Abstract: A light system includes at least one time-of-flight image sensor configured to generate at least one zone distance measurement. At least one control unit is configured to receive the at least one zone distance measurement and to generate at least one control signal based on the at least one zone distance measurement. At least one light unit is configured to adapt an output of the light unit based on the at least one control signal.

Abstract: A class D amplifier receives and amplifies a differential analog signal which is then differentially integrated. Two pulse width modulators generate pulse signals corresponding to the differentially integrated analog signal and two power units generate output pulse signals. The outputs the power units are coupled to input terminals of integrators via a resistor feedback network. An analog output unit converts the pulse signals to an output analog signal. The differential integration circuitry implements a soft transition between mute/un-mute. In mute, the integrator output is fixed. During the soft transition, the PWM outputs change slowly from a fixed 50% duty cycle to a final value to ensure that no pop noise is present in the output as a result of mode change.

Abstract: A MOS transistor is produced on and in an active zone which includes a source region and a drain region. The active zone is surrounded by an insulating region. A conductive gate region of the transistor has two flanks which extend transversely to a source-drain direction, and the conductive gate region overlaps two opposite edges of the active zone act overlap zones. The conductive gate region includes, at a location of at least one overlap zone, at least one conductive tag which projects from at least one flank at a foot of the conductive gate region. The conductive tag covers a part of the active zone and a part of the insulating region.

Abstract: An integrated circuit includes a substrate and an interconnect. A substrate zone is delineated by an insulating zone. A polysilicon region extends on the insulating zone and includes a strip part. An isolating region is situated between the substrate and the interconnect and covers the substrate zone and the polysilicon region. A first electrically conductive pad passes through the isolating region and has a first end in electrical contact with both the strip part and the substrate zone. A second end of the electrically conductive pad is in electrical contact with the interconnect. A second electrically conductive pad also passes through the isolating region to make electrical contact with another region. The first and second electrically conductive pads have equal or substantially equal cross sectional sizes, within a tolerance.

Abstract: A charge pump includes boosting circuits cascade coupled between first and second nodes, wherein each boosting circuit is operable in both a positive voltage boosting mode to positively boost voltage and a negative voltage boosting mode to negatively boost voltage. A first switching circuit selectively applies a first voltage to one of the cascaded boosting circuits in response to a first logic state of a periodic enable signal, with the cascaded boosting circuits operating in the positive voltage boosting mode to produce a high positive voltage at the second node. A second switching circuit selectively applies a second voltage to another of the cascaded boosting circuits in response to a second logic state of the periodic enable signal, with the cascaded boosting circuits operating in the negative voltage boosting mode to produce a high negative voltage at the first node. Simultaneous output of the positive and negative voltages is made.

Abstract: An electronic device includes a first integrated circuit die having formed therein photodiodes and readout circuitry for the photodiodes, with the readout circuitry including output pads exposed on a surface of the first integrated circuit die. A second integrated circuit die has formed therein storage capacitor structures for the photodiodes and digital circuitry for performing image processing on data stored in the storage capacitor structures, with the storage capacitor structures including input pads exposed on a surface of the second integrated circuit die. The first and second integrated circuit die are in a face to face arrangement such that the output pads of the first integrated circuit die face the input pads of the second integrated circuit die. An interconnect couples the output pads of the first integrated circuit die to the input pads of the second integrated circuit die.

Abstract: An integrated circuit includes a substrate, an interconnection part, and an isolating region located between the substrate and the interconnection part. A decoy structure is located within the isolating region and includes a silicided sector which is electrically isolated from the substrate.

Abstract: An integrated circuit chip is mounted to a front face of a support plate. An encapsulation cap in then mounted to the support plate. The encapsulation cap includes a front wall and a peripheral wall having an end edge at least partly facing a peripheral zone of the support plate. The support plate and the encapsulation cap delimit a chamber in which the integrated circuit chip is situated. To mount the encapsulation cap, a bead of glue is inserted between the peripheral zone and the end edge of the peripheral wall of the encapsulation cap. A peripheral outer face of the encapsulation cap includes a recess extending from the end edge which locally uncovers a part of the bead of glue. A local hardening of the glue at the recess is performed as a first attachment step. Further hardening of the remainder of the glue is then performed.

Abstract: Multicast transmissions do not allow for individual receivers to acknowledge that data was received by each receiver in the network. This is not acceptable for isochronous systems that require specific levels of QoS for each device. A multimedia communications protocol supports using multicast transmissions (one-to-many) in multimedia isochronous systems. A transmitter establishes a Multi-ACKed Multicast protocol within which a group of receiving devices can acknowledge the multicast transmission during a multi-acknowledgment period.

Abstract: An electronic image capture device includes a first portion and a second portion. The first portion is formed by a substrate wafer provided on one side with electronic circuits and a dielectric layer with a network of electrical connections and external electrical contacts on an outer surface. The second portion includes a pixel wafer capable of generating electrical signals under the effect of light, a substrate wafer mounted to the pixel wafer and provided with electronic circuits and a dielectric layer with a network of electrical connections and external electrical contacts on an outer surface. The outer surfaces and external electrical contacts are bonded to each other so as to mount the first portion to the second portion. A connection pad extends through a hole in the pixel wafer to make electrical connection to the network of electrical connections of the second portion.

