Patents Examined by Fernando Hidalgo
  • Patent number: 10984869
    Abstract: A memory device includes: a memory block including a plurality of main pages and a dummy page; a peripheral circuit for performing a normal program operation on the plurality of main pages and a dummy program operation on the dummy page in a program operation, and reading data stored in the dummy page and the plurality of main pages in a read operation; and control logic for controlling the peripheral circuit to program, to the dummy page, the same data as first logical page data of a first main page among the plurality of main pages in the program operation.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: April 20, 2021
    Assignee: SK hynix Inc.
    Inventors: Sung Ho Kim, Jong Han Ahn, Seong Cheon Yu
  • Patent number: 10978152
    Abstract: Systems and methods for reducing program disturb when programming portions of a memory array are described. A memory array may include a first set of NAND strings and a second set of NAND strings that share a common bit line that is connected to the drain-side end of drain-side select gates of the NAND strings and/or share a common source-side select gate line that connects to the gates of source-side select gates of the NAND strings. During programming of the first set of NAND strings a first pass voltage (e.g., 7V) may be applied to unselected word lines of the memory array and subsequently during programming of the second set of NAND strings a second pass voltage (e.g., 9V) greater than the first pass voltage may be applied to the unselected word lines of the memory array.
    Type: Grant
    Filed: November 13, 2019
    Date of Patent: April 13, 2021
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Rajdeep Gautam, Hardwell Chibvongodze, Ken Oowada
  • Patent number: 10971231
    Abstract: Systems and methods for reducing program disturb when programming portions of a memory array are described. A memory array may include a first set of NAND strings and a second set of NAND strings that share a common bit line that is connected to the drain-side end of drain-side select gates of the NAND strings and/or share a common source-side select gate line that connects to the gates of source-side select gates of the NAND strings. During programming of the first set of NAND strings a first pass voltage (e.g., 7V) may be applied to unselected word lines of the memory array and subsequently during programming of the second set of NAND strings a second pass voltage (e.g., 9V) greater than the first pass voltage may be applied to the unselected word lines of the memory array.
    Type: Grant
    Filed: June 26, 2020
    Date of Patent: April 6, 2021
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Rajdeep Gautam, Hardwell Chibvongodze, Ken Oowada
  • Patent number: 10971219
    Abstract: A semiconductor device capable of improving operating margins is provided. The semiconductor device comprises a memory circuit including a memory cell comprised of a SOTB transistor, and a mode designation circuit switching operation modes of the memory circuit for a first mode or a second mode. The memory circuit includes a substrate bias generation circuit supplying a substrate bias voltage to the SOTB transistor and a timing signal generation circuit generating a timing signal used for a reading operation or a writing operation of the memory circuit. The substrate bias generation circuit does not supply the substrate bias voltage to the SOTB transistor in the second mode.
    Type: Grant
    Filed: October 30, 2019
    Date of Patent: April 6, 2021
    Assignee: RENESAS ELECTRONICS CORPORATION
    Inventors: Makoto Yabuuchi, Shinji Tanaka
  • Patent number: 10971220
    Abstract: A semiconductor memory device includes an array of memory cells arranged in a plurality of rows and columns, with each memory cell including a plurality of bit cell transistors. The semiconductor memory device further includes a plurality of write assist circuits, including one or more write assist circuits within each column of the array of memory cells, each write assist circuit configured to provide a core voltage to memory cells within the same column and to reduce the core voltage during a write operation. The array of memory cells and the plurality of write assist circuits have a common semiconductor layout.
    Type: Grant
    Filed: January 6, 2020
    Date of Patent: April 6, 2021
    Assignee: Taiwan Semiconductor Manufacturing Company Limited
    Inventors: Sahil Preet Singh, Yen-Huei Chen, Hung-Jen Liao
  • Patent number: 10971509
    Abstract: A semiconductor memory device according to the present technology includes a stack body including a lower conductive pattern and an upper conductive pattern stacked apart from each other in a first direction, and at least one intermediate conductive pattern disposed between the lower conductive pattern and the upper conductive pattern, a contact plug connected to the lower conductive pattern and extending in the first direction, and at least one lower dummy plug overlapping the lower conductive pattern.
    Type: Grant
    Filed: November 13, 2019
    Date of Patent: April 6, 2021
    Assignee: SK hynix Inc.
