Patents Examined by T. R. Sundaram
  • Patent number: 6362638
    Abstract: A method and apparatus for measuring Kelvin contact resistance within an integrated circuit interconnect is provided, having upper and lower Kelvin contact resistance contacts covering a via and interconnect being measured, along with a third conductor placed substantially between the upper and lower Kelvin contacts, and in contact with the via.
    Type: Grant
    Filed: September 1, 1999
    Date of Patent: March 26, 2002
    Assignee: Agere Systems Guardian Corp.
    Inventors: Robert Alan Ashton, Steven Alan Lytle, Mary Drummond Roby, Daniel Joseph Vitkavage
  • Patent number: 6359457
    Abstract: A wafer with integrated circuits is held with a holding device having a support surface for the wafer. The support surface is subdivided into at least two segments, each with a temperature influencing device. The temperature of each segment can be set independently to different temperatures. The integrated circuits are tested while thermal contact is made between the wafer and the support surface. Those integrated circuits which are in thermal contact with the first segment are tested while the segment is kept at an essentially constant temperature. The temperature of the second segment is at the same time varied. The second segment is then tested at the changed temperature.
    Type: Grant
    Filed: May 17, 1999
    Date of Patent: March 19, 2002
    Assignee: Siemens Aktiengesellschaft
    Inventor: Michael Kund
  • Patent number: 6359446
    Abstract: An apparatus and method for the nondestructive inspection of dielectric materials are disclosed. Monochromatic, phase coherent electromagnetic radiation, preferably in the 5-50 gigahertz frequency range (i.e., microwaves) impinges on the sample. In accordance with Snell's law, the microwaves are partly transmitted and partly reflected at each interface where the dielectric constant changes (e.g., where there are delaminations, cracks, holes, impurities, or other defects.) A portion of the reflected beam is combined with the signal reflected by the specimen being inspected. These two signals have the same frequency, but may differ in amplitude and phase. The signals combine to produce an interference pattern, a pattern that changes as the specimen changes, or as the position of the specimen changes relative to that of the detector. Appropriate processing of the interference signal can greatly improve the signal-to-noise ratio.
    Type: Grant
    Filed: September 22, 1998
    Date of Patent: March 19, 2002
    Inventor: Jack R. Little, Jr.
  • Patent number: 6356068
    Abstract: A fully packaged current monitor system for galvanically isolated current measurement is manufactured in line with commercial IC fabrication and LOC packaging technology. A current path is part of the lead frame on which a die with sensor means is mounted with the aid of an electrically insulating correspondingly pre-patterned glue tape, the structured surface of the die facing the lead frame. The system manufactured in this way achieves for currents up to +/−10 A, a system accuracy of better than 50 mA and is applicable for currents up to the order of 50 A. The system performance can be further improved by ferromagnetic field concentrators and on-chip compensation techniques.
    Type: Grant
    Filed: May 12, 1999
    Date of Patent: March 12, 2002
    Assignee: AMS International AG
    Inventors: Ralph Steiner, Michael Schneider, Felix Mayer
  • Patent number: 6356094
    Abstract: An automated method of handling multi-chip modules (MCMs) in conjunction with automated module testing. The method includes providing a plurality of MCMs in a magazine at an input location and positively displacing the magazine through an indexing device. At the indexing device, the MCMs are each positively retreived and guided to a test site, tested, and positively ejected for sorting according to the results of the testing. Depending on the testing results, the MCMs may be placed in a shipping tray or in a discard bin. The emptied magazine is further displaced to an output location where it may be stacked with similar emptied magazines.
