Abstract: A Gaussian noise is simulated by discrete analogue ri,j. A first parameter ? and pluralities of first and second integers i and j are selected. A plurality of points i,j are identified and a magnitude si,j is calculated for each point based on ?, i and j. The discrete analogue ri,j is based on a respective si,j. Examples are given of ? = 2 B - A 2 B and D>i?0 and 2C>j?0, where B?0, 2B>A>0, C?1 and D?1, and magnitude s i , j = 1 - ? i + ? i · 1 - ? 2 C · j ? ? ? or ? ? ? s D - 1 , j = 1 - ? D - 1 + ? D - 1 · 1 2 C · j . In some embodiments, a segment is defined based on ? and i. The segment is divided into points based on respective values of j, and the magnitude is calculated for each point of the segment. The defining and dividing segments and calculating the magnitude is iteratively repeated for each value of i.

Abstract: A method and apparatus for calculating ramptime propagation for integrated circuit layout patterns having pins interconnected in an oriented graph in one or more closed loops is described. Ramptime values are calculated for a first set of the pins, which are not connected to a closed loop while leaving a second set of the pins with unknown ramptime values. One or more closed loops are identified by backtracking from the pins in the second set with unknown ramptime values. A ramptime value for each pin in the one or more closed loops is calculated iteratively.

Abstract: Embodiments of the invention include a copper interconnect structure having increased electromigration lifetime. Such structures can include a semiconductor substrate having a copper layer formed thereon. A dielectric barrier stack is formed on the copper layer. The dielectric barrier stack includes a first portion formed adjacent to the copper layer and a second portion formed on the first portion, the first portion having improved adhesion to copper relative to the second portion and both portions are formed having resistance to copper diffusion. The invention also includes several embodiments for constructing such structures. Adhesion of the dielectric barrier stack to copper can be increased by plasma treating or ion implanting selected portions of the dielectric barrier stack with adhesion enhancing materials to increase the concentration of such materials in the stack.

Abstract: The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.

Abstract: A fixed-point arithmetic unit comprises a plurality of full-adders and half-adders arranged in at least an input row and an output row. A plurality of inputs to the input row is arranged to receive bits comprising a sparse-redundant representation of the integer. A converter converts 1-redundant representations of the integer to the space (1/K)-redundant representations. A process is described to design rows of a multiplier by identifying a distribution of multiplication product groups, and transforming the distribution of multiplication product groups to adders to occupy a highest unoccupied row of the multiplier.

Abstract: A method of forming a planarized layer on a substrate, where the substrate is cleaned, and the layer is formed having a surface with high portions and low portions. A resistive mask is formed over the low portions of the layer, but not over the high portions of the layer. The surface of the layer is etched, where the high portions of the layer are exposed to the etch, but the low portions of the layer underlying the resistive mask are not exposed to the etch. The etch of the surface of the layer is continued until the high portions of the layer are at substantially the same level as the low portions of the layer, thereby providing an initial planarization of the surface of the layer. The resistive mask is removed from the surface of the layer, and all of the surface of the layer is planarized to provide a planarized layer.

Abstract: A methodology for generating scan based transition patterns (i.e., ATPG pattern generation for transition delay faults (“TDF”)) wherein when either a slow-to-rise (STR) or a slow-to-fall (STF) transition fault is detected, that specific fault is removed from a fault universe as well as its companion TDF, wherein the companion fault is a fault on the same node as the detected fault but has the opposite transition. In other words, if a slow-to-rise (STR) transition fault is detected, the slow-to-rise (STR) transition fault is removed from the fault universe as well as its corresponding slow-to-fall (STF) transition fault (and vise versa). By removing companion faults as well as those which are specifically detected, pattern generation run time is reduced as well as the total pattern count for the final delay test pattern.

Abstract: The present invention provides an endian mapping engine for use with a processing system. In one embodiment, the endian mapping engine includes an identification unit configured to identify sending and receiving endian schemes for data transfers between components of the processing system. Additionally, the endian scheme converter also includes a conversion unit coupled to the identification unit and configured to convert the data transfers between the sending and receiving endian schemes corresponding to an employed endian format. In an alternative embodiment, the endian mapping engine further includes a multiplexing unit coupled to the identification unit and configured to provide multiplexing between endian formats for a given endian scheme.

Abstract: A memory timing model is provided, which includes an address input, a multiple-bit data input, a multiple-bit data output, a capacity C and a width N. N one-bit wide memory modules are instantiated in parallel with one another between respective bits of the data input and the data output. Each memory module has a capacity of C bits addressed by the address input.

Abstract: A method and apparatus are provided for creating and using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

Abstract: A system and method are described for increasing performance of operations implemented in a storage system utilizing fibre channel, such as by enabling full duplex opens when a JBOD/bridge is involved. In an aspect of the present invention, a method of performing a full duplex open in a fibre channel network having an initiator and a bridge may include initiating an open by the initiator with the bridge. The bridge has a primary physical address and an alias physical address. The alias physical address represents a target device communicatively coupled to the bridge, wherein the open is initiated utilizing the primary physical address. The initiator communicates with the target device.

