Abstract: A method of generating an elemental map includes: acquiring a plurality of correction channel images by scanning a surface of a standard specimen having a uniform elemental concentration with a primary beam and generating a correction channel image for each channel; generating correction information for each pixel of each correction channel image among the plurality of correction channel images based on a brightness value of the pixel; acquiring a plurality of analysis channel images by scanning a surface of a specimen to be analyzed with the primary beam and generating an analysis channel image for each channel; correcting brightness values of pixels constituting an analysis channel image among the plurality of analysis channel images based on the correction information; and generating an elemental map of the specimen to be analyzed based on the plurality of analysis channel images having pixels with corrected brightness values.

Abstract: A container has a sample installation unit and an NMR circuit therein, and is connected to a bearing gas supply path and a drive gas supply path for supplying gas to the inside of that container. This container is also connected to an exhaust path that exhausts the gas from the inside of the container. The exhaust path has a pressure control valve as an adjustment mechanism for adjusting the pressure in the container.

Abstract: A review image is displayed prior to measurement of an analysis target sample. The review image includes a waveform image and a numerical value image showing a measurement condition determined for a measurement segment of interest. The waveform image includes a waveform portion which is a part of a chromatogram, and a marker array showing a period of a circulating ion measurement. The marker array includes a plurality of markers which are displayed in an overlapping manner over the waveform portion.

Abstract: An energy filter has a plurality of sector magnets which are configured symmetrically with respect to a symmetry plane, and forms a real image on the symmetry plane. The energy filter include: an entrance aperture provided with a slit having a longitudinal direction in a direction perpendicular to an energy dispersion direction; and a hexapole and a quadrupole disposed on the symmetry plane.

Abstract: An ion milling apparatus includes a sample holder, a vacuum chamber, an evacuation section, a vacuum gauge, a heater, a gas inlet assembly, and a control section. The evacuation section vents gas in the interior space of the vacuum chamber. The vacuum gauge measures the pressure in the interior space of the vacuum chamber. The heater heats the sample holder. The gas inlet assembly admits a dry gas containing no moisture into the interior space of the vacuum chamber. When the pressure in the interior space has reached below a given pressure, the control section controls the gas inlet assembly based on information about the pressure in the interior space so as to admit the dry gas into the vacuum chamber.

Abstract: An observation method includes placing a specimen on a specimen supporting film of a specimen support, attaching the specimen support to a retainer, attaching the retainer to an optical microscope retainer holding base, attaching the optical microscope retainer holding base to a specimen stage of an optical microscope and observing the specimen under the optical microscope, attaching the retainer to a transmission electron microscope retainer holding base, and loading the transmission electron microscope retainer holding base into a transmission electron microscope and observing the specimen under the transmission electron microscope.

Abstract: A cold cathode field-emission electron gun includes: an emitter; an extraction electrode which extracts electrons from the emitter; and a biased electrode which is disposed closer to the emitter than the extraction electrode. A voltage applied to the biased electrode is variable.

Abstract: Provided is a method for analyzing a diene compound including: a triazolinedione adduct heating step of heating a triazolinedione adduct to produce a triazolinedione compound; an ene compound formation step of reacting the triazolinedione compound with a diene compound to obtain an ene compound; and an ene compound analysis step of analyzing the ene compound to quantitative determine the diene compound. Also provided is a method for producing an ene compound, including: a triazolinedione adduct heating step of heating a triazolinedione adduct to produce a triazolinedione compound; and an ene compound formation step of reacting the triazolinedione compound with a diene compound to obtain an ene compound.

Abstract: There is provided a receptacle carrier unit and automated analyzer capable of suppressing generation of temperature nonuniformities among liquid aliquots received in plural receptacles without increasing the parts count. The receptacle carrier unit has a turntable, a turntable drive, a cool box, a cooling portion, and a control section. The control section controls the turntable drive, based on the number and installation locations of the receptacles installed in the cool box and on temperature distribution information, to homogenize the effects that the individual receptacles receive from the cool box.

Abstract: A container containing unit includes a housing and a lid member. The lid member has a probe insertion hole and a droplet guide portion. The droplet guide portion is formed at an edge of an opening end of the probe insertion hole and has a plurality of groove portions. The plurality of groove portions extend from the edge of the opening end to an outside of a locus through which the mouth of the container is moved.

Abstract: A control device controls an analyzing device or a processing device by using an application performing control for causing a GUI image including a plurality of GUI components to be displayed on a display screen of a display unit. The control device includes: a GUI component designation information receiving unit that receives GUI component designation information used for designating a GUI component among the GUI components; a position information acquiring unit that identifies the GUI component designated on the basis of the GUI component designation information and acquires position information indicating a position of the identified GUI component on the display screen from an operation system; and an emphasizing image display control unit that performs control for causing an image for emphasizing the identified GUI component to be displayed on the display screen on the basis of the position information.