    Type: Grant
    Filed: November 29, 2000
    Date of Patent: March 12, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Mark A. Tverdy, William C. Layer, Lothar R. Kress, Eric M. Matthews
  • Patent number: 6353323
    Abstract: Apparatus for, and a method of, simultaneously measuring the concentration of a selected ion species in a solution and the pH of the solution, uses an ion selective electrode, a reference electrode and an ISFET immersed in the solution. The ion concentration is determined in a first circuit from the potential difference between the ion selective electrode and the reference electrode, and the pH is determined in a second circuit from the current flowing between the ISFET and the reference electrode. The reference electrode is connected into the second circuit via a high resistance so as to isolate the two circuits from each other. The earth potential of the solution is connected to provide the earth potential of the first circuit, and is connected to the second circuit via a high capacitance so as to provide a virtual earth thereforee. Each circuit is supplied from a separate power source, and the circuit outputs are supplied via respective isolation amplifiers to a multi-channel meter.
    Type: Grant
    Filed: August 4, 1998
    Date of Patent: March 5, 2002
    Assignee: Eastman Kodak Company
    Inventor: Graham Anthony Fuggle
  • Patent number: 6353311
    Abstract: The design of Shaded Rotor devices to demonstrate the existence of a hypothetical Universal Particle Flux Field is presented. These devices should extract a measurable amount of energy from this Field. We believe the Universal Particle Flux Field can explain all invisible forces at a distance phenomena between masses, charged bodies, and magnetic materials. We propose that the Universal Particle Flux Field is a simultaneously convergent/divergent field, where the particle streams traverse to any point in the Universe from every other point in the Universe. The order of this Flux Field is a nearly perfect disorder, which is an order in itself. The strength of the gravitational component of this Field is conventionally denoted by “G”. Two neutral masses immersed in such Flux Field will develop forces between them, which are consistent with Newton's Equation of Gravitation. This Field is also consistent with Electrostatic, and Magnetic Force Equations.
    Type: Grant
    Filed: July 2, 1998
    Date of Patent: March 5, 2002
    Inventors: John P. Brainard, Robert D. Ney, Robert J. Ney
  • Patent number: 6351132
    Abstract: A capacitive sensor is employed to measure the dielectric constant of miscible liquids, and thereby determine the relative concentration of the two liquids. Further, a feedback circuit may be provided to change the operation of the system in accordance with the relative concentration of the liquids. Further, circuit arrangements may be provided to adjust the sensitivity and offset of the electrical circuit included in the system to match the output of the sensor with the dielectric constants being measured.
    Type: Grant
    Filed: September 3, 1999
    Date of Patent: February 26, 2002
    Assignee: Kavlico Corporation
    Inventor: Kyong M. Park
  • Patent number: 6348800
    Abstract: A system and method for detecting ground fault currents in multi-phase power systems. The system and method utilize a gapped core having a central opening. The central opening allows the multiple conductors, e.g. three conductors, to pass therethrough as a group. A sensor, such as a Hall generator, is disposed in the gap of the core and provides an output signal when the current flowing through the multi-phase conductor is unbalanced. The signal output is designed to be proportional to the detected ground fault current.
    Type: Grant
    Filed: September 28, 1999
    Date of Patent: February 19, 2002
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Steven T. Haensgen, Jeffrey R. Annis
  • Patent number: 6346818
    Abstract: A non-contacting capacitive position transducer comprises a stator substrate carrying two electrically conducting inverted wedge regions 14,16 whose width varies inversely in a sensing direction. A moveable pick-off 20 is capacitively coupled to both wedges. The wedges 14,16 are driven with respective distinguishable time varying periodic waveforms, e.g. a sine wave and a cosine wave, and the pick-off voltage at 20 processed to determine the position of the pick-off in the sensing direction. Various configurations of transducer are described, including those of linear, cylindrical and disc form. The pick-off voltage is preferably transferred from the pick-off 20 back to the stator by capacitively coupling the pick-off to a suitably screened pick-off track 36 on the stator.
