Abstract: A method of generating a truncated scan test pattern for an integrated circuit design includes steps of: (a) receiving as input an integrated circuit design; (b) estimating a number of transition delay fault test patterns and a corresponding number of top-off stuck-at fault patterns to achieve maximum stuck-at fault and transition delay fault coverage; (c) truncating the estimated number of transition delay fault patterns to generate a truncated set of transition delay fault patterns so that the truncated set of transition delay fault patterns and the corresponding number of top-off stuck-at fault patterns achieve maximum stuck-at fault and transition delay fault coverage within a selected scan memory limit; and (d) generating as output the truncated set of transition delay fault patterns and the corresponding number of top-off stuck-at fault patterns.

Abstract: A method of canceling noise in analog circuits is described along with noise cancellation circuits. Analog circuits are sensitive to noise. Especially in mixed signal environments where digital circuits and analog circuits are combined, the noise generated by relatively noisy digital circuits often cause the analog circuits to produce incorrect output signals. Instead of shielding or separating the susceptible analog circuits from noisy digital circuits, additional circuitry is added where one of the added circuits, denoted as the noise separator circuit, produce only the noise component of the output signal, the first output, of the analog circuit adversely affected by the noise. Then, another circuit is used to subtract the noise from the first output, thereby producing a noise-free output signal. Alternatively, the noise separator circuit can be made to produce the inverse of the first output, including the inverse of the noise.

Abstract: A microprocessor based system automatically detects the occurrence of certain conditions in the microprocessor. The conditions may include a determination of data corruption in the microprocessor. If a determination is made that data is corrupted, the microprocessor may be reloaded from a non-volatile memory. During a reload, a microcontroller controls the microprocessor. The non-volatile memory may be a flash memory or non-volatile random access memory.

Abstract: An image processing circuit inputs pixels arranged in RGB Bayer pattern. A chroma value calculation circuit calculates a chroma coefficient for evaluating chroma of a peripheral region of a target pixel. A correlation value calculation circuit calculates a correlation value for gray image and a correlation value for color image. When the chroma coefficient is higher than a first threshold value, a correlation judging method for color image and a pixel interpolation method for color image are selected. When the chroma coefficient is not higher than the first threshold value and higher than a second threshold value, a correlation judging method for gray image and the pixel interpolation method for color image are selected. When the chroma coefficient is not higher than the second threshold value, the correlation judging method for gray image and a pixel interpolation method for gray image are selected. Interpolation is executed in a pixel interpolation circuit.

Abstract: The present invention may generally provide a processor circuit comprising a processor, a first bus, a bus pipeline stage, and a second bus. The first bus may be coupled to the processor. The bus pipeline stage may be coupled between the first bus and the second bus and configured to delay an access between the first bus and the second bus at least one pipeline cycle.

Abstract: An apparatus and method for dynamically enabling and disabling interrupt coalescing in a data processing system. The present invention involves consistently monitoring IO load on an IOP of an IO adapter. The firmware on the IO adapter may have a global variable that stores counters for PCI function registers. Each counter tracks the number of outstanding IOs of a corresponding PCI function register. The counter is incremented whenever a new IO is received and is decremented upon posting the completed message back to the OS. A timer interrupt is generated periodically so that an ISR may be periodically performed. In the ISR, the maximum value stored of each counter seen since last timer interrupt is analyzed. When the maximum value stored is greater than a predetermined threshold value, the interrupt coalescing is enabled.

Abstract: A method for designing a routing pattern for electrical contacts on a printed circuit board by arranging contacts in an array of rows and columns on the printed circuit board, connecting groups of n columns of contacts to n?1 columns of vias disposed interstitially between the contacts, thereby forming a vertical channel that does not extend completely through the contact array. Connecting the vias to traces, and routing the traces to an outside edge of the via array through the vertical channel. Connecting groups of n rows of the contacts to n?1 rows of vias disposed interstitially between the contacts, thereby forming a horizontal channel that does not extend completely through the contact array, and intersects with the vertical channel. Connecting the vias to traces, and routing the traces to the outside edge of the via array through the horizontal channel.

Abstract: A method for validating operation of a fiber link when the fiber link is initialized includes the steps of entering a trial link up state upon receiving a command to initialize the fiber link so that normal commands to other devices within the fiber channel loop are not resumed, and thereafter entering a final link up state and resuming normal commands to other devices within the fiber channel loop. In exemplary embodiments, the method may be implemented by devices within a system such as a disk array system of a storage area network (SAN), or the like.

Abstract: An apparatus comprising a first circuit, a second circuit and a third circuit. The first circuit may be configured to filter an analog input signal in an analog domain in response to one or more control signals. The second circuit may be configured to convert the analog input signal to a digital signal. The third circuit may be configured to generate the control signals in response to the digital signal. The third circuit may also be configured to control skewing of the analog input signal within the first circuit to partially compensate for frequency dependent effects associated with a transmission medium.

