Abstract: To compensate switching of a dielectric component of a non-linear polar material based capacitor, an explicit dielectric capacitor is added to a memory bit-cell and controlled by a signal opposite to the signal driven on a plate-line.

Abstract: To compensate switching of a dielectric component of a non-linear polar material based capacitor, an explicit dielectric capacitor is added to a memory bit-cell and controlled by a signal opposite to the signal driven on a plate-line.

Abstract: Control logic in a memory device initiates a program operation on the memory device, the program operation comprising a program phase, a program recovery phase, a program verify phase, and a program verify recovery phase. The control logic further causes a negative voltage signal to be applied to a first plurality of word lines of a data bock of the memory device during the program verify recovery phase of the program operation, wherein each of the first plurality of word lines is coupled to a corresponding memory cell of a first plurality of memory cells in a string of memory cells in the data block, the first plurality of word lines comprising a selected word line associated with the program operation and one or more data word lines adjacent to the selected word line.

Abstract: Methods, systems, and devices for spare substitution in a memory system are described. Aspects include a memory device identifying a rotation index that indicates a first assignment of logical channel to physical channels for code words stored in a memory medium. The memory device may use a pointer to indicate one or more code word addresses that are to be rotated and update a value of the pointer associated with a range for the rotation index based on a condition being satisfied. The memory device may rotate a first code word according to a first assignment of the rotation index, where the rotating may occur at an address of the memory medium corresponding to the updated value of the pointer. Additionally, the memory device may execute access operations on the memory medium that include multiplexing multiple logical channels to multiple physical channels based on the rotation index and the pointer.

Abstract: A first circuit formed on a first semiconductor substrate is wafer-bonded to a second circuit formed on a second memory circuit, wherein the first circuit includes quasi-volatile or non-volatile memory circuits and wherein the second memory circuit includes fast memory circuits that have lower read latencies than the quasi-volatile or non-volatile memory circuits, as well as logic circuits. The volatile and non-volatile memory circuits may include static random-access memory (SRAM) circuits, dynamic random-access memory (DRAM) circuits, embedded DRAM (eDRAM) circuits, magnetic random-access memory (MRAM) circuits, embedded MRAM (eMRAM), or any suitable combination of these circuits.

Abstract: Control logic in a memory device initiates, subsequent to a program verify phase of a program operation, a new program operation on the memory array, the new program operation comprising a pre-boosting phase occurring prior to a program phase. The control logic causing one or more positive pre-boosting voltages to be applied to corresponding subsets of a plurality of word lines of a block of the memory array during the pre-boosting phase and causes the one or more positive pre-boosting voltages to be ramped down to a ground voltage during the pre-boosting phase in a designated order based on a location of the corresponding subsets of the plurality of word lines to which the one or more positive pre-boosting voltages were applied.

Abstract: A method for reading memory cells is described. The method may include applying a first read voltage to a plurality of memory cells, detecting first threshold voltages exhibited by the plurality of memory cells in response to application of the first read voltage, associating a first logic state to one or more cells of the plurality of memory cells, applying a second read voltage to the plurality of memory cells, where the second read voltage has the same polarity of the first read voltage and a higher magnitude than an expected highest threshold voltage of memory cells in the first logic state, and detecting second threshold voltages exhibited by the plurality of memory cells in response to application of the second read voltage, among other aspects. A related circuit, a related memory device and a related system are also disclosed.

Abstract: The semiconductor memory device includes a memory block including a plurality of memory strings, a pass circuit connected between local word lines of the memory block and global word lines and configured to connect the local word lines to the global word lines in response to a block selection signal, and a voltage providing circuit configured to generate an operation voltage during a program or read operation, apply the operation voltage to the global word lines, and discharge the global word lines when the program operation or the read operation is completed, and the pass circuit is configured to control the local word lines to be in a floating state after the program operation or the read operation is completed and before discharging the global word lines.

Abstract: A memory system may include a magnetic tunnel junction stack, a first high resistance tunnel barrier, and a first voltage controlled magnetic anisotropy write layer. The first voltage controlled magnetic anisotropy write layer may be adjacent the high resistance tunnel barrier, and the voltage controlled magnetic anisotropy write line may include a magnetic material in direct contact with a high resistance tunnel barrier.

Abstract: Systems, methods and apparatus to program memory cells to an intermediate state. A first voltage pulse is applied in a first polarity across each respective memory cell among the memory cells to move its threshold voltage in the first polarity to a first voltage region representative of a first value. A second voltage pulse is then applied in a second polarity to further move its threshold voltage in the first polarity to a second voltage region representative of a second value and the intermediate state. A magnitude of the second voltage pulse applied for the memory cells is controlled by increasing the magnitude in increments until the memory cells are sensed to be conductive. Optionally, prior to the first voltage pulse, a third voltage pulse is applied in the second polarity to cancel or reduce a drift in threshold voltages of the respective memory cell.

