Abstract: An apparatus comprising a first circuit and a second circuit. The first circuit may be configured to generate an MPEG packet data stream. The second circuit may be configured to (i) scramble the data stream to generate a scrambled data stream, (ii) encode the scrambled data stream to generate an encoded data stream, (iii) interleave the encoded data stream, (iv) encode the interleaved data stream, (v) modulate the encoded data stream, and (vi) filter the modulated data stream.

Abstract: An apparatus comprising (i) one or more input/output cells, (ii) one or more hard macros and (iii) one or more input/output affinity regions. The one or more input/output affinity regions may be disposed between the one or more input/output cells and the one or more hard macros. Each of the one or more input/output affinity regions may be customized as (i) circuitry in a first mode and (ii) routing between the one or more input/output cells and the one or more hard macros in a second mode.

Abstract: A process for re-designing IC chips by altering the positions of cells from a first to a second IC chip layout. An x,y grid is established for the first and second IC layouts such that each cell has identifying x,y coordinates in the first layout. Columns are established in the second layout based on the bounds of the second layout in the x-direction. The cells are sorted to the columns in the order of cell x-coordinates to establish new x-coordinates for each cell based on the x-coordinates of the respective column. The cells are sorted in each column to establish y-coordinates for each cell based on the height of the cells in the column and the height of the column.

Abstract: A video decoding system includes an embedded microcontroller that provides memory arbitration in addition to processing and control functions. The microcontroller architecture provides a first-in, first-out (FIFO) queue for storing memory access instructions and a processing logic for executing software instructions. The microcontroller processing logic determines which components within the decoding system need access to memory and stores a sequence of memory access instructions into the FIFO queue. Each memory access instruction is associated with one decoder component. When main memory becomes available, a memory access instruction is dequeued from the FIFO and transmitted to the associated decoder component, which is then permitted to access memory. The microcontroller receives indicator signals from the decoder components that indicate when the decoder components have finished accessing memory and, thus, when the memory device is available for subsequent transactions.

Abstract: Persistent reservations may be processed on an as-needed basis after a power cycle sequence. A computer storage device may have persistent reservations for various volumes that are to be deleted after a power cycle but before accepting any reservation I/O requests for those volumes. After a start up sequence, the device comes on-line prior to deleting the required registrations. Prior to the first reservation I/O request for the particular volume, the registrations are processed for that volume and the necessary registrations are deleted.

Abstract: A method and apparatus for performing efficient reseeks in an optical storage device. As data sectors are read by the optical storage device, address information corresponding to sectors being processed by the optical storage device is stored in a stack. The stack may be composed of shift registers that shift the address information of new sectors down the stack as they are read. When an interrupt occurs, a selector determines which stack location contains address information for the sector being processed, and transfers the address information to a register. The address information is held in the register until it is accessed by a microprocessor. The microprocessor uses the address information to determine a reseek location, and causes the sector being processed to be read again.

Abstract: A technique is described for enabling routing of metallisation wires over sensitive cells of an integrated circuit by means of a global router after the cell circuits have been designed. At least one cell includes dedicated route paths (32, 36, 40, 46) as part of the cell design. The paths may include alternative paths (32 and 36), and concurrently usable paths (40 and 46). By including the routes as part of the cell design, the subsequent problems of a global routing tool routing wires over sensitive areas of the cell can be avoided, and the number of wire routes can be controlled. The global router operates by detecting whether dedicated routes are provided and, if so, identifying the entry/exit points for routes to be used.

Abstract: The invention may relate to a digital frequency adjuster for adjusting a first frequency of a first signal. The digital frequency adjuster may comprise a first digital delay line and a first control circuit. The first digital delay line may comprise a plurality of taps. The first digital delay line may be configured to (i) receive the first signal and (ii) generate a second signal. The first control circuit may be configured to control dynamic assertion of respective ones of the taps at a rate such that the second signal has a second frequency different from the first frequency of the first signal.

Abstract: The invention may relate to a method of programming a programmable non-volatile device. The programmable non-volatile device may be programmed while coupled to a circuit in which the programmable non-volatile device is to be used. The method may include establishing a connection and communicating information. The connection may be established from an external device to a test interface of the circuit. The information may be communicated from the external device through the test interface, for programming the programmable non-volatile device.