    Type: Grant
    Filed: December 9, 1999
    Date of Patent: February 12, 2002
    Assignee: British Aerospace Plc
    Inventors: Edward Wilson, Colin Moore
  • Patent number: 6344747
    Abstract: A device and method for monitoring the condition of a thermocouple. In a preferred embodiment the device comprises a pair of thermocouples, each thermocouple comprising first and second thermoelement wires, and a diagnostic element selectively electrically coupled at a junction with one of the thermoelements. In a preferred embodiment, the diagnostic element is selected such that it is more stable at the expected operating temperature range of the thermocouple than the thermoelement wires themselves are. The diagnostic element can be switched into electrical connection with any of the thermoelements forming the thermocouples to thereby define one or more loops. An initial loop resistance is measured and recorded around each of the thermoelement/diagnostic element loops. This initial resistance is stored in a calibration matrix as a reference value. The initial loop resistance may be taken as part of a calibration process or during initial operation of the thermocouple.
    Type: Grant
    Filed: September 13, 1999
    Date of Patent: February 5, 2002
    Assignee: Accutru International
    Inventors: James G. Lunghofer, Collins P. Cannon, Trevor Pugh, Randy Riggs, M. David Landrum
  • Patent number: 6340896
    Abstract: A test socket for testing a packaged semiconductor device. The test socket includes a test substrate, at least one support member, and at least one securing member. Terminals of the test substrate are electrically connectable to a testing device. The terminals may by located within recesses that are configured to receive leads. The shapes of each support member and securing member may be complementary to the respective shapes of the bottom and top surfaces of leads extending from the packaged semiconductor device. Upon placement of a packaged semiconductor device on the test substrate, the leads are aligned with and positioned against their corresponding terminals and the support member. The securing elements are then placed against the leads to bias each lead against its corresponding terminal.
    Type: Grant
    Filed: June 22, 2001
    Date of Patent: January 22, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Chris G. Martin, Manny Kin F. Ma
  • Patent number: 6340886
    Abstract: A magnetic field sensing structure for sensing magnetic field changes provided therein having a pair of pole structures with a gap space between them that each include permeable material and end in substantially a common surface. A plurality of field sensing structures is positioned successively in the gap space to be supported between the pole structures with each having an end thereof substantially the common surface. These sensing structures are formed of a plurality of magnetoresistive, anisotropic, ferromagnetic thin-film layers at least two of which are separated from one another by a nonmagnetic, electrically conductive layer positioned between them. They are electrically connected to one another adjacent the common surface, and may be electrically connected to one of the pole structures.
    Type: Grant
    Filed: August 8, 1997
    Date of Patent: January 22, 2002
    Assignee: Nonvolatile Electronics, Incorporated
    Inventors: James M. Daughton, Arthur V. Pohm
  • Patent number: 6339321
    Abstract: An electronic device tray 110 having a plurality of IC holders 14 in which IC chips are held and having a shutter 15 for opening and closing openings of the IC holders 14, the shutter 15 being opened and closed by fluid pressure cylinders etc. provided at an IC tester.
    Type: Grant
    Filed: May 27, 1999
    Date of Patent: January 15, 2002
    Assignee: Advantest Corporation
    Inventors: Kazuyuki Yamashita, Hiroto Nakamura, Shin Nemoto
  • Patent number: 6333632
    Abstract: A discharge ionization detector (DID) includes a sensor that uses an alternating current (AC) discharge through a working gas as an ionization source. The sensor includes a discharge chamber, into which the working gas is introduced, and an ionization chamber, into which a sample gas is introduced. UV photons from the discharge chamber and metastable particles that enter the ionization chamber from the discharge chamber ionize molecules in the sample gas. The ions generated from the ionized sample gas are measured as a current indicating the quantity of ionizable molecules in the sample gas. For selective identification of molecules in the sample gas, one or more chemical filters can filter the sample gas to separate target gases from gases that interfere with detection of the target gases. Additionally, a supply for the working gas can change the working gas to change the maximum energy available for ionization of the sample gas.
    Type: Grant
    Filed: September 16, 1999
    Date of Patent: December 25, 2001
    Assignee: RAE Systems, Inc.
