probe for matching a resonant mode in a circuit to a required impedance (e.g., Z=50 Ohm) using a variable inductor which allows matching of the resonant mode in the circuit within a broad frequency range. In an additional aspect, the NMR probe and the method of use of a NMR probe allows matching of a resonant mode in a circuit to a required impedance (e.g., Z=50 Ohm) using a variable inductor without requiring the coupling constant K to be varied over a broad frequency range.

Abstract: Provided is a method for producing a high-purity, high-quality semicarbazide compound at a high yield by a simple method. The semicarbazide compound is recrystallized by a solvent containing a halogenated hydrocarbon. Dichloromethane is preferred as the halogenated hydrocarbon.

Abstract: There is provided a method of aberration measurement capable of reducing the effects of image drift. The novel method of aberration measurement is for use in an electron microscope. The method comprises the steps of: acquiring a first image that is a TEM (transmission electron microscope) image of a sample; scanning the illumination angle of an electron beam impinging on the sample and acquiring a second image by multiple exposure of a plurality of TEM images generated at different illumination angles; and calculating aberrations from the first and second images.

Abstract: A scanning electron microscope includes an FIB column, an SEM column, and a control unit which controls the FIB column and the SEM column. The control unit performs: processing to control the FIB column so that a cross-section of a specimen S is repeatedly exposed at predetermined intervals; processing to perform a first measurement to acquire a first image by irradiating a cross-section of the specimen S with an electron beam each time when a cross-section of the specimen S is exposed; and processing to perform a second measurement to acquire a second image by irradiating a cross-section of the specimen S with an electron beam each time when a cross-section of the specimen S is exposed n times (n is an integer of 2 or more).

Abstract: An offset map is determined in advance by a preliminary measurement process. A phase map is generated by execution of a long ? pulse sequence. A magnetic field map is calculated based on a phase map and a phase offset map. A shim adjustment is performed based on the magnetic field map. The offset map is calculated based on a first phase map acquired by execution of a first pulse sequence, a second phase map acquired by execution of a second pulse sequence, and a ratio ? related to phase evolution periods.

Abstract: Provided are a method for separating a DAPTAD-containing triazolinedione compound in solid form from a reaction solution, a separated solid triazolinedione compound, and a novel method for producing a triazolinedione compound. A triazolinedione solution in which a DAPTAD-containing triazolinedione compound is dissolved is brought into contact with a C5-15 hydrocarbon-based poor solvent to obtain a solid triazolinedione compound. Also, a triazolinedione compound is oxidized using an oxidizing agent that does not produce acid as a byproduct to obtain a triazolinedione compound.

Abstract: An electron microscope includes: an irradiation lens system that irradiates a specimen with an electron beam; an irradiation system deflector that deflects an electron beam incident on the specimen; a specimen tilting mechanism that tilts the specimen; an imaging lens system that forms an electron diffraction pattern or an electron microscope image by using an electron having passed through the specimen; an imaging device that acquires the electron diffraction pattern or the electron microscope image formed by the imaging lens system; and a controller that controls the irradiation system deflector and the specimen tilting mechanism.

Abstract: An apparatus for measuring ion beam current values without disturbing the state of ionization of an ion source includes a high-voltage circuit for applying a voltage between an anode and at least one cathode of an ion source based on a voltage condition and supplying its output current to the anode; a gas flow rate adjusting mechanism for adjusting the flow rate of a gas being an ion source material for generating ions and to be admitted into the ion source; a memory in which there is stored information representing a relationship between the flow rate of the gas and the value of an extraction current flowing through an extraction electrode; and an arithmetic processor for finding the extraction current corresponding to the flow rate of the gas based on the information stored in the memory and subtracting the value of the extraction current from the value of the output current supplied to the anode by the high-voltage circuit to compute the electrical current value of the ion beam.