Abstract: A system, apparatus and/or method is provided for fabricating an integrated capacitor during the fabrication of a transistor employing chemical mechanical polishing of a gate electrode of the transistor. Components of the integrated capacitor, particularly the lower electrode of a parallel plate capacitor in one form thereof, and an outer plate of a cylindrical-like capacitor in another form thereof, are defined by the polish stop layer during chemical mechanical polishing (CMP) of a gate of the transistor. According to an aspect of the subject invention, the polish stop layer may be an oxide or a nitride.

Abstract: The present invention provides a method for reliability testing leakage characteristics in an electronic circuit, and a testing device for accomplishing the same. In an advantageous embodiment, the method includes dividing conductors of an electronic circuit into at least first and second noninterleaved regions having at least two conductors each. The method further includes forming conductor nets by electrically connecting ones of the at least two conductors of the first region to ones of the at least two conductors of the second region then testing for electrical leakage in the conductor nets.

Abstract: Accurate models of the contact region of an integrated circuit resistor are created in a single function. The function incorporates many contact geometries into a single function that cannot otherwise be represented by a closed form solution. A method of creating the function uses regression over the simulation results for many combinations of input variables. The function may use the contact resistance, metal trace resistance, and resistive area resistance as inputs to calculate the resistor contact region resistance.

Abstract: A method of testing a floor plan for an integrated circuit prior to resynthesis includes attempting to construct a least-penalty path connecting pins of each long distance pin pair in the floor plan to determine whether the floor plan has an unreachable pin; and if the least-penalty path is constructed, then attempting to construct a least-penalty path connecting pins of each long distance pin pair in the floor plan to determine whether the floor plan has a bottleneck.

Abstract: A test package for electromigration testing includes a die having a plurality of I/O pads formed on a metal layer, a plurality of traces formed on the die electrically connecting adjacent pairs of the I/O pads, a plurality of bumped interconnects formed on the I/O pads, and a substrate having a plurality of bump-to-bump interconnects formed on a top surface of the substrate adjacent to the die wherein the plurality of bump-to-bump interconnects is electrically coupled to the plurality of bumped interconnects so that the plurality of bumped interconnects is connected in series.

Abstract: A method for adjusting preliminary feature position characteristics of a preliminary mask pattern on a mask to produce a desired etch pattern on a substrate having desired feature position characteristics.

Abstract: The present invention is directed to a system and method for effective approximation of smooth functions. In an aspect of the present invention, a method for approximating a smooth function for implementation in an integrated circuit design includes receiving a function f for computation with an accuracy of m bits by an integrated circuit. The function is computed based on an operator with one more output than the accuracy of m bits and a value of f′ is determined by choosing from one of the at least two numbers computed utilizing the operator with one more output. The value may be chosen based on complexity issues in the construction of a binary decision diagram for use in designing the integrated circuit.

Abstract: The present invention is directed to a system and method for providing an overlap remover manager. A method for removing overlaps in a circuit design for an integrated circuit may include initiating an overlap remover manager, wherein the overlap remover manager is suitable for moving cells of an integrated circuit design to remove cell overlaps. A search for critical wires is performed and a determination is made of which violated moves of cells caused at least one critical wire. A determined violated move of the cells is rolled back and the overlap remover manager employed to remove overlaps between rolled back cells.

Abstract: A serial data communication receiver includes a serial data input and first and second sets of data capture latches, which are coupled to the serial data input and have first and second recovered data outputs, respectively. One of the sets is designated as a master set and the other a slave set. Each data capture latch has a respective independently adjustable offset voltage. An offset adjustment control circuit varies the respective offset voltage over a range of offset voltage values for each of the data capture latches in the slave set while comparing the first and second recovered data outputs to produce an error output. The control circuit then sets each of the respective offset voltages in the slave set to one of the offset voltage values based on the error output.

Abstract: Control signals of an I/O or peripheral bus are sensed during cycles of the bus and information describing bus phases of the signals is derived by sensing the control signals and is stored in a register. During a sampling time period, a processor reads the bus phase information from the register and computes bus activity information by using the bus phase information. The computed bus information is continuously updated and displayed to reflect actual communication activity on the bus occurring substantially in real-time.

Abstract: A circuit generally comprising a control function and a checksum function is disclosed. The control function may be configured to assert (i) a start signal in response to a signal having a predetermined sequence of values matching an entry value and (ii) a stop signal in response to the signal matching an exit value. The checksum function configured to (i) generate a checksum value for the signal between assertions of the start signal and the stop signal and (ii) generate a result signal in response to comparing the checksum value with an expected value.