Abstract: A scanning electron microscope includes a first detector for detecting electrons, a second detector for detecting X-rays, and an image processor section for causing first markers indicative of imaging positions and second markers indicative of analysis positions to be displayed on a display device such that the first and second markers are placed on a whole image of a sample. The image processor section alters the magnification of the whole image based on instructions for altering the magnification of the whole image displayed on the display device. The image processor section displays new first markers of the same size as the first markers placed on the unaltered magnification whole image such that the new first markers are placed on the altered magnification whole image. The image processor section causes new second markers of the same size as the second markers placed on the unaltered magnification whole image to be placed on the altered magnification whole image.

Abstract: An electron microscope includes: an electron detector which detects electrons emitted from a specimen upon irradiation of the specimen with an electron beam; an X-ray detector which detects X-rays emitted from the specimen upon irradiation of the specimen with the electron beam; and a processor which generates a three-dimensional element map based on output signals from the electron detector and the X-ray detector. The processor performs processing for generating a electron microscopic image based on the output signal from the electron detector, processing for generating a three-dimensional image of the specimen based on the electron microscopic image, processing for generating a two-dimensional element map based on the output signal from the X-ray detector, and processing for generating the three-dimensional element map by projecting the two-dimensional element map on the three-dimensional image.

Abstract: An electron diffraction apparatus measures an overall structure of a crystal of a specimen by electron diffraction. An NMR apparatus measures a local structure of the crystal by NMR measurement. An analysis apparatus combines the overall structure and the local structure to specify a structure of the crystal.

Abstract: Attenuation of microwaves is reduced or prevented when vacuum windows are provided in microwave waveguides of a DNP-NMR probe. A DNP-NMR probe has an inner container and an outer container. The inner container has therein a sample tube containing a sample to which radicals are added. The outer container keeps a space between the outer container and the inner container in the outer container in a vacuum state. The outer container has an outer container waveguide that has a vacuum window at an inner end portion and guides microwaves. The inner container has a vacuum window facing the vacuum window of the outer container waveguide through vacuum, and guides microwaves transmitted from the outer container waveguide to the sample. The window-to-window distance between the vacuum window of the outer container and the vacuum window of the inner container is adjusted by means of adjustment bolts.

Abstract: An observation method includes: preparing a specimen including, as a mark a plurality of metal particles in which localized surface plasmon resonance is excited by irradiation with light; acquiring an optical microscope image by photographing the specimen with an optical microscope; acquiring an electron microscope image by photographing the specimen with an electron microscope; acquiring information of the positions and the colors of the plurality of metal particles in the optical microscope image; acquiring information of the positions and the particle diameters of the plurality of metal particles in the electron microscope image; and determining information for associating the optical microscope image and the electron microscope image based on the information of the positions and the colors of the plurality of metal particles acquired from the optical microscope image, and the information of the positions and the particle diameters of the plurality of metal particles acquired from the electron microscope i

Abstract: A charged particle beam device includes: a plurality of detecting units which detect charged particles diffracted by a specimen; and an intensity pattern information generating unit which generates, based on intensities of a plurality of detection signals output from the plurality of detecting units, intensity pattern information that represents the intensities of the plurality of detection signals as a pattern.

Abstract: An ion milling apparatus includes an ion irradiation source, a sample holder, a sample stage, a rotation mechanism, and a slide mechanism. The sample holder holds a sample such that the sample protrudes from a shielding plate in a direction perpendicular to an optical axis of an ion beam. The rotation mechanism is disposed such that a rotation center of a rotation shaft is perpendicular to the optical axis of the ion beam and parallel to a direction in which the sample protrudes from the shielding plate. The rotation mechanism supports the sample stage such that the sample stage is rotatable. The slide mechanism supports the sample held by the sample holder such that the sample is movable along the optical axis of the ion beam.

Abstract: An automatic analyzing apparatus includes a stirring mechanism. The stirring mechanism is provided with: a fixed member fixed to an apparatus body; a motor attached to the fixed member; a drive-side helical gear provided on a drive shaft of the motor; bearings provided to the fixed member with the center shaft held parallel to the drive shaft of the motor; a support member of circular column shape, supported so as to be capable of receding from one side relative to the bearings; a driven-side helical gear fixed to an end of the support member coaxially with respect to the support member such that the driven-side helical gear is fitted together with the drive-side helical gear with the support member recessed into the bearings; and a stirring rod extending coaxially with the support member from the end of the support member opposite to the end provided with the driven-side helical gear.

Abstract: A sample holder system includes a sample holder and a sample adjusting unit. The sample holder includes a shielding plate, a holder body, a holding portion, and a fastening mechanism. The fastening mechanism fastens the holding portion to the holder body, the fastening mechanism preventing the holding portion from swinging when the holding portion is fastened to the holder body. The sample adjusting unit includes a position adjusting jig that comes into contact with the holding portion, and a swinging mechanism that supports the position adjusting jig such that the position adjusting jig is swingable.