Abstract: A tunnel junction type superconducting device includes a pair of superconductor electrodes formed of compound oxide superconductor material, and a metal layer of a high electric conductivity formed between the pair of superconductor electrodes so as to maintain the pair of superconductor electrodes separate from each other. The pair of superconductor electrodes is separated from each other by a distance within a range of 3 nm to 70 nm by action of the metal layer.

Abstract: A BiMOS integrated circuit device comprises a bipolar transistor and at least one MOSFET. The collector and emitter of the bipolar transistor are connected to a high potential source and a low potential source, respectively. The MOSFET has two gate electrodes, a source, and a drain. The source is connected to the high potential source, and the drain is the base of the bipolar transistor by a diffusion layer. The diffusion layer is located between the gate electrodes, and serves as both the base of the bipolar transistor and the drain of the MOSFET. Therefore, the MOSFET has a great channel width, and a large current can be supplied to the base of the bipolar transistor. In other words, the MOSFET has a great driving capability, and the bipolar transistor has a high amplification factor.

Abstract: A dynamic random access memory includes a first conductivity type semiconductor substrate (40), a plurality of word lines (1a, 1b, 1c, 1d), a plurality of bit lines (2a, 2b) and a plurality of memory cells (3). The memory cells (3) are provided at the intersections between the word lines (1a, 1b, 1c, 1d) and the bit lines (2a, 2b). Each of the memory cells (3) includes a pair of impurity regions (6a, 6b) of a second conductivity type, a gate electrode (8) connected to the word line (1a, 1b, 1c, 1d), a storage node (9) and a cell plate (11). A capacitor (5) including the storage node (9) and the cell plate (11) is located above the bit lines (2a, 2b). The storage node (9) is formed to extend from a bottom surface to a side surface of a hole (Ct1, Ct2) formed in an insulator layer (14a, 14b) so as to extend to a surface of one impurity region (6a). The cell plate (11) is formed to interpose the storage node (9) between two layers thereof along the bottom surface and the side surface of the hole (Ct1, Ct2).

Abstract: A semiconductor integrated circuit device includes a semiconductor substrate, a field insulation film formed on a surface of the semiconductor substrate by a selective thermal oxidation process employing an oxidation-resistant mask whereby first and second groups of openings are formed therein for exposing the substrate at predetermined locations respectively corresponding to first and second active regions and relative to which first and second groups of contact holes are to be formed.

Abstract: A semiconductor device comprises a collector region of first conductivity type, a base region of second conductivity type, and an emitter region of first conductivity. The base region has first base area and second base area provided around the first base area. A band gap width of said second base area is greater than that of the first base area.

Abstract: A dynamic random access memory comprises a memory cell region and a sense amplifier region defined on a substrate, a plurality of memory cell capacitors provided on the memory cell region in correspondence to memory cell transistors, a first insulation layer provided on the semiconductor substrate to cover both the memory cell region and the sense amplifier region, a first conductor pattern provided on the first insulation layer, an intermediate connection pattern provided on the first insulation layer in correspondence to the sense amplifier region, a spin-on-glass layer provided on the first insulation layer to extend over both the memory cell region and the sense amplifier region, and a projection part provided on the substrate of the sense amplifier region in correspondence to the intermediate connection pattern under the first insulation layer for lifting the level of the surface of the first insulation layer such that the intermediate interconnection pattern is exposed above the upper major surface of t

Abstract: A photoelectric converting device has non-monocrystalline semiconductor layers of PIN structure laminated on mutually isolated plural pixel electrodes. P- or N-doped layer on the pixel electrode contains at least a microcrystalline structure. N- or P-doped layer on the area other than the pixel electrode is amorphous.

Abstract: A conductivity modulation type MISFET, and a control circuit thereof are provided. A semiconductor device 1 comprises a conductivity modulation type MOSFET 1a and a built-in MOSFET 1b which is designed to control a source electrode 12a and a control electrode 13 of a parasitic transistor to be in a short state or an open state, said conductivity modulation type MOSFET 1a having a polysilicon gate 6 on an obverse surface of n.sup.- -type conductivity modulation layer 4, a p-type channel diffusion area 7, n.sup.+ -type source diffusion area 8 and a parasitic transistor control electrode 13 conductively connected to the p-type channel diffusion area 7 through a p.sup.+ -type contact area 9.

Abstract: The structure and method of this invention provide, for example, electrical isolation between active elements in adjacent rows and/or columns of an integrated circuit by use of a self-aligned field-plate conductor formed over and insulated from the substrate regions that are bounded by the channel regions of field-effect transistors in adjacent rows and that are bounded by the bitlines forming those transistors in a column. The field-plate conductor is formed, for example, in a strip that extends over the isolation areas and thermal insulator regions between row lines of the memory cell array. The field-plate conductor strip is connected to a voltage supply that has a potential with respect to the potential of the semiconductor substrate which causes the isolation areas to be nonconductive. Component density may be increased over that of prior-art structures and methods.

Abstract: A depletion operation is realized by using a depletion type MOSFET even at the room temperature or the liquid nitrogen temperature without doping the channel portion below the gate electrode with impurities having a conductivity type, which is opposite to the conductivity type of the semiconductor substrate. Further this FET can construct an inverter together with an enhancement type FET and these can be integrated on one substrate.

