Patents Examined by Vinh P. Nguyen
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Patent number: 11506546Abstract: A system may include a transformer that may convert a first voltage to a second voltage, such that the second voltage is output via a conductor. The system may also include a wireless current sensor that may detect current data associated with current conducting via the conductor and a processor. The processor may receive the current data, determine one or more temperature measurements associated with the transformer based on the current data, and send a signal to a component in response to the one or more temperature measurements exceeding one or more respective threshold values.Type: GrantFiled: January 7, 2020Date of Patent: November 22, 2022Assignee: Schweitzer Engineering Laboratories, Inc.Inventor: Jeremy William Blair
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Patent number: 11499993Abstract: A stage on which an inspection object having an electronic device against which a contact terminal of a probe card of an inspection apparatus is pressed by a load applied thereto is placed, includes a first cooling plate including a first coolant flow path formed therein, a heating source mounted on the first cooling plate and including a plurality of light emitting elements so as to heat the inspection object, a transparent member provided on the heating source and transmitting light output from the heating source, a second cooling plate provided on the transparent member so as to hold the inspection object and including a second coolant flow path formed therein, and a transparent resin layer filled between the first cooling plate and the transparent member so as to cover the heating source.Type: GrantFiled: November 23, 2020Date of Patent: November 15, 2022Assignee: TOKYO ELECTRON LIMITEDInventors: Dai Kobayashi, Hiroyuki Nakayama, Naoki Akiyama
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Patent number: 11499994Abstract: A power distribution network monitoring system includes a plurality of measuring instruments that are installed at predetermined positions on power lines constituting a power distribution network and configured to perform electrical measurement of the power lines; a data collection relay configured to receive data related to measurement results from the plurality of measuring instruments; an imaging unit that is disposed near the data collection relay and configured to capture an image including the data collection relay; an abnormality detector configured to use the image captured by the imaging unit to detect an abnormality in the data collection relay; and a storage unit configured to store image data taken by the imaging unit. The image data consists of a single image previously captured by the imaging unit.Type: GrantFiled: November 17, 2017Date of Patent: November 15, 2022Assignee: Omron CorporationInventors: Tatsuya Adachi, Hiroaki Takeya, Mitsunori Sugiura, Yuji Funasaka
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Patent number: 11493377Abstract: A system for estimating a flowable substrate level in a storage unit is disclosed. In one embodiment, the system includes a transmitter and a conductor that extend downwardly into a grain storage bin, which cycles through a range of frequencies in order to determine the resonant frequency of the conductor which changes depending on the amount of grain in the bin.Type: GrantFiled: August 24, 2020Date of Patent: November 8, 2022Assignee: Extron CompanyInventor: Randall G. Honeck
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Patent number: 11493551Abstract: A testing apparatus comprises a test interface board comprising a plurality of socket interface boards, wherein each socket interface board comprises: a) an open socket to hold a DUT; b) a discrete active thermal interposer comprising thermal properties and operable to make thermal contact with the DUT; c) a superstructure operable to contain the discrete active thermal interposer; and d) an actuation mechanism operable to provide a contact force to bring the discrete active thermal interposer in contact with the DUT.Type: GrantFiled: August 5, 2020Date of Patent: November 8, 2022Assignee: ADVANTEST TEST SOLUTIONS, INC.Inventors: Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Rohan Gupte, Homayoun Rezai, Kenneth Santiago, Marc Ghazvini
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Patent number: 11486908Abstract: An electronic integrated multi-electrode detection system of a potential determination includes a multi-electrode array, a circuit unit and a total signal output and acquisition unit. The circuit unit includes a multi-electrode array signal input end, a high input impedance voltage follower, a phase shifting filter circuit, an extension module input end, a summing circuit and a total output signal end. The detection system promotes the detection sensitivity and increase the accuracy and precision of detection results. The detection system can be used for monitoring the change in trace ion concentration in a sample, analyzing a constant conventional sample and analyzing a sample with higher error requirement. The detection system can be widely applied to various analysis detection fields, including life sciences, environmental sciences, medicine clinics, and the like.Type: GrantFiled: February 11, 2018Date of Patent: November 1, 2022Assignee: SICHUAN UNIVERSITYInventors: Dan Xiao, Chunling Wang, Hongyan Yuan, Zhijuan Duan
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Patent number: 11486906Abstract: The voltage measuring device includes: a light source; a polarizer polarizing light emitted from the light source; a grounded conductor provided apart from a high-voltage conductor; a crystal end face electrode being out of contact with the grounded conductor and the high-voltage conductor; a Pockels cell transmitting light from the polarizer; an analyzer transmitting light reflected by the Pockels cell; a photodetector detecting light emitted from the analyzer; an intra-crystal electric field measurement unit converting voltage output by the photodetector into intra-crystal electric field; a bias electrode being out of contact with the crystal end face electrode; a bias supply; a bias supply control unit controlling the bias supply to keep internal electric field of the Pockels cell at zero; and a measurement voltage calculation unit obtaining voltage of the high-voltage conductor based on results output by the intra-crystal electric field measurement unit and the bias supply control unit.Type: GrantFiled: January 24, 2019Date of Patent: November 1, 2022Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Yasutomo Otake, Takahiro Umemoto, Yasuhito Hashiba, Hiroyuki Kawano, Daigo Matsumoto