Abstract: A method and apparatus are provided for receiving a list of design memories, wherein each type of design memory in the list has a name and at least one instance. A pre-placement model is associated with each named memory type in the list. The design memories in the list are mapped to an integrated circuit layout pattern, wherein at least one memory type comprises first and second instances that are mapped differently from one another. After mapping, at least one of the first and second instances is renamed to have a different name than the other. A post-placement model is then associated with each named memory type in the list, including a separate model for each renamed design memory.

Abstract: A process and apparatus are provided for tiling objects, such as design memories, in one or more respective object locations in a layout pattern. For each object, the following steps are performed recursively based on a comparison of at least one of a capacity and a width of the object and that of the respective object location: (1) do nothing; (2) reconfigure the object to have a different capacity and/or width; and (3) split the object into two or more separate objects. The recursion is repeated for each reconfigured object and each separated object.

Abstract: A device and method are provided for testing the timing of an output signal from a circuit. The output signal can be sent from a circuit contained within a portion of an integrated circuit, and represents a response to a test pattern or stimuli applied to that circuit. The output signal is compared to an expected output signal to determine skew of that signal relative to the clocking of the circuit. Testing the output signal involves placing a characterization path within the functional path of the output signal, between the circuits being tested and an output terminal that can receive a measurement device. By placing the characterization path into the functional path, the output signal sees only a single load gate terminal of, for example, a logic gate. The reduced loading not only positively impacts the normal operation of the output signal, but also beneficially minimizes the possibility of any inaccuracies in the characterization testing.

Abstract: A method and computer program product for verifying an incremental change to an integrated circuit design include receiving as input an integrated circuit design database and an engineering change order. Objects in the integrated circuit design database are identified and marked to indicate a current state of the integrated circuit design database. The engineering change order is applied to the integrated circuit design database, and the integrated circuit design database is analyzed to generate a list of incremental changes to the integrated circuit design database resulting from the engineering change order. Objects in the integrated circuit design database included in the list of incremental changes are identified and marked to distinguish objects in the integrated circuit design database that were changed from the current state. The marked integrated circuit design database distinguishing the objects that were changed from the current state is generated as output.

Abstract: A plurality of user-defined memories are mapped to pre-defined basic memories, such as defined on a base platform. The user-defined memories are dividing into classes of similar memories. A mapping technique is selected for members of a selected class of user-defined memories that minimizes the ratio (maxi,j(USEDi,j/AVAILi,j)) of basic memories that have been mapped to basic memories that are available for mapping. If the number of different memory mappings is smaller than a threshold the mapping technique is applied to each user-defined memory. If the number of different memory mappings is greater than the threshold, the groups are arranged in ordered queues of single memory types based on a mapping price and the mapping technique is selected based on a memory of each group and is applied to each user-defined memory in the respective group.

Abstract: The present invention provides a method and BIST architecture for fast memory testing in a platform-based integrated circuit. The method may include steps as follows. An Mem-BIST controller transmitter is started to generate input signals for a memory in a platform using a deterministic and unconditional test algorithm. The input signals are delayed by a first group of pipelines by n clock cycles. The delayed input signals are received by the memory and an output signal is generated by the memory. The output signal is delayed by a second pipeline by m clock cycles. An Mem-BIST controller receiver is started to receive the delayed output signal for comparison.

Abstract: An integrated circuit, where a hard macro is resident within the integrated circuit. The hard macro receives a clock signal at a frequency that is below the operational frequency of the integrated circuit, and produces a clock signal having a frequency that is at least equal to the operational frequency of the integrated circuit. The hard macro has a first input that receives a first signal from the tester. A second input receives a second signal from the tester, offset by substantially ninety degrees from the phase of the first signal. A speed select input receives a signal, where the signal is selectively set at one of a logical high indicating a first multiplier to be applied in the hard macro, and a logical low indicating a second multiplier to be applied in the hard macro. A clock multiplication circuit receives the first signal, selectively receives the second signal, and receives the speed select signal, and produces the clock signal.

Abstract: Methods and systems for improving delayed read handling in a loop of delayed commands among a larger set of commands in a queue of commands are disclosed. In general, when commands in a delayed loop are completed out of order, “holes” are left in the command queue. Skipping over such “holes” consumes multiple clock cycles before another command can be issued, as each “hole” must be examined first in order to determine that it no longer contains a valid read command. A loop of delayed read commands can thus be created from among a larger set of commands in a queue of commands with each command entry having a pointer to the next valid command. Valid delayed read commands in the loop of commands can then be processed by automatically advancing between any two valid delayed read commands among the loop of commands. In this manner, the time to advance between any two commands in the delayed read loop is constant and PCI read performance thereof can be dramatically improved.

Abstract: Base platforms customizable into ICs are designed by identifying a plurality of macros for placement on the platform, each macro being defined in part by a plurality of elements that perform respective functions of the macro. Identical elements in a plurality of macros are identified, and a common element is placed on the platform for an identical element of at least two macros. All other elements of the macros are placed at locations on the platform relative to the common element as to satisfy macro placement rules for each macro. Identical elements can be identified by identifying similar elements in a plurality of macros, and creating a common element generic to the similar elements. The user designs a metalization layer to select macros and configure common elements to the selected macros.