Abstract: A semiconductor device includes a first neutral impurity layer formed to a predetermined depth from a surface of a semiconductor substrate in a channel region that is interposed between source/drain regions and located below a gate electrode, and a second neutral impurity layer having a higher concentration than that of the first neutral impurity layer and formed to surround lower portions of the source/drain regions except for the channel region. Scattering of neutral impurities in the first neutral impurity layer suppresses generation of hot carriers, and the second neutral impurity layer suppresses diffusion of impurities in the source/drain regions in thermal processing. The second neutral impurity layer is formed by implanting neutral impurities obliquely after formation of the gate electrode.

Abstract: The efficiency of semiconductor cathodes based on avalanche breakdown is enhanced by using ".delta.-doping" structures. The quantization effects introduced thereby decrease the effective work function. A typical cathode structure has an n-type semiconductor region and a first p-type semiconductor region, with the n-type region having a thickness of at most 4 nanometers.

Abstract: A contact hole in a diffusion region is narrowed by a buffer layer formed at about the middle of an interlayer insulating film in its thickness direction. This buffer layer serves as effective alignment tolerances to the diffusion region and a contact electrode at the time of forming the contact hole. The structure having a wiring conductor filled in the contact hole and having the contact electrode formed on this wiring conductor can assure a highly reliable contact. Forming a buffer layer as a sidewall on this contact electrode and a first wiring layer formed on the same layer can assure an effective alignment tolerance to the first wiring layer at the time of forming a VIA hole. Filling a wiring conductor in the VIA hole can eliminate the need for any contact tolerance for a second wiring layer to be formed on this wiring conductor. Accordingly, the individual contact tolerances can be assured by self-alignment.

Abstract: A semiconductor device includes a housing, a semiconductor element disposed in a lower section inside the housing, an external lead terminal at least partially disposed within the housing, a gelled filler disposed within the housing, the semiconductor element and at least a portion of the external lead terminal being embedded in the gelled filler, a hardened sealing resin layer disposed over the gelled filler, and at least one internal pressure absorbing chamber having a pocket-type sealed space, the internal pressure absorbing chamber passing through the sealing resin layer and being open at an upper surface side of the gelled filler. The semiconductor device prevents a rise in the internal pressure of the housing in response to thermal expansion of the gelled filler sealed within the housing, and the absorption of external moisture by the gelled filler.

Abstract: In an MOS-controlled thyristor MCT comprising a multiplicity of adjacently disposed individual MCT cells (MC) having a cell width and which are electrically connected in parallel, either the MCT cells (MC) themselves or cell clusters (15) comprising a few closest-packed MCT cells (MC) are mutually separated by nonemitting gaps (2) which do not inject charge carriers into the cathode base layer and which have lateral linear dimensions greater than or at least equal to the cell width of the MCT cells (MC). As a result of this separation, the full performance of the individual MCT cell (MC) is achieved even in large-area components containing many cells.

Abstract: Stress induced grain boundary movement in aluminum lines used as connections in integrated circuits is substantially avoided by doping the aluminum with iron. Through this expedient not only is grain boundary movement avoided but electromigration problems are also decreased.

Abstract: A pair of first and second thin film transistors (TFTs). The transistors are formed from a first continuous, conductive region (38) and a second continuous, conductive region (39) which underlies the first conductive region (38). The first transistor has a source region (50), a drain region (54), and a channel region (52) created from three distinct and separate regions of conductor region (39). The first transistor has a gate region (53) that overlies the channel region (52). The gate region (53) is formed from a distinct region of conductive region (38). The second transistor has a source region (44), a drain region (48), and a channel region (46) which are created from three distinct and separate regions of conductor region (38). The second transistor has a gate region (47) that underlies the channel region (46). The gate region (47) is formed from a distinct region of conductive region (39).

Abstract: A semiconductor memory device having a non-volatile memory transistor and a selection transistor formed near the non-volatile memory transistor. The channel region surface of the memory transistor is formed to have the same conductivity type with a lower density than the channel region surface of the selection transistor or opposite conductivity type so that the characteristic of the memory transistor shifts to the negative side resulting in a sufficient read margin for an erased cell even at a control voltage of 0.

Abstract: A thin-film transistor comprises a gate electrode formed on a glass substrate, a gate insulating film formed essentially over an entire surface of the substrate to cover the gate electrode, a non-single-crystal silicon semiconductor film placed on the gate insulating film to cover the gate electrode; and a drain electrode and a source electrode spaced a specified distance apart on the semiconductor film and electrically connected to the semiconductor film so as to form the channel region of the transistor. The gate electrode is made of titanium-containing aluminum.

Abstract: A phototransistor includes a monocrystalline semiconductor substrate of a first conductivity type, a crystalline semiconductor layer of a second conductivity type formed from a surface of the semiconductor substrate to a predetermined depth, a substantially intrinsic amorphous semiconductor layer formed on the crystalline semiconductor layer, and an amorphous semiconductor layer of the first conductivity type formed on the intrinsic amorphous semiconductor layer.