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Patent number: 11480607Abstract: A method for determining the remaining usability of a semiconductor module in normal use. The semiconductor module is thermally coupled to a cooling device. A predefined electrical load is applied to the semiconductor module while predefined cooling is effected by the cooling device. A temperature of a semiconductor element of the semiconductor module is sensed at least for the predefined electrical load on the semiconductor module. The sensed temperature is compared with a comparison temperature in a first comparison. The comparison temperature is assigned to the predefined electrical load with the predefined cooling, and prediction data for the remaining usability of the semiconductor module in normal use up to a usability end are determined at least in accordance with the first comparison.Type: GrantFiled: December 17, 2019Date of Patent: October 25, 2022Assignee: Siemens AktiengesellschaftInventors: Gunnar Dietz, Markus Mauersberger
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Patent number: 11480604Abstract: A high-frequency 5 measurement method includes generating a test signal (TS), which is a sine-wave signal having a predetermined frequency, in which a period (?) during which the power level is at a first power level and a period (T-?) during which the power level is at a second power level lower than the first power level 10 are periodically repeated, inputting the test signal (TS) to a device under test (10) as an input signal, and measuring the difference between an output signal (OUT) of the device under test (10) and an ideal value of the output signal (OUT).Type: GrantFiled: November 20, 2017Date of Patent: October 25, 2022Assignee: NEC CORPORATIONInventor: Yoji Murao
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Patent number: 11474147Abstract: The present disclosure provides for a kit-less pick and place handler which conducts thermal testing of at least one device. An exemplary handler includes a thermal soak plate, a first prime mover, a second prime mover, a test site actuator, and a test contactor. The thermal soak plate can receive devices and maintain an accurate position of the devices using a friction between the thermal soak plate and the device. The test contactor can electrically contact the device. The first prime mover can place the device on the thermal soak plate. The second prime mover can carry the device to the test contactor, hold the device during thermal testing, and move the device from the test contactor. The test site actuator can exert force on the second prime mover during thermal testing.Type: GrantFiled: December 19, 2018Date of Patent: October 18, 2022Assignee: Boston Semi Equipment LLCInventors: Larry Stuckey, Igor Shekhtman, John Lewis, Kent Blumenshine, Colin Scholefield
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Patent number: 11476705Abstract: A power harvesting device is provided that may supply low voltage power to operate devices in remote locations. The power harvesting device may be connected to a medium to high voltage power line. First and second capacitors divide the voltage to a lower voltage sufficient to power a device, such as a monitoring device. The power harvesting device and monitoring device may be connected to an electric tower with the power harvesting device being connected to a power line supported by the tower.Type: GrantFiled: December 13, 2019Date of Patent: October 18, 2022Assignee: ABB SCHWEIZ AGInventors: Nirmal Paudel, Vivek Siddharth, David Raschka, Ronald D. Pate
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Patent number: 11474146Abstract: A method for estimating degradation of a wire-bonded power semi-conductor module is provided. The method includes obtaining an indicator of degradation (Degrest_t-1); estimating an estimated indicator of degradation (Degrest_t) by a temporal degradation model; obtaining a set of on-line measure (Xon_meas_t); then, (1) converting the on-line measure (Xon_meas_t) into a deducted indicator of degradation (Degrmeas_t) by an electrical equivalence model, and (2) computing a deviation between estimated and deducted indicator of degradation (Degrest_t; Degrmeas_t); and/or (1) converting the estimated indicator of degradation (Degrest_t) into a set of on-line estimation (Xon_est_t), and (2) computing a deviation between set of on-line measure and estimation (Xon_meas_t; Xon_est_t); and correcting the estimated indicator of degradation (Degrest_t) into a corrected estimated indicator of degradation (Degrcorr_t) as a function of the computed deviation.Type: GrantFiled: January 29, 2019Date of Patent: October 18, 2022Assignee: Mitsubishi Electric CorporationInventors: Nicolas Degrenne, Guilherme Bueno Mariani
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Patent number: 11467435Abstract: A device for detecting a sparkle effect of a transparent sample arranged in front of an image source, to which also a first polarizer having an optical axis of polarization is associated, wherein the detection device includes an imaging system, and wherein the transparent sample, the first polarizer and the imaging system are arranged along an optical path originated from the image source. The detection device includes a second polarizer, arranged between the transparent sample and the imaging system, having an optical axis of polarization directed at ninety degrees with respect to the optical axis of polarization of the first polarizer.Type: GrantFiled: March 24, 2020Date of Patent: October 11, 2022Assignee: C.R.F. Societa Consortile per AzioniInventors: Fabio Scaffidi Muta, Nello Li Pira, Luca Belforte