Abstract: A memory cell includes a write port and a read port. The write port includes two cross-coupled inverters that form a storage unit. The cross-coupled inverters are connected between a first power source signal line and a second power source signal line. The write port also includes a first local interconnect line in an interconnect layer that is connected to the second power source signal line. The read port includes a transistor that is connected to the storage unit in the write port and to the second power source signal line, and a second local interconnect line in the interconnect layer that is connected to the second power source signal line. The second local interconnect line in the read port is separate from the first local interconnect line in the write port.

Abstract: An integrated circuit may include circuitry for accessing an associated die stack. The circuitry may receive temperature information as well as a plurality of operating parameters that help determine whether it may be desirable to reroute access commands or requests to one or more die in the stack. The circuitry may include a smart crossbar switch that implements an address translation or hashing function to help map the logical user address to a physical address space. Performing thermally aware traffic management in this way can ensure that acceptable timing margins are maintained in the system to minimize the probability of errors.

Abstract: In a method of operating a nonvolatile memory device, the nonvolatile memory device includes a memory block that includes a plurality of memory cells and is connected to a plurality of wordlines. A data write command is received. Based on the data write command, a first program operation is performed on some wordlines among the plurality of wordlines connected to the memory block. At least one of the some wordlines on which the first program operation is performed is detected as a no-coupled wordline. Without the data write command, a second program operation is performed on an open wordline on which the first program operation is not performed and adjacent to the no-coupled wordline.

Abstract: A method for error correction comprises receiving data at a first device, and decoding, by decoder circuitry of the first device, the data. Decoding the data comprises determining a first error location within the data, and determining a first error magnitude within the data in parallel with determining the first error location. Decoding the data further comprises performing error correction to generate the decoded data based on the first error location and the first error magnitude. The method further comprises transmitting the decoded data to a second device.

Abstract: A system for DNA gene assembly that utilizes a DNA symbol library and a DNA linker library. The symbol library has a number of DNA symbols each having a first overhanging end and a second overhanging end different than and non-complimentary to the first end, the first and second ends being the same nucleotides for each DNA symbol. The linker library has pairs of DNA linkers, a first linker of a pair having a first end and a second end and a second linker of the pair having a first end and a second end, the first end of the first linker being the same nucleotides for each first linker and the second end of the second linker being the same nucleotides for each second linker, wherein the second end of the first linker and the first end of the second linker have complementary nucleotides. The first linker joins to the first end of a DNA symbol and the second linker joins to the second end of another DNA symbol.

Abstract: A method of programming a resistive memory device, and a corresponding resistive memory device, which includes the resistive memory device, in response to a write command, applying a write pulse to a selected memory cell arranged in a region where a selected word line intersects with a selected bit line; and after the applying the write pulse, applying a dummy pulse to at least one unselected memory cell. The at least one unselected memory cell is connected to at least one of the selected word line, the selected bit line, a first word line adjacent to the selected word line, and a first bit line adjacent to the selected bit line.

Abstract: A semiconductor memory device includes a memory block, and control logic. The memory block includes a plurality of memory cells. The control logic controls a peripheral circuit to perform a read operation on selected memory cells among the plurality of memory cells. The read operation includes a bit line precharge operation, an evaluation operation, and a sensing operation. The control logic is configured to control the peripheral circuit to float a common source line coupled to the memory block during at least a partial period of a period of the bit line precharge operation, in which a voltage of a plurality of bit lines coupled to the memory block increases.

Abstract: A memory device includes a cross-point array of spin-torque transfer MRAM cells. First rail structures laterally extend along a first horizontal direction. Each of the first rail structures includes a vertical stack including, from bottom to top, a first electrically conductive line, a reference layer having a fixed magnetization direction, and a tunnel barrier layer. Second rail structures laterally extend along a second horizontal direction. Each of the second rail structures includes a second electrically conductive line that overlies the first rail structures. A two-dimensional array of pillar structures is located between a respective one of the first rail structures and a respective one of the second rail structures. Each of the pillar structures includes a free layer having energetically stable magnetization orientations that are parallel or antiparallel to the fixed magnetization direction.

Abstract: A method and system for improved foggy-fine programming includes data that can be written to SLC memory. Then, the data can be decoded and then both foggy and finely written to MLC. After the decoding, the data can be stored in DRAM located in a front end or in a SRAM located in a flash manager prior to being written to MLC. After storing in either the DRAM or SRAM, the data is then decoded and written to MLC.

Abstract: Systems and methods are provided for controlling a wake-up operation of a memory circuit. The memory circuit is configured to precharge the bit lines of a memory array sequentially during wakeup. A sleep signal is received by the first bit line of a memory cell and then a designed delay occurs prior to the precharge of a second complementary bit line. The sleep signal may then precharge the bit lines of a second memory cell with further delay between the precharge of each bit line. The memory circuit is configured to precharge both bit lines of a memory cell at the same time when an operation associated with that cell is designated.