Abstract: Disclosed are an X-ray computed tomographic imaging apparatus and a method for same. The X-ray computed tomographic imaging apparatus of the present invention comprises: a tomograph which radiates light onto an object being imaged by tomography, and detects the light passing through the object being imaged by tomography; a magnification rate determining unit which determines the magnification rate of an image of the object being imaged by tomography using the hardware property of the tomograph and/or the size of an input voxel; and a magnification rate controller which moves the tomography in accordance with the determined magnification rate, thereby obtaining images having a high resolution.

Abstract: The present disclosure relates to a charged particle beam system comprising a charged particle beam source, a charged particle column, a sample chamber, a plurality of electrically powered devices arranged within or at either one of the charged particle column, the charged particle beam source and the sample chamber, and at least one first converter to convert an electrical AC voltage power into an electrical DC voltage. The first converter is positioned at a distance from either of the charged particle beam source, the charged particle column and the charged particle chamber, and all elements of the plurality of electrically powered devices, when operated during operation of the charged particle beam source, are configured to be exclusively powered by the DC voltage provided by the converter.

Abstract: The present disclosure relates to a charged particle beam system, comprising a noble gas field ion beam source, a charged particle beam column, and a housing defining a first vacuum region and a second vacuum region. A noble gas field ion beam source is arranged within the first vacuum region. A first mechanical vacuum pump is functionally attached to the first vacuum region, an ion getter pump is attached to the charged particle beam column, and a gas supply is attached to the first vacuum region configured to supply a noble gas to the noble gas field ion beam source.

Abstract: An evaluation aid is used as a phantom (imitation lesion) when a digital X-ray dynamic image thereof is taken and evaluated for image qualities for X-ray absorption parts having different X-ray absorption ratios. The evaluation aid contains a fixed plate (plate-like body) including a plurality of regions having different X-ray absorption ratios; a rotating disk (movable body) having a plurality of wires (wire rods), the rotating disk capable of rotating (moving) with respect to the fixed plate so that the plurality of wires traverse X-ray with which the fixed plate is irradiated; and a driving motor (driving portion) which rotates (moves) the rotating disk with respect to the fixed plate. It is preferred that thicknesses and/or constituent materials of the plurality of regions of the fixed plate are different from each other, so that these regions have the different X-ray absorption ratios.

Abstract: A processing apparatus may include: an extraction plate disposed along a side of a plasma chamber, the extraction plate having a first and second aperture, and middle portion between the first and second aperture, the first and second aperture being configured to define a first and second ion beam when the plasma is present in the plasma chamber and an extraction voltage is applied between the extraction plate and a substrate; a hidden deflection electrode disposed adjacent the middle portion outside of the plasma chamber, and electrically isolated from the extraction plate; and a hidden deflection electrode power supply to apply a bias voltage to the hidden deflection electrode, wherein the bias voltage is configured to modify a mean angle of incidence of ions and/or a range of angles of incidence centered around the mean angle of incidence in the first and second ion beam.

Abstract: A specimen holder is used for an optical microscope, comprising: a specimen support that supports a specimen to enable the specimen to tilt relative to the optical axis of the optical microscope; an adjustment plate that has an observation surface for making observations using the optical microscope; and an adjustment plate support that supports the adjustment plate, so that the angle formed by the optical axis and the observation surface is larger than the angle formed by the optical axis and a specimen surface of the specimen.

Abstract: This invention describes a sample collection and desorption device and method that collects residues of explosives and other chemicals from a surface and then introduces them into a detector. The desorption method and device include introducing additional chemicals while heating up the sample collector, thus, the collected sample may be converted via a chemical reaction or a catalytic process. The detector can be an ion mobility spectrometer or mass spectrometer.

Abstract: Described herein are devices and methods for mounting a lamp, wherein the lamp may include a light and a mounting assembly that may be configured to enable a quick release installation of the light. The light may be a UV light, and the light may be mounted to an external or an internal surface of an HVAC unit via a mounting assembly which may include a bracket, a mounting base, and/or a socket. The base and socket may have complementary engagement structures that allow the base to engage the socket from either of a first axial direction and a second axial direction.

Abstract: In one aspect, an ion implantation system is disclosed, which comprises a deceleration system configured to receive an ion beam and decelerate the ion beam at a deceleration ratio of at least 2, and an electrostatic bend disposed downstream of the deceleration system for causing a deflection of the ion beam. The electrostatic bend includes three tandem electrode pairs for receiving the decelerated beam, where each electrode pair has an inner and an outer electrode spaced apart to allow passage of the ion beam therethrough. Each of the electrodes of the end electrode pair is held at an electric potential less than an electric potential at which any of the electrodes of the middle electrode pair is held and the electrodes of the first electrode pair are held at a lower electric potential relative to the electrodes of the middle electrode pair.