Abstract: A MOS transistor is produced on and in an active zone and included a source region and a drain region. The active zone has a width measured transversely to a source-drain direction. A conductive gate region of the MOS transistor includes a central zone and, at a foot of the central zone, at least one stair that extends beyond the central zone along at least an entirety of the width of the active zone.

Abstract: A MOS transistor located in and on a semiconductor substrate has a drain region, a source region and a conductive gate region. The conductive gate region includes a first conductive gate region that is insulated from the semiconductor substrate and a second conductive gate region that is insulated from and located above the first conductive gate region. A length of the first conductive gate region, measured in the drain-source direction, is greater than a length of the second conductive gate region, also measured in the drain-source direction. The first conductive gate region protrudes longitudinally in the drain-source direction beyond the second conductive gate region at least on one side of the second conductive gate region so as to extend over at least one of the source and drain regions.

Abstract: A power supply voltage detector circuit monitors a ramping supply voltage and selectively enables a voltage divider for operation to divide the ramping supply voltage in response to the ramping supply voltage exceeding a first threshold. Additionally, a variable resistance of the voltage divider is changed in response to the ramping supply voltage exceeding a second threshold. A voltage output from the voltage divider is used to generate a bandgap voltage used as a reference voltage in comparison operations for controlling enabling of the voltage divider and selection of the variable resistance.

Abstract: A single stage voltage quadrupler circuit includes a first capacitive voltage boosting circuit responsive to a first clock signal and operable to boost a voltage at a first node in response to the first clock signal from a first voltage level to a second voltage level that is substantially two times the first voltage level. A pass transistor selectively passes the boosted voltage at the first node to a second node in response to a control signal generated by a bootstrapping capacitor circuit in response to the level shifted first clock signal. A second capacitive boosting circuit is operable to boost the voltage at the second node in response to a level shifted second clock signal that is the logical invert of the level shifted first clock signal to third voltage level that is substantially four times the first voltage level.

Abstract: A semiconductor substrate has a back face and a front face and includes a semiconductor well that is electrically isolated from the semiconductor substrate. A device is configured to detect a thinning of the semiconductor substrate from the back face. The device includes at least one trench that extends within the semiconductor well between two peripheral locations from the front face down to a location situated at a distance from a bottom of the semiconductor well. The trench is electrically isolated from the semiconductor well. A detection circuit is configured to measure a physical quantity representative of well electrical resistance between two contact areas respectively situated on either side of the at least one first trench.

Abstract: A phase change memory device includes two portions with local bitlines connected to memory cells. A reading stage is configured to read logic data stored by the first and second memory cells. A first main bitline extends between the reading stage and the first local bitlines and a first main switch is coupled between the first main bitline and reading stage and likewise for the second portion. Local switches are associated with respective ones of the local bitlines. A first reference signal generator is coupled to the reading stage. The phase change memory device is configured to operate in a first reading mode, in which the logic data stored by the first memory cell is read by the reading stage by comparison with the reference signal.

Abstract: Video encoders and decoders and video encoding and decoding methods are provided. A video encoder includes an input buffer configured to receive a video data stream and to supply current frame data, a frame buffer configured to store reconstructed frame data, and an encoder circuit configured to read reference frame data from the frame buffer, to encode the current frame data received from the input buffer using the reference frame data and to write the reconstructed frame data to the frame buffer. The encoder circuit may be configured to write the reconstructed frame data by overwriting the reference frame data in the frame buffer.

Abstract: A control circuit for a switching voltage regulator is configured to receive an error signal representative of a regulator output voltage in relation to a nominal output voltage, and includes a set/reset flip-flop, a hysteresis comparator and a logic circuit. The flip-flop is configured to produce a switching control signal according to logic values at its set and reset terminals. The comparator is configured to produce a set signal at the set terminal when an error signal drops below a first value, and a reset signal when the error signal rises above a second value. The logic circuit is configured to prevent transmission of the reset signal to the reset terminal during a selected minimum time period and to thereafter enable transmission of the reset signal, and further, to produce an alternate reset signal at the reset terminal at the end of the selected maximum time period.

Abstract: A read amplifier of a memory device has two current generators, an inverter, and five transistors. The inverter is connected to the second current generator. The first transistor has a gate connected to the read amplifier, a drain connected to the first current generator, and a source connected to a reference ground. The second transistor has a gate connected to the first current generator, a drain connected to a reference voltage, and a source connected to the gate of the first transistor. The third transistor has a drain connected to the first current generator and a source connected to the reference ground. The fourth transistor has a gate connected to the first current generator, a drain connected to the second current generator, and a source connected to the reference ground. The fifth transistor has a drain connected to the second current generator and a source connected to the reference voltage.

Abstract: A MEMS piezoelectric device includes a monolithic semiconductor body having first and second main surfaces extending parallel to a horizontal plane formed by first and second horizontal axes. A housing cavity is arranged within the monolithic semiconductor body. A membrane is suspended above the housing cavity at the first main surface. A piezoelectric material layer is arranged above a first surface of the membrane with a proof mass coupled to a second surface, opposite to the first surface, along the vertical axis. An electrode arrangement is provided in contact with the piezoelectric material layer. The proof mass causes deformation of the piezoelectric material layer in response to environmental mechanical vibrations. The proof mass is coupled to the membrane by a connection element arranged, in a central position, between the membrane and the proof mass in the direction of the vertical axis.