    Inventors: Wenjun Yang, Peter C. Hsi
  • Patent number: 6326796
    Abstract: A harmonic injection point a is set on a power line extending downstream from a harmonic measuring point b in an electric power system. The currents of interharmonics are injected to the harmonic injection point a by a current injection device. The frequencies of the interharmonics are located on both sides of the frequency of an n-th targeted harmonic in frequency spectrum and each of the frequencies is a nonintegral multiple of the frequency of a fundamental wave of an electric power transmitted by the electric power system. The current values and voltage values of the interharmonics at the harmonic measuring point are detected to thereby obtain admittance values of an equivalent circuit of a power line extending upstream from the harmonic measuring point b when the interharmonics flow therethrough. An admittance value of the equivalent circuit of the power line when the targeted harmonic flows therethrough is determined by interpolating the admittance values for the interharmonics.
    Type: Grant
    Filed: July 6, 1998
    Date of Patent: December 4, 2001
    Assignees: Nissin Electric Co., Ltd., Chubu Electric Power Co., Inc.
    Inventors: Isao Koda, Masakazu Tsukamoto, Shoji Nishimura, Katsuhiko Uno, Yasuyuki Natsuda, Yoshifumi Minowa
  • Patent number: 6320398
    Abstract: A semiconductor device testing apparatus is provided which allows for eliminating the need to replace IC sockets even if the type of IC package is changed. A device receiving carrier 100 accommodating the IC to be tested has its bottom open. A fine conductive wire-embedded member 110 is mounted to the open bottom of the device receiving carrier. The wire-embedded member comprises a resilient rubber plate 111 and a number of fine conductive wires 112 embedded in the rubber plate, the fine conductive wires being electrically insulated from each other and extending through the thickness of the rubber plate with the opposite ends exposed at the opposed surfaces of the rubber plate. The IC to be tested is rested on the wire-embedded member. A board 70 is mounted to the test head, the board having gold pads 72 formed in a manner electrically insulated from each other in the surface thereof at at least the positions opposing the terminals of the IC to be tested placed on the top surface of the wire-embedded member.
    Type: Grant
    Filed: April 6, 1998
    Date of Patent: November 20, 2001
    Assignee: Advantest Corporation
    Inventors: Akihiko Ito, Yoshihito Kobayashi
  • Patent number: 6320389
    Abstract: An electric leak detecting apparatus used for an electric motorcar includes a source for generating an AC signal, which supplies a sine wave detecting signal S1 of a single frequency fl Hz to between a vehicle body and a low potential side or a high potential side of a battery pack, a condenser having capacitance Cd for insulating the AC source from the low potential side or high potential side of the battery pack with respect to direct currents and for connecting the AC source to the low or high potential side of the battery pack with respect to alternating currents.
    Type: Grant
    Filed: October 30, 1998
    Date of Patent: November 20, 2001
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Kazuhiko Tamesue, Masahiro Takada, Kunio Kanamaru
  • Patent number: 6316952
    Abstract: An integrated circuit die test apparatus adapted to minimize damage to solder balls in a ball grid array. The apparatus includes a plurality of flexible pillars or other flexible support structures. The pillars may be formed of an electrically conductive polymer or other material, or formed of polymer and coated with a metallic substance. One or more pillars may be used to contact each solder ball during burn-in. The pillars flex under contact with the solder balls, and spring back upon disengagement. The support structures may be rectangular or wedge-shaped.
    Type: Grant
    Filed: May 12, 1999
    Date of Patent: November 13, 2001
    Assignee: Micron Technology, Inc.
    Inventors: Syed Sajid Ahmad, Salman Akram
  • Patent number: 6316930
    Abstract: There is described a direct current meter with passive input and galvanic insulation, particularly for high voltage. The direct current meter is made up of a passive input part and of an active output part that is optically coupled to the passive part and electrically insulated from it. In this way the high voltage present at the input only affects the passive part of the meter, whereas the active part can be supplied with a low voltage and can be made capable to provide an output signal proportional to the current to be measured and substantially independent from the working temperature.
    Type: Grant
    Filed: December 21, 1999
    Date of Patent: November 13, 2001
    Assignee: Istito Nazionale di Fisica Nucleare
    Inventor: Daniel V. Camin