Abstract: An object of the present invention is to provide a method and an apparatus capable of measuring a potential of a sample surface by using a charged particle beam, or of detecting a compensation value of a variation in an apparatus condition which changes due to sample charging, by measuring a sample potential caused by irradiation with the charged particle beam. In order to achieve the object, a method and an apparatus are provided in which charged particle beams (2(a), 2(b)) emitted from a sample (23) are deflected by a charged particle deflector (33) in a state in which the sample (23) is irradiated with a charged particle beam (1), and information regarding a sample potential is detected by using a signal obtained at that time.

Abstract: An ultraviolet irradiation device that is used for a fluid to be irradiated having a low ultraviolet ray transmissivity, a spirally wound tube in which the fluid to be irradiated flows is supported and fixed, and an irradiation amount of ultraviolet rays with which the fluid is irradiated is increased. A tube 3 having ultraviolet ray transmitting property is spirally wound on an outer circumferential surface of a support pipe 5, a plurality of ultraviolet lamps 7 are disposed around an axis of the support pipe apart from the tube, an inner case 9 that supports the support pipe and that encloses the plurality of ultraviolet lamps is provided, and a fluid flows in the tube and is irradiated with ultraviolet rays. The tube which is a fluid channel is thereby fixed to the support pipe, so that breakage of the tube and the ultraviolet lamps 7 can be prevented.

Abstract: The invention refers to a nanodevice for generating electromagnetic radiation in the terahertz frequency range, the nanodevice comprising a substrate (3) made of a dielectric material, a first graphene layer (1) arranged on the substrate (3), having a first longitudinal end being electrically connected with a source contact (source 1) and having a second longitudinal end being connected with a drain contact (drain 1), an electrically conducting layer (2) having a periodic grating structure with grating stripes (6) extending substantially in transversal direction (y), and a dielectric layer (4) arranged between the first graphene layer (1) and the conducting layer (2).

Abstract: A plurality of gas jet nozzles having equal angular separation around a central axis eject gas flows towards the central axis. The gas flows collide and form a gas channel from the neutral gas, the gas channel having a gas density depression at the center of the intersecting gas flow, where the gas density depression is surrounded by a higher density gaseous wall along the central axis. Ionization of the gas in the center produces a plasma channel that can guide a laser pulse fired into the gas along the central axis. The geometric arrangement of the gas jets and/or the backing pressure of the gas flows are configured to produce a gas channel having a predetermined density profile such that the ionized gas forms a plasma channel laser guiding structure configured to guide a laser pulse having predetermined spatial parameters.

Abstract: There is provided a charged particle beam apparatus that includes a trajectory monitoring unit which is disposed above an objective lens (14) and which includes an optical element (12) having a lens action and a trajectory correcting deflector (10). An applied voltage and an excitation current of the optical element (12) are set to zero after a trajectory correction of a primary charged particle beam (30). Accordingly, the lens action and an aberration of the optical element (12) have no influence on resolution.

Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.

Abstract: A flow directing gasket for improving the flow of a gas or liquid across electron beam transparent membranes in environmental cells within a sample holder of an electron microscope, and uses of the sample holders comprising said flow directing gaskets.

Abstract: An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.

Abstract: The invention relates to a patient support (17) for an odontological x-ray apparatus, which can be arranged e.g. to a patient support station (18) of the x-ray apparatus (10). The patient support (17) includes a substantially uniform, substantially curved or bendable to be curved band structure (21) substantially extending at least from one patient's temple to the other. The material and layer thickness of the band structure (21) are chosen such that the band structure (21) is soft, elastic and/or flexible and its density with respect to attenuation of x-radiation is substantially lower than that of cranial soft tissues.

Abstract: The same sample S is analyzed using an ion-trap (IT) mass spectrometer section 11 in which ions are captured in an ion trap before mass spectrometry and a time-of-flight (TOF) mass spectrometer section 12 in which ions generated from the sample are directly subjected to mass spectrometry. A mass spectrum creator 21 creates an IT mass spectrum and a TOF mass spectrum from the measured results. A glycopeptide detector 23 detects fragment ion peaks related to neutral loss of sugars from the IT mass spectrum as well as peaks corresponding to intact molecular ions from the TOF mass spectrum, and furthermore, detects peaks common to the two spectra as glycopeptide ions. A quantitative analyzer 24 determines relative quantities of glycoforms of the glycopeptide based on the TOF mass spectrum. A structural analyzer 25 analyzes the structure of the glycopeptide using the result of an MSn analysis of the sample S.

Abstract: Systems and methods are used to analyze a sample using variable mass selection window widths. A tandem mass spectrometer is instructed to perform at least two fragmentation scans of a sample with different mass selection window widths using a processor. The tandem mass spectrometer includes a mass analyzer that allows variable mass selection window widths. The selection of the different mass selection window widths can be based on one or more properties of sample compounds. The properties may include a sample compound molecular weight distribution that is calculated from a molecular weight distribution of expected compounds or is determined from a list of molecular weights for one or more known compounds. The tandem mass spectrometer can also be instructed to perform an analysis of the sample before instructing the tandem mass spectrometer to perform the at least two fragmentation scans of the sample.