Abstract: A set of tools is provided herein that produces useful, proven, and correct integrated semiconductor chips. Having as input either a customer's requirements for a chip, or a design specification for a partially manufactured semiconductor chip, the tools generate the RTL for control plane interconnect; memory composition, test, and manufacture; embedded logic analysis, trace interconnection, and utilization of spare resources on the chip; I/O qualification, JTAG, boundary scan, and SSO analysis; testable clock generation, control, and distribution; interconnection of all of the shared logic in a testable manner from a transistor fabric and/or configurable blocks in the slice. The input customer requirements are first conditioned by RTL analysis tools to quickly implement its logic. The slice definition and the RTL shell provides the correct logic for a set of logic interfaces for the design specification to connect. The tools share a common database so that logical interactions do not require multiple entries.

Abstract: A semiconductor wafer is placed into a probe fixture with a front side of the wafer facing up. Power and signal probes are then placed on an integrated circuit (IC) formed on the front side of the wafer. The probe fixture is retained at a test station either in a upright or an inverted position for testing and optical failure analysis. The probe fixture includes a position adjustment mechanism to locate the entire probe above the wafer and to more precisely position a tip of the probe on the IC. Optical failure analysis techniques are performed on the front side or the back side of the wafer while the wafer is retained in the test fixture and the probes are connected to the IC.

Abstract: A computer-aided circuit design application has a virtual node feature and a design tool. The virtual node feature is adapted to access design specification information in a first data format and to represent the accessed design specification information as a virtual data node object within a list of node objects in a second data format. The design tool is operable on the list of node objects and the virtual data node object.

Abstract: Buffers are inserted into an integrated circuit chip design using a table that identifies buffer types based on buffer height, input capacitance, output capacitance and ramptime. A buffer routing tree is created having root, internal and leaf vertices. For each internal vertex, the initial circuit parameters are compared to circuit parameters associated with buffers identified in the table to identify whether a buffer identified in the table can be inserted to the respective internal vertex. If it can, an optimal insertable buffer is selected from the table and inserted to a selected internal vertex based at least in part on the comparison results. Also described is a computer process of creating the buffer type table.

Abstract: The present disclosure is directed to a method of selecting cells in an integrated circuit for logic restructuring of an original design. The original design includes a set of parameters. The method includes forming a restructuring set that will include the selected cells for logic restructuring, and a candidate set. The restructuring set includes restructuring cells with an initial cell. The restructuring set is adapted to accept additional cells identified as restructuring cells. The candidate set is adapted to include candidate cells, where each candidate cell in the candidate set is connected to at least one of the restructuring cells in the restructuring set. The candidate set is adapted to remove candidate cells from the candidate set. The restructuring set is adapted to accept selected removed candidate cells as identified restructuring cells if a corresponding parameter is included in the set of parameters.

Abstract: A method of defining a transformation between an input signal and an output signal. The transformation may implement a pseudo-random one-to-one function that may be implemented in hardware and/or software or modeled in software. The method may comprise the steps of (A) allocating the input signal among a plurality of block input signals, (B) establishing a plurality of transfer functions where each transfer function may be configured to present a plurality of unique symbols as a block output signal responsive to said block input signal, and (C) concatenating the block output signals to form the output signal.

Abstract: A processor is disclosed that executes an instruction including a user-defined value (an address or a command) and provides the user-defined value during execution of the instruction. In one embodiment the processor includes a bus interface adapted for coupling to a bus, and the processor drives the user-defined address or command upon one or more signal lines of the bus via the bus interface during execution of the instruction. A described data processing system includes the processor coupled to a device including an addressable register. The device receives a user-defined address from the processor and accesses the addressable register in response to the user-defined address. Methods are disclosed for obtaining a value stored in an addressable register, providing a value stored in an addressable register, storing a value in an addressable register, and modifying a value stored in an addressable register.

Abstract: A system for generating an Open Library Architecture Delay and Power Calculation Module. The system includes a user interface for generating and submitting requests that specify configurations and types of memories for which Open Library Architecture Delay and Power Calculation Modules are needed. A server is configured to received the requests and produce Open Library Architecture Delay and Power Calculation Modules in response thereto.

Abstract: The present invention is directed to a method and apparatus for mapping platform-based design to multiple foundry processes. According to an exemplary aspect of the present invention, a predefined (or pre-specified) slice is successfully mapped on to a first fabrication process with a first set of design rules to produce a first result. Then the slice's ability to be mapped to a second fabrication process with a second set of design rules is evaluated to produce a second result. Next, the comparison between the two results is computed to produce a third result. The third result may be then used to modify the slice architecture, optimize the metalization process and/or modify the first or second fabrication process. The slice definition, the first set of design rules, the second set of design rules, the first result, the second result, and the third result may be stored into a database.

Abstract: A method and apparatus are provided for protecting elements of a receiver from overvoltages in a pseudo-differential signal having a true signal and a reference voltage. The method and apparatus limit the true signal to a protection voltage, which is correlated to the reference voltage, to produce a protected true signal. The protected true signal and the reference voltage are applied to inputs of the receiver.

Abstract: A method and apparatus are provided for summing DC voltages, which employ at least one native transistor device to add a first DC input voltage to a second DC input voltage to produce a sum output.