Abstract: A sensing circuit is provided which generates a sensing result according to a reading voltage of a non-volatile memory. The sensing circuit includes four transistors and a switch group. A first transistor is coupled between an operating voltage and a first node. A second transistor is coupled between the first node and a second node. A third transistor is coupled between the second node and a reference ground voltage. A control terminal of the first transistor, a control terminal of the second transistor, and a control terminal of the third transistor all receive the reading voltage. A fourth transistor is coupled between the operating voltage and the first node. The switch group forms or disconnects a conduction path between a control terminal of the fourth transistor and the second node according to a control signal, so that the first node obtains the sensing result.

Abstract: A dividing circuit system includes a first dividing circuit and a second dividing circuit. The first dividing circuit performs a reset operation based on a reset control signal and generates second and fourth divided clock signals. The second dividing circuit performs a reset operation based on the reset control signal and generates first and third divided clock signals.

Abstract: Systems and methods are provided for a computing-in memory circuit that includes a bit line and a plurality of computing cells connected to the bit line. Each of the plurality of computing cells includes a memory element, having a data output terminal; a logic element, having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is coupled to the data output terminal of the memory element, the second input terminal receives a select signal; and a capacitor, having a first terminal and a second terminal, where the first terminal is coupled to the output terminal of the logic element, the second terminal is coupled to the bit line. A voltage of the bit line is driven by the plurality of computing cells.

Abstract: A memory device includes at least one bit line, at least one source line, at least one program word line, at least one read word line, and at least one memory cell including a program transistor and a read transistor. The program transistor includes a gate terminal coupled to the at least one program word line, a first terminal coupled to the at least one source line, and a second terminal. The read transistor includes a gate terminal coupled to at least one read word line, a first terminal coupled to the at least one bit line, and a second terminal coupled to the second terminal of the program transistor.

Abstract: Embodiments are directed to providing a user interface (UI) that streamlines and simplifies the process of monitoring critical power-generation module (PGM) parameters after a PGM assembly is shutdown. The UI displays, in real-time, indicators corresponding to one or more post-shutdown PGM parameters. The UI provides indications of whether the post-shutdown PGM parameters meet post-shutdown criteria of the PGM assembly. When a post-shutdown PGM parameter does not meet the post-shutdown criteria, a user alert is provided to the user. A protocol may additionally be provided to the user. In some embodiments, the protocol may enable the user to return the PGM assembly to a condition that satisfies the post-shutdown criteria. The protocol may be a safety protocol and/or an asset protection protocol.

Abstract: A memory device includes a memory cell array and a data input and output circuit configured to output a data signal (DQ signal) including data read from the memory cell array and a data strobe signal (DQS signal) including a toggle pattern associated with an operating condition of the memory device based on n-level pulse amplitude modulation (PAMn), wherein n is an integer greater than or equal to 4.

Abstract: Methods, systems, and devices for phase clock correction are described. The clock correction may, in some examples, include two stages of duty cycle adjustment. In a first stage, the duty cycles of multiple clock signals may be adjusted. These clock signals may be based on an input clock signal and its complement. The duty cycle adjustment provided to a clock signal during this stage may be based on a difference between the duty cycle of the clock signal before adjustment and the duty cycle of another clock signal. In the second stage, the duty cycle of the input clock signal and its complement may be adjusted. The duty cycle adjustment provided to the input clock signal and/or its complement may be based on clock signals generated from the multiple clock signals after their duty cycles have been adjusted.

Abstract: A semiconductor device includes an internal power supply generation circuit that generates an internal power supply voltage from an external power supply voltage and a non-volatile memory circuit. The semiconductor device sets the internal power supply voltage generated by the internal power supply generation circuit based on data stored in the non-volatile memory circuit. A mode signal that switches the internal power supply voltage is set in the non-volatile memory circuit. The mode signal is set to a burn-in mode before a burn-in test and is set to a normal mode after the burn-in test. In the burn-in test, when a VCC burn-in voltage is applied to a VCC terminal to start the semiconductor device, the internal power supply generation circuit generates a VDD burn-in voltage upon receiving the mode signal set in the burn-in mode.

Abstract: A method for performing phase aware dynamic scheduling of a plurality of double data rate (DDR) commands includes determining a ratio of a frequency of DDR controller clock to a frequency of a DDR clock. The method includes determining a number of clock cycles of the DDR clock required for each DDR command of the plurality of DDR commands. The method includes, based on the ratio of the frequency of the DDR controller clock to the frequency of the DDR clock and the number of clock cycles of the DDR clock required for each DDR command, determining a sequence of the plurality of DDR commands according to a priority corresponding to the each DDR command, and transmitting the plurality of DDR commands to DDR devices over one or more clock cycles of the DDR controller clock according to the determined sequence of the plurality of DDR commands.

Abstract: A memory device and a method for input/output buffer control are provided. The memory device includes a pseudo static random access memory and a controller. The pseudo static random access memory includes an input/output circuit having a fast mode circuit and a slow mode circuit. The controller adjusts a power supply voltage and a clock frequency according to an operation mode of the memory device, and generates a register setting code based on an adjusted power supply voltage and an adjusted clock frequency. The pseudo static random access memory enables one of the fast mode circuit and the slow mode circuit according to the register setting code, and disables the other of the fast mode circuit and the slow mode circuit.