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Patent number: 11462753Abstract: An electric connector for fuel cell stack voltage monitoring includes at least two separate units, each unit including a plurality of pins, each pin being adapted to contact a plate of the fuel cell stack for monitoring a fuel cell stack voltage. The first pin of each unit is adapted to provide a measurement of a reference voltage.Type: GrantFiled: June 8, 2018Date of Patent: October 4, 2022Assignee: POWERCELL SWEDEN ABInventors: Stefan Munthe, Mattias Holmberg
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Patent number: 11460496Abstract: A measuring carrier for position-resolved meteorological determination of a measurement variable dependent on the dielectric permittivity of a device under test. The measuring carrier has a supporting means comprising a measuring surface, to which the device under test can be applied, and a measuring transmission line which entirely or partially forms the measuring surface and comprises a multiplicity of transmission line cells for the purpose of transmitting a radio-frequency measurement signal which can be injected at the input port. The measuring surface is structured in a cellular manner, wherein each of the transmission line cells has a cell-individual propagation constant with respect to the radio-frequency measurement signal in a state free of a device under test. This constant differs from the respective cell-individual constants of the other transmission line cells.Type: GrantFiled: January 29, 2016Date of Patent: October 4, 2022Assignee: IHP GMBH—INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS/LEIBNIZ-INSTITUT FUR INNOVATIVE MIKROELEKTRONIKInventors: Chafik Meliani, Subhajit Guha, Farabi Ibne Jamal
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Patent number: 11454554Abstract: Two sets of the DC voltages are determined from among sets of DC voltages. At a first temperature, a first voltage of one of the two sets and a first voltage of the other one of the two sets surround a detection voltage that varies substantially proportionally to temperature. The detection voltage is compared with a second voltage of one of the two sets.Type: GrantFiled: September 19, 2019Date of Patent: September 27, 2022Assignee: STMicroelectronics (Rousset) SASInventor: Bruno Gailhard
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Patent number: 11454664Abstract: A testing system includes: an inspection module including a plurality of levels of inspection chambers in each of which a tester part having a tester configured to perform an electrical inspection of an inspection object and a probe card is accommodated; an aligner module configured to align the inspection object with the tester part; an alignment area in which the aligner module is accommodated; and a loader part configured to load the inspection object into the alignment area and unload the inspection object out of the aligner module, wherein the inspection module is located adjacent to the alignment area.Type: GrantFiled: April 16, 2018Date of Patent: September 27, 2022Assignee: TOKYO ELECTRON LIMITEDInventors: Kentaro Konishi, Jun Fujihara, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata, Katsuaki Sugiyama, Shin Uchida, Tetsuya Kagami, Hiroaki Hayashi, Rika Ozawa, Takanori Hyakudomi, Xingjun Jiang, Kenichi Narikawa, Tomoya Endo
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Patent number: 11448689Abstract: An electronic device, a signal validator, and a method for signal validation are provided. The electronic device includes a circuit board generating a plurality of signals and a signal validator. The signal validator records a current voltage level of each signal as a sequence code and records a time interval between the sequence code and a previous sequence code as a delay time corresponding to the sequence code when a voltage level of one of the plurality of signals changes. The signal validator sequentially determines whether the sequence code matches with a prearranged sequence code. When the sequence code matches with the prearranged sequence code, the signal validator determines whether each delay time corresponding to each sequence code exceeds a predetermined delay time. When the delay time is less than the predetermined delay time, the signal validator determines that the plurality of signals passes signal validation.Type: GrantFiled: March 4, 2020Date of Patent: September 20, 2022Assignee: PEGATRON CORPORATIONInventors: Yi-Tso Chang, Chi-Wei Ting
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Patent number: 11448693Abstract: The disclosure relates to a test system for improving test stability. One end of the connection pin is fixed to a bottom surface of a corresponding pin socket, the bottom surface is near an end of the plug end, the other end of each connection pin is disposed in the corresponding pin socket and a portion of the other end of the connection pin protrudes from a top surface of an end of the plug end. The connection pin in the plug end will not be deformed by external force, which can avoid the deformation of the connection pin caused by external force, and ensure the electrical connection and test stability.Type: GrantFiled: September 7, 2020Date of Patent: September 20, 2022Assignees: Inventec (Pudong) Technology Corporation, INVENTEC CORPORATIONInventor: Lin Zhang
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Patent number: 11448523Abstract: A sensor device may include a rotor, a stator disposed outside the rotor and a sensor module disposed outside the stator. The rotor may include a sleeve and a magnet coupled to the sleeve, and the magnet may be disposed inside the sleeve. The sleeve may include a fixing part which protrudes from an end of the sleeve and is in contact with the magnet. The sleeve includes a second body, and a third body. The second body is disposed to cover an upper surface of the magnet, and the third body is disposed to cover an outer circumferential surface of the magnet. The magnet is disposed between the shaft and the third body, thereby providing an advantageous effect of increasing a coupling force between the magnet of the rotor and a yoke.Type: GrantFiled: August 20, 2020Date of Patent: September 20, 2022Assignee: LG INNOTEK CO., LTD.Inventor: Ho Chan Son