    Inventor: Jae Taek Kim
  • Patent number: 10964401
    Abstract: An arrangement is described used to throttle data in a connected computer device having a device configured to transmit and receive data from a host, the device comprising, a device controller configured to interact with at least memory array and a data transfer throttling arrangement, the data transfer throttling arrangement configured to measure a bandwidth threshold for the device controller and pass data through the device controller when a bandwidth of the device controller is one of at and below a threshold.
    Type: Grant
    Filed: June 25, 2019
    Date of Patent: March 30, 2021
    Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
    Inventor: Shay Benisty
  • Patent number: 10964712
    Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes blocks each containing memory cells. The controller is configured to instruct the semiconductor memory to execute a first operation and a second operation. In the first operation and the second operation, the semiconductor memory selects at least one of the blocks, and applies at least one voltage to all memory cells contained in said selected blocks. A number of blocks to which said voltage is applied per unit time in the second operation is larger than that in the first operation.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: March 30, 2021
    Assignee: Toshiba Memory Corporation
    Inventors: Takehiko Amaki, Yoshihisa Kojima, Toshikatsu Hida, Marie Grace Izabelle Angeles Sia, Riki Suzuki, Shohei Asami
  • Patent number: 10956832
    Abstract: A method is provided to produce training data set for training an inference engine to predict events in a data center comprising: producing probe vectors corresponding to components of a data center, each probe vector including a sequence of data elements, one of the probe vectors indicating an event at a component and at a time of the event; and producing at a master device a set of training snapshots, wherein each training snapshot includes a subsequence of data elements that corresponds to a time increment that matches or that occurred not later than the indicated time of occurrence of the event.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: March 23, 2021
    Assignee: Platina Systems Corporation
    Inventors: Frank Szu-Jen Yang, Ramanagopal V. Vogety, Sharad Mehrotra
  • Patent number: 10950790
    Abstract: A two-terminal memory device and methods for its use are provided. In the device, a bottom electrode is electrically continuous with a first operating terminal, and a control gate electrode is electrically continuous with a second operating terminal. A stack of insulator layers comprising a hopping conduction layer and a tunnel layer is contactingly interposed between the bottom electrode and the control gate electrode. The tunnel layer is thinner than the hopping conduction layer, and it has a wider bandgap than the hopping conduction layer. The hopping conduction layer consists of a material that supports electron hopping transport.
    Type: Grant
    Filed: February 24, 2020
    Date of Patent: March 16, 2021
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Matthew Marinella, Sapan Agarwal
  • Patent number: 10949745
    Abstract: A cognitive learning device includes inputs with each including an input path having a transistor device having a storage capacity. A circuit is responsive to the inputs and selects an input set in accordance with a current task, wherein the input set selected modifies a characteristic of the transistor device of one or more corresponding input paths to bias the input set for selection for subsequent accesses.
    Type: Grant
    Filed: July 29, 2019
    Date of Patent: March 16, 2021
    Assignee: International Business Machines Corporation
    Inventor: Effendi Leobandung
  • Patent number: 10943661
    Abstract: Numerous embodiments are disclosed for a high voltage generation algorithm and system for generating high voltages necessary for a particular programming operation in analog neural memory used in a deep learning artificial neural network. Different calibration algorithms and systems are also disclosed. Optionally, compensation measures can be utilized that compensate for changes in voltage or current as the number of cells being programmed changes.
    Type: Grant
    Filed: August 25, 2019
    Date of Patent: March 9, 2021
    Assignee: SILICON STORAGE TECHNOLOGY, INC.
    Inventors: Hieu Van Tran, Thuan Vu, Stanley Hong, Anh Ly, Vipin Tiwari, Nhan Do
  • Patent number: 10942873
    Abstract: In one embodiment, an apparatus, such as a memory device, is disclosed. The apparatus includes multiple memory tiles and selection circuitry. Each memory tile has an array of storage components at intersections of a plurality of digit line conductors and a plurality of access line conductors. The selection circuitry includes line drivers that select a storage component of a memory tile based on a corresponding digit line conductor and a corresponding access line conductor to the storage component. The selection circuitry may select two or more storage components of a memory tile in a consecutive manner before selecting the storage components of a different memory tile.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: March 9, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Hernan A. Castro, Kerry Dean Tedrow, Jack Chinho Wu
  • Patent number: 10943667
    Abstract: A memory device is provided. The memory device includes a shift register array having a plurality of shift registers arranged in a matrix of a plurality of rows and a plurality of columns. Each of the plurality of rows comprises a first plurality of shift registers and each of the plurality of columns comprises a second plurality of shift registers. Each of the plurality of rows are associated with a read word line and a write word lines. Each of the plurality of rows are associated with a data input line and a data output line. Each of the plurality of shift arrays comprises a static random access memory.