Abstract: An aberration measurement method for an objective lens in an electron microscope including an objective lens which focuses an electron beam that illuminates a specimen, and a detector which detects an electron beam having passed through the specimen, includes: introducing a coma aberration to the objective lens; measuring an aberration of the objective lens before introducing the coma aberration to the objective lens; measuring an aberration of the objective lens after introducing the coma aberration to the objective lens; and obtaining a position of an optical axis of the objective lens on a detector plane of the detector based on measurement results of the aberration of the objective lens before and after introducing the coma aberration.

Abstract: There is provided an ion milling apparatus and sample holder permitting one to observe a sample, which has been milled, with an electron microscope without transferring the sample to a different holding member. The ion milling apparatus has an ion source, a sample holder, and a sample stage. The sample holder includes: a holder body having a sample holding portion for holding the sample; and a cover member detachably mounted to the holder body and hermetically sealing the sample held on the sample holding portion. The holder body has a shield plate and a field-correcting plate for correcting electric fields around the sample held on the sample holding portion.

Abstract: Provided is an observation method including: acquiring an observed image that has been photographed by the first specimen observation apparatus with the specimen holder being mounted on the first specimen stage, the observed image having an observation target position of a specimen positioned at a center thereof, and including the plurality of markers (Step S104); acquiring pixel coordinates of each of the plurality of markers in the observed image (Step S106); acquiring stage coordinates of each of the plurality of markers on the second specimen stage having the specimen holder mounted thereon (Step S108); and converting, based on the pixel coordinates of the plurality of markers and the stage coordinates of the plurality of markers, pixel coordinates of the center of the observed image into stage coordinates to move the second specimen stage to the obtained stage coordinates (Step S112).

Abstract: There is provided a mass spectrometry data processor allowing for easy selection of a compositional formula for a sample component to be analyzed (analyte) even in general mass spectrometry applications. The mass spectrometry data processor is used to perform a qualitative analysis of the sample component based both on a first mass spectrum obtained by ionizing the sample component by a soft ionization method and on a second mass spectrum generated by cleavage of the sample component.

Abstract: A spectrum y includes a waveform-of-interest component and a baseline component which is a wide-band component. A weight array x is applied with respect to a base function array A to generate a baseline model Ax. An optimum baseline model Ax? is searched according to a first condition to fit a corresponding portion SIAx of the base line model Ax with respect to a representative portion yI of the baseline component and a second condition to reduce an Lp norm (wherein p?1) of the weight array x.

Abstract: A transmission signal generator generates a lock transmission signal that excites a lock nucleus (deuteron) used for observing a change of a static magnetic field. A LOCK transmission circuit transmits the lock transmission signal to an NMR probe. A LOCK reception circuit receives an NMR signal of the lock nucleus. A LOCK transmission sequencer, based on a pulse sequence generated according to at least one of amplitude modulation, frequency modulation, or phase modulation, controls generation of the lock transmission signal performed by the transmission signal generator.

Abstract: A sample pipe is provided in a sample temperature control pipe. A detection coil is provided in a low-temperature airtight chamber and configured to irradiate a sample with a high-frequency magnetic field. A room-temperature shield is provided on an outer circumferential surface of the sample temperature control pipe or on an inner circumferential surface thereof, and is configured to block irradiation of the high-frequency magnetic field from the detection coil from reaching a region other than an observation object. A low-temperature shield is provided in an airtight chamber and between the detection coil and the room-temperature shield and is configured to block irradiation of the high-frequency magnetic field from the detection coil from reaching the room-temperature shield.

Abstract: An aspect of the present invention includes: a base plate that moves along a vertical direction; a powder feeding unit that laminates a powder layer on an upper surface of the base plate; a beam generating unit that generates a beam in a designated quantity of heat; and a control unit that causes the beam generating unit to irradiate a designated position of the powder layer with the beam in a scan order programmed based on three-dimensional model data. The control unit calculates a required quantity of heat to be input to the designated position, based on heat capacity of the designated position of the powder layer, to set a temperature of the designated position at a desired temperature at a future designated time, and the control unit controls the beam generated by the beam generating unit to enable input of the required quantity of heat to the designated position.