Abstract: The present disclosure includes apparatuses and methods to change data category values. An example is a memory device that includes an array having a plurality of sequences of memory cells, where each of the respective sequences of memory cells includes a plurality of designated subsets of memory cells, and the array includes a counter corresponding to one of the plurality of designated subsets of memory cells. The memory device is configured to receive input corresponding to a data batch, where the input includes a designation that corresponds to the one of the plurality of designated subsets of memory cells to be conditionally updated, and to change a numerical value stored by the counter corresponding to the one of the plurality of designated subsets of memory cells.

Abstract: The present disclosure relates to integrated circuits, and more particularly, to a method for identifying unprogrammed bits for one-time-programmable memory (OTPM) and a corresponding structure. In particular, the present disclosure relates to a structure including: a read circuit configured to perform at least one read operation at an address for a twin-cell one-time-programmable-memory (OTPM); and a comparison circuit configured to identify whether at least one bit of the address for the twin-cell OTPM has been programmed based on the at least one read operation.

Abstract: A quantizer generates a thermometer coded signal from an analog voltage signal. Data weighted averaging (DWA) of the thermometer coded signal is accomplished by controlling the operation of a crossbar switch controlled by a switch control signal to generate an output DWA signal. The output DWA signal is latched to generate a latched output DWA signal which is processed along with bits of the thermometer coded input signal in feedback loop to generate the switch control signal. The latching of the output DWA signal is performed in an input register of a digital-to-analog converter which operates to convert the latched output DWA signal to a feedback analog voltage from which the analog voltage signal is generated. The switch control signal specifies a bit location for a beginning logic transition of the output DWA signal cycle based on detection of an ending logic transition of the latched DWA signal.

Abstract: A storage device of an embodiment includes a first conductive layer; a second conductive layer; a fluid layer between the first conductive layer and the second conductive layer; particles in the fluid layer; a first control electrode between the first conductive layer and the second conductive layer; a first insulating layer between the first conductive layer and the first control electrode surrounding the fluid layer; and a second insulating layer between the first control electrode and the second conductive layer surrounding the fluid layer. In this storage device, a first cross-sectional area of the fluid layer in a first cross-section perpendicular to a first direction is smaller than a second cross-sectional area of the fluid layer in a second cross-section perpendicular to the first direction. The first cross-section includes the first control electrode, and the second cross-section includes the second insulating layer.

Abstract: An one-time programmable memory cell includes: an upper electrode; an insulating layer beneath the upper electrode; and a lower electrode with electrical field enhancement structure beneath the insulating layer, wherein the electrical field enhancement structure has a least one tip portion. The one-time programmable memory cell also includes a shallow trench isolation region, disposed adjacent to the insulating layer and the lower electrode, wherein the electrical field enhancement structure is surrounded by the shallow trench isolation region and the upper electrode partially covers the shallow trench isolation region.

Abstract: Various aspects relate to a memory cell arrangement including: a plurality of spontaneous-polarizable memory cells; and a control circuit configured to cause a writing of one or more first memory cells by a writing operation, wherein the writing operation includes: supplying a write signal set to the plurality of spontaneous-polarizable memory cells to provide a write voltage drop at each of the one or more first memory cells to switch a respective polarization state, the write signal set causing a disturb voltage drop at one or more second memory cells that are not intended to be written, wherein the disturb voltage drop causes a disturb of the one or more second memory cells and maintains a respective polarization state; and wherein the control circuit is further configured to supply a counter-disturb signal set to the plurality of spontaneous-polarizable memory cells, wherein the counter-disturb signal set provides a counter-disturb voltage drop at the one or more second memory cells to at least partially

Abstract: Devices, systems, and methods for timing elements of memory read and write operations are disclosed. A device may include a first DQ pin, a second DQ pin, and an output circuit. The output circuit may be configured to provide: a first signal at the first DQ pin and a second signal at the second DQ pin, based on the timing pattern. In some embodiments, based on the timing pattern, the output circuit may be configure to delay the first signal relative to the second signal such that rising and falling edges of the first signal do not coincide with rising and falling edges of the second signal. In these or other embodiments, the device may further include a mode register, wherein a slew rate of the first signal is based at least in part on a value of the mode register. Associated systems and methods are also disclosed.

Abstract: An example method of encoding data attributes by data stream identifiers may include: receiving a plurality of data items to be written to a storage device; identifying, among the plurality of data items, a first data item and a second data item sharing a data attribute; generate a data stream identifier comprising an encoded form of the data attribute; and transmitting, to a controller of the storage device, one or more write commands comprising the first data item and the second data item, wherein each write command further specifies the data stream identifier.

Abstract: A memory device includes: memory cells; an operation mode determiner for determining any one of a normal operation mode and a memory communication operation mode of communicating data with another memory device; a pad control signal generator for generating a pad control signal for determining a pad to receive a signal corresponding to a data movement command of the memory controller according to the determined operation mode; a pad controller for receiving the signal through the determined pad according to the pad control signal; an internal command generator for generating an internal operation command corresponding to the data movement command according to the determined operation mode; and an operation controller for performing one of a read operation of reading first target data from the memory cells and a program operation of storing second target data in the memory cells, based on the internal operation command.

Abstract: An optical mechanism and an optical system for optical-medium storage. The mechanism includes an optical-medium storage device, and an optical-medium transmission device. The optical-medium storage device is provided with an optical-medium storage module, configured to store an optical medium, and an optical-medium input-output end, configured to receive and transmit the optical medium to the optical-medium storage module and read data from the optical-medium storage module. The optical-medium receiving module is configured to receive the optical medium transmitted from outside and transmit the optical medium to the optical-medium storage module via the optical-medium input-output end, according to a receiving instruction. The optical-medium storing module is configured to form a storage path for the optical medium with the optical-medium storage module.