    Type: Grant
    Filed: October 18, 2019
    Date of Patent: March 9, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Hidehiro Fujiwara, Hsien-Yu Pan, Chih-Yu Lin, Yen-Huei Chen, Hiroki Noguchi, Wei-Chang Zhao
  • Patent number: 10937513
    Abstract: A semiconductor memory device operates by applying a program pulse to a selected word line, updating a program pulse count value, determining a current sensing mode based upon the program pulse count value, and performing a program verify operation based upon the current sensing mode. The current sensing mode is determined by determining one of an individual state current sensing operation for determining verify pass or fail for one target program state and an all-state current sensing operation for determining verify pass or fail for all target program states.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: March 2, 2021
    Assignee: SK hynix Inc.
    Inventors: Jung Mi Ko, Kwang Ho Baek, Ji Hwan Kim, Seong Je Park, Sung Hoon Ahn, Young Don Jung
  • Patent number: 10938395
    Abstract: An electronic device including: a delay circuit configured to adjust a delay of an input for generating an output signal; and an input selection circuit coupled to the delay circuit, the input selection circuit configured to control a phase for a clock input based at least in part on a measurement of a delay corresponding to the delay circuit in generating the input.
    Type: Grant
    Filed: March 4, 2020
    Date of Patent: March 2, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Dan Shi, Tyler J. Gomm, Michael J. Allen
  • Patent number: 10930353
    Abstract: Provided are a non-volatile memory device and an operating method thereof. The non-volatile memory device includes a memory cell array having a vertically stacked structure, a bit line for applying a programming voltage to the memory cell array, and a control logic. The memory cell array includes memory cells that each include a corresponding portion of a semiconductor layer and a corresponding portion of a resistance layer. The memory cells include a non-selected memory cell, a compensation memory cell, and a selected memory cell. The control logic is configured to apply an adjusted program voltage to the selected memory cell, based on applying a first voltage to the compensation memory cell, a second voltage to the selected memory cell, and a third voltage to the non-selected memory cell. The adjusted program voltage may be dropped compared to the programming voltage due to the compensation memory cell.
    Type: Grant
    Filed: January 29, 2020
    Date of Patent: February 23, 2021
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jungho Yoon, Seyun Kim, Jinhong Kim, Soichiro Mizusaki, Youngjin Cho
  • Patent number: 10923184
    Abstract: An SRAM device has a voltage input terminal configured to receive a first signal at a first voltage level. A level shifter is connected to the voltage input terminal to receive the first signal, and the level shifter is configured to output a second signal at a second voltage level higher than the first voltage level. A memory cell has a word line and a bit line. The word line is connected to the output terminal of the level shifter to selectively receive the second signal at the second voltage level, and the bit line is connected to the voltage input terminal to selectively receive the first signal at the first voltage level. A sense amplifier is connected to the bit line and is configured to provide an output of the memory cell. The sense amplifier has a sense amplifier input connected to the output terminal of the level shifter to selectively receive the second signal at the second voltage level.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: February 16, 2021
    Inventors: Sanjeev Kumar Jain, Atul Katoch
  • Patent number: 10916277
    Abstract: A memory device includes a memory cell array including a plurality of memory blocks and a storage block storing a plurality of pieces of option parameter information; a parameter determining circuit outputting a parameter information signal by measuring a skew of the memory device; a peripheral circuit performing a read operation on the storage block; and a control logic controlling the peripheral circuit to perform the read operation on a selected piece of option parameter information, among the plurality of pieces of option parameter information, in response to the parameter information signal, and setting an option parameter according to the selected piece of option parameter information.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: February 9, 2021
    Assignee: SK hynix Inc.
    Inventor: Sang Oh Lim
  • Patent number: 10916292
    Abstract: A method for performing a refresh operation based on system characteristics is provided. The method includes determining that a current operating condition of a memory component is in a first state. The method also includes detecting a change in the operating condition from the first state to a second state. The method further includes setting a refresh period associated with the memory component based on the change of the operating condition. The refresh period corresponds to a period of time between a first time when a write operation is performed on a segment of the memory component and a second time when a refresh operation is to be performed on the segment. Moreover, the method includes performing the refresh operation according to the refresh period.
    Type: Grant
    Filed: August 28, 2019
    Date of Patent: February 9, 2021
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Zhenming Zhou, Tingjun Xie